JP7152939B2 - Testing machine controller - Google Patents

Description

The present invention relates to a control device for a testing machine.

A pressure tester and a vibration tester for testing the fatigue durability of test objects such as pipes and hoses perform vibration tests by applying target waveforms of pressure and vibration to the test objects. Therefore, such a control device for a testing machine repeatedly inputs a signal of a target waveform to the testing machine and controls the response waveform output by the testing machine according to the target waveform.

A test machine using fluid pressure is used for the pressure tester and the vibration tester. is used as an input to control the servo valve of the testing machine.

Specifically, the control device generally feeds back the pressure in the pressure tester so that the response waveform output by the testing machine follows the target waveform with respect to the target waveform. , feedback control is performed to feed back the displacement, velocity, or acceleration (see Patent Document 1, for example).

JP-A-11-101708

However, in the conventional control device, the target waveform is input to the feedback loop and feedback control is executed. Since the working medium has elasticity, the response waveform cannot be precisely matched to the target waveform.

This is because if the feedback control is continued for a long time, the response waveform approaches the target waveform. , the peak value of the response waveform cannot match the peak value of the target waveform.

Therefore, simply performing feedback control like the conventional control device cannot find the match between the target waveform and the response waveform. .

SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a control device for a testing machine that can accurately match the response waveform of the testing machine to the target waveform.

In order to achieve the above-described object, a control device for a testing machine according to the present invention is a control device for repeatedly outputting a target waveform to a testing machine. A storage unit for storing characteristics, and a correction waveform generation unit for obtaining a correction waveform for canceling the difference based on the difference between the target waveform and the response waveform of the testing machine and the characteristics, and the target waveform is obtained by correcting the target waveform with the correction waveform. The tester is controlled based on the corrected waveform obtained.

According to the control device for the testing machine configured in this way, the characteristics of the testing machine with respect to wavelets are grasped in advance, and a correction waveform that cancels out the difference between the target waveform and the response waveform is generated.

Further, the correction waveform generation section in the control device of the testing machine may extract peak portions from the waveform of the difference, and obtain a correction waveform that cancels the difference in each of the extracted peak portions. According to the control device for the testing machine configured in this way, a correction waveform that cancels out the difference is generated for the peak portion where a large difference occurs between the target waveform and the response waveform. The response waveform of the testing machine can be made to follow the target waveform by controlling the number of times.

Furthermore, the correction waveform generator in the control device of the testing machine may extract the peak portion after removing noise from the waveform of the difference. The control device for the testing machine configured in this manner can generate a correction waveform by accurately selecting the peak portion where a large difference occurs, efficiently correcting the target waveform, and obtaining the target waveform of the response waveform of the testing machine with a small number of times of control. can be followed.

Then, the correction waveform generator in the control device of the testing machine may generate the correction waveform based on the height and width of the peak portion and the time at which the peak portion appears. According to the control device of the testing machine configured in this way, the difference in the peak portion is not regarded as an instantaneous value, but is recognized as a difference in intensity within a certain time range. You can generate a corrected waveform by specifying the shape of the wavelet that cancels . Therefore, according to the control device for the testing machine of the present embodiment, the difference in the peak portion can be efficiently canceled, so that the response waveform of the testing machine can be made to follow the target waveform with a much smaller number of times of control.

Also, the controller of the testing machine may use a rectangular pulse waveform as a wavelet. According to the control device of the tester configured in this way, the shape of the wavelet can be handled very easily when generating the correction waveform, so the calculation load for generating the correction waveform is lightened, and the wavelet can be specified in a range of widths and widths. The storage capacity can be reduced by storing in the storage unit in association with the delay time and gain that can be specified by height.

Furthermore, the controller of the tester is ideal for controlling pressure testers and vibration testers that are required to output the same waveform repeatedly and whose response waveforms are difficult to match the target waveform due to the effects of the pressure medium and the elasticity of the test piece. becomes.

According to the control device of the present invention, the response waveform of the testing machine can be precisely matched to the target waveform.

