JP6902269B2 - Complex, perovskite layer and solar cell - Google Patents
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Description
本発明は,塗布液を塗布した後に,貧溶媒を塗布するまでの時間を十分に確保できるペロブスカイト層の製造方法や,その塗布液に含まれる錯体,ペロブスカイト前駆体,及び太陽電池の製造方法に関する。 The present invention relates to a method for producing a perovskite layer that can secure a sufficient time from application of a coating solution to application of a poor solvent, and a method for producing a complex, a perovskite precursor, and a solar cell contained in the coating solution. ..
国際公開WO2017/104792号パンフレットには,ペロブスカイト構造を有する化合物とジメチルホルムアミド(DMF)分子からなる錯体の他,ペロブスカイト層及び太陽電池の製造方法が記載されている。この公報に記載された太陽電池の製造方法は,ロール・トゥ・ロールによる大量生産を考慮したものである。しかしながら,ペロブスカイト構造を有する化合物とDMFを含む溶液を塗布した後に,貧溶媒を滴下するまでの期間が1〜5秒とされ,しかもできる限り短くする必要があるとされている(段落[0059])。このため,この公報に記載された方法では,ロール・トゥ・ロールにてペロブスカイト層を形成するためには,制約があった。 The pamphlet of WO2017 / 104792 describes a complex consisting of a compound having a perovskite structure and a dimethylformamide (DMF) molecule, as well as a method for producing a perovskite layer and a solar cell. The method for manufacturing a solar cell described in this publication considers mass production by roll-to-roll. However, it is said that the period from application of the solution containing the compound having a perovskite structure and DMF to the addition of the poor solvent is 1 to 5 seconds, and it is necessary to make it as short as possible (paragraph [0059]]. ). Therefore, in the method described in this publication, there is a restriction in forming the perovskite layer by roll-to-roll.
そこで,本発明は,塗布液を塗布した後に,貧溶媒を塗布するまでの時間を十分に確保できるペロブスカイト層の製造方法や,その塗布液に含まれる錯体,ペロブスカイト前駆体,及び太陽電池の製造方法を提供することを目的とする。 Therefore, the present invention relates to a method for producing a perovskite layer that can secure a sufficient time from application of a coating solution to application of a poor solvent, and production of a complex, a perovskite precursor, and a solar cell contained in the coating solution. The purpose is to provide a method.
本発明は,基本的には,ペロブスカイト構造を有する化合物と,所定の化合物を含む溶液を用いることで,貧溶媒を添加するまでに十分な時間を確保できるという実施例による知見に基づく。 The present invention is basically based on the findings of Examples that a sufficient time can be secured until a poor solvent is added by using a compound having a perovskite structure and a solution containing a predetermined compound.
本発明は,第1に錯体に関する。この錯体は,ペロブスカイト材料である。
この錯体は,式(I)で示される化合物と,
(1)1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)ピリミジノン(「DMTHP」と略記),
(2)スルホラン(テトラヒドロチオフェン1,1−オキシド:「SU」と略記),
(3)テトラメチレンスルホキシド(「TS」と略記),又は
(4)N,N−ジメチルアセトアミド(「DMA」と略記)を含む錯体である。
The present invention first relates to complexes. This complex is a perovskite material.
This complex is composed of the compound represented by the formula (I) and
(1) 1,3-dimethyl-3,4,5,6-tetrahydro-2 (1H) pyrimidinone (abbreviated as "DMTHP"),
(2) Sulfolane (tetrahydrothiophene 1,1-oxide: abbreviated as "SU"),
It is a complex containing (3) tetramethylene sulfoxide (abbreviated as "TS") or (4) N, N-dimethylacetamide (abbreviated as "DMA").
AMn1Xm1・・・(I)
(式(I)中,
Aは,メチルアンモニウムカチオン(CH3NH3 +),ホルムアミジニウムカチオン(NH2CHNH2 +)又はセシウムカチオン(Cs+)であり,
Mは,Pb2+,Ge2+,又はSn2+であり,
Xは,F−,Cl−,Br−,又はI−であり,
n1は,0.8〜1.2であり,
m1は,2.8〜3.2である。)
式(I)で示される化合物は,好ましくは,ペロブスカイト構造を有する化合物である。DMTHP,SU,及びDMAは,錯体を構成する分子(L)であることが好ましい。
この錯体は,実質的に,ペロブスカイト構造を有する化合物と分子(L)のみからなるものであってもよいし,不可避不純物といった不純物を含んでいてもよい。この錯体は,例えばアニールすることで,分子(L)が脱離し,ペロブスカイト構造を有する化合物を生ずる。このため,この錯体又はこの錯体を含む組成物は,ペロブスカイト前駆体として機能する。分子(L)は,X線結晶構造解析を行うと,一般的に,式(I)で示される化合物による結晶構造の隙間に,溶媒として取り込まれている状態として観測される。その意味で,分子(L)は,結晶内の溶媒分子(intercalated solvent molecule:結晶溶媒)として存在するものであってもよい。
AM n1 X m1 ... (I)
(In formula (I),
A is methyl ammonium cation (+ CH 3 NH 3), a formamidinium cation (NH 2 CHNH 2 +) or cesium cations (Cs +),
M is Pb 2+ , Ge 2+ , or Sn 2+ .
X is F − , Cl − , Br − , or I − ,
n1 is 0.8 to 1.2,
m1 is 2.8 to 3.2. )
The compound represented by the formula (I) is preferably a compound having a perovskite structure. DMTHP, SU, and DMA are preferably molecules (L) that form a complex.
This complex may substantially consist only of a compound having a perovskite structure and a molecule (L), or may contain impurities such as unavoidable impurities. When this complex is annealed, for example, the molecule (L) is eliminated to give a compound having a perovskite structure. Therefore, this complex or a composition containing this complex functions as a perovskite precursor. When the X-ray crystal structure analysis is performed, the molecule (L) is generally observed as being incorporated as a solvent in the gaps in the crystal structure of the compound represented by the formula (I). In that sense, the molecule (L) may exist as an intercalated solvent molecule (crystal solvent) in the crystal.
次に,本発明は,ペロブスカイト層の製造方法に関する。
この方法は,まず式(I)で示される化合物と,上記の分子(L)を含む溶液を基板に塗布して塗布層を得る。次に,塗布層に貧溶媒を添加する。次に,基板を加熱する。このようにして,ペロブスカイト層を得る。この方法は,溶液を塗布してから,貧溶媒を添加するまでの時間を10秒以上とすることができる(好ましくは5分以下である)。このように,この方法は,貧溶媒を添加するまで比較的十分な時間を確保できるので,ロール・トゥ・ロールといった大量生産に用いることができる。このペロブスカイト層を製造する方法と,公知の方法を組み合わせることで,太陽電池を得ることができる。
Next, the present invention relates to a method for producing a perovskite layer.
In this method, first, a solution containing the compound represented by the formula (I) and the above molecule (L) is applied to a substrate to obtain a coating layer. Next, a poor solvent is added to the coating layer. Next, the substrate is heated. In this way, the perovskite layer is obtained. In this method, the time from the application of the solution to the addition of the poor solvent can be 10 seconds or more (preferably 5 minutes or less). As described above, this method can be used for mass production such as roll-to-roll because a relatively sufficient time can be secured until the poor solvent is added. A solar cell can be obtained by combining a method for producing this perovskite layer with a known method.
本発明は,塗布液を塗布した後に,貧溶媒を塗布するまでの時間を十分に確保できるペロブスカイト層の製造方法や,その塗布液に含まれる錯体,ペロブスカイト前駆体,及び太陽電池の製造方法を提供できる。 The present invention provides a method for producing a perovskite layer that can secure a sufficient time from application of a coating solution to application of a poor solvent, and a method for producing a complex, a perovskite precursor, and a solar cell contained in the coating solution. Can be provided.
以下,図面を用いて本発明を実施するための形態について説明する。本発明は,以下に説明する形態に限定されるものではなく,以下の形態から当業者が自明な範囲で適宜修正したものも含む。 Hereinafter, embodiments for carrying out the present invention will be described with reference to the drawings. The present invention is not limited to the forms described below, and includes those which are appropriately modified by those skilled in the art from the following forms to the extent obvious to those skilled in the art.
本発明は,第1に錯体(本発明の錯体)に関する。この錯体は,ペロブスカイト前駆体である。この錯体は,式(I)で示される化合物(本発明の化合物)と,
(1)1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)ピリミジノン(「DMTHP」と略記),
(2)スルホラン(テトラヒドロチオフェン1,1−オキシド:「SU」と略記),
(3)テトラメチレンスルホキシド(「TS」と略記),又は
(4)N,N−ジメチルアセトアミド(「DMA」と略記)を含む錯体である。
The present invention first relates to a complex (complex of the present invention). This complex is a perovskite precursor. This complex is composed of the compound represented by the formula (I) (the compound of the present invention) and
(1) 1,3-dimethyl-3,4,5,6-tetrahydro-2 (1H) pyrimidinone (abbreviated as "DMTHP"),
(2) Sulfolane (tetrahydrothiophene 1,1-oxide: abbreviated as "SU"),
It is a complex containing (3) tetramethylene sulfoxide (abbreviated as "TS") or (4) N, N-dimethylacetamide (abbreviated as "DMA").
AMn1Xm1・・・(I)
式(I)中,
Aは,メチルアンモニウムカチオン(CH3NH3 +),ホルムアミジニウムカチオン(NH2CHNH2 +),又はセシウムカチオン(Cs+)であり,
Mは,Pb2+,Ge2+,又はSn2+であり,
Xは,F−,Cl−,Br−,又はI−であり,
n1は,0.8〜1.2であり,
m1は,2.8〜3.2である。
AM n1 X m1 ... (I)
In formula (I),
A is methyl ammonium cation (+ CH 3 NH 3), (+ NH 2 CHNH 2) formamidinium cation, or a cesium cation (Cs +),
M is Pb 2+ , Ge 2+ , or Sn 2+ .
X is F − , Cl − , Br − , or I − ,
n1 is 0.8 to 1.2,
m1 is 2.8 to 3.2.
錯体は,以下の式(Ia)で示されるものであってもよい。
AMn1Xm1・(k1)L (Ia)
Lは,上記(1)〜(4)のいずれかの化合物(錯体を構成する分子(L))を示す。
k1は,0.8以上2.2以下の数を示す。
つまり,本発明の錯体は,AMn1Xm11分子あたり,1個又は2個の分子(L)が存在するものが好ましいが,2個以上の分子(L)が存在してもよい。k1は,0.8以上1.2以下でもよいし,1.8以上2.2以下でもよく,
0.9以上2.1以下でもよいし,1又は2でもよい。
The complex may be represented by the following formula (Ia).
AM n1 X m1 · (k 1 ) L (Ia)
L represents any compound (molecule (L) constituting the complex) according to any one of the above (1) to (4).
k 1 indicates a number of 0.8 or more and 2.2 or less.
That is, the complex of the present invention preferably contains one or two molecules (L) per molecule of AM n1 X m1, but may contain two or more molecules (L). k 1 may be 0.8 or more and 1.2 or less, or 1.8 or more and 2.2 or less.
It may be 0.9 or more and 2.1 or less, or 1 or 2.
