JP7338656B2 - Measuring device, measuring method and its program - Google Patents

Description

This specification discloses a measuring device, a measuring method, and a program thereof.

Conventionally, as a device for observing an object to be measured, for example, a device has been proposed that enables three-dimensional structure grasping by performing cell observation by branching an optical path using a plurality of prisms (for example, , see Patent Document 1). With this observation device, when observing a subject having a three-dimensional structure, information on the subject observed from multiple directions can be obtained at once, and a multi-faceted image acquisition system can be provided that enables rapid structural comprehension. and Examples of measurement objects include a first electrode that is a columnar body having a first active material, a second electrode that has a second active material, and a first electrode and a second electrode that have ion conductivity. A secondary battery including a separation membrane that insulates is proposed (see, for example, Patent Document 2). With this secondary battery, it is possible to provide a novel secondary battery that can increase energy density and further improve safety.

JP 2017-187485 A JP 2018-152229 A

However, in Patent Literature 1 described above, cells and the like are photographed at the same time from multiple perspectives to quickly grasp the three-dimensional structure, but it is difficult to measure the shape quantitatively. In addition, in the secondary battery of Patent Document 2 as an object to be measured, it is composed of a fiber-like electrode in which a partition wall and a positive electrode are concentrically applied around the negative electrode, and for example, a separation membrane and a second active material layer are normally formed. It has been desired to quickly and accurately measure whether the

The present disclosure has been made in view of such problems, and the main purpose is to provide a novel measuring device, a measuring method, and a program thereof that can quantitatively measure the size and shape in the circumferential direction. do.

As a result of intensive research to achieve the above-described object, the inventors of the present invention have found that if the optical axis is tilted with respect to the imaging unit and slit light that is further tilted about the optical axis is used, the circumferential direction The inventors have found that the size and shape can be measured quantitatively, and have completed the invention disclosed in this specification.

That is, the measuring device disclosed in this specification
A measuring device for measuring the outer peripheral surface of an object to be measured,
an irradiation unit that irradiates a plurality of measurement planes of the measurement object with slit light from a plurality of directions by one or more branches, intersecting the plurality of measurement planes and having a first inclination angle;
an imaging unit that has a second tilt angle with respect to the optical axis of the irradiating unit and captures an image including reflected light of the slit light emitted to the plurality of measurement surfaces;
is provided.

The measurement method disclosed herein is
A measurement method for measuring the outer peripheral surface of an object to be measured,
an irradiation step of irradiating a plurality of measurement surfaces of the measurement object with slit light from a plurality of directions by one or more branches so that the slit light intersects the plurality of measurement surfaces and has an inclination;
an imaging step of capturing an image including reflected light of the slit light irradiated onto the plurality of measurement surfaces;
a processing step of detecting the outer peripheral surface of the measurement object from a plurality of slit lights of the captured image;
includes.

The program disclosed in this specification causes one or a plurality of computers to implement each step of the measurement method described above. This program may be recorded on a computer-readable recording medium (for example, hard disk, ROM, FD, CD, DVD, etc.), or may be transmitted from a computer via a transmission medium (communication network such as the Internet or LAN). may be distributed to any computer or sent or received in any other form.

In the present disclosure, it is possible to provide a novel measuring device, measuring method, and program thereof that can quantitatively measure the size and shape in the circumferential direction. The reason why the present disclosure has such an effect is presumed as follows. For example, the slit light source that irradiates linearly and the optical axis of the imaging unit have a predetermined angle of inclination and are not on the same straight line. Varies depending on At this time, the shape of the object to be measured can be calculated if the angle between the optical axis of the slit light source and the optical axis of the imaging unit is known. By splitting the slit light and irradiating the measurement object from two or more directions, the circumferential shape of the measurement object can be known. In addition, when the slit light beams are applied to the same location in the longitudinal direction of the measurement object, the slit light beams overlap each other in the circumferential direction. It is possible to further suppress the overlap of the slit light beams and obtain the shape of the object to be measured.

