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JP7110599B2 - Electronics - Google Patents
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JP7110599B2 - Electronics - Google Patents

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JP7110599B2
JP7110599B2 JP2018005376A JP2018005376A JP7110599B2 JP 7110599 B2 JP7110599 B2 JP 7110599B2 JP 2018005376 A JP2018005376 A JP 2018005376A JP 2018005376 A JP2018005376 A JP 2018005376A JP 7110599 B2 JP7110599 B2 JP 7110599B2
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housing
component
electronic
temperature
electronic device
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JP2019125701A (en
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敦 荻野
宏之 新井
俊之 増田
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Oki Electric Industry Co Ltd
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Oki Electric Industry Co Ltd
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Description

本発明は、電子機器に関する。 The present invention relates to electronic equipment.

特許文献1において、ヒートシンクと放熱板との間、および基板と放熱板との間にバイメタルが配置され、電子装置内の温度が上昇すると、これらのバイメタルが各放熱板に接触し、CPU等の電子部品で発生した熱が各放熱板を介して筐体外部に放散されることが記載されている。 In Patent Document 1, bimetals are arranged between a heat sink and a radiator plate and between a substrate and a radiator plate. It is described that the heat generated by the electronic components is dissipated to the outside of the housing through each heat sink.

特開2009-193350号公報JP 2009-193350 A

上記の従来技術では、スイッチングされる放熱経路に厚さが薄いバイメタルが含まれているため、熱抵抗が大きくなってしまい放熱性が十分に確保できないという問題点があった。 In the above-described prior art, since a thin bimetal is included in the heat dissipation path to be switched, there is a problem that heat resistance is increased and heat dissipation cannot be sufficiently ensured.

本発明は、以上の従来技術の問題点に鑑みなされたものであり、内部の電子部品からの熱の放熱性を十分に確保すると共に、電子部品の耐低温性を改善できる電子機器を提供することを目的とする。 SUMMARY OF THE INVENTION The present invention has been devised in view of the above-described problems of the prior art, and provides an electronic device capable of ensuring sufficient heat dissipation from internal electronic components and improving the low-temperature resistance of the electronic components. for the purpose.

本発明の電子機器は、電子部品を担持する部品担持アセンブリと、前記部品担持アセンブリを支持する支持機構と、前記部品担持アセンブリおよび前記支持機構を囲む中空の筐体と、を含む電子機器であって、
前記筐体の内部において前記電子部品に対向して配置された熱伝導体を備え、
前記支持機構は、所定温度を越える前記筐体内の温度において前記電子部品を前記熱伝導体に接触させ、前記所定温度以下の前記筐体内の温度において前記電子部品を前記熱伝導体から非接触とさせるように、前記部品担持アセンブリを位置決めする感温アクチュエータを有することを特徴とする。
An electronic device according to the present invention is an electronic device including a component carrier assembly that carries an electronic component, a support mechanism that supports the component carrier assembly, and a hollow housing surrounding the component carrier assembly and the support mechanism. hand,
A heat conductor disposed inside the housing facing the electronic component,
The support mechanism brings the electronic component into contact with the heat conductor at a temperature inside the housing that exceeds a predetermined temperature, and keeps the electronic component out of contact with the heat conductor at a temperature inside the housing that is equal to or lower than the predetermined temperature. and a temperature sensitive actuator for positioning the component carrier assembly so as to allow the component carrier assembly to be actuated.

本発明によれば、電子機器において前記感温アクチュエータを有する故に、放熱性を十分に確保すると共に電子部品の耐低温性を改善できる効果が得られる。 According to the present invention, since the electronic device includes the temperature-sensitive actuator, it is possible to obtain the effect of ensuring sufficient heat dissipation and improving the low-temperature resistance of the electronic component.

本発明による実施例1である電子機器を示す概略分解斜視図である。1 is a schematic exploded perspective view showing an electronic device that is Embodiment 1 according to the present invention; FIG. 実施例1の電子機器の外観を示す蓋体側から見た斜視図である。FIG. 2 is a perspective view showing the appearance of the electronic device of Example 1 as viewed from the lid side; 図2の線xxにおける電子機器の概略断面図である。3 is a schematic cross-sectional view of the electronic device taken along line xx in FIG. 2; FIG. 本発明による実施例1の電子機器の概略断面図である。1 is a schematic cross-sectional view of an electronic device of Example 1 according to the present invention; FIG. 本発明による実施例2の電子機器の概略断面図である。2 is a schematic cross-sectional view of an electronic device of Example 2 according to the present invention; FIG. 本発明による実施例2の電子機器の概略断面図である。2 is a schematic cross-sectional view of an electronic device of Example 2 according to the present invention; FIG. 本発明による実施例3の電子機器の概略断面図である。3 is a schematic cross-sectional view of an electronic device of Example 3 according to the present invention; FIG. 本発明による実施例3の電子機器の概略断面図である。3 is a schematic cross-sectional view of an electronic device of Example 3 according to the present invention; FIG. 本発明による実施例4の電子機器の概略断面図である。It is a schematic sectional view of the electronic device of Example 4 by this invention. 本発明による実施例4の電子機器の概略断面図である。It is a schematic sectional view of the electronic device of Example 4 by this invention. 本発明による実施例5の電子機器の概略断面図である。It is a schematic sectional view of the electronic device of Example 5 by this invention. 本発明による実施例5の電子機器の概略断面図である。It is a schematic sectional view of the electronic device of Example 5 by this invention.

