JP7420526B2 - Test question generation device, test system and test question generation program - Google Patents

Description

The present invention relates to a test question generation device, a test system, and a test question generation program.

Exam questions have traditionally been generated using computers, and computer processing has also been used to discover individual weaknesses in learning.

For example, Patent Document 1 discloses that each question is assigned a question code and a plurality of weak points corresponding thereto, and there is provided a means for automatically printing out an individual or group question paper, its answer sheet, and an answer sheet; A processing system is disclosed in the answer column of the paper, which includes a score processing means for analyzing the weaknesses of individuals or groups by means of reading question codes.

Japanese Patent Application Publication No. 5-11679

In the processing system disclosed in Patent Document 1, since weak points are attached to questions, practice questions are given to each individual as weak points countermeasures for the elements to which the incorrect question belongs, and the results are checked. In order to do so, you can conduct a weakness countermeasure test.

Here, for test takers who give incorrect answers to questions, by more accurately understanding the cause of the incorrect answers, a high learning effect on test results can be expected. However, in Patent Document 1, even if the attributes of the incorrect question can be grasped, it is not possible to grasp how the examinee made the question incorrectly.

Therefore, the present invention provides a test question generation device, a test system, and a test question generation program that can generate questions and answers that enable test takers to more accurately understand the cause of the mistake for test takers who have given incorrect answers to questions. The purpose is to provide.

A test question generating device according to an aspect of the present invention includes: a question generating means for generating a plurality of questions constituting a test based on the question pattern selected from a storage means storing a plurality of question patterns; correct answer generation means for generating a correct answer for each of the questions generated by the means; The present invention includes a wrong answer generating means for generating an answer, and a test data generating means for generating test data including a plurality of the questions with the correct answer and the wrong answer as options.

According to this configuration, incorrect answers to questions are generated based on predefined incorrect answer factors. Incorrect answer factors are factors that can reveal the incorrectly understood logic when a test taker selects an incorrect answer to a question. In other words, since incorrect answers to questions are generated based on the factors of incorrect answers, when a test taker selects an incorrect answer, the cause of the incorrect answer becomes clear. Therefore, this configuration can generate questions and answers that allow the examinee to more accurately understand the cause of the error for the examinee who gave an incorrect answer to the question.

According to the test question generating device, the answer to the question is a four-choice answer, and the wrong answer generating means generates three of the wrong answers based on the two different wrong answer factors associated with the question pattern. generate an answer. According to this configuration, the cause of the examinee's incorrect answer can be determined concisely.

According to the test question generation device, the question pattern has a substitution element into which a value or a word is input, and the question generation means assigns the value or word to the substitution element for the selected question pattern. The above problem is generated by inputting . According to this configuration, questions and answers can be easily generated.

A test system according to one aspect of the present invention includes the test question generation device described above and an information processing device operated by a test taker who conducted a test based on the test data, the test system comprising: The error factor corresponding to the question for which the examinee gave an incorrect answer is notified via the test taker. According to this configuration, the examinee can recognize the reason why he or she answered the question incorrectly.

A test question generation program according to one aspect of the present invention includes: question generation means for causing a computer to generate a plurality of questions constituting a test based on the question pattern selected from a storage means storing a plurality of question patterns; correct answer generating means for generating a correct answer for each of the questions generated by the problem generating means; and the question generated by the problem generating means based on a predefined incorrect answer factor associated with the question pattern. The test data generation means generates test data including a plurality of questions with the correct answer and the incorrect answer as options.

According to this configuration, it is possible to generate questions and answers that allow the examinee to more accurately understand the cause of the error for the examinee who gave an incorrect answer to the question.

According to the present invention, when a test taker gives an incorrect answer to a question, it is possible to generate a question that allows the test taker to more accurately understand the cause of the incorrect answer.

FIG. 1 is a schematic configuration diagram showing the configuration of the verification system of this embodiment. FIG. 2 is a block diagram showing the configuration of the problem generation function of this embodiment. FIG. 3 is a flowchart showing the flow of problem generation processing according to this embodiment. FIG. 4 is a block diagram showing the configuration of the test result notification function of this embodiment.