FIG. 2 is an explanatory diagram showing an example of a measurement system 10; FIG. 4 is an explanatory diagram showing an example of multi-view simultaneous imaging by optical path length correction of the measuring device 20; FIG. 2 is an explanatory diagram showing an example of an irradiation unit 21 and an imaging unit 26; FIG. 4 is an explanatory diagram of reflected light (scattered light) reflecting the shape of the measurement object S; FIG. 2 is an explanatory diagram showing an example of an electricity storage device 40; 4 is a flowchart showing an example of an outer peripheral shape measurement processing routine; Explanatory drawing of overlap of slit light at the time of multifaceted simultaneous photographing of a hexagonal prism. A photographed image of a hexagonal prism obtained by tilting the slit light at the time of multifaceted simultaneous photographing. Cross-sectional shape of a hexagonal prism object reconstructed from a photographed image. A captured image of a cylindrical structure with a groove taken simultaneously from multiple planes. The cross-sectional shape of the measuring object with a grooved cylindrical structure reconstructed from the photographed image.

(Measuring device)
Embodiments of the measuring device disclosed in this specification will be described below with reference to the drawings. FIG. 1 is a schematic explanatory diagram showing an example of a measurement system 10. As shown in FIG. 2A and 2B are explanatory diagrams showing an example of simultaneous multi-view imaging by optical path length correction of the measuring device 20. FIG. 2A is an explanatory diagram of the configuration of the measuring device 20, and FIG. 2B is an example of a captured image of the measurement object S. . FIG. 3 is an explanatory diagram showing an example of the irradiation unit 21 and the imaging unit 26. As shown in FIG. FIG. 4 is an explanatory diagram of reflected light (scattered light) reflecting the shape of the measurement object S. FIG. FIG. 5 is an explanatory diagram showing an electricity storage device 40 as an example of the measurement object S. As shown in FIG.

The measurement system 10 is a system for measuring the outer peripheral shape of a measuring object S having a three-dimensional shape. The object S to be measured is not particularly limited as long as it is an object having a three-dimensional shape, but it may be an elongated member, for example. For such an object S to be measured, the measuring device 20 can continuously measure the outer peripheral shape while moving the object S to be measured. Here, the single cell 11 and the electricity storage device 40 using the single cell 11 as an example of the measurement object S will be described.

Examples of the electric storage device 40 include a hybrid capacitor, a pseudo electric double layer capacitor, an alkali metal secondary battery of lithium or sodium, an alkali metal ion battery, an air battery, and the like. Among these, as the electric storage device 40, a lithium secondary battery, particularly a lithium ion secondary battery is preferable. Here, the explanation is mainly given assuming that the electricity storage device 40 is a lithium ion secondary battery. The electricity storage device 40 includes, for example, a columnar electrode 15, a separation film 16, a counter electrode 18, and current collectors 41 and 42, as shown in FIG. The columnar electrode 15 is composed of a columnar body 12 containing the first active material. Here, the term "columnar shape" includes not only a non-flexible thickness but also a bendable thickness. The columnar electrode 15 may be a negative electrode or a positive electrode, but is preferably a negative electrode. The counter electrode 18 may be a positive electrode or a negative electrode, but is preferably a positive electrode. The current collector 41 is a conductive member that collects current from the columnar electrode 15 and is electrically connected to the end surface of the columnar electrode 15 . The current collector 42 is a conductive member that collects current from the counter electrode 18 and is electrically connected to the end surface of the counter electrode 18 .

The columnar body 12 of the columnar electrode 15 may be a bundle of fibrous bodies 13 containing the first active material. The columnar electrode 15 may have a columnar shape, and its cross section may be circular or polygonal. In the electricity storage device 40, a plurality of columnar electrodes 15 are arranged in a predetermined direction. The columnar electrode 15 preferably has an average diameter of 10 μm or more and 500 μm or less in a cross section perpendicular to the longitudinal direction. Moreover, it is preferable that the average diameter of the fibrous body 13 is in the range of 5 μm or more and 50 μm or less. The length of the columnar body 12 in the longitudinal direction can be appropriately determined according to the use of the electricity storage device, and may be, for example, in the range of 20 mm or more and 200 mm or less. The fibrous body 13 may be, for example, a metal fibrous body, or may be a fiber of a carbon material that occludes and releases lithium ions. A carbon material has high conductivity and is preferable for the columnar electrode 15 . Carbon materials include, for example, one or more of graphites, cokes, vitreous carbons, non-graphitizable carbons, and pyrolytic carbons. Among these, graphites such as artificial graphite and natural graphite are preferred. Also, the fibrous body 13 may be carbon fiber having a graphite structure.

