JP7512072B2 - ウエーハの加工方法 - Google Patents
ウエーハの加工方法 Download PDFInfo
- Publication number
- JP7512072B2 JP7512072B2 JP2020075204A JP2020075204A JP7512072B2 JP 7512072 B2 JP7512072 B2 JP 7512072B2 JP 2020075204 A JP2020075204 A JP 2020075204A JP 2020075204 A JP2020075204 A JP 2020075204A JP 7512072 B2 JP7512072 B2 JP 7512072B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- back surface
- reinforcing portion
- modified layer
- protective member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/124—Preparing bulk and homogeneous wafers by processing the backside of the wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7402—Wafer tapes, e.g. grinding or dicing support tapes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7422—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Dicing (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Laser Beam Processing (AREA)
Description
波長 :1342nm
繰り返し周波数 :60kHz
平均出力 :1.6W
チャックテーブル回転数 :0.5回転/秒
10a:表面
10b:裏面
10c:補強部
10d:劈開面
12:デバイス
14:分割予定ライン
16a:デバイス領域
16b:外周余剰領域
17:境界
20:保護部材(粘着テープ)
30:レーザー加工装置
32:チャックテーブル
34:レーザー光線照射手段
36:集光器
40:研削装置
41:チャックテーブル
42:研削手段
43:スピンドルハウジング
44:スピンドル
46:研削ホイール
48:研削砥石
50:切削装置
52:切削手段
54:スピンドル
56:切削ブレード
60:ピックアップ装置
62:ピックアップコレット
64:拡張手段
100:改質層
110:分割溝
F:フレーム
T:ダイシングテープ
LB:レーザー光線
Claims (2)
- 複数のデバイスが分割予定ラインによって区画されたデバイス領域と該デバイス領域を囲繞する外周余剰領域とが表面に形成されたウエーハの加工方法であって、
ウエーハの裏面からウエーハに対して透過性を有する波長のレーザー光線の集光点を外周余剰領域に対応する内部に位置付けて照射しウエーハの仕上がり厚みに達しない改質層をリング状に形成する改質層形成工程と、
該改質層形成工程の前又は後に、ウエーハの表面に保護部材を配設する保護部材配設工程と、
該保護部材側をチャックテーブルに保持しウエーハの裏面を研削してリング状に形成された改質層を除去し該改質層を起端とする劈開面を表面に到達させると共に、仕上がり厚みまで研削し、リング状の補強部を外周余剰領域に対応して形成する補強部形成工程と、
ウエーハの裏面に所定の加工を施す裏面加工工程と、
を含み、
該保護部材は、ウエーハの表面側における該デバイス領域と、該リング状の補強部が形成される外周余剰領域とを含む領域に配設され、該補強部形成工程及び該裏面加工工程は、該保護部材が配設された状態で実施されるウエーハの加工方法。 - 該裏面加工工程の後、該補強部形成工程において形成された該劈開面に基づいて該リング状の補強部を除去することに加え、ウエーハの表面から保護部材を除去しウエーハの裏面をダイシングテープに貼着すると共にウエーハを収容する開口部を有するフレームでダイシングテープの外周を支持する移し替え工程と、
ウエーハの分割予定ラインに加工を施してウエーハを個々のデバイスチップに分割する分割工程と、
を含み構成される請求項1に記載のウエーハの加工方法。
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020075204A JP7512072B2 (ja) | 2020-04-21 | 2020-04-21 | ウエーハの加工方法 |
| US17/211,186 US11387133B2 (en) | 2020-04-21 | 2021-03-24 | Wafer processing method |
| KR1020210042197A KR102860783B1 (ko) | 2020-04-21 | 2021-03-31 | 웨이퍼의 가공 방법 |
| CN202110404974.6A CN113539788B (zh) | 2020-04-21 | 2021-04-15 | 晶片的加工方法 |
| TW110113755A TWI889806B (zh) | 2020-04-21 | 2021-04-16 | 晶圓加工方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020075204A JP7512072B2 (ja) | 2020-04-21 | 2020-04-21 | ウエーハの加工方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2021174810A JP2021174810A (ja) | 2021-11-01 |
| JP7512072B2 true JP7512072B2 (ja) | 2024-07-08 |
Family
ID=78082216
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020075204A Active JP7512072B2 (ja) | 2020-04-21 | 2020-04-21 | ウエーハの加工方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11387133B2 (ja) |
| JP (1) | JP7512072B2 (ja) |
| KR (1) | KR102860783B1 (ja) |
| CN (1) | CN113539788B (ja) |
