JP7476082B2 - Non-destructive testing support device, support method, and support program - Google Patents

Description

Embodiments of the present invention relate to support technology for non-destructive testing to non-destructively inspect structures, materials, etc. for scratches and defects.

Conventional non-destructive testing methods include ultrasonic testing (UT), radiographic testing (RT), magnetic particle testing (MT), penetrant testing (PT), and eddy current testing (ET). In addition, the qualifications and certification of inspectors for these non-destructive tests, as well as the test methods, are stipulated in various industrial standards. These non-destructive tests are applied in all industrial fields, such as energy, transportation, plants, social infrastructure, and construction, and play a major role in ensuring the soundness of these industries.

JIS Z 2305

In most non-destructive testing, not only the test results but also information on the equipment used and the inspectors are stored on paper or as local digital data. For this reason, this data is not managed in a systematic way, and is only available for local reference by the person who carried out the testing (a company or research institute) using analog methods.

Naturally, the data format of the digital data showing the results of non-destructive testing will differ depending on the type of testing method used, but even if the testing method is the same, it often differs depending on the manufacturer of the equipment used or the person who performs the testing. For this reason, there are obstacles to comparing and analyzing multiple test results that are different manufacturers of the equipment used in non-destructive testing or who perform the testing, because the data format is not standardized.

For the various non-destructive tests mentioned above, standards are prescribed for the test methods to be applied to each of the test objects in a wide range of industrial fields. However, specific information regarding the optimal conditions for a given test method for a given test object, such as the set values and the know-how for the reasons for the test, is the property of the person who implements the test method.

Such specific information is not shared between different practitioners, except in academic presentations, papers, and public documents such as some patents. As a result, even though the optimal conditions for the test method in accordance with the test object have already been found, each practitioner ends up setting their own conditions, which leads to a decrease in productivity for society as a whole.

In addition, in many cases, non-destructive testing is carried out on the object to be tested at regular intervals as part of TBM (Time Based Maintenance). In such cases, the frequency of testing may be more than necessary, resulting in unnecessary costs, or conversely, testing may be too infrequent, resulting in insufficient assurance of soundness.

Even if the equipment being inspected is the same, the degree of fatigue and deterioration will vary depending on the operating conditions, operating environment, operating frequency, and years of operation. For this reason, it is reasonable to apply Condition Based Maintenance (CBM) and appropriately change the inspection cycle for the object being inspected, taking into account such operating information and the results of the previous non-destructive inspection. However, because the operating information and non-destructive inspection results are not necessarily linked for these objects being inspected, it has been necessary to continue operations based on TBM.

The embodiment of the present invention has been made in consideration of these circumstances, and standardizes the data format of the test results, etc., making it possible for this information to be shared among multiple testers. The aim is to provide a non-destructive testing support technology that makes it easy to obtain information such as optimal conditions and know-how for the test method to be applied to the test object, as well as optimal testing cycles, etc.

In a non-destructive testing support device according to an embodiment, the device includes an input unit that inputs inspection data obtained by various test methods for performing non-destructive testing and stores the data in a database on a local network , a registration unit that registers a common data format in which the separate data formats of the inspection data are standardized based on the type of the test method, a conversion unit that automatically determines the equipment used for the test method from the input inspection data and converts the inspection data into converted inspection data expressed in the common data format, and a transfer unit that accumulates the converted inspection data transferred via the local network in a public server on a global network .

Embodiments of the present invention make it possible to standardize the data format of inspection data and share it among multiple inspectors. This provides a nondestructive inspection support technology that makes it easy to obtain information such as optimal conditions and know-how for the test method to be applied to the object being inspected, as well as optimal inspection cycles, etc.

1 is a block diagram showing the configuration of a nondestructive testing support device according to a first embodiment of the present invention; FIG. 11 is a network configuration diagram to which a nondestructive testing support device according to a second embodiment is applied. FIG. 11 is a block diagram showing the configuration of a nondestructive testing support device according to a second embodiment. FIG. 11 is a block diagram showing the configuration of a nondestructive testing support device according to a third embodiment. 3 is a flowchart for explaining a nondestructive inspection support method and its support program according to the first embodiment. FIG. 11 is a sequence diagram for explaining a nondestructive inspection support method and its support program according to the second embodiment.

