JP7585692B2 - Eyeglass frame shape measuring device and control program for eyeglass frame shape measuring device - Google Patents

Description

The present disclosure relates to an eyeglass frame shape measuring device for obtaining the shape of an eyeglass frame rim and a control program for the eyeglass frame shape measuring device.

There is a known eyeglass frame shape measuring device that has a probe unit that is pressed against and inserted into a groove in the rim of an eyeglass frame, and measures the shape of the entire circumference of the rim groove by obtaining the position of the probe that is moved along the rim groove (see, for example, Patent Document 1).

An optical measurement unit eyeglass frame shape measuring device is also known that has an optical measurement unit that irradiates a measurement light beam onto a groove in the rim of an eyeglass frame and receives the reflected light beam reflected by the groove, and obtains the cross-sectional shape of the rim groove based on the received reflected light (see, for example, Patent Document 2).

JP 2011-122899 A International Publication No. 2019/026416

By configuring the probe unit and the optical unit to move together, it is possible to efficiently obtain the three-dimensional shape of the entire circumference of the rim groove and the cross-sectional shape of the rim groove.

However, by adding an optical measuring unit to the probe unit, the size of the area around the probe increases, and when measuring the entire circumference of the rim, it becomes apparent that the optical measuring unit interferes with the rim holding member that holds the rim and the part of the rim being measured, making it difficult to perform a good measurement.

The technical objective of this disclosure is to provide an eyeglass frame shape measuring device and a control program for the eyeglass frame shape measuring device that can accurately measure the three-dimensional shape of the rim groove and the cross-sectional shape of the rim groove.

In order to solve the above problems, the present disclosure is characterized by having the following configuration.
(1) An eyeglass frame shape measuring device for measuring the shape of a rim of an eyeglass frame, comprising: a frame holding means having a rim holding member for holding the rim of an eyeglass frame; a probe unit having a probe to be inserted into a groove of the rim; and an optical measuring unit for optically measuring the shape of the groove of the rim, the optical measuring unit comprising: a light projecting optical system for irradiating a measuring beam from a light source toward the groove of the rim; a light receiving optical system for receiving by a detector the reflected beam of the measuring beam reflected by the groove of the rim; and a housing for accommodating the light projecting optical system and the light receiving optical system ; and a housing for integrating the probe unit and the optical measuring unit. a support unit which supports the rim centrally; a change means which changes the relative positional relationship between the rim and the support unit; and a control means which controls the change means based on position information of an interference site previously identified in the housing of the optical measurement unit so as to avoid interference with an interfering object including at least the optical measurement unit among the measuring device unit, the optical measurement unit, and the support unit when measuring the rim, the interfering object including at least one of the rim and the rim holding member of the eyeglass frame held by the frame holding means.
(2) An optical measurement unit for optically measuring the shape of the groove in the rim, the optical measurement unit comprising: a frame holding means having a rim holding member for holding a rim of an eyeglass frame; a probe unit having a probe to be inserted into a groove in the rim; a light projecting optical system which irradiates a measurement light beam from a light source toward the groove in the rim; a light receiving optical system which receives the measurement light beam reflected by the groove in the rim with a detector; and a housing which houses the light projecting optical system and the light receiving optical system; a support unit which integrally supports the probe and optical measurement unit; and a measuring device which measures the relative positional relationship between the rim and the support unit. and a modification means for modifying the position of an interference site determined in advance in the housing of the optical measurement unit, so as to avoid interference with an interfering object including at least the optical measurement unit among the measuring device unit, the optical measurement unit, and the support unit, for an interfered object including at least one of the rim of the eyeglass frame held by the frame holding means and the rim holding member.