以下、図面を参照しつつ本発明による実施例の電子機器について説明する。なお、本発明は以下の実施例に限定されるものではない。なお、実施例において、実質的に同一の機能および構成を有する構成要素については、同一の符号を付することにより重複説明を省略する。 Electronic devices according to embodiments of the present invention will be described below with reference to the drawings. In addition, the present invention is not limited to the following examples. In addition, in the embodiments, components having substantially the same functions and configurations are denoted by the same reference numerals, thereby omitting redundant description.

(構成の説明)
図1は、実施例1である電子機器11を示す概略分解斜視図である。図2は、実施例1の電子機器の筐体12の外観を示す蓋体側から見た概略斜視図(内部の一部を破線で示してある)である。図3は、図2の線xxにおける電子機器11の断面を示す概略断面図である。
(Description of configuration)
FIG. 1 is a schematic exploded perspective view showing an electronic device 11 that is Embodiment 1. FIG. FIG. 2 is a schematic perspective view (a part of the inside is indicated by a dashed line) showing the appearance of the housing 12 of the electronic device of Example 1, viewed from the lid side. FIG. 3 is a schematic cross-sectional view showing a cross section of the electronic device 11 taken along line xx in FIG.

図1~図3に示すように、実施例1の電子機器11の筐体12は略長方体形状の外観を有している。図に示すように、筐体12(蓋体13および筐体本体14)内に電子回路基板15(部品担持アセンブリ)が収容されている。なお、図中の電子回路基板15には種々の電子部品が搭載され電子回路が構成されているが、説明を簡略するために、動作中に熱を発生する電子部品16を下面に片面実装して、他の電子部品を省略して示している。一対の筒箱状の蓋体13および筐体本体14がそれぞれの開口部において互いに嵌合されて筐体12を構成し、筐体12は、その内側において電子回路基板15を支持し位置決めする支持機構17(バイアスバネ18およびバイメタルストリップ19)を収容する。なお、図示しないが、筐体本体14および蓋体13のそれぞれの開口部の対向面の間にパッキンを挟み込ませて、ネジ等(図示せず)により締結され、筐体本体14に蓋体13が固着される。 As shown in FIGS. 1 to 3, the housing 12 of the electronic device 11 of Example 1 has a substantially rectangular parallelepiped appearance. As shown in the figure, an electronic circuit board 15 (component support assembly) is accommodated in a housing 12 (lid 13 and housing body 14). Various electronic components are mounted on the electronic circuit board 15 in the figure to form an electronic circuit. , other electronic components are omitted. A pair of cylindrical box-shaped lid 13 and housing body 14 are fitted together at their respective openings to form housing 12, and housing 12 supports and positions electronic circuit board 15 inside thereof. It houses the mechanism 17 (bias spring 18 and bimetallic strip 19). Although not shown, packing is sandwiched between the facing surfaces of the openings of the housing body 14 and the lid body 13, and the housing body 14 and the lid body 13 are fastened with screws or the like (not shown). is fixed.

筐体本体14の内壁(底面)には、金属等からなる放熱板21が、電子回路基板15の電子部品16に対向するように設けられており、その放熱板21の上に電子部品16に対向するように柔軟性を有する熱伝導シート22が設けられている。放熱板21および熱伝導シート22は、電子部品16が熱伝導シート22に接触した場合の電子部品16で発生した熱が筐体本体14に放熱されるための熱伝導体23を構成する(図3)。熱伝導シート22は、発熱する素子とヒートシンクとの間の小さな隙間や凸凹を埋め、効率よく熱をヒートシンクに伝えるサーマルインターフェースマテリアル(Thermal Interface Material)部材である。 A radiator plate 21 made of metal or the like is provided on the inner wall (bottom surface) of the housing body 14 so as to face the electronic components 16 of the electronic circuit board 15 . Thermal conductive sheets 22 having flexibility are provided so as to face each other. The heat sink 21 and the heat conductive sheet 22 form a heat conductor 23 for dissipating heat generated by the electronic component 16 to the housing body 14 when the electronic component 16 contacts the heat conductive sheet 22 (see FIG. 3). The heat-conducting sheet 22 is a thermal interface material member that fills small gaps and irregularities between the heat-generating element and the heat sink and efficiently transfers heat to the heat sink.