First Embodiment
Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. Fig. 1 is a block diagram of a nondestructive testing support device 10 (hereinafter, simply referred to as "support device 10") according to a first embodiment of the present invention. As described above, the support device 10 of the first embodiment includes an input unit 15 for inputting test data 12 obtained by various test methods 11 (11a, 11b, ...) for performing nondestructive testing, a registration unit for registering a common data format 16 obtained by standardizing different data formats of the test data 12 based on the type of the test method 11 (11a, 11b, ...), and a conversion unit 17 for converting the inputted test data 12 into converted test data 18 represented in the common data format 16.

Furthermore, in the support device 10, the common data format 16 also specifies the additional information 21 that accompanies the converted test data 18, and further includes an information editing unit 22 that adds or changes this additional information 21.

Non-destructive testing methods 11 include typical ones such as ultrasonic testing (UT), radiographic testing (RT), magnetic particle testing (MT), penetrant testing (PT), and eddy current testing (ET), as well as strain measurement, leak testing, acoustic emission (AE), infrared testing, visual inspection, remote visual inspection, and dimensional inspection. Even when multiple test methods 11 are combined, they can be distinguished by the supplementary information 21 regardless of whether they are the same type of test methods 11. Even if the test methods 11 are the same type, the supplementary information 21 is used to distinguish the type of test method 11 between single probe UT, phased array UT, etc.

Ultrasonic testing (UT) can be classified into digital flaw detectors that can apply single probe or dual probe methods, digital array flaw detectors that can use phased array or TFM (Total Focusing Method), thickness gauges, etc., and these are also handled so that each type can be distinguished in the supplementary information 21. In addition, advanced (special) test methods 11 such as laser ultrasonic method, electromagnetic ultrasonic method, guided wave, airborne ultrasonic method, and nonlinear ultrasonic method are also handled so that each type can be distinguished in the supplementary information 21.

The inspection data 12 obtained by the above-mentioned test method 11 may be ultrasonic waveform data in the case of UT, voxel intensity data forming a phased array or TFM image, or image data after imaging. The inspection data 12 of RT may be imaging results digitized as in digital RT, or may be analog film digitized. Also, as in an image intensifier, data may be amplified by a scintillator or the like and captured by a digital camera. The inspection data 12 obtained in this way is image data after imaging.

ET may be a digital flaw detector that can use a single or multiple probes, an array ECT that uses an array coil, or anything that is generally used in eddy current flaw testing. ET inspection data 12 may be waveform data on a certain spatial (time) axis, or, if a C-Scope is obtained using a scanner, it may be intensity data or image data.

AE may use a single probe or multiple probes, and a method of identifying the location of the occurrence based on multiple probes and their position information may be used. AE inspection data 12 may be waveform data, count numbers, or a display of the counts distributed in space.

Regardless of what is used in each test method 11, whether it be MT, PT, infrared, visual inspection, remote visual inspection, or dimensional inspection, the inspection data 12 is ultimately obtained as an image, and is therefore image data. Also, if the shape can be obtained, such as in dimensional inspection, the inspection data 12 will be three-dimensional shape distribution data.

For example, in the case of inspection data 12 resulting from phased array ultrasonic inspection, the inspection data 12 also includes the results of the inspector's judgment, such as indications indicating defects, indications indicating noise, and indications indicating shapes. In addition, if a destructive test or the like is performed after a nondestructive inspection, the inspection data 12 may also include information regarding the design values of the test piece and the obtained true values (positions and numerical values).

The additional information 21 is information that is added to the inspection data 12, such as head information. In addition to information that distinguishes the type of test method 11, such additional information 21 may include information about the inspector of the nondestructive inspection, information related to the timestamp of the time when the nondestructive inspection was performed, information about features detected from the inspection data 12 or the converted inspection data 18, device information, and environmental information, and may include one or more of these.

The inspector information in the supplementary information 21 may include one or more pieces of information that can identify the inspector, such as the inspector's name, affiliation, qualifications, years of experience, age, and gender, and it is desirable for the information to be linked to the inspector's skills.

Among the supplementary information 21, the device information, for example, in the case of UT, AE, or ET, which is used by connecting a flaw detector to a probe, includes the model, specifications, flaw detection settings (for example, for ultrasound, frequency, repetition frequency, phased array transmission and reception conditions, number of probe channels, applied voltage, sampling frequency, gain, etc., some or all of the settings required for flaw detection), and other information may be added. Device information for the probe includes the external shape, frequency, number of channels, channel arrangement, transducer shape, coil shape, number of windings, transducer material, coil material, shoe shape, and other information may be added.

