JP6991673B2 - 剥離方法 - Google Patents
剥離方法 Download PDFInfo
- Publication number
- JP6991673B2 JP6991673B2 JP2018033502A JP2018033502A JP6991673B2 JP 6991673 B2 JP6991673 B2 JP 6991673B2 JP 2018033502 A JP2018033502 A JP 2018033502A JP 2018033502 A JP2018033502 A JP 2018033502A JP 6991673 B2 JP6991673 B2 JP 6991673B2
- Authority
- JP
- Japan
- Prior art keywords
- support plate
- substrate
- holding
- peeling
- starting point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/11—Separation of active layers from substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/032—Manufacture or treatment of conductive parts of the interconnections of conductive barrier, adhesion or liner layers
- H10W20/054—Manufacture or treatment of conductive parts of the interconnections of conductive barrier, adhesion or liner layers by selectively removing parts thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/019—Manufacture or treatment using temporary auxiliary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H10P72/7418—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding of passive members, e.g. a chip mounting substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7422—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/744—Details of chemical or physical process used for separating the auxiliary support from a device or a wafer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/744—Details of chemical or physical process used for separating the auxiliary support from a device or a wafer
- H10P72/7442—Separation by peeling
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/014—Manufacture or treatment using batch processing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Laser Beam Processing (AREA)
- Dicing (AREA)
Description
3 支持板(キャリア板)
3a 第1面(表面)
3b 第2面(裏面)
5 剥離層(仮接着層)
7 基板(封止基板)
7a 第1面(表面)
9 デバイスチップ
11 封止材(モールド樹脂層)
13 パッケージデバイス(小片)
2 剥離装置
4 チャックテーブル(第1保持ユニット)
6 枠体
6a 流路
8 保持板
8a 保持面
10 バルブ
12 吸引源
14 ノズル
16 吸引パッド(第2保持ユニット)
16a 保持面
18 切削ユニット
20 スピンドル
22 切削ブレード
24 コレット(ピックアップツール、第2保持ユニット)
24a 保持面
Claims (2)
- 支持板の表面に剥離層を介して設けられた基板を、該支持板から剥離する剥離方法であって、
該支持板と該基板との一方を第1保持ユニットで保持する第1保持工程と、
該支持板と該基板との端部で露出する該剥離層の端部に流体を吹き付け、該基板を該支持板から剥離する際の起点となる起点領域を形成する起点領域形成工程と、
該支持板と該基板との他方を第2保持ユニットで保持する第2保持工程と、
該第1保持ユニットと該第2保持ユニットとを互いに離れる方向に相対的に移動させて該基板を該支持板から剥離する剥離工程と、を含み、
該支持板の端部の該表面側には、該剥離層を構成する金属膜又は樹脂膜の一部が被覆しており、
該起点領域形成工程の前に、該支持板の端部の該表面側を覆う該金属膜又は樹脂膜を切削ブレード又はレーザービームによって除去する除去工程を含むことを特徴とする剥離方法。 - 支持板の表面に剥離層を介して設けられた基板を、複数の小片へと分割した上で、該支持板から剥離する剥離方法であって、
該支持板を第1保持ユニットで保持する第1保持工程と、
該基板に設定された分割予定ラインに沿って該基板側から切削ブレードを切り込ませ、又は該基板に対して吸収性を有する波長のレーザービームを照射して、該基板を該複数の小片に分割する分割工程と、
該小片の端部で露出する該剥離層に流体を吹き付け、該小片を該支持板から剥離する際の起点となる起点領域を形成する起点領域形成工程と、
該小片を第2保持ユニットで保持する第2保持工程と、
該第1保持ユニットと該第2保持ユニットとを互いに離れる方向に相対的に移動させて該小片を該支持板から剥離する剥離工程と、を含むことを特徴とする剥離方法。
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018033502A JP6991673B2 (ja) | 2018-02-27 | 2018-02-27 | 剥離方法 |
| KR1020190007365A KR102670600B1 (ko) | 2018-02-27 | 2019-01-21 | 박리 방법 |
| SG10201901152VA SG10201901152VA (en) | 2018-02-27 | 2019-02-11 | Peeling method for peeling off substrate from support plate |
| CN201910125779.2A CN110197794B (zh) | 2018-02-27 | 2019-02-20 | 剥离方法 |
