JP6961968B2 - Laminated modeling inspection device, laminated modeling device and laminated modeling method - Google Patents

Description

The present invention relates to a laminated modeling technique for forming a three-dimensional model by laminating layers.

The method of dividing 3D CAD (Computer Aided Design) data into layers and adding materials by stacking layers on top of each divided layer to manufacture a 3D model is defined as Adaptive Manufacturing in international standards. Has been done. This manufacturing method, which was invented in the 1980s, is generally called a 3D printer (3D printer). In recent years, 3D printers have been attracting attention as a new manufacturing method because they can easily manufacture complicated shapes without using a mold if they have 3D CAD data.

Unlike removal processing by cutting and molding processing in which a material is poured into a mold and hardened, a 3D printer can easily and accurately manufacture shapes that were once difficult to manufacture, such as mesh shapes and porous shapes. Furthermore, it is also expected to enable modeling in which a plurality of types of materials are freely arranged in a single part. This is because, by modeling using a plurality of materials, it is possible to realize a modeled product with new functions that make use of the characteristics of each material.

For example, by combining a conductive material and an insulating material, a modeled object having the function of an electronic circuit is realized. Further, by combining a hard material and a flexible material, a modeled object having both strength and flexibility can be realized. And these functions can be realized without developing new materials.

By the way, defects such as cavities and irregularities may occur in the layer of the three-dimensional model formed by the 3D printer. Therefore, Patent Documents 1 and 2 disclose methods for detecting this defect, removing the defective portion, and remodeling. In Patent Document 1, each time a layer is laminated, a defect such as a cavity inside the layer is detected by detecting an elastic wave propagating inside the modeled object due to an impact caused by irradiation with a laser beam. Further, in Patent Document 2, a three-dimensional shape measuring device and an X-ray inspection device are used to acquire data on the surface shape of the layer and data on the internal structure of the layer to detect defects. Further, in both Patent Documents 1 and 2, it is stated that a three-dimensional model without defects is realized by removing and remodeling the defective portion detected in the layer.

Japanese Unexamined Patent Publication No. 2016-60063 International Publication No. 2016/143137

However, the methods of Patent Documents 1 and 2 have the following problems. That is, in Patent Documents 1 and 2, it is necessary to inspect the entire layer for defects every time the layers are laminated. There are various types of defects such as cavities, irregularities, and poor curing, and they may be exposed on the surface of the layer or hidden inside the layer. Therefore, in order to detect a defect, a plurality of inspections according to the type of defect and the location of the defect must be performed in detail. For this reason, the inspection time per layer becomes longer, and the inspection time becomes longer due to the increase in the area of the layers and the increase in the number of layers. This increases production costs.

The present invention has been made in view of the above problems, and an object of the present invention is to provide a laminated modeling apparatus capable of shortening the time for defect inspection when laminating layers to form a three-dimensional modeled object. be.

The laminated modeling inspection device of the present invention has a collecting unit that collects modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional model, and defects based on the modeling process data. It has a specific unit that identifies an inspection area that may exist, and an inspection unit that inspects the specified inspection area.

The laminated modeling apparatus of the present invention has a collecting unit that collects modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional model, and defects based on the modeling process data. A laminated modeling inspection device having a specific unit that specifies an inspection area that may be specified, an inspection unit that inspects the specified inspection area, a supply unit that supplies the predetermined material, and the three-dimensional modeling. It has a modeling part for modeling an object.

The laminated modeling method of the present invention collects modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional model, and there is a possibility that defects exist based on the modeling process data. A certain inspection area is specified, and the identified inspection area is inspected.

According to the present invention, it is possible to provide a laminated modeling apparatus capable of shortening the time for defect inspection when laminating layers to form a three-dimensional modeled object.

It is a block diagram which shows the structure of the laminated modeling inspection device and the laminated modeling device of the first embodiment of the present invention. It is a figure which shows the structure of the laminated modeling inspection apparatus and the laminated modeling apparatus of the 2nd Embodiment of this invention. It is a figure for demonstrating operation of the laminated modeling inspection apparatus of 2nd Embodiment of this invention. It is a figure for demonstrating operation of the laminated modeling inspection apparatus of 2nd Embodiment of this invention. It is a flowchart which shows the operation of the laminated modeling inspection device and the laminated modeling device of the second embodiment of the present invention. It is a flowchart which shows the operation which specifies the inspection area of the laminated modeling inspection apparatus of the 2nd Embodiment of this invention. It is a flowchart which shows the operation which repairs the defective part of the laminated modeling inspection apparatus of the 2nd Embodiment of this invention. It is a figure for demonstrating the case where the operation of specifying the inspection area of the laminated modeling inspection apparatus of the 2nd Embodiment of this invention is performed by limiting the part of a modeled object. It is a figure for demonstrating the repair method of the laminated modeling inspection apparatus of 2nd Embodiment of this invention. It is a figure for demonstrating the repair method of the laminated modeling inspection apparatus of 2nd Embodiment of this invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. However, although the embodiments described below have technically preferable limitations for carrying out the present invention, the scope of the invention is not limited to the following.
(First Embodiment)
FIG. 1 is a block diagram showing a configuration of a laminated modeling inspection device and a laminated modeling device according to the first embodiment of the present invention.

