JP7417367B2 - Parts for film deposition equipment and film deposition equipment equipped with the same - Google Patents
Parts for film deposition equipment and film deposition equipment equipped with the same Download PDFInfo
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- JP7417367B2 JP7417367B2 JP2019098647A JP2019098647A JP7417367B2 JP 7417367 B2 JP7417367 B2 JP 7417367B2 JP 2019098647 A JP2019098647 A JP 2019098647A JP 2019098647 A JP2019098647 A JP 2019098647A JP 7417367 B2 JP7417367 B2 JP 7417367B2
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- 230000008021 deposition Effects 0.000 title description 3
- 229910000838 Al alloy Inorganic materials 0.000 claims description 25
- 230000003746 surface roughness Effects 0.000 claims description 24
- 239000012298 atmosphere Substances 0.000 claims description 7
- 239000002356 single layer Substances 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 239000010408 film Substances 0.000 description 183
- 238000000034 method Methods 0.000 description 24
- 239000000758 substrate Substances 0.000 description 24
- 239000002245 particle Substances 0.000 description 16
- 238000005507 spraying Methods 0.000 description 16
- 238000007751 thermal spraying Methods 0.000 description 16
- 239000000463 material Substances 0.000 description 12
- 230000000694 effects Effects 0.000 description 8
- 238000004544 sputter deposition Methods 0.000 description 8
- 239000007789 gas Substances 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 238000010285 flame spraying Methods 0.000 description 6
- 239000000654 additive Substances 0.000 description 5
- 230000000996 additive effect Effects 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000007750 plasma spraying Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000000889 atomisation Methods 0.000 description 2
- 230000008094 contradictory effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 229910017767 Cu—Al Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000003570 air Substances 0.000 description 1
- 238000004873 anchoring Methods 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- -1 for example Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 238000005477 sputtering target Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4404—Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/024—Deposition of sublayers, e.g. to promote adhesion of the coating
- C23C14/025—Metallic sublayers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
- C23C4/06—Metallic material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
- C23C4/06—Metallic material
- C23C4/067—Metallic material containing free particles of non-metal elements, e.g. carbon, silicon, boron, phosphorus or arsenic
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
- C23C4/06—Metallic material
- C23C4/08—Metallic material containing only metal elements
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/12—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the method of spraying
- C23C4/131—Wire arc spraying
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- General Chemical & Material Sciences (AREA)
- Coating By Spraying Or Casting (AREA)
- Physical Vapour Deposition (AREA)
Description
本発明は、付着した膜の密着性や剥離応力緩和効果に優れた成膜装置用部品及びこれを備えた成膜装置に関する。 The present invention relates to a component for a film forming apparatus that has excellent adhesion of a deposited film and an effect of relieving peeling stress, and a film forming apparatus equipped with the same.
近年、半導体製品は、減圧雰囲気とされた成膜室内において、各種の被膜形成方法(たとえば、スパッタリング法やCVD法など)を用い、被処理体(たとえば、Si基板など)上に各種の被膜を形成することにより製造される。その際、目的とする被処理体に形成される被膜は、成膜室内において、成膜時に被処理体の周りに存在する、各種の成膜装置用部品にも、当該被膜が付着することは避けられない。 In recent years, semiconductor products have been manufactured using various film forming methods (e.g., sputtering, CVD, etc.) on objects to be processed (e.g., Si substrates, etc.) in a film forming chamber with a reduced pressure atmosphere. Manufactured by forming. At that time, the film formed on the target object to be processed does not adhere to various parts of the film forming equipment that are present around the object to be processed during film formation in the film forming chamber. Inevitable.
このような現象は、成膜の回数(バッチ数)が増えるほど顕在化する。すなわち、被処理体は通常、1つの成膜操作ごとに交換されるのに対して、被処理体の周りに存在する各種の成膜装置用部品は、成膜操作ごとに交換されない。これにより、成膜操作を繰り返すにつれて、成膜装置用部品上には、成膜の回数(バッチ数)分だけ、付着した被膜が重なった状態、すなわち厚膜が堆積された状態となる。そのため、成膜装置用部品に付着した被膜は、密着性の臨界点を超えると、剥離、脱落し、微粒子、塵埃などのパーティクルと称されるものになり、これが成膜室内に浮遊し、成膜室内を汚染する。このようなパーティクルが半導体製品の中に取り込まれると、半導体製品の歩留まりを大きく低下させる虞があった。 Such a phenomenon becomes more obvious as the number of times of film formation (number of batches) increases. That is, while the object to be processed is usually replaced for each film-forming operation, the various parts of the film-forming apparatus that are present around the object to be processed are not replaced for each film-forming operation. As a result, as the film-forming operation is repeated, the deposited films overlap for the number of times (batch number) of film-forming, that is, a thick film is deposited on the parts for the film-forming apparatus. Therefore, when the film attached to the parts of the film forming apparatus exceeds the critical point of adhesion, it peels off and falls off, becoming particles such as fine particles and dust, which float inside the film forming chamber and form the film. Contaminates the inside of the membrane chamber. If such particles are taken into semiconductor products, there is a risk that the yield of semiconductor products will be significantly reduced.
