JP6837481B2 - 回転テーブル用ウェーハ加熱保持機構及び方法並びにウェーハ回転保持装置 - Google Patents
回転テーブル用ウェーハ加熱保持機構及び方法並びにウェーハ回転保持装置 Download PDFInfo
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- JP6837481B2 JP6837481B2 JP2018519230A JP2018519230A JP6837481B2 JP 6837481 B2 JP6837481 B2 JP 6837481B2 JP 2018519230 A JP2018519230 A JP 2018519230A JP 2018519230 A JP2018519230 A JP 2018519230A JP 6837481 B2 JP6837481 B2 JP 6837481B2
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- Prior art keywords
- wafer
- rotary table
- heating
- holding mechanism
- heating means
- Prior art date
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B6/00—Heating by electric, magnetic or electromagnetic fields
- H05B6/02—Induction heating
- H05B6/06—Control, e.g. of temperature, of power
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B6/00—Heating by electric, magnetic or electromagnetic fields
- H05B6/02—Induction heating
- H05B6/10—Induction heating apparatus, other than furnaces, for specific applications
- H05B6/105—Induction heating apparatus, other than furnaces, for specific applications using a susceptor
- H05B6/107—Induction heating apparatus, other than furnaces, for specific applications using a susceptor for continuous movement of material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7618—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
Claims (5)
- ウェーハ回転保持装置の回転テーブル用ウェーハ加熱保持機構であって、
回転軸と、
前記回転軸の先端に載置され且つ上面に支持ピンを介してウェーハを保持する回転テーブルと、
前記回転軸に動力を供給する駆動モータと、
前記回転テーブル上又は内部であり且つ前記ウェーハの下部に前記ウェーハに空間を有する非接触状態で設けられた前記ウェーハを加熱するための加熱手段と、
を有し、
前記回転軸の周囲に巻回された固定側1次コイルと、
前記固定側1次コイルに接続された電力供給源と、
前記固定側1次コイルに対応して所定距離離間して設けられ、且つ前記回転テーブルに取り付けられた回転テーブル側2次コイルと、
前記回転テーブル側2次コイルに接続された前記加熱手段と、
を含む回転テーブル用非接触電力供給機構を用い、電磁誘導により前記2次コイルを介して前記加熱手段に電力が供給されてなり、
前記加熱手段上に樹脂シートが設けられてなる、
回転テーブル用ウェーハ加熱保持機構。 - 前記回転テーブルと前記加熱手段の間に反射板を設けてなる、請求項1記載の回転テーブル用ウェーハ加熱保持機構。
- 請求項1又は2記載の回転テーブル用ウェーハ加熱保持機構を用いて、前記ウェーハを加熱してなる、回転テーブル用ウェーハ加熱方法。
- 請求項1又は2記載の回転テーブル用ウェーハ加熱保持機構を備えてなる、ウェーハ回転保持装置。
- 前記ウェーハ回転保持装置が、スピン処理機構を備える、請求項4記載のウェーハ回転保持装置。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016105591 | 2016-05-26 | ||
| JP2016105591 | 2016-05-26 | ||
| PCT/JP2017/018696 WO2017204083A1 (ja) | 2016-05-26 | 2017-05-18 | 回転テーブル用ウェーハ加熱保持機構及び方法並びにウェーハ回転保持装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2017204083A1 JPWO2017204083A1 (ja) | 2019-03-14 |
| JP6837481B2 true JP6837481B2 (ja) | 2021-03-03 |
Family
ID=60411260
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018519230A Active JP6837481B2 (ja) | 2016-05-26 | 2017-05-18 | 回転テーブル用ウェーハ加熱保持機構及び方法並びにウェーハ回転保持装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11056362B2 (ja) |
| EP (1) | EP3442016B1 (ja) |
| JP (1) | JP6837481B2 (ja) |
| CN (1) | CN109155273B (ja) |
| WO (1) | WO2017204083A1 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220319905A1 (en) * | 2021-04-01 | 2022-10-06 | Semes Co., Ltd. | Support unit and substrate treating apparatus |
| KR102832562B1 (ko) * | 2024-02-01 | 2025-07-11 | 가부시키가이샤 스크린 홀딩스 | 기판 유지 장치 및 기판 처리 장치 |
| KR102832561B1 (ko) * | 2024-02-09 | 2025-07-11 | 가부시키가이샤 스크린 홀딩스 | 기판 유지 장치 및 기판 처리 장치 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6689719B2 (ja) * | 2016-09-23 | 2020-04-28 | 株式会社Screenホールディングス | 基板処理装置 |
| KR102111099B1 (ko) * | 2018-11-09 | 2020-05-15 | (주)에이앤아이 | 집전 픽업을 포함하는 무선 로터리 검사장치 |
| JP7241646B2 (ja) * | 2019-08-30 | 2023-03-17 | 京セラ株式会社 | ヒータ及びヒータシステム |