The laminated modeling inspection device 1 of the present embodiment has a collecting unit 13 that collects modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional modeled object. Further, it has a specific unit 14 that identifies an inspection area where a defect may exist based on the modeling process data, and an inspection unit 15 that inspects the specified inspection area. Further, the laminated modeling device 10 of the present embodiment includes a laminated modeling inspection device 1, a supply unit 11 for supplying the predetermined material, and a modeling unit 12 for modeling the three-dimensional modeled object.

According to the laminated modeling inspection device 1 and the laminated modeling device 10 of the present embodiment, since the defect inspection is performed only in the specified inspection area in the layer, the time for the defect inspection is shortened.

As described above, according to the present embodiment, it is possible to provide a laminated modeling apparatus capable of shortening the time for defect inspection when laminating layers to form a three-dimensional modeled object.
(Second Embodiment)
FIG. 2 is a diagram showing a configuration of a laminated modeling inspection device and a laminated modeling device according to a second embodiment of the present invention. The laminated modeling device 20 of the present embodiment is a modeling that forms a three-dimensional model by laminating a supply unit 21 that supplies a predetermined material and the supplied material as a material layer and curing a predetermined position of each material layer. It has a portion 22 and a laminated modeling inspection device 2 that inspects a cured layer (cured layer) for defects and repairs the defective portion. Further, it has a control unit 27 that controls and links the supply unit 21, the modeling unit 22, and the laminated modeling inspection device 2.

The supply unit 21 has a chamber 211 and a supply cylinder 212. Chamber 211 stores the material. The supply cylinder 212 supplies a predetermined amount of the material stored in the chamber 211 to a predetermined position of the stage 221 described later in the modeling unit 22. Here, the predetermined amount is an amount required to spread the material on the stage 221 as a material layer having a predetermined thickness. The supply cylinder 212 can also monitor actual values of quantities such as weight and volume of the supplied material.

The material can be powder and the shape of the powder can be spherical. The atomizing method can be used as the method for generating the spherical shape, but the method is not limited to this. The particle size of the powder can be about 10 μm to 100 μm, and the average particle size can be about 20 μm to 50 μm, but is not limited thereto. The shape of the powder can also be a scaly flat plate shape (disk shape). The flat plate shape can be obtained by further flattening a spherical powder produced by an atomizing method or the like into a scaly shape by a method such as stamping, but the flat plate shape is not limited thereto. Further, the shape of the material is not limited to a sphere or a flat plate, and may be an arbitrary polyhedron or an ellipsoid.

The material of the material can be a plastic material, for example, nylon, polylactic acid, polyethylene, polystyrene, polyphenylene sulfide, polyetheretherketone and the like. Further, a predetermined amount of glass, carbon or the like may be added to these materials. It can also be a metal material, for example copper, stainless steel, aluminum or titanium. It can also be ceramic or carbon.

The modeling portion 22 has a stage 221, a squeegee 222, and a hardening portion 223.

The stage 221 is provided with a modeling surface for forming a three-dimensional model by laminating the materials supplied from the supply unit 21. Further, the stage 221 has an elevating mechanism, and the modeling surface can be elevated and lowered according to the stacking of materials.

The squeegee 222 is a material layer in which the material supplied on the stage 221 is spread flat on the molding surface and spread to a uniform thickness. The shape of the squeegee 222 can be a flat squeegee, a square squeegee, a sword squeeze, or the like according to the purpose. Further, the squeegee 222 may be used as a roller, and the material may be flattened and spread to a uniform thickness by rolling the roller. The material of the squeegee 222 can be selected from rubber, plastic, metal and the like according to the purpose.

The cured portion 223 supplies energy to a predetermined region of the material layer flattened by the squeegee 222 and spread over a uniform predetermined thickness, that is, a region forming a modeled object, and heats the cured portion 223 to cure the cured portion 223 to a predetermined thickness. Form a layer. As a method for forming the cured layer, a powder bed fusion method classified by ASTM (American Society for Testing and Materials) as a method of Adaptive Manufacturing can be used.