RT equipment information includes the type of radiation source, output, distance, exposure time, film specifications, etc., and other information may be added. PT equipment information includes the type of penetrant, method, type of current material, penetration time, and specifications of the camera used to take the photograph, and other information may be added. MT equipment information includes the specifications of the equipment used, magnetization conditions, type of magnetic powder, black light specifications, demagnetization conditions, etc., and other information may be added. Equipment information for infrared, visual inspection, remote visual inspection, and dimensional inspection includes the specifications of each imaging device, the wavelength band used, and the type, specifications, and conditions of the heat source if heating is involved, and other information may be added.

The environmental information in the incidental information 21 includes the date and time when the inspection was performed, the temperature, the weather, the location of the object to be inspected (address, floor, GPS coordinates, structure name, etc.), the position (for example, the name of a weld line or a piping part), etc., and other information may be added. Furthermore, when a mechanical access device such as a scanner or drone is used to control the position information of the object to be inspected, the incidental information 21 may include device information of the access device, operating conditions, and position information obtained therefrom as auxiliary data. Furthermore, information such as the name of the object to be inspected and its characteristics, such as the design drawing, shape, welds, weld joints, welding method, plate thickness, material, purpose, and number of years in service if it is in service, may be added.

The input unit 15 may be a connection interface for removable recording media such as a USB memory, SD card, or external hard disk that is equipped on the device used in the test method 11, a wired communication interface such as Gigabit Ethernet or a USB cable, or a wireless communication interface such as a wireless LAN or Bluetooth.

The data storage means (not shown) for storing the test data 12 input from the input unit 15 may be a general recording medium such as an SSD or HDD, or may use a large-capacity database 29 connected via a local network 25 (Figure 2). The data storage means also has the function of storing not only the test data 12 but also the converted test data 18 and other data.

The conversion unit 17 has a function to convert the data format of the test data 12 into a registered common data format 16. This common data format 16 specifies not only the test data 12 but also the accompanying information 21. In the equipment used in the test method 11, the test data 12 is often expressed in a data format specific to the manufacturer or model number. Therefore, the conversion unit 17 has a function to automatically determine the equipment used for the input test data 12 and automatically convert it into the common data format 16. By converting multiple test data 12 expressed in completely different data formats in this way and expressing them in the common data format 16, it becomes possible to refer to and analyze these multiple test data 12 using the same application tool.

The data format of the inspection data 12 can be converted into an image in terms of the number of pixels, tone, depth, angle of view, etc., and in order to unify these, the number of pixels can be increased or decreased, for example full color tone can be converted back to linear intensity data and then converted to grayscale tone, or the depth can be changed. If the image before conversion does not have enough pixels for the converted format, the system may simply have a function to re-divide the pixels or to supplement the pixels after re-division. The image storage format can also be unified to any standard, such as TIFF, BMP, JPEG, PNG, etc.

Specific examples of data format conversion for the test data 12 include standardizing the vertical axis resolution (number of bits) and time axis resolution (sampling frequency) in the case of waveform data. If the data format before conversion contains more information than the converted data format, the data may be decimated to exclude midpoints. Conversely, if the data format before conversion contains less information than the converted data format, a function for complementation may be provided, such as linear complementation or fitting. Waveforms can also be saved in a variety of binary formats, in addition to general text data.

Other data format conversions for the inspection data 12 include general image processing such as filtering, color correction, pixel count conversion, and rotation for images, as well as labeling of evaluation results, such as specifying the position on the image that indicates a defect. Data format conversions for the inspection data 12 represented by waveforms such as UT and ET include filtering to a single waveform, frequency analysis, gain adjustment, reading intensity at a gate, and expansion on the time axis. Other general data processing is possible, and it is also possible to label objects indicated by echoes, such as defects, noise, and shapes.

The information editing unit 22 adds or modifies the incidental information 21. The information editing unit 22 can also correct converted test data 18 for which automatic conversion to the common data format 16 is impossible or insufficient. Furthermore, as in the second embodiment described below, when the converted test data 18 is made public to a third party, some of the highly confidential incidental information 21 can be masked and made private. Specific incidental information 21 can also be collectively anonymized or masked for a huge amount of converted test data 18.

