JP7491127B2 - Inspection system and inspection method - Google Patents

Description

The present invention relates to an inspection system and an inspection method.

Conventionally, there is known an inspection device that illuminates an object to be inspected and inspects the object through an imaging camera.

For example, Patent Document 1 discloses a technique that uses multiple light sources to create multiple images of an object (object to be inspected).

Patent Literature 2 also discloses a technique for capturing images of a subject (inspected object) multiple times with different positions of the illumination light source to obtain multiple captured images of the subject.

In recent years, three-dimensional objects with embossed surfaces are sometimes inspected as inspection objects. In this case, the techniques disclosed in Patent Documents 1 and 2 have the problem that, because multiple light sources are arranged in the same plane, it is not possible to simultaneously illuminate the side and top surfaces of the three-dimensional inspection object without specular reflection.

In addition, if the surface of the object being inspected is embossed, there is a problem that fine specular reflection occurs, making it difficult to obtain an image suitable for inspection.

The present invention has been made in consideration of the above, and aims to create an inspection image that enables appropriate image inspection, even if the object being inspected has a three-dimensional shape and is prone to regular reflection, such as an embossed surface.

In order to solve the above problems and achieve the object, the present invention provides an inspection system for performing an inspection using an inspection image of an inspection object having a three-dimensional shape having a flat surface in a plate shape and an edge area surface curved from the flat surface, the inspection system including a first illumination device which irradiates light onto the inspection object from above , a second illumination device which is provided between the inspection object and the first illumination device and irradiates light onto the inspection object from an oblique direction, an imaging device which is provided above the first illumination device and the second illumination device and images the inspection object, and an image of the edge area surface of the inspection object captured by the imaging device using light irradiation from the first illumination device, the image of the inspection object being captured by the imaging device, the first inspection image of the inspection object being obtained by the imaging device ... The inspection apparatus is characterized in that it comprises a first image acquisition unit that acquires an image , a second image acquisition unit that acquires an image of the flat surface of the inspection object as a second inspection image of the inspection object from an image captured by the imaging device by irradiating light from the second lighting device, a third lighting device that is provided on the side of the inspection object opposite to the side on which the imaging device is provided and irradiates light onto the inspection object, a third image acquisition unit that acquires an image showing a region of the inspection object from an image captured by the imaging device by irradiating light from the third lighting device, and an image synthesis unit that synthesizes the first inspection image, the second inspection image, and an image showing the region of the inspection object to create the inspection image .

The present invention has the advantage that it is possible to create an inspection image that enables appropriate image inspection, even if the object being inspected has a three-dimensional shape and is prone to regular reflection, such as an embossed surface.

FIG. 1 is a diagram showing a schematic configuration of an inspection system according to an embodiment. FIG. 2 is a diagram showing an example of an object to be inspected. FIG. 3 is a diagram showing the configuration of the inspection device. FIG. 4 is a diagram showing the layout configuration of each lighting device. FIG. 5 is a diagram showing a modified example of the first ring illumination device and the second ring illumination device. FIG. 6 is a diagram showing the slide stage as viewed from above. FIG. 7 is a diagram showing a modified example of the configuration of the inspection device. FIG. 8 is a block diagram showing the connections of the electrical system of the inspection system. FIG. 9 is a diagram showing the hardware configuration of the information processing device. FIG. 10 is a functional block diagram showing the functional configuration of the information processing device. FIG. 11 is a flowchart showing the flow of the illuminance setting process. FIG. 12 is a flowchart showing the flow of the image synthesis process. FIG. 13 is a diagram illustrating an example of image synthesis.

Embodiments of the inspection system, inspection device, and inspection method are described in detail below with reference to the attached drawings.

FIG. 1 is a diagram showing a schematic configuration of an inspection system 1 according to an embodiment. As shown in FIG. 1, the inspection system 1 includes an inspection device 100 and an information processing device 200. The information processing device 200 is a PC (Personal Computer) or a server. The information processing device 200 controls the inspection device 100.