1 is a system configuration diagram of a control device for a testing machine in one embodiment; FIG. 1 is a control block diagram of a control device of a testing machine in one embodiment; FIG. It is a figure explaining an example of a target waveform. 4 is a control block diagram of a correction waveform generator of the control device of the testing machine in one embodiment; FIG. FIG. 4 is a diagram showing target waveforms and response waveforms during initial control; It is the figure which showed the waveform of the difference of a target waveform and a response waveform. FIG. 4 is a diagram showing a wavelet and a response waveform of the pressure tester to the input of the wavelet;

BEST MODE FOR CARRYING OUT THE INVENTION The present invention will be described below based on embodiments shown in the drawings. As shown in FIG. 1, a control device 1 for a testing machine according to one embodiment controls the pressure testing machine A so as to repeatedly output a target waveform. Specifically, the control device 1 includes a storage unit 4, a correction waveform generation unit 5 that generates a correction waveform, and a waveform correction unit 6 that obtains a corrected waveform by correcting a target waveform using the correction waveform. , in order to control the pressure tester A, it is provided with a pressure detector 2 for detecting the pressure P output by the pressure tester A, and a control section 3 for controlling the pressure tester A by a modified waveform.

On the other hand, the pressure tester A has a servo valve V for controlling the output fluid pressure, and the pressure output by the pressure tester A is adjusted by controlling the servo valve V by the control device 1 . Although not shown, the pressure tester A includes, for example, a pump and a booster cylinder that receives pressure fluid supplied from the pump. A pressure is applied to the inside of the specimen T such as a hose. The servo valve V is a proportional electromagnetic valve driven by a solenoid, and adjusts the pressure applied to the specimen T according to the amount of current supplied from the control device 1 .

In this example, the pressure detector 2 is installed in a pipeline H that guides the pressure output by the pressure tester A to the test body T, detects the pressure P output by the pressure tester A, and detects the pressure P output by the control unit 3 , is input to the correction waveform generator 5 . The pressure detector 2 may be provided at a position where the pressure output by the pressure tester A can be detected.

The target waveform is a pressure command that instructs the pressure to be applied to the test piece T by the pressure tester A in time series. When the output of the response waveform is completed, it is input to the control device 1 again. Therefore, the control device 1 performs control to cause the pressure tester A, which is the object of control, to output the pressure of the repetitive response waveform in response to the repetitively input target waveform.

As shown in FIG. 2, in this embodiment, the control unit 3 controls the pressure P detected by the pressure detector 2 and the input waveform indicating the pressure (indicated pressure) P ^* to be output by the pressure tester A. to generate a control command I ^* that instructs the amount of current to be applied to the servo valve V, and supplies the current to the servo valve V.

In this example, the input waveform input to the control section 3 is a modified waveform obtained by correcting the target waveform by the waveform correction section 6 . However, when the control unit 3 first controls the servo valve V for the first time, the input waveform is a target waveform representing an ideal pressure waveform to be applied to the test body T, as shown in FIG. The target waveform is set in advance as a one-time pressure command that instructs the pressure to be applied to the test body T in time series. The target waveform indicates one command pressure P ^* for each control cycle, and in the present embodiment, it is composed of data of 5000 target pressures. The corrected waveform is also composed of 5000 target pressure data similar to the target waveform. Note that the target waveform in the present embodiment is an example, and it is a matter of course that a waveform other than the illustrated waveform may be used as the target waveform.

Specifically, as shown in FIG. 2, the control unit 3 controls the pressure P* indicated by the input waveform output from the waveform correction unit 6, which will be described later, and the pressure P ^* output from the pressure tester A (pressure detector 2). A compensating unit 32 that obtains the control command I ^* by PID-compensating the deviation E obtained by the adding unit 31, and supplies a current to the servo valve V according to the control command I ^*. and a driver 33 for

The adder 31 obtains the deviation E between the pressure P ^* indicated by the input waveform and the pressure P detected by the pressure detector 2 and inputs it to the compensator 32 . In this example, the compensator 32 performs proportional-integral-differential compensation for the deviation E to obtain the control command I ^* that indicates the current to be supplied to the servo valve V. FIG. That is, the controller 3 controls the servo valve V by pressure feedback in this example. Although the compensator 32 is a PID compensator in this example, it may be a PI compensator that performs proportional-integral compensation.