DESCRIPTION OF THE PREFERRED EMBODIMENTS A test question generation device, a test system, and a test question generation program according to embodiments of the present invention will be described below with reference to the drawings. In addition, the embodiment described below shows an example of the case where the present invention is implemented, and the present invention is not limited to the specific configuration described below. In implementing the present invention, specific configurations depending on the embodiments may be adopted as appropriate. In this embodiment, as an example, a case will be described in which a test question generation device, a test system, and a test question generation program are applied to a certification system. The proficiency test of this embodiment is, for example, a proficiency test for determining the level of basic academic ability of a test taker (hereinafter referred to as "test taker"), but the present invention is not limited to this, and can be applied to various tests. You can.

FIG. 1 is a schematic configuration diagram showing the configuration of a verification system 10 of this embodiment. The test system 10 of this embodiment includes a WEB (World Wide Web) server 12, a question generation server 14, a database 16, an administrator PC (Personal Computer) 18, one or more supervisor PCs 20, and a plurality of test takers. It is composed of a terminal 22. Note that the administrator PC 18 and the supervisor PC 20 are, for example, desktop computers or laptop computers, but are not limited thereto, and may be tablet terminals or the like. Further, the test taker terminal 22 is, for example, a tablet terminal, but is not limited to this, and may be a desktop computer or a laptop computer.

The WEB server 12, question generation server 14, database 16, administrator PC 18, supervisor PC 20, and test taker terminal 22 are capable of transmitting and receiving information via communication lines. Note that the communication line is a wide area communication line or a local area network (LAN) provided by an electric utility company or the like, and may be either a wired line or a wireless line.

In this embodiment, the person who manages the certification system 10 is called the administrator, the person who supervises the test at the certification test venue is called the supervisor, and the person who takes the certification test is called the test taker. In this embodiment, as an example, there is one administrator, and there are multiple supervisors and test takers. That is, the administrator PC 18 is operated by the administrator, the supervisor PC 20 is operated by the supervisor, and the test taker terminal 22 is operated by the test taker.

In addition, in the certification test of this embodiment, test takers gather at the venue where the certification test will be conducted, and the certification is conducted at the certification exam venue by CBT (Computer Based Testing) using an information processing terminal. That is, the test taker solves a plurality of questions displayed on the information processing terminal and inputs the answers into the information processing terminal. Then, each test taker is scored based on the answers input into the information processing terminal, and the scoring results (certification test results) are stored in the database 16 for each test taker. Note that the information processing terminal used in the certification test may be prepared by the promoter of the certification test, or may be an information processing terminal owned by the test taker (for example, the test taker terminal 22).

Next, details of various information processing devices that constitute the test system 10 will be explained.

The WEB server 12 is connected to a question generation server 14, a database 16, an administrator's PC 18, a supervisor's PC 20, and a test taker's terminal 22 via a communication line. It has the function of distributing or transmitting content and various information.

The question generation server 14 generates a plurality of questions constituting a certification exam based on a question pattern selected from a database 16 that stores a plurality of question patterns, and also generates answers (correct and incorrect answers) to the questions. .

The database 16 stores a plurality of question patterns, questions and answers generated by the question generation server 14, information on test takers, information on supervisors and administrators, test results of test takers, and the like.

The administrator PC 18 is operated by the administrator to manage test takers and supervisors, and to make settings for holding the certification exam. For example, the administrator PC 18 accepts issuance of an account (hereinafter referred to as "test taker ID") from a test taker, and issues a test taker ID for each test taker. Further, the administrator PC 18 accepts issuance of an account (hereinafter referred to as a "supervisor ID") from a supervisor, and issues a supervisor ID for each supervisor. Furthermore, the administrator can view the test results for each test taker using the manager PC 18. Note that the administrator logs in (accesses) the WEB server 12 by inputting the administrator ID into the administrator PC 18.

The supervisor PC 20 is operated by the supervisor to set and change the examination venue for which the supervisor is responsible. The supervisor logs in (accesses) the WEB server 12 by inputting the supervisor ID into the supervisor PC 20. Further, the supervisor can use the supervisor's PC 20 to view the test results for each test taker at the test venue that the supervisor is in charge of.