Aは,メチルアンモニウムカチオン(CH3NH3 +)又はホルムアミジニウムカチオン(NH2CHNH2 +)であることが好ましい。
Mは,Pb2+であることが好ましい。
Xは,Br−,又はI−であることが好ましい。
A is preferably a methyl ammonium cation (CH 3 NH 3 +) or formamidinium cation (NH 2 CHNH 2 +).
M is preferably Pb 2+.
X is preferably Br − or I −.
式(I)で示される化合物の例は,ヨウ化鉛メチルアンモニウム(CH3NH3PbI3:「MAPbI3」と略記),(CH3NH3)2Pb3I8:「MA2Pb3I8」と略記,臭化鉛メチルアンモニウム(CH3NH3PbBr3:「MAPbBr3」と略記),ヨウ化鉛ホルムアミジニウム((NH2)2CHPbI3:「FAPbI3」と略記),及び臭化鉛ホルムアミジニウム((NH2)2CHPbBr3:「FAPbBr3」と略記)である。これらの中では,MAPbI3及びFAPbI3が好ましい。 Examples of the compound represented by the formula (I) are lead methylammonium iodide (CH 3 NH 3 PbI 3 : abbreviated as "MAPbI 3 "), (CH 3 NH 3 ) 2 Pb 3 I 8 : "MA 2 Pb 3". Abbreviated as "I 8 ", lead methylammonium bromide (CH 3 NH 3 PbBr 3 : abbreviated as "MAPbBr 3 "), lead iodide formamidinium ((NH 2 ) 2 CHPbI 3 : abbreviated as "FAPbI 3 "), And lead form amimonium bromide ((NH 2 ) 2 CHPbBr 3 : abbreviated as "FAPbBr 3 "). Of these, MAPbI 3 and FAPbI 3 are preferred.
(1)1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)ピリミジノン(DMTHP),(2)スルホラン(テトラヒドロチオフェン1,1−オキシド:SU),(3)テトラメチレンスルホキシド(「TS」と略記),及び(4)N,N−ジメチルアセトアミド(「DMA」と略記)は,以下の式IIa〜IIdで示される構造を有し,錯体を構成する分子(L)であることが好ましい。これらの化合物(分子(L))を,それぞれLとも略する。Lとして,(1)DMTHP,又は(2)SUが好ましい。また,(2)SUと(3)TSとは,類似した構造及び物性を有しており,同様の化学的挙動を起こすことが想定される。(1)DMTHP及び(4)DMAは,ともにアミド結合を有しており,物性が類似し,同様の化学的挙動を起こすことが想定される。この錯体は,実質的に,ペロブスカイト構造を有する化合物と分子(L)のみからなるものであってもよいし,不可避不純物といった不純物を含んでいてもよい。 (1) 1,3-dimethyl-3,4,5,6-tetrahydro-2 (1H) pyrimidinone (DMTHP), (2) sulfolane (tetrahydrothiophene 1,1-oxide: SU), (3) tetramethylene sulfoxide (Abbreviated as "TS") and (4) N, N-dimethylacetamide (abbreviated as "DMA") are molecules (L) having a structure represented by the following formulas IIa to IId and constituting a complex. It is preferable to have. Each of these compounds (molecule (L)) is also abbreviated as L. As L, (1) DMTHP or (2) SU is preferable. Further, (2) SU and (3) TS have similar structures and physical properties, and are expected to cause similar chemical behavior. It is assumed that both (1) DMTHP and (4) DMA have an amide bond, have similar physical characteristics, and cause similar chemical behavior. This complex may substantially consist only of a compound having a perovskite structure and a molecule (L), or may contain impurities such as unavoidable impurities.
具体的な本発明の錯体の例は,MAPbI3・2DMTHP,FAPbI3・2DMTHP,MAPbBr3・2DMTHP,FAPbBr3・2DMTHP,MAPbI3・SU,FAPbI3・SU,MAPbBr3・SU,FAPbBr3・SU,MAPbI3・TS,FAPbI3・TS,MAPbBr3・TS,FAPbBr3・TS,PBr2(TS)2,MAPbI3・DMA,FAPbI3・DMA,MAPbBr3・DMA,及びFAPbBr3・DMAである。 Examples of complexes of the specific invention, MAPbI 3 · 2DMTHP, FAPbI 3 · 2DMTHP, MAPbBr 3 · 2DMTHP, FAPbBr 3 · 2DMTHP, MAPbI 3 · SU, FAPbI 3 · SU, MAPbBr 3 · SU, FAPbBr 3 · SU , MAPbI 3 · TS, FAPbI 3 · TS, MAPbBr 3 · TS, FAPbBr 3 · TS, PBr 2 (TS) 2 , MAPbI 3 · DMA, FAPbI 3 · DMA, MAPbBr 3 · DMA, and FAPbBr 3 · DMA. ..
上記のような条件を満たす本発明の錯体は,針状の結晶として得られやすい。基板上に膜として形成した場合には,この針状の微結晶は,幅(直径)が10〜100nm(特に20〜80nm),長さが100〜1000nm(特に200〜800nm)が好ましい。この本発明の錯体は,基板上に膜として形成した場合には基板に対して水平方向に配向し,略平坦な膜が得られ得る。なお,本発明において,「略平坦な膜」とは,後述のように,走査型電子顕微鏡で測定した表面の平坦性が,水平方向500nm×500nmの範囲において,高低差が50nm以下であることを意味する。一方,本発明の錯体を単離し,各種原料として用いる場合は,例えば,二層拡散法(再結晶)により,針状の比較的大きな結晶としてもよい。この場合,この針状の微結晶は,幅(直径)が50〜2000μm(特に100〜1000μm),長さが1〜50mm(特に1mm〜3mm)が好ましい。 The complex of the present invention satisfying the above conditions can be easily obtained as needle-shaped crystals. When formed as a film on a substrate, the needle-shaped microcrystals preferably have a width (diameter) of 10 to 100 nm (particularly 20 to 80 nm) and a length of 100 to 1000 nm (particularly 200 to 800 nm). When the complex of the present invention is formed as a film on a substrate, it is oriented in the horizontal direction with respect to the substrate, and a substantially flat film can be obtained. In the present invention, the term "substantially flat film" means that the surface flatness measured by a scanning electron microscope is 50 nm or less in the horizontal direction of 500 nm × 500 nm, as described later. Means. On the other hand, when the complex of the present invention is isolated and used as various raw materials, it may be formed into relatively large needle-shaped crystals by, for example, a two-layer diffusion method (recrystallization). In this case, the needle-shaped crystallites preferably have a width (diameter) of 50 to 2000 μm (particularly 100 to 1000 μm) and a length of 1 to 50 mm (particularly 1 mm to 3 mm).
上記のような条件を満たす本発明の錯体は,分子(L)が脱離することにより,ペロブスカイト材料を得ることができる。つまり,本発明の錯体は,ペロブスカイト前駆体として使用され得る。また,これらの錯体は実施例で示したように元素純度が高いペロブスカイト材料の前駆体として用いることができ,これにより,より高純度のペロブスカイト材料を得ることができる。 In the complex of the present invention satisfying the above conditions, a perovskite material can be obtained by desorbing the molecule (L). That is, the complex of the present invention can be used as a perovskite precursor. Further, these complexes can be used as a precursor of a perovskite material having a high elemental purity as shown in Examples, whereby a perovskite material having a higher purity can be obtained.
本発明の錯体を製造する方法
本発明の錯体を製造する方法は,公知の方法を適宜採用すればよく,例えば,PbX1 2で示される化合物とRX2で示される化合物とを分子(L)を含む第1の有機溶媒に溶解させること(スキーム1)により得ることができる。ここで,X1及びX2は,同一でも異なってもよくハロゲン原子(特にヨウ素原子又は臭素原子)を示す。Rは,MA(メチルアンモニウム)又はFA(ホルムアミジニウム)を示す。
Method for producing a complex of the method of the present invention for producing the complex of the present invention may be appropriately employed any known method, for example, molecules and a compound represented by the compound RX 2 represented by PbX 1 2 (L) It can be obtained by dissolving it in a first organic solvent containing (Scheme 1). Here, X 1 and X 2 may be the same or different, and represent a halogen atom (particularly an iodine atom or a bromine atom). R indicates MA (methylammonium) or FA (formamidinium).
第1の有機溶媒は,分子(L)自体が溶媒であってもよいし,分子(L)以外の溶媒を含んでもよい。本発明の分子(L)以外の溶媒の例は,ジメチルスルホキシド(DMSO)及びγ−ブチロラクトンである。一方,分子(L)以外の溶媒は,本発明の化合物と錯体を形成する能力が強い溶媒でないものが好ましい。第1の有機溶媒が,分子(L)以外の溶媒を含む場合,分子(L)とそれ以外の溶媒のモル比は,4:1以上100:1以下が好ましく,5:1以上10:1以下でもよい。
PbX1 2で示される化合物とRX2で示される化合物とを,第1の有機溶媒に溶解させる際には,各化合物の濃度は,本発明の錯体が得られやすい観点から,PbX1 2で表される化合物の濃度は,例えば0.5〜3.0モル/Lが好ましく,0.8〜2.0モル/Lがより好ましい。また,RX2で示される化合物の濃度は,例えば,0.5〜3.0モル/Lが好ましく,0.8〜2.0モル/Lがより好ましい。
The first organic solvent may be a solvent in the molecule (L) itself, or may contain a solvent other than the molecule (L). Examples of solvents other than the molecule (L) of the present invention are dimethyl sulfoxide (DMSO) and γ-butyrolactone. On the other hand, the solvent other than the molecule (L) is preferably not a solvent having a strong ability to form a complex with the compound of the present invention. When the first organic solvent contains a solvent other than the molecule (L), the molar ratio of the molecule (L) to the other solvent is preferably 4: 1 or more and 100: 1 or less, and 5: 1 or more and 10: 1. It may be as follows.
A compound represented by the compound RX 2 represented by PbX 1 2, when dissolved in the first organic solvent, the concentration of each compound from easy in view of the complex of the present invention can be obtained, in PbX 1 2 The concentration of the represented compound is, for example, preferably 0.5 to 3.0 mol / L, more preferably 0.8 to 2.0 mol / L. The concentration of the compound represented by RX 2 is, for example, preferably 0.5 to 3.0 mol / L, more preferably 0.8 to 2.0 mol / L.