Second Embodiment
Next, a second embodiment of the present invention will be described with reference to Figures 2 and 3. Figure 2 is a configuration diagram of a network 20 to which a nondestructive testing support device 10 (10a, 10b, 10c, ...) according to the second embodiment is applied. Figure 3 is a block configuration diagram of the nondestructive testing support device 10 according to the second embodiment. In Figures 2 and 3, parts having the same configuration or function as Figure 1 are indicated by the same reference numerals, and duplicated explanations will be omitted.

As shown in FIG. 3, the support device 10 of the second embodiment includes an input unit 15 for test data 12 common to the first embodiment, a registration unit for registering a common data format 16, a conversion unit 17 for converting the input test data 12 into converted test data 18, and an information editing unit 22 for adding or changing supplementary information 21.

The support device 10 of the second embodiment further includes a transfer unit 28 that transfers the converted test data 18 via the local network 25 (25a, 25b, 25c, etc.) and stores it in a public server 27 (27a, 27b, 27c, etc.) on the global network 26.

The local network 25 is a so-called LAN, which connects computers, communication devices, information devices, etc. with cables or radio waves, enabling data communication between them. As shown in FIG. 2, the local network 25 is a localized information and communication network constructed by a nondestructive testing implementer 30 (30a, 30b, 30c, etc.) within a limited area, such as a room or a building. The implementer 30 may be, for example, a company or a research institute such as a university. On the other hand, the global network 26 is the so-called Internet, which is a global information and communication network that interconnects multiple local networks 25 (25a, 25b, 25c, etc.).

Unlike the support devices 10 and databases 29, which are not accessible to the outside world via the global network 26, the public servers 27 are constructed to be open to the outside world after implementing prescribed information security measures. Each public server 27 (27a, 27b, 27c...) stores converted test data 18 created by the support devices 10 (10a, 10b, 10c...) connected to each local network 25 (25a, 25b, 25c...). The public servers 27 then transfer the stored converted test data 18 in response to a request from the support devices 10 (10a, 10b, 10c...).

The support device 10 of the second embodiment further includes a search unit 31 that searches for converted test data 18x stored in a plurality of public servers 27 (27a, 27b, 27c, etc.) constructed in each of a plurality of local networks 25 (25a, 25b, 25c, etc.) based on the supplementary information 21, and a receiving unit 32 that receives the converted test data 18x requested based on this search from the public servers 27 (27a, 27b, 27c, etc.) that store the converted test data 18x.

As shown in FIG. 2, in the second embodiment, one of the multiple public servers 27 (27a, 27b, 27c, ...) constructed in each of the multiple local networks 25 (25a, 25b, 25c, ...) is selected as a host server. For the sake of explanation, one selected from the multiple public servers 27 is referred to as the host server 27c, and the other public servers 27 are referred to as guest servers 27a, 27b.

The support device 10 (10a, 10b, 10c, ...) has a transmission unit 35 (Figure 3) that transmits the supplementary information 21 to the host server 27c via the local network 25 and the global network 26. The search unit 31 of the support device 10a then executes a search on the host server 27c via the local network 25 and the global network 26. The host server 27c then issues a transfer command 36 to the public server 27b that stores the converted test data 18x requested based on the search. The receiving unit 32 of the support device 10a then receives the converted test data 18x transferred based on the transfer command 36.

In this way, the multiple public servers 27 (27a, 27b, 27c, ...) are classified into one host server and the other guest servers. This allows the implementer 30 who manages the host server to control the entire nondestructive testing support network 20.

There may be cases where multiple public servers 27 are not differentiated as host servers or guest servers. In this case, the search unit 31 of each support device 10 (10a, 10b, 10c, ...) directly accesses and searches each of the public servers 27 (27a, 27b, 27c, ...) and receives the desired converted test data 18x.

Here, each of the support devices 10 (10a, 10b, 10c, etc.) managed by the implementer 30 (30a, 30b, 30c, etc.) is composed of a CPU that executes an operating system and application programs, a main memory unit composed of ROM and RAM, an auxiliary memory unit composed of a hard disk or the like, a communication control unit composed of a network card or the like, input units such as a keyboard and a mouse, and an output unit such as a monitor, although not shown in the figure.