The inspection device 100 illuminates the object to be inspected 300, which is the object to be inspected for print quality, etc., and inspects the object to be inspected 300 through the imaging device 102.

Here, FIG. 2 is a diagram showing an example of an object 300 to be inspected. As shown in FIG. 2, the object 300 to be inspected in this embodiment has a thick, three-dimensional disk shape. The object 300 to be inspected has a flat surface 301 in the shape of a flat plate, and an edge region surface 302 that curves from the flat surface 301. The flat surface 301 is embossed.

The object to be inspected 300 has various designs printed on its surface according to the user's preferences using a printing device such as an inkjet printer. The inspection device 100 inspects the print quality of the design image printed on the object to be inspected 300.

The object 300 to be inspected is not limited to a disk shape, but may be rectangular, elliptical, or other shapes. Examples of the object 300 to be inspected include a can badge, a smartphone cover for a smartphone, and a grip to be attached to a smartphone or the like to prevent it from falling.

Figure 3 is a diagram showing the configuration of the inspection device 100. As shown in Figure 3, the inspection device 100 has a main body frame 101 made of an aluminum frame. The main body frame 101 is formed in a rectangular prism shape.

The main body frame 101 is equipped with an imaging device 102, a first ring illumination device 103 which is a first illumination device, a second ring illumination device 104 which is a second illumination device, and a backlight illumination device 105 which is a third illumination device, which are arranged vertically from the top.

In addition, the main frame 101 is provided with a slide stage 106 between the second ring illumination device 104 and the backlight illumination device 105.

The imaging device 102 is, for example, a camera using a complementary metal oxide semiconductor (CMOS) and outputs a signal corresponding to the projected light. Note that the imaging device 102 may also be a camera using a charge coupled device (CCD).

Figure 4 shows the layout configuration of each lighting device.

The first ring illumination device 103 has a ring-shaped main body 103a which is a first main body. The ring shape of the main body 103a enables the imaging device 102 to capture an image of the object 300 to be inspected. The first ring illumination device 103 has a number of LEDs 103b which are a first light source on the underside of the ring-shaped main body 103a. The number of LEDs 103b irradiate light from above (vertically) to the object 300 to be inspected which is located at the imaging position of the imaging device 102.

As shown in FIG. 4, the light from the first ring illumination device 103 is specularly reflected light and diffusely reflected light toward the imaging device 102 at the flat surface 301 of the inspected object 300. Also, the light from the first ring illumination device 103 is diffusely reflected light toward the imaging device 102 at the edge area surface 302 of the inspected object 300.

Note that the first ring illumination device 103 is configured to have a ring-shaped main body 103a, but is not limited to this. For example, the first ring illumination device 103 may be configured to have multiple fragment-shaped illuminations arranged in a ring shape, or multiple (e.g., four) small illuminations arranged at top, bottom, left, and right positions on a circumference in a plan view.

The second ring illumination device 104 has a ring-shaped main body 104a which is a second main body. The ring shape of the main body 104a enables the imaging device 102 to capture an image of the object 300 to be inspected. The second ring illumination device 104 has a number of LEDs 104b as light sources on the inner wall of the ring-shaped main body 104a. The inner wall of the ring-shaped main body 104a has a tapered shape such that the opening widens from the top to the bottom. The number of LEDs 104b irradiate light from an oblique direction (e.g., 30 degrees) with respect to the vertical direction to the object 300 to be inspected which is located at the imaging position of the imaging device 102.

As shown in FIG. 4, the light from the second ring illumination device 104 is specularly reflected light and diffusely reflected light toward the imaging device 102 at the flat surface 301 of the inspected object 300. Also, the light from the second ring illumination device 104 is specularly reflected light and diffusely reflected light toward the imaging device 102 at the edge area surface 302 of the inspected object 300.

Note that the second ring illumination device 104 is configured to have a ring-shaped main body 104a, but is not limited to this. For example, the second ring illumination device 104 may be configured to have multiple fragment-shaped illuminations arranged in a ring shape, or multiple (e.g., four) small illuminations arranged at top, bottom, left, and right positions on a circumference in a plan view.

