JP6841139B2 - Temperature abnormality judgment device - Google Patents

Description

The present invention relates to a temperature abnormality determination device.

When detecting and determining a temperature abnormality of a component, it is desirable to consider the performance of the temperature sensor used for measuring the temperature of the component, the influence of noise generated inside and outside the temperature sensor, and the like. Therefore, for example, a high temperature abnormality of a component can be determined when the temperature measured by the temperature sensor exceeds the high temperature abnormality detection threshold value for a predetermined time (high temperature abnormality determination time). Similarly, the low temperature abnormality of a component can be determined when the temperature measured by the temperature sensor falls below the low temperature abnormality detection threshold for a predetermined time (low temperature abnormality determination time). However, when the measured temperature reaches the usable limit temperature of the component, the component cannot be used due to deterioration of the component or failure of the component. Therefore, it is desirable that the temperature abnormality of the component is determined before the measured temperature reaches the usable limit temperature.

As a related technique, the technique described in Patent Document 1 is known.

JP-A-2010-207029

However, the time variation of the measured temperature may be steep or slow. Therefore, it is conceivable to set the temperature abnormality detection threshold value away from the usable limit temperature so that the measurement temperature can be changed rapidly with time. FIG. 9 is an explanatory diagram of a case in which a temperature abnormality detection threshold value is set in response to a steep time change of the measurement temperature. FIG. 9 shows a case in which a high temperature abnormality detection threshold value is set away from the upper limit temperature at which the component can be used so that the high temperature abnormality can be determined even if the measurement temperature changes rapidly with time.

As shown in FIG. 9, if the high temperature abnormality detection threshold value is set away from the upper limit of usable temperature, even if the measurement temperature changes rapidly with time, the high temperature abnormality of the component before the measurement temperature reaches the upper limit of usable temperature. Can be determined. That is, as shown by the solid line in FIG. 9A, even if the time change of the measurement temperature is continuously steep, the measurement temperature can be used _{during the high temperature abnormality determination time (time t S} to time t _E). It is possible to determine a high temperature abnormality of a part before reaching the upper limit temperature. Further, as shown by the broken line in FIG. 9A, even if the time change of the measurement temperature becomes steep after the measurement temperature _{exceeds the high temperature abnormality detection threshold (time t C), the measurement temperature is determined to be a high temperature abnormality.} It is possible to judge the high temperature abnormality of the part before reaching the upper limit temperature that can be used in time.

However, when the high temperature abnormality detection threshold is set away from the upper limit of usable temperature, the measured temperature reaches the upper limit of usable temperature as shown by the solid line in FIG. 9B when the time change of the measured temperature is slow. Even though there is a margin, it will judge the high temperature abnormality of the part. Alternatively, as shown by the broken line in FIG. 9B, the temperature abnormality of the component is determined even though the measured temperature may be lower than the high temperature abnormality detection threshold value after the lapse of the high temperature abnormality determination time.

The above-mentioned problems regarding the determination of the high temperature abnormality of the component also occur in the determination of the low temperature abnormality of the component.
An object of one aspect of the present invention is to provide a temperature abnormality determination device capable of appropriately determining a temperature abnormality of a component regardless of whether the measurement temperature changes steeply or slowly over time.

The temperature abnormality determination device according to the present invention includes a temperature sensor for measuring the temperature of parts and a control unit. The control unit sets the higher the temperature rise rate of the component or the higher the measured temperature, the shorter the high temperature abnormality determination time from the detection of the high temperature abnormality of the component to the determination. Further, the control unit determines the high temperature abnormality of the component when the measured temperature exceeds the high temperature abnormality detection threshold value during the high temperature abnormality determination time.

According to the temperature abnormality determination device according to one embodiment, it is possible to appropriately determine the temperature abnormality of the component regardless of whether the measurement temperature changes with time is steep or slow.

It is a figure which shows the configuration example of the temperature abnormality determination apparatus according to an embodiment. It is a figure explaining an example of the temperature abnormality determination time set according to the temperature change rate of a part. It is a figure explaining an example of the temperature abnormality determination time set according to the measurement temperature. It is explanatory drawing of the temperature abnormality determination in 1st Example. It is a flowchart which shows an example of the operation of the control part in the modification of 1st Example. It is explanatory drawing of the temperature abnormality determination in the modification of the 1st Example. It is explanatory drawing of the temperature abnormality determination in the 2nd Example (the 1). It is explanatory drawing of temperature abnormality determination in 2nd Example (the 2). It is explanatory drawing of the case where the temperature abnormality detection threshold value was set corresponding to the steep time change of the measurement temperature.

Hereinafter, embodiments will be described in detail based on the drawings.
FIG. 1 is a diagram showing a configuration example of a temperature abnormality determination device according to an embodiment. In the example shown in FIG. 1, the temperature abnormality determination device 1 includes a temperature sensor 11, a control unit 12, a storage unit 13, and a counter 14.

The temperature sensor 11 is, for example, a thermistor. The temperature sensor 11 is installed on or near one or more parts 2 which are the targets for determining the temperature abnormality, and measures the temperature of the parts 2. The component 2 may be any component including a secondary battery, an inlet of a charging device, a relay, a circuit board, and the like.

The control unit 12 is composed of, for example, a CPU (Central Processing Unit) or a programmable device (FPGA (Field Programmable Gate Array), PLD (Programmable Logic Device), or the like). For example, the control unit 12 executes at least one of the high temperature abnormality determination as described in (1) below and the low temperature abnormality determination as described in (2) below.

(1) The control unit 12 sets the higher the temperature rise rate of the component 2 or the higher the measured temperature, the shorter the high temperature abnormality determination time from the detection of the high temperature abnormality of the component 2 to the determination. .. Further, the control unit 12 determines the high temperature abnormality of the component 2 when the measured temperature exceeds the high temperature abnormality detection threshold value during the high temperature abnormality determination time.

(2) The control unit 12 sets the low temperature abnormality determination time from the detection of the low temperature abnormality of the component 2 to the determination as the temperature decrease rate of the component 2 increases or the measured temperature decreases. .. Further, the control unit 12 determines the low temperature abnormality of the component 2 when the measured temperature falls below the low temperature abnormality detection threshold value during the low temperature abnormality determination time.