支持機構17のバイアスバネ18(コイルスプリング等の弾性部材)は、電子回路基板15の下面の縁部を支持するように筐体本体14の内壁(底面)に設けられている。バイアスバネ18と電子回路基板15のアライメントを取るために、筐体本体14の底面には各バイアスバネ18の下端が嵌合する環状溝(図示せず)、電子回路基板15の下面には各バイアスバネ18の上端が嵌合する環状溝15aがそれぞれ設けられている(図1)。 A bias spring 18 (an elastic member such as a coil spring) of the support mechanism 17 is provided on the inner wall (bottom surface) of the housing body 14 so as to support the edge of the lower surface of the electronic circuit board 15 . In order to align the bias springs 18 and the electronic circuit board 15, the bottom surface of the housing body 14 is provided with annular grooves (not shown) into which the lower ends of the respective bias springs 18 are fitted. An annular groove 15a into which the upper end of the bias spring 18 is fitted is provided (FIG. 1).

支持機構17のバイメタルストリップ19は、電子回路基板15の上面の縁部を支持するように筐体本体14の側壁に設けられている。対向するバイアスバネ18とバイメタルストリップ19の一組の4対は、電子回路基板15の周縁を囲むように設けられ、電子回路基板15を挟んで支持し位置決めしている。バイメタルストリップ19は、熱膨張率が相互に異なる2枚の金属板を主面同士で貼り合わせた短冊形状板体であり、自体の温度上昇によって2枚の金属板それぞれが伸び、高熱膨張率金属板が低熱膨張率金属板よりも大きく伸びることによって、全体が低熱膨張率金属板側に湾曲する。この湾曲特性を利用するために、バイメタルストリップ19の各々は、その一端の扇ほぞ形状の基部19aが筐体本体14の内壁(側壁)のほぞ穴14aに嵌合されネジ等(図示せず)により、片持ち梁形態で固定される(図1)。 A bimetal strip 19 of the support mechanism 17 is provided on the side wall of the housing body 14 so as to support the edge of the upper surface of the electronic circuit board 15 . A set of four pairs of bias springs 18 and bimetal strips 19 facing each other is provided so as to surround the periphery of the electronic circuit board 15 , supporting and positioning the electronic circuit board 15 therebetween. The bimetal strip 19 is a strip-shaped plate body in which two metal plates having different coefficients of thermal expansion are pasted together on their main surfaces. As the plate expands more than the low thermal expansion metal plate, the whole bends toward the low thermal expansion metal plate. In order to utilize this curving characteristic, each of the bimetal strips 19 is fitted with a fan-tenon-shaped base 19a at one end thereof into a mortise hole 14a in the inner wall (side wall) of the housing body 14 and screwed (not shown). is fixed in a cantilever configuration (Fig. 1).

バイメタルストリップ19は、筐体12内の温度上昇に応じて、その他端(自由端)が電子回路基板15を熱伝導シート22に向かう下方向(第一方向)に付勢するように、配置される。一方、バイアスバネ18は、電子回路基板15および筐体本体14の底面の間に配置(好ましくはバイメタルストリップ19の自由端の近傍)され、且つ、電子部品16を熱伝導シート22から離す上方向(第一方向の逆方向)に付勢する。すなわち、支持機構17(バイメタルストリップ19とバイアスバネ18)は、電子回路基板15を表裏から挟みつつ支持し、筐体内温度に応じてバイメタルストリップ19が上下方向に電子回路基板15を移動する感温アクチュエータとして機能する。 The bimetal strip 19 is arranged such that the other end (free end) of the bimetal strip 19 urges the electronic circuit board 15 downward (first direction) toward the thermally conductive sheet 22 as the temperature inside the housing 12 rises. be. On the other hand, the bias spring 18 is arranged between the electronic circuit board 15 and the bottom surface of the housing body 14 (preferably near the free end of the bimetallic strip 19), and is directed upwardly to separate the electronic component 16 from the thermally conductive sheet 22. (opposite direction of the first direction). That is, the support mechanism 17 (bimetal strip 19 and bias spring 18) supports the electronic circuit board 15 while sandwiching it from the front and back. Acts as an actuator.