FIG. FIG. 2 is a top view of the frame holding unit. FIG. 4 is a diagram illustrating a clamp mechanism. FIG. 2 is a top perspective view of the target lens shape acquisition unit. FIG. 2 is a bottom perspective view of the target lens shape acquisition unit. FIG. 2 is a top perspective view of a Z-direction moving unit and a Y-direction moving unit. FIG. 2 is a perspective view illustrating a schematic configuration of a holding unit. 11A and 11B are diagrams illustrating a mechanism by which a holding unit holds a supporting unit. FIG. 2 is a schematic configuration diagram of a measurement element unit and an optical measurement unit. 2 is a schematic diagram showing the positional relationship between a light projecting optical system and a light receiving optical system of the optical measurement unit; FIG. FIG. 2 is a diagram showing a control system of the eyeglass frame shape measuring apparatus. 4 is a flowchart of a program executed by a control unit in the eyeglass frame shape measuring device. FIG. FIG. 13 is a diagram showing the operation of the holding unit at the start of measurement. 10 is a schematic diagram showing the positional relationship between a clamp pin, a rim, a measuring element, and an optical measuring unit when measuring the shape of a low curve frame. FIG. FIG. 10 is a schematic diagram showing the positional relationship between the clamp pin, the rim, the measurement element, and the optical measurement unit when the optical measurement unit and the clamp pin interfere with each other; FIG. 4 is a diagram showing an interference portion of the optical measurement unit. 13 is a diagram illustrating a case where the optical measurement unit is moved in the Y direction to avoid interference. FIG. 13A and 13B are diagrams illustrating a case where the optical measurement unit is moved in the Z direction to avoid interference. FIG. 13 is a diagram for explaining a case where interference is avoided for an unmeasured portion of a rim. 13A and 13B are diagrams illustrating an example in which interference is avoided by utilizing the results of measurements of the rim. FIG. 13 is a graph showing the results of differentiating the measurement results in the Z direction of the rim measured by the probe. FIG. 13 is a diagram illustrating an avoidance operation at a measurement point where interference has occurred. 13 is a diagram illustrating a case where the optical measurement unit is moved in the X direction to avoid interference. FIG. 1 is a schematic diagram showing the positional relationship between an optical measurement unit and a probe when the optical measurement units are arranged on both the left and right sides of the probe. FIG. 13A and 13B are diagrams illustrating an operation for avoiding an object that may be interfered with when optical measurement units are arranged on both the left and right sides of a probe.

Hereinafter, an embodiment of the present disclosure will be described with reference to the drawings. FIGS. 1 to 11 are diagrams for explaining the configuration of an eyeglass frame shape measuring device (e.g., eyeglass frame shape measuring device 1) according to this embodiment. In this embodiment, the measurement plane when measuring the rim of an eyeglass frame, which is an eyeglass frame, is the XY direction, and the vertical direction perpendicular to the XY direction is the Z direction. For example, the measurement plane (XY plane) is also treated as a radial plane. The XY direction is also treated as a radial direction for obtaining radial information of the rim. For example, the measurement plane is a plane defined by a rim holding member (e.g., clamp pins 130a, 130b, 131a, 131b) that holds the rim of the eyeglass frame, and a rim holding member (e.g., clamp pins 130a, 130b) arranged at two locations to hold the upper sides of the left and right rims (in this embodiment, the upper and lower sides of the eyeglass frame and rim refer to the upper and lower sides that are vertical when the eyeglasses are worn), and a rim holding member (e.g., clamp pins 131a, 131b) arranged at two locations to hold the lower sides of the left and right rims. In addition, the vertical direction (depth direction of the eyeglass frame shape measuring device) that is the up-down direction of the eyeglass frame when the eyeglass frame is held by the rim holding member on the measurement plane is defined as the Y direction, and the left-right direction of the eyeglass frame is defined as the X direction.

In this embodiment, for example, the measurement plane is horizontal, and the rim portion of the eyeglass frame F is placed in the eyeglass frame shape measuring device shown in FIG. 1 with the rim portion facing downward and the temple portion of the eyeglass frame F facing upward. That is, when the eyeglass frame F is placed in the eyeglass frame shape measuring device, the left and right rims FL, FR of the eyeglass frame F face downward, and the left and right temples FTL, FTR of the eyeglass frame F face upward. Of course, the arrangement direction of the eyeglass frame with respect to the eyeglass frame shape measuring device is not limited to this. For example, the eyeglass frame may be arranged with the rim portion of the eyeglass frame F facing upward and the temple portion of the eyeglass frame F facing downward. Also, for example, the measurement plane may be vertical, and when the eyeglass frame F is placed in the eyeglass frame shape measuring device, the upper ends of the left and right rims FL, FR of the eyeglass frame F face downward with respect to the eyeglass frame shape measuring device, and the lower ends of the left and right rims FL, FR of the eyeglass frame F face upward with respect to the eyeglass frame shape measuring device, or the arrangement of the upper and lower ends of the left and right rims FL, FR may be reversed. Furthermore, the measurement plane is not limited to being horizontal or vertical, but may be oblique.

[overview]
For example, the eyeglass frame shape measuring device includes a frame holding means (e.g., a frame holding unit 10) configured to hold the eyeglass frame in a measurement state. For example, the frame holding means is a means for holding the eyeglass frame with the left-right direction of the eyeglass frame as the X direction, the vertical direction of the rim of the eyeglass frame as the Y direction, and the front-rear direction of the rim of the eyeglass frame as the Z direction. For example, the frame holding means has a rim holding member for holding the eyeglass frame in a measurement state. For example, the rim holding member is arranged at two locations to hold the upper sides of the left and right rims, respectively, and is also arranged at two locations to hold the lower sides of the left and right rims, respectively. For example, two rim holding members are arranged at each position to sandwich the rim of the eyeglass frame from its thickness direction (Z direction). For example, the two rim holding members arranged at each position are configured to be openable and closable in the Z direction. For example, the frame holding means includes a rim holding member opening and closing means (e.g., a clamp mechanism 300) for opening and closing the two rim holding members in the Z direction. Note that the rim holding member may be a member having a V-shaped groove. In this case, the rim holding member is configured to hold the rim by receiving the rim in the thickness direction in a V-shaped groove.