この問題を解消するため、従来の成膜装置では、成膜室内に配置される成膜装置用部品の表面に、各種の溶射膜を設けた仕様のものが用いられている(特許文献1)。
溶射膜は一般に、ブラスト(Blast)処理表面に比べてその表面粗さが大きいので、溶射膜上に付着した被膜(以下、付着膜と呼ぶ)はアンカー効果を得やすいことが知られている。また、溶射膜は付着膜との接触面積が大になることから剥離し難くなる傾向がある。さらに、溶射膜はある程度の空孔率を有しており、その空孔の存在によってやや変形し易く、その度合いに応じて付着膜の剥離応力が緩和されることも公知である。
In order to solve this problem, conventional film-forming equipment has specifications in which various sprayed films are provided on the surfaces of parts of the film-forming equipment placed in the film-forming chamber (Patent Document 1). .
It is known that a thermal sprayed film generally has a larger surface roughness than a blast-treated surface, so that a film deposited on the thermal sprayed film (hereinafter referred to as an adhered film) tends to have an anchoring effect. Furthermore, since the sprayed film has a large contact area with the deposited film, it tends to be difficult to peel off. Furthermore, it is also known that the sprayed film has a certain degree of porosity, and the presence of the pores makes it slightly deformable, and the peeling stress of the deposited film is alleviated depending on the degree of deformation.
しかしながら、付着膜が内部応力の高いスパッタ膜に対しては、必ずしも満足な効果が得られていなかった。すなわち、前述したように、スパッタ膜が繰り返し堆積され厚膜化されたが状態になると、成膜装置用部品に付着したスパッタ膜は、密着性の臨界点を超え易くなり、剥離、脱落し、微粒子、塵埃などのパーティクルが発生し、これが成膜室内に浮遊し、成膜室内を汚染する問題が顕在化する。
このため、内部応力の高い付着膜に対して、剥離や脱落の発生が起こりにくい成膜装置用部品及びこれを備えた成膜装置の開発が期待されていた。
However, a satisfactory effect has not always been obtained for sputtered films whose deposited films have high internal stress. That is, as mentioned above, when the sputtered film is repeatedly deposited and becomes thick, the sputtered film attached to the parts for the film forming apparatus tends to exceed the critical point of adhesion, peeling off, falling off, and so on. Particles such as fine particles and dust are generated and float inside the film forming chamber, causing the problem of contaminating the inside of the film forming chamber.
For this reason, there have been expectations for the development of parts for film forming apparatuses that are less prone to peeling or falling off of deposited films with high internal stress, and film forming apparatuses equipped with the same.
本発明は、上記の事情に鑑みてなされたもので、内部応力の高い付着膜に対して、剥離や脱落の発生が起こりにくい成膜装置用部品及びこれを備えた成膜装置を提供することを目的とする。 The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide a component for a film forming apparatus that is unlikely to cause peeling or falling off of an adhered film with high internal stress, and a film forming apparatus equipped with the same. With the goal.
上記課題を解決するために、請求項1に記載の発明は、成膜雰囲気に晒される表面に、4.81~11.6at%のSiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)または1.1~2.9at%のTiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)からなる溶射膜が形成された成膜装置用部品であって、前記成膜装置用部品の前記表面には、単層のみの前記溶射膜が形成され、前記溶射膜上には、別の溶射膜が追加的に積層されず、前記溶射膜の表面粗さRa[μm]が50~70の範囲内であり、前記溶射膜の密着力[N/mm2]が6以上であることを特徴とする。 In order to solve the above problem, the invention according to claim 1 provides an Al alloy containing 4.81 to 11.6 at% Si (however, Bi, Ce and Mg are not included) on the surface exposed to the film forming atmosphere. Parts for film forming equipment on which a thermal sprayed film is formed of an Al alloy containing 1.1 to 2.9 at% Ti (excluding that containing Bi, Ce, and Mg) The thermal sprayed film is formed in a single layer on the surface of the part for the film forming apparatus , and another thermal sprayed film is not additionally laminated on the thermal sprayed film, and the thermal sprayed film is It is characterized in that the surface roughness Ra [μm] is within the range of 50 to 70, and the adhesion force [N/mm 2 ] of the sprayed film is 6 or more.
請求項2に記載の発明は、成膜室と、前記成膜室内に配置され、表面に溶射膜が形成された成膜装置用部品とを備えた成膜装置であって、前記溶射膜は、4.81~11.6at%のSiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)または1.1~2.9at%のTiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)からなり、前記成膜装置用部品には、単層のみの前記溶射膜が形成され、前記溶射膜上には、別の溶射膜が追加的に積層されず、前記溶射膜の表面粗さRa[μm]が50~70の範囲内であり、前記溶射膜の密着力[N/mm
2
]が6以上であることを特徴とする。
The invention according to
請求項1に記載の成膜装置用部品は、成膜雰囲気に晒される表面に、4.81~11.6at%のSiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)または1.1~2.9at%のTiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)からなる溶射膜が形成されており、前記溶射膜の表面粗さRa[μm]が50~70の範囲内であり、前記溶射膜の密着力[N/mm 2 ]が6以上である。これにより、内部応力の高い付着膜に対して、剥離や脱落の発生が起こりにくい成膜装置用部品が得られる。 The part for a film forming apparatus according to claim 1 is provided with an Al alloy containing 4.81 to 11.6 at% Si (but not including Bi, Ce and Mg) on the surface exposed to the film forming atmosphere. ) or an Al alloy containing 1.1 to 2.9 at% Ti (excluding Bi, Ce, and Mg) , and the surface roughness of the sprayed film is Ra [μm] is within the range of 50 to 70, and the adhesion force [N/mm 2 ] of the sprayed film is 6 or more . As a result, it is possible to obtain a component for a film forming apparatus in which peeling or falling off does not easily occur with respect to a deposited film with high internal stress.