上記の工程(スキーム1)は,例えば,攪拌下,溶媒にPbX1 2とRX2を滴下することにより行う。PbX1 2とRX2のモル比は,通常1:1である。もっとも,PbX1 2とRX2のモル比は,1:3〜3:1でもよいし,1:2〜2:1でもよいし,2:3〜3:2でもよい。攪拌速度は任意であり,10rpm以上200rpm以下でもよい。溶媒は過剰に存在してもよいし,PbX1 21モルに対し,溶媒が1モル又は2モル以上であってもよい。スキーム1は,加熱下に行ってもよい。加熱温度は,PbX1 2,RX2及び第1の有機溶媒に合わせて適宜調整すればよく,加熱温度の例は60℃以上110℃であり,70℃以上100℃以下でもよい。スキーム1の反応時間(滴下時間)は,適宜調整すればよく,例えば,10分以上2時間以下でもよく,15分以上1時間以下でもよいし,20分以上45分以下でもよい。 The above steps (Scheme 1) is carried out, for example, under stirring, by the dropwise addition of PbX 1 2 and RX 2 in a solvent. The molar ratio of PbX 1 2 and RX 2 is usually 1: 1. However, the molar ratio of PbX 1 2 and RX 2 is from 1: 3 to 3: 1, even to good, 1: 2 to 2: 1, even to good, 2: 3 to 3: 2 even better. The stirring speed is arbitrary and may be 10 rpm or more and 200 rpm or less. The solvent may be present in excess, or the solvent may be 1 mol or 2 mol or more with respect to 1 2 1 mol of PbX. Scheme 1 may be carried out under heating. The heating temperature may be appropriately adjusted according to PbX 1 2, RX 2 and the first organic solvent, examples of the heating temperature is 60 ° C. or higher 110 ° C., or at 70 ° C. or higher 100 ° C. or less. The reaction time (dropping time) of Scheme 1 may be appropriately adjusted, and may be, for example, 10 minutes or more and 2 hours or less, 15 minutes or more and 1 hour or less, or 20 minutes or more and 45 minutes or less.
スキーム1の後,溶液を室温まで空冷してもよい。その後,溶液に貧溶媒(第2の有機溶媒)を添加してもよい(スキーム2)。なお,スキーム1の後,溶液を用いて膜を形成し,その膜が乾燥する前に貧溶媒を滴下してもよい。
第2の有機溶媒が拡散して小さく(直径が10〜100nm程度,長さが100〜1000nm程度)針状の結晶からなる本発明の錯体が生成される。貧溶媒を用いることで,本発明の錯体が水平方向に配向し,略平坦な膜が得られやすくなる。
After Scheme 1, the solution may be air cooled to room temperature. After that, a poor solvent (second organic solvent) may be added to the solution (Scheme 2). After Scheme 1, a film may be formed using a solution, and a poor solvent may be added dropwise before the film dries.
The second organic solvent diffuses to produce a complex of the present invention composed of small needle-shaped crystals (diameter: about 10 to 100 nm, length: about 100 to 1000 nm). By using a poor solvent, the complex of the present invention is oriented in the horizontal direction, and a substantially flat film can be easily obtained.
第2の有機溶媒は,第2の有機溶媒が十分に拡散して本発明の錯体を得やすいという観点から,貧溶媒が好ましい。具体的な第2の有機溶媒の例は,トルエン,ベンゼン等の芳香族炭化水素;クロロベンゼン,オルトジクロロベンゼン,ニトロベンゼン等の置換芳香族炭化水素;ジエチルエーテル,テトラヒドロフラン(THF)等のエーテル;メタノール,エタノール,イソプロパノール,ブタノール,オクタノール等のアルコール;ヘキサン等の長鎖炭化水素(特にC4−10炭化水素);ピリジン;アセトニトリルである。これら第2の有機溶媒は,単独で使用することもできるし,2種以上を組合せて使用することもできる。なかでも,本発明の錯体が得られやすい観点から,第2の有機溶媒として,芳香族炭化水素が好ましく,トルエンがより好ましい。 The second organic solvent is preferably a poor solvent from the viewpoint that the second organic solvent is sufficiently diffused to easily obtain the complex of the present invention. Specific examples of the second organic solvent are aromatic hydrocarbons such as toluene and benzene; substituted aromatic hydrocarbons such as chlorobenzene, orthodichlorobenzene and nitrobenzene; ethers such as diethyl ether and tetrahydrofuran (THF); methanol, Alcohols such as ethanol, isopropanol, butanol, octanol; long-chain hydrocarbons such as hexane (particularly C4-10 hydrocarbons); pyridine; acetonitrile. These second organic solvents can be used alone or in combination of two or more. Among them, aromatic hydrocarbons are preferable and toluene is more preferable as the second organic solvent from the viewpoint that the complex of the present invention can be easily obtained.
第2の有機溶媒の添加量は,特に制限されず,第2の有機溶媒が十分に拡散して本発明の錯体を得やすい観点から,第1の有機溶媒の使用量と,第2の有機溶媒の添加量との比が,第2の有機溶媒/第1の有機溶媒=0.05〜2.0/1.0(体積比)が好ましく,0.1〜1.3/1.0(体積比)がより好ましい。 The amount of the second organic solvent added is not particularly limited, and from the viewpoint that the second organic solvent is sufficiently diffused to easily obtain the complex of the present invention, the amount of the first organic solvent used and the amount of the second organic solvent are used. The ratio to the amount of the solvent added is preferably 0.1 to 1.3 / 1.0 (volume ratio) of the second organic solvent / first organic solvent = 0.05 to 2.0 / 1.0 (volume ratio). (Volume ratio) is more preferable.
第2の有機溶媒を添加する場合,第2の有機溶媒が十分に拡散して本発明の錯体を単離しやすいという観点からは,その後長時間放置することが好ましい。例えば,5〜100時間程度,特に10〜50時間程度放置することが好ましい。一方,本錯体を成膜過程で生成させ,平坦性が高く緻密なペロブスカイト膜の中間体として用いる場合は,溶媒の乾燥の制御という観点から,第2の有機溶媒の添加を短時間で行い,その後速やかにアニール過程へと移行することが好ましい。例えば,第1の有機溶媒の溶液をスピンコートなどにより成膜する過程で,終了の1〜5秒で第2の有機溶媒を滴下し,その後5分以内にアニール過程へと移行することが好ましい。 When the second organic solvent is added, it is preferable to leave it for a long time thereafter from the viewpoint that the second organic solvent is sufficiently diffused and the complex of the present invention can be easily isolated. For example, it is preferable to leave it for about 5 to 100 hours, particularly about 10 to 50 hours. On the other hand, when this complex is formed in the film formation process and used as an intermediate for a highly flat and dense perovskite film, a second organic solvent is added in a short time from the viewpoint of controlling the drying of the solvent. After that, it is preferable to immediately shift to the annealing process. For example, in the process of forming a solution of the first organic solvent by spin coating or the like, it is preferable that the second organic solvent is added dropwise within 1 to 5 seconds after the completion, and then the process proceeds to the annealing process within 5 minutes. ..
本発明の錯体や本発明の錯体の膜を加熱すると,分子(L)が分離し,ペロブスカイト化合物が形成される。すなわち,本発明の錯体や本発明の錯体を含む膜は,ペロブスカイト前駆体として機能する。 When the complex of the present invention or the membrane of the complex of the present invention is heated, the molecule (L) is separated to form a perovskite compound. That is, the complex of the present invention and the membrane containing the complex of the present invention function as a perovskite precursor.
ペロブスカイト層を製造する方法
次に,ペロブスカイト層を製造する方法を説明する。この方法は,本発明の錯体を製造する方法を用いて,本発明の錯体を含む膜を形成し,膜(従って基板)をアニール等する方法であってもよい。
この方法は,まず式(I)で示される化合物と,上記の分子(L)を含む溶液を基板に塗布して塗布層を得る。次に,塗布層に貧溶媒を添加する。次に,基板を加熱する。このようにして,ペロブスカイト層を得る。この方法は,溶液を塗布してから,貧溶媒を添加するまでの時間を10秒以上とすることができる(好ましくは30秒以上,1分以上,又は2分以上であり,5分以下であってもよい)。このように,この方法は,貧溶媒を添加するまで比較的十分な時間を確保できるので,ロール・トゥ・ロールといった大量生産に用いることができる。このペロブスカイト層を製造する方法と,公知の方法を組み合わせることで,太陽電池を得ることができる。基板には,既に他の膜が形成されており,その膜の上にペロブスカイト層を形成してもよい。塗布層の膜厚の例は,10nm以上1000nm以下である。膜厚は,50nm以上500nm以下でもよいし,100nm以上500nm以下でもよいし,250nm以上500nm以下でもよい。
Method for Producing Perovskite Layer Next, a method for producing a perovskite layer will be described. This method may be a method of forming a film containing the complex of the present invention by using the method for producing the complex of the present invention, and annealing the film (hence, the substrate) or the like.
In this method, first, a solution containing the compound represented by the formula (I) and the above molecule (L) is applied to a substrate to obtain a coating layer. Next, a poor solvent is added to the coating layer. Next, the substrate is heated. In this way, the perovskite layer is obtained. In this method, the time from the application of the solution to the addition of the poor solvent can be 10 seconds or more (preferably 30 seconds or more, 1 minute or more, or 2 minutes or more, and 5 minutes or less. There may be). As described above, this method can be used for mass production such as roll-to-roll because a relatively sufficient time can be secured until the poor solvent is added. A solar cell can be obtained by combining a method for producing this perovskite layer with a known method. Another film may already be formed on the substrate, and a perovskite layer may be formed on the film. An example of the film thickness of the coating layer is 10 nm or more and 1000 nm or less. The film thickness may be 50 nm or more and 500 nm or less, 100 nm or more and 500 nm or less, or 250 nm or more and 500 nm or less.
次に,本発明の化合物を含む太陽電池(特にペロブスカイト型太陽電池)や,本発明の化合物を含む電子輸送層について説明する。 Next, a solar cell containing the compound of the present invention (particularly a perovskite type solar cell) and an electron transport layer containing the compound of the present invention will be described.
本発明のペロブスカイト型太陽電池は,例えば,透明電極,(正孔)ブロッキング層,電子輸送層,ペロブスカイト層(光吸収層),正孔輸送層,及び金属電極をこの順に備える。 The perovskite-type solar cell of the present invention includes, for example, a transparent electrode, a (hole) blocking layer, an electron transport layer, a perovskite layer (light absorption layer), a hole transport layer, and a metal electrode in this order.
透明電極
透明電極は,電子輸送層の支持体であるとともに,(正孔)ブロッキング層を介してペロブスカイト層(光吸収層)より電流(電子)を取り出す機能を有する層であることから,導電性基板が好ましく,光電変換に寄与する光を透過可能な透光性を有する透明導電層が好ましい。
Transparent electrode The transparent electrode is conductive because it is a support for the electron transport layer and also has a function of extracting current (electrons) from the perovskite layer (light absorption layer) via the (hole) blocking layer. A substrate is preferable, and a transparent conductive layer having translucency capable of transmitting light that contributes to photoelectric conversion is preferable.
当該透明導電層としては,例えば,錫ドープ酸化インジウム(ITO)膜,不純物ドープの酸化インジウム(In2O3)膜,不純物ドープの酸化亜鉛(ZnO)膜,フッ素ドープ二酸化錫(FTO)膜,これらを積層してなる積層膜等が挙げられる。これら透明導電層の厚みは特に制限されず,通常,抵抗が5〜15Ω/□となるように調整することが好ましい。当該透明導電層は,成形する材料に応じ,公知の成膜方法により得ることができる。 Examples of the transparent conductive layer include a tin-doped indium oxide (ITO) film, an impurity-doped indium oxide (In 2 O 3 ) film, an impurity-doped zinc oxide (ZnO) film, and a fluorine-doped tin dioxide (FTO) film. Examples thereof include a laminated film formed by laminating these. The thickness of these transparent conductive layers is not particularly limited, and it is usually preferable to adjust the resistance so that it is 5 to 15 Ω / □. The transparent conductive layer can be obtained by a known film forming method depending on the material to be molded.