また、電子回路基板15に対向する筐体本体14の底面には、電子回路基板15の移動を抑制する抑止部STが設けられている。抑止部STは、温度上昇によってバイメタルストリップ19の自由端が付勢する電子回路基板15の下方向(第一方向)の移動量を規制するため、電子部品16が熱伝導シート22に強く押し付けられて破損してしまうことを防止する。なお、抑止部STおよび熱伝導体23(放熱板21および熱伝導シート22)の筐体本体14の底面からの高さ(厚さ)は、電子回路基板15の下面からの電子部品16の高さを考慮して、昇温動作時に熱伝導シート22に適宜圧力で接触して電子部品16で発生した熱が筐体本体14に放熱されるように、それぞれ設定されている。バイメタルストリップ19の材質・形状は、所定温度において、その自由端が電子回路基板15を抑止部STに当接させるように湾曲するようにそれぞれ設定されている。このように、支持機構17は、所定温度を越える温度において電子部品16を熱伝導シート22に接触させ、所定温度以下においては電子部品16と熱伝導シート22とが非接触となるように、電子回路基板15を位置決めする。 A restraining portion ST for restraining movement of the electronic circuit board 15 is provided on the bottom surface of the housing body 14 facing the electronic circuit board 15 . The restraining portion ST regulates the amount of downward (first direction) movement of the electronic circuit board 15 urged by the free end of the bimetal strip 19 due to temperature rise, so that the electronic component 16 is strongly pressed against the heat conductive sheet 22 . to prevent it from being damaged. The height (thickness) of the restraining portion ST and the heat conductor 23 (the heat sink 21 and the heat conductive sheet 22) from the bottom surface of the housing body 14 is equal to the height of the electronic component 16 from the bottom surface of the electronic circuit board 15. In consideration of this, each setting is made so that the heat generated by the electronic component 16 is radiated to the housing main body 14 by contacting the heat conductive sheet 22 with appropriate pressure during the temperature raising operation. The material and shape of the bimetal strip 19 are set so that the free end of the bimetal strip 19 curves at a predetermined temperature so as to bring the electronic circuit board 15 into contact with the restraining portion ST. In this way, the support mechanism 17 keeps the electronic component 16 in contact with the heat conductive sheet 22 at a temperature exceeding a predetermined temperature, and keeps the electronic component 16 out of contact with the heat conductive sheet 22 at a temperature not higher than the predetermined temperature. Position the circuit board 15 .

蓋体13および筐体本体14の筐体用樹脂材料としては、ABS(アクリルニトリルブタジエンスチレン)、ASA(アクリレートスチレンアクリルニトリル)、AES(アクリロニトリルエチレン-プロピレン-ジエンスチレン)等のエンジニアリングプラスチックが挙げられる。また、蓋体13および筐体本体14は、金属材料を用いて形成されてもよい。 Examples of housing resin materials for the lid 13 and housing body 14 include engineering plastics such as ABS (acrylonitrile-butadiene-styrene), ASA (acrylate-styrene-acrylonitrile), and AES (acrylonitrile-ethylene-propylene-diene-styrene). . Moreover, the lid 13 and the housing main body 14 may be formed using a metal material.

なお、図示しないが、筐体12には、外部接続端子を介して電子回路を動作させるための外部の給電ケーブルや入出力ケーブル等を通過させるための接続孔が側壁の一部において設けられている。 Although not shown, the housing 12 is provided with a connection hole in a part of the side wall for passing an external power supply cable, an input/output cable, etc. for operating an electronic circuit via an external connection terminal. there is

(動作の説明)
図4は、電子回路基板15を支持する低温時のバイメタルストリップ19の変形前における電子部品16と熱伝導シート22とが非接触となる状態を示している。なお、図3は電子回路基板15を付勢する高温時のバイメタルストリップ19の変形後における電子部品16が熱伝導シート22に接触する状態を示す。
(Description of operation)
FIG. 4 shows a state in which the electronic component 16 and the thermally conductive sheet 22 are out of contact before the bimetal strip 19 supporting the electronic circuit board 15 is deformed at low temperature. 3 shows a state in which the electronic component 16 is in contact with the heat conductive sheet 22 after the bimetal strip 19 is deformed at a high temperature for urging the electronic circuit board 15. As shown in FIG.

図4のように外気温・筐体内温度が低く、バイメタルストリップ19が変形していない状態では、バイアスバネ18の反力によって電子部品16と熱伝導シート22の間には隙間が開いており、両者は熱的に分離されている。そのため、外気温の影響で筐体12が低温になっても電子部品16の自己発熱によって電子部品16の温度が過剰に低下することを防ぐことができる。外気温が高くなるとバイメタルストリップ19が変形し、電子回路基板15を押し込むことによって図3の状態へ遷移する。筐体本体14の底面の抑止部STは、電子部品16が熱伝導シート22に押し付けられる際に過剰な応力がかからないように、電子回路基板15の移動量を決定する。温度が高いとき電子部品16は熱伝導シート22に接触しているため、電子部品16で発生した熱が、熱伝導シート22を通して放熱板21へと伝わる。そのため、電子部品16の温度上昇を防ぐことができる。 As shown in FIG. 4, when the outside air temperature and the inside temperature of the housing are low and the bimetal strip 19 is not deformed, a gap is opened between the electronic component 16 and the heat conductive sheet 22 due to the reaction force of the bias spring 18. Both are thermally isolated. Therefore, even if the temperature of the housing 12 becomes low due to the influence of the outside air temperature, it is possible to prevent the temperature of the electronic components 16 from excessively decreasing due to the self-heating of the electronic components 16 . When the outside air temperature rises, the bimetal strip 19 deforms and pushes the electronic circuit board 15 into the state shown in FIG. The restraining portion ST on the bottom surface of the housing body 14 determines the amount of movement of the electronic circuit board 15 so that excessive stress is not applied when the electronic component 16 is pressed against the heat conductive sheet 22 . Since the electronic component 16 is in contact with the heat conductive sheet 22 when the temperature is high, the heat generated by the electronic component 16 is transferred to the heat dissipation plate 21 through the heat conductive sheet 22 . Therefore, the temperature rise of the electronic component 16 can be prevented.