The shape of the first ring illumination device 103 or the second ring illumination device 104 is not limited to a circle (ring shape) and may be an ellipse or a rectangle, etc.

Here, FIG. 5 is a diagram showing modified examples of the first ring illumination device 10 and the second ring illumination device 104. FIG. 5(a) shows an example of an elliptical shape, and FIG. 5(b) shows an example of a rectangular shape. As shown in FIG. 5(a), the first ring illumination device 103 (second ring illumination device 104) may be provided with a main body 103a (104a) having a large number of LEDs 103b (104b) and an elliptical opening. Also, as shown in FIG. 5(b), the first ring illumination device 103 (second ring illumination device 104) may be provided with a main body 103a (104a) having a large number of LEDs 103b (104b) and an opening of a rectangular shape.

The light from the backlight illumination device 105 is diffusely reflected by the imaging device 102 at the flat surface 301 of the inspected object 300. The light from the backlight illumination device 105 is specularly reflected and diffusely reflected by the imaging device 102 at the edge area surface 302 of the inspected object 300.

In this embodiment, the first ring illumination device 103 functions as an illumination for imaging the edge area surface 302 of the inspected object 300. The second ring illumination device 104 functions as an illumination for imaging the flat surface 301 (the inside of the edge area surface 302) of the inspected object 300. The backlight illumination device 105 functions as an illumination for recognizing the area of the inspected object 300. There are no particular restrictions on the shape of the backlight illumination device 105, as long as it is larger than the inspected object 300, which is the object to be inspected.

In this embodiment, an image captured by the imaging device 102 using illumination from the first ring illumination device 103 and an image captured by the imaging device 102 using illumination from the second ring illumination device 104 are combined to obtain an image of the entire area of the inspected object 300.

Next, the slide stage 106 will be described. The slide stage 106 is a guide member that guides the object to be inspected 300 to the imaging position of the imaging device 102.

Figure 6 is a diagram showing the slide stage 106 as viewed from above. As shown in Figure 6, the slide stage 106 is capable of holding two objects 300 to be inspected. The slide stage 106 moves left and right by a sliding mechanism, thereby alternately moving the objects 300 to be inspected to the imaging position of the imaging device 102.

As shown in FIG. 3, the slide stage 106 has a ratchet mechanism 106a. The slide stage 106 fixes the inspected object 300 to the imaging position of the imaging device 102 by the ratchet mechanism 106a.

As shown in FIG. 3, the slide stage 106 has sensors 106b and 106c. The sensors 106b and 106c are non-contact sensors. When the object to be inspected 300 on the right side is fixed at the imaging position of the imaging device 102, the sensor 106b turns ON. On the other hand, when the object to be inspected 300 on the left side is fixed at the imaging position of the imaging device 102, the sensor 106c turns ON. The imaging device 102 starts imaging when the sensor 106b or the sensor 106c turns ON as a trigger.

The movement of the slide stage 106 is damped by absorbers (or dampers) 106d provided on the left and right sides.

In this embodiment, a sliding type slide stage 106 is used as a guide member for guiding the inspected object 300 to the imaging position of the imaging device 102, but this is not limited to this. FIG. 7 is a diagram showing a modified example of the configuration of the inspection device 100. As shown in FIG. 7, for example, the guide member may be a revolver type stage that guides the inspected object 300 to the imaging position of the imaging device 102 while rotating it.

Next, we will explain the connections of the electrical system of the inspection system 1.

Figure 8 is a block diagram showing the connections of the electrical system of the inspection system 1. As shown in Figure 8, the inspection device 100 includes an I/O power supply box 107 and a light source power supply box 108. The information processing device 200 is connected to the inspection device 100 via the I/O power supply box 107.

The first ring illumination device 103, the second ring illumination device 104, and the backlight illumination device 105 are connected to the information processing device 200 via the I/O power supply box 107 and the light source power supply box 108. The first ring illumination device 103, the second ring illumination device 104, and the backlight illumination device 105 are subjected to LED illumination lighting control and LED illumination lighting power control by the information processing device 200.