In the case of this method, the cured portion 223 can be a laser irradiation mechanism that irradiates a laser beam that heats the material layer, or an electron beam irradiation mechanism that irradiates an electron beam. The cured portion 223 heats a predetermined region of the material layer on the stage 221 by irradiating a predetermined region with a laser beam or an electron beam having a predetermined output for a predetermined time to form a cured layer. As the laser, a fiber laser or the like used in Adaptive Manufacturing can be used. The cured unit 223 can also monitor the actual value of the output of the laser beam or the electron beam.

The remaining portion of the material layer excluding the cured layer is an uncured material and can be recovered or discarded.

The laminated modeling inspection device 2 has a collecting unit 23, a specific unit 24, an inspection unit 25, and a repair unit 26.

The collection unit 23 collects modeling process data. The modeling process data is actual data related to modeling conditions and shapes during modeling acquired by a method such as monitoring during the process (process) in which the supply unit 21 and the modeling unit 22 model the modeled object. The modeling process data includes material supply data of the supply unit 21, energy supply data of the modeling unit 22 at the time of curing, temperature data of the material layer at the time of curing, and the like. These modeling process data are compared with the setting data related to modeling and the shape data when the modeled object is normally formed in order for the specific unit 24, which will be described later, to specify the inspection area for defect inspection. It is data that can predict that there may be a defect in it.

When the modeling process data is the material supply data, the collecting unit 23 acquires the value of the weight and volume of the material supplied for each layer monitored by the supply cylinder 212 for each layer. Further, the collecting unit 23 acquires an image of the surface of the material layer for each layer spread by the squeegee 222 or data of the unevenness of the surface of the material layer together with the position information on the stage 221. For this purpose, the collecting unit 23 can have a means for taking an image such as a camera, a three-dimensional shape measuring device using a laser, a stylus, or the like.

When the modeling process data is energy supply data, the collecting unit 23 sets the output value of the laser light or electron beam supplied by the laser irradiation mechanism or electron beam irradiation mechanism monitored by the curing unit 223 at the time of curing. And the position information of each layer irradiated with electron beam is acquired. As will be described later, the curing unit 223 is designated by the control unit 27 as the output value of the laser beam or electron beam, the irradiation position, and the irradiation time, and performs irradiation based on this. Therefore, the collecting unit 23 can acquire the irradiation position information from the control unit 27 and the output value of the laser beam or the electron beam corresponding to the position information from the curing unit 223.

When the modeling process data is the temperature data of the cured material layer, the collecting unit 23 can acquire the temperature data of the cured material layer by providing a thermal image camera using infrared rays. The temperature data at the moment of irradiation of the laser beam or the electron beam or immediately after the irradiation can be acquired by high-speed photography in which a plurality of frames are photographed per second as needed.

The identification unit 24 identifies the inspection area of the cured layer based on the modeling process data acquired by the collection unit 23.

When the modeling process data is the material supply data, the specific unit 24 has the value of the weight and volume of the material set by the control unit 27 previously acquired from the control unit 27 by the specific unit 24 and the supply cylinder 212 acquired by the collection unit 23. Compare the weight and volume values of the materials supplied by. When the difference between the two exceeds a preset range, the specific portion 24 states that the cured layer formed of the material layer having a weight value or a volume value exceeding the range may have a defect. , The entire hardened layer is specified as an inspection area. For example, when the supplied weight value exceeds the range of ± 10% of the set value, the layer exceeding this range is specified as the inspection area. On the other hand, if the range is not exceeded, the cured layer is not specified in the inspection area.

Further, the specific unit 24 includes data or an image of the surface unevenness of the material layer acquired in advance when normal modeling is performed without defects, and data or an image of the surface unevenness of the material layer acquired by the collecting unit 23. Compare with. If the difference between the unevenness data of the two exceeds a preset range, or if a difference is observed between the two images, the specific unit 24 has a defect in the portion exceeding the range or the difference in the image. Identify these areas in the inspection area as they may have occurred.

For example, when the data of the unevenness of the surface of the material layer is the average roughness for each portion of a predetermined area, the average roughness acquired by the collecting unit 23 is compared with the average roughness in the normal case, and the difference between the two is preset. When the specified range is exceeded, the relevant part exceeding the range is specified in the inspection area. Further, when the data of the unevenness on the surface of the material layer is a step, the step acquired by the collecting unit 23 and the step in the normal case corresponding to the position of the step are compared, and the difference between the two is set in a preset range. If it exceeds, the relevant part is specified as an inspection area. Further, in the case of the image of the surface of the material layer, the difference is detected by comparing the image acquired by the collecting unit 23 with the image in the normal case, and the difference portion is specified in the inspection area.

