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JP6938130B2 - Anti-rotation of optical measuring instrument - Google Patents
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JP6938130B2 - Anti-rotation of optical measuring instrument - Google Patents

Anti-rotation of optical measuring instrument Download PDF

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JP6938130B2
JP6938130B2 JP2016212527A JP2016212527A JP6938130B2 JP 6938130 B2 JP6938130 B2 JP 6938130B2 JP 2016212527 A JP2016212527 A JP 2016212527A JP 2016212527 A JP2016212527 A JP 2016212527A JP 6938130 B2 JP6938130 B2 JP 6938130B2
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movable portion
scale
measuring instrument
movable
magnet
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JP2018072174A (en
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太良 津留
太良 津留
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Tokyo Seimitsu Co Ltd
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Tokyo Seimitsu Co Ltd
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Description

本発明は光学式のリニア・エンコーダを有する測定器に係り、被測定物に当接して使用するペンシル型の光学式測定器に用いて好適な回り止めに関する。 The present invention relates to a measuring instrument having an optical linear encoder, and relates to a detent that is suitable for use in a pencil-type optical measuring instrument that is used in contact with an object to be measured.

従来のリニア・エンコーダの例が、特許文献1に記載されている。この公報では、小型のアクチュエータを実現できる信頼性の高い小型のリニア・エンコーダを得るために、可動シャフトの端部に形成した平坦部に、フォトリソグラフィーで高反射率と低反射率の縞模様を形成したテープ状のスケール部を、取り付けている。そしてシャフトの平坦部とは異なる位置の周方向複数個所に永久磁石を取り付け、その外側に三相コイルを有する固定子を配置している。固定子の前記スケール部に対応する位置には、スケール部に対向して複数層を有する光学式センサを配置している。なお、スケール部の固定子内での回転を防ぐために、固定子端部に設けるガイド部材に、シャフトの平坦部形状に対応した矩形の開口部が形成されている。 An example of a conventional linear encoder is described in Patent Document 1. In this publication, in order to obtain a highly reliable and compact linear encoder that can realize a compact actuator, a striped pattern with high reflectance and low reflectance is applied to a flat portion formed at the end of a movable shaft by photolithography. The formed tape-shaped scale portion is attached. Permanent magnets are attached to a plurality of permanent magnets at positions different from the flat portion of the shaft in the circumferential direction, and stators having a three-phase coil are arranged outside the permanent magnets. At a position corresponding to the scale portion of the stator, an optical sensor having a plurality of layers facing the scale portion is arranged. In order to prevent the scale portion from rotating in the stator, a rectangular opening corresponding to the shape of the flat portion of the shaft is formed in the guide member provided at the stator end.

特許文献2には、接触式変位測定器が開示されている。この公報では、プローブ部材の摺動部に滑り軸受を用い、接触子とともに上下動するプローブ部材の一端に差動トランスを構成するコアが取り付けられている。プローブを取り囲む外筒には、コアに対応する位置に差動トランスを構成するコイルユニットが組み込まれている。さらに特許文献3には、半導体製造装置等で部品吸着に用いる往復動装置において、往復動する可動部材の回転を防止する構成が開示されている。 Patent Document 2 discloses a contact type displacement measuring instrument. In this publication, a slide bearing is used for the sliding portion of the probe member, and a core constituting a differential transformer is attached to one end of the probe member that moves up and down together with a contact. A coil unit that constitutes a differential transformer is incorporated in the outer cylinder that surrounds the probe at a position corresponding to the core. Further, Patent Document 3 discloses a configuration for preventing rotation of a reciprocating movable member in a reciprocating device used for sucking parts in a semiconductor manufacturing apparatus or the like.

特開2008−215911号公報(特にその段落0021)Japanese Unexamined Patent Publication No. 2008-215911 (particularly, paragraph 0021). 特開2012−185019号公報Japanese Unexamined Patent Publication No. 2012-185019 特開2008−82512号公報Japanese Unexamined Patent Publication No. 2008-82512

プローブを被測定物に当接させて変位を測定する、小型の接触式センサが多くの用途に用いられている。その中でもいわゆるペンシル型の光学式測定器は、小型であるので取り付け自由度が高いこと、及び対候性、耐環境性に富むので、アクチュエータ等の計測具に用いることが可能であり、例えば上記特許文献1では、光学式リニア・エンコーダを持つアクチュエータとして実現されている。 A small contact sensor that measures displacement by bringing the probe into contact with the object to be measured is used in many applications. Among them, the so-called pencil-type optical measuring instrument has a high degree of freedom in mounting because it is small, and has excellent weather resistance and environmental resistance, so that it can be used as a measuring tool such as an actuator. In Patent Document 1, it is realized as an actuator having an optical linear encoder.

光学式リニア・エンコーダでは、特にペンシル型の場合には、センサの取り付け易さから、センサは円柱状に形成したプローブを持つのが一般的である。一方、光源からの光がスケール面で透過または反射して受光部に到達するので、センサのスケール面は平面であることが検出強度を一定に保つために望ましい。 In an optical linear encoder, especially in the case of a pencil type, the sensor generally has a probe formed in a columnar shape because of the ease of mounting the sensor. On the other hand, since the light from the light source is transmitted or reflected on the scale surface and reaches the light receiving portion, it is desirable that the scale surface of the sensor is flat in order to keep the detection intensity constant.

そのため、特許文献1では円柱面を面落としして平面を形成し、摺動抵抗をできるだけ減らすため固定子に非接触で固定子内で回転可能に形成した円柱状のプローブを、スケール面と検出部とが常に同じ関係を維持できるよう、固定子側に設けた矩形穴でその回転を規制している。 Therefore, in Patent Document 1, a cylindrical probe is detected as a scale surface by flattening a cylindrical surface to form a flat surface and forming a columnar probe that is rotatably formed in the stator without contacting the stator in order to reduce sliding resistance as much as possible. The rotation is regulated by a rectangular hole provided on the stator side so that the part can always maintain the same relationship.

その結果、矩形穴とスケール面の面落とし形状とには、挿入及びプローブの軸方向移動のために微小な隙間があり、相互の接触による摩耗の発生や摺動抵抗による摩擦の発生の恐れがある。 As a result, there is a minute gap between the rectangular hole and the surface drop shape of the scale surface due to insertion and axial movement of the probe, and there is a risk of wear due to mutual contact and friction due to sliding resistance. be.