The test taker terminal 22 is an information processing device owned by the test taker (or the test taker's guardian). The test taker logs in (accesses) the web server 12 by inputting the test taker ID into the test taker terminal 22. Then, the test taker applies for or changes the test, views test results, etc. via the test taker terminal 22.

Here, in the test system 10 of this embodiment, the question generation server 14 generates a correct answer for each question, and also generates a plurality of correct answers for each question based on a plurality of predefined incorrect answer factors associated with the question pattern. generates a wrong answer.

Incorrect answer factors are factors that can reveal the incorrectly understood logic when a test taker chooses an incorrect answer to a question. In other words, the correct knowledge and understanding necessary to solve the question. This item indicates whether or not the test taker has the following. In this way, the incorrect answers to the questions of this embodiment are generated based on the factors of the incorrect answers, so when the test taker selects an incorrect answer, the cause of the incorrect answer becomes clear. Therefore, with this configuration, for a test taker who has given an incorrect answer to a question, it is possible to generate questions and answers that allow the test taker to more accurately understand the cause of the mistake. By feeding back the factors behind the incorrect answer to the test taker who gave the wrong answer, the test taker can determine the reason why the test taker chose the wrong answer and whether or not they have acquired the correct knowledge and understanding.

Next, incorrect answers generated based on incorrect answer factors will be specifically explained with reference to Examples A to C. Note that one or more erroneous answer factors are associated with the question pattern of this embodiment, and in the following explanation, the combination of the question pattern and the erroneous answer factor will be referred to as a question structure. In the question structure of this embodiment, as an example, two incorrect answer factors are set for each question pattern, but three or more incorrect answer factors may be set. Further, even if the question structure is the same as the question pattern of another question structure, there may be a question structure with different error factors set.

Note that in this embodiment, the answer to the question is one of four options. Furthermore, as shown in Examples A to C, three incorrect answers are generated for one question based on two different error factors. With such a configuration, it becomes possible to easily determine the cause of the test taker's incorrect answer.

(Example A) "Multiplying decimals" for elementary school students
-Problem structure-
<Question pattern> X×Y=
<Incorrect answer factors> Factor A1 “Addition of decimals”, Factor A2 “Scaling of decimal point”
-Generated questions and answers-
<Question text> 0.12×45=
<Correct answer> 5.4
<Incorrect answer 1> 45.12 You are performing ``multiplication with addition'' for decimal numbers.
(Error calculation formula: X+Y)
<Wrong Answer 2> 54 You are using the wrong place value when multiplying decimals.
(Error calculation formula: X×Y×10)
<Wrong Answer 3> 4.512 The decimals are done by "multiplication by addition" and the "place value" is also incorrect.
(Incorrect answer calculation formula: (X+Y)÷10)

(Example B) “Transformation of equations” for junior high school students
-Problem structure-
<Problem pattern> Xa-Yb=Z (*Problem to solve the given expression for a)
<Factors for incorrect answers> Factor B1: “Do not change the sign when transferring terms”, Factor B2: “Do not divide both sides by the coefficient of the letter to be solved”
-Generated questions and answers-
<Question text> 2a-6b=6
<Correct answer> a=3b+3
<Incorrect answer 1> a=-3b+3 Not able to "change the sign when transposing terms".
(Incorrect answer calculation formula: a=(-Yb+Z)/X)
<Incorrect answer 2> a=6b+6 It is not possible to "divide by the coefficient of a" and the term is moved to the right side.
(Incorrect answer calculation formula: a=Yb+Z)
<Incorrect answer 3> a=-6b+6 Neither did they "change the sign when transposing terms" nor were they able to "divide by the coefficient of a."
(Error calculation formula: a=-Yb+Z)