When the modeling process data is energy supply data, the specific unit 24 includes the output value of the laser beam or electron beam corresponding to the position information set by the control unit 27 previously acquired from the control unit 27 by the specific unit 24, and the collection unit 23. Compare with the output value of the laser beam or electron beam corresponding to the position information acquired by. When the difference between the two exceeds a preset range, the specific unit 24 considers that the portion irradiated with the laser beam or the electron beam exceeding the range may have a defect, and inspects the portion. To specify. For example, in the case of curing by irradiating laser light, when the output value of the laser light exceeds the range of ± 5% of the set value, the portion exceeding this range is specified as the inspection area.

When the modeling process data is the temperature data of the cured material layer, the specific unit 24 compares the temperature data at the time of normal modeling without defects acquired in advance with the temperature data acquired by the collecting unit 23. .. When the difference between the two exceeds a preset temperature range, the specific unit 24 determines that the portion exceeding the range may have a defect and specifies the portion in the inspection area.

The modeling process data when the supply unit 21 and the modeling unit 22 actually model the three-dimensional modeled object can be used as the above material supply data, energy supply data at the time of curing, and temperature data of the material layer at the time of curing. Is not limited. The modeling process data at the time of modeling the modeled object may be any data that can be compared with the data set by the control unit 27 and the information at the time of normal modeling.

The identification of the inspection area in the specific unit 24 described above does not require detailed and rigorous analysis as long as it can identify a portion of the modeling process data acquired by the collection unit 23 that may have some abnormality. Therefore, it can be performed in a short time as compared with the case where a plurality of inspections according to the type of defect and the location of the defect are performed in detail as in the case of defect inspection.

Further, the specifying unit 24 does not need to specify the inspection area for all of the modeling process data such as the material supply data, the energy supply data at the time of curing, and the temperature data of the material layer at the time of curing. The identification unit 24 may specify the inspection area by selecting one or more data effective for specifying the area based on the actual results of effectiveness in specifying the inspection area. By doing so, it is possible to shorten the time for specifying the inspection area in the specific unit 24.

The inspection unit 25 inspects the inspection area specified by the specific unit 24 and detects a defective portion. The inspection unit 25 is a three-dimensional shape measuring instrument using a laser beam, a stylus, or the like as a means for detecting defects such as irregularities appearing on the surface of the cured layer in order to perform a defect inspection in the specified inspection region. And a camera can be provided. Further, as a means for detecting defects such as cavities inside the cured layer, an inspection device using ultrasonic waves, elastic waves, X-rays, or the like can be provided. The inspection unit 25 is not limited to the above method as long as it can detect defects on the surface or inside of the cured layer.

In the case of the three-dimensional shape measuring instrument, the inspection unit 25 detects the unevenness of the specified inspection region. The inspection unit 25 compares the unevenness of the detected inspection area with the unevenness of the surface of the cured layer at the position corresponding to the inspection area when the normal molding without defects acquired in advance is performed, and both of them are compared. If the difference exceeds a preset range, the unevenness is identified as a defect. At this time, the inspection unit 25 identifies the position information of the defect.

In the case of a camera, the inspection unit 25 acquires a surface image of the specified inspection area. The inspection unit 25 compares the acquired surface image of the inspection area with the surface image of the cured layer obtained in advance at a position corresponding to the inspection area when normal modeling is performed without defects, and both of them are used. The part determined to be different between the images is identified as a defect. At this time, the inspection unit 25 identifies the position information of the defect.

In the case of an inspection device inside a layer using ultrasonic waves, elastic waves, X-rays, or the like, the inspection unit 25 detects and analyzes signals by ultrasonic waves, elastic waves, X-rays, or the like from a specified inspection area. At this time, a comparison with a signal in a normal state acquired in advance may be performed, and a defect such as an internal cavity may be identified from the comparison result. At this time, the inspection unit 25 identifies the position information of the defect.

In the defect inspection of the hardened layer, it is necessary to perform a plurality of detailed inspections depending on the type of defect and whether the defect is on the surface or inside the layer. Therefore, the inspection time per layer becomes longer, and the inspection time becomes longer due to the increase in the area of the layers and the increase in the number of layers. However, in the laminated modeling inspection device 2, the specific unit 24 identifies the inspection area where a defect may occur in advance, and the inspection unit 25 inspects the specified inspection area, thus shortening the time for defect inspection. be able to.