The imaging device 102 is directly connected to and controlled by the information processing device 200.

The sensors 106b and 106c of the slide stage 106 are connected to the information processing device 200 via the I/O power supply box 107. The sensors 106b and 106c of the slide stage 106 are subjected to signal detection by the information processing device 200. When the sensor 106b or the sensor 106c is turned ON, the imaging device 102 starts imaging.

Next, the hardware configuration of the information processing device 200 will be described.

Figure 9 is a hardware configuration diagram of the information processing device 200. As shown in Figure 9, the information processing device 200 is constructed by a computer, and as shown in Figure 9, it includes a CPU 501, a ROM 502, a RAM 503, a HD 504, a HDD (Hard Disk Drive) controller 505, a display 506, an external device connection I/F (Interface) 508, a network I/F 509, a bus line 510, a keyboard 511, a pointing device 512, a DVD-RW (Digital Versatile Disk Rewritable) drive 514, and a media I/F 516.

Of these, the CPU 501 controls the operation of the entire information processing device 200. The ROM 502 stores programs used to drive the CPU 501, such as IPL. The RAM 503 is used as a work area for the CPU 501. The HD 504 stores various data such as programs. The HDD controller 505 controls the reading or writing of various data from the HD 504 according to the control of the CPU 501. The display 506 displays various information such as a cursor, menu, window, character, or image. The external device connection I/F 508 is an interface for connecting various external devices. In this case, the external device is, for example, a USB (Universal Serial Bus) memory or a printer. The network I/F 509 is an interface for data communication using the communication network 100. The bus line 510 is an address bus, a data bus, or the like for electrically connecting each component such as the CPU 501 shown in FIG. 9.

The keyboard 511 is a type of input means equipped with multiple keys for inputting characters, numbers, various instructions, etc. The pointing device 512 is a type of input means for selecting and executing various instructions, selecting a processing target, moving the cursor, etc. The DVD-RW drive 514 controls the reading and writing of various data from the DVD-RW 513, which is an example of a removable recording medium. Note that this is not limited to a DVD-RW, and may be a DVD-R, etc. The media I/F 516 controls the reading and writing (storing) of data from the recording medium 515, such as a flash memory.

The program executed by the information processing device 200 of this embodiment is provided in the form of an installable or executable file recorded on a computer-readable recording medium such as a CD-ROM, a flexible disk (FD), a CD-R, or a DVD (Digital Versatile Disk).

The program executed by the information processing device 200 of this embodiment may be configured to be stored on a computer connected to a network such as the Internet and provided by being downloaded via the network. The program executed by the information processing device 200 of this embodiment may be configured to be provided or distributed via a network such as the Internet.

Below, we will explain the characteristic processing of this embodiment among the various computational processes executed by the CPU 501 of the information processing device 200 according to a program.

Here, FIG. 10 is a functional block diagram showing the functional configuration of the information processing device 200. As shown in FIG. 10, the CPU 501 of the information processing device 200 executes a program to realize a first image acquisition unit 201, a second image acquisition unit 202, a third image acquisition unit 203, an image synthesis unit 204, and an illuminance setting unit 205.

The first image acquisition unit 201 acquires an image of the edge area surface 302 of the inspected object 300 as a first inspection image of the object to be inspected from an image (diffuse reflection illumination image) captured by the imaging device 102 by irradiating light from the first ring illumination device 103.

The second image acquisition unit 202 acquires an image of the flat surface 301 excluding the edge area surface 302 of the inspected object 300 as a second inspection image of the object to be inspected from the captured image (specular reflection illumination image) captured by the imaging device 102 when light is irradiated from the second ring illumination device 104.

The third image acquisition unit 203 acquires an image showing the area of the inspected object 300 from the captured image (silhouette image) captured by the imaging device 102 by irradiating light from the backlight illumination device 105.