特許文献2に記載のものは小型化したリニア・エンコーダが記載されているが、作動トランス型であって、光学式ではないため、プローブの回転は許容するので、光学式センサにおけるスケール面と検出部の相対関係を保つ必要は必ずしもない。なおこの特許文献2に記載のものは、リニア・エンコーダの耐環境性を保持するため蛇腹を用いて外部汚染源からの油等の異物の混入を防止している。 Although the one described in Patent Document 2 describes a miniaturized linear encoder, since it is an actuating transformer type and not an optical type, the probe can be rotated, so that the scale surface and detection in the optical sensor can be detected. It is not always necessary to maintain the relative relationship of the parts. In the case described in Patent Document 2, in order to maintain the environmental resistance of the linear encoder, a bellows is used to prevent foreign substances such as oil from entering from an external pollution source.

異物混入は、検出部の劣化を引き起こすので避けなければならないが、蛇腹を使用するとプローブの移動とともに内部空気がダンパ作用を起こして摺動抵抗の一因となるので、蛇腹等を使用せずに摺動抵抗を低減したプローブの密封及び回転支持方法が望まれている。 Foreign matter must be avoided because it causes deterioration of the detection part, but if a bellows is used, the internal air will act as a damper as the probe moves, which will contribute to sliding resistance. A method for sealing and rotating a probe with reduced sliding resistance is desired.

また特許文献3では、往復動する可動部材の往復動方向に沿って、可動磁石と固定磁石を対向配置し、往復動の戻り力を発生させるとともに、可動部材の周方向運動を規制している。しかしながらこの公報に記載の装置も、可動部材の回り止めは、本体ケース端部に設けたすべり軸受の形状を円形とは異なる形状として物理的に回動を規制することであり、可動部材と軸受が接触して回動を防止するので、スティック・スリップにより軸受で摩耗が発生することについては、考慮されていない。 Further, in Patent Document 3, a movable magnet and a fixed magnet are arranged so as to face each other along the reciprocating direction of the reciprocating movable member, a return force of the reciprocating movement is generated, and the circumferential movement of the movable member is regulated. .. However, also in the device described in this publication, the detent of the movable member is to physically regulate the rotation by changing the shape of the slide bearing provided at the end of the main body case to a shape different from the circular shape, and the movable member and the bearing. It is not considered that the bearings are worn due to stick slip because they come into contact with each other to prevent rotation.

本発明は上記従来技術の不具合または従来技術では未考慮の事項に鑑みなされたものであり、その目的は、スリーブ内に基本的に非接触に保持した測定プローブを有する小型ペンシル型の光学式変位測定器において、測定プローブとスリーブの周方向位置関係を常時一定に保ちながら、測定プローブの往復動に起因する、測定プローブとスリーブを含む固定部材間での摩擦及び摩耗発生を抑制することにある。本発明の他の目的は、上記目的に加え、小型のペンシル型の光学式変位測定器の構成を簡素化して、プローブの往復動による測定器内空気のダンパ作用を無くすまたは低減することにある。 The present invention has been made in view of the above-mentioned defects of the prior art or matters not considered in the prior art, and an object of the present invention is a small pencil-type optical displacement having a measurement probe basically held in a sleeve in a non-contact manner. In the measuring instrument, the purpose is to suppress the occurrence of friction and wear between the measuring probe and the fixing member including the sleeve due to the reciprocating movement of the measuring probe while always keeping the positional relationship between the measuring probe and the sleeve in the circumferential direction constant. .. Another object of the present invention is, in addition to the above object, to simplify the configuration of a small pencil-type optical displacement measuring instrument to eliminate or reduce the damper action of the air inside the measuring instrument due to the reciprocating movement of the probe. ..

上記目的を達成する本発明の特徴は、一端側に被測定物に当接する測定子が配設され、他端側にスケールが配設された棒状の可動部と、この可動部の反測定子側を収容する円筒状部材を含み、前記可動部の中間部を支持する軸受部を一端側に有し、前記スケールに対向して配設された検出部を有する固定部を備えた変位測定器において、前記可動部がその長手軸周りに前記固定部に対して回動するのを防止する、可動部回り止め手段を前記可動部に、固定部回り止め手段を前記固定部にそれぞれ設け、前記可動部回り止め手段と前記固定部回り止め手段は、ともに磁石手段を含むことにある。 A feature of the present invention that achieves the above object is a rod-shaped movable portion in which a stylus that contacts an object to be measured is arranged on one end side and a scale is arranged on the other end side, and an anti-meterer of the movable portion. Displacement measuring instrument including a cylindrical member for accommodating a side, having a bearing portion for supporting an intermediate portion of the movable portion on one end side, and having a fixed portion having a detection portion disposed opposite to the scale. A movable portion detenting means for preventing the movable portion from rotating around the longitudinal axis thereof with respect to the fixed portion is provided in the movable portion, and a fixed portion detenting means is provided in the fixed portion. Both the movable portion detenting means and the fixed portion detenting means include a magnet means.

そしてこの特徴において、前記可動部回り止め手段は前記軸受部よりも前記スケール側に設けられた長円形または矩形の突起とこの突起の周囲面であって長手方向に配設された永久磁石を有し、前記固定部回り止め手段は前記突起の前記長手方向の移動範囲に応じて形成された長円形または矩形の溝とこの溝の長手方向内周面に配設した永久磁石を有し、前記可動部側の永久磁石と前記可動部側永久磁石に対向する前記固定部側の永久磁石の磁極を、同極とするのが好ましく、また、前記固定部側の永久磁石は前記溝の長手方向内面に間隔を置いて複数個配設されており、前記間隔を置いた永久磁石間にコイル磁石を配設してもよい。 In this feature, the movable portion detenting means has an oval or rectangular protrusion provided on the scale side of the bearing portion and a permanent magnet on the peripheral surface of the protrusion and arranged in the longitudinal direction. The fixing portion detenting means has an oval or rectangular groove formed according to the movement range of the protrusion in the longitudinal direction and a permanent magnet arranged on the inner peripheral surface of the groove in the longitudinal direction. It is preferable that the magnetic poles of the permanent magnet on the movable portion side and the permanent magnet on the fixed portion side facing the permanent magnet on the movable portion side are the same pole, and the permanent magnet on the fixed portion side is in the longitudinal direction of the groove. A plurality of magnets are arranged on the inner surface at intervals, and coil magnets may be arranged between the permanent magnets at intervals.