(Example C) “Index calculation” for high school students
-Problem structure-
<Question pattern> AaX×BaY=
<Factors for incorrect answers> Factor C1 “Multiplication of indexes”, Factor C2 “Addition of coefficients”
-Generated questions and answers-
<Question text> a2×a9=
<Correct answer> a11
<Incorrect answer 1> a18 "Exponents are multiplied together."
(Error calculation formula: a(X×Y))
<Incorrect answer 2> 2a11 "Adding coefficients."
(Error calculation formula: (A+B)a(X+Y))
<Incorrect answer 3> 2a18 "Multiplying exponents together" and "adding coefficients together."
(Error calculation formula: (A+B)a(X×Y))

First, the question pattern has a substitution element into which a value or phrase is input, and a question is generated by inputting the value or phrase into the substitution element. In examples A to C, X, Y, Z, A, and B of the question pattern are substitution elements. As an example, in Example A, "0.12" is substituted for X, "45" is substituted for Y, and a question is generated. Furthermore, in example B, a question is generated by assigning "2" to X, "6" to Y, and "6" to Z. Further, in example C, "2" is assigned to X, "9" is assigned to Y, and 1 is assigned to both A and B to generate a problem.

Correct answers and incorrect answers are then generated based on the values input to the substitution elements. Note that the incorrect answer is generated based on the incorrect answer factor associated with the question pattern as described above.

For example, in Example A, the error factors are "addition of decimals" (factor A1) and "scale of decimal point" (factor A2). Therefore, incorrect answer 1 is generated based on factor A1, incorrect answer 2 is generated based on factor A2, and incorrect answer 3 is generated based on factor A1 and factor A2. In other words, incorrect answer 1 is generated based on the assumption that a multiplication problem is mistakenly answered as addition. Further, incorrect answer 2 is generated as an incorrect answer assuming that the answer is given incorrectly. In addition, incorrect answer 3 is generated based on the assumption that the answer is erroneously added and the scale is also incorrect.

Furthermore, in Example B, the incorrect answer factors are ``Do not change the sign when transferring terms'' (Factor B1) and ``Do not divide both sides by the coefficient of the letter to be solved'' (Factor B2). Therefore, similarly to example A, incorrect answer 1 in example B is generated based on factor B1, incorrect answer 2 is generated based on factor B2, and incorrect answer 3 is generated based on factor B1 and factor B2. Ru.

Furthermore, in Example C, the error factors are "multiplying exponents by each other" (factor C1) and "adding coefficients" (factor C2). Therefore, similarly to example A, incorrect answer 1 in example C is generated based on factor C1, incorrect answer 2 is generated based on factor C2, and incorrect answer 3 is generated based on factor C1 and factor C2. Ru.

In this way, one incorrect answer may be generated according to one incorrect answer factor, or one incorrect answer may be generated by combining a plurality of incorrect answer factors. Note that when the test taker selects an incorrect answer generated by combining multiple incorrect answer factors, it becomes difficult for the test taker to determine the cause of the incorrect answer. Furthermore, even if a large number of incorrect answers are prepared for one question, it becomes difficult for test takers who select an incorrect answer to determine the cause of the incorrect answer. Therefore, in this embodiment, the number of factors for incorrect answers is suppressed by making the answers multiple-choice, while increasing the number of questions (question patterns) included in the test questions increases the degree of understanding of the test takers. Make it possible to understand more accurately.

Further, for each error factor, a wrong answer derivation pattern (wrong answer calculation formula) indicating the process leading to an incorrect answer according to the error factor is determined. In example A, in order to generate incorrect answer 1 in which a small number of multiplications are performed by addition, "X+Y" is determined as an example of an incorrect answer calculation formula that leads to an incorrect answer. Furthermore, in order to generate an incorrect answer 2 with an incorrect scale, "X x Y x 10" is determined as an example of an incorrect answer calculation formula that leads to an incorrect answer. Furthermore, in order to generate an incorrect answer 3 that is erroneously added and has an incorrect scale, "(X+Y)÷10" is determined as an example of an incorrect answer calculation formula that leads to an incorrect answer. In this way, incorrect answers are generated based on the incorrect answer derivation pattern determined for each incorrect answer factor.

Examples A to C are arithmetic (mathematics) problems, but the problem is not limited to this.Multiple errors are made for each problem based on multiple types of predefined error factors associated with the problem pattern. If answers can be generated, questions and answers in languages such as English and Japanese, science, and the like may be generated.

