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JP7051480B2 - Relative position detection means - Google Patents
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JP7051480B2 - Relative position detection means - Google Patents

Relative position detection means Download PDF

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JP7051480B2
JP7051480B2 JP2018025747A JP2018025747A JP7051480B2 JP 7051480 B2 JP7051480 B2 JP 7051480B2 JP 2018025747 A JP2018025747 A JP 2018025747A JP 2018025747 A JP2018025747 A JP 2018025747A JP 7051480 B2 JP7051480 B2 JP 7051480B2
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relative position
light
light receiving
beam splitter
detecting means
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JP2019053023A (en
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隼 奥山
光騎 鈴木
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DMG Mori Co Ltd
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DMG Mori Co Ltd
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Description

本発明は、工作機械や半導体製造装置等の可動部分の変位を検出する変位検出装置に備わる相対位置検出手段に関する。 The present invention relates to a relative position detecting means provided in a displacement detecting device for detecting a displacement of a moving part such as a machine tool or a semiconductor manufacturing apparatus.

従来から、被測定物の変位を非接触で測定する装置として光を用いた変位検出装置が広く利用されている。変位検出装置は、可動部分となる被測定物の変位に基づいて、光源からの光の位相を変化させ、その光の位相の変化状態を検出することで被測定物の変位量を検出する。近年では、工作機械や半導体製造装置を中心として、1nm以下の変位の計測が行える高分解能化された変位検出装置が求められている。 Conventionally, a displacement detection device using light has been widely used as a device for measuring the displacement of an object to be measured in a non-contact manner. The displacement detection device changes the phase of the light from the light source based on the displacement of the object to be measured as a movable part, and detects the displacement amount of the object to be measured by detecting the changed state of the phase of the light. In recent years, there has been a demand for high-resolution displacement detection devices capable of measuring displacements of 1 nm or less, mainly for machine tools and semiconductor manufacturing equipment.

このように高分解能化された変位検出装置として、例えば、特許文献1及び2に記載されているものがある。特許文献1では、波長の異なる2種類の光波の光軸のずれに基づく測定誤差を防止することによって、高精度な測定を実現可能とするレーザ干渉計について開示されている。一方、特許文献2では、光源の発振特性に合わせ偏波保持ファイバを任意の長さで構成することによって、安定した精度の高い変位量の検出ができる変位検出装置について開示されている。 As the displacement detection device having such high resolution, for example, there are those described in Patent Documents 1 and 2. Patent Document 1 discloses a laser interferometer that enables highly accurate measurement by preventing a measurement error based on a deviation of the optical axis of two types of light waves having different wavelengths. On the other hand, Patent Document 2 discloses a displacement detection device capable of detecting a stable and highly accurate displacement amount by configuring a polarization-retaining fiber with an arbitrary length according to the oscillation characteristics of a light source.

特開2009-300263号公報Japanese Unexamined Patent Publication No. 2009-300263 特開2016-142552号公報Japanese Unexamined Patent Publication No. 2016-142552

しかしながら、特許文献1及び2に記載された変位検出装置では、装置に備わる部品の性能や形状によって、計測方向に移動する被測定物に設けられる被測定対象となるターゲットの相対位置情報を示すインクリメンタル信号の周期が決まってしまう。すなわち、特許文献1に記載されたレーザ干渉計では、使用する光源の波長によって信号周期が決まってしまい、特許文献2に記載された変位検出装置では、被測定面に設けられる回折格子の格子間隔によって信号周期が決まってしまう。このため、装置に備わる部品を取り替えることなく幅広い信号周期に対応することが困難なものとなっていた。安定した精度の高い変位量の検出をするためには、ターゲットの相対位置情報を検出する際に、幅広いインクリメンタル信号の周期に対応出来ることが望まれる。 However, in the displacement detection device described in Patent Documents 1 and 2, the incremental position information indicating the relative position information of the target to be measured provided on the object to be measured moving in the measurement direction is shown depending on the performance and shape of the parts provided in the device. The signal cycle is fixed. That is, in the laser interferometer described in Patent Document 1, the signal period is determined by the wavelength of the light source used, and in the displacement detection device described in Patent Document 2, the lattice spacing of the diffraction grating provided on the measured surface is determined. The signal cycle is determined by. For this reason, it has become difficult to handle a wide range of signal cycles without replacing the parts provided in the device. In order to detect a stable and highly accurate displacement amount, it is desired to be able to handle a wide range of incremental signal cycles when detecting the relative position information of the target.

本発明は、上記課題に鑑みてなされたものであり、簡素な構成で幅広い信号周期に対応することの可能な、新規かつ改良された相対位置検出手段を提供することを目的とする。 The present invention has been made in view of the above problems, and an object of the present invention is to provide a new and improved relative position detecting means capable of supporting a wide range of signal periods with a simple configuration.

本発明の一態様は、被測定物の計測方向の変位の相対位置を光学的に検出する相対位置検出手段であって、前記被測定物に載置され、光源から光が照射されるターゲットと、前記光に対する前記ターゲットでの反射光の偏光状態を変化させて受光する相対位置検出用受光部と、前記相対位置検出用受光部で受光した前記反射光の偏光状態の変化に基づいて前記ターゲットの前記計測方向の変位に基づく相対位置情報を出力する相対位置情報出力部と、を備え、前記ターゲットには、前記被測定物に載置される板状の反射物と、前記反射物の上に設けられ、前記計測方向に沿って先端から基端への厚さが変化する複屈折部材が設けられ、前記複屈折部材は、底面の基端側を中心として該底面の先端側が前記反射物に対して回動可能に構成されていることを特徴とする。 One aspect of the present invention is a relative position detecting means for optically detecting the relative position of the displacement of the object to be measured in the measurement direction, and the target is placed on the object to be measured and is irradiated with light from a light source. Based on the change in the polarization state of the reflected light received by the relative position detection light receiving unit and the light receiving unit for relative position detection, the target receives light by changing the polarization state of the reflected light of the target with respect to the light. The target is provided with a relative position information output unit that outputs relative position information based on the displacement in the measurement direction, and the target includes a plate-shaped reflector placed on the object to be measured and a reflective object on the reflector. A double-reflecting member whose thickness changes from the tip to the proximal end along the measurement direction is provided in the double-reflecting member. It is characterized in that it is configured to be rotatable with respect to the relative.

本発明の一態様によれば、複屈折部材の傾きと配置によってターゲットの相対位置情報を示すインクリメンタル信号の周期が定められるので、簡素な構成で幅広い信号周期に対応できる。 According to one aspect of the present invention, the period of the incremental signal indicating the relative position information of the target is determined by the inclination and arrangement of the birefringent member, so that a wide range of signal periods can be supported with a simple configuration.

このとき、本発明の一態様では、前記相対位置検出用受光部は、前記ターゲットの前記計測方向への移動に伴い前記反射光の偏光状態の変化を検出し、前記相対位置情報出力部は、前記反射光の偏光状態の変化を光電変換して得らえた信号に基づいて前記ターゲットの前記相対位置情報を出力することとしてもよい。 At this time, in one aspect of the present invention, the light receiving unit for relative position detection detects a change in the polarization state of the reflected light as the target moves in the measurement direction, and the relative position information output unit displays the relative position information output unit. The relative position information of the target may be output based on the signal obtained by photoelectric conversion of the change in the polarization state of the reflected light.

このようにすれば、簡素な構成で幅広い信号周期に対応可能とした上でターゲットの相対位置情報を確実に精度よく出力できるので、安定した高精度の変位検出が可能になる。 By doing so, it is possible to handle a wide range of signal cycles with a simple configuration, and it is possible to reliably and accurately output the relative position information of the target, so that stable and highly accurate displacement detection becomes possible.

また、本発明の一態様では、前記相対位置検出用受光部は、前記反射光を2つに分岐するビームスプリッタと、前記ビームスプリッタで分岐された一方の反射光のS成分を反射させてP成分を透過させる第1の偏光ビームスプリッタと、前記第1の偏光ビームスプリッタの透過光を受光する第1の受光素子と、前記第1の偏光ビームスプリッタの反射光を受光する第2の受光素子と、前記ビームスプリッタで分岐された他方の反射光のS成分を反射させてP成分を透過させる第2の偏光ビームスプリッタと、前記ビームスプリッタと前記第2の偏光ビームスプリッタとの間に介在される1/4波長板と、前記第2の偏光ビームスプリッタの反射光を受光する第3の受光素子と、前記第2の偏光ビームスプリッタの透過光を受光する第4の受光素子と、を備えることとしてもよい。 Further, in one aspect of the present invention, the light receiving unit for relative position detection reflects the beam splitter that splits the reflected light into two and the S component of one of the reflected lights branched by the beam splitter to P. A first polarized beam splitter that transmits components, a first light receiving element that receives the transmitted light of the first polarized beam splitter, and a second light receiving element that receives the reflected light of the first polarized beam splitter. And a second polarized beam splitter that reflects the S component of the other reflected light branched by the beam splitter to transmit the P component, and is interposed between the beam splitter and the second polarized beam splitter. A 1/4 wavelength plate, a third light receiving element that receives the reflected light of the second polarized beam splitter, and a fourth light receiving element that receives the transmitted light of the second polarized beam splitter. It may be that.

このようにすれば、簡素な構成でターゲットの計測方向への移動に伴い反射光の偏光状態の変化を確実に検出できる。 By doing so, it is possible to reliably detect a change in the polarization state of the reflected light as the target moves in the measurement direction with a simple configuration.

また、本発明の一態様では、前記複屈折部材は、前記計測方向に沿って複数の異なる部材が並列して構成されるか、又は前記光の入射方向に沿って複数の異なる部材が積層されて構成されることとしてもよい。 Further, in one aspect of the present invention, the birefringence member is composed of a plurality of different members arranged in parallel along the measurement direction, or a plurality of different members are laminated along the incident direction of the light. It may be configured as such.

このようにすれば、簡素な構成でターゲットの計測方向への移動に伴い反射光の偏光状態の変化を示す信号出力の感度や周期を容易に変えることができる。 By doing so, it is possible to easily change the sensitivity and period of the signal output indicating the change in the polarization state of the reflected light as the target moves in the measurement direction with a simple configuration.

また、本発明の一態様では、前記複屈折部材は、結晶軸の方向が異なる複数の部材が前記光の入射方向に沿って積層されて構成されることとしてもよい。 Further, in one aspect of the present invention, the birefringence member may be configured by laminating a plurality of members having different crystal axis directions along the incident direction of the light.

このようにすれば、複屈折部材を構成する各部材の結晶軸方向が直交している場合等に熱変動や光源の波長変動による影響を抑制することができる。 By doing so, it is possible to suppress the influence of thermal fluctuations and wavelength fluctuations of the light source when the crystal axial directions of the members constituting the birefringent member are orthogonal to each other.

また、本発明の一態様では、前記光源に対する前記複屈折部材の前段側又は後段側の何れかに補正プリズムが設けられていることとしてもよい。 Further, in one aspect of the present invention, the correction prism may be provided on either the front stage side or the rear stage side of the birefringence member with respect to the light source.

このようにすれば、複屈折部材を透過したビーム分布内の偏光状態が均一となるので、後段側の絶対位置検出手段による安定した高精度な変位検出が可能となる。 By doing so, the polarization state in the beam distribution transmitted through the birefringence member becomes uniform, so that stable and highly accurate displacement detection by the absolute position detecting means on the rear stage side becomes possible.

また、本発明の一態様では、前記相対位置検出用受光部が前記計測方向に沿って2つ設けられており、それぞれの相対位置検出用受光部で検出した前記反射光の偏光状態の位相変動量の差分に基づいて波長変動量を推定して補正することとしてもよい。 Further, in one aspect of the present invention, two light receiving units for relative position detection are provided along the measurement direction, and the phase variation of the polarization state of the reflected light detected by the light receiving units for relative position detection is provided. The wavelength fluctuation amount may be estimated and corrected based on the difference in the amount.

このようにすれば、各相対位置検出用受光部で検出した反射光の偏光状態の位相変動量の差分に基づいて波長変動量を容易に推定できるので、かかる推定に基づいて波長変動量を補正することによって、より高精度な変位検出が可能になる。 By doing so, the wavelength fluctuation amount can be easily estimated based on the difference in the phase fluctuation amount of the polarization state of the reflected light detected by each relative position detection light receiving unit, and the wavelength fluctuation amount is corrected based on such estimation. By doing so, more accurate displacement detection becomes possible.

また、本発明の一態様では、前記光源と前記複屈折部材との間に偏光板が更に設けられることとしてもよい。 Further, in one aspect of the present invention, a polarizing plate may be further provided between the light source and the birefringence member.

このようにすれば、変位検出に用いるビームをより高消光比とすることができるので、より高精度な変位検出が可能となる。 By doing so, the beam used for displacement detection can have a higher extinction ratio, so that more accurate displacement detection becomes possible.

また、本発明の一態様では、前記相対位置検出用受光部には、前記反射光に対してアジマス補正を行うアジマス補正部が更に設けられることとしてもよい。 Further, in one aspect of the present invention, the light receiving unit for relative position detection may be further provided with an azimuth correction unit that corrects azimuth with respect to the reflected light.

このようにすれば、偏光板を透過した反射光の角度差による差分が修正されるので、より高精度な変位検出が可能になる。 By doing so, the difference due to the angle difference of the reflected light transmitted through the polarizing plate is corrected, so that more accurate displacement detection becomes possible.

以上説明したように本発明によれば、複屈折部材の傾きと配置によってターゲットの相対位置情報を示すインクリメンタル信号の周期が定められるので、簡素な構成で幅広い信号周期に対応できる。また、簡素な構成で幅広い信号周期に対応可能とした上でターゲットの相対位置情報を確実に精度よく出力できるので、安定した高精度の変位検出が可能になる。 As described above, according to the present invention, the period of the incremental signal indicating the relative position information of the target is determined by the inclination and arrangement of the birefringent member, so that a wide range of signal periods can be supported with a simple configuration. In addition, since the relative position information of the target can be reliably and accurately output while being able to handle a wide range of signal cycles with a simple configuration, stable and highly accurate displacement detection becomes possible.

