JP7093082B2 - 磁場計測装置 - Google Patents
磁場計測装置 Download PDFInfo
- Publication number
- JP7093082B2 JP7093082B2 JP2019519100A JP2019519100A JP7093082B2 JP 7093082 B2 JP7093082 B2 JP 7093082B2 JP 2019519100 A JP2019519100 A JP 2019519100A JP 2019519100 A JP2019519100 A JP 2019519100A JP 7093082 B2 JP7093082 B2 JP 7093082B2
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- Prior art keywords
- magnetic field
- magnetic
- superconductor
- magnetic sensor
- sensor
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
- G01R33/0082—Compensation, e.g. compensating for temperature changes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/063—Magneto-impedance sensors; Nanocristallin sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/096—Magnetoresistive devices anisotropic magnetoresistance sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/098—Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Toxicology (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Measuring Magnetic Variables (AREA)
Description
(1)磁気センサは、第1の磁場空間形成手段と第2の磁場空間形成手段の間に配置していること。
(2)磁気センサを挿通可能としたスリットを備えた基体を有し、このスリットを挟んで第1の磁場空間形成手段と第2の磁場空間形成手段を設けていること。
(3)基体上で、第1の磁場空間形成手段と第2の磁場空間形成手段とが一体化されていること。
(4)磁気センサが、ホール素子、磁気インピーダンス素子、磁気抵抗素子のいずれかであること。
(5)磁場空間形成手段は超伝導コイルであって、磁気センサは、超伝導コイルに生じた遮蔽電流によって生成される磁場を計測すること。
(6)超伝導コイルの一部に常伝導体を介設していること。
図1に第1実施形態の磁場計測装置の要部であるセンサ部を示す。図1において、符号1-1は磁気センサであり、符号2-1は超伝導体である。
本発明の磁場計測装置では、超伝導体が超伝導状態となることで生じる磁束の集中を利用することで、「感度」及び「磁場分解能」を向上させた磁場計測装置としているが、磁束の集中させることができるのであれば、どのような方法を用いることもできる。
上述した第1実施形態では、超伝導状態による磁場の遮蔽効果を利用して集中させた磁場の大きさを磁気センサで測定していたが、磁場の遮蔽効果によって超伝導体に生じる遮蔽電流の変動を検出することで、磁場の変動を検出することもできる。特に、この場合には、超伝導体に生じた遮蔽電流の変動を、この遮蔽電流の変動によって生じる磁場の大きさの変動として測定することで、磁場を計測することができる。
上述した実施形態では、いずれの場合も絶対磁場を計測することを想定した磁場計測装置であるが、例えば地磁気の変動だけを高感度に計測することも求められている分野もある。
L:超伝導コイル3-2の自己インダクタンス
R:常伝導体4の抵抗
τ(=L/ R):超伝導コイル3-2の時定数
r:超伝導コイル3-2の半径
とすると、超伝導コイル3-2のインダクタンスと抵抗値の関係から、超伝導コイル3-2に生じる遮蔽電流In(t)は、下式で表される。
1-2 磁気センサ
1-3 磁気センサ
1-4 磁気センサ
2-1 超伝導体
2-2 超伝導体
3-1 超伝導コイル
3-2 超伝導コイル
4 常伝導体
Claims (5)
- 超伝導体が超伝導状態となる極低温の状態を維持する温度維持手段と、
この温度維持手段内に設けて磁場を検出する磁気センサと、
前記温度維持手段内で超伝導状態となることで超伝導状態に特有の磁場空間を形成する磁場空間形成手段と
を有し、前記磁気センサを前記磁場空間内に配置し、
前記磁気センサは、第1の磁場空間形成手段と第2の磁場空間形成手段の間に配置し、
前記磁気センサを挿通可能としたスリットを備えた基体を有し、このスリットを挟んで前記第1の磁場空間形成手段と前記第2の磁場空間形成手段を設けている磁場計測装置。 - (削除)
- (削除)
- 前記基体上で、前記第1の磁場空間形成手段と前記第2の磁場空間形成手段とが一体化されている請求項1に記載の磁場計測装置。
- 前記磁気センサが、ホール素子、磁気インピーダンス素子、磁気抵抗素子のいずれかである請求項1または4に記載の磁場計測装置。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017100227 | 2017-05-19 | ||
| JP2017100227 | 2017-05-19 | ||
| PCT/JP2018/013670 WO2018211833A1 (ja) | 2017-05-19 | 2018-03-30 | 磁場計測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2018211833A1 JPWO2018211833A1 (ja) | 2020-04-09 |
| JP7093082B2 true JP7093082B2 (ja) | 2022-06-29 |
Family