また,当該透明導電層は,外部から保護するために,必要に応じて,透光性被覆体により覆われ得る。当該透光性被覆体としては,例えば,フッ素樹脂,ポリ塩化ビニル,ポリイミド等の樹脂シート;白板ガラス,ソーダガラス等の無機シート;これらの素材を組合せてなるハイブリッドシート等が挙げられる。これら透光性被覆体の厚みは特に制限されず,通常,抵抗が5〜15Ω/□となるように調整することが好ましい。 In addition, the transparent conductive layer may be covered with a translucent coating, if necessary, in order to protect it from the outside. Examples of the translucent coating include resin sheets such as fluororesin, polyvinyl chloride, and polyimide; inorganic sheets such as white plate glass and soda glass; and hybrid sheets made by combining these materials. The thickness of these translucent coatings is not particularly limited, and it is usually preferable to adjust the resistance so that it is 5 to 15Ω / □.
(正孔)ブロッキング層
(正孔)ブロッキング層は,正孔の漏れを防ぎ,逆電流を抑制して太陽電池特性(特に光電変換効率)を向上させるために設けられる層であり,透明電極とペロブスカイト層(光吸収層)との間に設けられることが好ましい。(正孔)ブロッキング層は,酸化チタン等の金属酸化物からなる層が好ましく,コンパクトTiO2等のn型半導体で透明電極の表面を平滑且つ緻密に覆った層がより好ましい。「緻密」とは,電子輸送層中の金属化合物の充填密度より高密度で金属化合物が充填されていることを意味する。なお,透明電極と電子輸送層とが電気的に接続されなければ,ピンホール,クラック等が存在していてもよい。
(Hole) blocking layer The (hole) blocking layer is a layer provided to prevent hole leakage, suppress reverse current, and improve solar cell characteristics (particularly photoelectric conversion efficiency). It is preferably provided between the perovskite layer (light absorption layer). The (hole) blocking layer is preferably a layer made of a metal oxide such as titanium oxide, and more preferably a layer in which the surface of the transparent electrode is smoothly and densely covered with an n-type semiconductor such as compact TiO 2. “Dense” means that the metal compound is packed at a density higher than the packing density of the metal compound in the electron transport layer. If the transparent electrode and the electron transport layer are not electrically connected, pinholes, cracks, etc. may be present.
(正孔)ブロッキング層の膜厚は,例えば,5〜300nmである。(正孔)ブロッキング層の膜厚は,電極への電子注入効率の観点より,10〜200nmがより好ましい。 The film thickness of the (hole) blocking layer is, for example, 5 to 300 nm. The film thickness of the (hole) blocking layer is more preferably 10 to 200 nm from the viewpoint of electron injection efficiency into the electrode.
(正孔)ブロッキング層は上記透明電極上に形成される。金属酸化物を(正孔)ブロッキング層に用いる場合,既知の方法に従って(例えば,非特許文献4,J. Phys. D: Appl. Phys. 2008, 41, 102002.等),スプレーパイロリシスを行うことにより作製できる。例えば,200〜550℃(特に300〜500℃)に加熱したホットプレート上に置いた透明電極に0.01〜0.40M(特に0.02〜0.20M)の金属アルコキシド(チタンジ(イソプロポキシド)ビス(アセチルアセトナート)等のチタンアルコキシド等)のアルコール溶液(例えばイソプロピルアルコール溶液等)をスプレーで吹き付けて作製できる。 The (hole) blocking layer is formed on the transparent electrode. When a metal oxide is used for a (hole) blocking layer, spray pyrolysis is performed according to a known method (for example, Non-Patent Document 4, J. Phys. D: Appl. Phys. 2008, 41, 102002.). Can be produced by. For example, 0.01-0.40M (especially 0.02-0.20M) metal alkoxide (titanium di (isopropoxide) bis (acetylacetate)) was placed on a transparent electrode placed on a hot plate heated to 200-550 ° C (especially 300-500 ° C). It can be prepared by spraying an alcohol solution (for example, an isopropyl alcohol solution, etc.) of titanium alkoxide or the like (nato) or the like.
その後,得られた基板を,酸化チタン(TiO2等),チタンアルコキシド(チタンイソプロポキシド等),チタンハロゲン化物(TiCl4等)の水溶液中に浸漬して加熱することで,より緻密な膜とすることもできる。 Then, the obtained substrate is immersed in an aqueous solution of titanium oxide (TiO 2 etc.), titanium alkoxide (titanium isopropoxide etc.), and titanium halide (TiCl 4 etc.) and heated to obtain a more dense film. It can also be.
この水溶液の濃度は,0.1〜1.0mMが好ましく,0.2〜0.7mMがより好ましい。また,浸漬温度は30〜100℃が好ましく,50〜80℃がより好ましい。さらに,加熱条件は200〜1000℃(特に300〜700℃)で5〜60分(特に10〜30分)が好ましい。 The concentration of this aqueous solution is preferably 0.1 to 1.0 mM, more preferably 0.2 to 0.7 mM. The immersion temperature is preferably 30 to 100 ° C, more preferably 50 to 80 ° C. Further, the heating conditions are preferably 200 to 1000 ° C. (particularly 300 to 700 ° C.) for 5 to 60 minutes (particularly 10 to 30 minutes).
電子輸送層
電子輸送層は,ペロブスカイト層(光吸収層)の活性表面積を増加させ,光電変換効率を向上させるとともに,電子収集しやすくするために形成される。電子輸送層は,基板上に形成してもよいが,(正孔)ブロッキング層の上に形成することが好ましい。また,上記の(正孔)ブロッキング層が,電子輸送層として機能してもよいし,電子輸送層が(正孔)ブロッキング層を兼ねてもよい。電子輸送層はフラーレン誘導体等有機半導体材料を用いた平坦な層でもよい。また,電子輸送層は,酸化チタン(TiO2)(メソポーラスTiO2を含む),SnO2層,又はZnO層であってもよい。電子輸送層は,メソポーラスTiO2等多孔質構造を有していることが好ましい。多孔質構造とは,例えば,粒状体,針状体,チューブ状体,柱状体等が集合して,全体として多孔質な性質を有していることが好ましい。また,細孔サイズはナノスケールが好ましい。多孔質構造を有することにより,ナノスケールであるため,光吸収層の活性表面積を著しく増加させ,太陽電池特性(特に光電変換効率)を向上させるとともに,電子収集に優れる多孔質電子輸送層とすることができる。
Electron transport layer The electron transport layer is formed to increase the active surface area of the perovskite layer (light absorption layer), improve the photoelectric conversion efficiency, and facilitate electron collection. The electron transport layer may be formed on the substrate, but is preferably formed on the (hole) blocking layer. Further, the above-mentioned (hole) blocking layer may function as an electron transporting layer, or the electron transporting layer may also serve as a (hole) blocking layer. The electron transport layer may be a flat layer using an organic semiconductor material such as a fullerene derivative. Further, the electron transport layer may be titanium oxide (TiO 2 ) ( including mesoporous TiO 2 ), SnO 2 layer, or ZnO layer. The electron transport layer preferably has a porous structure such as mesoporous nitro 2. As for the porous structure, for example, it is preferable that granules, needles, tubes, columns and the like are aggregated to have a porous property as a whole. The pore size is preferably nanoscale. Since it has a porous structure and is nanoscale, it significantly increases the active surface area of the light absorption layer, improves the solar cell characteristics (particularly photoelectric conversion efficiency), and makes it a porous electron transport layer with excellent electron collection. be able to.
電子輸送層は,酸化チタン,酸化スズ等の金属酸化物からなる層であってもよい。なお,金属化合物が半導体である場合,半導体を使用する場合には,ドナーをドープすることもできる。これにより,電子輸送層がペロブスカイト層(光吸収層)に導入するための窓層となり,且つ,ペロブスカイト層(光吸収層)から得られた電力をより効率よく取り出すことができる。 The electron transport layer may be a layer made of a metal oxide such as titanium oxide or tin oxide. If the metal compound is a semiconductor, or if a semiconductor is used, the donor can be doped. As a result, the electron transport layer becomes a window layer for introducing into the perovskite layer (light absorption layer), and the electric power obtained from the perovskite layer (light absorption layer) can be taken out more efficiently.
電子輸送層の厚みは,特に制限されず,ペロブスカイト層(光吸収層)からの電子をより収集できる観点から,10〜300nm程度が好ましく,10〜250nm程度がより好ましい。電子輸送層は,成形する材料に応じて公知の成膜方法を用いて得ることができる。例えば,(正孔)ブロッキング層の上に,5〜50質量%(特に10〜30質量%)の酸化チタンペーストのアルコール溶液(例えばエタノール溶液等)を塗布して作製することができる。酸化チタンペーストは公知又は市販品を用いることができる。塗布の方法は,スピンコート法が好ましい。なお,塗布は例えば15〜30℃程度で行うことができる。 The thickness of the electron transport layer is not particularly limited, and is preferably about 10 to 300 nm, more preferably about 10 to 250 nm, from the viewpoint of being able to collect more electrons from the perovskite layer (light absorption layer). The electron transport layer can be obtained by using a known film forming method depending on the material to be molded. For example, it can be prepared by applying an alcohol solution (for example, ethanol solution) of titanium oxide paste of 5 to 50% by mass (particularly 10 to 30% by mass) on the (hole) blocking layer. As the titanium oxide paste, a known or commercially available product can be used. The coating method is preferably a spin coating method. The coating can be performed at, for example, about 15 to 30 ° C.
ペロブスカイト層(光吸収層)
ペロブスカイト型太陽電池におけるペロブスカイト層(光吸収層)は,光を吸収し,励起された電子を移動させることにより,光電変換を行う層である。ペロブスカイト層(光吸収層)は,ペロブスカイト材料や,ペロブスカイト錯体を含む。ペロブスカイト層は,先に説明した方法に基づいて製造すればよい。ペロブスカイト層は,ロール・トゥ・ロールによる大量生産を実現することが好ましい。混合液をスピンコート,ディップコート,スクリーン印刷法,ロールコート,ダイコート法,転写印刷法,スプレー法,スリットコート法等,好ましくはスピンコートにより基板上に塗布することが好ましい。
Perovskite layer (light absorption layer)
The perovskite layer (light absorption layer) in a perovskite type solar cell is a layer that performs photoelectric conversion by absorbing light and moving excited electrons. The perovskite layer (light absorption layer) contains a perovskite material and a perovskite complex. The perovskite layer may be produced based on the method described above. The perovskite layer preferably realizes mass production by roll-to-roll. It is preferable to apply the mixed solution on the substrate by spin coating, dip coating, screen printing method, roll coating, die coating method, transfer printing method, spray method, slit coating method, etc., preferably by spin coating.
基板は,成膜する膜を支持できるものであれば特に限定されない。前記基板の材料も,本発明の目的を阻害しない限り特に限定されず,公知の基板であってよく,有機化合物及び無機化合物のいずれも採用し得る。例えば,絶縁体基板,半導体基板,金属基板及び導電性基板(導電性フィルムも含む)のいずれも採用できる。また,これらの表面の一部又は全部の上に,金属膜,半導体膜,導電性膜及び絶縁性膜の少なくとも1種の膜が形成されている基板も好適に用いることができる。 The substrate is not particularly limited as long as it can support the film to be formed. The material of the substrate is not particularly limited as long as it does not impair the object of the present invention, and may be a known substrate, and either an organic compound or an inorganic compound can be adopted. For example, any of an insulator substrate, a semiconductor substrate, a metal substrate, and a conductive substrate (including a conductive film) can be adopted. Further, a substrate in which at least one of a metal film, a semiconductor film, a conductive film and an insulating film is formed on a part or all of these surfaces can also be preferably used.