本発明の一実施形態に係る変位検出装置の構成の概略を示す正面図である。It is a front view which shows the outline of the structure of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の構成の概略を示す平面図である。It is a top view which shows the outline of the structure of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置に備わる相対位置検出手段の構成の概略を示す側面図である。It is a side view which shows the outline of the structure of the relative position detecting means provided in the displacement detecting apparatus which concerns on one Embodiment of this invention. 本発明の一実施形態に係る相対位置検出手段に備わる相対位置情報出力部の構成を示すブロック図である。It is a block diagram which shows the structure of the relative position information output part provided in the relative position detection means which concerns on one Embodiment of this invention. (A)は、本発明の一実施形態に係る相対位置検出手段の複屈折部材による測定原理を示す説明図であり、(B)は、当該複屈折部材の結晶軸に関する説明図である。(A) is an explanatory diagram showing the measurement principle of the relative position detecting means according to the embodiment of the present invention by the birefringent member, and (B) is an explanatory diagram relating to the crystal axis of the birefringent member. (A)は、本発明の一実施形態に係る変位検出装置に備わる絶対位置検出手段の構成の概略を示す側面図であり、(B)は、当該絶対位置検出手段に備わる可変反射膜の構成を示す平面図であり、(C)は、当該絶対位置検出手段に備わる絶対位置情報出力部の構成を示すブロック図である。(A) is a side view showing the outline of the configuration of the absolute position detecting means provided in the displacement detecting device according to the embodiment of the present invention, and (B) is the configuration of the variable reflective film provided in the absolute position detecting means. (C) is a block diagram showing a configuration of an absolute position information output unit provided in the absolute position detecting means. 本発明の一実施形態に係る変位検出装置による信号出力の概要を示すブロック図である。It is a block diagram which shows the outline of the signal output by the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る相対位置検出手段に備わるインクリメンタル信号発生器のリサージュ信号の角度を示す説明図である。It is explanatory drawing which shows the angle of the resage signal of the incremental signal generator provided in the relative position detection means which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の各構成要素の信号出力を示すグラフである。It is a graph which shows the signal output of each component of the displacement detection apparatus which concerns on one Embodiment of this invention. (A)は、本発明の一実施形態に係る相対位置検出手段の複屈折部材の変形例の一例を示す説明図であり、(B)は、当該複屈折部材の移動量と位置情報との関係を示すグラフである。(A) is an explanatory diagram showing an example of a modification of the birefringent member of the relative position detecting means according to the embodiment of the present invention, and (B) is an explanatory diagram of the movement amount and position information of the birefringent member. It is a graph which shows the relationship. (A)及び(B)は、本発明の一実施形態に係る相対位置検出手段の複屈折部材の他の変形例の一例を示す説明図である。(A) and (B) are explanatory views which show an example of another modification of the birefringent member of the relative position detecting means which concerns on one Embodiment of this invention. (A)乃至(C)は、本発明の一実施形態に係る相対位置検出手段の複屈折部材の更に他の変形例の一例を示す説明図である。(A) to (C) are explanatory views showing an example of still another modification of the birefringent member of the relative position detecting means according to the embodiment of the present invention. 本発明の一実施形態に係る相対位置検出手段の複屈折部材の更に他の変形例の一例を示す説明図である。It is explanatory drawing which shows an example of still another modification of the birefringent member of the relative position detection means which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の変形例の構成の概略を示す斜視図である。It is a perspective view which shows the outline of the structure of the modification of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の変形例の他の態様の構成及び動作の概略を示す説明図である。It is explanatory drawing which shows the outline of the structure and operation of another embodiment of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の変形例に備わる反射膜付きプリズムの更に他の変形例の構成の概略を示す側面図である。It is a side view which shows the outline of the structure of the prism with a reflective film provided in the modification of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の他の変形例の構成の概略を示す正面図である。It is a front view which shows the outline of the structure of the other modification of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の変形例の一変形例の構成の概略を示す斜視図である。It is a perspective view which shows the outline of the structure of one modification of the modification of the displacement detection device which concerns on one Embodiment of this invention. (A)及び(B)は、本発明の一実施形態に係る相対位置検出手段の他の変形例に設けられる補正プリズムの他の設置態様の一例を示す説明図である。(A) and (B) are explanatory views showing an example of another installation mode of the correction prism provided in another modification of the relative position detecting means according to the embodiment of the present invention. 本発明の一実施形態に係る変位検出装置の変形例の他の変形例の構成の概略を示す斜視図である。It is a perspective view which shows the outline of the structure of the other modification of the modification of the displacement detection device which concerns on one Embodiment of this invention. 本発明の一実施形態に係る変位検出装置の更に他の変形例の構成の概略を示す斜視図である。It is a perspective view which shows the outline of the structure of the other modification of the displacement detection apparatus which concerns on one Embodiment of this invention.

以下、本発明の好適な実施の形態について詳細に説明する。なお、以下に説明する本実施形態は、特許請求の範囲に記載された本発明の内容を不当に限定するものではなく、本実施形態で説明される構成の全てが本発明の解決手段として必須であるとは限らない。また、以下の説明において記載される各種レンズは、所定の結像性能を持っていれば、その形態は、どのようなものでもよく、球面や非球面の単レンズ、レンズ群、あるいは結像機能を持った回折格子でもよい。 Hereinafter, preferred embodiments of the present invention will be described in detail. It should be noted that the present embodiment described below does not unreasonably limit the content of the present invention described in the claims, and all the configurations described in the present embodiment are indispensable as the means for solving the present invention. It is not always the case. Further, the various lenses described in the following description may have any form as long as they have predetermined imaging performance, and may be a spherical or aspherical single lens, a lens group, or an imaging function. A diffraction grating having a lens may be used.

まず、本発明の一実施形態に係る変位検出装置の構成について、図面を使用しながら説明する。図1は、本発明の一実施形態に係る変位検出装置の構成の概略を示す正面図であり、図2は、本発明の一実施形態に係る変位検出装置の構成の概略を示す平面図である。 First, the configuration of the displacement detection device according to the embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a front view showing an outline of the configuration of a displacement detection device according to an embodiment of the present invention, and FIG. 2 is a plan view showing an outline of the configuration of a displacement detection device according to an embodiment of the present invention. be.

本発明の一実施形態に係る変位検出装置100は、被測定物10の計測方向(X方向)の変位の絶対位置及び相対位置を光学的に検出する装置である。ここで言及する絶対位置とは、被測定物10の基準点から計測方向(X方向)の変位を受光した光量の変化を電圧等の絶対値に変換した位置情報を示し、相対位置とは、偏光の変化を受光し電圧等の周期的な信号を位相変換した位置情報を示す。 The displacement detection device 100 according to an embodiment of the present invention is a device that optically detects the absolute position and the relative position of the displacement of the object to be measured 10 in the measurement direction (X direction). The absolute position referred to here indicates the position information obtained by converting the change in the amount of light received by the displacement in the measurement direction (X direction) from the reference point of the object 10 into an absolute value such as voltage, and the relative position is defined as the relative position. It shows the position information in which the change in polarization is received and the periodic signal such as voltage is phase-converted.

本実施形態の変位検出装置100は、図1及び図2に示すように、光源102と、光源側ビームスプリッタ108と、相対位置検出手段110と、絶対位置検出手段140と、を備える。そして、本実施形態の変位検出装置100は、絶対位置検出手段140と相対位置検出手段110が被測定物10の計測方向(X方向)に対してインライン上に設けられることを特徴とする。 As shown in FIGS. 1 and 2, the displacement detecting device 100 of the present embodiment includes a light source 102, a light source side beam splitter 108, a relative position detecting means 110, and an absolute position detecting means 140. The displacement detecting device 100 of the present embodiment is characterized in that the absolute position detecting means 140 and the relative position detecting means 110 are provided in-line with respect to the measuring direction (X direction) of the object to be measured 10.

光源102は、可干渉距離の制限された可干渉光を出射してもよい。本実施形態では、光源102として、マルチモードの半導体レーザ、スーパールミネッセントダイオード等の可干渉光源であるが、可干渉距離の比較的短い光源が使用される。ただし、光源102は、これら特定の種類の光源に限定されるわけではない。 The light source 102 may emit coherent light having a limited coherent distance. In the present embodiment, the light source 102 is a coherent light source such as a multimode semiconductor laser or a super luminescent diode, but a light source having a relatively short coherence distance is used. However, the light source 102 is not limited to these specific types of light sources.

また、本実施形態では、光源102から出た光として偏光を使うので、光源102の出力段側には、コリメートレンズからなる第1のレンズ104と偏光子106が設けられている。このように、光源102から出た光は、第1のレンズ104を介してコリメート光にされてから偏光子106を使ってある一定の直線偏光に変換される。 Further, in the present embodiment, since polarized light is used as the light emitted from the light source 102, a first lens 104 made of a collimating lens and a polarizing element 106 are provided on the output stage side of the light source 102. In this way, the light emitted from the light source 102 is converted into collimated light through the first lens 104 and then converted into a certain linear polarization using the polarizing element 106.

なお、光源102の位置としては、図1に示された光源102の位置に置いてもよいし、光源102の発熱の影響を避けるため、光源102を離れた場所に設置し、光ファイバを用いて光を伝搬させて、光ファイバの出射端を図1に示された光源102の位置に置くようにしてもよい。このときも、光ファイバを出射した発散する光ビームは、コリメートレンズによってコリメートビームに変換される。また、光源からのビームが直線偏光の場合は、光ファイバには、偏波保持ファイバ等の偏波面を保持できるものを用いる。 The position of the light source 102 may be the position of the light source 102 shown in FIG. 1, or in order to avoid the influence of the heat generated by the light source 102, the light source 102 is installed at a distant place and an optical fiber is used. The light may be propagated so that the emission end of the optical fiber is placed at the position of the light source 102 shown in FIG. Also at this time, the diverging light beam emitted from the optical fiber is converted into a collimated beam by the collimating lens. When the beam from the light source is linearly polarized, an optical fiber such as a polarization-retaining fiber that can retain the plane of polarization is used.

光源側ビームスプリッタ108は、光源102からの可干渉光を2つに分岐する偏光依存のない無偏向型のビームスプリッタである。本実施形態では、光源側ビームスプリッタ108は、図1及び図2に示すように、光源102からの光b1を絶対位置検出手段140に行く方向と、そのまま相対位置検出手段110に備わるターゲット112に入射する方向に分けられる。 The light source side beam splitter 108 is a polarization-independent beam splitter that splits the coherent light from the light source 102 into two. In the present embodiment, as shown in FIGS. 1 and 2, the light source side beam splitter 108 is directed toward the direction in which the light b1 from the light source 102 goes to the absolute position detecting means 140 and the target 112 provided in the relative position detecting means 110 as it is. It is divided in the direction of incidence.

相対位置検出手段110は、光源側ビームスプリッタ108で分岐された一方の光b1に対する反射光b2の偏光状態の変化に基づいて被測定物10の計測方向の変位の相対位置を検出する機能を有する。本実施形態では、相対位置検出手段110は、ターゲット112と、相対位置検出用受光部120と、及び相対位置情報出力部130(図4参照)と、を備える。 The relative position detecting means 110 has a function of detecting the relative position of the displacement of the object 10 to be measured in the measurement direction based on the change in the polarization state of the reflected light b2 with respect to one of the light b1 branched by the light source side beam splitter 108. .. In the present embodiment, the relative position detecting means 110 includes a target 112, a light receiving unit 120 for relative position detection, and a relative position information output unit 130 (see FIG. 4).

ターゲット112は、被測定物10に載置され、光源102からの光b1が照射される。ターゲット112には、被測定物10に載置される板状の反射物114と、当該反射物114の上に設けられ、計測方向に沿って先端116aから基端116a´への厚さが増加ように変化する複屈折部材116が設けられる。そして、複屈折部材116は、底面116bの基端側を中心として当該底面116bの先端側が反射物114に対して回動可能に構成されている。すなわち、複屈折部材116は、先端116aが角度θである複屈折部材116の底面116bと反射物114との角度θを調整可能にしてもよい。 The target 112 is placed on the object to be measured 10 and is irradiated with the light b1 from the light source 102. The target 112 is provided on the plate-shaped reflector 114 placed on the object to be measured 10 and the reflector 114, and the thickness from the tip 116a to the proximal end 116a'increases along the measurement direction. The birefringence member 116 that changes in this way is provided. The birefringent member 116 is configured such that the tip end side of the bottom surface 116b is rotatable with respect to the reflecting object 114 with the base end side of the bottom surface 116b as the center. That is, the birefringence member 116 may be able to adjust the angle θ 2 between the bottom surface 116b of the birefringence member 116 whose tip 116a has an angle θ 1 and the reflector 114.

相対位置検出用受光部120は、可干渉光b1に対するターゲット112での反射光b2の偏光状態を変化させて受光する。本実施形態では、相対位置検出用受光部120は、ビームスプリッタ121、第1の偏光ビームスプリッタ122、第1の受光素子123、第2の受光素子124、1/4波長板125(図3参照)、第2の偏光ビームスプリッタ126、第3の受光素子127、及び第4の受光素子128を備える。相対位置検出用受光部120で受光した反射光b2の偏光状態の変化を表す信号は、相対位置情報出力部130(図4参照)に送られて、相対位置情報出力部130は、当該信号に基づいてターゲット112の計測方向の変位に基づく相対位置情報を出力する。なお、相対位置検出手段110に備わるターゲット112、相対位置検出用受光部120、及び相対位置情報出力部130の詳細については、後述する。 The light receiving unit 120 for relative position detection changes the polarization state of the reflected light b2 at the target 112 with respect to the coherent light b1 and receives light. In the present embodiment, the relative position detection light receiving unit 120 includes a beam splitter 121, a first polarizing beam splitter 122, a first light receiving element 123, a second light receiving element 124, and a 1/4 wave plate 125 (see FIG. 3). ), A second polarizing beam splitter 126, a third light receiving element 127, and a fourth light receiving element 128. A signal indicating a change in the polarization state of the reflected light b2 received by the light receiving unit 120 for relative position detection is sent to the relative position information output unit 130 (see FIG. 4), and the relative position information output unit 130 sends the signal to the signal. Based on this, relative position information based on the displacement of the target 112 in the measurement direction is output. The details of the target 112, the light receiving unit 120 for relative position detection, and the relative position information output unit 130 provided in the relative position detecting means 110 will be described later.

絶対位置検出手段140は、光源側ビームスプリッタ108で分岐された他方の光b3、b4に対する反射光b5、b6の光量の変化に基づいて被測定物10の計測方向の変位の絶対位置を検出する機能を有する。本実施形態では、絶対位置検出手段140は、頂面側に可変反射膜146が設けられたプリズム144と、光源側ビームスプリッタ108で分岐された他方の光b3をプリズム144に導入するミラー142と、絶対位置検出用受光部150と、及び絶対位置情報出力部160(図6(C)参照)と、を備える。 The absolute position detecting means 140 detects the absolute position of the displacement of the object 10 to be measured in the measurement direction based on the change in the amount of reflected light b5 and b6 with respect to the other light b3 and b4 branched by the light source side beam splitter 108. Has a function. In the present embodiment, the absolute position detecting means 140 includes a prism 144 provided with a variable reflection film 146 on the top surface side and a mirror 142 that introduces the other light b3 branched by the light source side beam splitter 108 into the prism 144. , A light receiving unit 150 for absolute position detection, and an absolute position information output unit 160 (see FIG. 6C).