Each function of the support device 10 is realized by loading a specific software onto the CPU or main memory, operating the communication control unit, input unit, output unit, etc. under the control of the CPU, and reading and writing data from and to the main memory and auxiliary memory. Data necessary for processing is temporarily stored in the main memory and auxiliary memory. Furthermore, the support device 10 is appropriately access-managed so that the right to use the above-mentioned search service is granted. Specifically, the support device 10 is realized by a general-purpose personal computer, tablet terminal, smartphone, smart watch, eye tracker, etc.

Incidentally, the test data 12 input from the input unit 15 and the converted test data 18 converted by the conversion unit 17 may be stored in a database 29 constructed on the local network 25, rather than inside the support device 10. In this case, the conversion unit 17 obtains the test data 12 from the database 29, and stores the converted test data 18 again in the database 29 after conversion. The transfer unit 28 then transfers the converted test data 18 stored in the database 29 to the public server 27.

The transmission unit 35 transmits only the additional information 21 of the converted test data 18 to the host server 27c selected from the multiple public servers 27 (27a, 27b, 27c, ...). The additional information 21 transmitted in this manner and stored in the host server 27c is used as a search key specified by the search unit 31 of each support device 10 (10a, 10b, 10c, ...).

When a condition related to the object to be inspected from the supplementary information 21 is used as a search key, the search unit 31 makes it possible to track the inspection history of this object to be inspected. Also, when a condition related to equipment information from the supplementary information 21 is used as a search key, it makes it possible to obtain information related to the know-how of using the equipment used. For example, by sorting the inspection cases according to UT technology, it is possible to extract the optimal inspection conditions.

In addition, by sorting and referencing surface inspection methods such as RT, PT, and MT, as well as UT, it is possible to investigate trends in both inherent and surface defects. Furthermore, by sorting by inspector, it is possible to judge the judgment trends and skills of each inspector. In this way, even if an inspector 30 has no knowledge of an object to be inspected, it is possible to utilize the knowledge of other inspectors to select the inspection method, extract the conditions, and estimate the expected results, etc.

The inspection data 12 (Fig. 3) can be input to the input unit 15 (Fig. 3) of the support device 10 via the global network 26, for example, from the non-destructive inspection site 37 (Fig. 2). In this way, it is possible to have an inspector make a judgment on the results of the inspection data 12 of the object to be inspected remotely without having to dispatch the inspector to the site 37.

At this time, it is natural that inspectors will be remote within the implementer, but remote operation across implementers is also possible. For example, an inspector from one implementer A may be requested by another implementer B, and the inspector from implementer A may evaluate the data measured by implementer B. There does not need to be two implementers here; an inspector from implementer A may evaluate the data of multiple implementers, and conversely, implementer B may request evaluation from multiple implementers other than implementer A. Note that this remote operation naturally allows for connections outside Japan.

Third Embodiment
Next, a third embodiment of the present invention will be described with reference to Fig. 4. Fig. 4 is a block diagram of a non-destructive testing support device 10 according to the third embodiment. In Fig. 4, parts having the same configuration or function as Fig. 1 are indicated by the same reference numerals, and duplicated explanations will be omitted.

As described above, the support device 10 of the third embodiment includes an input unit 15 for the test data 12, which are common to the first embodiment, a registration unit for registering the common data format 16, a conversion unit 17 for converting the input test data 12 into converted test data 18, and an information editing unit 22 for adding or changing the incidental information 21. Although not shown, the support device 10 may also include a transfer unit 28 (FIG. 3) for the converted test data 18, which are common to the second embodiment, a transmission unit 35 for the incidental information 21, a search unit 31 for the converted test data 18x stored in the public server 27 (27a, 27b, 27c, ...) on the global network 26, and a receiving unit 32 (FIG. 3) for the converted test data 18x requested based on the search.

The support device 10 of the third embodiment includes a storage unit that stores a learning model 38 that has been machine-learned so that the input values are the multiple converted test data 18x and the information on the respective feature values is the output value, and a determination unit 39 that inputs new converted test data 18 and outputs information on the feature values, including information on the presence or absence.

According to the third embodiment, by using multiple converted inspection data 18x jointly created by multiple inspectors 30 (30a, 30b, 30c, ...) as teacher data, any inspector 30 can automatically analyze newly obtained inspection data 12 to analyze the feature quantities of the object to be inspected. Here, the feature quantities are, for example, defect size, shape, etc. identified for the inspection data 12 represented by a waveform. These feature quantities may be calculated from the measurement results of the length between indications in the case of ultrasound, etc., or the length and area may be extracted from the angle of view in the case of an image.