The repair unit 26 repairs the defective portion detected by the inspection unit 25. The repair unit 26 has a function of removing the defective portion, a function of supplying a new material to the removed portion, and a function of curing the newly supplied material in order to reshape the defective portion. Further, it has a function of shaping such as removing an unnecessary part of the cured part and a function of inspecting the reshaped part as described above.

The repair unit 26 can be provided with a cutting mechanism such as a machining center that enables partial cutting and a removal processing mechanism by laser polishing as a function of removing a defective portion. The type of cutting tool used for cutting, the cutting conditions, and the laser polishing processing conditions can be selected according to the material of the modeled object. The repair unit 26 can remove the defective portion of the hardened layer and its periphery by the thickness of the hardened layer.

The repair unit 26 can be provided with a material supply mechanism having a nozzle-shaped tip so that the material can be selectively supplied to a minute region as a function of newly supplying the material to the removed portion. The repair unit 26 can calculate the material supply amount based on the volume of the removed defective portion and supply a predetermined amount of material to a predetermined position. The repair unit 26 may also use the supply unit 21 to supply a new material to the removed portion. The repair unit 26 may also pressurize the material after supplying the material so that the material is distributed to every corner. Further, the material may be supplied and simultaneously heated to be cured.

As a function of curing the newly supplied material, the repair unit 26 can irradiate a laser beam or an electron beam with the curing unit 223 to cure the material. The repair portion 26 may also be provided with a dedicated cured portion so as to be suitable for curing in a fine region.

The repair unit 26 can be provided with a shaping mechanism using a cutting tool or a file as a function of shaping such as removing an unnecessary portion of the hardened portion. The shaping mechanism can process the reshaped portion into a predetermined state by scraping or polishing an unnecessary portion of the cured portion.

The repair unit 26 can inspect the surface and the inside of the remodeled portion by using the inspection unit 25 as a function of inspecting the remodeled portion. When a defect is detected in the remodeled portion as a result of this defect inspection, the repair unit 26 removes the defective portion again and remodels. On the other hand, if no defect is detected in the remodeled portion, it is possible to move to the modeling of the next layer.

In the above description, the collecting unit 23 collects the modeling process data for each layer, and based on this, the inspection area of the specific unit 24 is specified, the defect inspection of the inspection unit 25, and the remodeling of the repair unit 26 are performed. Is performed on a layer-by-layer basis, but is not limited to this. The above series of processes may be performed by collectively performing a plurality of layers of two or more layers. As a result, when the inspection area of the specific unit 24 is specified for each of a plurality of layers, the accuracy of identifying the defect position of the inspection unit 25 is lowered, and the time for defect detection and remodeling can be shortened. That is, it is possible to select whether to process each layer individually or a plurality of layers collectively according to the characteristics such as strength and accuracy required for the modeled object and the cost.

The control unit 27 has a function of connecting to the supply unit 21, the modeling unit 22, and the laminated modeling inspection device 2, and controlling and linking them. That is, the supply amount, supply position and supply timing of the material, the amount of ascending / descending of the stage 221, the operation of the squeegee, the output value of the laser beam, the irradiation position and the irradiation time, the defect inspection in the laminated modeling inspection device 2 and the remodeling of the defective portion. Controls related to the laminated modeling of the modeled object.

The control unit 27 can be realized by operating an information processing device such as a server by a program. Among the operations by this program, the operations related to the laminated modeling are set based on the three-dimensional CAD data of the modeled object. That is, the control unit 27 can control the modeling of the three-dimensional modeled object based on the three-dimensional CAD data.

3A and 3B are diagrams for explaining the operation of the laminated modeling inspection device 2 of the present embodiment. FIG. 3A shows the case where the defective portion appears on the surface of the cured layer, and FIG. 3B shows the case where the defective portion exists inside the cured layer.

In FIG. 3A, in (a), the identification unit 24 specifies the inspection area based on the modeling process data acquired by the collection unit 23. In (b), the inspection unit 25 inspects the inspection area specified by the specific unit 24, detects a defect, and specifies the position thereof. In (c), the repair unit 26 removes the defective portion based on the position of the identified defect. In (d), the material is selectively supplied to the region where the defective portion has been removed. Here, the case where the material is supplied by the supply unit 21 is shown, but a dedicated supply mechanism for selectively supplying the material to a minute region may be provided to supply the material.