請求項2に記載の成膜装置は、成膜室内に配置される成膜装置用部品が、表面に溶射膜が形成されおり、前記溶射膜は、4.81~11.6at%のSiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)または1.1~2.9at%のTiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)からなり、前記溶射膜の表面粗さRa[μm]が50~70の範囲内とし、前記溶射膜の密着力[N/mm
2
]を6以上とした。これにより、成膜装置用部品の表面に設けた溶射膜は、内部応力の高い付着膜に対して、剥離や脱落が生じにくくなるので、パーティクルの発生が抑制される。本発明は、特に付着膜が内部応力の高いスパッタ膜に対しても、この効果が得られる成膜装置の提供に貢献する。
In the film forming apparatus according to
図1は、本実施形態に係る成膜装置10の一例としてスパッタリング装置を示す概略構成図である。真空槽1は全体としてステンレス(たとえば、SUS304)にて作製されており、真空槽1の内部空間が成膜室20を構成している。成膜室20には、プロセスガス供給手段(不図示)に繋がるプロセスガスの導入管8と、これに対向する位置に真空排気手段(不図示)に繋がる排気管9が接続されている。真空槽1の内部空間である成膜室20は、排気管9を通じて排気手段(不図示)によって真空排気される。
FIG. 1 is a schematic configuration diagram showing a sputtering apparatus as an example of a
成膜室20には、高周波電源2に電気的に接続されカソードとして機能するターゲットTと、アノードとして機能する基板ホルダ4とが平行に対向して配置される。ターゲットTの背後には、中央部に円柱状の磁石6が、外周部には円環状の磁石6’が、互いに極性が逆になるように配置され、磁力線の一部がターゲットTの表面上に漏洩し、当該表面と平行をなしている。基板ホルダ4には基板Wが載置され、バイアス電源(不図示)が電気的に接続されている。基板ホルダ4の背後には、基板Wを所定の温度に制御する温度制御手段5が配置されている。
In the
基板WとターゲットTとの間には、基板Wと水平をなす面内において回転可能とされ、基板Wに対する成膜が可能な位置と、成膜を遮蔽する位置とに、その位置を変更するように、シャッター板7が配置されている。シャッター板7はステンレス(たとえば、SUS340)にて作製されている。 A space between the substrate W and the target T is rotatable in a plane parallel to the substrate W, and the position is changed between a position where film formation can be performed on the substrate W and a position where film formation is blocked. The shutter plate 7 is arranged like this. The shutter plate 7 is made of stainless steel (for example, SUS340).
シャッター板7は、本実施形態に係る成膜装置用部品の一つである。図2はシャッター板7の要部拡大断面図である。シャッター板7は、成膜室20において成膜雰囲気に晒される表面に、AlまたはAl合金からなる溶射膜3が形成されている。そして、その溶射膜3の表面粗さRa[μm]は50~70の範囲内とされている。
The shutter plate 7 is one of the parts for the film forming apparatus according to this embodiment. FIG. 2 is an enlarged sectional view of a main part of the shutter plate 7. As shown in FIG. The shutter plate 7 has a sprayed film 3 made of Al or an Al alloy formed on the surface exposed to the film forming atmosphere in the
溶射膜3がAl合金の場合は、添加元素がSiまたはTiが好ましい。溶射膜3がCu合金の場合、添加元素はAlが好ましい。 When the sprayed film 3 is an Al alloy, the additive element is preferably Si or Ti. When the sprayed film 3 is a Cu alloy, the additive element is preferably Al.
溶射法としては、アーク溶射法や、フレーム溶射法、プラズマ溶射法などを用いることができるが、本発明を実現するためにはアーク溶射法が好ましい。アーク溶射法によれば、表面粗さRa[μm]が50~70の範囲内であり、かつ、密着力[N/mm 2 ]が6以上である、溶射膜3が形成できる。これにより、内部応力の高い付着膜に対して、剥離や脱落の発生が起こりにくい成膜装置用部品が得られる。 As the thermal spraying method, an arc thermal spraying method, a flame thermal spraying method, a plasma thermal spraying method, etc. can be used, but the arc thermal spraying method is preferable in order to realize the present invention. According to the arc spraying method, a sprayed film 3 having a surface roughness Ra [μm] within the range of 50 to 70 and an adhesion force [ N/mm 2 ] of 6 or more can be formed. As a result, it is possible to obtain a component for a film forming apparatus in which peeling or falling off does not easily occur with respect to a deposited film with high internal stress.