絶対位置検出用受光部150は、ミラー142での反射光b4に対するプリズム144及び被測定物10の反射光b5、b6の光量を変化させて受光する。本実施形態では、絶対位置検出用受光部150は、第5の受光素子152、及び第6の受光素子154を備える。絶対位置検出用受光部150で受光した反射光b5、b6の光量の変化を表す信号は、絶対位置情報出力部160(図6(C)参照)に送られて、絶対位置情報出力部160は、当該信号に基づいてプリズム144の計測方向の変位に基づく絶対位置情報を出力する。なお、絶対位置検出手段140に備わるプリズム144、絶対位置検出用受光部150、及び絶対位置情報出力部160の詳細については、後述する。 The light receiving unit 150 for absolute position detection receives light by changing the amount of light of the prism 144 and the reflected light b5 and b6 of the object 10 to be measured with respect to the light b4 reflected by the mirror 142. In the present embodiment, the light receiving unit 150 for absolute position detection includes a fifth light receiving element 152 and a sixth light receiving element 154. A signal indicating a change in the amount of reflected light b5 and b6 received by the light receiving unit 150 for absolute position detection is sent to the absolute position information output unit 160 (see FIG. 6C), and the absolute position information output unit 160 , Absolute position information based on the displacement of the prism 144 in the measurement direction is output based on the signal. The details of the prism 144, the light receiving unit 150 for absolute position detection, and the absolute position information output unit 160 provided in the absolute position detecting means 140 will be described later.

次に、本発明の一実施形態に係る変位検出装置に備わる相対位置検出手段の構成について、図面を使用しながら説明する。図3は、本発明の一実施形態に係る変位検出装置に備わる相対位置検出手段の構成の概略を示す側面図であり、図4は、本発明の一実施形態に係る相対位置検出手段に備わる相対位置情報出力部の構成を示すブロック図である。 Next, the configuration of the relative position detecting means provided in the displacement detecting device according to the embodiment of the present invention will be described with reference to the drawings. FIG. 3 is a side view showing an outline of the configuration of the relative position detecting means provided in the displacement detecting device according to the embodiment of the present invention, and FIG. 4 is a side view showing the outline of the relative position detecting means provided in the displacement detecting means according to the embodiment of the present invention. It is a block diagram which shows the structure of the relative position information output part.

相対位置検出手段110は、前述したように、光源側ビームスプリッタ108で分岐された一方の光b1に対する反射光b2の偏光状態の変化に基づいて被測定物10の計測方向の変位の相対位置を検出する機能を有する。本実施形態では、相対位置検出手段110は、ターゲット112と、相対位置検出用受光部120と、及び相対位置情報出力部130と、を備える。 As described above, the relative position detecting means 110 determines the relative position of the displacement of the object 10 to be measured in the measurement direction based on the change in the polarization state of the reflected light b2 with respect to one of the light b1 branched by the light source side beam splitter 108. It has a function to detect. In the present embodiment, the relative position detecting means 110 includes a target 112, a light receiving unit 120 for relative position detection, and a relative position information output unit 130.

本実施形態では、相対位置検出手段110は、相対位置検出用受光部120がターゲット112の計測方向への移動に伴い反射光の偏光状態の変化を検出し、相対位置情報出力部130が反射光の偏光状態の変化を光電変換して得らえた信号に基づいてターゲット112の相対位置情報を出力することを特徴とする。 In the present embodiment, the relative position detecting means 110 detects a change in the polarization state of the reflected light as the light receiving unit 120 for relative position detection moves in the measurement direction of the target 112, and the relative position information output unit 130 detects the reflected light. It is characterized in that the relative position information of the target 112 is output based on the signal obtained by photoelectric conversion of the change in the polarization state of the target 112.

ターゲット112は、被測定物10に載置され、被測定物10の変位の検出対象として機能する。ターゲット112には、光源102からの可干渉光b1が第1のレンズ104と偏光子106を介して一定の直線偏光に変換されてから光源側ビームスプリッタ108を経由して照射される。 The target 112 is placed on the object to be measured 10 and functions as a displacement detection target of the object to be measured 10. The target 112 is irradiated with the coherent light b1 from the light source 102 via the light source side beam splitter 108 after being converted into constant linear polarization via the first lens 104 and the splitter 106.

本実施形態では、ターゲット112は、被測定物10に載置される板状の反射物114と、当該反射物114の上に設けられ、計測方向に沿って先端116aから基端116a´への厚さが増加する略三角柱形状の複屈折部材116を備える。そして、複屈折部材116は、底面116bの基端側を中心として当該底面116bの先端側が反射物114に対して回動可能に構成されている。すなわち、複屈折部材116は、先端116aが角度θである複屈折部材116の底面116bと反射物114との角度θを調整可能にしてもよい。 In the present embodiment, the target 112 is provided on the plate-shaped reflector 114 placed on the object to be measured 10 and the reflector 114, and is provided from the tip 116a to the proximal end 116a'along the measurement direction. A birefringent member 116 having a substantially triangular prism shape with an increasing thickness is provided. The birefringent member 116 is configured such that the tip end side of the bottom surface 116b is rotatable with respect to the reflecting object 114 with the base end side of the bottom surface 116b as the center. That is, the birefringence member 116 may be able to adjust the angle θ 2 between the bottom surface 116b of the birefringence member 116 whose tip 116a has an angle θ 1 and the reflector 114.

相対位置検出用受光部120は、光b1に対するターゲット112での反射光b2の偏光状態を変化させて受光する機能を有する。本実施形態では、相対位置検出用受光部120は、ビームスプリッタ121、第1の偏光ビームスプリッタ122、第1の受光素子123、第2の受光素子124、1/4波長板125、第2の偏光ビームスプリッタ126、第3の受光素子127、及び第4の受光素子128を備える。 The light receiving unit 120 for relative position detection has a function of changing the polarization state of the reflected light b2 at the target 112 with respect to the light b1 and receiving light. In the present embodiment, the relative position detection light receiving unit 120 includes a beam splitter 121, a first polarizing beam splitter 122, a first light receiving element 123, a second light receiving element 124, a 1/4 wave plate 125, and a second. It includes a polarizing beam splitter 126, a third light receiving element 127, and a fourth light receiving element 128.

ビームスプリッタ121は、反射物114での反射光b2を2つに分岐する偏光依存のない無偏光型ビームスプリッタである。第1の偏光ビームスプリッタ122は、ビームスプリッタ121で分岐された一方の反射光b7のS成分を反射させてP成分を透過させる偏光型ビームスプリッタである。第1の受光素子123は、第1の偏光ビームスプリッタ122の透過光を受光して光電変換をするフォトダイオード等からなる受光素子である。第2の受光素子124は、第1の偏光ビームスプリッタ122の反射光b10を受光して光電変換をするフォトダイオード等からなる受光素子である。第2の偏光ビームスプリッタ126は、ビームスプリッタ121で分岐された他方の反射光b8のS成分を反射させてP成分を透過させる偏光型ビームスプリッタである。1/4波長板125は、ビームスプリッタ121と第2の偏光ビームスプリッタ126との間に介在され、反射光b8の位相を1/4波長分ずらす機能を有する。第3の受光素子127は、第2の偏光ビームスプリッタ126の反射光b11を受光して光電変換をするフォトダイオード等からなる受光素子である。第4の受光素子128は、第2の偏光ビームスプリッタ126の透過光b12を受光して光電変換をするフォトダイオード等からなる受光素子である。 The beam splitter 121 is a polarization-independent unpolarizing beam splitter that splits the light b2 reflected by the reflector 114 into two. The first polarizing beam splitter 122 is a polarizing beam splitter that reflects the S component of one of the reflected light b7 branched by the beam splitter 121 and transmits the P component. The first light receiving element 123 is a light receiving element including a photodiode or the like that receives the transmitted light of the first polarizing beam splitter 122 and performs photoelectric conversion. The second light receiving element 124 is a light receiving element including a photodiode or the like that receives the reflected light b10 of the first polarizing beam splitter 122 and performs photoelectric conversion. The second polarization beam splitter 126 is a polarization beam splitter that reflects the S component of the other reflected light b8 branched by the beam splitter 121 and transmits the P component. The 1/4 wave plate 125 is interposed between the beam splitter 121 and the second polarizing beam splitter 126, and has a function of shifting the phase of the reflected light b8 by 1/4 wavelength. The third light receiving element 127 is a light receiving element including a photodiode or the like that receives the reflected light b11 of the second polarizing beam splitter 126 and performs photoelectric conversion. The fourth light receiving element 128 is a light receiving element including a photodiode or the like that receives the transmitted light b12 of the second polarizing beam splitter 126 and performs photoelectric conversion.

相対位置検出用受光部120で受光した反射光b2の偏光状態の変化を表す信号は、相対位置情報出力部130に送られ、当該相対位置情報出力部130は、当該信号に基づいてターゲット112の計測方向の変位に基づく相対位置情報を出力する。相対位置情報出力部130は、図4に示すように、第1の差動増幅器131と、第2の差動増幅器132と、第1のA/D変換器133と、第2のA/D変換器134と、波形補正処理部135と、インクリメンタル信号発生器136とを備える。 A signal indicating a change in the polarization state of the reflected light b2 received by the light receiving unit 120 for relative position detection is sent to the relative position information output unit 130, and the relative position information output unit 130 is based on the signal of the target 112. Outputs relative position information based on displacement in the measurement direction. As shown in FIG. 4, the relative position information output unit 130 includes a first differential amplifier 131, a second differential amplifier 132, a first A / D converter 133, and a second A / D. It includes a converter 134, a waveform correction processing unit 135, and an incremental signal generator 136.

第1の差動増幅器131は、相対位置検出用受光部120の第1の受光素子123及び第2の受光素子124が入力端に接続され、出力端に第1のA/D変換器133が接続されている。また、第2の差動増幅器132は、相対位置検出用受光部120の第3の受光素子127及び第4の受光素子128が入力端に接続され、出力端に第2のA/D変換器134が接続されている。そして、第1のA/D変換器133及び第2のA/D変換器134は、波形補正処理部135に接続されている。波形補正処理部135は、インクリメンタル信号発生器136に接続されている。 In the first differential amplifier 131, the first light receiving element 123 and the second light receiving element 124 of the light receiving unit 120 for relative position detection are connected to the input end, and the first A / D converter 133 is connected to the output end. It is connected. Further, in the second differential amplifier 132, the third light receiving element 127 and the fourth light receiving element 128 of the light receiving unit 120 for relative position detection are connected to the input end, and the second A / D converter is connected to the output end. 134 is connected. The first A / D converter 133 and the second A / D converter 134 are connected to the waveform correction processing unit 135. The waveform correction processing unit 135 is connected to the incremental signal generator 136.

相対位置情報出力部130は、相対位置検出用受光部120で受光した光の強度に基づいてターゲット112の変位情報を出力する機能を有する。具体的には、相対位置情報出力部130では、まず、フォトダイオードからなる第1の受光素子123、第2の受光素子124からの信号を第1の差動増幅器131によって、第3の受光素子127、第4の受光素子128からの信号を第2の差動増幅器132によって、それぞれ所定の増幅率α、βで差動増幅する。増倍率α、βは、増幅後の2つの信号の振幅が等しくなるように、かつ、後段のA/D変換器133、134の入力可能レンジに合わせて設定する。 The relative position information output unit 130 has a function of outputting displacement information of the target 112 based on the intensity of the light received by the light receiving unit 120 for relative position detection. Specifically, in the relative position information output unit 130, first, the signal from the first light receiving element 123 made of a photodiode and the second light receiving element 124 is transmitted by the first differential amplifier 131 to the third light receiving element. The signals from 127 and the fourth light receiving element 128 are differentially amplified by the second differential amplifier 132 at predetermined amplification factors α and β, respectively. The Magnifications α and β are set so that the amplitudes of the two signals after amplification are equal to each other and according to the inputtable range of the A / D converters 133 and 134 in the subsequent stage.

差動増幅器131、132で差動増幅されて得られた2つの信号は、A/D変換器133、134でアナログのsin、cos信号からデジタル信号へと数値化され、波形補正処理部135で演算処理が行われる。波形補正処理部135、インクリメンタル信号発生器136では、DSPが組み込まれたプログラマブルロジックデバイス等で演算を行い、アナログ信号の乱れに起因するsinθ信号、cosθ信号の振幅変動、オフセット変動、及び位相変動の補正を行う。補正された信号からθ=Atanθを求めることにより、より正確なスケールの位置情報を生成し、必要な形式のインクリメンタル信号を発生させることができる。 The two signals obtained by differential amplification by the differential amplifiers 131 and 132 are digitized from analog sin and cos signals to digital signals by the A / D converters 133 and 134, and are digitized by the waveform correction processing unit 135. Arithmetic processing is performed. In the waveform correction processing unit 135 and the incremental signal generator 136, calculations are performed by a programmable logic device or the like incorporating a DSP, and the amplitude fluctuation, offset fluctuation, and phase fluctuation of the sinθ signal and cosθ signal caused by the disturbance of the analog signal are generated. Make corrections. By obtaining θ = Atan θ from the corrected signal, more accurate scale position information can be generated and an incremental signal of a required format can be generated.

本実施形態では、計測方向に沿って厚みが変化した複屈折部材116を備えたターゲット112に偏光されたビームを照射し、ターゲット112が計測方向に移動することによって、ターゲット112から反射するビームの偏光状態を変化させられる。そして、相対位置情報出力部130は、その偏光状態の変化を4つの受光素子123、124、127、128によって検出して、その4つの受光素子123、124、127、128から光電変換された信号に基づいてインクリメンタル信号の位相を求めて、測定方向に移動するターゲット112の相対位置情報をインクリメンタル信号発生器136より出力する。 In the present embodiment, the beam reflected from the target 112 is reflected by irradiating the target 112 having the birefringent member 116 whose thickness has changed along the measurement direction with a polarized beam and moving the target 112 in the measurement direction. The polarization state can be changed. Then, the relative position information output unit 130 detects the change in the polarization state by the four light receiving elements 123, 124, 127, 128, and the signal photoelectrically converted from the four light receiving elements 123, 124, 127, 128. The phase of the incremental signal is obtained based on the above, and the relative position information of the target 112 moving in the measurement direction is output from the incremental signal generator 136.

その際に、複屈折部材116の先端116aの角度θと複屈折部材116の底面116bと反射物114との角度θを調整することによって、自由にインクリメンタル信号の信号周期を所定の大きさに決めることができる。このため、簡素な構成で幅広い信号周期に対応可能とした上でターゲット112の相対位置情報を確実に精度よく出力できるので、安定した高精度の被測定物10の変位検出が可能になる。 At that time, by adjusting the angle θ 1 of the tip 116a of the birefringence member 116 and the angle θ 2 between the bottom surface 116b of the birefringence member 116 and the reflector 114, the signal cycle of the incremental signal can be freely set to a predetermined magnitude. Can be decided. Therefore, since the relative position information of the target 112 can be reliably and accurately output while being able to handle a wide range of signal cycles with a simple configuration, stable and highly accurate displacement detection of the object to be measured 10 becomes possible.