The obtained control command I ^* is input to the driver 33, and the driver 33 supplies current to the servo valve V according to the control command I ^* . The driver 33 is a circuit that includes, for example, an analog circuit such as an operational amplifier and a switching element, and can adjust the amount of current supplied from the power supply to the solenoid of the servo valve V by turning the switching element on and off.

As shown in FIG. 4, the correction waveform generation unit 5 includes a difference calculation unit 51 that obtains the difference between the target waveform and the response waveform that is the waveform of the pressure P output by the pressure tester A detected by the pressure detector 2; A filter 52 that removes noise from the difference waveform, a peak extractor 53 that extracts a peak portion from the difference waveform processed by the filter 52, and a pressure tester A for the difference in the peak portion and the wavelet stored in the storage unit 4. A waveform calculator 54 for generating a corrected waveform based on the response waveform, and a characteristic identifier 55 for identifying the characteristic from the input to the pressure tester A to the response.

The difference calculator 51 obtains the difference between the target waveform and the response waveform output by the pressure tester A detected by the pressure detector 2 . The difference calculation unit 51 obtains the difference by calculating the difference between the response waveform, which is the time-series data of the pressure P output by the pressure detector 2, and the target waveform through one control. Since it takes time to output the response waveform of the pressure tester A with respect to the input of the target waveform, the difference between the target waveform and the response waveform is obtained by offsetting the response waveform by this amount of time on the time axis. The filter 52 sequentially processes the difference obtained by the difference calculation unit 51 to remove high-frequency noise from the difference.

FIG. 5 shows a target waveform indicated by a solid line in FIG. A response waveform (broken line in the figure), which is the waveform of P, is shown. Assuming that the pressure tester A outputs the response waveform indicated by the dashed line in FIG. 5 with respect to the target waveform shown in FIG. waveform difference is obtained. In FIG. 5, the delay time of the pressure tester A is offset to display the response waveform output by the pressure tester A corresponding to the target waveform.

A peak extraction unit 53 extracts a peak portion from the waveform difference obtained by the filter 52 . A conventionally well-known algorithm may be used as a peak extraction algorithm used in the peak extraction unit 53 . In the present embodiment, the peak extraction unit 53 extracts four peak portions n1, n2, n3, and n4 from the differential waveform, as shown in FIG.

Then, the waveform calculator 54 generates a correction waveform for canceling out the differences in the peak portions n1, n2, n3 and n4. Specifically, the waveform calculator 54 generates a corrected waveform according to the procedure described below.

Here, the principle of generating a correction waveform that cancels out the difference will be described. First, in order to grasp the characteristics of the pressure tester A, the characteristic identification section 55 obtains a response waveform output from the pressure tester A in response to an input of a predetermined wavelet W to the control section 3 . In this embodiment, as shown in FIG. 7, the wavelet W is plotted on a graph with the indicated pressure on the vertical axis and the time on the horizontal axis, with the width a, the height b, and the central time in the width direction c. A rectangular pulse waveform is used. Assume that when the pressure indicated by the wavelet W is input to the control unit 3 as a command to control the pressure tester A, the pressure tester A outputs a response waveform as indicated by the dashed line in FIG.

The width a, which is a parameter defining the wavelet W, is a value that determines the time during which the indicated pressure of the wavelet W is input as a command, and is a value corresponding to the cycle. Therefore, if the width a is lengthened, a command with a long cycle is input to the pressure tester A, and if the width a is shortened, a command with a short cycle is input to the pressure tester A. Considering this way, the width a is a value that determines the frequency of the command. By inputting a plurality of wavelets W with different widths a to the pressure tester A, the frequency and characteristics of the pressure tester A can be grasped. As described above, the gain characteristic and the phase characteristic of the pressure tester A can be grasped by commanding the pressure tester A using a plurality of wavelets W having different widths a and obtaining a response waveform. The height b, which is a parameter that defines the wavelet W, indicates the magnitude of the command pressure and represents the intensity of the signal. The time c that defines the wavelet W is a value that determines the time at which the wavelet W is input to the controller 3 . Specifically, the pressure b indicated by the wavelet W is input to the control unit 3 from time (ca/2) to time (c+a/2), and the pressure tester A is controlled.