In the following description, when the high temperature abnormality determination and the low temperature abnormality determination are not particularly distinguished, it may be described as the temperature abnormality determination. When the high temperature abnormality determination time and the low temperature abnormality determination time are not particularly distinguished, they may be described as the temperature abnormality determination time. When the temperature rise rate and the temperature decrease rate are not particularly distinguished, they may be described as the temperature change rate. When the high temperature abnormality detection threshold value and the low temperature abnormality detection threshold value are not particularly distinguished, they may be described as the temperature abnormality detection threshold value. The temperature abnormality detection threshold value refers to the temperature at which the temperature abnormality of the component 2 is first detected before the temperature abnormality of the component 2 is finally determined. When the upper limit temperature and the lower limit temperature that can be used are not particularly distinguished, they may be described as the limit temperature that can be used. The usable limit temperature refers to a limit temperature at which the use (operation) of the component 2 can be continued without the component 2 being deteriorated or broken due to a temperature abnormality. The usable upper limit temperature is higher than the high temperature abnormality detection threshold value, and the usable lower limit temperature is lower than the low temperature abnormality detection threshold value.

When the temperature abnormality of the component 2 is determined, the control unit 12 may notify the user of the temperature abnormality of the component 2. Further, the control unit 12 may stop the operation of the component 2.
The storage unit 13 is composed of, for example, a RAM (Random Access Memory), a ROM (Read Only Memory), or the like. The storage unit 13 stores at least one of the high temperature abnormality determination time and the low temperature abnormality determination time as shown in FIGS. 2 and 3 in accordance with the control executed by the control unit 12. The control unit 12 reads the current temperature change rate or the temperature abnormality determination time corresponding to the current measurement temperature from the storage unit 13, and sets the read temperature abnormality determination time.

FIG. 2 is a diagram illustrating an example of a temperature abnormality determination time set according to the temperature change rate of the component. Specifically, FIG. 2A is an example of a high temperature abnormality determination time set according to the temperature rise rate of the component 2. The horizontal axis of FIG. 2A is the temperature rise rate of the component 2, and the vertical axis is the high temperature abnormality determination time. Further, FIG. 2B is an example of a low temperature abnormality determination time set according to the temperature decrease rate of the component. The horizontal axis of FIG. 2B is the temperature decrease rate of the component 2, and the vertical axis is the low temperature abnormality determination time.

As shown in FIG. 2A, the high temperature abnormality determination time is set so as to become shorter as the temperature rise rate of the component 2 increases. Further, as shown in FIG. 2B, the low temperature abnormality determination time is set so as to become shorter as the temperature decrease rate of the component 2 increases. The storage unit 13 may store a table in which the relationship between the temperature change rate of the component 2 and the temperature abnormality determination time as shown in FIG. 2 is described. Alternatively, the storage unit 13 may store a function indicating the relationship between the temperature change rate of the component 2 and the temperature abnormality determination time as shown in FIG.

FIG. 3 is a diagram illustrating an example of a temperature abnormality determination time set according to the measured temperature. Specifically, FIG. 3A is an example of a high temperature abnormality determination time set according to the measurement temperature. The horizontal axis of FIG. 3A is the measured temperature, and the vertical axis is the high temperature abnormality determination time. FIG. 3B is an example of the low temperature abnormality determination time set according to the measurement temperature. The horizontal axis of FIG. 3B is the measured temperature, and the vertical axis is the low temperature abnormality determination time.

As shown in FIG. 3A, the high temperature abnormality determination time is set so as to become shorter as the measurement temperature becomes higher. Further, as shown in FIG. 3B, the low temperature abnormality determination time is set so as to become shorter as the measurement temperature becomes lower. The storage unit 13 may store a table in which the relationship between the measured temperature and the temperature abnormality determination time as shown in FIG. 3 is described. Alternatively, the storage unit 13 may store a function indicating the relationship between the measured temperature and the temperature abnormality determination time as shown in FIG.

The temperature abnormality determination time may be set differently from those in FIGS. 2 and 3. For example, the temperature abnormality determination time may be set to change discontinuously (for example, in a stepped manner) according to the temperature change rate of the component 2, as shown in FIG. Further, the temperature abnormality determination time may be set so as to continuously change according to the measurement temperature as shown in FIG.

Specific examples of the temperature abnormality determination executed by the temperature abnormality determination device 1 include the first embodiment in which the temperature abnormality determination time is set according to the temperature change rate of the component 2, and the temperature abnormality according to the measured temperature measured by the temperature sensor 11. The second embodiment in which the determination time is set will be described below.
<First Example>
The control unit 12 calculates the temperature change of the component 2 per unit time (for example, 1 second, 5 seconds, etc.) from the temperature of the component 2 measured by the temperature sensor 11, and acquires the temperature change rate of the component 2. To do. Then, the control unit 12 acquires the temperature abnormality determination time corresponding to the temperature change rate of the component 2 from the storage unit 13 (see FIG. 2). The temperature change rate and the temperature abnormality determination time may be acquired sequentially before the measurement temperature of the component 2 reaches the temperature abnormality detection threshold, or when the measurement temperature of the component 2 reaches the temperature abnormality detection threshold. It may be done from.

For example, when the measured temperature of the component 2 measured by the temperature sensor 11 exceeds the high temperature abnormality detection threshold value, the control unit 12 sets the high temperature abnormality determination time at the time when the high temperature abnormality detection threshold value of the component 2 is exceeded. Further, the control unit 12 starts the measurement of the set high temperature abnormality determination time using the counter 14. When the measurement temperature of the component 2 exceeds the high temperature abnormality detection threshold value during the set high temperature abnormality determination time, the control unit 12 determines that the high temperature abnormality has occurred in the component 2.

In other words, the high temperature abnormality determination time means that the component 2 is determined to be a high temperature abnormality when the temperature of the component 2 exceeds the high temperature abnormality detection threshold value and then continuously exceeds the high temperature abnormality detection threshold value for a predetermined time (determination). It's time to do it.

On the other hand, when the measured temperature of the component 2 measured by the temperature sensor 11 falls below the low temperature abnormality detection threshold value, the control unit 12 sets the low temperature abnormality determination time at the time when the temperature abnormality detection threshold value of the component 2 falls below the low temperature abnormality detection threshold value. Further, the control unit 12 starts the measurement of the set low temperature abnormality determination time using the counter 14. When the measurement temperature of the component 2 falls below the low temperature abnormality detection threshold value during the set low temperature abnormality determination time, the control unit 12 determines that the low temperature abnormality has occurred in the component 2.

In other words, the low temperature abnormality determination time means that the component 2 is determined to be a low temperature abnormality when the temperature of the component 2 falls below the low temperature abnormality detection threshold value and then continuously falls below the low temperature abnormality detection threshold value for a predetermined time (judgment). It's time to do it.

For example, when the temperature change rate of the component 2 is high, the temperature abnormality determination time is set to be relatively short (see FIG. 2). Therefore, even when the temperature change of the component 2 is steep and the temperature change rate of the component 2 is high, the control unit 12 states that the temperature abnormality has occurred in the component 2 before the measured temperature of the component 2 reaches the usable limit temperature. Can be judged appropriately.