図3は、アーク溶射法を説明する模式図である。
アーク溶射とは、矢印の方向に連続的に送給される2本の溶射材料(Spray coating wire)の先端で直流アーク放電を発生させるために、当該2本の溶射材料の間に、所定の電圧/電流を印加することにより、当該2本の溶射材料の先端近傍にアーキング(Arcing)を発生させる。同時に、吹き付けガス(Compressor Air)を用い、アーキングによって溶融した金属を噴霧化(Atomizing)する。この噴霧化された粒子(Arc spray particles)を、エアーキャップ(Air Cap)に設けた開口部を通して、対象基材(不図示)に吹き付けることにより、対象基材(不図示)上に堆積させて、所望の溶射膜3が形成される。吹き付けガスとしては、たとえば、空気や窒素ガス、アルゴンガスなどが好適に用いられる。
FIG. 3 is a schematic diagram illustrating the arc spraying method.
Arc spraying is a process in which a predetermined distance between two spray coating wires is generated in order to generate a DC arc discharge at the tips of two spray coating wires that are continuously fed in the direction of the arrow. By applying voltage/current, arcing is generated near the tips of the two thermal spray materials. At the same time, compressor air is used to atomize the metal melted by arcing. These atomized particles (Arc spray particles) are deposited on a target substrate (not shown) by spraying them onto the target substrate (not shown) through an opening provided in an air cap. , a desired thermal sprayed film 3 is formed. As the blowing gas, for example, air, nitrogen gas, argon gas, etc. are suitably used.
本発明者らは、エアーキャップに設けた開口部の穴径については、次の傾向があることを見出し、本発明の好適な条件を選定した。
エアーキャップに設けた開口部の穴径は、小さければ小さいほど、エアーキャップ内の圧力が上昇し、微細な噴霧化が可能となる。これにより、対象基材上に形成された溶射膜3は、表面粗さが小さく、密着力が高い傾向となる。
これに対して、エアーキャップに設けた開口部の穴径を大きくすると、エアーキャップ内の圧力が下がり、噴霧化が進まなくなる。このため、対象基材上に形成された溶射膜3は、表面粗さが大きく、密着力が低下する傾向となる。
The present inventors found that the hole diameter of the opening provided in the air cap has the following tendency, and selected suitable conditions for the present invention.
The smaller the hole diameter of the opening provided in the air cap, the higher the pressure inside the air cap, and the more fine the atomization becomes possible. As a result, the sprayed film 3 formed on the target base material tends to have low surface roughness and high adhesion.
On the other hand, if the hole diameter of the opening provided in the air cap is increased, the pressure inside the air cap will decrease and atomization will not proceed. For this reason, the sprayed film 3 formed on the target base material has a large surface roughness and tends to have low adhesion.
本発明者らは、二律背反する条件、すなわち、表面粗さが大きく、密着力が高い傾向となる溶射膜3を作製する溶射条件を検討した。
このような範囲の表面粗さRaや密着力を備えたAlからなる溶射膜3を作製するための溶射条件としては、Air capの穴径は大きい方が好ましい。電圧は安定したアーキングできる範囲で小さい方が好ましい。ガス圧は溶射膜3の密着力の低下が生じない範囲で低い方が望ましい。具体的には、電圧[V]は30~33、電流[A]は150~200、ガス種は空気、アルゴンあるいは窒素、ガス圧[bar]は28~35、Air capの穴径[mm]はφ12~14、が各々好適である。
The present inventors investigated contradictory conditions, that is, thermal spraying conditions for producing a thermal sprayed film 3 that tends to have large surface roughness and high adhesion.
As for the thermal spraying conditions for producing a thermal sprayed film 3 made of Al having surface roughness Ra and adhesion within such a range, it is preferable that the hole diameter of the air cap is large. It is preferable that the voltage be as low as possible within a range that allows stable arcing. The gas pressure is desirably as low as possible without reducing the adhesion of the sprayed film 3. Specifically, the voltage [V] is 30 to 33, the current [A] is 150 to 200, the gas type is air, argon, or nitrogen, the gas pressure [bar] is 28 to 35, and the air cap hole diameter [mm]. and φ12 to φ14, respectively.
上述したアーク溶射法によりAlまたはAl合金からなる溶射膜3を形成する際に用いる基材としては、たとえば、SUS、Al、Ti、各種セラミクスが挙げられる。基材の表面粗さRa[μm]は3~8の範囲内が好ましい。 Examples of the base material used when forming the sprayed film 3 made of Al or Al alloy by the above-mentioned arc spraying method include SUS, Al, Ti, and various ceramics. The surface roughness Ra [μm] of the base material is preferably within the range of 3 to 8.