In order to grasp the characteristics of the pressure tester A with respect to the input of the wavelet W, the characteristic identification unit 55 identifies the delay time τ from the input of the wavelet W to the control unit 3 to the output of the pressure tester A, and the gain characteristic identify. Identification of the delay time τ and gain characteristics is performed for each wavelet W having a different width a.

The characteristic identification unit 55 obtains the degree of coincidence between the wavelet W and the response waveform output from the pressure tester A to identify the delay time τ. Specifically, the correlation between the wavelet W and the pressure P, which is the output of the pressure tester A, is calculated to identify the delay time τ. With respect to the input wavelet W, the response waveform of the pressure P as the output of the pressure tester A is temporally be late. Here, when the waveform of the pressure P in FIG. 7 is shifted leftward by the time τ on the time axis with respect to the wavelet W, there exists a time τ at which the degree of matching between the waveforms of the wavelet W and the pressure P is maximized. . Therefore, the characteristic identification unit 55 identifies the time τ at which the degree of matching between the target pressure waveform of the rectangular wave and the waveform of the pressure P is maximum as the delay time.

Specifically, when the time is t and the delay time is τ, the characteristic identification unit 55 has a function f(t) representing the wavelet W and a function representing the response waveform of the pressure P that is the output of the pressure tester A The degree of matching is obtained using the cross-correlation function Rfg(τ)=f(t)·g(t+τ) of g(t+τ). As described above, the wavelet W is a rectangular wave having a width a, a height b, and a time at the center of the width c. /2≤t≤c+a/2, f(t)=b, and c+a/2<t, f(t)=0.

More specifically, the characteristic identification unit 55 calculates the following equation (1) using τ as a parameter, and identifies τ at which the function of equation (1) takes a peak value as the delay time. The cross-correlation function Rfg(τ) is a function for determining the degree of matching between both functions, and the maximum value (peak value) of this function indicates the maximum degree of matching between the two functions. In equation (1), x and y denote arbitrary times, and the computation interval is from x seconds to y seconds. The value of x is set to the dead time from the input of the target pressure waveform of the square wave to the response of the pressure tester A, and the value of y is set so that the pressure P, which is the output of the pressure tester A, is sufficiently zero. The time is set to the extent that it converges. By setting the calculation interval in this way, it is possible to eliminate unnecessary calculations in the time domain in which there is no τ that maximizes the degree of coincidence. is also shortened.

そして、ｆ（ｔ）の最大値であるｂと、圧力試験機Ａが出力する応答波形ｇ（ｔ）の最大値であるｍａｘ（ｇ（ｔ））を考えると、これらの比がゲインとなることが分かる。よって、特性同定部５５は、ｍａｘ（ｇ（ｔ））／ｂを演算してこれをゲインＫとして把握する。

Considering b, which is the maximum value of f(t), and max(g(t)), which is the maximum value of the response waveform g(t) output by the pressure tester A, the ratio of these becomes the gain. I understand. Therefore, the characteristic identification unit 55 calculates max(g(t))/b and recognizes it as the gain K.

Thus, the characteristic identification unit 55 identifies the delay time τ and the gain K of the pressure tester A with respect to the input of a certain wavelet W. FIG. The characteristic identification unit 55 identifies the delay time τ and the gain K for each wavelet W having a different width a, and causes the storage unit 4 to store the delay time τ and the gain K in association with the width a. In this embodiment, the delay time τ and the gain K are identified for the input of 1000 wavelets W with different widths a from 0.001 seconds to 1 second every 0.001 seconds. are stored in the storage unit 4. The identification number of the delay time τ and the gain K is 1000, the step value of the width a is 0.001, and the range of the width a is 0.001 to 1. The identification number, the step value of the width a and the width The range of a can be changed in design so as to be suitable for the testing machine in which the controller 1 is used.

Since the characteristics of the delay time τ and the gain K with respect to the width a of the pressure tester A are grasped by the processing of the characteristic identification unit 55, the waveform calculation unit 54 determines the target waveform and the response waveform output by the pressure tester A. If there is a difference, it is possible to reversely calculate what kind of width and what kind of height command should be input at what timing to cancel out this difference.