上記特徴において、前記固定部の一端側に設けた軸受部に、周方向に複数極に分割形成された永久磁石を配設し、前記可動部の外周であって前記軸受部に対応する位置に、前記軸受部の永久磁石に対応する磁極数を有する周方向に分割された複数個の永久磁石を配置してもよく、前記可動部のスケールは、反射部と透過部が前記長手方向に規則的に多数形成された光学リニアスケールであり、前記固定部の検出部は、前記スケールに投射した光の反射光または透過光を検出するフォトダイオードを含むものであってもよい。また、前記可動部の前記回り止めと前記固定部の前記検出部間にばねを配設するとともに、長円形または矩形の前記回り止めの前記長手方向側両端面および前記固定部の長円形または矩形の前記溝の長手方向両内側端面にそれぞれ永久磁石を配設し、対向する永久磁石の磁極を同極としてもよい。 In the above feature, a permanent magnet divided into a plurality of poles in the circumferential direction is arranged on a bearing portion provided on one end side of the fixed portion, and is located on the outer periphery of the movable portion and at a position corresponding to the bearing portion. A plurality of permanent magnets divided in the circumferential direction having a number of magnetic poles corresponding to the permanent magnets of the bearing portion may be arranged, and the scale of the movable portion is such that the reflecting portion and the transmitting portion are regulated in the longitudinal direction. The optical linear scale is formed in large numbers, and the detection unit of the fixed portion may include a photodiode that detects the reflected light or the transmitted light of the light projected on the scale. In addition, a spring is arranged between the detent of the movable portion and the detection portion of the fixing portion, and both end faces of the detent on the longitudinal direction side of the oval or rectangular shape and the oval or rectangular shape of the fixing portion. Permanent magnets may be arranged on both inner end faces in the longitudinal direction of the groove, and the magnetic poles of the facing permanent magnets may be the same pole.

本発明によれば、プローブの周方向変位を防止する回り止めを永久磁石で構成したので、光学式の変位測定器において、測定プローブが、測定プローブに対向して配置される検出部及び測定部を内蔵するスリーブに対する非接触の状態を維持できるので、測定プローブと固定部材間の摩擦や摩耗の発生を抑制できる。また、従来使用されてきた蛇腹やばね等の部品を省くことが可能になり、変位測定器の構成が簡素化するとともに、測定器内の空気の圧縮が低減され、測定器内部空気によるダンパ作用が無くなるまたは低減される。 According to the present invention, since the detent for preventing the circumferential displacement of the probe is composed of a permanent magnet, in the optical displacement measuring instrument, the measuring probe is arranged in the detection unit and the measuring unit facing the measuring probe. Since it is possible to maintain a non-contact state with respect to the sleeve containing the measuring probe, it is possible to suppress the occurrence of friction and wear between the measuring probe and the fixing member. In addition, parts such as bellows and springs that have been used in the past can be omitted, the configuration of the displacement measuring instrument is simplified, the compression of air inside the measuring instrument is reduced, and the damper action by the air inside the measuring instrument. Is eliminated or reduced.

本発明に係るペンシル型変位測定器の一実施例を示す図であり、同図(a)は同図(b)のA視図、同図(b)は縦断面図である。It is a figure which shows one Example of the pencil type displacement measuring instrument which concerns on this invention, FIG. 図1に示した変位測定器の可動部側(同図(a))及び静止側(同図(b))の斜視図である。It is a perspective view of the movable part side (the figure (a)) and the stationary side (the figure (b)) of the displacement measuring instrument shown in FIG. 図1に示した変位測定器の回り止め部の図であり、同図(a)は上面図、同図(b)は同図(a)のB−B断面図である。It is a figure of the rotation stop part of the displacement measuring instrument shown in FIG. 1, FIG. 1A is a top view, and FIG. 1B is a cross-sectional view taken along the line BB of FIG. 1A. 図1に示した変位測定器におけるピッチングとローリングを説明する図である。It is a figure explaining pitching and rolling in the displacement measuring instrument shown in FIG. 本発明に係る変位測定器の回り止め部の他の実施例の図であり、図3に対応する図である。It is a figure of another Example of the rotation stop part of the displacement measuring instrument which concerns on this invention, and is the figure corresponding to FIG.

以下、本発明に係る小型ペンシル型の変位測定器100の一実施例を、図面を用いて説明する。小型ペンシル型の変位測定器100は、光学式スケールを採用したエンコード方式の高精度接触式デジタル測長機であり、隣接した多点計測に好適で様々な形状の測定を正確に実行可能である。また、測定子10側に蛇腹ブーツ14を備えること等により、防水性や耐環境性を向上でき、一般的なクーラントや油に対しても耐性を持たせることが可能になる。 Hereinafter, an embodiment of the small pencil type displacement measuring instrument 100 according to the present invention will be described with reference to the drawings. The small pencil-type displacement measuring instrument 100 is an encoding-type high-precision contact-type digital length measuring machine that employs an optical scale, and is suitable for adjacent multipoint measurement and can accurately perform measurement of various shapes. .. Further, by providing the bellows boot 14 on the stylus 10 side, waterproofness and environmental resistance can be improved, and resistance to general coolant and oil can be provided.

図1に、本発明に係る小型ペンシル型の変位測定器100の縦断面図(同図(b))とそのA部上面図(同図(a))を示す。変位測定器100は、大別して測定子10を一端側に有する可動部20と、この可動部20の一部を収納する外形ほぼ円筒状の固定部62とから構成される。可動部20の一部を図2(a)に、固定部62の一部を分解斜視図で図2(b)に示す。 FIG. 1 shows a vertical cross-sectional view (FIG. 1B) of the small pencil-type displacement measuring instrument 100 according to the present invention and a top view of part A thereof (FIG. 1A). The displacement measuring instrument 100 is roughly divided into a movable portion 20 having a stylus 10 on one end side, and a fixing portion 62 having a substantially cylindrical outer shape for accommodating a part of the movable portion 20. A part of the movable portion 20 is shown in FIG. 2 (a), and a part of the fixed portion 62 is shown in an exploded perspective view in FIG. 2 (b).

図1(b)において、可動部20は、図示しない被測定物に当接するほぼ半球状の接触子12とこの接触子を保持する測定子10を一端側に有する。測定子10の反接触子側には、丸棒状の軸部30が取り付けられている。軸部30の反測定子側には、詳細を後述する本発明の特徴的構成である回り止め80を有する。 In FIG. 1B, the movable portion 20 has a substantially hemispherical contactor 12 that abuts on an object to be measured (not shown) and a stylus 10 that holds the contactor on one end side. A round bar-shaped shaft portion 30 is attached to the counter-contact side of the stylus 10. On the counter-measurer side of the shaft portion 30, there is a detent 80, which is a characteristic configuration of the present invention, the details of which will be described later.