前記金属膜の構成金属としては,例えば,ガリウム,鉄,インジウム,アルミニウム,バナジウム,チタン,クロム,ロジウム,ニッケル,コバルト,亜鉛,マグネシウム,カルシウム,シリコン,イットリウム,ストロンチウム及びバリウムから選ばれる1種又は2種以上の金属等が挙げられる。半導体膜の構成材料としては,例えば,シリコン,ゲルマニウム等の元素単体,周期表の第3族〜第5族,第13族〜第15族の元素を有する化合物,金属酸化物,金属硫化物,金属セレン化物,金属窒化物等が挙げられる。また,前記導電性膜の構成材料としては,例えば,スズドープ酸化インジウム(ITO),フッ素ドープ酸化インジウム(FTO),酸化亜鉛(ZnO),アルミニウムドープ酸化亜鉛(AZO),ガリウムドープ酸化亜鉛(GZO),酸化スズ(SnO2),酸化インジウム(In2O3),酸化タングステン(WO3)等が挙げられる。前記絶縁性膜の構成材料としては,例えば,酸化アルミニウム(Al2O3),酸化チタン(TiO2),酸化シリコン(SiO2),窒化シリコン(Si3N4),酸窒化シリコン(Si4O5N3)等が挙げられ,絶縁性酸化物からなる絶縁性膜が好ましく,酸化チタン膜がより好ましい。本発明においては,導電性酸化物又は絶縁性酸化物からなる導電性膜が好ましく,スズドープ酸化インジウム(ITO)膜,フッ素ドープ酸化インジウム(FTO)等がより好ましい。 As the constituent metal of the metal film, for example, one selected from gallium, iron, indium, aluminum, vanadium, titanium, chromium, rhodium, nickel, cobalt, zinc, magnesium, calcium, silicon, yttrium, strontium and barium, or one of them. Two or more kinds of metals and the like can be mentioned. Examples of the constituent materials of the semiconductor film include simple elements such as silicon and germanium, compounds having elements of groups 3 to 5 and groups 13 to 15 of the periodic table, metal oxides, and metal sulfides. Examples include metal serene products and metal nitrides. Examples of the constituent material of the conductive film include tin-doped indium oxide (ITO), fluorine-doped indium oxide (FTO), zinc oxide (ZnO), aluminum-doped zinc oxide (AZO), and gallium-doped zinc oxide (GZO). , Tin oxide (SnO 2 ), indium oxide (In 2 O 3 ), tungsten oxide (WO 3 ) and the like. Examples of the constituent materials of the insulating film include aluminum oxide (Al 2 O 3), titanium oxide (TiO 2 ), silicon oxide (SiO 2 ), silicon nitride (Si 3 N 4 ), and silicon nitride (Si 4 O). 5 N 3 ) and the like are mentioned, and an insulating film made of an insulating oxide is preferable, and a titanium oxide film is more preferable. In the present invention, a conductive film made of a conductive oxide or an insulating oxide is preferable, and tin-doped indium oxide (ITO) film, fluorine-doped indium oxide (FTO), and the like are more preferable.
前記基板の形状としては,どのような形状のものであってもよく,あらゆる形状に対して有効であり,例えば,平板や円板等の板状,繊維状,棒状,円柱状,角柱状,筒状,螺旋状,球状,リング状等が挙げられ,多孔質構造体を採用することもできる。本発明においては,板状の基板が好ましい。基板の厚さは,本発明においては特に限定されず,0.1μm〜100mmが好ましく,1μm〜10mmがより好ましい。基板がガラス基板の場合,基板の厚さの例は,0.1mm以上1cm以下であり,0.5mm以上3mm以下でもよいし,0.5mm以上2mm以下でもよい。また,基板が,PET基板や2軸延伸ポリエチレン2,6−ナフタレート(PEN)基板といった樹脂製の基板の場合,基板の厚さの例は,1μm以上200μm以下であり,5μm以上100μm以下でもよいし,10μm以上100μm以下でもよい。 The shape of the substrate may be any shape and is effective for any shape. For example, plate-like, fibrous, rod-like, columnar, prismatic, such as a flat plate or a disk, Cylindrical, spiral, spherical, ring-shaped, etc. can be mentioned, and a porous structure can also be adopted. In the present invention, a plate-shaped substrate is preferable. The thickness of the substrate is not particularly limited in the present invention, and is preferably 0.1 μm to 100 mm, more preferably 1 μm to 10 mm. When the substrate is a glass substrate, an example of the thickness of the substrate may be 0.1 mm or more and 1 cm or less, 0.5 mm or more and 3 mm or less, or 0.5 mm or more and 2 mm or less. When the substrate is a resin substrate such as a PET substrate or a biaxially stretched polyethylene 2,6-naphthalate (PEN) substrate, the thickness of the substrate is 1 μm or more and 200 μm or less, and may be 5 μm or more and 100 μm or less. However, it may be 10 μm or more and 100 μm or less.
ペロブスカイト層は,本発明の錯体から得られるペロブスカイト材料又は本発明のペロブスカイト材料のみからなる層ともし得るし,電子輸送層との接着性の観点より,メソ酸化チタンや酸化アルミニウム等の金属酸化物及びペロブスカイト材料を含む層とすることもできる。 The perovskite layer may be a layer composed only of the perovskite material obtained from the complex of the present invention or the perovskite material of the present invention, and from the viewpoint of adhesion to the electron transport layer, a metal oxide such as titanium oxide or aluminum oxide. And can also be a layer containing a perovskite material.
ペロブスカイト層(光吸収層)の膜厚は,光吸収効率と励起子拡散長とのバランス及び透明電極で反射した光の吸収効率の観点から,例えば,50〜1000nmが好ましく,200〜800nmがより好ましい。なお,本発明のペロブスカイト層(光吸収層)の膜厚は,100〜1000nmの範囲内であることが好ましく,250〜500nmの範囲内であることがより好ましい。具体的には,本発明のペロブスカイト層(光吸収層)の膜厚の下限値が100nm以上(特に250nm)以上であり,上限値が1000nm以下(特に500nm以下)であることが好ましい。本発明のペロブスカイト層(光吸収層)の膜厚は,本発明の錯体からなる膜の断面走査型電子顕微鏡(断面SEM)により測定する。 The film thickness of the perovskite layer (light absorption layer) is preferably, for example, 50 to 1000 nm, more preferably 200 to 800 nm, from the viewpoint of the balance between the light absorption efficiency and the exciton diffusion length and the absorption efficiency of the light reflected by the transparent electrode. preferable. The film thickness of the perovskite layer (light absorption layer) of the present invention is preferably in the range of 100 to 1000 nm, and more preferably in the range of 250 to 500 nm. Specifically, it is preferable that the lower limit of the film thickness of the perovskite layer (light absorption layer) of the present invention is 100 nm or more (particularly 250 nm) or more, and the upper limit is 1000 nm or less (particularly 500 nm or less). The thickness of the perovskite layer (light absorption layer) of the present invention is measured by a cross-section scanning electron microscope (cross-section SEM) of a film made of the complex of the present invention.
また,本発明のペロブスカイト層(光吸収層)の平坦性は,走査型電子顕微鏡により測定した表面の水平方向500nm×500nmの範囲において高低差が50nm以下(−25nm〜+25nm)であるものが好ましく,高低差が40nm以下(−20nm〜+20nm)がより好ましい。これにより,光吸収効率と励起子拡散長とのバランスをより取りやすくし,透明電極で反射した光の吸収効率をより向上させることができる。なお,ペロブスカイト層(光吸収層)の平坦性とは,任意に決定した測定点を基準点とし,測定範囲内において最も膜厚が大きいところとの差を上限値,最も小さいところとの差を下限値としており,本発明のペロブスカイト層(光吸収層)の断面走査型電子顕微鏡(断面SEM)により測定する。 Further, the flatness of the perovskite layer (light absorption layer) of the present invention is preferably one in which the height difference is 50 nm or less (-25 nm to + 25 nm) in the horizontal direction of 500 nm × 500 nm of the surface measured by a scanning electron microscope. , The height difference is more preferably 40 nm or less (-20 nm to + 20 nm). This makes it easier to balance the light absorption efficiency and the exciton diffusion length, and further improves the absorption efficiency of the light reflected by the transparent electrode. The flatness of the perovskite layer (light absorption layer) is defined by using an arbitrarily determined measurement point as a reference point, the upper limit of the difference from the largest film thickness in the measurement range, and the difference from the smallest measurement range. The lower limit is measured by a cross-section scanning electron microscope (cross-section SEM) of the perovskite layer (light absorption layer) of the present invention.
正孔輸送層
正孔輸送層は,電荷を輸送する機能を有する層である。正孔輸送層には,例えば,導電体,半導体,有機正孔輸送材料等を用いることができる。当該材料は,ペロブスカイト層(光吸収層)から正孔を受け取り,正孔を輸送する正孔輸送材料として機能し得る。正孔輸送層はペロブスカイト層(光吸収層)上に形成される。当該導電体及び半導体としては,例えば,CuI,CuInSe2,CuS等の1価銅を含む化合物半導体;GaP,NiO,CoO,FeO,Bi2O3,MoO2,Cr2O3等の銅以外の金属を含む化合物が挙げられる。なかでも,より効率的に正孔のみを受け取り,より高い正孔移動度を得る観点から,1価銅を含む半導体が好ましく,CuIがより好ましい。有機正孔輸送材料としては,例えば,ポリ−3−ヘキシルチオフェン(P3HT),ポリエチレンジオキシチオフェン(PEDOT)等のポリチオフェン誘導体;2,2’,7,7’−テトラキス-(N,N−ジ−p−メトキシフェニルアミン)−9,9’−スピロビフルオレン(spiro−OMeTAD)等のフルオレン誘導体;ポリビニルカルバゾール等のカルバゾール誘導体;ポリ[ビス(4−フェニル)(2,4,6−トリメチルフェニル)アミン](PTAA)等のトリフェニルアミン誘導体;ジフェニルアミン誘導体;ポリシラン誘導体;ポリアニリン誘導体等が挙げられる。なかでも,より効率的に正孔のみを受け取り,より高い正孔移動度を得る観点から,トリフェニルアミン誘導体,フルオレン誘導体等が好ましく,PTAA,spiro−OMeTADなどがより好ましい。
Hole transport layer The hole transport layer is a layer that has the function of transporting electric charges. For the hole transport layer, for example, a conductor, a semiconductor, an organic hole transport material, or the like can be used. The material can function as a hole transport material that receives holes from the perovskite layer (light absorption layer) and transports holes. The hole transport layer is formed on the perovskite layer (light absorption layer). Examples of the conductor and semiconductor include compound semiconductors containing monovalent copper such as CuI, CuInSe 2 , and CuS; other than copper such as GaP, NiO, CoO, FeO, Bi 2 O 3 , MoO 2 , and Cr 2 O 3. Examples include compounds containing the above metals. Among them, a semiconductor containing monovalent copper is preferable, and CuI is more preferable, from the viewpoint of receiving only holes more efficiently and obtaining higher hole mobility. Examples of the organic hole transport material include polythiophene derivatives such as poly-3-hexylthiophene (P3HT) and polyethylenedioxythiophene (PEDOT); 2,2', 7,7'-tetrax- (N, N-di). Fluolene derivatives such as -p-methoxyphenylamine) -9,9'-spiro-OMeTAD; carbazole derivatives such as polyvinylcarbazole; poly [bis (4-phenyl) (2,4,6-trimethylphenyl) ) Amin] (PTAA) and other triphenylamine derivatives; diphenylamine derivatives; polysilane derivatives; polyaniline derivatives and the like. Among them, triphenylamine derivatives, fluorene derivatives and the like are preferable, and PTAA, spiro-OMeTAD and the like are more preferable, from the viewpoint of receiving only holes more efficiently and obtaining higher hole mobility.