Specifically, the waveform calculator 54 obtains a command to cancel the respective differences for the peak portions n1, n2, n3, and n4 of the differential waveform extracted by the peak extractor 53, and generates a corrected waveform. Specifically, the waveform calculator 54 calculates the half width a1, the height b1 and the peaks n1, n2, n3, n4 of the peaks n1, n2, n3, n4 from the waveforms of the peaks n1, n2, n3, n4. is obtained, and the difference at each peak portion n1, n2, n3, n4 is approximated by a rectangular wave.

Then, the waveform calculator 54 obtains an instruction to cancel the rectangular wave that approximates the difference between the peak portions n1, n2, n3, and n4. In other words, in order to cancel the difference of the peak portion n1, the waveform calculator 54 inputs the waveform having the shape of the half-value width a1 and the height b at a timing earlier than the time c1 by the time (τ+a1/2) by anticipating the delay time τ. Look for a signal to Specifically, the waveform calculator 54 refers to the values of the delay time τ and the gain K of the wavelet W whose width a is the half width a1 stored in the storage unit 4, and Then, a command to input a rectangular wave whose width is a1 and whose height is -(b1×K) at the time obtained by calculating c1-τ-a1/2 is obtained. The command obtained in this way instructs to input a rectangular wave having a width of a1 and a height of -(b1×K), which is moved forward by the time (τ+a1/2) from the time c1 when the peak portion n1 appears. becomes. Assuming that the function of this command is F(t), F(t) is as follows.

このようにピーク部ｎ１について差分を打ち消す指令を求める他、波形演算部５４は、他のピーク部ｎ２，ｎ３，ｎ４についても同様にして、ピーク部ｎ２，ｎ３，ｎ４について差分を打ち消す指令を求めて合成して時系列化された指示圧力のデータセットでなる補正波形を生成する。なお、半値幅ａ１に等しい幅のウェーブレットＷについての圧力試験機Ａの応答波形についての遅れ時間τおよびゲインＫが同定されていない場合、線形補間によって差分を打ち消す指令を生成すればよい。

In addition to obtaining the command to cancel the difference for the peak portion n1 in this way, the waveform calculator 54 similarly obtains the command to cancel the difference for the peak portions n2, n3 and n4 for the other peak portions n2, n3 and n4. A correction waveform is generated by synthesizing the time-series command pressure data sets. If the delay time τ and the gain K of the response waveform of the pressure tester A for the wavelet W having a width equal to the half-value width a1 are not identified, a command for canceling the difference may be generated by linear interpolation.

Each time the control unit 3 controls the pressure tester A and the response waveform of the pressure tester A is obtained, the correction waveform generation unit 5 obtains the correction waveform from the difference between the target waveform and the response waveform, and generates the correction waveform. Update.

The waveform correction unit 6 adds the correction waveform obtained by the waveform calculation unit 54 to the target waveform to obtain a modified waveform. Specifically, since both the target waveform and the corrected waveform are data sets indicating the pressure in time series, the waveform correction unit 6 adds the indicated pressures at the same time of the target waveform and the corrected waveform to obtain the corrected waveform. . The waveform corrector 6 inputs the determined corrected waveform to the controller 3, and the controller 3 controls the pressure tester A by feedback of the pressure using the corrected waveform as an input waveform.

Each part of the control device 1 other than the pressure sensor 2 and the driver 33 specifically includes, although not shown, an amplifier for amplifying the signal output from the pressure sensor 2 and a converter for converting an analog signal into a digital signal. a converter, a CPU (Central Processing Unit), a storage device such as a ROM (Read Only Memory), a RAM (Random Access Memory), and a bus line connecting them. The wavelet W is input to detect the response output of the pressure tester A to identify the delay time τ and the gain K; , the control processing procedure for controlling the servo valve V may be stored in advance in a ROM or other storage device as a program. Moreover, the tester is not limited to the pressure tester A, and the control device 1 can be used for various testers such as a vibration tester that vibrates a test object.