On the other hand, when the temperature change rate of the component 2 is low, the temperature abnormality determination time is set to be relatively long (see FIG. 2). Even though the temperature rise rate of the component 2 is low, if the measured temperature of the component 2 exceeds the high temperature abnormality detection threshold value for a relatively long time, it is determined that the high temperature abnormality has occurred in the component 2. Is desirable. Therefore, when the temperature change of the component 2 is slow and the measured temperature of the component 2 exceeds the high temperature abnormality detection threshold value during the relatively long high temperature abnormality determination time, the control unit 12 causes the temperature abnormality in the component 2. It can be appropriately determined that it has occurred. Similarly, even if the temperature decrease rate of the component 2 is low, if the measured temperature of the component 2 falls below the low temperature abnormality detection threshold value for a relatively long time, it is determined that the low temperature abnormality has occurred in the component 2. It is desirable to be done. Therefore, when the temperature change of the component 2 is slow and the measured temperature of the component 2 falls below the low temperature abnormality detection threshold value during the relatively long low temperature abnormality determination time, the control unit 12 causes a low temperature abnormality in the component 2. It can be appropriately determined that it has occurred.

As described above, according to the temperature abnormality determination device according to the embodiment, it is possible to appropriately determine the temperature abnormality of the component regardless of whether the time change of the measurement temperature is steep or slow. Further, according to the temperature abnormality determination device according to the embodiment, the state in which the temperature abnormality does not have to be determined is not determined as the temperature abnormality, so that the operating rate of the parts can be improved.

The above description is only one embodiment of the first embodiment, and various improvements and changes can be made. For example, the control unit 12 may sequentially acquire the temperature change rate of the component 2 even after the measurement temperature of the component 2 reaches the temperature abnormality detection threshold value. Then, the control unit 12 may sequentially change the temperature abnormality determination time according to the sequentially acquired temperature change rate. According to such a configuration, even when the temperature rise rate becomes steep after the measurement temperature exceeds the high temperature abnormality detection threshold value, the high temperature abnormality of the component can be appropriately determined. Similarly, according to such a configuration, even when the temperature decrease rate becomes steep after the measurement temperature falls below the low temperature abnormality detection threshold value, the low temperature abnormality of the component can be appropriately determined.

FIG. 4 is an explanatory diagram of temperature abnormality determination in such a configuration. Specifically, FIG. 4A is an explanatory diagram of high temperature abnormality determination. The horizontal axis of FIG. 4A is the high temperature abnormality determination time, and the vertical axis is the measurement temperature. FIG. 4B is an explanatory diagram of low temperature abnormality determination. The horizontal axis of FIG. 4B is the low temperature abnormality determination time, and the vertical axis is the measurement temperature. In addition, in FIG. 4A, it is assumed that the measurement temperature continues to rise after exceeding the _{high temperature abnormality detection threshold value T thH.} Further, in FIG. 4B, it is assumed that the measured temperature continues to decrease after falling below the _{low temperature abnormality detection threshold value T thL.}

For example, as shown in FIG. 4 (A), when the measured temperature of the part 2 is more than high temperature abnormality detection threshold value _{T thH} at time _{t 13,} the control unit 12, the temperature rise at the time of exceeding the high temperature abnormality detection threshold value _{T thH} setting a first high temperature abnormality determination time _{T JH1} corresponds to the rate _{R H1. Further, the control unit 12 starts} the measurement of the first high temperature abnormality determination time TJH1 by using the counter 14.

Next, at time _{t 14} before the first high temperature abnormality determination time _{T JH1} has elapsed, the temperature increase rate _{R H} is high temperature increase rate _{R H2} than the temperature increase rate _{R H1,} the control unit 12, the as the temperature increase rate R _H2, sets the second high temperature abnormality determination time T _JH2 count is started at the same time as the start time of the first high temperature abnormality determination time T _JH1. Incidentally, the temperature increase rate _{R H2} higher than the temperature increase rate _{R H1,} the second high temperature abnormality determination time _{T JH2} becomes shorter than the first high temperature abnormality determination time _{T JH1.}

Next, at time _{t 15} before the second high temperature abnormality determination time _{T JH2} elapses, the temperature increase rate _{R H} is returned from the temperature increase rate _{R H1} in temperature increase rate _{R H1,} the control unit 12, the temperature with increasing rate _{R H1,} it sets the first high temperature abnormality determination time _{T JH1.}

Then, at time _{t 16,} when the first high temperature abnormality determination time _{T JH1} has elapsed, i.e., during the first high temperature abnormality determination time _{T JH1,} measured temperature of the part 2 exceeds the high temperature abnormality detection threshold value _{T thH} In this case, the control unit 12 determines that a high temperature abnormality has occurred in the component 2.

For example, when the temperature rise rate of the component 2 is relatively low and there is a margin between the measurement temperature of the component 2 exceeding the high temperature abnormality detection threshold value and reaching the usable upper limit temperature of the component 2, the high temperature abnormality determination time. Is set relatively long (see FIG. 2 (A)). Even though the temperature rise rate of the component 2 is low, if the measured temperature of the component 2 exceeds the high temperature abnormality detection threshold value for a relatively long time, it is determined that the high temperature abnormality has occurred in the component 2. Is desirable. Therefore, when the temperature rise rate of the component 2 is relatively low and the measured temperature of the component 2 exceeds the high temperature abnormality detection threshold value during the relatively long high temperature abnormality determination time, the control unit 12 determines the component 2. It can be appropriately determined that a high temperature abnormality has occurred.

Further, if the temperature rise rate of the component 2 is relatively high and there is no time to reach the usable upper limit temperature of the component 2 after exceeding the high temperature abnormality detection threshold value, the high temperature abnormality determination time is set to be relatively short. (See FIG. 2 (A)). In this way, when the temperature rise rate of the component 2 is high, the high temperature abnormality determination time is set to be relatively short, so that the control unit 12 controls the component before the measured temperature of the component 2 reaches the upper limit temperature that can be used. It can be appropriately determined that a high temperature abnormality has occurred in 2.

On the other hand, for example, as shown in FIG. 4B, when the measurement temperature of the component 2 _{falls below the low temperature abnormality detection threshold value T thL at time t 17 , the control unit 12 reaches} the time point when the temperature falls below the low temperature abnormality detection threshold value T thL. setting the first low-temperature abnormality determination time _{T JL1} corresponding to the temperature drop rate _{R L1. Further, the control unit 12 starts} the measurement of the first low temperature abnormality determination time TJL1 by using the counter 14.