Example D is an example of an English exam question, and the basic example sentence shown below is set as the question pattern. "A" is the substitution element, and a phrase (word) is input into the substitution element. This creates a problem. Note that the words input to the substitution element may be set in advance, such as "tomorrow," "yesterday," or "two days ago," and one of the set words may be selected. The incorrect answer factors in Example D are "conjugation" (factor D1) and "auxiliary verb" (factor D1). Note that the test taker selects a word or phrase to be included in the "X" included in the question pattern from among the four answers.

Also in Example D, a wrong answer derivation pattern is determined for each wrong answer factor, and wrong answers are generated according to the wrong answer derivation pattern.

Note that in Example D, in this embodiment, the incorrect answer derivation pattern is determined to change depending on the word substituted for "A". For example, when "tomorrow" is assigned to "A", the incorrect answer derivation patterns are "If a word indicating the future is assigned to A, then X is the present tense" or "A indicates the future." When a phrase is substituted, an auxiliary verb indicating the past is added to X.'' etc. In this way, the question pattern and the error factors associated with it are defined in advance, and the error derivation pattern associated with the error factor changes depending on the values and words input to the substitution elements of the question pattern. may be set.

(Example D)
-Problem structure-
<Question pattern> He “X” to the park “A”.
<Incorrect answer factors> Factor D1 “conjugation”, factor D2 “auxiliary verb”
-Generated questions and answers-
<Question sentence> He “X” to the park yesterday.
<correct answer> went
<Incorrect answer 1> go You are using the wrong word "conjugation".
(Incorrect answer derivation pattern: When a word indicating the past is assigned to A, X is assumed to be present tense.)
<Incorrect answer 2> will went An unnecessary "auxiliary verb" is added.
(Incorrect answer derivation pattern: When a word indicating the past is assigned to A, an auxiliary verb indicating the future is added to X.)
<Wrong answer 3> will go You made a mistake in the ``conjugation'' and added an unnecessary ``auxiliary verb.''
(Incorrect answer derivation pattern: When a word indicating the past is assigned to A, make X present tense and add an auxiliary verb indicating the future.)

Further, in the case of a question related to Japanese, for example, the question pattern may be a selection of kanji, and the error factor may be ``wrong radical of kanji'' or ``wrong reading of kanji''.

FIG. 2 is a block diagram showing the configuration of the problem generation function included in the problem generation server 14 of this embodiment. The problem generation server 14 includes a calculation section 30 composed of a CPU (Central Processing Unit) and the like, a ROM (Read Only Memory) 32 in which various programs and data are stored in advance, and a processing section 30 that is configured with a CPU (Central Processing Unit) and the like, a ROM (Read Only Memory) 32 in which various programs and data are stored in advance, and A RAM (Random Access Memory) 34 used as a work area etc., a storage medium 36 for storing programs and various data for realizing a problem generation function, and a communication unit 38 for transmitting and receiving data to and from other information processing devices, etc. We are prepared.

The calculation unit 30 of this embodiment includes a question selection unit 40, a question generation unit 42, a correct answer generation unit 44, an incorrect answer generation unit 46, and a test data generation unit 48.

The question selection section 40 selects a question pattern (question structure) from the database 16 based on question generation conditions input by the administrator via the administrator's PC 18 . The question generation conditions include, for example, the type of certification test, the target group of test takers for the certification test, and the number of questions in the certification test. The types of certification tests are, for example, mathematics, Japanese, English, science, science, etc. The test takers are, for example, children and students, such as lower grades of elementary school, middle grades of elementary school, upper grades of elementary school, first year of junior high school, second year of junior high school, etc. Note that the database 16 stores question structures for each type of certification test and test taker group.

Note that when the question selection unit 40 receives the question generation conditions from the administrator PC 18 via the communication unit 38, it requests the database 16 to transmit a plurality of question structures according to the question generation conditions. Note that the plurality of problem structures corresponding to the problem generation conditions are randomly selected from among the plurality of problem structures stored in the database 16. The question generation server 14 stores the plurality of question structures received from the database 16 in the RAM 34 or the storage medium 36.