In (e), the supplied material is cured. Here, the case where the cured portion 223 is cured is shown, but a dedicated cured portion may be provided and cured so as to be suitable for curing in a fine region. In (f), shaping such as removing unnecessary portions after curing is performed. Here, the case where the surface of the remodeled portion is matched with the surface of the cured portion around the remodeled portion is shown, but the present invention is not limited to this. The shaping can be performed according to the design conditions of the remodeled part.

In (g), the inspection unit 25 inspects the remodeled portion for defects. In (h), if no defect is detected as a result of the defect inspection, the repair is terminated and the process proceeds to modeling the next layer. When a defect is detected, the process from the removal of the defective portion in (c) is repeated.

In the case of FIG. 3B, since the defect portion exists inside the cured layer, the method of detecting the defect is different from that of FIG. 3A, but the series of operations (a) to (h) is the case of FIG. 3A. Can be similar to.

FIG. 4 is a flowchart showing the operation of the laminated modeling apparatus 20 of the present embodiment. The flowchart of FIG. 4 is started when the control unit 27 starts the operation of performing modeling.

In step S01, the supply unit 21 supplies a material having a volume having a predetermined laminated thickness on the modeling surface of the stage 221. In step S02, the squeegee 222 laminates the supplied material as a material layer flatly spread on the molding surface of the stage 221 with a uniform predetermined thickness. This process is called squeezing. In step S03, the curing unit 223 irradiates a predetermined position of the material layer with a laser beam or an electron beam having a predetermined output for a predetermined time to heat the material layer, and cures the material layer.

In step S04, the collecting unit 23 collects material supply data, energy supply data at the time of curing, temperature data of the material layer at the time of curing, and the like, which are layer modeling process data. In step S05, the identification unit 24 identifies the inspection area of the cured layer based on the modeling process data acquired by the collection unit 23. The details of step S05 will be described later.

In step S06, the inspection unit 25 inspects the surface and the inside of the cured layer in the inspection area specified by the specific unit 24, and if a defect is detected, identifies the position of the defect. If there is no inspection area specified by the specific unit 24, the inspection unit 25 proceeds to the next step S07 without doing anything in particular.

When a defect is detected by the inspection unit 25 (YES in step S07), the repair unit 26 repairs the defective portion (step S08). The details of step S08 will be described later. If no defect is detected (NO in step S07) or if the defective portion is repaired, if a predetermined number of layers in the laminated molding are laminated (YES in step S09), the process ends. On the other hand, when a predetermined number of layers are not laminated (NO in step S09), the stage 221 is lowered by the thickness of the next layer in order to form the next layer (step S10), and step S01 is repeated. ..

FIG. 5 is a flowchart showing an operation of specifying an inspection area of the laminated modeling inspection device 2 (step S05 of FIG. 4). The flowchart of FIG. 5 starts when the collecting unit 23 collects the modeling process data.

In step S11, the specific unit 24 uses the modeling process data acquired by the collecting unit 23, the data set in advance by the control unit 27 (setting data), and the data when normal modeling is performed (normal data). ) And.

In step S12, the specific unit 24 determines whether or not there is a difference between the modeling process data and the setting data or normal data depending on whether or not the difference between the two exceeds a preset range as a result of the comparison in step S11. Check. As a result, the specific unit 24 detects abnormal data that is considered to be different from the setting data and the normal data from the modeling process data.

If no abnormal data is detected (NO in step S12), the process ends. When abnormal data is detected (YES in step S12), the process proceeds to step S13. In step S13, the identification unit 24 identifies the position of the abnormal data as a defect inspection area and ends.

FIG. 6 is a flowchart showing an operation of repairing a defective portion of the laminated modeling inspection device 2 (step S08 of FIG. 4). The flowchart of FIG. 6 starts when a defect is detected by the inspection unit 25.

In step S21, the repair unit 26 removes the portion containing the defect identified by the inspection unit 25 from the cured layer. In step S22, the repair unit 26 remodels by supplying a new material to the removed portion, curing the newly supplied material, and performing shaping such as removing an unnecessary portion after curing. In step S23, the repair unit 26 inspects the surface and the inside of the remodeled portion for defects. If a defect is detected in the remodeled portion (YES in step S24), step S21 is repeated. If no defect is detected in the remodeled portion (NO in step S24), the process ends.

FIG. 7 is a plan view for explaining a case where the operation of specifying the inspection area of the laminated modeling inspection device 2 is performed by limiting the portion of the modeled object. For example, as shown in FIG. 7, when the modeled object is composed of the A part, the B part, and the C part, and the strength and accuracy of the modeled object are obtained in the B part but not in the A part or the C part, the laminated modeling inspection device. In No. 2, defect inspection and repair can be performed only in the B part, and not in the A part and the C part.