以上のように、実施例1によれば、外気温が低いときは、電子部品16と筐体12とが熱的に遮断されて電子部品16の温度低下を緩和し、外気温が高いときは、電子部品16と筐体12とが熱的に接続されて電子部品16の温度上昇を緩和するという効果が得られる。また、高温時は電子部品16の全面に熱伝導シート22を接触させることができ、さらに放熱板21との間に熱伝導シート22のみしか挟まないため、電子部品16から筐体12への熱抵抗を非常に小さくすることができる。 As described above, according to the first embodiment, when the outside air temperature is low, the electronic component 16 and the housing 12 are thermally isolated to alleviate the temperature drop of the electronic component 16, and when the outside temperature is high, , the electronic component 16 and the housing 12 are thermally connected to reduce the temperature rise of the electronic component 16 . In addition, when the temperature is high, the heat conductive sheet 22 can be brought into contact with the entire surface of the electronic component 16, and only the heat conductive sheet 22 is sandwiched between the heat sink 21 and the electronic component 16. resistance can be very small.

(構成の説明)
本実施例は、実施例1の筐体本体14の対向する側壁に設けられている一対のバイメタルストリップ19に代えて、図5に示すように、当該対向する側壁に垂直な筐体本体14の側壁に片持ち梁部CLTを設けて、その端部から一対のバイアスバネ18の上方まで伸長する一つのバイメタルストリップ19Aをその中央部で固定し、バイメタルストリップ19Aの両端が電子回路基板15を熱伝導シート22に向かう下方向(第一方向)に付勢する構成とした以外、実施例1と同一である。
(Description of configuration)
In this embodiment, instead of the pair of bimetal strips 19 provided on the opposing side walls of the housing body 14 of the first embodiment, as shown in FIG. A cantilever beam portion CLT is provided on the side wall, and one bimetal strip 19A extending from the end portion to above the pair of bias springs 18 is fixed at its center portion, and both ends of the bimetal strip 19A heat the electronic circuit board 15. It is the same as Example 1 except that it is configured to bias downward (first direction) toward the conductive sheet 22 .

(動作の説明)
図6は、電子回路基板15を支持する低温時のバイメタルストリップ19Aの変形前における電子部品16と熱伝導シート22とが非接触となる状態を示している。なお、図5は電子回路基板15を付勢する高温時のバイメタルストリップ19Aの変形後における電子部品16が熱伝導シート22に接触する状態を示す。
(Description of operation)
FIG. 6 shows a state in which the electronic component 16 and the heat conductive sheet 22 are out of contact before the bimetal strip 19A supporting the electronic circuit board 15 is deformed at low temperatures. 5 shows a state in which the electronic component 16 is in contact with the heat conductive sheet 22 after the bimetal strip 19A is deformed at a high temperature for urging the electronic circuit board 15. FIG.

以上のように、本実施例によれば、実施例1と同様の効果が得られると共に、バイメタルストリップ19Aを実施例1のものより長いものを利用できるゆえに、電子回路基板15の下方向(第一方向)への移動量を増大することができる。また、一組2本のバイメタルストリップを1本のバイメタルストリップに置き換えるので、筐体内の電子回路基板15の有効利用空間容積を増やす効果が得られる。 As described above, according to the present embodiment, the same effects as those of the first embodiment can be obtained, and a longer bimetal strip 19A than that of the first embodiment can be used. one direction) can be increased. In addition, since one set of two bimetal strips is replaced with one bimetal strip, the effect of increasing the effectively usable space volume of the electronic circuit board 15 in the housing can be obtained.

(構成の説明)
本実施例は、実施例1の筐体本体14の対向する側壁に設けられている一対のバイメタルストリップ19とこれに対応する一対のバイアスバネ18に代えて、図7に示すように、当該対向する側壁に掛け渡して、その両端が筐体12の対向側壁に固定された一つのバイメタルストリップ19Bを用いて、バイメタルストリップ19Bの中央が電子回路基板15を熱伝導シート22に向かう下方向(第一方向)に付勢し、バイメタルストリップ19Bの中央の下方に一つのバイアスバネ18Bを配置した構成とした以外、実施例1と同一である。
(Description of configuration)
In this embodiment, in place of the pair of bimetal strips 19 and the corresponding pair of bias springs 18 provided on the opposite side walls of the housing body 14 of the first embodiment, as shown in FIG. The center of the bimetal strip 19B extends over the side walls of the housing 12 and is fixed to the opposite side walls of the housing 12. 1 direction) and one bias spring 18B is arranged below the center of the bimetal strip 19B.