The separation membrane 16 has ion conductivity for carrier ions (for example, lithium ions), insulates the columnar electrode 15 from the second electrode 22, prevents a short circuit, and functions as a separator. Examples of the separation membrane 16 include polyvinylidene fluoride (PVdF), a copolymer of PVdF and hexafluoropropylene (PVdF-HFP), polymethyl methacrylate (PMMA), and a copolymer of PMMA and an acrylic polymer. Resins such as coalescence can be mentioned. The separation film 20 preferably has a thickness in the range of, for example, 2 μm or more and 40 μm or less in order to ensure insulation. Also, when the thickness of the separation membrane 16 is in the range of 2 to 40 μm, ionic conductivity and insulation are suitable. The separation membrane 16 may contain an electrolytic solution.

The counter electrode 18 is an electrode that has a second active material and faces the columnar electrode 15 with the separation film 16 interposed therebetween. The counter electrode 18 may be formed on the outer peripheral surface of the separation membrane 16 and may have a structure that binds the unit cells 11 together, or may be provided so as to fill the space between adjacent separation membranes 16 . Examples of the second active material include materials capable of intercalating and deintercalating lithium, which is a carrier. Examples of the second active material include a compound containing lithium and a transition metal, such as an oxide containing lithium and a transition metal element, and a phosphate compound containing lithium and a transition metal element. Specifically, a lithium-manganese composite oxide having a basic composition formula such as Li _(1-x) MnO ₂ (0≦x≦1, etc., hereinafter the same) or Li _(1-x) Mn ₂ O ₄ , etc., basic composition A lithium cobalt composite oxide having a formula such as Li _{(1-x) CoO2} , a lithium nickel composite oxide having a basic composition formula such as Li _{(1-x) NiO2} , and a basic composition formula of Li _(1-x) CoaNibMncO2 (a _> 0, b>0, c>0, _a + _{b +} c ₌ 1), _{Li (1-x) CoaNibMncO4 (} 0<a<1, 0<b <1, 1 ≤ c < 2, a + b + c = 2), etc., lithium vanadium composite oxides with a basic composition formula of LiV ₂ O ₃ , etc., basic composition formulas of V ₂ O ₅ , etc. A transition metal oxide or the like can be used. Also, a lithium iron phosphate compound having a basic compositional formula of LiFePO ₄ or the like can be used as the positive electrode active material. Among these, lithium-cobalt-nickel-manganese _composite oxides such _as LiCo1 _{/ 3Ni1} / _{3Mn1 / 3O2} and _{LiNi0.4Co0.3Mn0.3O2} are preferable. In addition, the "basic composition formula" means that other elements such as Al and Mg may be included.

In the single cell 11 configured in this manner, the separation film 16 and the counter electrode 18 may be formed on the surfaces of the columnar bodies 12 while the columnar bodies 12 are being moved. It is necessary to measure the states of the separation film 16 to be formed, the counter electrode 18, and the like. Since the measurement device 20 can measure the outer peripheral surface of such a long member, the columnar body 12, the single cell 11, and the like are suitable as the measurement object S.

The measurement system 10 has a measurement device 20 and a management PC 30 . The measurement device 20 is a device that measures the outer peripheral surface of the object S to be measured. The measurement device 20 includes an irradiation unit 21, an imaging unit 26, and a processing unit 28, as shown in FIGS. The irradiation unit 21 irradiates a plurality of measurement surfaces of the measurement object S with slit light from a plurality of directions through one or more branches. Further, the irradiation unit 21 irradiates slit light beams which intersect the plurality of measurement surfaces and have a first tilt angle θ1 (see FIG. 3). The irradiation section 21 has a light source 22 and a slit 23 . The light source 22 is not particularly limited as long as it is light having a wavelength that is reflected by the measurement object S. For example, it is preferable to irradiate light in the visible light range. The width of the slit 23 is not particularly limited as long as it can be identified in the image captured by the imaging unit 26, and may be in the range of 0.1 mm or more and 5 mm or less, for example. The irradiating unit 21 irradiates slit light to at least one of a cylindrical or polygonal columnar electrode and a cylindrical or polygonal columnar single cell as the measurement object S. FIG.