The image synthesis unit 204 synthesizes an image of the edge region surface 302 of the inspected object 300, an image of the flat surface 301 of the inspected object 300, and an image showing the region of the inspected object 300, and sets the synthesized image as the inspection image. Note that the image synthesis unit 204 may also synthesize an image of the edge region surface 302 of the inspected object 300 and an image of the flat surface 301 of the inspected object 300, and set the synthesized image as the inspection image.

The order in which light is irradiated from the backlight illumination device 105, the first ring illumination device 103, and the second ring illumination device 104 and an image is captured by the imaging device 102 is not limited.

The illuminance setting unit 205 sets the illuminance of the first ring illumination device 103 and the second ring illumination device 104.

Next, we will explain the flow of characteristic processes performed by the information processing device 200 in this embodiment.

First, the illuminance setting process for the first ring illumination device 103 and the second ring illumination device 104 performed by the CPU 501 of the information processing device 200 will be described. FIG. 11 is a flowchart showing the flow of the illuminance setting process.

The illuminance setting process is performed on an object 300 to be inspected in which the flat surface 301 and the edge area surface 302 are the same color (e.g., white).

As shown in FIG. 11, the illuminance setting unit 205 controls the first ring illumination device 103 and the imaging device 102 (step S1) to obtain the signal level (level A) of the captured image of the edge area surface 302 of the inspected object 300 captured by illumination from the first ring illumination device 103 (step S2).

Next, the illuminance setting unit 205 controls the second ring illumination device 104 and the imaging device 102 (step S3) to obtain the signal level (level B) of the captured image of the flat surface 301 of the inspected object 300 captured by illumination from the second ring illumination device 104 (step S4).

Next, the illuminance setting unit 205 sets the illuminance of the first ring illumination device 103 and the second ring illumination device 104 so that the level A acquired in step S2 is the same as the level B acquired in step S4 (step S5). For example, the illuminance setting unit 205 calculates a correction coefficient (level A/level B) for the captured image signal so that the level A acquired in step S2 is the same as the level B acquired in step S4. The correction coefficient is used to correct the captured image by the second ring illumination device 104 during actual inspection.

In this embodiment, the illuminance setting process for the two illumination devices, the first ring illumination device 103 and the second ring illumination device 104, has been described, but this is not limited thereto, and focus adjustment of the imaging device 102 and the like are also possible. Furthermore, in addition to illuminance setting and focus adjustment, it is also possible to set the shutter speed of the imaging device 102 and the like.

Next, the image synthesis process performed by the CPU 501 of the information processing device 200 will be described. Here, FIG. 12 is a flowchart showing the flow of the image synthesis process, and FIG. 13 is a diagram showing an example of image synthesis.

As shown in FIG. 12, the third image acquisition unit 203 first controls the backlight illumination device 105 and the imaging device 102 (step S11), and recognizes the area of the object 300 to be inspected from the captured image (silhouette image) of the object 300 to be inspected captured under illumination by the backlight illumination device 105 (step S12).

The imaging device 102 starts capturing images when the sensor 106b or the sensor 106c is turned on as a trigger. When the imaging device 102 finishes capturing images, the backlight illumination device 105, the first ring illumination device 103, and the second ring illumination device 104 are each turned off.

More specifically, in step S12, the third image acquisition unit 203 measures the installation position (x, y) of the inspected object 300, calculates the circular size of the inspected object 300, determines the background image area of the inspected object 300, and judges whether the inspected object 300 is installed properly.

Next, the first image acquisition unit 201 controls the first ring illumination device 103 and the imaging device 102 (step S13) to acquire an image of the edge area surface 302 of the inspected object 300 from the captured image (diffuse reflection illumination image) of the inspected object 300 captured by illumination from the first ring illumination device 103 (step S14).

More specifically, in step S13, the first image acquisition unit 201 obtains captured images (diffuse reflection illumination images) of four pieces of the inspected object 300. Then, in step S14, the first image acquisition unit 201 performs image averaging processing based on the four captured images (diffuse reflection illumination images), and then records an image of the edge area surface 302 of the inspected object 300.