正孔輸送層中には,正孔輸送特性をさらに向上させることを目的として,リチウムビス(トリフルオロメチルスルホニル)イミド(LiTFSI),銀ビス(トリフルオロメチルスルホニル)イミド,トリフルオロメチルスルホニルオキシ銀,NOSbF6,SbCl5,SbF5等の酸化剤を含むこともできる。また,正孔輸送層中には,t−ブチルピリジン(TBP),2−ピコリン,2,6−ルチジン等の塩基性化合物を含むこともできる。酸化剤及び塩基性化合物の含有量は,従来から通常使用される量とすることができる。正孔輸送層の膜厚は,より効率的に正孔のみを受け取り,より高い正孔移動度を得る観点から,例えば,30〜200nmが好ましく,50〜100nmがより好ましい。正孔輸送層を成膜する方法は,例えば,乾燥雰囲気下で行うことが好ましい。例えば,有機正孔輸送材料を含む溶液を,乾燥雰囲気下,ペロブスカイト層(光吸収層)上に塗布(スピンコート等)し,30〜150℃(特に50〜100℃)で加熱することが好ましい。 In the hole transport layer, lithium bis (trifluoromethylsulfonyl) imide (LiTFSI), silver bis (trifluoromethylsulfonyl) imide, and trifluoromethylsulfonyloxy silver are used for the purpose of further improving the hole transport characteristics. , NOSbF 6 , SbCl 5 , SbF 5 and the like can also be included. In addition, the hole transport layer may contain basic compounds such as t-butylpyridine (TBP), 2-picoline, and 2,6-lutidine. The contents of the oxidizing agent and the basic compound can be the amounts normally used conventionally. The film thickness of the hole transport layer is preferably, for example, 30 to 200 nm, more preferably 50 to 100 nm, from the viewpoint of receiving only holes more efficiently and obtaining higher hole mobility. The method of forming the hole transport layer is preferably performed in a dry atmosphere, for example. For example, it is preferable to apply a solution containing an organic hole transport material on a perovskite layer (light absorption layer) (spin coating or the like) in a dry atmosphere and heat it at 30 to 150 ° C. (particularly 50 to 100 ° C.). ..
金属電極
金属電極は,透明電極に対向配置され,正孔輸送層の上に形成されることで,正孔輸送層と電荷のやり取りが可能である。金属電極としては,当業界で用いられる公知の素材を用いることが可能であり,例えば,白金,チタン,ステンレス,アルミニウム,金,銀,ニッケル等の金属又はこれらの合金が挙げられる。これらの中でも金属電極は,乾燥雰囲気下で電極を形成することができる点から,蒸着等の方法で形成できる材料が好ましい。 上記層構成以外の構成を有するペロブスカイト型太陽電池についても,同様の方法により,製造することができる。
Metal electrode The metal electrode is arranged opposite to the transparent electrode and is formed on the hole transport layer so that electric charges can be exchanged with the hole transport layer. As the metal electrode, a known material used in the art can be used, and examples thereof include metals such as platinum, titanium, stainless steel, aluminum, gold, silver, and nickel, or alloys thereof. Among these, the metal electrode is preferably a material that can be formed by a method such as thin film deposition because the electrode can be formed in a dry atmosphere. A perovskite type solar cell having a structure other than the above layer structure can also be manufactured by the same method.
有機エレクトロルミネッセンス素子(有機EL素子)
有機EL素子は,例えば特開2017−123352号公報,特開2015−071619号公報に記載される通り,公知の素子であり,その製造方法も公知である。有機EL素子の例は,基板と,陽極と,陰極と,陽極と陰極との間に配置された有機層と,を有する。 そして,有機層は,陽極側から順に,正孔注入層,正孔輸送層,発光層,電子輸送層,および電子注入層が,この順番で積層されて構成される。本発明の化合物は,電子輸送層における電子輸送材料として用いることができる。
Organic electroluminescence element (organic EL element)
The organic EL element is a known element as described in, for example, JP-A-2017-123352 and JP-A-2015-071619, and a method for manufacturing the organic EL element is also known. An example of an organic EL device has a substrate, an anode, a cathode, and an organic layer arranged between the anode and the cathode. The organic layer is composed of a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer laminated in this order from the anode side. The compound of the present invention can be used as an electron transport material in the electron transport layer.
本発明は,太陽電池の製造方法をも提供する。この方法は,先に説明したペロブスカイト層の製造方法を用いて,基板上に,電子輸送(ブロッキング)層を形成する工程と,電子輸送層上にペロブスカイト層を形成する工程と,ペロブスカイト層上にホール輸送層を形成する工程と,ホール輸送層上に電極を形成する工程とを含む。 The present invention also provides a method for manufacturing a solar cell. This method uses the method for producing a perovskite layer described above to form an electron transporting (blocking) layer on a substrate, a step of forming a perovskite layer on an electron transporting layer, and a step of forming a perovskite layer on the perovskite layer. It includes a step of forming a hole transport layer and a step of forming an electrode on the hole transport layer.
CH 3 NH 3 PbI 3 ・2DMTHP (MAPbI 3 ・2DMTHP)の合成
1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)−ピリミジノン(1,3−Dimethyl−3,4,5,6−tetrahydro−2(1H)−pyrimidinone:DMTHP) 7.0 mL 中にPbI2 (2.34 g, 5.0 mmol)とヨウ化メチルアンモニウム(MAI; CH3NH3I; 800 mg, 5.0 mmol)を添加し,80 ℃ で 30 分間攪拌した後に室温まで放冷して橙色溶液を得た.スクリュー管に当該溶液を投入し,貧溶媒としてトルエンを 20 mL加えた.容器にフタをして室温で 3日間静置することで,合計 4.28 g(収率96%)の淡黄色針状の結晶を回収した.得られた淡黄色針状結晶に対して,ブルカー社製単結晶CCD−X線回析計(Bruker Single Crystal CCD X−ray Diffractometer)スマートアペックスIIウルトラ(SMART APEX II ULTRA),X線源:Mo Kα照射(radiation) (λ= 0.71073 Å))を用いて結晶を 100 Kに冷却して測定を行った.2θ角が 51.0 °の範囲において全部で 24994 個の反射を観測した.これらのうち 6989 個の反射が独立であり,Rint値は0.0230であった.直接法により解析した結晶データは以下の通りである.
CH 3 Synthesis of NH 3 PbI 3 · 2DMTHP (MAPbI 3 · 2DMTHP)
1,3-Dimethyl-3,4,5,6-Tetrahydro-2 (1H) -pyrimidinone (1,3-Dimethyl-3,4,5,6-tetrahydro-2 (1H) -pyrimidinone: DMTHP) 7.0 mL PbI 2 (2.34 g, 5.0 mmol) and methylammonium iodide (MAI; CH 3 NH 3 I; 800 mg, 5.0 mmol) were added thereto, and the mixture was stirred at 80 ° C. for 30 minutes and then at room temperature. The mixture was allowed to cool to obtain an orange solution. The solution was put into a screw tube, and 20 mL of toluene was added as a poor solvent. By covering the container with a lid and letting it stand at room temperature for 3 days, a total of 4.28 g (yield 96%) of pale yellow needle-shaped crystals were recovered. For the obtained pale yellow needle-shaped crystals, Bruker Single Crystal CCD X-ray Diffractometer, SMART APEX II ULTRA, X-ray source: Mo Kα The crystals were cooled to 100 K using radiation (λ = 0.71073 Å)) and measured. A total of 24994 reflections were observed in the range of 2θ angle of 51.0 °. Of these, 6989 reflections were independent and the Rint value was 0.0230. The crystal data analyzed by the direct method is as follows.
C26H60I6N10O4Pb2; FW = 1752.62, crystal size 0.20 × 0.11 × 0.07 mm3, Orthorhombic, Pna21, a = 15.9292(12) Å, b = 20.0253(15) Å, c = 15.2483(11) Å, V = 4864.0(6) Å3, Z = 4, Dc = 2.393 g cm−3. The refinement converged to R1 = 0.0233, wR2 = 0.0435 (I > 2σ(I)), GOF = 1.035 C 26 H 60 I 6 N 10 O 4 Pb 2 ; F W = 1752.62, crystal size 0.20 × 0.11 × 0.07 mm 3 , Orthorhombic, Pna2 1 , a = 15.9292 (12) Å, b = 20.0253 (15) Å, c = 15.2483 (11) Å, V = 4864.0 (6) Å 3 , Z = 4, Dc = 2.393 g cm -3 . The refinement converged to R1 = 0.0233, wR 2 = 0.0435 (I> 2σ (I)), GOF = 1.035
単離した化合物の元素分析結果からCH3NH3PbI3・2DMTHP (MAPbI3・2DMTHP)であることを明らかにした.Anal. Calcd. for C13H30N5O2PbI3: C, 17.82; H, 3.45; N, 7.99%; Found: C, 17.81; H, 3.37; N, 7.89%. Elemental analysis of the isolated compound was revealed to be a CH 3 NH 3 PbI 3 · 2DMTHP (MAPbI 3 · 2DMTHP). Anal. Calcd. For C 13 H 30 N 5 O 2 PbI 3 : C, 17.82; H, 3.45; N, 7.99%; Found: C, 17.81; H, 3.37; N, 7.89%.
CH(NH2)2PbI3・2DMTHP (FAPbI3・2DMTHP)の合成
1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)−ピリミジノン(1,3−Dimethyl−3,4,5,6−tetrahydro−2(1H)−pyrimidinone :DMTHP) 1.5 mL 中にPbI2 (463 mg, 1.0 mmol)とヨウ化ホルムアミジニウム(FAI; CH(NH2)2I; 176 mg, 1.0 mmol)を添加し,90 ℃ で 30 分間攪拌した後に室温まで放冷して橙色溶液を得た.スクリュー管に当該溶液を投入し,貧溶媒としてトルエンを 5 mL加えた.容器にフタをして室温で 1 週間静置することで,合計 764 mg(収率85%)の淡黄色針状の結晶を回収した.得られた淡黄色針状結晶に対して,Bruker Single Crystal CCD X−ray Diffractometer(SMART APEX II ULTRA,X線源:Mo Kα radiation (λ= 0.71073 Å))を用いて結晶を 100 Kに冷却して測定を行った.2θ角が 51.0 °の範囲において全部で 6419 個の反射を観測した.これらのうち 4697 個の反射が独立であり,Rint値は0.0191であった.直接法により解析した結晶データは以下の通りである.