The irradiation unit 21 may further include an optical path length correction member 24 and a mirror 25 as an optical system. The optical path length correction member 24 is a member that corrects the optical path length of slit light beams split from the slit light beams that are directly irradiated onto the measurement surface. The optical path length correction member 24 may be a transparent member made of quartz, for example. The mirror 25 is a member that reflects the slit light whose optical path length is corrected and irradiates it onto the measurement surface. As shown in FIG. 2, the irradiation unit 21 has a first optical path D1 that directly irradiates the measurement object S with the slit light, and an optical path length correction member 24 and a mirror 25 to branch the slit light to the measurement object S and a third optical path D3 for irradiating the measurement object S by branching the slit light via another optical path length correction member 24 and a mirror 25 . The irradiation unit 21 irradiates the measurement object S with light from positions rotated by 120°, and irradiates the entire outer periphery of the measurement object S with slit light. Although the irradiation unit 21 is described as using direct light and two branched lights, it is not particularly limited to this as long as one or more direct lights and one or more branched lights are used.

As shown in FIG. 3, the irradiation unit 21 directs the slit light onto the measurement surface of the measurement object S by inclining the slit light at a first inclination angle θ1 with respect to the reference line L perpendicular to the boundary line B of the measurement surface of the measurement object S. To prevent the slit light to be irradiated and the split slit light from being spatially overlapped when a measurement surface is irradiated with the slit light. Although details will be described later, when slit light is irradiated from three surfaces to the measurement object S, not only a specific measurement surface but also slit light irradiated to other measurement surfaces are included in the imaging range. It becomes difficult to determine whether the slit light corresponds to the surface. Here, since the slit light is tilted at the predetermined tilt angle θ1 about the optical axis, it is possible to separate the slit light from other measurement planes. The inclination angle θ1 is not particularly limited as long as the slit light can be separated. When the tilt angle θ1 is 5° or more, the slit light can be sufficiently separated, and when it is 45° or less, the image can be made more compact, which is preferable. The inclination angle .theta.1 is the angle formed by the reference line L and the slit, and is defined as an acute angle.

The imaging unit 26 is a camera that captures an image including the reflected light of the slit light irradiated onto the plurality of measurement surfaces. The imaging unit 26 includes an imaging element 27 that forms an image of light. The imaging element 27 forms a plurality of images including the reflected light of the slit light and the measurement surface, and may be an image sensor such as a CMOS or CCD, for example. The imaging unit 26 is fixed at a second tilt angle θ2 with respect to the optical axis of the irradiation unit 21 (see FIG. 3). This tilt angle θ2 may be, for example, in the range of 5° or more and 45° or less. When the inclination angle θ2 is 5° or more, the resolution of the three-dimensional reflected wave of the slit light can be further improved, and the shape of the outer peripheral surface of the measurement object S can be easily grasped, which is preferable. In addition, when the inclination angle θ2 is 45° or less, the influence of shadows caused by irregularities on the surface of the measurement object S can be further suppressed, which is preferable. In the measurement device 20, the shape of the outer surface of the measurement object S can be measured based on the change in the shape of the linear slit light by tilting the irradiation unit 21 and the imaging unit 26. FIG. Note that this tilt angle θ2 is an angle formed by the optical axis of the irradiation unit 21 and the imaging direction from the imaging unit 26, and is an angle on the acute angle side. The imaging unit 26 captures an image including the slit light with which the first measurement surface, the second measurement surface and the third measurement surface of the measurement object S are irradiated by the imaging device 27 . As shown in FIG. 2B, the imaging unit 26 captures a first image P1, a second image P2, and a third image P2 based on the reflected light of the slit light on the first optical path D1, the second optical path D2, and the third optical path D3, respectively. An image P3 is captured by one image sensor 27 . In the imaging unit 26, the image of the slit light reflecting the shape of the same outer circumference is obtained in the same image, so the processing is smooth.