可動部20には段付き軸部32が形成されており、その周方向1か所に軸方向に延び、段付き軸部32から外径側に突出した回り止め80が設けられている。段付き軸部32よりもさらに反測定子側には、後述するコイルばね38を巻回するために、段付き軸部32よりも小径の保持部34が形成されている。保持部34は、図2(a)に示すように、段付き軸部32側から軸方向中間部までは円柱形状(中実軸状)であるが、中間部から他方の軸端までは、水平面で切断した断面半円形状の切り落とし部35を形成している。 A stepped shaft portion 32 is formed in the movable portion 20, and a detent 80 extending in the axial direction and projecting from the stepped shaft portion 32 to the outer diameter side is provided at one place in the circumferential direction thereof. A holding portion 34 having a diameter smaller than that of the stepped shaft portion 32 is formed on the counter side of the stepped shaft portion 32 in order to wind the coil spring 38 described later. As shown in FIG. 2A, the holding portion 34 has a cylindrical shape (solid shaft shape) from the stepped shaft portion 32 side to the axial intermediate portion, but the holding portion 34 has a cylindrical shape (solid shaft shape) from the intermediate portion to the other shaft end. A cut-off portion 35 having a semicircular cross section cut on a horizontal plane is formed.

切り落とし部35の軸端側には、さらに光学スケール76の厚さだけ半円形状から水平面で切り込まれたスケール取り付け部36が形成されている。すなわち、接着剤等を用いて光学スケール76をスケール取り付け部36に取り付けたときに、スケール76の上面がほぼ切り落とし部35の上面と一致する、円の2分割面になるようにその切込み深さを調整している。 On the shaft end side of the cut-off portion 35, a scale mounting portion 36 cut in a horizontal plane from a semicircular shape by the thickness of the optical scale 76 is further formed. That is, when the optical scale 76 is attached to the scale mounting portion 36 using an adhesive or the like, the cutting depth thereof is such that the upper surface of the scale 76 substantially coincides with the upper surface of the cut-off portion 35 and becomes a circular two-divided surface. Is being adjusted.

光学スケール76はリニアスケールとして知られているものであり、ガラス等の透明基板に反射部をエッチング等で長手方向に等間隔に構成しており、基板の地の部分を透過部として利用している。透過部と反射部の幅は実質的に等しく、透過部と反射部の対がなすピッチは、例えば20μmである。すなわち、透過部と反射部の幅はそれぞれほぼ10μmである。 The optical scale 76 is known as a linear scale. Reflective portions are formed on a transparent substrate such as glass at equal intervals in the longitudinal direction by etching or the like, and the ground portion of the substrate is used as a transmissive portion. There is. The widths of the transmitting portion and the reflecting portion are substantially the same, and the pitch formed by the pair of the transmitting portion and the reflecting portion is, for example, 20 μm. That is, the widths of the transmitting portion and the reflecting portion are each approximately 10 μm.

40は可動部が図1(b)中で左右方向(X方向)に移動するのを低摩擦及び低コンタミで支持する軸受(軸受部とも称する)であり、含油軸受や非接触型の軸受を採用している。軸受(軸受部)40の一実施例では、軸受40は周方向に複数個に分割されて交互にS極とN極が配列された永久磁石からなる磁気軸受を有し、この軸受40に対向する可動部20の軸部30外周には、軸受40に構成されたのと同磁極で同数の永久磁石が周方向に分割配列されている。可動部20の軸部30が軸受40に相対的にX方向に移動するので、可動部20の軸受40に対向する面の長手方向長さは、軸受40の長さより長くなる。したがって、軸受40を永久磁石で構成する場合には、軸部30に設ける永久磁石の長さは、軸受40の長さに可動部20のX方向変位を加えた長さ以上とすることが望ましい。 Reference numeral 40 denotes a bearing (also referred to as a bearing portion) that supports the movement of the movable portion in the left-right direction (X direction) in FIG. 1B with low friction and low contamination, and includes an oil-impregnated bearing and a non-contact type bearing. It is adopted. In one embodiment of the bearing (bearing portion) 40, the bearing 40 has a magnetic bearing composed of a permanent magnet divided into a plurality of pieces in the circumferential direction and alternately arranged with S poles and N poles, and faces the bearing 40. On the outer periphery of the shaft portion 30 of the movable portion 20, the same number of permanent magnets having the same magnetic poles as those formed in the bearing 40 are divided and arranged in the circumferential direction. Since the shaft portion 30 of the movable portion 20 moves in the X direction relative to the bearing 40, the longitudinal length of the surface of the movable portion 20 facing the bearing 40 is longer than the length of the bearing 40. Therefore, when the bearing 40 is composed of a permanent magnet, it is desirable that the length of the permanent magnet provided on the shaft portion 30 is equal to or greater than the length of the bearing 40 plus the displacement of the movable portion 20 in the X direction. ..

固定部62の先端側(図1(b)で左側)と測定子10の反接触子端面間には、蛇腹ブーツ14が気密に取り付けられており、可動部20が固定部62に対して動いても、変位測定器100の周囲環境に含まれる油やクーラント等の外部の塵埃が、固定部62の内部に侵入するのを防止している。蛇腹ブーツ14は測定子10の測定に影響を与えないよう低剛性に形成されているとともに、耐環境性材料から構成されている。 The bellows boot 14 is airtightly attached between the tip side of the fixed portion 62 (left side in FIG. 1B) and the anticontact end face of the stylus 10, and the movable portion 20 moves with respect to the fixed portion 62. However, external dust such as oil and coolant contained in the surrounding environment of the displacement measuring instrument 100 is prevented from entering the inside of the fixing portion 62. The bellows boot 14 is formed with low rigidity so as not to affect the measurement of the stylus 10, and is made of an environment-resistant material.

固定部62の軸受40より反蛇腹ブーツ側(図1(b)で右側)には、変位測定器100の外径をほぼ円筒状に気密に構成するために、軸受40への接続側を円筒状に形成され、多くの切り欠き部を有するケース42と、このケース42のカバー案内部44の外周に沿う薄肉円筒状のカバー60が設けられている。カバー60は、ケース42のほぼ全長手方向を覆う。カバー60がケース42に嵌合する側の反対端には、本変位測定器100の電子部品に延びる信号線92や電線94が接続されるターミナル部90が配設されており、ターミナル部90とカバー60はOリング等の機械的な封止手段もしくは接着等の方法で、気密化されている。ターミナル部90には、本変位測定器100を制御する制御器に接続するケーブルが接続されているが、図示を省略している。 On the anti-bellows boot side (on the right side in FIG. 1B) of the fixed portion 62 from the bearing 40, the connection side to the bearing 40 is cylindrical in order to form the outer diameter of the displacement measuring instrument 100 in a substantially cylindrical shape. A case 42 formed in a shape and having many notches, and a thin-walled cylindrical cover 60 along the outer periphery of the cover guide portion 44 of the case 42 are provided. The cover 60 covers almost the entire longitudinal direction of the case 42. At the opposite end on the side where the cover 60 fits into the case 42, a terminal portion 90 to which the signal line 92 and the electric wire 94 extending to the electronic component of the displacement measuring instrument 100 are connected is arranged, and the terminal portion 90 and the terminal portion 90 are arranged. The cover 60 is airtightened by a mechanical sealing means such as an O-ring or a method such as bonding. A cable connected to the controller that controls the displacement measuring device 100 is connected to the terminal unit 90, but the illustration is omitted.