The question generation unit 42 generates a plurality of questions constituting the certification exam based on question patterns included in the question structure selected from the database 16. Note that the value input to the substitution element of each question pattern may be input by the administrator via the administrator PC 18, but in this embodiment, the question generation unit 42 inputs it at random.

The correct answer generation unit 44 generates a correct answer for each question generated by the question generation unit 42.

The incorrect answer generation unit 46 generates a plurality of incorrect answers for each question generated by the question generation unit 42 based on a plurality of types of error factors associated with the question pattern. Specifically, the wrong answer generation unit 46 generates a plurality of wrong answers corresponding to the question based on the wrong answer derivation pattern determined for each wrong answer factor.

The test data generation unit 48 generates certification test data that includes a plurality of questions in which the correct answer and a plurality of incorrect answers generated by the question generation unit 42, the correct answer generation unit 44, and the incorrect answer generation unit 46 are selected. The certification test data is transmitted to the database 16 via the communication unit 38 and stored in a predetermined area of the database 16. Note that the certification test data is generated questions and options arranged in a predetermined format, and by displaying the certification test data on the display, the test taker can solve the questions and This data can be printed and used as a question paper for a certification exam. Note that, together with the certification test data, answer data indicating the answers corresponding to the test data is also stored in the database 16. Note that the answer data describes correct answers, incorrect answers, and error factors corresponding to the incorrect answers.

FIG. 3 is a flowchart showing the flow of problem generation processing according to this embodiment, and the problem generation processing is executed by the problem generation server 14.

First, in step S100, the question selection unit 40 selects a plurality of question structures from the database 16 based on question generation conditions.

In the next step S102, the question generation unit 42 generates a question based on the question pattern included in the question structure.

In the next step S104, the correct answer generation unit 44 generates a correct answer corresponding to the question generated in step S102.

In the next step S106, the wrong answer generation unit 46 generates a plurality of wrong answers corresponding to the question generated in step S102, based on the plurality of types of wrong answer factors associated with the question pattern.

In the next step S108, the test data generation unit 48 determines whether generation of a predetermined number (for example, 50 questions) of questions and answers indicated by the question generation conditions has been completed, and if the determination is affirmative, the process moves to step S110. do. On the other hand, in the case of a negative determination, steps S102 to S108 are repeated until a predetermined number of questions and answers have been generated.

In step S110, the test data generation unit 48 generates certification test data and answer data based on the generated questions and answers and stores them in the database 16, and the question generation process ends.

The test system 10 of this embodiment also has a function (hereinafter referred to as "test result notification function") that notifies the test taker of the error factor corresponding to the question answered incorrectly via the test taker terminal 22. have The test result notification function is a function that is executed when a test taker views his or her own certification test result via the test taker terminal 22. The test result notification function is provided by the test taker terminal 22 where the test taker operates the test result data (so-called report card) that shows the score of the certification test, pass/fail, correctness of each question, as well as the factors of incorrect answers for questions for which incorrect answers were selected. Send to. This allows test takers to recognize the reason why they answered the question incorrectly. Note that the test result notification function is executed by the WEB server 12, as an example.

FIG. 4 is a block diagram showing the configuration of the test result notification function included in the WEB server 12 of this embodiment. The web server 12 includes a calculation unit 50 composed of a CPU, etc., a ROM 52 in which various programs and data are stored in advance, a RAM 54 used as a work area etc. when the calculation unit 50 executes various programs, and a test result notification function. It includes a storage medium 56 that stores programs and various data for realizing the above, and a communication section 58 that sends and receives data to and from other information processing devices.

The calculation unit 50 includes a test taker ID determination unit 60, a test result acquisition unit 62, and a test result transmission processing unit 64.

The test taker ID determination unit 60 acquires the test taker ID from the test taker terminal 22 that has made the transmission request for the test result via the communication unit 58, and determines whether or not the test taker ID is included in the database 16. Determine.

When the test taker ID transmitted from the test taker terminal 22 is included in the database 16, the test result acquisition unit 62 acquires the test result associated with the test taker ID from the database 16, and stores it in the RAM 54. Or it is stored in the storage medium 56.