| JP7350613B2 (ja) * | 2019-10-17 | 2023-09-26 | 東京エレクトロン株式会社 | 基板処理装置 |
| KR102898051B1 (ko) * | 2020-03-13 | 2025-12-10 | 삼성전자주식회사 | 펠리클 전사 장치 및 펠리클 전사 방법 |
| CN112133649A (zh) * | 2020-09-21 | 2020-12-25 | 南通大学 | 一种大尺寸晶片均匀高温腐蚀装置及其腐蚀方法 |
| KR102548766B1 (ko) * | 2020-11-02 | 2023-06-30 | 세메스 주식회사 | 기판 처리 장치 및 발열 부재 제어 방법 |
| US12025320B2 (en) * | 2020-12-15 | 2024-07-02 | Arash Kani | Moving heating element |
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| JPH06232047A (ja) * | 1993-01-29 | 1994-08-19 | Mitsubishi Heavy Ind Ltd | ウェハ回転装置 |
| JPH09181155A (ja) | 1995-09-29 | 1997-07-11 | Applied Materials Inc | 堆積装置のサセプタ |
| JP4257816B2 (ja) | 2000-03-16 | 2009-04-22 | 三益半導体工業株式会社 | 廃液回収機構付ウェーハ表面処理装置 |
| JP4111479B2 (ja) * | 1999-09-09 | 2008-07-02 | 三益半導体工業株式会社 | ウェーハ回転保持装置 |
| JP3592233B2 (ja) | 2000-12-14 | 2004-11-24 | 大日本スクリーン製造株式会社 | 基板表面処理装置および基板表面処理方法 |
| JP4067858B2 (ja) * | 2002-04-16 | 2008-03-26 | 東京エレクトロン株式会社 | Ald成膜装置およびald成膜方法 |
| JP2004072000A (ja) | 2002-08-09 | 2004-03-04 | Matsushita Electric Ind Co Ltd | 加熱装置 |
| JP4364242B2 (ja) | 2004-03-22 | 2009-11-11 | 三益半導体工業株式会社 | スピンエッチングにおける工程管理方法及びスピンエッチング装置 |
| WO2006103773A1 (ja) * | 2005-03-30 | 2006-10-05 | Mimasu Semiconductor Industry Co., Ltd. | スピン処理方法及び装置 |
| JP2007335709A (ja) * | 2006-06-16 | 2007-12-27 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
| JP4753832B2 (ja) * | 2006-10-19 | 2011-08-24 | 大日本スクリーン製造株式会社 | 基板回転保持装置および基板処理装置 |
| JP4933409B2 (ja) | 2007-11-29 | 2012-05-16 | 株式会社ニューフレアテクノロジー | 半導体製造装置および半導体製造方法 |
| JP2010087197A (ja) | 2008-09-30 | 2010-04-15 | M Setek Co Ltd | レジスト塗布装置 |
| TWI602253B (zh) | 2012-10-12 | 2017-10-11 | 蘭姆研究股份公司 | 圓盤狀物件之液體處理用設備及用於該設備中之加熱系統 |
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| KR102124417B1 (ko) * | 2012-11-27 | 2020-06-24 | 에이씨엠 리서치 (상하이) 인코포레이티드 | 기판 지지 장치 |
| DE102016103270B3 (de) | 2016-02-24 | 2017-05-11 | Ev Group E. Thallner Gmbh | Vorrichtung und Verfahren zur Halterung, Rotation sowie Heizung und/oder Kühlung eines Substrats |
-
2017
- 2017-05-18 EP EP17802675.3A patent/EP3442016B1/en active Active
- 2017-05-18 WO PCT/JP2017/018696 patent/WO2017204083A1/ja not_active Ceased
- 2017-05-18 CN CN201780031237.8A patent/CN109155273B/zh active Active
- 2017-05-18 JP JP2018519230A patent/JP6837481B2/ja active Active
- 2017-05-18 US US16/304,385 patent/US11056362B2/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220319905A1 (en) * | 2021-04-01 | 2022-10-06 | Semes Co., Ltd. | Support unit and substrate treating apparatus |
| KR20220137197A (ko) * | 2021-04-01 | 2022-10-12 | 세메스 주식회사 | 지지 유닛 및 기판 처리 장치 |
| KR102683732B1 (ko) * | 2021-04-01 | 2024-07-12 | 세메스 주식회사 | 지지 유닛 및 기판 처리 장치 |
| US12519007B2 (en) * | 2021-04-01 | 2026-01-06 | Semes Co., Ltd. | Support unit and substrate treating apparatus |
| KR102832562B1 (ko) * | 2024-02-01 | 2025-07-11 | 가부시키가이샤 스크린 홀딩스 | 기판 유지 장치 및 기판 처리 장치 |
| KR102832561B1 (ko) * | 2024-02-09 | 2025-07-11 | 가부시키가이샤 스크린 홀딩스 | 기판 유지 장치 및 기판 처리 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| US11056362B2 (en) | 2021-07-06 |
| EP3442016A4 (en) | 2019-11-13 |
| JPWO2017204083A1 (ja) | 2019-03-14 |
| CN109155273A (zh) | 2019-01-04 |
| WO2017204083A1 (ja) | 2017-11-30 |
| CN109155273B (zh) | 2024-01-02 |
| EP3442016B1 (en) | 2023-06-07 |
| US20190295866A1 (en) | 2019-09-26 |
| EP3442016A1 (en) | 2019-02-13 |
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