The processing unit 28 is a controller that controls the entire measuring device 20 . The processing unit 28 executes processing for detecting the outer peripheral surface of the measurement object S from a plurality of slit lights included in the captured image. For example, when the cylindrical single cell 11 shown in FIG. 3 is imaged by the measurement device 20, an image shown in FIG. 4 is obtained. At this time, the height Δz of the unit cell 11 from the reference plane R located on the lower surface of the unit cell 11 is obtained by the formula Δy/tan θ2. The processing unit 28 performs such calculations and obtains a stereoscopic image of the single cell 11 .

The management PC 30 is configured as a management device that manages data of the measurement system 10 and the like. This management PC 30 exchanges information with the measuring device 20 via a line 29, as shown in FIG. The management PC 30 has a control section 31, a storage section 32, an input device 37, a display device 38, and a communication section. The control unit 31 is a microprocessor composed mainly of a CPU, and controls the entire device. The storage unit 32 is a device that stores data, and includes, for example, an HDD and a flash ROM. The storage unit 32 may store measurement result information 33 including measurement results, an outer peripheral shape measurement processing program of the measurement object S, and the like. The input device 37 is a device including a keyboard and a mouse, and inputs commands from the operator. The display device 38 is a display that displays and outputs images and characters. The communication unit is an interface that exchanges information with an external device.

(Measurement method)
The measurement method of the present disclosure is a method of measuring the outer peripheral surface of the object S to be measured. This measurement method may be executed using, for example, the measurement device 20 described above. It should be noted that the conditions, configuration, and the like described in the measurement device 20 are used as appropriate, and detailed descriptions of their contents are omitted here. This measurement method includes, for example, an irradiation step, an imaging step, and a processing step. Each step may be executed by the measuring device 20, by the management PC 30, or by a plurality of devices in a shared manner. In this measurement method, one or more of the columnar or polygonal columnar electrode and the columnar or polygonal columnar single cell can be used as the measurement object S.

In the irradiation step, the plurality of measurement surfaces of the measurement object S are irradiated with slit light from a plurality of directions by one or more branches. At this time, it is assumed that the slit light is irradiated so as to intersect the plurality of measurement surfaces and have an inclination. In this step, the slit light is tilted at an inclination angle θ1 with respect to the reference line L perpendicular to the boundary line B of the measurement surface, so that the slit light directly irradiated onto the measurement surface and the split slit light are projected onto the measurement object. It is intended to prevent two or more slit lights from spatially overlapping each other when an object to be measured is irradiated with a certain measurement surface. The inclination angle θ1 is preferably in the range of 5° or more and 45° or less with respect to the reference line L orthogonal to the boundary line B. Further, in this step, the optical path length correction member 24 corrects the optical path length of the slit light beam split from the slit light beam directly irradiated to the measurement surface, and the slit light beam whose optical path length is corrected is reflected and irradiated onto the measurement surface. The measurement surface may be irradiated with the slit light via an optical system member including the mirror 25 . In this step, the first optical path D1 directly irradiates the first measurement surface with the slit light, the second optical path D2 branches and irradiates the slit light onto the second measurement surface, and the third optical path D2 branches and irradiates the slit light. The measurement surface may be irradiated with the slit light through the third optical path D3 for irradiating the measurement surface. In this irradiation step, it is preferable to irradiate the measuring object S with visible light.

In the imaging step, a process of imaging an image including reflected light of the slit light irradiated onto the plurality of measurement surfaces is performed. In this step, an image including the slit light with which the first measurement surface, the second measurement surface and the third measurement surface of the measurement object S are irradiated may be captured. Further, in the imaging step, one image including a plurality of reflected light of slit light and a plurality of measurement surfaces may be acquired. Combining the images into one image is preferable because subsequent processing can proceed smoothly.

In the processing step, a process of detecting the outer peripheral surface of the measuring object S from a plurality of slit lights of the captured image is performed. By executing such processing, the shape of the outer peripheral surface of the measuring object S can be measured.