(動作の説明)
図8は、電子回路基板15を支持する低温時のバイメタルストリップ19Bの変形前における電子部品16と熱伝導シート22とが非接触となる状態を示している。なお、図7は電子回路基板15を付勢する高温時のバイメタルストリップ19Bの変形後における電子部品16が熱伝導シート22に接触する状態を示す。
(Description of operation)
FIG. 8 shows a state in which the electronic component 16 and the heat conductive sheet 22 are out of contact before the bimetal strip 19B supporting the electronic circuit board 15 is deformed at low temperatures. 7 shows a state in which the electronic component 16 is in contact with the heat conductive sheet 22 after the bimetal strip 19B is deformed at a high temperature for urging the electronic circuit board 15. FIG.

以上のように、本実施例によれば、実施例1と同様の効果が得られると共に、バイメタルストリップ19Bを実施例1のもの更に長いものを利用できるゆえに、電子回路基板15の下方向(第一方向)への移動量を増大することができる。また、一組2本のバイメタルストリップを1本のバイメタルストリップに置き換えるので、筐体内の電子回路基板15の有効利用空間容積を増やす効果が得られる。 As described above, according to the present embodiment, the same effects as those of the first embodiment can be obtained, and a longer bimetal strip 19B than that of the first embodiment can be used. one direction) can be increased. In addition, since one set of two bimetal strips is replaced with one bimetal strip, the effect of increasing the effectively usable space volume of the electronic circuit board 15 in the housing can be obtained.

(構成の説明)
本実施例は、実施例1の筐体本体14の対向する側壁に設けられている一対のバイメタルストリップ19に代えて、図9に示すように、一端が筐体12の底面に保持部25aを介して固定され他端が電子回路基板15に固定される形状記憶合金コイルバネ25を用いて、形状記憶合金コイルバネ25の当該他端が電子回路基板15を熱伝導シート22に向かう下方向(第一方向)に付勢する構成とした以外、実施例1と同一である。
(Description of configuration)
In this embodiment, instead of the pair of bimetal strips 19 provided on the opposite side walls of the housing body 14 of the first embodiment, one end of the bimetal strip 19 is provided on the bottom surface of the housing 12 as shown in FIG. The other end of the shape memory alloy coil spring 25 moves the electronic circuit board 15 downward toward the heat conductive sheet 22 (first It is the same as the first embodiment except that it is configured to urge in the direction ).

本実施例では、Ni-Ti合金、Cu-Zn-Al合金等の形状記憶合金が所定温度以下の低温側で軟らかく、所定温度を越える高温側で硬い性質を利用している。図9に示す支持機構17において、形状記憶合金コイルバネ25とこれに対向するバイアスバネ18(SUS等)が互いに押し合うように電子回路基板15を挟んでセットしてある。 In this embodiment, shape memory alloys such as Ni--Ti alloys and Cu--Zn--Al alloys are soft at low temperatures below a predetermined temperature and hard at high temperatures above a predetermined temperature. In the support mechanism 17 shown in FIG. 9, the electronic circuit board 15 is set so that the shape memory alloy coil spring 25 and the opposing bias spring 18 (such as SUS) press each other.

(動作の説明)
低温時(図10)、形状記憶合金コイルバネ25は軟らかいのでバイアスバネ18に付勢されて上方向に寄り電子部品16と熱伝導シート22とが非接触となる。そして、温度が上がる(図9)と、形状記憶合金コイルバネ25は強い力で元の形状に回復して伸び、バイアスバネ18を押し戻して下方向に電子回路基板15を動かし、電子部品16が熱伝導シート22に接触する状態となる。支持機構17は温度が下がる(図10)と再び上方向に電子回路基板15を動かし、温度に応じて全体として二方向性動作をする。
(Description of operation)
When the temperature is low (FIG. 10), the shape memory alloy coil spring 25 is soft and biased by the bias spring 18 to move upward, so that the electronic component 16 and the heat conductive sheet 22 are out of contact. Then, when the temperature rises (FIG. 9), the shape memory alloy coil spring 25 recovers its original shape with a strong force and expands, pushing back the bias spring 18 to move the electronic circuit board 15 downward, and the electronic component 16 heats up. It will be in contact with the conductive sheet 22 . The support mechanism 17 moves the electronic circuit board 15 upward again when the temperature drops (FIG. 10), and the overall bi-directional movement depends on the temperature.