| TW (1) | TWI889806B (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7730666B2 (ja) * | 2021-06-01 | 2025-08-28 | 株式会社ディスコ | 加工方法および加工装置 |
| JP7840739B2 (ja) * | 2022-03-07 | 2026-04-06 | 株式会社ディスコ | ウエーハの加工方法 |
| CN115741248A (zh) * | 2022-11-23 | 2023-03-07 | 杭州中欣晶圆半导体股份有限公司 | 一种改善硅片塌边的硅片加工机构及方法 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007019461A (ja) | 2005-04-27 | 2007-01-25 | Disco Abrasive Syst Ltd | ウェーハの加工方法及びウェーハ |
| JP2012129404A (ja) | 2010-12-16 | 2012-07-05 | Disco Abrasive Syst Ltd | 分割方法 |
| JP2013235917A (ja) | 2012-05-08 | 2013-11-21 | Disco Abrasive Syst Ltd | ウエーハの分割方法 |
| JP2015138951A (ja) | 2014-01-24 | 2015-07-30 | 株式会社ディスコ | ウェーハの加工方法 |
| JP2016081990A (ja) | 2014-10-14 | 2016-05-16 | 株式会社ディスコ | ウエーハの分割方法 |
| JP2018117037A (ja) | 2017-01-18 | 2018-07-26 | 株式会社ディスコ | 加工方法 |
| WO2019176589A1 (ja) | 2018-03-14 | 2019-09-19 | 東京エレクトロン株式会社 | 基板処理システム、基板処理方法及びコンピュータ記憶媒体 |
| JP2020009864A (ja) | 2018-07-05 | 2020-01-16 | 株式会社ディスコ | 被加工物の研削方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4791774B2 (ja) * | 2005-07-25 | 2011-10-12 | 株式会社ディスコ | ウェーハの加工方法及び研削装置 |
| JP2008283025A (ja) * | 2007-05-11 | 2008-11-20 | Disco Abrasive Syst Ltd | ウエーハの分割方法 |
| JP5357669B2 (ja) * | 2009-08-28 | 2013-12-04 | 株式会社ディスコ | ウエーハの加工方法 |
| JP6124547B2 (ja) * | 2012-10-16 | 2017-05-10 | 株式会社ディスコ | 加工方法 |
| US9206037B2 (en) * | 2014-03-04 | 2015-12-08 | Disco Corporation | MEMS device chip manufacturing method |
| JP6821245B2 (ja) * | 2016-10-11 | 2021-01-27 | 株式会社ディスコ | ウェーハの加工方法 |
-
2020
- 2020-04-21 JP JP2020075204A patent/JP7512072B2/ja active Active
-
2021
- 2021-03-24 US US17/211,186 patent/US11387133B2/en active Active
- 2021-03-31 KR KR1020210042197A patent/KR102860783B1/ko active Active
- 2021-04-15 CN CN202110404974.6A patent/CN113539788B/zh active Active
- 2021-04-16 TW TW110113755A patent/TWI889806B/zh active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007019461A (ja) | 2005-04-27 | 2007-01-25 | Disco Abrasive Syst Ltd | ウェーハの加工方法及びウェーハ |
| JP2012129404A (ja) | 2010-12-16 | 2012-07-05 | Disco Abrasive Syst Ltd | 分割方法 |
| JP2013235917A (ja) | 2012-05-08 | 2013-11-21 | Disco Abrasive Syst Ltd | ウエーハの分割方法 |
| JP2015138951A (ja) | 2014-01-24 | 2015-07-30 | 株式会社ディスコ | ウェーハの加工方法 |
| JP2016081990A (ja) | 2014-10-14 | 2016-05-16 | 株式会社ディスコ | ウエーハの分割方法 |
| JP2018117037A (ja) | 2017-01-18 | 2018-07-26 | 株式会社ディスコ | 加工方法 |
| WO2019176589A1 (ja) | 2018-03-14 | 2019-09-19 | 東京エレクトロン株式会社 | 基板処理システム、基板処理方法及びコンピュータ記憶媒体 |
| JP2020009864A (ja) | 2018-07-05 | 2020-01-16 | 株式会社ディスコ | 被加工物の研削方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20210130099A (ko) | 2021-10-29 |
| US11387133B2 (en) | 2022-07-12 |
| CN113539788A (zh) | 2021-10-22 |
| TW202141606A (zh) | 2021-11-01 |
| JP2021174810A (ja) | 2021-11-01 |
| CN113539788B (zh) | 2025-12-19 |
| US20210327744A1 (en) | 2021-10-21 |
| TWI889806B (zh) | 2025-07-11 |
| KR102860783B1 (ko) | 2025-09-16 |
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