Next, the operation of the measuring device 20 of the present embodiment configured in this way, particularly the process of measuring the outer peripheral shape of the single cell 11 executed by the measuring device 20 will be described. FIG. 6 is a flow chart showing an example of a peripheral shape measurement processing routine executed by the processing unit 28 of the measuring device 20. As shown in FIG. This routine is stored in a storage unit (not shown) of the processing unit 28 (not shown) and executed based on an execution command from the operator. Here, it is assumed that this routine is executed using the measuring device 20 shown in FIGS. When this routine is started, the processing unit 28 first tilts the slit light at the tilt angle θ1, and irradiates the measurement object S with the slit light with the irradiation unit 21 tilted at the tilt angle θ2 (S100). Next, the processing unit 28 captures an image of the reflected light received from the first optical path D1, the second optical path D2, and the third optical path D3 with the imaging device 27 (S110), and the shape of the slit light included in the captured image obtained. is analyzed, and the outer peripheral shape of the measurement object S is obtained by calculation using a calculation formula (S120). Then, the processing unit 28 stores the measurement results obtained by calculation (S130), and determines whether or not all measurement results have been obtained (S140). For example, the processing unit 28 may measure the outer peripheral shape of the elongated single cell 11 while continuously moving it, and determine whether all the measurement results of this single cell 11 have been obtained in this step. . When all the measurement results have not been obtained, the processing section 28 executes the processes from S100 onwards, and when all the measurement results have been obtained, this routine ends.

With the measuring device 20 and the measuring method of this embodiment described above, it is possible to provide a novel measuring device, a measuring method, and a program thereof that can quantitatively measure the size and shape in the circumferential direction. The reason why the present disclosure has such an effect is presumed as follows. For example, if the linearly irradiated slit light and the optical axis of the imaging unit have a predetermined angle of inclination and are not on the same straight line, the shape of the slit light projected onto the object to be measured changes to the shape of the object to be measured. Varies depending on At this time, the shape of the object to be measured can be calculated if the angle between the optical axis of the slit light source and the optical axis of the imaging unit is known. Further, by splitting the slit light and irradiating the measurement object from two or more directions, the circumferential shape of the measurement object can be known. In addition, when the slit light beams are applied to the same location in the longitudinal direction of the measurement object, the slit light beams overlap each other in the circumferential direction. It is possible to further suppress the overlap of the slit light beams and obtain the shape of the object to be measured.

It goes without saying that the present disclosure is not limited to the above-described embodiments, and can be implemented in various forms as long as they fall within the technical scope of the present disclosure.

For example, in the embodiments described above, the present disclosure has been described as the measurement system 10, the measurement device 20, and the measurement method, but for example, it may be a program for executing the measurement method. This program may be recorded on a computer-readable recording medium (for example, hard disk, ROM, FD, CD, DVD, etc.), or may be transmitted from a computer via a transmission medium (communication network such as the Internet or LAN). It may be distributed to another computer or sent or received in any other manner. If this program is executed by one computer, or each step is divided and executed by a plurality of computers, each step of the above-described measurement method is executed, so that the same effects as this measurement method can be obtained. .

An example in which the measuring device and the measuring method of the present disclosure are specifically examined will be described below as an experimental example.

(Experimental example 1: Circumferential shape measurement of hexagonal prism structure)
A measurement apparatus 20 shown in FIGS. 1 to 3 was manufactured, and processing for detecting the outer surface of a columnar measurement object S was examined. As shown in FIG. 3, an object to be measured is irradiated with linear slit light, and when reflected light or scattered light is photographed at a position tilted from the optical axis of the slit light, an image as shown in FIG. 4 is obtained. The shape of this image reflects the shape and size of the object to be measured, and can be converted by the formula shown in FIG. In the method shown in FIG. 4, only the upper surface side of the measurement object S can be measured. On the other hand, as shown in FIG. 2, when the irradiation light is split into two and the slit light is irradiated to the measurement object S from three directions (FIG. 2A), only a single imaging element is used, and the measurement object It is possible to obtain images of S simultaneously captured from multiple directions (Fig. 2B). Since lights with different optical path lengths cannot be brought into focus on the imaging element, simultaneous imaging was made possible by using an optical path length correction element (Crobit: registered trademark). The number of branches and the imaging angle can be arbitrarily changed by combining mirrors and crobits.