図2(b)は、カバー60と軸受40を取り除いた固定部62を示す。図2(b)を参照して、ケース42及びその周りをさらに説明する。ケース42には、ワイヤ放電加工等で複雑形状の複数の切り欠き部を有するように形成されている。すなわち、図2(b)のほぼ左半分の部分は、ばね当接部45まで中空円筒形上に形成されて、可動部20を受け入れる形状になっている。そして、上面には、長円形の溝50が形成されており、可動部20の回り止め80が長手方向に移動できる回り止め用溝となっている。溝50の周縁部には、溝縁部磁石82が接着等で取り付けられている。可動部20の回り止め80と溝縁部磁石82は、回り止め部84を構成する。 FIG. 2B shows a fixing portion 62 from which the cover 60 and the bearing 40 have been removed. The case 42 and its surroundings will be further described with reference to FIG. 2 (b). The case 42 is formed so as to have a plurality of notches having a complicated shape by wire electric discharge machining or the like. That is, the substantially left half portion of FIG. 2B is formed in a hollow cylindrical shape up to the spring contact portion 45, and has a shape that accepts the movable portion 20. An oval groove 50 is formed on the upper surface, and the detent 80 of the movable portion 20 is a detent groove that can move in the longitudinal direction. A groove edge magnet 82 is attached to the peripheral edge of the groove 50 by adhesion or the like. The detent 80 of the movable portion 20 and the groove edge magnet 82 form the detent portion 84.

下側にも穴48が形成されており、調整等に使用される。ばね当接部45はほぼ上半分にのみ形成された壁であり、可動部20の段付き軸部32の壁面との間で、コイルばね38を保持する。コイルばね38は、本変位測定器100を使用した後の、測定子10をX方向に左側へ戻すためのものである。なおカバー案内部44の内面とばね当接部45につながるばね保持部46の内面が、コイルばね38を保持及びガイドする。 A hole 48 is also formed on the lower side and is used for adjustment and the like. The spring contact portion 45 is a wall formed only in the upper half, and holds the coil spring 38 between the spring contact portion 45 and the wall surface of the stepped shaft portion 32 of the movable portion 20. The coil spring 38 is for returning the stylus 10 to the left in the X direction after using the displacement measuring instrument 100. The inner surface of the cover guide portion 44 and the inner surface of the spring holding portion 46 connected to the spring contact portion 45 hold and guide the coil spring 38.

ばね当接部45の右側には台状に基板受け部52が形成されており、固定部62の反軸受部端に形成した基板受け部56とで、光学式エンコーダを形成する受光部72が搭載された電子基板70を搭載する。したがって両基板受け部52、56は同一平面を形成しており、端部の基板受け部56は半円よりやや大きな切頭円柱である。電子基板70は、下面に受光部72や回路素子74が搭載されて基板受け部52、56に載置され、一端側が基板受け部52に形成したねじ穴52aと電子基板70に形成した取り付け穴70aを用いて止めねじ78で固定される。同様に、他端側が基板受け部56に形成したねじ穴56aと電子基板70に形成した取り付け穴70bを用いて、止めねじ78で固定される。受光部72は、フォトダイオードなどの受光素子を有し、受光素子がリニアスケールを構成する反射部、透過部に投射された光の反射光または透過光を検出する。 A substrate receiving portion 52 is formed in a trapezoidal shape on the right side of the spring contact portion 45, and a light receiving portion 72 forming an optical encoder is formed with the substrate receiving portion 56 formed at the end of the anti-bearing portion of the fixed portion 62. The mounted electronic board 70 is mounted. Therefore, both substrate receiving portions 52 and 56 form the same plane, and the substrate receiving portions 56 at the ends are truncated cylinders slightly larger than a semicircle. The electronic board 70 has a light receiving portion 72 and a circuit element 74 mounted on the lower surface thereof and is mounted on the substrate receiving portions 52 and 56, and one end side thereof is a screw hole 52a formed in the substrate receiving portion 52 and a mounting hole formed in the electronic substrate 70. It is fixed with a set screw 78 using 70a. Similarly, the other end side is fixed with the set screw 78 by using the screw hole 56a formed in the substrate receiving portion 56 and the mounting hole 70b formed in the electronic substrate 70. The light receiving unit 72 has a light receiving element such as a photodiode, and the light receiving element detects the reflected light or the transmitted light of the light projected on the reflecting unit and the transmitting unit constituting the linear scale.

電子基板70を基板受け部52、56に固定した状態で、受光部72の下面と可動部20に取り付けた光学スケール76の上面との間の距離が、光学式測定に適切な距離となるよう、基板受け部52、56の水平面高さが設定されている。電子基板70に搭載した受光部72や回路素子74を固定部62内に収容するため、固定部には半円型の切り欠き部59が形成されており、さらにこの半円型の切り欠き部59の下側部分には、組み立て等の便のために切り欠き部58が長手方向に延びて形成されている。上述したように、電子基板70には、図示しないターミナル部から信号線92や電力用の電線94が複数本(図1(b)では簡便のためそれぞれ1本のみ記載)取り付けられている。 With the electronic substrate 70 fixed to the substrate receiving portions 52 and 56, the distance between the lower surface of the light receiving portion 72 and the upper surface of the optical scale 76 attached to the movable portion 20 is an appropriate distance for optical measurement. , The horizontal plane heights of the substrate receiving portions 52 and 56 are set. In order to accommodate the light receiving portion 72 and the circuit element 74 mounted on the electronic substrate 70 in the fixed portion 62, a semicircular notch portion 59 is formed in the fixed portion, and further, the semicircular notch portion is formed. A notch 58 is formed in the lower portion of the 59 so as to extend in the longitudinal direction for convenience of assembly and the like. As described above, a plurality of signal lines 92 and electric power wires 94 are attached to the electronic board 70 from a terminal portion (not shown) (only one of each is described for convenience in FIG. 1 (b)).