Next, at time _{t 18} before the first cold abnormality determination time _{T JL1} elapses, the temperature decrease rate _{R L} becomes high temperature decrease rate _{R L2} than the temperature decrease rate _{R L1,} the control unit 12, the as the temperature decrease rate R _L2, set the second low-temperature abnormality determination time T _JL2 count is started at the same time as the start time of the first low-temperature abnormality determination time T _JL1. The temperature decrease rate _{R L2} is higher than the temperature decrease rate _{R L1,} the second low-temperature abnormality determination time _{T JL2} a shorter time than the first low temperature abnormality determination time _{T JL1.}

Next, at time _{t 19} before the second low-temperature abnormality determination time _{T JH2} elapses, the temperature decrease rate _{P L} returns from the temperature decrease rate _{R L2} to a temperature decrease rate _{R L1,} the control unit 12, the temperature corresponding to the decrease rate _{R L1,} it sets the first high temperature abnormality determination time _{T JH1.}

Then, at time t ₂₀ , when the first low temperature abnormality determination time T _JL1 has elapsed, that is, during the first low temperature abnormality determination time T _JL1 , the measured temperature of the component 2 has fallen below the _{low temperature abnormality detection threshold T thL.} In this case, the control unit 12 determines that a low temperature abnormality has occurred in the component 2.

For example, when the temperature decrease rate of the component 2 is relatively low and there is a margin between the measurement temperature of the component 2 falling below the low temperature abnormality detection threshold value and reaching the usable lower limit temperature of the component 2, the low temperature abnormality determination time. Is set relatively long (see FIG. 2B). Even though the temperature decrease rate of the component 2 is low, if the measured temperature of the component 2 falls below the low temperature abnormality detection threshold value for a relatively long time, it is determined that the low temperature abnormality has occurred in the component 2. Is desirable. Therefore, when the temperature decrease rate of the component 2 is relatively low and the measured temperature of the component 2 falls below the low temperature abnormality detection threshold value during the relatively long low temperature abnormality determination time, the control unit 12 determines the component 2. It can be appropriately determined that a low temperature abnormality has occurred.

Further, when the temperature decrease rate of the component 2 is relatively high and there is no time to reach the usable lower limit temperature of the component 2 after the measurement temperature of the component 2 falls below the low temperature abnormality detection threshold value, the low temperature abnormality determination time. Is set relatively short (see FIG. 2B). As described above, when the temperature decrease rate of the component 2 is relatively high, the low temperature abnormality determination time is set to be relatively short, so that the control unit 12 reaches the lower limit temperature at which the component 2 can be measured. It can be appropriately determined that a low temperature abnormality has occurred in the component 2 before.
<Modified example of the first embodiment>
In the modified example of the first embodiment, the control unit 12 acquires the temperature rise when the measurement temperature of the component 2 exceeds the high temperature abnormality detection threshold value after the measurement temperature of the component 2 exceeds the high temperature abnormality detection threshold value. The high temperature abnormality judgment time is set according to the maximum temperature rise rate of the rates. Alternatively, the control unit 12 determines the maximum temperature decrease of the temperature decrease rates acquired when the measurement temperature of the component 2 is below the low temperature abnormality detection threshold value and then the measurement temperature of the component 2 is below the low temperature abnormality detection threshold value. Set the low temperature abnormality judgment time according to the rate.

Even with this configuration, even if the temperature rise rate suddenly changes after the measurement temperature exceeds the high temperature abnormality detection threshold value, the high temperature abnormality of the component 2 can be appropriately determined. Similarly, even if the temperature decrease rate suddenly changes after the measurement temperature falls below the low temperature abnormality detection threshold value, the low temperature abnormality of the component 2 can be appropriately determined.

FIG. 5 is a flowchart showing an example of the operation of the control unit 12 in the modified example of the first embodiment. The control unit 12 executes the flowchart shown in FIG. 5 at each first control timing. Further, the control unit 12 shall acquire the latest temperature increase rate and the latest temperature decrease rate for each second control timing. The first control timing and the second control timing may be the same timing or different timings from each other. Further, the counter 14 counts up the high temperature counter value and the low temperature counter value, and keeps the high temperature counter value and the low temperature counter value until they are cleared.

First, when the control unit 12 determines that the measurement temperature of the component 2 exceeds the high temperature abnormality detection threshold value (S501: Yes), the latest temperature rise rate exceeds the high temperature abnormality detection threshold value of the component 2. It is determined whether or not the temperature rise rate is larger than the maximum temperature rise rate acquired at the time of being (S502).

Next, when the control unit 12 determines that the latest temperature rise rate is larger than the maximum temperature rise rate (S502: Yes), the control unit 12 sets (updates) the maximum temperature rise rate to the latest temperature rise rate and at the same time. , The latest high temperature abnormality determination time is set (updated) to the high temperature abnormality determination time corresponding to the latest temperature rise rate (S503).

Next, after the control unit 12 counts up the high temperature counter value (S504) and determines that the high temperature counter value is equal to or longer than the latest high temperature abnormality determination time (S505: Yes), the component 2 has a high temperature abnormality. It is determined that it has occurred (S506).

Further, when the control unit 12 determines that the latest temperature rise rate is equal to or less than the maximum temperature rise rate (S502: No), the high temperature counter does not update the maximum temperature rise rate and the latest high temperature abnormality determination time. When the value is counted up (S504) and it is determined that the high temperature counter value is equal to or longer than the latest high temperature abnormality determination time (S505: Yes), it is determined that a high temperature abnormality has occurred in the component 2 (S506).

Further, when the control unit 12 determines that the measurement temperature of the component 2 is lower than the low temperature abnormality detection threshold value (S501: No, S507: Yes), the latest temperature reduction rate is that the measurement temperature of the component 2 detects the low temperature abnormality. It is determined whether or not the temperature decrease rate is larger than the maximum temperature decrease rate acquired when the temperature is below the threshold value (S508).

Next, when the control unit 12 determines that the latest temperature decrease rate is larger than the maximum temperature decrease rate (S508: Yes), the control unit 12 sets (updates) the maximum temperature decrease rate to the latest temperature decrease rate and at the same time. , The latest low temperature abnormality determination time is set (updated) to the low temperature abnormality determination time corresponding to the latest temperature decrease rate (S509).

Next, after the control unit 12 counts up the low temperature counter value (S510) and determines that the low temperature counter value is equal to or longer than the latest low temperature abnormality determination time (S511: Yes), the component 2 has a low temperature abnormality. It is determined that it has occurred (S506).

Further, when the control unit 12 determines that the latest temperature decrease rate is equal to or less than the maximum temperature decrease rate (S508: No), the low temperature counter does not update the maximum temperature decrease rate and the latest low temperature abnormality determination time. When the value is counted up (S510) and it is determined that the low temperature counter value is equal to or longer than the latest low temperature abnormality determination time (S511: Yes), it is determined that a low temperature abnormality has occurred in the component 2 (S512).