以上のように、本実施例によれば、実施例1と同様の効果が得られる。さらに、バイメタルストリップは異種金属の張り合わせ板材なので、動作が張り合わせ面に直角の方向に限られるが、形状記憶合金は単一材なので材料自体に方向依存性がなく、その線材をコイルスプリング状に成形した形状記憶合金コイルバネ25によれば、バネ長動作ストロークを大幅に拡大できる。ゆえに、少ない体積の形状記憶合金コイルバネ25により電子回路基板15の下方向(第一方向)への移動量を増大することができ、筐体内の電子回路基板15の有効利用空間容積を増やす効果が得られる。 As described above, according to this embodiment, the same effects as those of the first embodiment can be obtained. In addition, since the bimetal strip is a plate made of different metals laminated together, the movement is limited to the direction perpendicular to the laminated surface, but since the shape memory alloy is a single material, the material itself has no direction dependency, and the wire is formed into a coil spring shape. With the shape memory alloy coil spring 25, the spring length operation stroke can be greatly increased. Therefore, the amount of movement of the electronic circuit board 15 in the downward direction (first direction) can be increased by the shape memory alloy coil spring 25 having a small volume, and the effect of increasing the effectively usable space volume of the electronic circuit board 15 in the housing is obtained. can get.

(構成の説明)
本実施例は、実施例4の保持部25aとこれに保持された形状記憶合金コイルバネ25に代えて、図11に示すように、形状記憶合金コイルバネ25Aをバイアスバネ18と同軸に電子回路基板15の下面に配置し、バイアスバネ18と同様に、一端が筐体12の底面に直接固定され他端が電子回路基板15に直接固定される構成とした以外、実施例1と同一である。
(Description of configuration)
In this embodiment, in place of the holding portion 25a and the shape memory alloy coil spring 25 held by the holding portion 25a of the fourth embodiment, a shape memory alloy coil spring 25A is mounted on the electronic circuit board 15 coaxially with the bias spring 18 as shown in FIG. , one end of which is directly fixed to the bottom surface of the housing 12 and the other end of which is directly fixed to the electronic circuit board 15 in the same manner as the bias spring 18 .

本実施例では、形状記憶合金コイルバネ25Aは図11に示すように元の形状(高温時)は縮んだ形状に回復するようにセットされている。所定温度以下の低温側で軟らかく伸び、所定温度を越える高温側で硬い性質を縮んだ形状に回復する。図11に示す支持機構17において、形状記憶合金コイルバネ25Aの各々はバイアスバネ18の各々と同軸で、電子回路基板15を担持するようにセットしてある。 In this embodiment, the shape memory alloy coil spring 25A is set so as to recover its original shape (when the temperature is high) to the shrunk shape as shown in FIG. It stretches softly on the low temperature side below a predetermined temperature, and recovers its hard property to a shrunk shape on the high temperature side above the predetermined temperature. In the support mechanism 17 shown in FIG. 11, each of the shape memory alloy coil springs 25A is coaxial with each of the bias springs 18 and is set to carry the electronic circuit board 15. As shown in FIG.

(動作の説明)
低温時(図12)、形状記憶合金コイルバネ25Aは軟らかいのでバイアスバネ18に伸ばされて電子部品16と熱伝導シート22とが非接触となる。そして、温度が上がる(図11)と、形状記憶合金コイルバネ25Aは強い力で形状回復して縮み、バイアスバネ18を圧縮して下方向に電子回路基板15を動かし、電子部品16が熱伝導シート22に接触する状態となる。支持機構17は温度が下がる(図12)と再び上方向に電子回路基板15を動かし、温度に応じて全体として二方向性動作をする。
(Description of operation)
When the temperature is low (FIG. 12), the shape memory alloy coil spring 25A is soft and is stretched by the bias spring 18 so that the electronic component 16 and the heat conductive sheet 22 are out of contact. Then, when the temperature rises (FIG. 11), the shape memory alloy coil spring 25A recovers its shape with a strong force and contracts, compressing the bias spring 18 to move the electronic circuit board 15 downward, and the electronic component 16 becomes a thermal conductive sheet. 22 is brought into contact. The support mechanism 17 moves the electronic circuit board 15 upward again when the temperature drops (FIG. 12), and the overall bi-directional movement depends on the temperature.

以上のように、本実施例によれば、実施例4と同様の効果が得られると共に、バイアスバネ18と同軸の形状記憶合金コイルバネ25Aを含む支持機構17により、支持機構17が小型化され、少ない体積で、筐体内の電子回路基板15の有効利用空間容積を増やす効果が得られる。 As described above, according to the present embodiment, the same effect as in the fourth embodiment can be obtained, and the support mechanism 17 including the shape memory alloy coil spring 25A coaxial with the bias spring 18 makes the support mechanism 17 compact. It is possible to obtain the effect of increasing the effective use space volume of the electronic circuit board 15 in the housing with a small volume.