次に、本発明の一実施形態に係る相対位置検出手段の動作にについて、図面を使用しながら説明する。図5(A)は、本発明の一実施形態に係る相対位置検出手段の複屈折部材による測定原理を示す説明図であり、図5(B)は、当該複屈折部材の結晶軸に関する説明図である。 Next, the operation of the relative position detecting means according to the embodiment of the present invention will be described with reference to the drawings. FIG. 5A is an explanatory diagram showing the measurement principle of the relative position detecting means according to the embodiment of the present invention by the birefringent member, and FIG. 5B is an explanatory diagram relating to the crystal axis of the birefringent member. Is.

本発明の一実施形態に係る相対位置検出手段120では、光線の偏光状態を観測することで、ターゲット112の移動量Lを検出する。具体的には、図5(A)に示すように、透過する箇所によって厚みの異なる複屈折部材116に光を透過させ、P偏光とS偏光に位相差を付ける。その位相差を不図示の偏光子によって光量変動に変換し、移動量Lを検出する。 The relative position detecting means 120 according to the embodiment of the present invention detects the movement amount L of the target 112 by observing the polarization state of the light beam. Specifically, as shown in FIG. 5A, light is transmitted through the birefringent member 116 having a different thickness depending on the transmission portion, and a phase difference is added between the P-polarization and the S-polarization. The phase difference is converted into a variation in the amount of light by a polarizing element (not shown), and the amount of movement L is detected.

このとき、P偏光とS偏光の光路差をd、P偏光とS偏光の屈折率差をΔn、光源の波長をλで表すと、位相差Δφは、下記の式(1)で表せる。
Δφ=2π×d×Δn/λ・・・・・(1)
At this time, if the optical path difference between P-polarization and S-polarization is represented by d, the refractive index difference between P-polarization and S-polarization is represented by Δn, and the wavelength of the light source is represented by λ, the phase difference Δφ can be represented by the following equation (1).
Δφ = 2π × d × Δn / λ ... (1)

図5(A)に示すように、複屈折部材116の先端116aの角度θ、複屈折部材116の底面116bと反射物114との角度θと、移動量Lだけ動いた場合のP偏光とS偏光の光路差dは、下記の式(2)で表せる。
d=L(tanθ-tan(θ-θ))・・・・・(2)
As shown in FIG. 5A, the angle θ 1 of the tip 116a of the birefringence member 116, the angle θ 2 between the bottom surface 116b of the birefringence member 116 and the reflector 114, and the P polarization when the movement amount L is applied. The optical path difference d between S and S polarization can be expressed by the following equation (2).
d = L (tan θ 1 -tan (θ 12 )) ... (2)

移動量Lを移動するとΔφ=2πとなるので、前述した式(1)を整理すると、下記の式(3)の関係式が成立する。
d =λ/Δn・・・・・(3)
Since Δφ = 2π when the movement amount L is moved, the relational expression of the following equation (3) is established by rearranging the above-mentioned equation (1).
d = λ / Δn ... (3)

前述した式(1)、式(2)、及び式(3)から下記の式(4)の関係式が成立する。
L=λ/(Δn×(tanθ-tan(θ-θ)))・・・・・(4)
From the above-mentioned equations (1), (2), and equations (3), the relational expression of the following equation (4) is established.
L = λ / (Δn × (tan θ 1 -tan (θ 12 ))) ... (4)

前述した式(4)より、ターゲット112の移動量Lを複屈折部材116の先端116aの角度θと、複屈折部材116の底面116bと反射物114との角度θで任意の大きさに変更できることが分かる。また、dead pathが0であることから、ターゲット112の移動による位相差のみが検出可能となる。 From the above equation (4), the movement amount L of the target 112 can be set to an arbitrary size at an angle θ 1 of the tip 116a of the birefringence member 116 and an angle θ 2 between the bottom surface 116b of the birefringence member 116 and the reflector 114. You can see that it can be changed. Further, since the dead path is 0, only the phase difference due to the movement of the target 112 can be detected.

例えば、複屈折部材116の材質を水晶として、光源の波長λを790nm、移動量Lを100μmの場合に、θを20度としたとき、θが35.895・・・≒35.9度となる。すなわち、ターゲット112の移動量Lに応じて複屈折部材116の角度θ、θを調整できるので、ターゲット112の移動量Lのピッチを所望の大きさに自由に変えられるようになる。このため、ターゲット112の相対位置情報を示すインクリメンタル信号の周期を自由に定められる。 For example, when the material of the birefringence member 116 is quartz, the wavelength λ of the light source is 790 nm, the movement amount L is 100 μm, and θ 1 is 20 degrees, θ 2 is 35.895 ... ≈ 35.9. It becomes a degree. That is, since the angles θ 1 and θ 2 of the birefringent member 116 can be adjusted according to the movement amount L of the target 112, the pitch of the movement amount L of the target 112 can be freely changed to a desired size. Therefore, the period of the incremental signal indicating the relative position information of the target 112 can be freely determined.

また、複屈折部材116は、結晶軸(光学軸)によって屈折率が異なる材質である。このため、図5(B)に示すように、結晶軸A1に対して入射光の偏光方向が傾くと、屈折率は、その傾き角度θによって変化する。具体的には、P偏光の屈折率n、S偏光の屈折率n、複屈折部材のX方向の屈折率n、複屈折部材のY方向の屈折率nは、それぞれ下記の式(5)及び式(6)の関係式が成立する。
=n・・・・・(5)
Further, the birefringent member 116 is made of a material having a different refractive index depending on the crystal axis (optical axis). Therefore, as shown in FIG. 5B, when the polarization direction of the incident light is tilted with respect to the crystal axis A1, the refractive index changes depending on the tilt angle θ 3 . Specifically, the refractive index n p of P polarization, the refractive index n s of S polarization, the refractive index n x in the X direction of the double refraction member, and the refractive index ny in the Y direction of the double refraction member are expressed by the following equations, respectively. The relational expressions of (5) and (6) are established.
n s = n y ... (5)

Figure 0007051480000001
Figure 0007051480000001

θ=0°であれば、入射光のP偏光は、結晶のX軸と揃うため、n=nとなり、同様にS偏光もn=nとなる。つまり、屈折率差Δnは、結晶軸A1への入射光によって変化させることができるため、下記の式(7)の関係式が成立する。 If θ 3 = 0 °, the P polarization of the incident light is aligned with the X-axis of the crystal, so that n p = n x , and similarly, the S polarization is n s = n y . That is, since the refractive index difference Δn can be changed by the incident light on the crystal axis A1, the relational expression of the following equation (7) is established.

Figure 0007051480000002
Figure 0007051480000002

上記の式(7)で示される屈折率差Δnを前述したターゲット112の移動量Lと角度θ、θとの関係を示す式(4)に代入すると、下記の式(8)の関係式が成立する。 Substituting the refractive index difference Δn represented by the above equation (7) into the equation (4) showing the relationship between the movement amount L of the target 112 and the angles θ 1 and θ 2 described above, the relationship of the following equation (8) The formula holds.

Figure 0007051480000003
Figure 0007051480000003

上記の式(8)に示すように、複屈折部材116の先端116aの角度θ、複屈折部材116の底面116bと反射物114との角度θ、及び結晶軸A1に対する入射光の傾き角度θによって、ターゲット112の移動量Lを変化できる。すなわち、ターゲット112の移動量Lに応じて複屈折部材116の角度θ、θ及び結晶軸A1に対する入射光の傾き角度θを調整できるので、ターゲット112の移動量Lのピッチを所望の大きさに自由に変えられるようになる。 As shown in the above equation (8), the angle θ 1 of the tip 116a of the birefringence member 116, the angle θ 2 between the bottom surface 116b of the birefringence member 116 and the reflector 114, and the inclination angle of the incident light with respect to the crystal axis A1. The movement amount L of the target 112 can be changed by θ 3 . That is, since the angles θ 1 and θ 2 of the birefringence member 116 and the inclination angle θ 3 of the incident light with respect to the crystal axis A1 can be adjusted according to the movement amount L of the target 112, the pitch of the movement amount L of the target 112 is desired. You will be able to freely change the size.

次に、本発明の一実施形態に係る変位検出装置に備わる絶対位置検出手段の構成について、図面を使用しながら説明する。図6(A)は、本発明の一実施形態に係る変位検出装置に備わる絶対位置検出手段の構成の概略を示す側面図であり、図6(B)は、当該絶対位置検出手段に備わる可変反射膜の構成を示す平面図であり、図6(C)は、当該絶対位置検出手段に備わる絶対位置情報出力部の構成を示すブロック図である。 Next, the configuration of the absolute position detecting means provided in the displacement detecting device according to the embodiment of the present invention will be described with reference to the drawings. FIG. 6A is a side view showing an outline of the configuration of an absolute position detecting means provided in the displacement detecting device according to the embodiment of the present invention, and FIG. 6B is a variable view provided in the absolute position detecting means. FIG. 6C is a plan view showing the configuration of the reflective film, and FIG. 6C is a block diagram showing the configuration of the absolute position information output unit provided in the absolute position detecting means.

絶対位置検出手段140は、光源側ビームスプリッタ108(図1参照)で分岐された光に対する反射光の光量の変化に基づいて被測定物10の計測方向(図6(A)及び図6(B)に示すX方向)の変位の絶対位置を検出する機能を有する。本実施形態では、絶対位置検出手段140は、被測定物10に載置され、光源102からの光b4がミラー142を介して照射されるプリズム144と、光b4に対するプリズム144での反射光b5、b6の光量を変化させて受光する絶対位置検出用受光部150と、絶対位置検出用受光部150で受光した反射光b5、b6の光量の変化に基づいてプリズム144の計測方向の変位に基づく絶対位置情報を出力する絶対位置情報出力部160(図6(C)参照)と、を備える。 The absolute position detecting means 140 measures the measurement direction of the object 10 to be measured (FIGS. 6A and 6B) based on the change in the amount of reflected light with respect to the light branched by the light source side beam splitter 108 (see FIG. 1). ) Has a function of detecting the absolute position of the displacement in the X direction). In the present embodiment, the absolute position detecting means 140 is placed on the object 10 to be measured, the prism 144 in which the light b4 from the light source 102 is irradiated through the mirror 142, and the reflected light b5 in the prism 144 with respect to the light b4. , Based on the displacement of the prism 144 in the measurement direction based on the change in the light amount of the reflected light b5 and b6 received by the light receiving unit 150 for absolute position detection and the light receiving unit 150 for absolute position detection that receives light by changing the light amount of b6. It includes an absolute position information output unit 160 (see FIG. 6C) that outputs absolute position information.

本実施形態では、被測定物10の計測方向の変位の絶対位置情報を光学的に検出するために、図6(A)に示すように、被測定物10に載置される光b4の照射対象が所定の厚さを有するプリズム144である。そして、プリズム144の頂面側には、図6(B)に示すように、計測方向(図6(B)に示すX方向)に沿って反射特性が変化する可変反射膜146が設けられる。 In the present embodiment, as shown in FIG. 6A, irradiation of light b4 placed on the object to be measured 10 is performed in order to optically detect the absolute position information of the displacement of the object to be measured 10 in the measurement direction. The object is a prism 144 having a predetermined thickness. Then, as shown in FIG. 6B, a variable reflective film 146 whose reflection characteristics change along the measurement direction (X direction shown in FIG. 6B) is provided on the top surface side of the prism 144.

絶対位置検出用受光部150は、図6(A)に示すように、光b4の可変反射膜146での反射光b5を集光する第2のレンズ151を介して受光して光電交換をするフォトダイオード等からなる第5の受光素子152と、可干渉光b4の被測定物10での反射光b6を集光する第3のレンズ153を介して受光して光電交換をするフォトダイオード等からなる第6の受光素子154を備える。そして、第5の受光素子152と第6の受光素子154で光電して得られた信号は、図6(C)に示す絶対位置情報出力部160へ送られる。 As shown in FIG. 6A, the light receiving unit 150 for absolute position detection receives light through a second lens 151 that collects the reflected light b5 of the variable reflecting film 146 of the light b4 and exchanges photoelectrics. From a fifth light receiving element 152 made of a photodiode or the like and a photodiode or the like that receives light through a third lens 153 that collects the reflected light b6 of the interfering light b4 on the object 10 to be measured and exchanges photoelectric light. A sixth light receiving element 154 is provided. Then, the signal obtained by photoelectrically measured by the fifth light receiving element 152 and the sixth light receiving element 154 is sent to the absolute position information output unit 160 shown in FIG. 6 (C).

絶対位置情報出力部160は、図6(C)に示すように、第1の絶対位置情報演算器161、第2の絶対位置情報演算器162、比較器163、加算器164、及び絶対位置変換器165を備える。第1の絶対位置情報演算器161は、第5の受光素子152で光電変換した信号を電圧値に変換する。第2の絶対位置情報演算器162は、第6の受光素子154で光電変換した信号を電圧値に変換する。比較器163は、第1の絶対位置情報演算器161と第2の絶対位置情報演算器162の位置情報の差を演算する。加算器164は、第1の絶対位置情報演算器161と第2の絶対位置情報演算器162の出力信号を加算する。絶対位置変換器165は、比較器163と加算器164の情報を元に可変反射板146が付いたプリズム144の測定方向Xの変位及び絶対位置情報を出力する。 As shown in FIG. 6C, the absolute position information output unit 160 includes a first absolute position information calculator 161, a second absolute position information calculator 162, a comparator 163, an adder 164, and an absolute position conversion. It is equipped with a vessel 165. The first absolute position information calculator 161 converts the signal photoelectrically converted by the fifth light receiving element 152 into a voltage value. The second absolute position information calculator 162 converts the signal photoelectrically converted by the sixth light receiving element 154 into a voltage value. The comparator 163 calculates the difference in the position information between the first absolute position information calculator 161 and the second absolute position information calculator 162. The adder 164 adds the output signals of the first absolute position information calculator 161 and the second absolute position information calculator 162. The absolute position converter 165 outputs the displacement and the absolute position information of the measurement direction X of the prism 144 having the variable reflector 146 based on the information of the comparator 163 and the adder 164.