Further, the control unit 12 determines that the measurement temperature of the component 2 does not exceed the high temperature abnormality detection threshold value (S501: No), and determines that the measurement temperature of the component 2 does not fall below the low temperature abnormality detection threshold value (S501: No). S507: No), the high temperature counter value and the low temperature counter value are cleared (S513).

In the flowchart shown in FIG. 5, the control unit 12 may be configured to execute only the high temperature abnormality determination (S501 to S506) or only the low temperature abnormality determination (S507 to S512). In this configuration, if the control unit 12 determines that the measurement temperature of the component 2 does not exceed the high temperature abnormality detection threshold value (S501: No), the control unit 12 clears the high temperature counter value (S513). Alternatively, when the control unit 12 determines that the measurement temperature of the component 2 is not lower than the low temperature abnormality detection threshold value (S707: No), the control unit 12 clears the low temperature counter value (S513).

FIG. 6 is an explanatory diagram of temperature abnormality determination in a modified example of the first embodiment. Specifically, FIG. 6A is an explanatory diagram of high temperature abnormality determination. The horizontal axis of FIG. 6A is the high temperature abnormality determination time, and the vertical axis is the measurement temperature. FIG. 6B is an explanatory diagram of low temperature abnormality determination. The horizontal axis of FIG. 6B is the low temperature abnormality determination time, and the vertical axis is the measurement temperature. _{In addition, in FIG. 6A, it} is assumed that the measurement temperature continues to rise after exceeding the high temperature abnormality detection threshold value T thH. Further, in FIG. 6B, it is assumed that the measured temperature continues to decrease after falling below the _{low temperature abnormality detection threshold value T thL.}

For example, as shown in FIG. 6 (A), when the measured temperature of the part 2 is more than high temperature abnormality detection threshold value T _thH at time t _21, the control unit 12, the maximum temperature rise rate, the most recent temperature increase rate R set _H1, the latest high temperature abnormality determination time is set to a first high temperature abnormality determination time T _JH1 corresponds to the most recent temperature increase rate R _H1. Further, the control unit 12 starts counting up the high temperature counter value.

Next, at time t ₂₂ before hot counter value becomes equal to or greater than the first high temperature abnormality determination time T _{JH1 (latest} high temperature abnormality determination time), a temperature higher than the latest temperature rise rate of the temperature increase rate R _H1 When the rate _RH2 is reached, the control unit 12 sets (updates) the maximum temperature rise rate to the latest temperature rise rate _RH2, and sets the latest high temperature abnormality determination time to correspond to the _{latest temperature rise rate RH2.} The second high temperature abnormality determination time is set (updated) to _TJH2. Incidentally, the temperature increase rate _{R H2} higher than the temperature increase rate _{R H1,} the second high temperature abnormality determination time _{T JH2} becomes shorter than the first high temperature abnormality determination time _{T JH1.}

Next, at time t ₂₃ before hot counter value becomes more than the second high temperature abnormality determination time T _{JH2 (latest} high temperature abnormality determination time), the latest temperature rise rate of the temperature increase rate from the temperature increase rate R _H2 R _When returning to H1, the control unit 12 does not update the maximum temperature rise rate and the latest high temperature abnormality determination time, and continues to count up the high temperature counter value.

Then, at time t ₂₄ , when the high temperature counter value becomes equal to _{or longer than the second high temperature abnormality determination time T JH2} (latest high temperature abnormality determination time), the control unit 12 determines that the high temperature abnormality has occurred in the component 2.

On the other hand, for example, as shown in FIG. 6 (B), when at time t ₂₅ the measured temperature of the part 2 falls below the low temperature abnormality detection threshold value T _thL, the control unit 12, the maximum temperature drop rate, the most recent temperature drop set the rate R _L1, the latest low-temperature abnormality determination time is set to a first low-temperature abnormality determination time T _JL1 corresponding to the latest temperature decrease rate R _L1. Further, the control unit 12 starts counting up the low temperature counter value.

Next, at time t ₂₆ before cold counter value becomes equal to or greater than the first low temperature abnormality determination time T _{JL1 (latest} cold abnormality determination time), a temperature lower than the latest temperature decrease rate temperature decrease rate R _L1 When the rate _RL2 is reached, the control unit 12 sets (updates) the maximum temperature drop rate to the latest temperature drop rate _RL2, and sets the latest low temperature abnormality determination time to correspond to the _{latest temperature drop rate RL2.} The second low temperature abnormality determination time is set (updated) to _TJL2. The temperature decrease rate _{R L2} is higher than the temperature decrease rate _{R L1,} the second low-temperature abnormality determination time _{T JL2} a shorter time than the first low temperature abnormality determination time _{T JL1.}

_{Next, at time t 27} before the low temperature counter value becomes equal to or longer than the second low temperature abnormality determination time T _JL2 (latest low temperature abnormality determination time), the latest temperature decrease rate changes from the temperature decrease rate R _L2 to the temperature decrease rate R. _When returning to L1, the control unit 12 does not update the maximum temperature decrease rate and the latest low temperature abnormality determination time, and continues to count up the low temperature counter value.

Then, at time t ₂₈ , when the low temperature counter value becomes equal to _{or longer than the second low temperature abnormality determination time T JL2} (latest low temperature abnormality determination time), the control unit 12 determines that the low temperature abnormality has occurred in the component 2.
<Second Example>
The control unit 12 acquires the temperature of the component 2 measured by the temperature sensor 11. Then, the control unit 12 acquires the temperature abnormality determination time corresponding to the measurement temperature of the component 2 from the storage unit 13 (see FIG. 3). The temperature abnormality determination time may be acquired sequentially before the measurement temperature of the component 2 reaches the temperature abnormality detection threshold value, or may be performed from the time when the measurement temperature of the component 2 reaches the temperature abnormality detection threshold value. May be good.

FIG. 7 is an explanatory diagram of temperature abnormality determination in the second embodiment (No. 1). Specifically, FIG. 7A is an explanatory diagram of high temperature abnormality determination in the second embodiment (No. 1). The horizontal axis of FIG. 7A is the high temperature abnormality determination time, and the vertical axis is the measurement temperature. FIG. 7B is an explanatory diagram of the low temperature abnormality determination in the second embodiment (No. 1). The horizontal axis of FIG. 7B is the low temperature abnormality determination time, and the vertical axis is the measurement temperature.