このように構成した本変位測定器100の回り止め部84の詳細を、図3及び図4を用いて説明する。図3(a)は回り止め部84の周方向展開図であり、図1(a)に対応する図であり、図3(b)は図3(a)のB‐B断面図である。図4は可動部20と固定部62の相対変位を説明する図であり、同図(a)はヨー動とロール動を説明する図、同図(b)はロール動による可動部20と固定部62の相対変位を示す図、同図(c)はヨー動による可動部20と固定部62の相対変位を示す図である。 The details of the detent portion 84 of the displacement measuring instrument 100 configured in this way will be described with reference to FIGS. 3 and 4. FIG. 3A is a circumferential development view of the detent portion 84, is a view corresponding to FIG. 1A, and FIG. 3B is a cross-sectional view taken along the line BB of FIG. 3A. FIG. 4 is a diagram for explaining the relative displacement between the movable portion 20 and the fixed portion 62, FIG. 4A is a diagram for explaining the yaw motion and the roll motion, and FIG. 4B is a diagram for explaining the yaw motion and the roll motion, and FIG. The figure which shows the relative displacement of a part 62, FIG.

固定部62のカバー案内部44とばね保持部46にわたって、長手方向に長円形の溝50(図3(a)にはその一部を記載)が形成されている。溝50の内周面では溝50の全周にわたって、最内側に永久磁石(N極)822が、その外側に永久磁石(S極)821が積層されて形成されている。一方、可動部20の段付き軸部32には長円形の溝が形成されており、この溝に回り止め80が嵌合されている。回り止め80は長円形柱であり、断面矩形の高剛性の金属製固定軸806が中心に配置され、その周りであって長辺側には順に永久磁石(S極)802、永久磁石(N極)801が積層されて、接着等で取り付けられている。一方固定軸806の短辺側では、内側から順に永久磁石(N極)803、永久磁石(S極)804が積層されて、接着等で取り付けられている。各磁石801〜804の角部は、樹脂等で固められた後丸み付処理されて回り止め80が完成する。上記各磁石の材料は高磁力を発生できる材料が好ましく、例えば希土類磁石のネオジムやサマリウムコバルトやフェライト磁石を使用する。 An oval groove 50 (a part thereof is shown in FIG. 3A) is formed in the longitudinal direction over the cover guide portion 44 and the spring holding portion 46 of the fixing portion 62. On the inner peripheral surface of the groove 50, a permanent magnet (N pole) 822 is laminated on the innermost side and a permanent magnet (S pole) 821 is laminated on the outermost side over the entire circumference of the groove 50. On the other hand, an oval groove is formed in the stepped shaft portion 32 of the movable portion 20, and a detent 80 is fitted in this groove. The detent 80 is an oval pillar, and a high-rigidity metal fixed shaft 806 with a rectangular cross section is arranged in the center, and a permanent magnet (S pole) 802 and a permanent magnet (N) are arranged around the fixed shaft 806 on the long side in order. Pole) 801 are laminated and attached by adhesion or the like. On the other hand, on the short side of the fixed shaft 806, a permanent magnet (N pole) 803 and a permanent magnet (S pole) 804 are laminated in this order from the inside and attached by adhesion or the like. The corners of the magnets 801 to 804 are hardened with resin or the like and then rounded to complete the detent 80. The material of each of the above magnets is preferably a material capable of generating a high magnetic force, and for example, neodymium, samarium cobalt, or ferrite magnet, which are rare earth magnets, are used.

磁石821、822からなり溝50の内周に配設される溝縁部磁石82、および回り止め80に配置される磁石801〜804の磁極をこのように構成したので、溝縁部磁石82を備えた固定部62と回り止め80とは常時互いに反発する反発力を生じており、可動部20が長手方向に移動する際に、たとえその長手方向軸周りに回動(ロール動)するような力が加えられても、上記回り止め部84の磁石822、801の相互作用により復元力が発生し、その回転方向位置を一定に保つ。したがって、回り止め80が固定部62に接触するのも防止され、可動部20の移動に伴うコンタミの発生を防止できる。また、回り止め80が長円形であり、磁石801、802も長手方向に所定長さを有しているので、可動部20のある点周りの変位(ヨー動)を防止できる。さらに、回り止め80の角部に丸みを形成したので、溝50の端部に万一回り止め80が当接しても、塵埃等のコンタミが発生するのが防止される。 Since the magnetic poles of the groove edge magnet 82 composed of the magnets 821 and 822 and arranged on the inner circumference of the groove 50 and the magnets 801 to 804 arranged on the detent 80 are configured in this way, the groove edge magnet 82 can be used. The provided fixed portion 62 and the detent 80 always generate repulsive forces that repel each other, and when the movable portion 20 moves in the longitudinal direction, it rotates (rolls) around its longitudinal axis. Even if a force is applied, a restoring force is generated by the interaction of the magnets 822 and 801 of the detent portion 84, and the position in the rotation direction is kept constant. Therefore, it is possible to prevent the detent 80 from coming into contact with the fixed portion 62, and to prevent the occurrence of contamination due to the movement of the movable portion 20. Further, since the detent 80 is oval and the magnets 801 and 802 also have a predetermined length in the longitudinal direction, displacement (yaw movement) around a certain point of the movable portion 20 can be prevented. Further, since the corners of the detent 80 are rounded, even if the detent 80 comes into contact with the end of the groove 50, contamination such as dust is prevented.

一方、測定を終えて測定子10が被測定物から解放されると、可動部20はコイルばね38の復元力により初期位置に戻るが、その際回り止め80の短辺部に設けた磁石804と溝50の内面の磁石822の相互作用により、その復元動作が緩衝され溝50の端部円弧部との当接が回避され、この場合にもコンタミの発生を防止できる。 On the other hand, when the stylus 10 is released from the object to be measured after the measurement is completed, the movable portion 20 returns to the initial position due to the restoring force of the coil spring 38, but at that time, the magnet 804 provided on the short side portion of the detent 80 The interaction between the magnet 822 and the magnet 822 on the inner surface of the groove 50 buffers the restoration operation and avoids contact with the arc portion at the end of the groove 50, and in this case as well, the occurrence of contamination can be prevented.

また、磁石804、822の相互作用により磁気ばねが生成され、測定時に可動部20の絶対変位量の変化による影響を緩和し、被測定物に対してほぼ一定の接触応力を付与することが可能になり、計測精度が向上する。さらに、磁気ばねにより重力のない環境や空気のない真空環境等での計測時にも接触応力をほぼ一定にすることが可能になる。さらにまた、蛇腹ブーツ14やケース54で気密化したことにより、可動部20が変位すると内部空気が空気ばねとして作用し、これは計測時の抵抗になるが、そのような場合にも所定の速さで可動部20を長手方向(X方向)に動かすことが可能になる。 Further, a magnetic spring is generated by the interaction of the magnets 804 and 822, and it is possible to mitigate the influence of the change in the absolute displacement amount of the movable portion 20 at the time of measurement and to apply a substantially constant contact stress to the object to be measured. And the measurement accuracy is improved. Further, the magnetic spring makes it possible to make the contact stress substantially constant even during measurement in an environment without gravity or a vacuum environment without air. Furthermore, due to the airtightness of the bellows boots 14 and the case 54, when the movable part 20 is displaced, the internal air acts as an air spring, which becomes a resistance at the time of measurement. Now the movable portion 20 can be moved in the longitudinal direction (X direction).