That is, the laminated modeling inspection device 2 collects modeling process data for part B, identifies a portion of abnormal data as an inspection area based on the modeling process data, inspects the inspection area, detects a defective portion, and detects a defect. Repair the part. FIG. 7 shows a case where the A part, the B part, and the C part are formed from one material layer, and the collecting part 23 has acquired the weight value when the material for one layer is supplied as the modeling process data. In this case, if the weight value is an abnormal value, part B is designated as the inspection area. When the A part, the B part, and the C part are formed of different materials, the weight value of the material forming the B part is acquired, and if the weight value is an abnormal value, the B part is inspected. It should be specified in.

When the modeling process data is the image of the surface of the material layer other than the material supply data, the unevenness data, the output value of the laser beam or electron beam at the time of curing, the surface temperature of the material layer at the time of curing, etc. It is the same as the case of the supply data of the material of. That is, for the B part, the modeling process data can be collected, the abnormal data portion can be identified as the inspection area based on the modeling process data, the inspection area can be inspected to detect the defective portion, and the defective portion can be repaired. ..

Further, in the laminated modeling inspection device 2, the defect inspection and repair may be performed on all layers in the B portion, and the defect inspection and repair may be performed on the A portion and the C portion by thinning out every other layer, for example. Further, when the modeled object is composed of a plurality of materials, a defect inspection and repair may be performed on a layer using a specific material. By doing so, the time for defect inspection can be shortened.

8A and 8B are cross-sectional views for explaining a method of repairing the laminated modeling inspection device 2. 8A and 8B show the removal shape when the defective portion is removed. FIG. 8A is a hemispherical shape, and FIG. 8B is a mortar shape. In any case, the shape after removal is such that the central portion of the removed portion, that is, the central portion of the removed portion in a plan view is the deepest.

By processing in this way, when the material is supplied to the removed part and cured, the material is heated to every corner concentrically by irradiating the central part with a laser beam or an electron beam in a plan view of the removed part. It is possible to cure uniformly. As a result, defects are less likely to occur in the remodeled portion, and the repair time is shortened. The shape for removing the defective portion is not limited to the hemispherical shape or the mortar shape as long as it is easily heated to every corner of the remodeled portion. Further, the irradiation of the laser beam or the electron beam is not limited to the irradiation of the central portion, and may be irradiated so as to scan.

As described above, according to the laminated modeling inspection device 2 and the laminated modeling device 20 of the present embodiment, the defect inspection is performed only in the specified inspection area in the layer, so that the defect inspection time is shortened.

As described above, according to the present embodiment, it is possible to provide a laminated modeling apparatus capable of shortening the time for defect inspection when laminating layers to form a three-dimensional modeled object.

The present invention is not limited to the above-described embodiment, and various modifications can be made within the scope of the invention described in the claims, and these are also included in the scope of the present invention.