In the second embodiment (No. 1), when the measured temperature of the component 2 exceeds the first high temperature abnormality detection threshold value, the control unit 12 starts with the first high temperature abnormality from the time when the first high temperature abnormality detection threshold value is exceeded. When the count of the determination time is started and then the measured temperature exceeds the second high temperature abnormality detection threshold value higher than the first high temperature abnormality detection threshold value, it is shorter than the first high temperature abnormality determination time and the first A second high temperature abnormality determination time is set, in which counting is started at the same time as the start time of the high temperature abnormality determination time. Alternatively, when the measurement temperature of the component 2 falls below the first low temperature abnormality detection threshold, the control unit 12 starts counting the first low temperature abnormality determination time from the time when the temperature falls below the first low temperature abnormality detection threshold, and then starts counting. When the measured temperature is lower than the second low temperature abnormality detection threshold lower than the first low temperature abnormality detection threshold, it is shorter than the first low temperature abnormality determination time and is the same as the start time of the first low temperature abnormality determination time. Set the second low temperature abnormality determination time at which the count starts at the time.

For example, as shown in FIG. 7 (A), when the measured temperature of the part 2 is more than high temperature abnormality detection threshold value _{T thH} at time _{t 1,} the control unit 12, relatively long first high temperature abnormality determination time _{T JH1} To set. _{Further, the control unit 12 starts} the measurement of the set first high temperature abnormality determination time TJH1 by using the counter 14. Then, when the measured temperature of the component 2 exceeds the high temperature abnormality detection threshold value T _{thH without exceeding the first temperature T m} 1 which is higher than the high _{temperature abnormality detection threshold value T thH} during the first high temperature abnormality determination time T _JH1 . The control unit 12 determines that a high temperature abnormality has occurred in the component 2.

Next, at time t ₂ before the lapse of the first high temperature abnormality determination time T _JH1 set, if the measured temperature of the part 2 exceeds the first temperature T _m1, the control unit 12, a first high temperature abnormality A second high temperature abnormality determination time T _JH2 shorter than the determination time T _JH1 is set. Then, during the set second high temperature abnormality determination time T _JH2 , the measured temperature of the component 2 exceeded the high temperature abnormality detection threshold T _thH without exceeding the second temperature T _{m 2 higher than the first temperature T m 1.} In this case, the control unit 12 determines that a high temperature abnormality has occurred in the component 2.

Further, at time t ₃ before the lapse of the second high temperature abnormality determination time T _JH2 set, if the measured temperature of the part 2 exceeds the second temperature T _{m @ 2,} the control unit 12, a second high temperature abnormality determination A third high temperature abnormality determination time T _JH3 shorter than the time T _JH2 is set. Then, when the measured temperature of the component 2 _{exceeds the high temperature abnormality detection threshold value T thH} during the set third high temperature abnormality determination time T _JH3 , the control unit 12 determines that the high temperature abnormality has occurred in the component 2.

For example, if the measurement temperature of the component 2 is relatively low and there is a margin from exceeding the high temperature abnormality detection threshold value to reaching the usable upper limit temperature of the component 2, the high temperature abnormality determination time is set to be relatively long. (See FIGS. 3 (A) and 7 (A)). Even if the measurement temperature of the component 2 is low, if the measurement temperature of the component 2 exceeds the high temperature abnormality detection threshold value for a relatively long time, it may be determined that the high temperature abnormality has occurred in the component 2. desirable. Therefore, when the temperature change of the component 2 is slow and the measured temperature of the component 2 exceeds the high temperature abnormality detection threshold value during the relatively long high temperature abnormality determination time, the control unit 12 causes a high temperature abnormality in the component 2. It can be appropriately determined that it has occurred.

Further, when the measurement temperature of the component 2 is relatively high and there is no time to reach the usable upper limit temperature of the component 2 after exceeding the high temperature abnormality detection threshold value, the high temperature abnormality determination time is set to be relatively short. (See FIGS. 3 (A) and 7 (A)). Therefore, when the temperature change of the component 2 is steep and the measurement temperature of the component 2 becomes relatively high, the high temperature abnormality determination time is set to be relatively short, so that the control unit 12 measures the component 2. It can be appropriately determined that a high temperature abnormality has occurred in the component 2 before the temperature reaches the upper limit temperature that can be used.

On the other hand, for example, as shown in FIG. 7 (B), the measured temperature of the part 2 falls below the low temperature abnormality detection threshold value T _thL at time t _4, the control unit 12, relatively long first cold abnormality determination time Set T _{JL1. Further, the control unit 12 starts} the measurement of the first low temperature abnormality determination time TJL1 by using the counter 14. Then, below the low temperature abnormality detection threshold value T _thL without below a first low-temperature abnormality determination time T between _JL1, low measured temperature of the part 2 abnormality detection threshold value T third temperature T _m3 lower than _thL set In this case, the control unit 12 determines that a low temperature abnormality has occurred in the component 2.

Next, when the measured temperature of the component 2 _{falls below the third temperature T m3} at the time t ₅ before the set first low temperature abnormality determination time T _JL1 elapses, the control unit 12 sends the first low temperature abnormality. setting a second low-temperature abnormality determination time _{T JL2} shorter than a determination time _{T JL1.} Then, during the set second low temperature abnormality determination time T _JL2 , the measured temperature of the component 2 fell below the low temperature abnormality detection threshold T _thL without falling below the fourth temperature T _{m4, which is lower than the third temperature T m 3.} In this case, the control unit 12 determines that a low temperature abnormality has occurred in the component 2.

Further, when the measured temperature of the component 2 _{falls below the fourth temperature T m4} at the time t ₆ before the set second low temperature abnormality determination time T _JL2 elapses, the control unit 12 determines the second low temperature abnormality. setting the third low-temperature abnormality determination time _{T JL3} shorter than the time _{T JL2.} Then, when the measured temperature of the component 2 _{falls below the low temperature abnormality detection threshold value T thL} during the set third low temperature abnormality determination time T _JL3 , the control unit 12 determines that the low temperature abnormality has occurred in the component 2.

For example, if the measurement temperature of the component 2 is relatively high and there is a margin from below the low temperature abnormality detection threshold value to reaching the usable lower limit temperature of the component 2, the low temperature abnormality determination time is set relatively long. (See FIG. 3 (B) and FIG. 7 (B)). Even if the measurement temperature of the component 2 is high, if the measurement temperature of the component 2 falls below the low temperature abnormality detection threshold value for a relatively long time, it may be determined that the low temperature abnormality has occurred in the component 2. desirable. Therefore, when the temperature change of the component 2 is slow and the measured temperature of the component 2 falls below the low temperature abnormality detection threshold value during the relatively long low temperature abnormality determination time, the control unit 12 causes a low temperature abnormality in the component 2. It can be appropriately determined that it has occurred.