The control device 1 is configured in this manner, and the target waveform is repeatedly input. In response to the input of the target waveform, the correction waveform generation unit 5 generates a correction waveform from the difference between the target waveform and the response waveform of the pressure tester A, and the waveform correction unit 6 corrects the target waveform with the correction waveform to obtain a corrected waveform. to generate The control unit 3, to which the corrected waveform thus obtained is input as an input waveform, performs pressure feedback control based on the indicated pressure P ^* indicated by the input waveform and the pressure P detected by the pressure detector 2. controls the pressure output by the Control of the pressure tester A by the control device 1 in response to one input of the target waveform is defined as the first (initial) control, and the control device 1 receives the input of the target waveform and controls the pressure tester A for the first time. In this case, the correction waveform generation unit 5 inputs a correction waveform with the instructed pressure set to 0 to the waveform correction unit 6, and the control unit 3 receives the target waveform as it is.

During the first control, a difference occurs between the target waveform, which is the input waveform, and the pressure response waveform output from the pressure tester A due to the pressure feedback control by the control unit 3 . Then, when the control unit 3 controls the pressure tester A by inputting the target waveform for the first time and obtains the response waveform, the correction waveform generation unit 5 performs the above-described processing to generate the correction waveform.

Subsequently, when the target waveform is input to the control device 1 for the second time, the corrected waveform is obtained by adding the corrected waveform generated by the corrected waveform generation unit 5 to the target waveform by the waveform correction unit 6, and the corrected waveform is controlled. It is input to part 3.

Therefore, in the second control, the corrected waveform is generated by correcting the target waveform by the corrected waveform obtained by the corrected waveform generation section 5 , and this corrected waveform is input to the control section 3 . In the first control, the target waveform is the input waveform, but in the second control, the input waveform input to the control unit 3 is the modified waveform obtained by adding the correction waveform to the target waveform. In the second control, the corrected waveform is input to the control unit 3 as an input waveform, and the corrected waveform is a pressure command corrected to cancel the difference between the target waveform and the response waveform. and the difference from the response waveform obtained during the second control becomes smaller. Thus, in the second control, the target waveform is corrected in this way, so the second response waveform is closer to the target waveform than the response waveform in the first control when the target waveform is input to the control unit 3. waveform.

Then, the response waveform obtained by this second control is input to the correction waveform generator 5 . The correction waveform generator obtains a new instruction to cancel the difference from the difference between the target waveform and the response waveform obtained during the second control. The command for canceling the difference obtained during the second control is added to the correction waveform obtained during the first control to update the correction waveform and generate a new correction waveform. After that, the control device 1 updates the correction waveform each time a response waveform is obtained, and the correction waveform input to the control unit 3 is also revised as the number of times of control progresses.

Then, when the difference between the response waveform of the pressure tester A and the target waveform becomes sufficiently small and becomes equal to or less than the stop threshold, the correction waveform generation unit 5 finishes updating the correction waveform, and the control unit 3 outputs the same waveform thereafter. is input. In this manner, the control device 1 controls the pressure tester A, and as the control progresses, the response waveform of the pressure tester A follows the target waveform with high accuracy.

As described above, the control device 1 of the testing machine according to the present embodiment is a control device 1 that causes the pressure testing machine (testing machine) A to repeatedly output a target waveform. A storage unit 4 that stores the characteristics of the delay time τ and the gain K of the pressure tester (testing machine) A, and the difference between the target waveform and the response waveform of the pressure testing machine (testing machine) A, and the difference based on the characteristics. A correction waveform generator 5 for obtaining a correction waveform to be canceled is provided, and the pressure tester (testing machine) A is controlled based on the corrected waveform obtained by correcting the target waveform with the correction waveform. According to the control device 1 of the testing machine configured as described above, the characteristics of the pressure testing machine (testing machine) A with respect to the wavelet W are grasped in advance, and a correction waveform that cancels out the difference between the target waveform and the response waveform is generated. , the response waveform can be accurately matched with the target waveform even if the target waveform includes a steep peak.

Then, the control device 1 for the testing machine of the present embodiment uses the characteristics of the delay time τ and the gain K of the pressure testing machine (testing machine) A with respect to the input of the wavelet W to the control unit 3 to cancel out the difference in the correction waveform , all the parameters used in generating the correction waveform can be handled on the time axis. Therefore, in the control device 1 of the testing machine according to the present embodiment, it is not necessary to use parameters defined on the frequency axis, which are difficult to handle, so that a correction waveform can be generated by a simple calculation.