In addition, some or all of the above embodiments may be described as in the following appendix, but are not limited to the following.
(Appendix 1)
A collection unit that collects modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional model.
A specific part that identifies an inspection area where defects may exist based on the modeling process data, and
A laminated modeling inspection device having an inspection unit for inspecting the specified inspection area.
(Appendix 2)
The laminated modeling inspection apparatus according to Appendix 1, wherein the specific unit identifies anomalous data in the modeling process data, and specifies a region of the abnormal data in the layer of the material as the inspection region.
(Appendix 3)
The specific unit identifies the abnormal data based on the comparison between the modeling process data and the modeling setting data or the modeling process data at the time of normal modeling acquired in advance, as described in Appendix 2. Laminated modeling inspection equipment.
(Appendix 4)
The modeling process data includes at least one of the material supply data, the energy supply data at the time of curing, and the temperature data of the material layer at the time of curing, and is one of the appendices 1 to 3. The laminated modeling inspection device described in the section.
(Appendix 5)
The laminated modeling inspection device according to item 1 of Appendix 1 to 4, wherein the collecting unit collects the modeling process data for each layer of the material.
(Appendix 6)
The laminated modeling inspection device according to item 1 of Appendix 1 to 5, wherein the collecting unit collects the modeling process data from a specific part of the layer of the material or a layer of the material having the specific material.
(Appendix 7)
The laminated molding inspection apparatus according to item 1 of Appendix 1 to 6, further comprising a repairing portion for remodeling the defective portion when the inspection unit detects a defective portion in the inspection region.
(Appendix 8)
The laminated modeling inspection apparatus according to Appendix 7, wherein the repaired portion removes the defective portion and removes the removed portion so that the central portion is deepest from the surface in a plan view.
(Appendix 9)
The laminated modeling inspection device according to Appendix 7 or 8, wherein the inspection unit inspects the remodeled portion.
(Appendix 10)
A laminated modeling device including the laminated modeling inspection device according to item 1 of Appendix 1 to 9, a supply unit for supplying the predetermined material, and a modeling unit for modeling the three-dimensional modeled object.
(Appendix 11)
Collecting modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional modeled object,
Based on the modeling process data, identify the inspection area where defects may exist, and identify the inspection area.
A laminated modeling method for inspecting the identified inspection area.
(Appendix 12)
The laminated molding method according to Appendix 11, wherein anomalous data in the modeling process data is specified, and a region of the abnormal data in the layer of the material is specified as the inspection region.
(Appendix 13)
The laminated modeling method according to Appendix 12, wherein the abnormal data is specified based on a comparison between the modeling process data and the modeling setting data or the modeling process data obtained in advance when normal modeling is performed.
(Appendix 14)
The modeling process data includes at least one of the material supply data, the energy supply data at the time of curing, and the temperature data of the material layer at the time of curing, and is one of the appendices 11 to 13. The laminated molding method described in the section.
(Appendix 15)
The laminated modeling method according to item 1 of Appendix 11 to 14, wherein the modeling process data is collected for each layer of the material.
(Appendix 16)
The laminated molding method according to item 1 of Appendix 11 to 15, wherein the modeling process data is collected from a specific part of the layer of the material or a layer of the material having the specific material.
(Appendix 17)
The laminated molding method according to item 1 of Appendix 11 to 16, wherein when a defective portion is detected in the inspection region, the defective portion is remodeled.
(Appendix 18)
The laminated molding method according to Appendix 17, wherein the defective portion is removed, and the central portion is removed from the surface so as to be the deepest in the plan view of the removed portion.
(Appendix 19)
The laminated molding method according to Appendix 17 or 18, wherein the remodeled portion is inspected.

1, 2 Laminated modeling inspection device 10, 20 Laminated modeling device 11 Supply section 12 Modeling section 13 Collection section 14 Specific section 15 Inspection section 21 Supply section 211 Chamber 212 Supply cylinder 22 Modeling section 221 Stage 222 Squeegee 223 Hardened section 23 Collection section 24 Specific part 25 Inspection part 26 Repair part 27 Control part

Claims (9)

A collection unit that collects modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional model.
A specific part that identifies an inspection area where defects may exist based on the modeling process data, and
It has an inspection unit that inspects the identified inspection area, and has an inspection unit.
The modeling process data is
The value of the weight or volume of the material supplied for each layer, and
The output value of the laser beam or electron beam supplied by the laser irradiation mechanism or electron beam irradiation mechanism during curing, and
Including at least one of
Laminated modeling inspection equipment.
The laminated modeling inspection apparatus according to claim 1, wherein the specific unit identifies anomalous data in the modeling process data, and specifies a region of the abnormal data in a layer of the material as the inspection region. The second aspect of the present invention, wherein the specific unit identifies the abnormal data based on a comparison between the modeling process data and the modeling setting data or the modeling process data at the time of normal modeling acquired in advance. Laminated modeling inspection equipment. The collection unit, certain portions of the layer of material or from a layer of said material having a specific material, and collecting the construction process data, layered manufacturing inspection apparatus according one of among claims 1 to 3 .. A repair unit which the measurement part is remodeling the defective portion and detecting a defective portion in the examination region, layered manufacturing inspection apparatus according one of among claims 1 to 4. The laminated molding inspection apparatus according to claim 5 , wherein the repaired portion removes the defective portion and removes the removed portion so that the central portion is deepest from the surface in a plan view. A laminated modeling device comprising the laminated modeling inspection device according to claim 1 of claims 1 to 6 , a supply unit for supplying the predetermined material, and a modeling unit for modeling the three-dimensional modeled object. Collecting modeling process data obtained in the process of laminating and curing layers of a predetermined material to form a three-dimensional modeled object,
Based on the modeling process data, identify the inspection area where defects may exist, and identify the inspection area.
Inspect the identified inspection area and
The modeling process data is
The value of the weight or volume of the material supplied for each layer, and
The output value of the laser beam or electron beam supplied by the laser irradiation mechanism or electron beam irradiation mechanism during curing, and
Including at least one of
Laminated modeling method.
The laminated molding method according to claim 8 , wherein the abnormality data in the modeling process data is specified, and a region of the abnormality data in the layer of the material is specified as the inspection region.

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