このように、本実施形態の絶対位置検出手段140では、ミラー142を介して入射した可干渉光b4が可変反射膜146を通って、一方は、可変反射膜146で反射して、もう一方は、可変反射膜146を透過する。そして、可変反射膜146で反射した反射光b5と可変反射膜146を透過してから被測定物10で反射した反射光b6との光量差を第5の受光素子152と第6の受光素子154で拾って、差動を取って減算をすることによって、DCキャンセルをする。例えば、光量の変動やノイズがあったとしても、差動を取ることによって消すことができる。このため、より効率よく透過率と反射率の変化を読み取ることによって、ターゲットの絶対位置情報を確実に精度よく出力できるので、安定した高精度の変位検出が可能になる。 As described above, in the absolute position detecting means 140 of the present embodiment, the coherent light b4 incident through the mirror 142 passes through the variable reflective film 146, one is reflected by the variable reflective film 146, and the other is reflected. , Transmits through the variable reflective film 146. Then, the difference in the amount of light between the reflected light b5 reflected by the variable reflecting film 146 and the reflected light b6 transmitted by the variable reflecting film 146 and then reflected by the object 10 to be measured is the difference between the fifth light receiving element 152 and the sixth light receiving element 154. DC cancellation is performed by picking up with, taking a differential, and subtracting. For example, even if there is a fluctuation in the amount of light or noise, it can be eliminated by taking a differential. Therefore, by reading the changes in the transmittance and the reflectance more efficiently, the absolute position information of the target can be output reliably and accurately, so that stable and highly accurate displacement detection becomes possible.

次に、本発明の一実施形態に係る変位検出装置による変位検出の動作について、図面を使用しながら説明する。図7は、本発明の一実施形態に係る変位検出装置による信号出力の概要を示すブロック図であり、図8は、本発明の一実施形態に係る相対位置検出手段に備わるインクリメンタル信号発生器のリサージュ信号の角度を示す説明図であり、図9は、本発明の一実施形態に係る変位検出装置の各構成要素の信号出力を示すグラフである。 Next, the operation of displacement detection by the displacement detection device according to the embodiment of the present invention will be described with reference to the drawings. FIG. 7 is a block diagram showing an outline of signal output by the displacement detection device according to the embodiment of the present invention, and FIG. 8 is an incremental signal generator provided in the relative position detection means according to the embodiment of the present invention. It is explanatory drawing which shows the angle of the resage signal, and FIG. 9 is a graph which shows the signal output of each component of the displacement detection apparatus which concerns on one Embodiment of this invention.

本発明の一実施形態に係る変位検出装置100では、図7に示すように、インクリメンタル信号発生器136から出力される相対位置情報を示すインクリメンタル信号と、絶対位置変換器165から出力されるプリズム144の測定方向Xの変位及び絶対位置情報に基づいて、絶対位置信号発生器170が絶対位置信号を出力する。 In the displacement detection device 100 according to the embodiment of the present invention, as shown in FIG. 7, an incremental signal indicating relative position information output from the incremental signal generator 136 and a prism 144 output from the absolute position converter 165. The absolute position signal generator 170 outputs the absolute position signal based on the displacement and the absolute position information of the measurement direction X of.

相対位置情報出力部130(図4参照)のインクリメンタル信号発生器136では、前段側に有する第1の差動増幅器131及び第2の差動増幅器132から供給された信号に基づき、ターゲット112の変位方向及び変位量を求め、インクリメンタル信号を発生する。その際に、第1の差動増幅器131(図4参照)及び第2の差動増幅器132(図4参照)から供給される信号に基づいて、図8に示すリサージュ信号の角度θを求める。 In the incremental signal generator 136 of the relative position information output unit 130 (see FIG. 4), the displacement of the target 112 is based on the signals supplied from the first differential amplifier 131 and the second differential amplifier 132 on the front stage side. The direction and the amount of displacement are obtained, and an incremental signal is generated. At that time, the angle θ of the resage signal shown in FIG. 8 is obtained based on the signals supplied from the first differential amplifier 131 (see FIG. 4) and the second differential amplifier 132 (see FIG. 4).

本実施形態では、第1の受光素子123と第2の受光素子124のDCキャンセルをすることによって得られるSINと、第3の受光素子127と第4の受光素子128のDCキャンセルをすることによって得られるCOSをそれぞれA/D変換後に角度演算をして図8に示すリサージュ信号を作成する。具体的には、それぞれのxにSIN、yにCOSを書くと、円状のリサージュ曲線が描けて、インクリメンタル信号発生器136は、ターゲット112を横に測定方向に動かすと、出力が図9に示す円を描く。これを単位時間の角度で求めて変位情報にする。かかる変位情報がインクリメンタル信号発生器136の出力として出るので、1周360度の角度情報が出てきて、また、戻って0度から360度まで同じように延々と繰り返す。 In the present embodiment, the SIN obtained by DC-cancelling the first light-receiving element 123 and the second light-receiving element 124, and the DC-cancellation of the third light-receiving element 127 and the fourth light-receiving element 128 are performed. After A / D conversion of each of the obtained COS, an angle calculation is performed to create a resage signal shown in FIG. Specifically, if SIN is written in x and COS is written in y, a circular Lissajous curve can be drawn, and when the incremental signal generator 136 moves the target 112 laterally in the measurement direction, the output is shown in FIG. Draw a circle to show. This is obtained by the angle of unit time and used as displacement information. Since such displacement information is output as the output of the incremental signal generator 136, the angle information of 360 degrees per lap is output, and the angle information is returned and repeated endlessly from 0 degrees to 360 degrees.

例えば、1周期360度で100μmの場合では、θが0度の場合では、0mm、θが90度の場合では、25μm、θが180度の場合では、50μmとなる。その際に、インクリメンタル信号発生器136は、16BitのA/Dコンバータで分割することによって、100μm/65536=1.53nmの分解能で相対位置を出力することが可能になる。一方、絶対位置変換器165は、インクリメンタルの1周期100μmの番地情報を出力して、絶対位置信号発生器170で上位の100μmの桁の絶対位置が確定させて、インクリメンタル信号と合成される。 For example, in the case of 100 μm in one cycle of 360 degrees, it is 0 mm when θ is 0 degrees, 25 μm when θ is 90 degrees, and 50 μm when θ is 180 degrees. At that time, the incremental signal generator 136 can output the relative position with a resolution of 100 μm / 65536 = 1.53 nm by dividing by a 16-bit A / D converter. On the other hand, the absolute position converter 165 outputs the address information of 100 μm in one cycle of the incremental, and the absolute position signal generator 170 determines the absolute position of the upper 100 μm digit and synthesizes it with the incremental signal.

本実施形態の変位検出装置100は、前述したような相対位置検出手段110、及び絶対位置検出手段140を備えることによって、1周期100μmに設計した場合に、ターゲット112より反射したビームの偏光状態は、図9に示すように、縦偏光だったものが反時計回りの円偏光に変わり、そこから更に進むと、横方向の直線偏光に変わって、更に進むと時計回りの円偏光に変わってから元に戻って一周期の信号が取れる。 When the displacement detecting device 100 of the present embodiment is provided with the relative position detecting means 110 and the absolute position detecting means 140 as described above and is designed to have a cycle of 100 μm, the polarization state of the beam reflected from the target 112 can be changed. As shown in FIG. 9, what was vertical polarization changes to counterclockwise circular polarization, and when it goes further, it changes to horizontal linear polarization, and when it goes further, it changes to clockwise circular polarization. It returns to the original state and a signal of one cycle can be taken.

これに対して、第1の受光素子123と第2の受光素子124の信号出力に関しては、反射光b2、b7、b9がそのまま通過してくる第1の受光素子123の出力がMAXのときに、第1の偏光ビームスプリッタ122での反射光b10を受光する第2の受光素子124の出力がMINになる。すなわち、第1の受光素子123の出力信号がsin曲線の場合に、第2の受光素子124の出力信号が-sin曲線になる。 On the other hand, regarding the signal outputs of the first light receiving element 123 and the second light receiving element 124, when the output of the first light receiving element 123 through which the reflected light b2, b7, b9 passes as it is is MAX. , The output of the second light receiving element 124 that receives the reflected light b10 in the first polarizing beam splitter 122 becomes MIN. That is, when the output signal of the first light receiving element 123 has a sine curve, the output signal of the second light receiving element 124 has a −sin curve.

一方、ビームスプリッタ121での反射光b8は、λ/4波長板125を通過するので、第3の受光素子127と第4の受光素子128の信号出力に関しては、それぞれcos曲線、-cos曲線になる。 On the other hand, since the reflected light b8 in the beam splitter 121 passes through the λ / 4 wave plate 125, the signal outputs of the third light receiving element 127 and the fourth light receiving element 128 have a cos curve and a -cos curve, respectively. Become.

本実施形態では、第1の差動増幅器131が第1の受光素子123と第2の受光素子124の信号出力の差動をとり、第2の差動増幅器132が第3の受光素子127と第4の受光素子128の信号出力の差動をとるので、第1の差動増幅器131と第2の差動増幅器132の出力信号は、それぞれ倍の振幅になる。その際に、図9の横の線が0Vを示し、DCキャンセルをする。これによっては、光量が変化しても0V中心に変化するので、位相検出の誤差とならない。これらの差動増幅信号は、それぞれsin曲線、cos曲線になって、これをインクリメンタル信号発生器136によって1週360度の角度情報になる。 In the present embodiment, the first differential amplifier 131 takes the difference between the signal outputs of the first light receiving element 123 and the second light receiving element 124, and the second differential amplifier 132 and the third light receiving element 127. Since the signal output of the fourth light receiving element 128 is differential, the output signals of the first differential amplifier 131 and the second differential amplifier 132 have double amplitudes, respectively. At that time, the horizontal line in FIG. 9 indicates 0V, and DC cancellation is performed. As a result, even if the amount of light changes, it changes to the center of 0V, so that there is no error in phase detection. These differential amplification signals are converted into a sine curve and a cos curve, respectively, which are converted into angle information of 360 degrees per week by the incremental signal generator 136.

この角度情報は、前述したリサージュ信号で求める。例えば、絶対位置情報の単位を100μmとした場合に100μmの中で360度のアブソリュート情報になっている。100μmを超えるとまた元に戻ってしまうことから、周期的な信号が作成されず、絶対位置検出が出来なくなってしまう。そこで今度は、絶対位置検出手段140で単純にレーザから来た光を表面と透過したものの差動を取ると、一方は、反射して、一方は透過する。このため、これのバランスがリニアに変わっていくので、引き算すると電圧が少しずつ増えていくような信号になっていく。本実施形態では、これら差動増幅器131、132の出力信号をA/D変換器133、134でデジタル変換するが、電圧の変化をデジタル変換して、これを引き算することによって、DCキャンセルされた信号が得られる。このため、インクリメンタル信号発生器136で作成されるインクリメンタル信号のデジタル角度値は、1周期で緩やかな勾配の増加を繰り返すグラフが得られ、絶対位置変換器165のデジタル絶対値は、所定の間隔で段階的にデジタル絶対値を増加させるグラフが得られる。 This angle information is obtained by the above-mentioned resage signal. For example, when the unit of absolute position information is 100 μm, the absolute information is 360 degrees within 100 μm. If it exceeds 100 μm, it will return to its original state, so a periodic signal will not be created and absolute position detection will not be possible. Therefore, this time, when the absolute position detecting means 140 simply transmits the light coming from the laser to the surface and takes a differential, one is reflected and the other is transmitted. For this reason, the balance of this changes linearly, and when subtracted, the signal becomes such that the voltage gradually increases. In the present embodiment, the output signals of the differential amplifiers 131 and 132 are digitally converted by the A / D converters 133 and 134, but the change in voltage is digitally converted and DC canceled by subtracting the digital conversion. A signal is obtained. Therefore, the digital angle value of the incremental signal created by the incremental signal generator 136 can be obtained as a graph in which a gentle gradient increase is repeated in one cycle, and the digital absolute value of the absolute position converter 165 is set at predetermined intervals. A graph is obtained that gradually increases the digital absolute value.

このように、本実施形態では、相対位置検出手段100のターゲット112の複屈折部材116が計測方向に厚さが変化する断面がくさび状の構成として、かつ、複屈折部材116の先端116aを基端116a´に対して回動可能にするので、複屈折部材116の傾きと配置によって、インクリメンタル信号の周期を所望の大きさに変更できる。すなわち、従来のように、インクリメンタル信号の信号周期によって部品を変えずに、所望の周期に変更できるので、簡素な構成で幅広い信号周期に対応可能とした上でターゲットの相対位置情報を確実に精度よく出力できるので、安定した高精度の変位検出が可能になる。 As described above, in the present embodiment, the birefringent member 116 of the target 112 of the relative position detecting means 100 has a wedge-shaped cross section whose thickness changes in the measurement direction, and is based on the tip 116a of the birefringent member 116. Since it is rotatable with respect to the end 116a', the period of the incremental signal can be changed to a desired magnitude depending on the inclination and arrangement of the birefringent member 116. In other words, as in the past, it is possible to change to the desired cycle without changing the parts according to the signal cycle of the incremental signal, so it is possible to handle a wide range of signal cycles with a simple configuration, and the relative position information of the target is reliably accurate. Since it can output well, stable and highly accurate displacement detection becomes possible.

また、本実施形態では、変位を検出するための2つの光波が空間的に同じ光路を通るので、外乱の影響を受けずに、安定した高精度の変位検出が可能になる。更に、本実施形態では、相対位置検出手段110と絶対位置検出手段140を被測定物10の計測方向に対してインライン上に設けられるので、簡素な構成で幅広いインクリメンタル信号の周期に対応可能とした上でターゲットの相対位置情報も踏まえた絶対位置情報を確実に精度よく出力できるので、安定した高精度の変位検出が可能になるので、極めて大きな工業的価値を有する。 Further, in the present embodiment, since the two light waves for detecting the displacement pass through the same optical path spatially, stable and highly accurate displacement detection is possible without being affected by the disturbance. Further, in the present embodiment, since the relative position detecting means 110 and the absolute position detecting means 140 are provided in-line with respect to the measurement direction of the object to be measured 10, it is possible to correspond to a wide range of incremental signal cycles with a simple configuration. Since the absolute position information based on the relative position information of the target can be output reliably and accurately, stable and highly accurate displacement detection becomes possible, which has extremely great industrial value.

なお、本発明の一実施形態に係る相対位置検出手段100のターゲット112の複屈折部材116の構成は、計測方向に対して厚さが変化する形状であれば、その断面がくさび状となる略三角柱形状に限定されない。例えば、図10(A)に示すように、上に凸状の曲面形状の複屈折部材116cや、上に凹状の曲面形状の複屈折部材116d、正弦曲線形状の複屈折部材116eとしてもよい。このように、複屈折部材を計測方向に対して厚さが変化する形状とすることによって、かかる形状の変化に伴って、図10(B)に示すように、計測方向の移動量に対する位置情報が変化するようになるので、複屈折部材の傾きと配置によって、インクリメンタル信号の周期を所望の大きさに変更できる。 The configuration of the birefringent member 116 of the target 112 of the relative position detecting means 100 according to the embodiment of the present invention is abbreviated that the cross section thereof is wedge-shaped if the thickness changes with respect to the measurement direction. It is not limited to the triangular prism shape. For example, as shown in FIG. 10 (A), the birefringent member 116c having a curved surface shape having an upward convex shape, the birefringent member 116d having a curved surface shape having a concave shape upward, and the birefringent member 116e having a sinusoidal curved surface shape may be used. By forming the birefringent member into a shape whose thickness changes with respect to the measurement direction in this way, as shown in FIG. 10B, the position information with respect to the movement amount in the measurement direction is accompanied by the change in the shape. Therefore, the period of the incremental signal can be changed to a desired magnitude depending on the inclination and arrangement of the birefringent member.