The test result transmission processing unit 64 transmits the test result obtained from the database 16 to the test taker terminal 22 that has transmitted the test taker ID via the communication unit 58.

Although the present invention has been described above using the above embodiments, the technical scope of the present invention is not limited to the range described in the above embodiments. Various changes or improvements can be made to the embodiments described above without departing from the gist of the invention, and forms with such changes or improvements are also included within the technical scope of the present invention.

For example, in the embodiment described above, a configuration in which the certification test is conducted at the venue has been described, but the present invention is not limited to this. For example, the certification test data is transmitted to the test taker terminal 22, The terminal 22 may also be used to conduct the certification test. In the case of a certification test using the test taker terminal 22, the test taker does not necessarily have to go to the venue, and may take the test at home, for example.

In addition, in the above embodiment, the certification test is conducted using CBT, but the present invention is not limited to this. For example, the test taker writes the answer on a paper answer sheet (an example is a mark sheet) and answers the The forms may be collected and the scoring results (certification test results) for each test taker may be stored in the database 16 for each test taker.

Further, in the above embodiment, the test system 10 is configured by dividing the WEB server 12, the question generation server 14, and the database 16 according to the functions, but the present invention is not limited to this. The processing device may have the functions of the WEB server 12, question generation server 14, and database 16.

Furthermore, in the above embodiment, the test takers for the certification test are children and students, but the present invention is not limited to this. It may be different, or it may be based on academic background, such as junior high school graduate, high school graduate, or university graduate.

Further, in the above embodiment, the test system of the present invention is applied to the implementation of certification exams, but the present invention is not limited to this. It may also be applied to other tests aimed at determining the academic ability of test takers, such as entrance exams for schools and cram schools.

INDUSTRIAL APPLICATION This invention is useful as an information processing apparatus etc. which generate test questions and answers.

Question generation server 14 (exam question generation device)
Certification system 10 (test system)
Problem generation unit 42 (problem generation means)
Correct answer generation unit 44 (correct answer generation means)
Wrong answer generation unit 46 (wrong answer generation means)
Test data generation unit 48 (test data generation means)

Claims (5)

question generating means for generating a plurality of questions constituting an exam based on the question pattern selected from a storage means storing a plurality of question patterns;
Correct answer generation means for generating a correct answer for each of the questions generated by the question generation means;
an incorrect answer generating means for generating an incorrect answer for each of the questions generated by the question generating means based on predefined incorrect answer factors associated with the question pattern;
test data generation means for generating test data including a plurality of the questions with the correct answer and the incorrect answer as options;
Equipped with
The incorrect answer generation means generates an incorrect answer for each of the questions generated by the question generation means based on an incorrect answer derivation pattern determined for each error factor.
Exam question generator. The answer to the above question is multiple choice,
2. The test question generating device according to claim 1, wherein said wrong answer generating means generates three said wrong answers based on two different said wrong answer factors associated with said question pattern. The question pattern has an assignment element into which a value or phrase is input,
3. The test question generation device according to claim 1, wherein the question generation means generates the question by inputting the value or phrase to the substitution element for the selected question pattern. A test system comprising the test question generation device according to any one of claims 1 to 3 , and an information processing device operated by a test taker who has conducted a test based on the test data,
A test system that notifies, via the information processing device, the cause of an incorrect answer corresponding to a question for which the examinee gave an incorrect answer. computer,
question generating means for generating a plurality of questions constituting an exam based on the question pattern selected from a storage means storing a plurality of question patterns;
Correct answer generation means for generating a correct answer for each of the questions generated by the question generation means;
an incorrect answer generating means for generating an incorrect answer for each of the questions generated by the question generating means based on predefined incorrect answer factors associated with the question pattern;
test data generation means for generating test data including a plurality of the questions with the correct answer and the incorrect answer as options;
and make it work ,
The wrong answer generating means generates a wrong answer for each of the questions generated by the problem generating means, based on a wrong answer derivation pattern determined for each of the wrong answer factors.
Exam question generation program.

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