以上のように構成された成膜装置10において、成膜室20内を例えば10-3~10-1Pa程度のアルゴン雰囲気に保ち、高周波電源2によってターゲットTに高周波電力を印加することにより、ターゲットTの上方の電界と磁界が直交している部分で効果的にグロー放電が生起され円環状にプラズマが発生する。このプラズマ中のAr+イオンがカソードであるターゲットTの近傍で加速されてターゲットTの表面に衝突し、ターゲット原子をスパッタするので、スパッタされた粒子はアノードである基板ホルダ4の基板W上に付着して目的とする薄膜を形成させる。
In the
シャッター板7は、スパッタリングの開始時点ではターゲットTと基板Wとの間を閉じており、シャッター板7にはスパッタされた粒子の膜が付着する。スパッタリングが定常状態に達するとシャッター板7を回転させてターゲットTと基板Wとの間を開とすることにより、基板Wの面に成膜が開始される。このときにも、基板Wの近傍にあるシャッター板7に同様な成膜がされる。 The shutter plate 7 closes the gap between the target T and the substrate W at the start of sputtering, and a film of sputtered particles adheres to the shutter plate 7. When sputtering reaches a steady state, film formation on the surface of the substrate W is started by rotating the shutter plate 7 to open the space between the target T and the substrate W. At this time as well, a similar film is formed on the shutter plate 7 near the substrate W.
基板Wは所定の膜厚に形成されると、次の基板に交換してスパッタリングは継続される。シャッター板7はそのまま継続して使用されるためにスパッタリングが繰り返されていくとシャッター板7に付着した膜は徐々に厚くなっていくが、本実施形態では、上述したようにシャッター板7の表面に、Alからなる溶射膜3が形成されているので、その溶射膜3に対する付着膜の密着性を高め、さらに剥離応力を緩和することができ、付着膜を剥離しにくくできる。この結果、付着膜の剥離に起因して生じるパーティクルによる成膜室20内の汚染を抑制できる。上記構成の溶射膜3は、特に、剥離の原因となる内部応力が比較的大きな、Ta膜、TaN膜、Ti膜、TiN膜、W膜、WN膜、WSi膜、SiN膜、およびそれらの積層膜の付着に対して有効である。
When the substrate W is formed to a predetermined thickness, it is replaced with the next substrate and sputtering is continued. Since the shutter plate 7 is continuously used as it is, the film attached to the shutter plate 7 gradually becomes thicker as sputtering is repeated, but in this embodiment, as described above, the film attached to the shutter plate 7 is In addition, since the thermal sprayed film 3 made of Al is formed, the adhesion of the adhered film to the thermal sprayed film 3 can be improved, and peeling stress can be further alleviated, making it difficult to peel off the adhered film. As a result, it is possible to suppress contamination in the
さらに、上記構成の溶射膜3は大気中に置かれても酸化しにくく上述の特性を長期間維持できる。この結果、成膜装置のメンテナンス周期の長期化が図れ、成膜装置の稼働率を向上でき生産性を高められる。 Furthermore, the sprayed film 3 having the above structure is not easily oxidized even when placed in the atmosphere, and can maintain the above-mentioned characteristics for a long period of time. As a result, the maintenance cycle of the film forming apparatus can be extended, the operating rate of the film forming apparatus can be improved, and productivity can be increased.
なお、上述したアーク溶射法を検討するに前に、本発明者らは、比較のために、フレーム溶射法とプラズマ溶射法についても調査した。その結果、以下の傾向があることが確認された。
フレーム溶射法は、ワイヤーを溶かしながら吹き付ける方法のため、任意に溶融量を調節することが困難である。このため、対象基材上に形成された溶射膜3は、表面粗さが小さく、表面プロファイルが整ったものとなる。
プラズマ溶射法は、使用する材料が数十~百μm程度の粒子を用い、プラズマ(plasma)の炎で溶融させて吹き付け、対象基材上に堆積して溶射膜3を形成する。その際、粒子はプラズマの高い熱量で完全に溶融し高い熱量を持っている。このため、対象基材上に堆積する際には、粒子は大きく扁平し、表面粗さが小さく、表面プロファイルが整った溶射膜3が形成される。
In addition, before examining the above-mentioned arc thermal spraying method, the present inventors also investigated flame thermal spraying method and plasma thermal spraying method for comparison. As a result, the following trends were confirmed.
Since flame spraying is a method of spraying wire while melting it, it is difficult to arbitrarily adjust the amount of melting. Therefore, the sprayed film 3 formed on the target base material has low surface roughness and a uniform surface profile.
In the plasma spraying method, the material used is particles of about several tens to 100 μm, which are melted by a plasma flame, sprayed, and deposited on the target substrate to form the sprayed film 3. At that time, the particles are completely melted by the high heat of the plasma and have a high heat content. Therefore, when deposited on the target substrate, the particles are large and flat, and a sprayed film 3 with small surface roughness and a uniform surface profile is formed.
したがって、フレーム溶射法とプラズマ溶射法においては、上述した本発明の二律背反する条件、すなわち、表面粗さが大きく、密着力が高い傾向となる溶射膜3を作製する溶射条件が得られないことが分かった。具体的には、フレーム溶射法とプラズマ溶射法では、表面粗さRaが8~20μm程度の溶射膜3しか得られない。溶射膜3の粗面化には、本発明のアーク溶射法が必須であることが確認された。 Therefore, in the flame spraying method and the plasma spraying method, it is impossible to obtain the above-mentioned contradictory conditions of the present invention, that is, the spraying conditions for producing a sprayed film 3 that tends to have large surface roughness and high adhesion. Do you get it. Specifically, the flame spraying method and the plasma spraying method can only provide a sprayed film 3 with a surface roughness Ra of about 8 to 20 μm. It was confirmed that the arc spraying method of the present invention is essential for roughening the sprayed film 3.