As mentioned above, each practitioner can apply the training data obtained by multiple practitioners to machine learning, but practitioners can also use a machine learning system registered on a public server as a user and provide the data they have acquired solely for machine learning judgment. In this case, it is also possible to register the data provided for judgment as new training data for machine learning, and tune each practitioner to a machine learning system that has strengths in the area they use. By having such functions, even practitioners who have no knowledge of machine learning can benefit from the latest evaluation technology through this device and program.

Fourth Embodiment
When the incidental information 21 includes an inspection object, related information that is linked to the inspection object and managed in another system can also be acquired by the support device 10. Such related information specifically includes technical information related to some previous processes of the inspection object, the name and use of the inspection object, design drawings showing the characteristics of the inspection object, shape, welded parts, welded joint shapes, welding methods, plate thickness, materials, defect criteria required for detection, standards on which the inspection should be based, the certification contents if a special qualification is set (for example, SCC occurring in austenitic stainless steel welds), the number of years in service, operation history, and past inspection results, and information on the manufacturing process if the inspection object is being manufactured, such as inspection results between processes, repair history, and inspection results for other lots.

By being able to obtain related information linked to the object being inspected in this manner in the support device 10, it is expected that the following (Functions A) to (Functions E) will be realized. (Function A) A function to compare inspection data or features between different lots or different individuals of the same object being inspected. (Function B) A function to compare specific information stored in multiple locations with searched and extracted inspection data or features. (Function C) A function to search, extract, and compare unspecified inspection data or features based on information present as supplementary information 21. (Function D) A function to compare inspection data or features obtained between different non-destructive inspection equipment. (Function E) A function to compare with past inspection data or features inspected under the same conditions.

Furthermore, these (Functions A) to (Functions E) allow for a wide range of potential applications compared to when inspecting individual objects, such as identifying locations where defects are likely to occur, the probability of defects occurring or remaining, and evaluating the lifespan of objects based on differences from past data. It will also be possible to provide feedback on inspection methods and conditions so that appropriate inspection data can be obtained from past cases.

In addition, if the object to be inspected is not a single object but part of a larger host system (for example, the host system is a nuclear power plant and the object to be inspected is a pipe within the host system), information data of the object to be inspected can be stored in the system data storage means of the host system. Such information data can include the name and use, the design drawings of the entire host system, operation history, the load expected to be generated on the object to be inspected when the host system is operated, inspection data obtained from other non-destructive inspection equipment, monitoring results that do not depend on non-destructive inspection equipment (for example, a vibration meter, a flow meter, etc.), future operation schedules, etc. Furthermore, by feeding back the converted inspection data 18 output from the support device 10 to the host system, it is possible to propose the suitability of the current operating conditions, the timing of the next inspection, and the methods and timing of improvement and repair, etc., based on the degree of damage revealed by the inspection.

The nondestructive testing support method and support program according to the first embodiment will be described with reference to the flowchart in Figure 5 (see Figure 1 as appropriate). First, a common data format 16 is registered in which the different data formats of the test data 12 are standardized based on the type of test method 11 (11a, 11b, ...) (S11). Next, the test data 12 of the nondestructive tests performed using the various test methods 11 (11a, 11b, ...) is input (S12). Then, the input test data 12 is converted to converted test data 18 represented in the common data format 16 and output (S13, END).

Next, the nondestructive testing support method and support program according to the second embodiment will be described with reference to the sequence diagram of FIG. 6 (see FIG. 2 as appropriate). First, each support device 10 (10a, 10b, 10c...) transfers the converted test data 18 created in the first embodiment via the local network 25 (25a, 25b, 25c...) and stores it in the public server 27 (27a, 27b, 27c...) (S21).

Furthermore, the support device 10 (10a, 10b, 10c, ...) transmits the additional information 21 separated from the converted test data 18 via the local network 25 and the global network 26 (S22) and stores it in the host server 27c. Then, in any of the support devices 10a, a search is performed on the host server 27c via the local network 25 and the global network 26 (S23).