Synthesis of CH (NH 2 ) 2 PbI 3・ 2DMTHP (FAPbI 3・ 2DMTHP)
1,3-Dimethyl-3,4,5,6-Tetrahydro-2 (1H) -pyrimidinone (1,3-Dimethyl-3,4,5,6-tetrahydro-2 (1H) -pyrimidinone: DMTHP) 1.5 mL Pb I 2 (463 mg, 1.0 mmol) and formamidinium iodide (FAI; CH (NH 2 ) 2 I; 176 mg, 1.0 mmol) were added thereto, and the mixture was stirred at 90 ° C. for 30 minutes and then allowed to cool to room temperature. To obtain an orange solution. The solution was put into a screw tube, and 5 mL of toluene was added as a poor solvent. By covering the container with a lid and letting it stand at room temperature for 1 week, a total of 764 mg (yield 85%) of pale yellow needle-shaped crystals were recovered. The obtained pale yellow acicular crystals were cooled to 100 K using a Bruker Single Crystal CCD X-ray Diffractometer (SMART APEX II ULTRA, X-ray source: Mo Kα radiation (λ = 0.71073 Å)). The measurement was performed. A total of 6419 reflections were observed in the range of 2θ angle of 51.0 °. Of these, 4697 reflections were independent and the Rint value was 0.0191. The crystal data analyzed by the direct method is as follows.
C13H29I3N6O2Pb; FW = 889.31, crystal size 0.16 × 0.10 × 0.07 mm3, Triclinic, P−1, a = 8.0581(16) Å, b = 11.270(2) Å, c = 14.379(3) Å, V = 1203.2(4) Å3, Z = 2, Dc = 2.455 g cm−3. The refinement converged to R1 = 0.0339, wR2 = 0.0875 (I > 2σ(I)), GOF = 1.049 C 13 H 29 I 3 N 6 O 2 Pb; F W = 889.31, crystal size 0.16 x 0.10 x 0.07 mm 3 , Triclinic, P-1, a = 8.0581 (16) Å, b = 11.270 (2) Å, c = 14.379 (3) Å, V = 1203.2 (4) Å 3 , Z = 2, Dc = 2.455 g cm -3 . The refinement converged to R1 = 0.0339, wR 2 = 0.0875 (I> 2σ (I)), GOF = 1.049
単離した化合物の元素分析結果からCH(NH2)2PbI3・2DMTHP (FAPbI3・2DMTHP)であることを明らかにした.Anal. Calcd. for C13H29N6O2PbI3: C, 17.56; H, 3.29; N, 9.45%; Found: C, 17.94; H, 3.33; N, 9.55%. Elemental analysis of the isolated compound was revealed to be a CH (NH 2) 2 PbI 3 · 2DMTHP (FAPbI 3 · 2DMTHP). Anal. Calcd. For C 13 H 29 N 6 O 2 PbI 3 : C, 17.56; H, 3.29; N, 9.45%; Found: C, 17.94; H, 3.33; N, 9.55%.
CH 3 NH 3 PbBr 3 ・2DMTHP (MAPbBr 3 ・2DMTHP)の合成
1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)−ピリミジノン(1,3−Dimethyl−3,4,5,6−tetrahydro−2(1H)−pyrimidinone :DMTHP) 1.5 mL 中にPbBr2 (368 mg, 1.0 mmol)と臭化メチルアンモニウム(MABr; CH3NH3Br; 116 mg, 1.0 mmol)を添加し,90 ℃ で 30 分間攪拌した後に室温まで放冷して無色透明溶液を得た.スクリュー管に当該溶液を投入し,貧溶媒としてトルエンを 5 mL加えた.容器にフタをして室温で 1 週間静置することで,合計 400 mg(収率54%)の無色針状の結晶を回収した.得られた結晶に対して,Bruker Single Crystal CCD X−ray Diffractometer(SMART APEX II ULTRA,X線源:Mo Kα radiation (λ= 0.71073 Å))を用いて結晶を 100 Kに冷却して測定を行った.2θ角が 51.0 °の範囲において全部で 13221 個の反射を観測した.これらのうち 2908 個の反射が独立であり,Rint値は0.0303であった.直接法により解析した結晶データは以下の通りである.
CH 3 Synthesis of NH 3 PbBr 3 · 2DMTHP (MAPbBr 3 · 2DMTHP)
1,3-Dimethyl-3,4,5,6-Tetrahydro-2 (1H) -pyrimidinone (1,3-Dimethyl-3,4,5,6-tetrahydro-2 (1H) -pyrimidinone: DMTHP) 1.5 mL PbBr 2 (368 mg, 1.0 mmol) and methylammonium bromide (MABr; CH 3 NH 3 Br; 116 mg, 1.0 mmol) were added thereto, and the mixture was stirred at 90 ° C. for 30 minutes and then allowed to cool to room temperature to be colorless. A clear solution was obtained. The solution was put into a screw tube, and 5 mL of toluene was added as a poor solvent. By covering the container with a lid and letting it stand at room temperature for 1 week, a total of 400 mg (yield 54%) of colorless needle-shaped crystals was recovered. The obtained crystal was cooled to 100 K using a Bruker Single Crystal CCD X-ray Diffractometer (SMART APEX II ULTRA, X-ray source: Mo Kα radiation (λ = 0.71073 Å)) and measured. It was. A total of 13221 reflections were observed in the range of 2θ angle of 51.0 °. Of these, 2908 reflections were independent and the Rint value was 0.0303. The crystal data analyzed by the direct method is as follows.
C13H30IBr3N5O2Pb; FW = 735.34, crystal size 0.16 × 0.10 × 0.07 mm3, Orthorhombic, Pnma, a = 7.7783(10) Å, b = 16.821(2) Å, c = 20.212(3) Å, V = 2644.5(6) Å3, Z = 8, Dc = 3.694 g cm−3. The refinement converged to R1 = 0.0399, wR2 = 0.1186 (I > 2σ(I)), GOF = 1.261 C 13 H 30 IBr 3 N 5 O 2 Pb; F W = 735.34, crystal size 0.16 x 0.10 x 0.07 mm 3 , Orthorhombic, Pnma, a = 7.7783 (10) Å, b = 16.821 (2) Å, c = 20.212 (3) Å, V = 2644.5 (6) Å 3 , Z = 8, Dc = 3.694 g cm -3 . The refinement converged to R1 = 0.0399, wR 2 = 0.1186 (I> 2σ (I)), GOF = 1.261
CH3NH3PbI3・スルホラン(Sulfolane) (MAPbI3・スルホラン(Sulfolane))の合成
テトラヒドロチオフェン1,1−ジオキシド(スルホラン)(Tetrahydrothiophene 1,1−Dioxide (Sulfolane)) 7.0 mL 中にPbI2 (1.21 g, 2.6 mmol)とヨウ化メチルアンモニウム(MAI; CH3NH3I; 406 mg, 2.6 mmol)を添加し,80 ℃ で 30 分間攪拌した後に室温まで放冷して黄色溶液を得た.スクリュー管に当該溶液を投入し,貧溶媒としてトルエンを 7 mL加えた.容器にフタをして室温で 4日間静置することで,合計 1.88 g(収率97%)の淡黄色針状の結晶を回収した.得られた淡黄色針状結晶に対して,Bruker Single Crystal CCD X−ray Diffractometer(SMART APEX II ULTRA,X線源:Mo Kα radiation (λ= 0.71073 Å))を用いて結晶を 100 Kに冷却して測定を行った.
Synthesis of CH 3 NH 3 PbI 3 Sulfolane (MAPbI 3 Sulfolane) PbI 2 (Tetrahydrothiophene 1,1-Dioxide (Sulfolane)) in 7.0 mL 1.21 g, 2.6 mmol) and methylammonium iodide (MAI; CH 3 NH 3 I; 406 mg, 2.6 mmol) were added, and the mixture was stirred at 80 ° C. for 30 minutes and allowed to cool to room temperature to obtain a yellow solution. The solution was put into a screw tube, and 7 mL of toluene was added as a poor solvent. By covering the container with a lid and letting it stand at room temperature for 4 days, a total of 1.88 g (yield 97%) of pale yellow needle-shaped crystals were recovered. The obtained pale yellow acicular crystals were cooled to 100 K using a Bruker Single Crystal CCD X-ray Diffractometer (SMART APEX II ULTRA, X-ray source: Mo Kα radiation (λ = 0.71073 Å)). The measurement was performed.
CH(NH2)2PbI3・スルホラン(Sulfolane) (FAPbI3・スルホラン(Sulfolane))の合成
テトラヒドロチオフェン1,1−ジオキシド(スルホラン)(Tetrahydrothiophene 1,1−Dioxide (Sulfolane)) 2.0 mL 中にPbI2 (460 mg, 1.0 mmol)とヨウ化ホルムアミジニウム(FAI; CH(NH2)2I; 177 mg, 1.0 mmol)を添加し,90 ℃ で 30 分間攪拌した後に室温まで放冷して黄色溶液を得た.スクリュー管に当該溶液を投入し,貧溶媒としてトルエンを 7 mL加えた.容器にフタをして室温で 4日間静置することで,合計 671 mg(収率89%)の淡黄色針状の結晶を回収した.得られた淡黄色針状結晶に対して,Bruker Single Crystal CCD X−ray Diffractometer(SMART APEX II ULTRA,X線源:Mo Kα radiation (λ= 0.71073 Å))を用いて結晶を 100 Kに冷却して測定を行った.得られた結晶に対して,Bruker Single Crystal CCD X−ray Diffractometer(SMART APEX II ULTRA,X線源:Mo Kα radiation (λ= 0.71073 Å))を用いて結晶を 100 Kに冷却して測定を行った.2θ角が 50.5 °の範囲において全部で 7945 個の反射を観測した.これらのうち 1770 個の反射が独立であり,Rint値は0.0255であった.直接法により解析した結晶データは以下の通りである.
C5H13I3N2O2PbS; FW = 735.12, crystal size 0.28 × 0.13 × 0.08 mm3, Orthorhombic, Pbcm, a = 11.6247(14) Å, b = 7.8287(10) Å, c = 17.740(2) Å, V = 1614.4(3) Å3, Z = 8, Dc = 6.197 g cm−3. The refinement converged to R1 = 0.0187, wR2 = 0.0438 (I > 2σ(I)), GOF = 1.152.
単離した化合物の元素分析結果からCH(NH2)2PbI3・Sulfolane (FAPbI3・Sulfolane)であることを明らかにした.Anal. Calcd. for C5H13N2O2SPbI3: C, 7.97; H, 1.74; N, 3.72; S, 4.26%; Found: C, 8.21; H, 1.74; N, 3.69; S, 4.55%.