また、複屈折部材116は、複数の異なる部材から構成されてもよい。例えば、図11(A)に示すように、2つの複屈折部材116f、116gが計測方向に沿って並列して構成されることによって、計測箇所によって信号出力の感度を変えられるようにしてもよい。また、図11(B)に示すように、2つの複屈折部材116h、116iが光の入射方向、すなわち、入射光線方向に沿って積層されて構成されることによって、信号周期を変えられるようにしてもよい。このように、複屈折部材116を複数の異なる部材から構成されることによって、簡素な構成でターゲットの計測方向への移動に伴い反射光の偏光状態の変化を示す信号出力の感度や周期を容易に変えることができる。 Further, the birefringence member 116 may be composed of a plurality of different members. For example, as shown in FIG. 11A, two birefringent members 116f and 116g may be configured in parallel along the measurement direction so that the sensitivity of the signal output can be changed depending on the measurement location. .. Further, as shown in FIG. 11B, the two birefringent members 116h and 116i are laminated along the incident direction of light, that is, the incident light direction, so that the signal period can be changed. May be. By configuring the birefringent member 116 from a plurality of different members in this way, the sensitivity and period of the signal output indicating the change in the polarization state of the reflected light as the target moves in the measurement direction can be easily achieved with a simple configuration. Can be changed to.

更に、複屈折部材116は、熱変動や光源の波長変動による影響を抑制するために、結晶軸の方向が異なる複数の部材が光の入射方向に沿って積層されて構成されることとしてもよい。例えば、図12(A)に示すように、複屈折部材116jに対して90°直交した結晶軸で同等の作用を持つ他の複屈折部材116kを重ね合わせても良い。これにより、各複屈折部材116j、116kの結晶軸方向が互いに直交しているので、熱変動や光源の波長変動による影響を抑えることができる。また、図12(B)に示すように、複屈折部材116lの断面を二等辺三角形状にし、測定時のインラインをその二等辺三角形の角度中心の位置にすることによって、アッべ誤差を抑えることができるようになる。更に、図12(C)に示すように、複屈折部材116oに対して90°直交した結晶軸で同等の作用を持ち、かつ、同形状の他の複屈折部材116nを重ね合わせることによって、出射光線の角度ズレを抑制して、複屈折部材116n、116oの厚みを小さくすることも可能である。なお、これらの作用・効果は、後述する補正プリズム129、229に対しても同様に行うことによって、同等の効果を得ることができる。 Further, the birefringence member 116 may be configured by laminating a plurality of members having different crystal axis directions along the incident direction of light in order to suppress the influence of thermal fluctuation and wavelength fluctuation of the light source. .. For example, as shown in FIG. 12A, another birefringent member 116k having the same effect on the crystal axis orthogonal to the birefringent member 116j may be superposed. As a result, since the crystal axis directions of the birefringent members 116j and 116k are orthogonal to each other, it is possible to suppress the influence of thermal fluctuations and wavelength fluctuations of the light source. Further, as shown in FIG. 12B, the cross section of the birefringence member 116l is formed into an isosceles triangle shape, and the in-line at the time of measurement is set to the position of the angle center of the isosceles triangle, thereby suppressing the abbe error. Will be able to. Further, as shown in FIG. 12 (C), the birefringent member 116o has the same effect on the crystal axis orthogonal to 90 °, and is emitted by superimposing another birefringent member 116n having the same shape. It is also possible to suppress the angular deviation of the light beam and reduce the thickness of the birefringent members 116n and 116o. It should be noted that these actions / effects can be obtained in the same manner with respect to the correction prisms 129 and 229 described later.

また、複屈折部材116に対し、入射光線が入射する面は、斜面に限定されず、他の面としてもよい。例えば、図13に示すように、複屈折部材116pが斜面116p2の他に平面116p1を有する場合、斜面116p2の頂点側を反射板114に設置して、上側に配置される平面116p1に対して垂直に入射光線が入射すると、入射光線の屈折角を抑えることができるので、高精度な計測に対して効果的である。 Further, the surface on which the incident light rays are incident on the birefringence member 116 is not limited to the slope surface, and may be another surface. For example, as shown in FIG. 13, when the double refraction member 116p has a plane 116p1 in addition to the slope 116p2, the apex side of the slope 116p2 is installed on the reflector 114 and is perpendicular to the plane 116p1 arranged on the upper side. When an incident light ray is incident on the surface, the refraction angle of the incident light ray can be suppressed, which is effective for high-precision measurement.

なお、本発明の一実施形態に係る相対位置検出手段110を備える変位検出装置100は、絶対位置検出手段140と相対位置検出手段110が被測定物10の計測方向に対してインライン上に設けられる構成となっていれば良いので、他の構成としてもよい。 In the displacement detecting device 100 including the relative position detecting means 110 according to the embodiment of the present invention, the absolute position detecting means 140 and the relative position detecting means 110 are provided in-line with respect to the measurement direction of the object to be measured 10. As long as it has a configuration, it may be another configuration.

例えば、図14に示すように、被測定物に載置する反射物を絶対位置検出手段240と相対位置検出手段210で共通の反射膜付きプリズム244にしてもよい。本変形例に係る変位検出装置200に備わる反射膜付きプリズム244は、図14に示すように、箱型形状であり、内側に断面が略V字型のプリズム面244a、244bが設けられている。そして、反射膜付きプリズム244の頂面側には、複屈折部材216と可変反射膜246が計測方向に沿ってインライン上(同軸上)に設けられている。複屈折部材216と可変反射膜246は、インライン上に設けなくてもよいが、この場合、被測定物の姿勢変化により絶対位置検出と相対位置検出にアッペ誤差が発生する虞があるので、インライン上に設けることが好ましい。なお、複屈折部材216と可変反射膜246の構成及び作用は、本発明の一実施形態に係る変位検出装置100に備わるものと同様なので、その説明については、省略する。 For example, as shown in FIG. 14, the reflecting object placed on the object to be measured may be a prism 244 with a reflective film common to the absolute position detecting means 240 and the relative position detecting means 210. As shown in FIG. 14, the prism with a reflective film 244 provided in the displacement detection device 200 according to this modification has a box shape, and prism surfaces 244a and 244b having a substantially V-shaped cross section are provided inside. .. A birefringent member 216 and a variable reflective film 246 are provided in-line (coaxially) along the measurement direction on the top surface side of the prism with a reflective film 244. The birefringence member 216 and the variable reflective film 246 do not have to be provided in-line, but in this case, an appe error may occur in absolute position detection and relative position detection due to a change in the attitude of the object to be measured. It is preferable to provide it on the top. Since the configuration and operation of the birefringence member 216 and the variable reflection film 246 are the same as those provided in the displacement detection device 100 according to the embodiment of the present invention, the description thereof will be omitted.

本変形例では、各受光素子223、224、227、228、252、254で光の垂直方向での入射が可能となるようにするために、相対位置検出手段210では、ビームスプリッタ221の入力段側に、光源202からの光b´1の反射膜付きプリズム244での反射光b´2の反射光b´3を集光するための第4のレンズ217が設けられ、第1の偏光ビームスプリッタ222の第1の受光素子223側の出力段にミラー218が設けられ、第2の偏光ビームスプリッタ226の第3の受光素子227側の出力段にミラー219が設けられている。一方、絶対位置検出手段240では、図14に示すように、ミラー242と反射板付きプリズム244との間に、偏光子255、偏光ビームスプリッタ256、及び1/4波長板257が設けられ、かつ、偏光ビームスプリッタ256の第5の受光素子252側の出力段にミラー258が設けられている。 In this modification, in order to enable the light to be incident in the vertical direction at each light receiving element 223, 224, 227, 228, 252, 254, the relative position detecting means 210 has an input stage of the beam splitter 221. A fourth lens 217 for condensing the reflected light b'3 of the reflected light b'2 by the mirror 244 with a reflecting film of the light b'1 from the light source 202 is provided on the side, and a first polarized beam is provided. A mirror 218 is provided on the output stage of the splitter 222 on the first light receiving element 223 side, and a mirror 219 is provided on the output stage of the second polarized beam splitter 226 on the third light receiving element 227 side. On the other hand, in the absolute position detecting means 240, as shown in FIG. 14, a splitter 255, a polarizing beam splitter 256, and a 1/4 wave plate 257 are provided between the mirror 242 and the prism with a reflecting plate 244, and the absolute position detecting means 240 is provided. A mirror 258 is provided in the output stage on the fifth light receiving element 252 side of the polarizing beam splitter 256.

このように、本変形例の変位検出装置200は、本発明の一実施形態に係る変位検出装置100と同様に、相対位置検出手段200のターゲットの複屈折部材216が計測方向に厚さが変化する断面がくさび状の構成として、かつ、複屈折部材216の先端216aを基端216bに対して回動可能にするので、複屈折部材216の傾きと配置によって、インクリメンタル信号の周期を所望の大きさに変更できる。このため、簡素な構成で幅広い信号周期に対応可能とした上でターゲットの相対位置情報を確実に精度よく出力できるので、安定した高精度の被測定物の変位検出が可能になる。 As described above, in the displacement detection device 200 of the present modification, the thickness of the birefringence member 216 of the target of the relative position detection means 200 changes in the measurement direction, similarly to the displacement detection device 100 according to the embodiment of the present invention. Since the cross section is wedge-shaped and the tip 216a of the birefringence member 216 is rotatable with respect to the base end 216b, the period of the incremental signal can be set to a desired size depending on the inclination and arrangement of the birefringence member 216. Can be changed to. Therefore, since the relative position information of the target can be reliably and accurately output while being able to handle a wide range of signal cycles with a simple configuration, stable and highly accurate displacement detection of the object to be measured becomes possible.

また、被測定物に載置する反射物を絶対位置検出手段240と相対位置検出手段210で共通の反射膜付きプリズム244として、かつ、各受光素子223、224、227、228、252、254で光の垂直方向での入射が可能となる構成となっているので、装置の省スペース化が図れるので、極めて大きな工業的価値を有する。 Further, the reflecting object to be placed on the object to be measured is a prism 244 with a reflecting film common to the absolute position detecting means 240 and the relative position detecting means 210, and each light receiving element 223, 224, 227, 228, 252, 254. Since the structure allows light to be incident in the vertical direction, the space of the device can be saved, and it has an extremely large industrial value.

なお、本実施形態では、図14に示すように、光源202がファイバで導入される場合には、光源202の温度を測定することによって波長変動を推定し補正してもよい。一方、光源202がファイバでなく、LDがセンサヘッド部に含まれる形状の場合では、LDやセンサヘッド部付近に温度計を配置することによって同様の波長変動補正を行えるようになる。 In the present embodiment, as shown in FIG. 14, when the light source 202 is introduced by a fiber, the wavelength fluctuation may be estimated and corrected by measuring the temperature of the light source 202. On the other hand, when the light source 202 is not a fiber and the LD is included in the sensor head portion, the same wavelength fluctuation correction can be performed by arranging the thermometer near the LD and the sensor head portion.

また、複屈折部材216の光学軸は、計測方向に対して必ずしも平行、直交である必要はない。例えば、図14のx軸に平行に又は直角に光学軸をもつ複屈折部材216において、光学軸をx軸に対してz軸を回転軸として光学軸を45度回転させた場合、光源202が直線偏光であるときには,光源202、相対位置検出用受光部220をz軸を回転軸として45度傾ければよい。一方、光源202が円偏光の場合では、光源202を回転する必要はない。このようにして、光学軸の自由度を高めることによって、フレキシブルに高精度な変位検出が可能になる。 Further, the optical axis of the birefringence member 216 does not necessarily have to be parallel or orthogonal to the measurement direction. For example, in the birefringence member 216 having an optical axis parallel to or perpendicular to the x-axis of FIG. 14, when the optical axis is rotated 45 degrees with the z-axis as the rotation axis with respect to the x-axis, the light source 202 is rotated. In the case of linearly polarized light, the light source 202 and the light receiving unit 220 for relative position detection may be tilted by 45 degrees with the z-axis as the rotation axis. On the other hand, when the light source 202 is circularly polarized, it is not necessary to rotate the light source 202. By increasing the degree of freedom of the optical axis in this way, flexible and highly accurate displacement detection becomes possible.

更に、本実施形態では、光源ユニット(センサヘッド)からターゲットとなる複屈折部材216に入射される光において、偏光状態を円偏光にしておいてもよい。入射光の偏光状態が円偏光の場合では、センサヘッドのアジマスがずれても、複屈折媒質における常光、異常光の電界成分比を常に等量とすることができる。 Further, in the present embodiment, the polarization state of the light incident on the target birefringence member 216 from the light source unit (sensor head) may be circularly polarized. When the polarization state of the incident light is circularly polarized light, the electric field component ratios of the normal light and the abnormal light in the birefringent medium can always be equal even if the azimuth of the sensor head shifts.

また、本実施形態では、図14に示すように、ビームスプリッタ221と第2の偏光ビームスプリッタ226との間に1/4波長板225が設けられているが、これを取り除き、ビームスプリッタ221の直前に1/4波長板225を配置してもよい。このとき、1/4波長板225の光学軸は、複屈折部材の光学軸に対して斜め45度となるようにして、干渉信号検出部のPBSのP偏光軸、S偏光軸の方位角を調整することによって,+/-sin信号、+/-cos信号を得られるように調整することが好ましい。 Further, in the present embodiment, as shown in FIG. 14, a 1/4 wave plate 225 is provided between the beam splitter 221 and the second polarizing beam splitter 226, but this is removed and the beam splitter 221 is used. A 1/4 wave plate 225 may be arranged immediately before. At this time, the optical axis of the 1/4 wave plate 225 is set at an angle of 45 degrees with respect to the optical axis of the birefringence member, and the azimuth angles of the P and S polarization axes of the PBS of the interference signal detection unit are set. It is preferable to adjust so that a +/- sin signal and a +/- cos signal can be obtained.