溝50の磁石822と回り止めの磁石801の相互作用によりロール動を抑制する結果、図4(b)に示すように、何らかの要因で可動部20に取り付けた光学スケール76が破線で示した位置76aに変化しても位置は即座に復元され、光学スケール76と受光部72間は適正隙間dに戻され、高精度な測定を可能にする。同様に何らかの要因で可動部20が長手方向からΔθだけ傾いて、図4(c)に示すように光学スケール76が位置76bへ変化しても、上述した磁石の相互作用により光学スケール76の位置は即座に復元され、光学スケール76と受光部72の相対位置が一定に保たれる。 As a result of suppressing the roll motion by the interaction between the magnet 822 of the groove 50 and the magnet 801 of the detent, as shown in FIG. 4B, the position of the optical scale 76 attached to the movable portion 20 for some reason is shown by the broken line. Even if it changes to 76a, the position is immediately restored, and the gap between the optical scale 76 and the light receiving unit 72 is returned to the proper gap d, enabling highly accurate measurement. Similarly, even if the movable portion 20 is tilted by Δθ from the longitudinal direction for some reason and the optical scale 76 changes to the position 76b as shown in FIG. 4C, the position of the optical scale 76 is due to the above-mentioned interaction of the magnets. Is immediately restored, and the relative positions of the optical scale 76 and the light receiving unit 72 are kept constant.

図5に本発明に係る回り止め部84の変形例を示す。本変形例が上記実施例と異なるのは、固定部62に形成した溝50の内周面に取り付ける永久磁石を分割形状とし、分割した磁石を所定間隔を置いて配置し、各隣り合う磁石間にコイル磁石を配置したことにある。なお溝50の円弧部の磁石は分割せずに、図3に示した実施例と同様の構成である。 FIG. 5 shows a modified example of the detent portion 84 according to the present invention. This modification differs from the above embodiment in that the permanent magnets attached to the inner peripheral surface of the groove 50 formed in the fixed portion 62 have a divided shape, the divided magnets are arranged at predetermined intervals, and between the adjacent magnets. The coil magnet is placed in. The magnet in the arc portion of the groove 50 is not divided and has the same configuration as that of the embodiment shown in FIG.

具体的には、長手方向長さを所定長さとした分割磁石822、821を溝50の長手部内面に積層して接着等で配設し、隣り合う分割磁石822、821の間にコイル磁石825を配設している。コイル磁石825は、芯811の周りにコイル812が巻回された磁石であり、コイル812は図示しない電線により電子基板70に接続されている。コイル812の端部への印加電流を制御することにより、発生する磁力を変化させる。その場合、各コイル812ごとの印加電流の大きさや流れる方向を制御すると、可動部20の長手方向位置に応じてコイル812の発生する磁力の強さや方向を変化させることができ、測定子10の測定位置に応じて可動部20の移動速さを変化させることができ、一定なまたは変化する可動部20の最適長手方向移動速度を得ることができる。また、上記印加電流の向きや方向を制御することにより、測定子10による被測定物への測定圧(押圧力)を調整することもできる。 Specifically, the split magnets 822 and 821 having a predetermined length in the longitudinal direction are laminated on the inner surface of the longitudinal portion of the groove 50 and arranged by adhesion or the like, and the coil magnet 825 is placed between the adjacent split magnets 822 and 821. Are arranged. The coil magnet 825 is a magnet in which a coil 812 is wound around a core 811. The coil 812 is connected to an electronic substrate 70 by an electric wire (not shown). By controlling the current applied to the end of the coil 812, the generated magnetic force is changed. In that case, by controlling the magnitude and flow direction of the applied current for each coil 812, the strength and direction of the magnetic force generated by the coil 812 can be changed according to the longitudinal position of the movable portion 20, and the stylus 10 can be changed. The moving speed of the movable portion 20 can be changed according to the measurement position, and a constant or changing optimum longitudinal moving speed of the movable portion 20 can be obtained. Further, by controlling the direction and direction of the applied current, the measured pressure (pressing pressure) on the object to be measured by the stylus 10 can be adjusted.

以上説明したように本実施例及び変形例によれば、接触して計測するペンシル型の変位測定器において、可動部の回り止めと固定部の溝の双方に永久磁石を配置したので、可動部と固定部の接触を極力回避でき、変位測定器内部でのコンタミの発生を防止できる。また万一コンタミが発生しても磁性金属粉であれば磁石に吸着することができ、光学式変位測定部に対するコンタミによる測定精度劣化の悪影響を防止できる。さらに、可動部の固定部に対する相対ヨー動、ロール動を磁石が復元するので、光学スケールと受光部の相対姿勢を一定に保持できる。 As described above, according to the present embodiment and the modified example, in the pencil-type displacement measuring instrument that measures by contact, permanent magnets are arranged in both the detent of the movable part and the groove of the fixed part. It is possible to avoid contact between the fixed part and the fixed part as much as possible, and it is possible to prevent the occurrence of contamination inside the displacement measuring instrument. Further, even if contamination should occur, if it is a magnetic metal powder, it can be attracted to the magnet, and it is possible to prevent adverse effects of deterioration of measurement accuracy due to contamination on the optical displacement measuring unit. Further, since the magnet restores the relative yaw motion and roll motion of the movable portion with respect to the fixed portion, the relative posture of the optical scale and the light receiving portion can be kept constant.