It is possible to obtain only one captured image (diffuse reflection illumination image) of the inspected object 300, but in this embodiment, the S/N ratio can be increased by obtaining four captured images (diffuse reflection illumination images) and performing image averaging processing.

Next, the second image acquisition unit 202 controls the second ring illumination device 104 and the imaging device 102 (step S15) to acquire an image of the flat surface 301 of the object to be inspected 300 from the captured image (specular reflection illumination image) of the object to be inspected 300 captured by illumination from the second ring illumination device 104 (step S16).

More specifically, in step S15, the second image acquisition unit 202 obtains captured images (specular reflection illumination images) of the four inspected objects 300. Then, in step S16, the second image acquisition unit 202 performs image averaging processing based on the four captured images (specular reflection illumination images), and then records an image of the flat surface 301 of the inspected object 300.

The processing from step S13 to step S16 is not limited to the order shown in the above-mentioned flowchart. For example, the second image acquisition unit 202 may control the second ring illumination device 104 and the imaging device 102 (step S15) to acquire an image of the flat surface 301 of the inspected object 300 (step S16), and then the first image acquisition unit 201 may control the first ring illumination device 103 and the imaging device 102 (step S13) to acquire an image of the edge area surface 302 of the inspected object 300 (step S14).

The order in which light is irradiated from the backlight illumination device 105, the first ring illumination device 103, and the second ring illumination device 104 and the image is captured by the image capture device 102 is not limited. When the image capture device 102 has finished capturing an image, the backlight illumination device 105, the first ring illumination device 103, and the second ring illumination device 104 are each turned off.

Finally, the image synthesis unit 204 synthesizes the area of the inspected object 300 recognized in step S12, the image of the edge area surface 302 of the inspected object 300 acquired in step S14, and the image of the flat surface 301 of the inspected object 300 acquired in step S16 (step S17).

In the image synthesis process in step S17, the image synthesis unit 204 performs x- and y-axis center pattern matching, rotation angle acquisition, x- and y-center affine transformation processing, resampling, and the like. In addition, in the image synthesis process in step S17, the image synthesis unit 204 also performs tone correction processing to apply tone correction to the synthesized image.

The composite image generated in the above manner is used as an inspection image of the inspected object 300 to be compared with the master image, for example, to inspect the print quality. The inspection results are stored in the information processing device 200 and displayed on the display 506 of the information processing device 200. The destination of the inspection results is not limited to the information processing device 200, and they may be transferred to a mobile terminal such as a smartphone or a tablet terminal.

As described above, according to this embodiment, even if the object 300 to be inspected has a three-dimensional shape and is prone to specular reflection, such as an embossed surface, it is possible to create an inspection image that enables appropriate image inspection.

In addition, even if the object to be inspected has many design variations (on-demand printing, variable printing), the burden on inspectors can be reduced and inspections can be carried out efficiently.

Each function of the embodiments described above can be realized by one or more processing circuits. In this specification, the term "processing circuit" includes a processor programmed to execute each function by software, such as a processor implemented by an electronic circuit, and devices such as an ASIC (Application Specific Integrated Circuit), DSP (Digital Signal Processor), FPGA (Field Programmable Gate Array), and conventional circuit modules designed to execute each function described above.

The devices described in the examples are merely illustrative of one of several computing environments for implementing the embodiments disclosed herein.

In one embodiment, the information processing apparatus 200 includes multiple computing devices, such as a server cluster. The multiple computing devices are configured to communicate with each other over any type of communication link, including a network, shared memory, etc., to perform the processing disclosed herein. Similarly, the information processing apparatus 200 may include multiple computing devices configured to communicate with each other.