なお、図14に示す変位検出装置200の相対位置検出手段210には、ターゲットの計測方向への移動に伴い反射光の偏光状態の変化を検出する相対位置検出用受光部220が1つ設けられているが、計測方向に沿って2つ設けてもよい。例えば、図15に示すように、第1相対位置検出用受光部220aと第2相対位置検出用受光部220bを計測方向に沿って並べて配置して、2つの相対位置検出用受光部220a、220bを同一の光源202で動作させて複屈折部材216の2点における位相変動量を得ることによって、2点間の差分に基づいて波長変動量を推定し補正する。 The relative position detection means 210 of the displacement detection device 200 shown in FIG. 14 is provided with one light receiving unit 220 for relative position detection that detects a change in the polarization state of the reflected light as the target moves in the measurement direction. However, two may be provided along the measurement direction. For example, as shown in FIG. 15, the first relative position detection light receiving unit 220a and the second relative position detection light receiving unit 220b are arranged side by side along the measurement direction, and the two relative position detection light receiving units 220a and 220b are arranged side by side. Is operated by the same light source 202 to obtain the amount of phase fluctuation at two points of the birefringent member 216, thereby estimating and correcting the amount of wavelength fluctuation based on the difference between the two points.

例えば、波長変動による常光、異常光の位相差Φは、光の波長をλ、波長λの時にΦの位相差を与える複屈折部材216の厚さd、常光と異常光の屈折率差をΔnとすると、下記の式(9)で表される。
Φ=Δn*d/λ・・・・・(9)
For example, the phase difference Φ between normal light and abnormal light due to wavelength fluctuation is the thickness d of the birefringent member 216 that gives a phase difference of Φ when the wavelength of light is λ and the wavelength λ, and the difference in refractive index between normal light and abnormal light is Δn. Then, it is expressed by the following equation (9).
Φ = Δn * d / λ ... (9)

波長λの時にΦの位相差を与える複屈折部材216の厚さdは、複屈折部材216の斜面の傾きをk、複屈折部材216の計測方向の移動量をxとすると、下記の式(10)で表される。
d=k*x・・・・・(10)
The thickness d of the birefringent member 216 that gives a phase difference of Φ at the wavelength λ is as follows, where k is the inclination of the slope of the birefringence member 216 and x is the amount of movement of the birefringence member 216 in the measurement direction. It is represented by 10).
d = k * x ... (10)

このため、第1相対位置検出用受光部220aで検出される常光、異常光の位相差ΔΦ1は、光の波長をλ、λ´、波長λ、λ´の時にΔΦ1、ΔΦ´1の位相差を与える複屈折部材216の厚さd1、常光と異常光の屈折率差をΔnとすると、下記の式(11)乃至(13)で表される。
Φ1=Δn*d1/λ・・・・・(11)
Φ´1=Δn*d1/λ´・・・・(12)
ΔΦ1=Φ´1-Φ1・・・・・・(13)
Therefore, the phase difference ΔΦ1 between normal light and abnormal light detected by the first relative position detection light receiving unit 220a is the phase difference ΔΦ1 and ΔΦ'1 when the wavelengths of the light are λ, λ', wavelengths λ, and λ'. When the thickness d1 of the birefringent member 216 and the difference in the refractive index between the normal light and the abnormal light are Δn, they are represented by the following equations (11) to (13).
Φ1 = Δn * d1 / λ ... (11)
Φ'1 = Δn * d1 / λ'... (12)
ΔΦ1 = Φ'1-Φ1 ... (13)

一方、第2相対位置検出用受光部220bで検出される常光、異常光の位相差ΔΦ2は、光の波長をλ、λ´、波長λ、λ´の時にΔΦ2、ΔΦ´2の位相差を与える複屈折部材216の厚さd2、常光と異常光の屈折率差をΔnとすると、下記の式(14)乃至(16)で表される。
Φ2=Δn*d2/λ・・・・・(14)
Φ´2=Δn*d2/λ´・・・・(15)
ΔΦ2=Φ´2-Φ2・・・・・・(16)
On the other hand, the phase difference ΔΦ2 between normal light and abnormal light detected by the second relative position detection light receiving unit 220b has a phase difference of ΔΦ2 and ΔΦ'2 when the wavelengths of the light are λ, λ', wavelengths λ and λ'. Assuming that the thickness d2 of the birefringent member 216 and the difference in the refractive index between the normal light and the abnormal light are Δn, they are represented by the following equations (14) to (16).
Φ2 = Δn * d2 / λ ... (14)
Φ'2 = Δn * d2 / λ'... (15)
ΔΦ2 = Φ'2-Φ2 ... (16)

上記の式(9)乃至(16)より、第1相対位置検出用受光部220aと第2相対位置検出用受光部220bで検出される常光、異常光の位相差ΔΦ12は、下記の式(17)で示される。
ΔΦ12=Δn*k*{(λ-λ‘)/λλ’ }*Δx・・・・・(17)
From the above equations (9) to (16), the phase difference ΔΦ12 between the normal light and the abnormal light detected by the first relative position detection light receiving unit 220a and the second relative position detection light receiving unit 220b is the following equation (17). ).
ΔΦ12 = Δn * k * {(λ-λ') / λλ'} * Δx ... (17)

このため、変調後の波長λ´は、下記の式(18)で示される。
λ´={Δn*k*λ*Δx}/{ΔΦ12*λ+Δn*k*Δx}・・・(18)
Therefore, the wavelength λ'after modulation is represented by the following equation (18).
λ'= {Δn * k * λ * Δx} / {ΔΦ12 * λ + Δn * k * Δx} ... (18)

このように、本実施形態では、波長変動による常光、異常光の位相差が複屈折部材216の厚さdに比例するため、Δxと複屈折部材216の傾きkが分かっていれば、波長変動量を見積もることが出来る。このため、各相対位置検出用受光部220a、220bで検出した反射光の偏光状態の位相変動量の差分に基づいて波長変動量を容易に推定できるので、かかる推定に基づいて波長変動量を補正することによって、より高精度な変位検出が可能になる。 As described above, in the present embodiment, the phase difference between normal light and abnormal light due to wavelength fluctuation is proportional to the thickness d of the birefringent member 216. Therefore, if Δx and the slope k of the birefringent member 216 are known, the wavelength fluctuation You can estimate the amount. Therefore, the wavelength fluctuation amount can be easily estimated based on the difference in the phase fluctuation amount of the polarization state of the reflected light detected by the light receiving units 220a and 220b for relative position detection, and the wavelength fluctuation amount is corrected based on the estimation. By doing so, more accurate displacement detection becomes possible.

なお、本発明の一実施形態の変形例に係る変位検出装置200に備わる反射膜付きプリズム244の形状は、図14に示す形状に限定されない。例えば、図16に示すように、反射膜付きプリズム244´の断面が左右対称な六角形としてもよい。 The shape of the prism with a reflective film 244 provided in the displacement detection device 200 according to the modified example of the embodiment of the present invention is not limited to the shape shown in FIG. For example, as shown in FIG. 16, the cross section of the prism with a reflective film 244'may be a hexagon whose cross section is symmetrical.

具体的には、反射膜付きプリズム244´は、図16に示すように、プリズム面244´a、244´bが反射膜付きプリズム244´の底面側の近傍に設けられ、反射膜付きプリズム244´の頂面側の略中央に反射膜248が設けられている。なお、複屈折部材216と可変反射膜246の構成及び作用は、本発明の一実施形態に係る変位検出装置100に備わるものと同様なので、その説明については、省略する。 Specifically, as shown in FIG. 16, in the prism with a reflective film 244', the prism surfaces 244'a and 244'b are provided in the vicinity of the bottom surface side of the prism 244'with a reflective film, and the prism 244 with a reflective film is provided. A reflective film 248 is provided substantially in the center on the top surface side of the screen. Since the configuration and operation of the birefringence member 216 and the variable reflection film 246 are the same as those provided in the displacement detection device 100 according to the embodiment of the present invention, the description thereof will be omitted.

反射膜付きプリズム244´をこのような構成とすることによって、反射膜付きプリズム244´への入射光b´1、b´10のプリズム面244´aでの反射光b´2a、b´11aが反射膜248で反射されて、当該反射膜248での反射光b´2b、b´11bがプリズム面244´bで反射される。このため、反射膜付きプリズム244´が計測方向Xに対して垂直方向となるY方向に移動したとしても、入射光b´1、b´10と当該プリズム面244´bでの反射光b´3、b´12の間隔I1が一定になるので、絶対位置検出手段240と相対位置検出手段210に備わる各受光素子223、224、227、228、252、254(図14参照)による受光が安定するようになる。このため、絶対位置検出手段240(図14参照)と相対位置検出手段210(図14参照)による安定した高精度の変位検出が可能になる。 By configuring the reflecting film-equipped prism 244'in this way, the reflected light b'2a, b'11a on the prism surface 244'a of the incident light b'1 and b'10 on the reflecting film-equipped prism 244' Is reflected by the reflective film 248, and the reflected light b'2b and b'11b by the reflective film 248 are reflected by the prism surface 244'b. Therefore, even if the prism with a reflective film 244'moves in the Y direction, which is perpendicular to the measurement direction X, the incident light b'1 and b'10 and the reflected light b'b on the prism surface 244'b. 3. Since the interval I1 of b'12 becomes constant, the light reception by each light receiving element 223, 224, 227, 228, 252, 254 (see FIG. 14) provided in the absolute position detecting means 240 and the relative position detecting means 210 is stable. Will come to do. Therefore, stable and highly accurate displacement detection is possible by the absolute position detecting means 240 (see FIG. 14) and the relative position detecting means 210 (see FIG. 14).

また、変位検出装置100、200において、絶対位置検出手段140、240の絶対位置信号1周期の長さに対して測定に用いるビームの径が十分に小さいと言えない場合に、図17及び図18に示すように、ビームが複屈折部材116、216へ入射する前に補正プリズム129、229を透過させても良い。その際に、補正プリズム129、229は、複屈折部材116、216と同等の作用を持つ部材、例えば、同材質・同形状の部材を使用する。ただし、補正プリズム129、229の結晶の光学軸は、複屈折材料116、216に対して90°直交している。また、設置箇所は、複屈折部材116、216に入射前後のどちらでも良いが、何れか一方にのみに設置する。 Further, in the displacement detection devices 100 and 200, when it cannot be said that the diameter of the beam used for the measurement is sufficiently small with respect to the length of one cycle of the absolute position signals of the absolute position detection means 140 and 240, FIGS. 17 and 18 show. As shown in the above, the correction prisms 129 and 229 may be transmitted before the beam is incident on the birefringence members 116 and 216. At that time, the correction prisms 129 and 229 use members having the same function as the birefringent members 116 and 216, for example, members having the same material and shape. However, the optical axis of the crystal of the correction prisms 129 and 229 is orthogonal to the birefringent materials 116 and 216 by 90 °. Further, the installation location may be either before or after the incident on the birefringent members 116 and 216, but it is installed only on one of them.

このような構成の補正プリズム129、229を複屈折部材116、216に入射前後の何れかに設けることによって、複屈折部材116、216を透過したビーム分布内の偏光状態が均一となる。これにより、絶対位置検出手段140、240による安定した高精度の変位検出が可能となる。なお、図19(A)に示すように、補正プリズム129a、229aは、複屈折部材116、216と同等の作用を持つ部材、例えば、同材質・同形状の部材を使用して、向かい合わせて配置しても良い。また、図19(B)に示すように、補正プリズム129b、229bは、複屈折部材116、216に対して左右対称に配置しても、同等の効果を得ることができる。 By providing the correction prisms 129 and 229 having such a configuration on the birefringence members 116 and 216 either before or after the incident, the polarization state in the beam distribution transmitted through the birefringence members 116 and 216 becomes uniform. This enables stable and highly accurate displacement detection by the absolute position detecting means 140 and 240. As shown in FIG. 19A, the correction prisms 129a and 229a face each other using members having the same function as the birefringent members 116 and 216, for example, members having the same material and shape. It may be arranged. Further, as shown in FIG. 19B, even if the correction prisms 129b and 229b are arranged symmetrically with respect to the birefringent members 116 and 216, the same effect can be obtained.

また、変位検出装置200に対して、図20に示すように、第1のレンズ204と光源側ビームスプリッタ208の間に偏光板230を搭載しても良い。偏光板230をこのように設けることによって、変位検出に用いるビームをより高消光比とすることができる。これによって、偏光を利用した変位検出装置200では、より高精度の変位検出が可能となる。なお、このとき、絶対位置検出手段240では、図20に示すように、ミラー242と偏光ビームスプリッタ256との間の偏光子255(図14及び図18を参照)の設置を省略してもよい。なお、偏光板230は、光源202から複屈折部材216の間であれば、何処に配置しても良いが、複屈折部材216の直前に偏光板230の結晶軸を複屈折部材216の結晶軸に対して45°ずらして配置することが最も効果的である。その場合、測定物がZ軸方向に回転しても、その影響を抑えることができるので好ましい。また、偏光板230を複屈折部材216に貼り付けた場合、測定物がZ軸方向に回転しても偏光板230も共に回転するため、その影響を抑えることができる。 Further, as shown in FIG. 20, the polarizing plate 230 may be mounted between the first lens 204 and the light source side beam splitter 208 with respect to the displacement detection device 200. By providing the polarizing plate 230 in this way, the beam used for displacement detection can have a higher extinction ratio. As a result, the displacement detection device 200 using polarization enables more accurate displacement detection. At this time, in the absolute position detecting means 240, as shown in FIG. 20, the installation of the splitter 255 (see FIGS. 14 and 18) between the mirror 242 and the polarizing beam splitter 256 may be omitted. .. The polarizing plate 230 may be arranged anywhere as long as it is between the light source 202 and the birefringence member 216, but the crystal axis of the polarizing plate 230 may be arranged immediately before the birefringence member 216 and the crystal axis of the birefringence member 216. It is most effective to displace it by 45 ° with respect to it. In that case, even if the object to be measured rotates in the Z-axis direction, its influence can be suppressed, which is preferable. Further, when the polarizing plate 230 is attached to the birefringence member 216, even if the object to be measured rotates in the Z-axis direction, the polarizing plate 230 also rotates, so that the influence can be suppressed.

さらに、図21に示すように、本実施形態の変位検出装置300の相対位置検出手段310に備わる相対位置検出用受光部320に、反射光に対してアジマス補正を行うアジマス補正部380を更に設けてもよい。本実施形態では、アジマス補正部380は、図21に示すように、入射光用ビームスプリッタ381、入射光用反射プリズム382、アジマス補正用偏光板383、アジマス回転検出用レンズ384、アジマス回転検出用ビームスプリッタ385、アジマス回転検出用偏光板386、パワーモニター用反射プリズム387、パワーモニター用受光素子388、及び角度測定用受光素子389を備える。なお、本実施形態では、アジマスの検出角感度を高めるために、アジマス回転検出用ビームスプリッタ385の直前、又は角度測定用受光素子389の直前に、1/2波長板やダブプリズム等のような偏光方位角の変化を大きくするような光学素子を設けてもよい。 Further, as shown in FIG. 21, the azimuth correction unit 380 for performing azimuth correction on the reflected light is further provided in the relative position detection light receiving unit 320 provided in the relative position detection means 310 of the displacement detection device 300 of the present embodiment. You may. In the present embodiment, as shown in FIG. 21, the azimuth correction unit 380 includes a beam splitter 381 for incident light, a reflection prism 382 for incident light, a polarizing plate 383 for azimuth correction, a lens 384 for azimuth rotation detection, and azimuth rotation detection. A beam splitter 385, a polarizing plate for detecting azimuth rotation 386, a reflection prism 387 for a power monitor, a light receiving element 388 for a power monitor, and a light receiving element 389 for angle measurement are provided. In this embodiment, in order to increase the azimuth detection angle sensitivity, a 1/2 wave plate, a dub prism, or the like is used immediately before the beam splitter 385 for azimuth rotation detection or immediately before the light receiving element 389 for angle measurement. An optical element that increases the change in the polarization azimuth may be provided.