Further, the correction waveform generation unit 5 in the control device 1 of the testing machine of the present embodiment extracts the peak portions n1, n2, n3, and n4 from the waveform of the difference, and extracts the extracted peak portions n1, n2, n3, and n4. A correction waveform that cancels out the difference in is obtained. In the control device 1 of the testing machine configured in this manner, the correction waveforms for canceling the differences are generated for the peak portions n1, n2, n3, and n4 in which a large difference occurs between the target waveform and the response waveform. The waveform can be corrected, and the response waveform of the pressure tester (testing machine) A can be made to follow the target waveform with a small number of times of control.

Further, since the corrected waveform generation unit 5 of the control device 1 of the testing machine of the present embodiment extracts the peak portions n1, n2, n3, and n4 after removing noise from the waveform of the difference, the peak portions where a large difference occurs A correction waveform can be generated by appropriately selecting n1, n2, n3, and n4, and the target waveform can be efficiently corrected to allow the response waveform of the pressure tester (testing machine) A to follow the target waveform with a small number of controls.

Then, the correction waveform generation unit 5 of the control device 1 of the testing machine of the present embodiment generates the height b1 and the half-value width (width) a1 of the peak portions n1, n2, n3, and n4, and the peak portions n1, n2, and n3 , n4 appear on the basis of the correction waveform. According to the control device 1 of the testing machine configured in this way, the difference between the peak portions n1, n2, n3 and n4 is not treated as an instantaneous value, but the difference between the peak portions n1, n2, n3 and n4 is Since the difference is recognized as a certain intensity difference in a certain time range, a correction waveform can be generated by designating the shape of the wavelet W that cancels this. Therefore, according to the control device 1 of the testing machine of the present embodiment, the differences in the peak portions n1, n2, n3, and n4 can be efficiently canceled, so that the pressure testing machine (testing machine) A can be controlled with a smaller number of times of control. can be made to follow the target waveform. Since the correction waveform generator 5 generates the correction waveform using the half-value width a1 of the peak portions n1, n2, n3, and n4, the integrated value of the difference in the peak portions n1, n2, n3, and n4 is can effectively cancel the difference by generating a correction waveform that cancels may

Further, the control device 1 of the testing machine of the present embodiment uses a rectangular pulse waveform as the wavelet W. FIG. According to the control device 1 of the testing machine configured in this way, the shape of the wavelet W can be handled very easily in generating the correction waveform, so the calculation load for generating the correction waveform is lightened, and the wavelet W can be specified. The storage capacity can be reduced even if the delay time τ and the gain K that can be specified by the width a and the height b are associated with each other or stored in the storage unit 4 . Note that the shape of the wavelet W may be a waveform other than a rectangular pulse waveform.

From the above, the control device 1 of the testing machine is required to repeatedly output the same waveform, and the response waveform is difficult to match the target waveform due to the influence of the pressure medium and the elasticity of the test body T. is optimal for controlling

Although preferred embodiments of the invention have been described in detail above, modifications, variations, and changes are possible without departing from the scope of the claims.

DESCRIPTION OF SYMBOLS 1... Control apparatus of a test machine, 4... Storage part, 5... Correction waveform generation part, W... Wavelet, A... Pressure test machine (test machine)

Claims (5)

A control device for a testing machine that causes the testing machine to repeatedly output a target waveform,
a storage unit that stores delay time and gain characteristics of the testing machine with respect to input of a plurality of wavelets with different periods;
a correction waveform generation unit that obtains a correction waveform that cancels the difference based on the difference between the target waveform and the response waveform of the test machine and the characteristics,
A control device for a testing machine, wherein the testing machine is controlled based on a corrected waveform obtained by correcting the target waveform with the correction waveform. The control device for a testing machine according to claim 1, wherein the correction waveform generator extracts peak portions from the waveform of the difference, and obtains a correction waveform that cancels the difference in each of the extracted peak portions. 3. The control device for a testing machine according to claim 2, wherein the corrected waveform generator removes noise from the waveform of the difference before extracting the peak portion. 4. The tester control device according to claim 2, wherein the correction waveform generation unit generates the correction waveform based on the height and width of the peak portion and the time at which the peak portion appears. . The control device for a testing machine according to any one of claims 1 to 4, wherein a rectangular pulse waveform is used as the wavelet.

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