The host server 27c then issues a transfer command 36 to the public server 27b, which stores the converted test data 18x requested based on the search (S24). The receiving unit 32 of the support device 10a then receives the converted test data 18x transferred from the public server 27b based on the transfer command 36 (S25).

According to at least one embodiment of the nondestructive testing support device described above, the test data can be converted into a common data format, allowing it to be shared among multiple testers. This makes it easy to obtain information such as optimal conditions and know-how for the test method to be applied to the test object, as well as optimal test cycles, etc.

Although several embodiments of the present invention have been described, these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, modifications, and combinations can be made without departing from the spirit of the invention. These embodiments and their modifications are within the scope of the invention and its equivalents as set forth in the claims, as well as the scope and spirit of the invention.

10 (10a, 10b, 10c)...Non-destructive testing support device, 12...Test data, 15...Input section, 16...Common data format, 17...Conversion section, 18, 18x...Converted test data, 20...Network, 21...Additional information, 22...Information editing section, 25...Local network, 26...Global network, 27 (27a, 27b, 27c)...Public server, 27b...Guest server, 27c...Host server, 28...Transfer section, 29...Database, 30 (30a, 30b, 30c)...Implementer, 31...Search section, 32...Receiver, 35...Transmitter, 36...Transfer command, 37...Site, 38...Learning model, 39...Determination section.

Claims (11)

an input unit for inputting inspection data obtained by various test methods for carrying out non-destructive inspection and storing the data in a database on the local network ;
a registration unit that registers a common data format obtained by standardizing the different data formats of the inspection data based on the type of the test method;
a conversion unit that automatically determines an apparatus used in the test method from the input test data and converts the test data into converted test data represented in the common data format;
A non-destructive testing support device comprising : a transfer unit that stores the converted inspection data transferred via the local network in a public server of a global network . 2. The non-destructive testing support device according to claim 1,
The common data format also defines additional information associated with the converted examination data,
A non-destructive testing support device comprising an information editing unit that adds or changes the supplementary information. 3. The non-destructive testing support device according to claim 2 ,
a search unit that searches the converted examination data stored in a plurality of the public servers constructed in each of the plurality of the local networks based on the supplementary information;
A non-destructive testing support device comprising: a receiving unit that receives from the public server, which stores the converted inspection data requested based on the search. 4. The non-destructive testing support device according to claim 3 ,
One of the public servers constructed in each of the local networks is selected as a host server;
a transmission unit that transmits the additional information to the host server via the global network,
the search unit executes the search on the host server via the global network;
the host server issues a transfer command to the public server that stores the converted test data requested based on the search;
The receiving unit receives the converted inspection data transferred based on the transfer command. The non-destructive testing support device according to any one of claims 2 to 4 ,
The non-destructive testing support device, wherein the supplementary information includes information related to a time stamp of when the non-destructive testing was performed. The non-destructive testing support device according to any one of claims 2 to 5 ,
The non-destructive testing support device, wherein the supplementary information includes information about an inspector performing the non-destructive testing. The non-destructive testing support device according to any one of claims 2 to 6 ,
A non-destructive testing support device, wherein the supplementary information includes information on features detected from the test data or the converted test data. The non-destructive testing support device according to any one of claims 1 to 7 ,
The inspection data is input to the non-destructive inspection support device via the global network. The non-destructive testing support device according to any one of claims 1 to 8 ,
a storage unit that stores a learning model that has been machine-learned so that a plurality of the converted inspection data are used as input values and information on each feature amount is used as an output value;
a determination unit that receives the new converted inspection data and outputs information about the features, including information about the presence or absence of the feature. An input unit inputs inspection data obtained by various test methods for performing non-destructive testing, and stores the data in a database on a local network ;
a registration unit registering a common data format obtained by standardizing the different data formats of the inspection data based on the type of the test method ;
A conversion unit automatically determines an apparatus used in the test method from the input test data, and converts the test data into converted test data represented in the common data format;
and storing the converted inspection data transferred by a transfer unit via the local network in a public server of a global network . On the computer,
A step of inputting inspection data obtained by various test methods for carrying out non-destructive testing and storing the data in a database on the local network ;
A step of registering a common data format obtained by standardizing the different data formats of the inspection data based on the type of the test method;
A step of automatically determining an apparatus used in the test method from the inputted test data, and converting the test data into converted test data represented in the common data format;
and storing the converted inspection data transferred via the local network in a public server on a global network .

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