<実施例1>
実施例1は、平面寸法80mm×100mm、厚さ2mmのSUS304製基材を用い、その表面に、アーク溶射法を用いてAl単体からなる溶射膜3(厚さ350μm)を形成した。SUS304製基材の表面には、溶射膜の形成前に、予め、アンカー効果が得られるようにドライブラスト処理を行い、表面を荒らした。溶射法はアーク溶射法にて行った。後述する表1に示す溶射条件の異なる4つの試料(Al-1、Al-2、Al-3、Al-4)を作製した。
また、これらとは別に、添加元素がSiまたはTiのAl合金からなる溶射膜も作製した。その際、Siの含有率は4.81~11.6at%、Tiの含有率は1.1~2.9at%の範囲内とした。
<Example 1>
In Example 1, a SUS304 base material with a planar dimension of 80 mm x 100 mm and a thickness of 2 mm was used, and a sprayed film 3 (thickness: 350 μm) made of Al alone was formed on the surface thereof using an arc spraying method. Before forming the sprayed film, the surface of the SUS304 base material was dry blasted to roughen the surface so as to obtain an anchor effect. The thermal spraying method was an arc thermal spraying method. Four samples (Al-1, Al-2, Al-3, Al-4) having different thermal spraying conditions as shown in Table 1 below were prepared.
Separately from these, a sprayed film made of an Al alloy containing Si or Ti as an additive element was also produced. At that time, the Si content was in the range of 4.81 to 11.6 at%, and the Ti content was in the range of 1.1 to 2.9 at%.
<比較例1>
比較例1は、実施例1と同基材の表面にAl単体からなる溶射膜を、フレーム溶射法により同様の厚さ(厚さ350μm)となるように形成した。後述する表1に示す1つの試料(Ref.Flame Al)を作製した。
<Comparative example 1>
In Comparative Example 1, a thermally sprayed film made of simple Al was formed on the surface of the same base material as in Example 1 by flame spraying so as to have the same thickness (thickness 350 μm). One sample (Ref.Flame Al) shown in Table 1 described below was produced.
<実施例2>
実施例2は、実施例1と同じ基材を用い、その表面に、アーク溶射法を用いてCu-Al合金からなる溶射膜3(厚さ350μm)を形成した。Cu-Al合金の組成は、Cu-7.9at%Alとした。基材の表面には、実施例1と同様に、溶射膜の形成前に、予め、アンカー効果が得られるようにドライブラスト処理を行い表面を荒らした。溶射法はアーク溶射法にて行った。後述する表1に示す溶射条件の異なる2つの試料(Cu-Al-1、Cu-Al-2)を作製した。
また、これらとは別に、添加元素を含まないCu膜(Cu単体からなる溶射膜)とCu-Al合金からなる溶射膜も作製した。その際、Cu-Al合金からなる溶射膜は、Alの含有率を6.7~11.1at%の範囲内とした。
<Example 2>
In Example 2, the same base material as in Example 1 was used, and a sprayed film 3 (thickness: 350 μm) made of a Cu--Al alloy was formed on the surface thereof using an arc spraying method. The composition of the Cu--Al alloy was Cu-7.9 at% Al. As in Example 1, the surface of the base material was roughened by dry blasting in advance to obtain an anchor effect before forming the sprayed film. The thermal spraying method was an arc thermal spraying method. Two samples (Cu-Al-1 and Cu-Al-2) with different thermal spraying conditions shown in Table 1 described below were prepared.
Separately from these, a Cu film containing no additive elements (a sprayed film made of pure Cu) and a sprayed film made of a Cu--Al alloy were also produced. At that time, the Al content of the sprayed film made of the Cu--Al alloy was within the range of 6.7 to 11.1 at%.
以下に示す表1は、実施例1、比較例1、実施例2において作製した各試料の作製条件と形成した溶射膜の評価である。表面粗さRaの評価は、触針式表面粗さ測定機(東京精密社製、型番:SURFCOM TOUCH50)を用い、JISB0601(1994)に規定される条件で行った。密着力の評価は、プルオフ式付着性試験機(ELCOMETER社製、型番:510)を用い、JISK5600-5-7に規定される条件にて行った。 Table 1 shown below shows the production conditions of each sample produced in Example 1, Comparative Example 1, and Example 2, and evaluation of the sprayed coatings formed. The surface roughness Ra was evaluated using a stylus surface roughness measuring device (manufactured by Tokyo Seimitsu Co., Ltd., model number: SURFCOM TOUCH50) under the conditions specified in JISB0601 (1994). The adhesion was evaluated using a pull-off adhesion tester (manufactured by ELCOMETER, model number: 510) under the conditions specified in JIS K5600-5-7 .