このように、アジマス補正部380を設けることによって、光源302からの入射光b″1が入射光用ビームスプリッタ381で分岐されて、その分岐光b″15が入射光用反射プリズム382で反射する。そして、その反射光b″16が反射膜付きプリズム344の略V字型のプリズム面344a、344bで反射して、その反射光b″18がアジマス補正用偏光板383とアジマス回転検出用レンズ384を経て、アジマス回転検出用ビームスプリッタ385に入射する。 By providing the azimuth correction unit 380 in this way, the incident light b "1 from the light source 302 is branched by the incident light beam splitter 381, and the branched light b" 15 is reflected by the incident light reflection prism 382. .. Then, the reflected light b "16 is reflected by the substantially V-shaped prism surfaces 344a and 344b of the prism 344 with a reflective film, and the reflected light b" 18 is the azimuth correction polarizing plate 383 and the azimuth rotation detection lens 384. Then, the light is incident on the beam splitter 385 for detecting the rotation of the azimuth.

アジマス回転検出用ビームスプリッタ385に入射した反射光b″18は、分岐光b″19がパワーモニター用反射プリズム387で反射して、その反射光b″20がパワーモニター用受光素子388に入射する。一方、アジマス回転検出用ビームスプリッタ385に入射した反射光b″18の透過光b″21は、アジマス回転検出用偏光板386を透過してから角度測定用受光素子389に入射する。 In the reflected light b "18 incident on the beam splitter 385 for azimuth rotation detection, the branched light b" 19 is reflected by the reflecting prism 387 for the power monitor, and the reflected light b "20 is incident on the light receiving element 388 for the power monitor. On the other hand, the transmitted light b "21 of the reflected light b" 18 incident on the beam splitter 385 for detecting azimus rotation passes through the polarizing plate 386 for detecting azimus rotation and then incidents on the light receiving element 389 for angle measurement.

角度測定用受光素子389は、アジマス補正用偏光板383とアジマス回転検出用偏光板386の角度差を読み取り、アジマス角度を測定する。アジマスが回転するとリサージュが歪み、当該歪みが計測誤差の要因となるため、その補正をする必要がある。その際に、アジマスの角度ズレ量が事前に分かっていれば補正が行えるため、アジマス角度の検出機能が必要となる。そこで、本実施形態では、相対位置検出用受光部320に反射光に対してアジマス補正を行うアジマス補正部380を設けている。このため、偏光板383、386を透過した反射光の角度差による差分が修正されて、より高精度な変位検出が可能になる。なお、本実施形態における変位検出装置300の相対位置検出手段310の他の構成要素、及び絶対位置検出手段340の構成、及び動作は、本発明の一実施形態の変形例に係る変位検出装置200と同様であるので、その説明は、省略する。 The light receiving element 389 for angle measurement reads the angle difference between the azimuth correction polarizing plate 383 and the azimuth rotation detecting polarizing plate 386, and measures the azimuth angle. When the azimuth rotates, the resage is distorted, and the distortion causes a measurement error, so it is necessary to correct it. At that time, if the amount of azimuth angle deviation is known in advance, correction can be performed, so a function for detecting the azimuth angle is required. Therefore, in the present embodiment, the light receiving unit 320 for relative position detection is provided with an azimuth correction unit 380 that corrects the azimuth of the reflected light. Therefore, the difference due to the angle difference of the reflected light transmitted through the polarizing plates 383 and 386 is corrected, and more accurate displacement detection becomes possible. The configuration and operation of the other components of the relative position detecting means 310 of the displacement detecting device 300 and the absolute position detecting means 340 in the present embodiment are the displacement detecting device 200 according to the modification of the embodiment of the present invention. Since it is the same as the above, the description thereof will be omitted.

なお、上記のように本発明の各実施形態について詳細に説明したが、本発明の新規事項及び効果から実体的に逸脱しない多くの変形が可能であることは、当業者には、容易に理解できるであろう。従って、このような変形例は、全て本発明の範囲に含まれるものとする。 Although each embodiment of the present invention has been described in detail as described above, those skilled in the art can easily understand that many modifications that do not substantially deviate from the new matters and effects of the present invention are possible. You can do it. Therefore, all such modifications are included in the scope of the present invention.

例えば、明細書又は図面において、少なくとも一度、より広義又は同義な異なる用語と共に記載された用語は、明細書又は図面のいかなる箇所においても、その異なる用語に置き換えることができる。また、変位検出装置及び相対位置検出手段の構成、動作も本発明の各実施形態で説明したものに限定されず、種々の変形実施が可能である。 For example, a term described at least once in a specification or drawing with a different term in a broader or synonymous manner may be replaced by that different term anywhere in the specification or drawing. Further, the configuration and operation of the displacement detecting device and the relative position detecting means are not limited to those described in each embodiment of the present invention, and various modifications can be carried out.

10 被測定物、100、200、300 変位検出装置、102、202、302 光源、104、204 第1のレンズ、106、255 偏光子、108、208 光源側ビームスプリッタ、110、210、310 相対位置検出手段、112 ターゲット、114、244、344 反射物、116、216、316 複屈折部材、116a 先端、116a´ 基端、116b 底面、120、220、320 相対位置検出用受光部、121、221、321 ビームスプリッタ、122、222、322 第1の偏光ビームスプリッタ、123、223、323 第1の受光素子、124、224、324 第2の受光素子、125、225、325 1/4波長板、126、226、326 第2の偏光ビームスプリッタ、127、227、327 第3の受光素子、128、228、328 第4の受光素子、129、229 補正プリズム、130 相対位置情報出力部、131 第1の差動増幅器、132 第2の差動増幅器、133 第1のA/D変換器、134 第2のA/D変換器、135 波形補正処理部、136 インクリメンタル信号発生器、140、240、340 絶対位置検出手段、142、242、342 ミラー、144 プリズム、146、246、346 可変反射膜、150 絶対位置検出用受光部、151、251、351 第2のレンズ、152、252、352 第5の受光素子、153、253、353 第3のレンズ、154、254、354 第6の受光素子、160 絶対位置情報出力部、161 第1の絶対位置情報演算器、162 第2の絶対位置情報演算器、163 比較器、164 加算器、165 絶対位置変換器、170 絶対位置信号発生器、230 偏光板、380 アジマス補正部 10 Subject, 100, 200, 300 Displacement detector, 102, 202, 302 Light source, 104, 204 First lens, 106, 255 Polarizer, 108, 208 Light source side beam splitter, 110, 210, 310 Relative position Detection means, 112 target, 114, 244, 344 reflector, 116, 216, 316 double polarizing member, 116a tip, 116a'base end, 116b bottom surface, 120, 220, 320 light receiving part for relative position detection, 121, 221 321 beam splitter, 122, 222, 322 first polarized beam splitter, 123, 223, 323 first light receiving element, 124, 224, 324 second light receiving element, 125, 225, 325 1/4 wave plate, 126. , 226, 326 Second polarizing beam splitter, 127, 227, 327 Third light receiving element, 128, 228, 328 Fourth light receiving element, 129, 229 Correction prism, 130 Relative position information output unit, 131 First Differential amplifier, 132 2nd differential amplifier, 133 1st A / D converter, 134 2nd A / D converter, 135 waveform correction processing unit, 136 incremental signal generator, 140, 240, 340 absolute Position detecting means, 142, 242, 342 mirror, 144 prism, 146, 246, 346 variable reflecting film, 150 light receiving part for absolute position detection, 151, 251, 351 second lens, 152, 252, 352 fifth light receiving Element, 153, 253, 353, 3rd lens, 154, 254, 354, 6th light receiving element, 160 absolute position information output unit, 161 first absolute position information calculator, 162 second absolute position information calculator, 163 Comparer, 164 Adder, 165 Absolute Position Converter, 170 Absolute Position Signal Generator, 230 Polarizing Plate, 380 Azimas Correction Unit

Claims (9)

被測定物の計測方向の変位の相対位置を光学的に検出する相対位置検出手段であって、
前記被測定物に載置され、光源から光が照射されるターゲットと、
前記光に対する前記ターゲットでの反射光の偏光状態を変化させて受光する相対位置検出用受光部と、
前記相対位置検出用受光部で受光した前記反射光の偏光状態の変化に基づいて前記ターゲットの前記計測方向の変位に基づく相対位置情報を出力する相対位置情報出力部と、を備え、
前記ターゲットには、
前記被測定物に載置される反射物と、
前記反射物の上に設けられ、前記計測方向に沿って先端から基端への厚さが変化する複屈折部材が設けられ、
前記複屈折部材は、底面の基端側を中心として該底面の先端側が前記反射物に対して回動可能に構成されていることを特徴とする相対位置検出手段。
It is a relative position detecting means that optically detects the relative position of the displacement of the object to be measured in the measurement direction.
A target placed on the object to be measured and irradiated with light from a light source,
A light receiving unit for relative position detection that changes the polarization state of the reflected light at the target with respect to the light and receives light.
A relative position information output unit that outputs relative position information based on the displacement of the target in the measurement direction based on the change in the polarization state of the reflected light received by the light receiving unit for relative position detection is provided.
The target is
A reflective object placed on the object to be measured and
A birefringent member provided on the reflector and whose thickness changes from the tip end to the base end along the measurement direction is provided.
The birefringent member is a relative position detecting means, characterized in that the tip end side of the bottom surface is rotatably configured with respect to the reflecting object, with the base end side of the bottom surface as the center.
前記相対位置検出用受光部は、前記ターゲットの前記計測方向への移動に伴い前記反射光の偏光状態の変化を検出し、
前記相対位置情報出力部は、前記反射光の偏光状態の変化を光電変換して得らえた信号に基づいて前記ターゲットの前記相対位置情報を出力することを特徴とする請求項1に記載の相対位置検出手段。
The light receiving unit for relative position detection detects a change in the polarization state of the reflected light as the target moves in the measurement direction.
The relative position information output unit according to claim 1, wherein the relative position information output unit outputs the relative position information of the target based on a signal obtained by photoelectric conversion of a change in the polarization state of the reflected light. Position detection means.
前記相対位置検出用受光部は、
前記反射光を2つに分岐するビームスプリッタと、
前記ビームスプリッタで分岐された一方の反射光のS成分を反射させてP成分を透過させる第1の偏光ビームスプリッタと、
前記第1の偏光ビームスプリッタの透過光を受光する第1の受光素子と、
前記第1の偏光ビームスプリッタの反射光を受光する第2の受光素子と、
前記ビームスプリッタで分岐された他方の反射光のS成分を反射させてP成分を透過させる第2の偏光ビームスプリッタと、
前記ビームスプリッタと前記第2の偏光ビームスプリッタとの間に介在される1/4波長板と、
前記第2の偏光ビームスプリッタの反射光を受光する第3の受光素子と、
前記第2の偏光ビームスプリッタの透過光を受光する第4の受光素子と、を備えることを特徴とする請求項1又は2に記載の相対位置検出手段。
The light receiving unit for relative position detection is
A beam splitter that splits the reflected light into two, and
A first polarizing beam splitter that reflects the S component of one of the reflected lights branched by the beam splitter and transmits the P component,
A first light receiving element that receives the transmitted light of the first polarizing beam splitter, and
A second light receiving element that receives the reflected light of the first polarizing beam splitter, and
A second polarization beam splitter that reflects the S component of the other reflected light branched by the beam splitter and transmits the P component.
A quarter wave plate interposed between the beam splitter and the second polarization beam splitter,
A third light receiving element that receives the reflected light of the second polarizing beam splitter, and
The relative position detecting means according to claim 1 or 2, further comprising a fourth light receiving element that receives the transmitted light of the second polarizing beam splitter.
前記複屈折部材は、前記計測方向に沿って複数の異なる部材が並列して構成されるか、又は前記光の入射方向に沿って複数の異なる部材が積層されて構成されることを特徴とする請求項1乃至3の何れか1項に記載の相対位置検出手段。 The birefringent member is characterized in that a plurality of different members are configured in parallel along the measurement direction, or a plurality of different members are laminated along the incident direction of the light. The relative position detecting means according to any one of claims 1 to 3. 前記複屈折部材は、結晶軸の方向が異なる複数の部材が前記光の入射方向に沿って積層されて構成されることを特徴とする請求項4に記載の相対位置検出手段。 The relative position detecting means according to claim 4, wherein the birefringent member is configured by laminating a plurality of members having different crystal axis directions along the incident direction of the light. 前記光源に対する前記複屈折部材の前段側又は後段側の何れかに補正プリズムが設けられていることを特徴とする請求項1乃至5の何れか1項に記載の相対位置検出手段。 The relative position detecting means according to any one of claims 1 to 5, wherein a correction prism is provided on either the front stage side or the rear stage side of the birefringence member with respect to the light source. 前記相対位置検出用受光部が前記計測方向に沿って2つ設けられており、それぞれの相対位置検出用受光部で検出した前記反射光の偏光状態の位相変動量の差分に基づいて波長変動量を推定して補正することを特徴とする請求項1乃至6の何れか1項に記載の相対位置検出手段。 Two light receiving units for relative position detection are provided along the measurement direction, and the wavelength fluctuation amount is based on the difference in the phase fluctuation amount of the polarization state of the reflected light detected by the light receiving units for relative position detection. The relative position detecting means according to any one of claims 1 to 6, wherein the relative position detecting means is estimated and corrected. 前記光源と前記複屈折部材との間に偏光板が更に設けられることを特徴とする請求項1乃至7の何れか1項に記載の相対位置検出手段。 The relative position detecting means according to any one of claims 1 to 7, wherein a polarizing plate is further provided between the light source and the birefringent member. 前記相対位置検出用受光部には、前記反射光に対してアジマス補正を行うアジマス補正部が更に設けられることを特徴とする請求項1乃至8の何れか1項に記載の相対位置検出手段。 The relative position detecting means according to any one of claims 1 to 8, wherein the light receiving unit for relative position detection is further provided with an azimuth correction unit that corrects azimuth with respect to the reflected light.
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