First, a photographed image was taken when the illumination light was slit light in the optical system shown in FIG. FIG. 7 is an explanatory diagram of overlapping of slit lights during multi-facet simultaneous imaging of a hexagonal prism. Here, the tilt angle θ2 between the optical axis and the imaging method of the imaging unit 26 is set to 20°. Further, the inclination angle θ1 of the slit light with respect to the reference line L orthogonal to the boundary line B was set to 0° in the direction along the reference line L. As shown in FIG. 7, the slit light beams were projected along the hexagonal prism structure onto the surface of the object to be measured. Ta. Therefore, the slit light was rotated around the optical axis and the inclination angle θ1 was set to 20°, and the reflected light was imaged.

FIG. 8 is an explanatory view of suppression of overlap due to tilting of slit light during simultaneous multifacet imaging of a hexagonal prism. It has been found that by inclining the slit light in this way, it is possible to independently image the split slit light as shown in FIG. The method of independently photographing the slit light is not limited to the rotation of the slit light, but can also be performed by changing the optical path using a mirror or prism. Based on the position and angle at which the slit light was applied to the photographed image, the detected shape was obtained. FIG. 9 shows a cross-sectional shape of a hexagonal prism-shaped measurement object reconstructed from a photographed image. As shown in FIG. 9, from the image analysis of reflected light, a hexagonal shape with an inscribed circle diameter of 3 mm could be measured. If it is a columnar structure, it turned out that the shape measurement is similarly possible.

(Experimental example 2: Circumferential shape measurement of cylindrical structure with grooves)
Next, the outer peripheral shape of a cylindrical body having a plurality of grooves formed on its surface was measured. 10A and 10B are captured images of a grooved columnar structure obtained by simultaneous multi-view imaging. The object to be measured is a cylinder (having a diameter of 2 mm) having a groove in its longitudinal direction. The shape of the object to be measured was calculated based on the position and angle at which the slit light was applied to the photographed image of FIG. FIG. 11 shows the cross-sectional shape of the measuring object with a grooved columnar structure reconstructed from the photographed image. The dashed black line in the figure represents a circle with a diameter of 2 mm. As shown in FIG. 11, the measurement device 20 was able to measure a cylindrical shape and a groove with a diameter of 2 mm. As described above, it has been found that if the shape of the slit light does not cast a shadow, for example, the single cell 11 can be used as the object S to be measured, and scratches on the surface thereof can be detected. In particular, since the measuring device 20 can continuously detect the outer peripheral shape of the single cell 11 while moving, it is presumed to be useful for inspection during manufacturing of the columnar body 12 and the single cell 11. Ta.

It should be noted that the measuring apparatus, measuring method, and program thereof disclosed in the present specification are not limited to the above-described embodiments, and can be implemented in various forms as long as they fall within the technical scope of the present disclosure. Not even.

INDUSTRIAL APPLICABILITY The measuring device, the measuring method, and the program disclosed in this specification can be used in the technical field of measuring the outer peripheral shape of an object to be measured.

10 measurement system, 11 unit cell, 12 columnar body, 13 carbon fiber, 15 columnar electrode, 16 separation membrane, 18 counter electrode, 20 measurement device, 21 irradiation unit, 22 light source, 23 slit, 24 optical path length correction member, 25 mirror, 26 imaging unit 27 imaging element 28 processing unit 29 line 30 management PC 31 control unit 32 storage unit 33 measurement result information 37 input device 38 display device 40 power storage device 41 current collector 42 Current collector 60 Captured image A Optical axis B Boundary line D1 First optical path D2 Second optical path D3 Third optical path L Orthogonal line P1 First image P2 Second image P3 Third image.

Claims (17)