形成した溶射膜の評価より、以下の点が明らかとなった。
(a1)アーク溶射法を用いることにより、フレーム溶射法で作製された試料より、Raが大きく、かつ、密着力の大きな溶射膜を形成することができる(試料番号1と試料番号2の比較)。
(a2)Al単体からなる溶射膜では、表面粗さ[μm]が15~70の範囲内であり、かつ、密着力[N/mm
2 ]が6.51~7.11の範囲内となる(試料番号2~5)。
(a3)Cu-Al合金からなる溶射膜では、表面粗さ[μm]が20~60の範囲内であり、かつ、密着力[N/mm
2 ]が6.08~8.82の範囲内となる(試料番号6~7)。
(a4)溶射膜の表面粗さが、上記範囲を超えた場合には、溶射膜の強度が低下し、溶射粒子の脱落が起こるようになり、パーティクルの発生量が増加することが分かった。
(a5)溶射膜の膜厚は、300~600μmなければ、所望の表面粗さが確保できない(試料番号2と試料番号3~5の比較)。
(a6)密着力の評価結果より、溶射膜の膜厚を増やすことで、応力吸収量が増加する(強度の高い溶射膜が得られる)ことが分かった。
The following points became clear from the evaluation of the formed sprayed film.
(a1) By using the arc spraying method, it is possible to form a sprayed film with a larger Ra and greater adhesion than samples produced by the flame spraying method (comparison of sample number 1 and sample number 2) .
(a2) In the sprayed film made of Al alone, the surface roughness [μm] is within the range of 15 to 70, and the adhesion force [ N/mm 2 ] is within the range of 6.51 to 7.11. (
(a3) For a sprayed film made of Cu-Al alloy, the surface roughness [μm] is within the range of 20 to 60, and the adhesion force [ N/mm 2 ] is within the range of 6.08 to 8.82. (Sample numbers 6-7).
(a4) It has been found that when the surface roughness of the sprayed film exceeds the above range, the strength of the sprayed film decreases, sprayed particles begin to fall off, and the amount of particles generated increases.
(a5) The desired surface roughness cannot be secured unless the sprayed film has a thickness of 300 to 600 μm (comparison of
(a6) From the adhesion evaluation results, it was found that increasing the thickness of the sprayed film increases the amount of stress absorption (a sprayed film with high strength can be obtained).
表1には示さないが、Raが70μmより大きい粗さになると、溶射粒子間の密着性を確保することが難しくなることが確認された。
また、表1には示さないが、添加元素がSiまたはTiのAl合金からなる溶射膜においても、上述したAl単体からなる溶射膜(試料番号2~5)と同様の結果が得られた。また、Cu単体からなる溶射膜においても、上述したCu-Al合金からなる溶射膜(試料番号6~7)と同様の結果が得られた。
Although not shown in Table 1, it was confirmed that when the roughness Ra was greater than 70 μm, it became difficult to ensure adhesion between the sprayed particles.
Although not shown in Table 1, the same results as the above-mentioned sprayed films made of Al alone (
以上の評価結果より、アーク溶射法を用いて形成された本発明に係るAl単体またはAl合金からなる溶射膜は、従来のフレーム溶射法により形成されたAl単体からなる溶射膜に比べて、表面粗さが大きく、かつ、密着力が大きいことが分かった。これにより、本発明に係るAl単体またはAl合金からなる溶射膜を備えることにより、長期間にわたって、付着膜との高い密着性及び高い剥離応力緩和効果を安定して得られる。
また、アーク溶射法を用いて形成された本発明に係るCu単体またはCu合金からなる溶射膜についても、Al単体またはAl合金からなる溶射膜と同様の作用・効果が確認された。
ゆえに、本発明は、内部応力の高い付着膜に対して、剥離や脱落の発生が起こりにくい成膜装置用部品及びこれを備えた成膜装置の提供に貢献する。
From the above evaluation results, the sprayed film made of Al alone or Al alloy according to the present invention formed using the arc spraying method has a higher surface area than the sprayed film made of Al alone formed by the conventional flame spraying method. It was found that the roughness was large and the adhesion was large. As a result, by providing the sprayed film made of Al alone or an Al alloy according to the present invention, high adhesion to the deposited film and high peel stress relaxation effect can be stably obtained over a long period of time.
Furthermore, the same actions and effects as the sprayed film made of Al alone or an Al alloy were confirmed for the sprayed film made of Cu alone or Cu alloy according to the present invention, which was formed using the arc spraying method.
Therefore, the present invention contributes to providing a component for a film forming apparatus that is less likely to cause peeling or falling off of a deposited film with high internal stress, and a film forming apparatus equipped with the same.
本実施形態の溶射膜を用いることで、スパッタリング装置において成膜室内を汚染させるようなパーティクルを生じさせるまでの積算電力が従来はTi/W積層膜において75kWh、W/WN積層膜において300kWhだったものを、Ti/W積層膜において150kWh、W/WN積層膜において600kWhまで延ばすことを可能になった。 By using the sprayed film of this embodiment, the integrated power required to generate particles that contaminate the inside of the film forming chamber in a sputtering device was conventionally 75 kWh for Ti/W laminated film and 300 kWh for W/WN laminated film. It has become possible to increase the power consumption to 150kWh using a Ti/W multilayer film and 600kWh using a W/WN multilayer film.
以上、本発明の実施形態について説明したが、勿論、本発明はこれに限定されることな
く、本発明の技術的思想に基づいて種々の変形が可能である。
Although the embodiments of the present invention have been described above, the present invention is of course not limited thereto, and various modifications can be made based on the technical idea of the present invention.