CH (NH 2 ) 2 PbI 3 Sulfolane (FAPbI 3 Sulfolane) Synthesis Tetrahydrothiophene 1,1-Dioxide (Sulfolane) PbI in 2.0 mL Add 2 (460 mg, 1.0 mmol) and formamidinium iodide (FAI; CH (NH 2 ) 2 I; 177 mg, 1.0 mmol), stir at 90 ° C for 30 minutes, allow to cool to room temperature, and yellow. A solution was obtained. The solution was put into a screw tube, and 7 mL of toluene was added as a poor solvent. By covering the container with a lid and letting it stand at room temperature for 4 days, a total of 671 mg (yield 89%) of pale yellow needle-shaped crystals were recovered. The obtained pale yellow acicular crystals were cooled to 100 K using a Bruker Single Crystal CCD X-ray Diffractometer (SMART APEX II ULTRA, X-ray source: Mo Kα radiation (λ = 0.71073 Å)). The measurement was performed. The obtained crystal was cooled to 100 K using a Bruker Single Crystal CCD X-ray Diffractometer (SMART APEX II ULTRA, X-ray source: Mo Kα radiation (λ = 0.71073 Å)) and measured. It was. A total of 7945 reflections were observed in the range of 2θ angle of 50.5 °. Of these, 1770 reflections were independent and the R int value was 0.0255. The crystal data analyzed by the direct method is as follows.
C 5 H 13 I 3 N 2 O 2 PbS; F W = 735.12, crystal size 0.28 x 0.13 x 0.08 mm 3 , Orthorhombic, Pbcm, a = 11.6247 (14) Å, b = 7.8287 (10) Å, c = 17.740 (2) Å, V = 1614.4 (3) Å 3 , Z = 8, Dc = 6.197 g cm -3 . The refinement converged to R 1 = 0.0187, wR 2 = 0.0438 (I> 2σ (I)), GOF = 1.152.
From the elemental analysis results of the isolated compound, it was clarified that it was CH (NH 2 ) 2 PbI 3 · Sulfolane (FAPbI 3 · Sulfolane). Anal. Calcd. For C 5 H 13 N 2 O 2 SPbI 3 : C, 7.97; H, 1.74; N, 3.72; S, 4.26%; Found: C, 8.21; H, 1.74; N, 3.69; S, 4.55 %.
塗膜形成から貧溶媒滴下までの時間についての検討
ITO付ガラス基板(25 mm×24 mm,ジオマテック)を,水,アセトン,セミコクリーン56,水,エタノールの順でそれぞれ15分間超音波洗浄した.最後に,15分間のUVオゾン洗浄を行った.
上記ITO基板に,SnO2のコロイド水溶液(アフラ アエサー社製)を蒸留水で薄め,400μL/枚でスピンコート塗布した.スピンコート条件は,3秒間で3000rpmにして30秒間回転させ,その後3秒間のスロープで0rpmとした。その後,ホットプレートを用いて150℃で30分アニールした。
Examination of the time from the formation of the coating film to the dropping of the poor solvent The glass substrate with ITO (25 mm × 24 mm, Geomatec) was ultrasonically cleaned in the order of water, acetone, semicoclean 56, water, and ethanol for 15 minutes each. Finally, UV ozone washing was performed for 15 minutes.
A colloidal aqueous solution of SnO 2 (manufactured by Afra Aesar Co., Ltd.) was diluted with distilled water and spin-coated at 400 μL / sheet on the above ITO substrate. The slope was set to 0 rpm. Then, it was annealed at 150 ° C. for 30 minutes using a hot plate.
PbI2及びMAIを1:1(モル比)で含む混合物に対して,DMTHPを濃度が1.5 Mになるように加えた.この溶液をスピンコート塗布した。溶液を塗布してから10秒後,1分後又は5分後にトルエン(700μL)をスピンコート塗布した。得られたフィルムを100℃でアニールすることでペロブスカイト層を作製した. DMTHP was added to a mixture containing PbI 2 and MAI in a ratio of 1: 1 (molar ratio) to a concentration of 1.5 M. This solution was spin coated. Toluene (700 μL) was spin-coated 10 seconds, 1 minute, or 5 minutes after the solution was applied. A perovskite layer was prepared by annealing the obtained film at 100 ° C.
正孔輸送材料(Spiro−OMeTAD; 2,2’,7,7’−テトラキス(N,N−ジ−p−メトキシフェニルアミン)−9,9’−スピロビフルオレン, 73.6mg),[トリス(2−(1H−ピラゾル−1−イル)−4−tert−ブチルピリジン)コバルト(III)トリス(ビス(トリフルオロメチルスルホニル)イミド)](FK209, 13.3mg),4−tert−ブチルピリジン(TBP, 27μL),及びリチウムビス(トリフルオロメチルスルホニル)イミド(LiTFSI, 7.6mg)を1 mLのクロロベンゼンに溶解させた.30分間撹拌後,溶液をメンブレンフィルターで濾過し,濾液をペロブスカイト層上に4000 rpmで30秒間スピンコートし,70℃で30分間アニールした.最後に,真空蒸着により80nmの金電極をつけ,ペロブスカイト太陽電池を得た. Hole transport material (Spiro-OMeTAD; 2,2', 7,7'-tetrakis (N, N-di-p-methoxyphenylamine) -9,9'-spirobifluorene, 73.6 mg), [Tris (2- (1H-pyrazol-1-yl) -4-tert-butylpyridine) cobalt (III) tris (bis (trifluoromethylsulfonyl) imide)] (FK209, 13.3 mg), 4-tert-butyl pyridine (TBP, 27 μL) and lithium bis (trifluoromethylsulfonyl) imide (LiTFSI, 7.6 mg) were dissolved in 1 mL of chlorobenzene. After stirring for 30 minutes, the solution was filtered through a membrane filter, and the filtrate was spin-coated on a perovskite layer at 4000 rpm for 30 seconds and annealed at 70 ° C. for 30 minutes. Finally, a perovskite solar cell was obtained by attaching an 80 nm gold electrode by vacuum deposition.
溶液を塗布してから10秒後,1分後又は5分後にトルエンを塗布したいずれのものも,ペロブスカイト太陽電池として良好な特性を発揮していた。このように,溶液を塗布してから貧溶媒を塗布するまでに十分な時間を確保することができた。なお,MAPbI3・2DMTHP以外の錯体についても同様にペロブスカイト太陽電池を得たところ,それぞれ特性の変化はあったもののいずれもペロブスカイト太陽電池としての特性を発揮できる太陽電池を得ることができた。 Any of the substances to which toluene was applied 10 seconds, 1 minute, or 5 minutes after the solution was applied exhibited good characteristics as a perovskite solar cell. In this way, it was possible to secure a sufficient time from the application of the solution to the application of the poor solvent. Incidentally, was obtained in the same manner as perovskite solar cells for complex non MAPbI 3 · 2DMTHP, was none despite each change in characteristic can be obtained a solar cell capable of exhibiting the characteristics as perovskite solar cells.
本発明は新規錯体を提供するので,化学産業の分野で利用されうる。また,本発明は,ペロブスカイト前駆体や,ペロブスカイト層,太陽電池,有機EL素子の製造方法を提供するので,情報電気産業において利用されうる。 Since the present invention provides a novel complex, it can be used in the field of the chemical industry. Further, since the present invention provides a method for manufacturing a perovskite precursor, a perovskite layer, a solar cell, and an organic EL element, it can be used in the information and electrical industry.
Claims (6)
1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)ピリミジノン,スルホラン,テトラメチレンスルホキシド又はN,N−ジメチルアセトアミドを含む錯体。
AMn1Xm1・・・(I)
(式(I)中,
Aは,メチルアンモニウムカチオン(CH3NH3 +),ホルムアミジニウムカチオン(NH2CHNH2 +)又はセシウムカチオン(Cs+)であり,
Mは,Pb 2+ ,Ge 2+ ,又はSn 2+ であり,
Xは,F−,Cl−,Br−,又はI−であり,
n1は,0.8〜1.2であり,
m1は,2.8〜3.2である。) The compound represented by the formula (I) and
1,3-Dimethyl-3,4,5,6-Tetrahydro-2 (1H) Complex containing pyrimidinone, sulfolane, tetramethylene sulfoxide or N, N-dimethylacetamide.
AM n1 X m1 ... (I)
(In formula (I),
A is methyl ammonium cation (+ CH 3 NH 3), a formamidinium cation (NH 2 CHNH 2 +) or cesium cations (Cs +),
M is Pb 2+ , Ge 2+ , or Sn 2+ .
X is F − , Cl − , Br − , or I − ,
n1 is 0.8 to 1.2,
m1 is 2.8 to 3.2. )
式(I)で示される化合物と, The compound represented by the formula (I) and
1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)ピリミジノン,又はスルホランを含む錯体。 A complex containing 1,3-dimethyl-3,4,5,6-tetrahydro-2 (1H) pyrimidinone, or sulfolane.
Aは,メチルアンモニウムカチオン(CH3NH3 +)又はホルムアミジニウムカチオン(NH2CHNH2 +)であり,
Mは,Pb 2+ であり,
Xは,Br−,又はI−である錯体。 The complex according to claim 1.
A is methyl ammonium cation (CH 3 NH 3 +) or formamidinium cation (NH 2 CHNH 2 +),
M is Pb 2+ ,
X is a complex of Br − or I −.
式(I)で示される化合物と,
1,3−ジメチル−3,4,5,6−テトラヒドロ−2(1H)ピリミジノン,スルホラン,テトラメチレンスルホキシド又はN,N−ジメチルアセトアミドを含む溶液を基板に塗布し塗布層を得る塗布工程と,
前記塗布工程の後に,前記塗布層に貧溶媒を添加する,貧溶媒添加工程と,
前記貧溶媒添加工程の後に,前記基板を加熱する加熱工程と,
を含み,
前記塗布工程の終わりから,前記貧溶媒添加工程までの時間が10秒以上5分以下である,
方法。
AMn1Xm1・・・(I)
(式(I)中,
Aは,メチルアンモニウムカチオン(CH3NH3 +),ホルムアミジニウムカチオン(NH2CHNH2 +)又はセシウムカチオン(Cs+)であり,
Mは,Pb 2+ ,Ge 2+ ,又はSn 2+ であり,
Xは,F−,Cl−,Br−,又はI−であり,
n1は,0.8〜1.2であり,
m1は,2.8〜3.2である。) A method for manufacturing a perovskite layer.
The compound represented by the formula (I) and
A coating step of applying a solution containing 1,3-dimethyl-3,4,5,6-tetrahydro-2 (1H) pyrimidinone, sulfolane, tetramethylene sulfoxide or N, N-dimethylacetamide to a substrate to obtain a coating layer.
After the coating step, a poor solvent addition step of adding a poor solvent to the coating layer,
After the poor solvent addition step, a heating step of heating the substrate and a heating step
Including
The time from the end of the coating step to the poor solvent addition step is 10 seconds or more and 5 minutes or less.
Method.
AM n1 X m1 ... (I)
(In formula (I),
A is methyl ammonium cation (+ CH 3 NH 3), a formamidinium cation (NH 2 CHNH 2 +) or cesium cations (Cs +),
M is Pb 2+ , Ge 2+ , or Sn 2+ .
X is F − , Cl − , Br − , or I − ,
n1 is 0.8 to 1.2,
m1 is 2.8 to 3.2. )
A method for producing a solar cell, which comprises a step of obtaining a perovskite layer by the method for producing a perovskite layer according to claim 5.
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