A measuring device for measuring the outer peripheral surface of an object to be measured,
an irradiation unit that irradiates a plurality of measurement planes of the measurement object with slit light from a plurality of directions by one or more branches, intersecting the plurality of measurement planes and having a first inclination angle;
an imaging unit that has a second tilt angle with respect to the optical axis of the irradiation unit and captures an image containing reflected light of the slit light irradiated to the plurality of measurement surfaces;
The irradiating unit tilts the slit light at the first tilt angle with respect to a reference line orthogonal to the boundary line of the measurement surface, thereby irradiating the slit light directly onto the measurement surface and the measurement surface. Preventing spatial overlap with the slit light that has passed through the optical path for branching when the measurement surface is irradiated,
The imaging unit receives reflected light of slit light directly irradiated onto the measurement surface and reflected light of slit light that has passed through an optical path for branching to the measurement surface. The irradiating unit irradiates the measurement surface with the slit light having the first inclination angle in the range of 5° or more and 45° or less with respect to a reference line perpendicular to a boundary line of the measurement surface. Item 1. The measuring device according to item 1. The measuring device according to claim 1 or 2, wherein said imaging unit is arranged such that said second tilt angle ranges from 5° to 45°. The irradiating unit includes an optical path length correcting member that corrects the optical path length of the slit light that is split with respect to the slit light that is directly irradiated onto the measurement surface, and an optical path length correcting member that reflects the optical path length corrected slit light onto the measurement surface. 4. The measuring apparatus according to claim 1, comprising an optical system member including a mirror for irradiating light. The irradiation unit has a first optical path that directly irradiates the first measurement surface with the slit light, a second optical path that branches and irradiates the slit light onto the second measurement surface, and a second optical path that branches and irradiates the slit light onto the third measurement surface. and a third optical path for irradiation,
5. The imaging unit according to any one of claims 1 to 4, wherein the imaging unit captures an image including slit light irradiated onto the first measurement surface, the second measurement surface, and the third measurement surface. measuring device. The measuring device according to any one of claims 1 to 5, wherein the irradiating section irradiates visible light. 7. The measuring device according to claim 1, wherein said imaging unit has an imaging element that forms a plurality of images including reflected light of said slit light and said measurement surface. The measuring device according to any one of claims 1 to 7,
a processing unit that detects the outer peripheral surface of the object to be measured from a plurality of slit lights of the captured image. 9. The irradiating unit irradiates the slit light to at least one of a cylindrical or polygonal prismatic electrode and a cylindrical or polygonal prismatic single cell as the object to be measured. Measuring device as described. A measurement method for measuring the outer peripheral surface of an object to be measured,
an irradiation step of irradiating a plurality of measurement surfaces of the measurement object with slit light from a plurality of directions by one or more branches so that the slit light intersects the plurality of measurement surfaces and has an inclination;
an imaging step of capturing an image including reflected light of the slit light irradiated onto the plurality of measurement surfaces;
a processing step of detecting the outer peripheral surface of the measurement object from a plurality of slit lights of the captured image,
In the irradiating step, by tilting the slit light with respect to a reference line perpendicular to the boundary line of the measurement surface, the slit light is directly irradiated onto the measurement surface and passes through an optical path for branching to the measurement surface. preventing spatial overlap of two or more slit lights when the measurement object is irradiated with the slit lights,
In the imaging step, the measuring method receives reflected light of the slit light directly irradiated to the measurement surface and reflected light of the slit light that has passed through an optical path for branching to the measurement surface. 11. The method according to claim 10, wherein in the irradiation step, the measurement surface is irradiated with the slit light having an inclination of 5° or more and 45° or less with respect to a reference line orthogonal to a boundary line of the measurement surface. measurement method. In the irradiating step, an optical path length correcting member for correcting the optical path length of the slit light beams split with respect to the slit light beams directly irradiated onto the measurement surface, and an optical path length correction member for reflecting the optical path length corrected slit light beams onto the measurement surface. 12. The measuring method according to claim 10, wherein said slit light is applied to said measurement surface via an optical system member including an irradiation mirror. In the irradiating step, a first optical path that directly irradiates the first measurement surface with the slit light, a second optical path that branches and irradiates the slit light onto the second measurement surface, and a second optical path that branches and irradiates the slit light onto the third measurement surface. irradiating the measurement surface with the slit light through a third optical path for irradiation,
13. The imaging step according to any one of claims 10 to 12, wherein an image including slit light irradiated onto the first measurement surface, the second measurement surface, and the third measurement surface is captured. measurement method. The measuring method according to any one of claims 10 to 13, wherein the irradiation step irradiates visible light. The measurement method according to any one of claims 10 to 14, wherein in said imaging step, one image including a plurality of reflected light of said slit light and said measurement surface is obtained. The measurement according to any one of claims 10 to 15, wherein, in the irradiation step, the slit light is irradiated to a cylindrical or polygonal columnar electrode and/or a cylindrical or polygonal columnar single cell as the measurement object. Method. A program that causes one or more computers to implement the steps of the measuring method according to any one of claims 10 to 16.