本発明はスパッタリング装置に限らず、CVD装置、蒸着装置などその他の成膜装置にも適用可能である。また、成膜時の雰囲気は減圧下に限らず、大気圧下であってもよい。 The present invention is applicable not only to sputtering apparatuses but also to other film forming apparatuses such as CVD apparatuses and vapor deposition apparatuses. Furthermore, the atmosphere during film formation is not limited to reduced pressure, but may be atmospheric pressure.
本発明に係る成膜装置用部品としては、シャッター板に限らず、シャワープレート、防着板、マスク、アースシールド、基板ホルダなどが挙げられる。 Parts for a film forming apparatus according to the present invention include not only a shutter plate but also a shower plate, a deposition prevention plate, a mask, an earth shield, a substrate holder, and the like.
本発明は、内部応力の高い付着膜に対して、剥離や脱落の発生が起こりにくい成膜装置用部品及びこれを備えた成膜装置に、広く適用することができる。 INDUSTRIAL APPLICABILITY The present invention can be widely applied to parts for film forming apparatuses in which peeling or falling off does not easily occur with respect to adhered films with high internal stress, and to film forming apparatuses equipped with the same.
1 真空槽、3 溶射膜、7 成膜装置用部品(シャッター板)、10 成膜装置、20 成膜室、T ターゲット、W 基板。 1 Vacuum chamber, 3 Sprayed film, 7 Film forming device parts (shutter plate), 10 Film forming device, 20 Film forming chamber, T target, W substrate.
Claims (2)
前記成膜装置用部品の前記表面には、単層のみの前記溶射膜が形成され、
前記溶射膜上には、別の溶射膜が追加的に積層されず、
前記溶射膜の表面粗さRa[μm]が50~70の範囲内であり、
前記溶射膜の密着力[N/mm2]が6以上であることを特徴とする成膜装置用部品。 An Al alloy containing 4.81 to 11.6 at% Si (excluding those containing Bi, Ce, and Mg) or 1.1 to 2.9 at% Ti is placed on the surface exposed to the film forming atmosphere. A part for a film forming apparatus on which a thermal sprayed film made of an Al alloy containing (excluding that containing Bi, Ce and Mg) is formed,
The thermal sprayed film of only a single layer is formed on the surface of the part for the film forming apparatus ,
Another thermal sprayed film is not additionally laminated on the thermal sprayed film,
The surface roughness Ra [μm] of the sprayed film is within the range of 50 to 70,
A component for a film forming apparatus, characterized in that the thermal sprayed film has an adhesion force [N/mm 2 ] of 6 or more.
前記溶射膜は、4.81~11.6at%のSiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)または1.1~2.9at%のTiを含有するAl合金(ただし、Bi、CeおよびMgを含有することを除く)からなり、
前記成膜装置用部品には、単層のみの前記溶射膜が形成され、
前記溶射膜上には、別の溶射膜が追加的に積層されず、
前記溶射膜の表面粗さRa[μm]が50~70の範囲内であり、
前記溶射膜の密着力[N/mm2]が6以上であることを特徴とする成膜装置。 A film forming apparatus comprising a film forming chamber and parts for the film forming apparatus disposed within the film forming chamber and having a thermally sprayed film formed on a surface thereof,
The sprayed film is made of an Al alloy containing 4.81 to 11.6 at% Si (excluding Bi, Ce, and Mg) or an Al alloy containing 1.1 to 2.9 at% Ti. Consisting of an alloy (excluding those containing Bi, Ce and Mg),
The thermal sprayed film of only a single layer is formed on the part for the film forming apparatus,
Another thermal sprayed film is not additionally laminated on the thermal sprayed film,
The surface roughness Ra [μm] of the sprayed film is within the range of 50 to 70,
A film forming apparatus characterized in that the thermal sprayed film has an adhesion force [N/mm 2 ] of 6 or more.
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| KR1020200053285A KR20200136309A (en) | 2019-05-27 | 2020-05-04 | Component for film formation apparatus, and film formation apparatus provided with component for film formation apparatus |
| CN202010447387.0A CN111996486B (en) | 2019-05-27 | 2020-05-25 | Film forming device member and film forming device provided with film forming device member |
| KR1020220159155A KR20220165676A (en) | 2019-05-27 | 2022-11-24 | Component for film formation apparatus, and film formation apparatus provided with component for film formation apparatus |
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| JP2005248296A (en) | 2004-03-08 | 2005-09-15 | Ulvac Material Kk | Component for film deposition apparatus and film deposition apparatus |
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| JP2004232016A (en) * | 2003-01-30 | 2004-08-19 | Toshiba Corp | Vacuum film forming apparatus component and vacuum film forming apparatus using the same |
| JP2007073823A (en) * | 2005-09-08 | 2007-03-22 | Toshiba Ceramics Co Ltd | Ceramic coating material and manufacturing method thereof |
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| JP2002363728A (en) | 2001-06-06 | 2002-12-18 | Toshiba Corp | Vacuum film forming device parts and vacuum film forming device using the same |
| JP2005248296A (en) | 2004-03-08 | 2005-09-15 | Ulvac Material Kk | Component for film deposition apparatus and film deposition apparatus |
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