ID=64273958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019519100A Expired - Fee Related JP7093082B2 (ja) | 2017-05-19 | 2018-03-30 | 磁場計測装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US11275128B2 (ja) |
| JP (1) | JP7093082B2 (ja) |
| WO (1) | WO2018211833A1 (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109799467B (zh) * | 2019-01-31 | 2021-04-27 | 北京大学 | 无需伸杆的空间磁场测量装置、测量系统及测量方法 |
| CN116484788B (zh) * | 2023-04-26 | 2023-11-14 | 北京航空航天大学 | 一种磁屏蔽装置消磁过程的建模方法及系统 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010032368A (ja) | 2008-07-29 | 2010-02-12 | Nippon Telegr & Teleph Corp <Ntt> | 磁場分布測定装置 |
| JP2011226819A (ja) | 2010-04-15 | 2011-11-10 | National Institute Of Advanced Industrial & Technology | 電流比較器 |
| JP2013130471A (ja) | 2011-12-21 | 2013-07-04 | International Superconductivity Technology Center | 高温超電導磁気センサ |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01288722A (ja) | 1988-05-16 | 1989-11-21 | Canon Inc | 超電導体を用いたエンコーダ |
| JPH06194434A (ja) | 1992-12-24 | 1994-07-15 | Hitachi Ltd | スクイド磁束計 |
| EP0699922A2 (en) * | 1994-08-29 | 1996-03-06 | International Business Machines Corporation | Method to improve performance of a superconducting magnetometer in a magnetic field |
| US6307369B1 (en) * | 2000-07-12 | 2001-10-23 | Mayo Foundation For Medical Education And Research | Autocorrection of 3D MR images for motion artifacts |
| US7437188B2 (en) * | 2005-02-18 | 2008-10-14 | Mayo Foundation For Medical Education And Research | Method for reducing artifacts in magnetic resonance images acquired with continuous table motion |
| US8483457B2 (en) * | 2010-07-07 | 2013-07-09 | General Electric Company | System and method of image artifact reduction using self-navigated real-time phase correction in echo planar imaging |
| US10495717B2 (en) * | 2014-08-25 | 2019-12-03 | The General Hospital Corporation | System and method for dual-kernel image reconstruction |
-
2018
- 2018-03-30 WO PCT/JP2018/013670 patent/WO2018211833A1/ja not_active Ceased
- 2018-03-30 JP JP2019519100A patent/JP7093082B2/ja not_active Expired - Fee Related
- 2018-03-30 US US16/614,884 patent/US11275128B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010032368A (ja) | 2008-07-29 | 2010-02-12 | Nippon Telegr & Teleph Corp <Ntt> | 磁場分布測定装置 |
| JP2011226819A (ja) | 2010-04-15 | 2011-11-10 | National Institute Of Advanced Industrial & Technology | 電流比較器 |
| JP2013130471A (ja) | 2011-12-21 | 2013-07-04 | International Superconductivity Technology Center | 高温超電導磁気センサ |
Also Published As
| Publication number | Publication date |
|---|---|
| US20200110140A1 (en) | 2020-04-09 |
| JPWO2018211833A1 (ja) | 2020-04-09 |
| US11275128B2 (en) | 2022-03-15 |
| WO2018211833A1 (ja) | 2018-11-22 |
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