| US16/281,872 US10998196B2 (en) | 2018-02-27 | 2019-02-21 | Peeling method for peeling off substrate from support plate |
| TW108106101A TWI782189B (zh) | 2018-02-27 | 2019-02-22 | 剝離方法 |
| DE102019202564.1A DE102019202564B4 (de) | 2018-02-27 | 2019-02-26 | Ablöseverfahren zum Ablösen eines Substrats von einer Trägerplatte |
| US17/180,295 US11764066B2 (en) | 2018-02-27 | 2021-02-19 | Peeling method for peeling off substrate from support plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018033502A JP6991673B2 (ja) | 2018-02-27 | 2018-02-27 | 剥離方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2019149470A JP2019149470A (ja) | 2019-09-05 |
| JP6991673B2 true JP6991673B2 (ja) | 2022-01-12 |
Family
ID=67550228
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018033502A Active JP6991673B2 (ja) | 2018-02-27 | 2018-02-27 | 剥離方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US10998196B2 (ja) |
| JP (1) | JP6991673B2 (ja) |
| KR (1) | KR102670600B1 (ja) |
| CN (1) | CN110197794B (ja) |
| DE (1) | DE102019202564B4 (ja) |
| SG (1) | SG10201901152VA (ja) |
| TW (1) | TWI782189B (ja) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7025171B2 (ja) * | 2017-10-12 | 2022-02-24 | 株式会社ディスコ | 被加工物の研削方法 |
| JP7262903B2 (ja) * | 2019-08-26 | 2023-04-24 | 株式会社ディスコ | キャリア板の除去方法 |
| JP7511980B2 (ja) * | 2020-07-21 | 2024-07-08 | 株式会社ディスコ | キャリア板の除去方法 |
| CN114323827A (zh) * | 2020-09-30 | 2022-04-12 | 中国科学院微电子研究所 | 透射电镜样品的制备方法及装置 |
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2018
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-
2019
- 2019-01-21 KR KR1020190007365A patent/KR102670600B1/ko active Active
- 2019-02-11 SG SG10201901152VA patent/SG10201901152VA/en unknown
- 2019-02-20 CN CN201910125779.2A patent/CN110197794B/zh active Active
- 2019-02-21 US US16/281,872 patent/US10998196B2/en active Active
- 2019-02-22 TW TW108106101A patent/TWI782189B/zh active
- 2019-02-26 DE DE102019202564.1A patent/DE102019202564B4/de active Active
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2021
- 2021-02-19 US US17/180,295 patent/US11764066B2/en active Active
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| JP2015217421A (ja) | 2014-05-19 | 2015-12-07 | 株式会社ディスコ | リフトオフ方法 |
| JP2016021464A (ja) | 2014-07-14 | 2016-02-04 | 株式会社ディスコ | リフトオフ方法及び超音波ホーン |
| JP2016063057A (ja) | 2014-09-18 | 2016-04-25 | ファスフォードテクノロジ株式会社 | ダイボンダ並びにボンディング方法及びピックアップ装置 |
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| JP2017208453A (ja) | 2016-05-18 | 2017-11-24 | 東京応化工業株式会社 | 封止体の製造方法、及び、積層体 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE102019202564B4 (de) | 2024-03-07 |
| US11764066B2 (en) | 2023-09-19 |
| US20190267245A1 (en) | 2019-08-29 |
| JP2019149470A (ja) | 2019-09-05 |
| DE102019202564A1 (de) | 2019-08-29 |
| CN110197794A (zh) | 2019-09-03 |
| SG10201901152VA (en) | 2019-09-27 |
| US20210175085A1 (en) | 2021-06-10 |
| KR20190102990A (ko) | 2019-09-04 |
| CN110197794B (zh) | 2024-02-20 |
| TW201936476A (zh) | 2019-09-16 |
| US10998196B2 (en) | 2021-05-04 |
| KR102670600B1 (ko) | 2024-05-29 |
| TWI782189B (zh) | 2022-11-01 |
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