10…測定子、12…接触子、14…蛇腹ブーツ、20…可動部、30…軸部、32…段付き軸部、32a…ばね当接面、34…保持部、34a…ばね巻回面、35…切り落とし部、36…スケール取り付け部、38…コイルばね、40…軸受(部)、42…ケース、43…ケース端部、44…カバー案内部、45…ばね当接部、46…ばね保持部、48…穴、50…(回り止め用)溝、52…基板受け部、52a…取り付けねじ穴、54…ケース、56…基板受け部、56a…取り付けねじ穴、58、59…切り欠き部、60…カバー、62…固定部、70…電子基板、70a、70b…取り付け穴、72…受光部、74…回路素子、76…(光学)スケール、76a…(ロール変位後の)スケール、76b…(ヨー変位後の)スケール、78…止めねじ、80…回り止め、82…溝縁部磁石、84…回り止め部、90…ターミナル部、92…信号線、94…電線、100…(ペンシル型)変位測定器、801、803…永久磁石(N極)、802、804…永久磁石(S極)、806…固定軸、811…芯、812…コイル、821…永久磁石(S極)、822…永久磁石(N極)、825…コイル磁石、d…隙間、Δθ…ヨー変位量 10 ... Stylus, 12 ... Contact, 14 ... Bellows boot, 20 ... Movable part, 30 ... Shaft, 32 ... Stepped shaft, 32a ... Spring contact surface, 34 ... Holding part, 34a ... Spring winding surface , 35 ... cut-off part, 36 ... scale mounting part, 38 ... coil spring, 40 ... bearing (part), 42 ... case, 43 ... case end, 44 ... cover guide part, 45 ... spring contact part, 46 ... spring Holding part, 48 ... hole, 50 ... (for detent) groove, 52 ... board receiving part, 52a ... mounting screw hole, 54 ... case, 56 ... board receiving part, 56a ... mounting screw hole, 58, 59 ... notch Part, 60 ... cover, 62 ... fixed part, 70 ... electronic board, 70a, 70b ... mounting hole, 72 ... light receiving part, 74 ... circuit element, 76 ... (optical) scale, 76a ... (after roll displacement) scale, 76b ... Scale (after yaw displacement), 78 ... Set screw, 80 ... Anti-rotation, 82 ... Groove edge magnet, 84 ... Anti-rotation part, 90 ... Terminal part, 92 ... Signal line, 94 ... Electric wire, 100 ... ( Pencil type) Displacement measuring instrument, 801, 803 ... Permanent magnet (N pole), 802, 804 ... Permanent magnet (S pole), 806 ... Fixed shaft, 811 ... Core, 812 ... Coil, 821 ... Permanent magnet (S pole) , 822 ... Permanent magnet (N pole), 825 ... Coil magnet, d ... Gap, Δθ ... Yaw displacement amount

Claims (4)

一端側に被測定物に当接する測定子が配設され、他端側にスケールが配設された棒状の可動部と、この可動部の反測定子側を収容する円筒状部材を含み、前記可動部を支持する軸受部を一端側に有し、前記スケールに対向して配設された検出部を有する固定部を備えた変位測定器において、
前記可動部がその長手軸周りに前記固定部に対して回動するのを防止する、可動部回り止め手段を前記可動部に、固定部回り止め手段を前記固定部にそれぞれ設け、前記可動部回り止め手段と前記固定部回り止め手段は、ともに磁石手段を含み、
前記可動部回り止め手段は前記軸受部よりも前記スケール側に設けられた長円形または矩形の突起とこの突起の周囲面であって長手方向に配設された永久磁石を有し、前記固定部回り止め手段は前記突起の前記長手方向の移動範囲に応じて形成された長円形または矩形の溝とこの溝の長手方向内周面に配設した永久磁石を有し、前記可動部側の永久磁石と前記可動部側永久磁石に対向する前記固定部側の永久磁石の磁極を同極とし、
前記固定部側の永久磁石は前記溝の長手方向内面に間隔を置いて複数個配設されており、前記間隔を置いた永久磁石間にコイル磁石を配設したことを特徴とする変位測定器。
A rod-shaped movable portion having a stylus in contact with an object to be measured on one end side and a scale on the other end side, and a cylindrical member accommodating the counter-measurer side of the movable portion are included. In a displacement measuring instrument having a bearing portion that supports a movable portion on one end side and a fixed portion having a detection portion arranged so as to face the scale.
The movable portion detent means for preventing the movable portion from rotating around the longitudinal axis with respect to the fixed portion is provided in the movable portion, and the fixed portion detent means is provided in the fixed portion, respectively, and the movable portion is provided. Both the detent means and the fixed portion detent means include a magnet means.
The movable portion detenting means has an oval or rectangular protrusion provided on the scale side of the bearing portion and a permanent magnet which is a peripheral surface of the protrusion and is arranged in the longitudinal direction, and the fixed portion. The detent means has an oval or rectangular groove formed according to the movement range of the protrusion in the longitudinal direction and a permanent magnet arranged on the inner peripheral surface of the groove in the longitudinal direction, and is permanent on the movable portion side. The magnetic poles of the magnet and the permanent magnet on the fixed portion side facing the movable portion side permanent magnet are set to the same pole.
A plurality of permanent magnets on the fixed portion side are arranged at intervals on the inner surface in the longitudinal direction of the groove, and a coil magnet is arranged between the permanent magnets at intervals . ..
前記固定部の一端側に設けた軸受部に、周方向に複数個に分割形成された永久磁石を配設し、前記可動部の外周であって前記軸受部に対応する位置に、前記軸受部の永久磁石に対応する磁極数を有する周方向に分割された複数個の永久磁石を配置したことを特徴とする請求項1に記載の変位測定器。 A plurality of permanent magnets divided and formed in the circumferential direction are arranged on the bearing portion provided on one end side of the fixed portion, and the bearing portion is located on the outer periphery of the movable portion and at a position corresponding to the bearing portion. The displacement measuring instrument according to claim 1, wherein a plurality of permanent magnets divided in the circumferential direction having a number of magnetic poles corresponding to the permanent magnets of the above are arranged. 前記可動部のスケールは、反射部と透過部が前記長手方向に規則的に多数形成された光学リニアスケールであり、前記固定部の検出部は、前記スケールに投射した光の反射光または透過光を検出するフォトダイオードを含むことを特徴とする請求項1または2に記載の変位測定器。 The scale of the movable portion is an optical linear scale in which a large number of reflecting portions and transmitting portions are regularly formed in the longitudinal direction, and the detecting portion of the fixed portion is the reflected light or transmitted light of the light projected on the scale. The displacement measuring instrument according to claim 1 or 2 , further comprising a photodiode for detecting light. 前記可動部の前記回り止めと前記固定部の前記検出部間にばねを配設するとともに、長円形または矩形の前記回り止めの前記長手方向側両端面および前記固定部の長円形または矩形の前記溝の長手方向両内側端面にそれぞれ永久磁石を配設し、対向する永久磁石の磁極を同極としたことを特徴とする、請求項1ないしのいずれか1項に記載の変位測定器。 A spring is arranged between the detent of the movable portion and the detection portion of the fixing portion, and both end faces of the detent on the longitudinal side of the oval or rectangular shape and the oval or rectangular shape of the fixing portion. The displacement measuring instrument according to any one of claims 1 to 3 , wherein permanent magnets are arranged on both inner end faces in the longitudinal direction of the groove, and the magnetic poles of the facing permanent magnets are made the same pole.
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