Further, when the measurement temperature of the component 2 is relatively low and there is no time to reach the usable lower limit temperature of the component 2 after falling below the low temperature abnormality detection threshold value, the low temperature abnormality determination time is set to be relatively short. (See FIG. 3 (B) and FIG. 7 (B)). Therefore, when the temperature change of the component 2 is steep and the measurement temperature of the component 2 becomes relatively low, the low temperature abnormality determination time is set to be relatively short, so that the control unit 12 measures the component 2. It can be appropriately determined that a low temperature abnormality has occurred in the component 2 before the temperature reaches the lower limit of the usable temperature.

As described above, according to the temperature abnormality determination device according to the embodiment, it is possible to appropriately determine the temperature abnormality of the component regardless of whether the time change of the measurement temperature is steep or slow. Further, according to the temperature abnormality determination device according to the embodiment, the state in which the temperature abnormality does not have to be determined is not determined as the temperature abnormality, so that the operating rate of the parts can be improved.

The above description is only one embodiment of the second embodiment, and various improvements and changes can be made. For example, in the above description, three temperature abnormality determination times are set and changed according to the temperature change of the component 2, but two or less or four or more temperature abnormality determination times are set and changed according to the temperature change of the component 2. It may be configured as follows. Further, unlike the above description, the second embodiment may be modified as described below.

FIG. 8 is an explanatory diagram of temperature abnormality determination in the second embodiment (No. 2). Specifically, FIG. 8A is an explanatory diagram of high temperature abnormality determination in the second embodiment (No. 2). The horizontal axis of FIG. 8A is the high temperature abnormality determination time, and the vertical axis is the measurement temperature. FIG. 8B is an explanatory diagram of the low temperature abnormality determination in the second embodiment (No. 2). The horizontal axis of FIG. 8B is the low temperature abnormality determination time, and the vertical axis is the measurement temperature.

For example, as shown in FIG. 8 (A), when the measured temperature of the part 2 exceeds the first high temperature abnormality detection threshold value T _ThH1 at time t _7, the control unit 12, relatively long first high temperature abnormality determination Set the time T _JH1 ^'. Further, the control unit 12 _starts ^{the measurement of the first high temperature abnormality determination time T JH1 ′} by using the counter 14 from the time when the first high temperature abnormality detection threshold value T _{thH1 is exceeded.} Then, when the measured temperature of the component 2 exceeds the first high temperature abnormality detection threshold value T _thH1 during the first high temperature abnormality determination time T _JH1 ^′ , the control unit 12 causes the first high temperature abnormality in the component 2. It is determined that it has been done.

Next, at time _{t 8} before the first high temperature abnormality determination time _{T JH1} has elapsed, the measured temperature of the component 2 a first high temperature abnormality detection threshold value _{T thH} second high temperature abnormality detection threshold value _{T ThH2} higher than When it exceeds, the control unit 12 further sets _{the second high temperature abnormality determination time T JH2} ^′. That is, the control unit 12 sets the second high temperature abnormality determination time T _JH2 ^′, which _{is shorter than the first high temperature abnormality determination time T JH1} ^′ , in addition to the first high temperature abnormality determination time T _JH1 ^{′ already set.} Further set. Further, the control unit 12 measures the second high temperature abnormality determination time T _JH2 ^′ in addition to the measurement of the first high temperature abnormality determination time T _JH1 ^′ that has already started, and measures the second high temperature abnormality detection threshold value T _thH2. From the time when the above time is exceeded, the counter 14 is used to start further. Then, when the measured temperature of the component 2 exceeds the second high temperature abnormality detection threshold value T _thH2 during the second high temperature abnormality determination time T _JH2 ^′ , the control unit 12 causes a second high temperature abnormality in the component 2. It is determined that it has been done.

Further, at time _{t 9} before the second high temperature abnormality determination time _{T JH2} ^'has elapsed, a third high temperature abnormality detection threshold value _{T ThH3} higher than the measured temperature of the component 2 is a second high temperature abnormality detection threshold value _{T ThH2} When it exceeds, the control unit 12 further sets _{the third high temperature abnormality determination time T JH3} ^′. That is, the control unit 12, in addition to the already first high temperature abnormality determination time _{T JH1} ^'and the second high temperature abnormality determination time _{T ^JH2'} which is set shorter than the second high temperature abnormality determination time _{T JH2} ^' The third high temperature abnormality determination time T _JH3 ^′ is further set. _{Further, in addition to the measurement of the first high temperature abnormality determination time T JH1} ^′ and the second high temperature abnormality determination time T _JH2 ^′ that have already started, the control unit 12 has a third high temperature abnormality determination time T _JH3 ^′ . The measurement is further started using the counter 14 from the time when the third high temperature abnormality detection threshold value T _{thH3 is exceeded.} Then, when the measured temperature of the component 2 exceeds the third high temperature abnormality detection threshold value T _thH3 during the third high temperature abnormality determination time T _JH3 ^′ , the control unit 12 causes a third temperature abnormality in the component 2. It is determined that it has been done.

On the other hand, as shown in FIG. 8 (B), the measured temperature of the part 2 falls below the first low temperature abnormality detection threshold value T _thL1 at time t _10, the control unit 12, relatively long first cold abnormality determination Set the time T _JL1 ^'. _{Further, the control unit 12 starts} the measurement of the first low temperature abnormality determination time T ^{JL1 ′} by using the counter 14 from the time when the temperature falls below the first low temperature abnormality detection threshold value T _thL1. Then, when the measured temperature of the component 2 falls below the first low temperature abnormality detection threshold value T _thL1 during the first low temperature abnormality determination time T _JL1 ^′ , the control unit 12 causes the first low temperature abnormality in the component 2. It is determined that it has been done.

Next, at time _{t 11} before the first cold abnormality determination time _{T JL1} ^'has passed, the measured temperature of the part 2 a first low-temperature abnormality detection threshold value _T lower than _thL second cold abnormality detection threshold value _{T ThL2 Below} , the control unit 12 further sets the second low temperature abnormality determination time T ^{JL2 ′.} That is, the control unit 12 has already ^'in addition to, the first low-temperature abnormality determination time _{T JL1} shorter second cold abnormality determination time than _{T ^JL2'} first cold abnormality determination time _{T JL1} has set further Set. _{Further, in addition to the measurement of the first low temperature abnormality determination time T JL1} ^′ that has already started, the control unit 12 measures the second low temperature abnormality determination time T _JL2 ^′ and sets the second low temperature abnormality detection threshold value T _thL2 . From the time when the temperature falls below the limit, the counter 14 is used to start further. Then, when the measured temperature of the component 2 falls below the second low temperature abnormality detection threshold value T _thL2 during the second low temperature abnormality determination time T _JL2 ^′ , the control unit 12 causes a second low temperature abnormality in the component 2. It is determined that it has been done.