REFERENCE SIGNS LIST 1 Inspection system 100 Inspection device 102 Imaging device 103 First illumination device 103a First main body 103b First light source 104 Second illumination device 104a Second main body 104b Second light source 105 Third illumination device 106 Guide member 201 First image acquisition section 202 Second image acquisition section 203 Third image acquisition section 204 Image synthesis section 205 Illuminance setting section 300 Inspection object

JP 2002-501265 A JP 2006-285763 A

Claims (9)

1. An inspection system for performing an inspection using an inspection image of an object to be inspected having a three-dimensional shape having a flat surface in a plate shape and an edge area surface curved from the flat surface,
a first lighting device that irradiates the inspection object with light from above ;
a second lighting device provided between the inspection object and the first lighting device and configured to irradiate light onto the inspection object from an oblique direction;
an imaging device that is installed above the first lighting device and the second lighting device and captures an image of the inspection object;
a first image acquisition unit that acquires an image of the edge area surface of the inspection object as a first inspection image of the inspection object from a captured image captured by the imaging device while irradiating light from the first illumination device;
a second image acquisition unit that acquires an image of the flat surface of the inspection object as a second inspection image of the inspection object from an image captured by the imaging device while irradiating light from the second illumination device;
a third illumination device that is provided on the opposite side of the inspection object from the side on which the imaging device is provided, and that irradiates light onto the inspection object;
a third image acquisition unit that acquires an image showing a region of the inspection object from an image captured by the imaging device while irradiating light from the third illumination device;
an image synthesis unit that synthesizes the first inspection image, the second inspection image, and an image showing the region of the inspection object to generate a synthetic image as the inspection image;
An inspection system comprising : the first illumination device includes a ring-shaped first main body and a first light source provided on a side of the first main body facing the inspection object;
The first light source irradiates light from above onto the inspection object located at an imaging position of the imaging device.
2. The inspection system according to claim 1 . The second lighting device includes a second body portion having a ring shape and a tapered inner wall, and a second light source provided on the inner wall of the second body portion,
The second light source irradiates the inspection object located at an imaging position of the imaging device with light from an oblique direction.
3. The inspection system according to claim 1 or 2 . The imaging device further includes a guide member for guiding the object to be inspected to an imaging position of the imaging device.
4. The inspection system according to claim 1, wherein the inspection system comprises: An illuminance setting unit that sets the illuminance of the first lighting device and the second lighting device,
5. The inspection system according to claim 1, wherein the inspection system comprises: The image acquisition by the third image acquisition unit, the image acquisition by the first image acquisition unit, and the image acquisition by the second image acquisition unit are performed in this order.
2. The inspection system according to claim 1 . The image synthesis unit performs gradation correction on the synthesized image to obtain the inspection image.
2. The inspection system according to claim 1 . the third image acquisition unit acquires an image showing an area of the inspection object, and performs at least one of measuring an installation position of the inspection object, calculating a circular size of the inspection object, determining a background image area of the inspection object, and judging an installation defect of the inspection object;
8. An inspection system according to claim 1, wherein the inspection system comprises: 1. An inspection method for an inspection system that performs inspection using an inspection image of an inspection target having a three-dimensional shape having a flat surface in a plate shape and an edge area surface that curves from the flat surface, comprising:
The inspection system includes:
a first lighting device that irradiates the inspection object with light from above ;
a second lighting device provided between the inspection object and the first lighting device and configured to irradiate light onto the inspection object from an oblique direction;
an imaging device that is installed above the first lighting device and the second lighting device and captures an image of the inspection object;
a third illumination device that is provided on the opposite side of the inspection object from the side on which the imaging device is provided, and that irradiates light onto the inspection object;
Equipped with
a first image acquiring step of acquiring an image of the edge area surface of the inspection object as a first inspection image of the inspection object from an image captured by the imaging device while irradiating light from the first illumination device;
a second image acquiring step of acquiring an image of the flat surface of the inspection object as a second inspection image of the inspection object from an image captured by the imaging device while irradiating light from the second illumination device;
a third image acquisition step of acquiring an image showing a region of the inspection object from an image captured by the imaging device while irradiating light from the third illumination device;
an image synthesis step of synthesizing the first inspection image, the second inspection image, and an image showing the region of the inspection object to generate a synthetic image as the inspection image;
An inspection method comprising :

Images