上記実施例のいずれにおいても基板上に実装された電子部品に適用した例を説明したが、電源ユニット等の筐体内に収容する全ての発熱体にも適用可能である。また、上記実施例のいずれにおいても電子機器は、屋外に設置される電子機器に好適である。 In all of the above-described embodiments, examples of application to electronic components mounted on a substrate have been described, but the present invention can also be applied to all heat generating elements housed in a housing such as a power supply unit. Also, the electronic equipment in any of the above embodiments is suitable for electronic equipment installed outdoors.

また、上記実施例1~3では、コイルスプリング形状のバイアスバネ18を用いているが、これに代えてバイアスバネとして、筐体側壁に片持ち梁形状で形成された板バネの湾曲弾性を利用するものであってもよい。 Further, although the coil spring-shaped bias spring 18 is used in the first to third embodiments, the bending elasticity of a leaf spring formed in a cantilever shape on the side wall of the housing is used as the bias spring instead. It may be something to do.

11…電子機器
12…筐体
13…蓋体
14…筐体本体
15…電子回路基板
16…電子部品
17…支持機構
18…バイアスバネ
19…バイメタルストリップ
21…放熱板
22…熱伝導シート
23…熱伝導体
ST…抑止部
DESCRIPTION OF SYMBOLS 11... Electronic equipment 12... Case 13... Lid body 14... Case main body 15... Electronic circuit board 16... Electronic component 17... Support mechanism 18... Bias spring 19... Bimetal strip 21... Radiation plate 22... Thermal conductive sheet 23... Heat Conductor ST... Deterrence part

Claims (5)

電子部品を担持する部品担持アセンブリと、前記部品担持アセンブリを支持する支持機構と、前記部品担持アセンブリおよび前記支持機構を囲む中空の筐体と、を含む電子機器であって、
前記筐体の内部において前記電子部品に対向して配置された熱伝導体を備え、
前記支持機構は、所定温度を越える前記筐体内の温度において前記電子部品を前記熱伝導体に接触させ、前記所定温度以下の前記筐体内の温度において前記電子部品を前記熱伝導体から非接触とさせるように、前記部品担持アセンブリを位置決めする感温アクチュエータを有し、
前記感温アクチュエータは、中央又は両端が前記筐体の内壁に固定され且つ前記両端又は前記中央が前記部品担持アセンブリを前記熱伝導体に向かう第一方向に付勢するバイメタルストリップを有することを特徴とする電子機器。
An electronic device including a component carrying assembly that carries an electronic component, a support mechanism that supports the component carrying assembly, and a hollow housing that surrounds the component carrying assembly and the support mechanism,
A heat conductor disposed inside the housing facing the electronic component,
The support mechanism brings the electronic component into contact with the heat conductor at a temperature inside the housing that exceeds a predetermined temperature, and keeps the electronic component out of contact with the heat conductor at a temperature inside the housing that is equal to or lower than the predetermined temperature. a temperature sensitive actuator for positioning the component carrier assembly to allow
The temperature sensitive actuator comprises a bimetallic strip having a center or both ends fixed to the inner wall of the housing, the ends or the center biasing the component carrier assembly in a first direction toward the thermal conductor. and electronic devices.
前記支持機構は、前記部品担持アセンブリおよび前記筐体の内壁の間の前記感温アクチュエータの近傍に配置され、且つ、前記電子部品を前記熱伝導体から離すように、前記部品担持アセンブリを前記第一方向の逆方向に付勢するバイアスバネを有することを特徴とする請求項に記載の電子機器。 The support mechanism is positioned proximate the temperature sensitive actuator between the component carrier assembly and the inner wall of the housing, and moves the component carrier assembly away from the thermal conductor to move the component carrier assembly away from the thermal conductor. 2. The electronic device according to claim 1 , further comprising a bias spring that biases the device in one opposite direction. 前記支持機構は、前記部品担持アセンブリおよび前記筐体の内壁の間に前記部品担持アセンブリの移動を抑制する抑止部を備えたことを特徴とする請求項1又は2に記載の電子機器。 3. The electronic device according to claim 1, wherein the support mechanism includes a restraining portion that restrains movement of the component support assembly between the component support assembly and the inner wall of the housing. 前記熱伝導体は、前記筐体の内壁に前記電子部品に対向するように設けられる放熱板と、前記放熱板上に設けられる熱伝導シートと、を有することを特徴とする請求項1乃至のいずれか一項に記載の電子機器。 3. The thermal conductor includes a heat sink provided on the inner wall of the housing so as to face the electronic component, and a heat conductive sheet provided on the heat sink. The electronic device according to any one of 1. 前記感温アクチュエータは、前記部品担持アセンブリの周縁を囲むように複数設けられていることを特徴とする請求項1乃至のいずれか一項に記載の電子機器。 5. The electronic device according to claim 1 , wherein a plurality of said temperature-sensitive actuators are provided so as to surround the periphery of said component support assembly.
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