Further, at time _{t 12} before the second low-temperature abnormality determination time _{T JL2} ^'has elapsed, a third cold abnormality detection threshold value _{T ThL3} lower than the measured temperature of the component 2 is a second low-temperature abnormality detection threshold value _{T ThL2} If it falls below this, the control unit 12 further sets _{the third low temperature abnormality determination time T JL3} ^′. That is, the controller 12 is shorter already in addition to the first low-temperature abnormality determination time _{T JL1} ^'and the second low-temperature abnormality determination time _{T ^JL2'} which is set, than the second low-temperature abnormality determination time _{T JL2} ^' further setting the third low-temperature abnormality determination time _{T JL3} ^'. _{Further, in addition to the measurement of the first low temperature abnormality determination time T JL1} ^′ and the second low temperature abnormality determination time T _JL2 ^′ that have already started, the control unit 12 has a third low temperature abnormality determination time T _JL3 ^′ . The measurement is further started using the counter 14 from the time when the _measurement falls below the third low temperature abnormality detection threshold value T thL3. Then, when the measured temperature of the component 2 falls below the third low temperature abnormality detection threshold value T _thL3 during the third low temperature abnormality determination time T _JL3 ^′ , the control unit 12 causes the component 2 to have a third low temperature abnormality. It is determined that it has been done.

According to such a second embodiment (No. 2), the same effect as that of the second embodiment (No. 1) can be obtained. Further, according to the second embodiment (No. 2), since the temperature abnormality determination time is set and started according to the plurality of temperature abnormality detection threshold values, a plurality of types of temperature abnormality of the component (for example, softening of the component) And failure) can be appropriately monitored and determined in parallel.

The present invention is not limited to the above embodiments, and various improvements and changes can be made without departing from the gist of the present invention.

1 Temperature abnormality judgment device 11 Temperature sensor 12 Control unit 13 Storage unit 14 Counter 2 Parts

Claims (12)

A temperature sensor that measures the temperature of parts and
The higher the temperature rise rate of the component or the higher the measured temperature, the shorter the high temperature abnormality determination time from the detection of the high temperature abnormality of the component to the determination is set, and the measured temperature becomes higher. A temperature abnormality determination device including a control unit that determines a high temperature abnormality of the component when the high temperature abnormality detection threshold value is exceeded during the high temperature abnormality determination time. The temperature abnormality determination device according to claim 1.
When the measured temperature exceeds the first high temperature abnormality detection threshold value, the control unit starts counting the first high temperature abnormality determination time from the time when the first high temperature abnormality detection threshold value is exceeded, and is measured. When the temperature exceeds the second high temperature abnormality detection threshold value higher than the first high temperature abnormality detection threshold value, the time is shorter than the first high temperature abnormality determination time from the time when the second high temperature abnormality detection threshold value is exceeded. A temperature abnormality determination device that starts counting the second high temperature abnormality determination time. The temperature abnormality determination device according to claim 1.
When the measured temperature exceeds the first high temperature abnormality detection threshold value, the control unit starts counting the first high temperature abnormality determination time from the time when the first high temperature abnormality detection threshold value is exceeded, and is measured. When the temperature exceeds the second high temperature abnormality detection threshold value higher than the first high temperature abnormality detection threshold value, it is shorter than the first high temperature abnormality determination time and the start of the first high temperature abnormality determination time. A temperature abnormality determination device that sets a second high temperature abnormality determination time at which counting starts at the same time as the time. The temperature abnormality determination device according to claim 1.
When the measured temperature exceeds the high temperature abnormality detection threshold value, the control unit starts counting the first high temperature abnormality determination time from the time when the high temperature abnormality detection threshold value is exceeded, and the temperature rise rate changes. , A temperature abnormality determination device that sets a second high temperature abnormality determination time in which counting is started at the same time as the start time of the first high temperature abnormality determination time according to the temperature rise rate. The temperature abnormality determination device according to claim 1.
The control unit is a temperature abnormality determination device that sequentially changes the high temperature abnormality determination time according to the temperature rise rate after the measured temperature exceeds the high temperature abnormality detection threshold value. The temperature abnormality determination device according to claim 1.
The control unit has the maximum rate of temperature increase acquired when the measured temperature exceeds the high temperature abnormality detection threshold value after the measured temperature exceeds the high temperature abnormality detection threshold value. A temperature abnormality determination device that sets the high temperature abnormality determination time according to the temperature rise rate. A temperature sensor that measures the temperature of parts and
The higher the temperature decrease rate of the component or the lower the measured temperature, the shorter the low temperature abnormality determination time from the detection of the low temperature abnormality of the component to the determination is set, and the measured temperature becomes lower. A temperature abnormality determination device including a control unit that determines a low temperature abnormality of the component when the temperature falls below the low temperature abnormality detection threshold during the low temperature abnormality determination time. The temperature abnormality determination device according to claim 7.
When the measured temperature falls below the first low temperature abnormality detection threshold, the control unit starts counting the first low temperature abnormality determination time from the time when the measured temperature falls below the first low temperature abnormality detection threshold, and is measured. When the temperature falls below the second low temperature abnormality detection threshold, which is lower than the first low temperature abnormality detection threshold, the time is shorter than the first low temperature abnormality determination time from the time when the temperature falls below the second low temperature abnormality detection threshold. A temperature abnormality determination device that starts counting the second low temperature abnormality determination time. The temperature abnormality determination device according to claim 7.
When the measured temperature falls below the first low temperature abnormality detection threshold, the control unit starts counting the first low temperature abnormality determination time from the time when the measured temperature falls below the first low temperature abnormality detection threshold, and is measured. When the temperature is lower than the second low temperature abnormality detection threshold lower than the first low temperature abnormality detection threshold, the temperature is shorter than the first low temperature abnormality determination time and the start of the first low temperature abnormality determination time. A temperature abnormality determination device that sets a second low temperature abnormality determination time at which counting starts at the same time as the time. The temperature abnormality determination device according to claim 7.
When the measured temperature falls below the low temperature abnormality detection threshold, the control unit starts counting the first low temperature abnormality determination time from the time when the temperature falls below the low temperature abnormality detection threshold, and the temperature decrease rate changes. , A temperature abnormality determination device that sets a second low temperature abnormality determination time in which counting is started at the same time as the start time of the first low temperature abnormality determination time according to the temperature decrease rate. The temperature abnormality determination device according to claim 7.
The control unit is a temperature abnormality determination device that sequentially changes the low temperature abnormality determination time according to the temperature decrease rate after the measured temperature falls below the low temperature abnormality detection threshold value. The temperature abnormality determination device according to claim 7.
The control unit has the maximum temperature decrease rate acquired when the measured temperature is below the low temperature abnormality detection threshold after the measured temperature is below the low temperature abnormality detection threshold. A temperature abnormality determination device that sets the low temperature abnormality determination time according to the rate of decrease.

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