For example, the eyeglass frame shape measuring device includes a probe unit (e.g., probe unit 60). For example, the probe unit includes a probe (e.g., probe 61) that is inserted into the groove of the rim. For example, the probe unit includes a probe shaft (e.g., probe shaft 62) with the probe disposed on the upper part. Note that in this embodiment, when the probe shaft is positioned in the Z direction, the direction of the tip of the probe (e.g., measurement axis L3) is arranged to extend approximately parallel to the measurement plane with respect to the probe shaft, but this is not limited to this. For example, the direction of the tip of the probe may be arranged to face upward at a certain angle (e.g., 5 to 15 degrees) with respect to the measurement plane so that it is easy to follow the shape of the rim when measuring a highly curved frame.

For example, the eyeglass frame shape measuring device includes an optical measuring unit (for example, optical measuring unit 30). For example, the optical measuring unit optically measures the rim shape of the groove of the rim of the eyeglass frame in a non-contact manner. For example, the optical measuring unit includes a light projecting optical system (for example, light projecting optical system 30a) and a light receiving optical system (for example, light receiving optical system 30b). For example, the light projecting optical system has a light source (for example, light source 31) and irradiates a measurement light beam from the light source toward the groove of the rim of the eyeglass frame. For example, the light projecting optical system is configured to project slit light onto the groove of the rim. For example, the groove of the rim is illuminated in a light-cut form by the slit light. For example, the light receiving optical system has a detector (for example, detector 37) that receives light. For example, the light receiving optical system receives the reflected light beam of the measurement light beam that is irradiated by the light projecting optical system toward the groove of the rim of the eyeglass frame and reflected by the groove of the rim of the eyeglass frame by the detector.

For example, the eyeglass frame shape measuring device includes a support unit (e.g., support unit 70) that integrally supports the probe unit and the optical measuring unit. For example, the support unit has a support member (e.g., probe shaft 62) that supports the probe unit and the optical measuring unit. For example, the support unit is configured to support the probe unit and the optical measuring unit by using a part of the probe shaft to which the probe is attached as a support member. For example, the optical measuring unit is attached to the probe shaft.

For example, the optical measurement unit includes a housing (e.g., cover 30c) in which the light projecting optical system and the light receiving optical system are housed. For example, the housing of the optical measurement unit is provided on the support unit such that the entire housing is positioned to one side in the left-right direction with respect to the probe axis with the tip of the probe facing forward. Note that the optical measurement unit may be configured to be disposed on both the left and right sides of the probe axis.

In addition, for example, when the measuring element is inserted into the groove of the rim held by the rim holding member at the start of measurement, the upper end of the housing of the optical measurement unit (e.g., cover 30c) is configured to be located below the position of the lower end of the rim holding member (e.g., below when the Z direction is the up-down direction) so that the optical measurement unit does not interfere with the rim holding member in the Z direction. This makes it easier to avoid interference with the rim holding member and the rim nearby the rim holding member during measurement. In addition, for example, the lower end of the housing of the optical measurement unit may be located above the upper end of the rim holding member. This also makes it easier to avoid interference of the optical measurement unit with the rim holding member.

For example, the eyeglass frame shape measuring device includes a holding unit (e.g., holding unit 25) that holds the support unit. For example, the holding unit is configured to hold the support unit movably in the direction in which the tip of the probe faces (e.g., the direction of measurement axis L3). For example, the holding unit includes a measurement pressure applying means (e.g., spring 76) that applies a measurement pressure that presses the tip of the probe against the groove in the rim. For example, the holding unit is configured to hold the position of the support unit in the Z direction so that it can be freely moved.

For example, the eyeglass frame shape measuring device includes a change means (e.g., moving unit 210, rotation unit 260) that changes the relative positional relationship between the rim and the support unit. For example, the change means includes a rotation means (e.g., rotation unit 260) that rotates the support unit around a rotation axis extending in the Z direction in order to change the XY direction in which the tip of the probe faces. For example, the rotation means is provided in the holding unit. The rotation means changes the XY direction in which the tip of the probe of the probe unit faces (e.g., the direction of measurement axis L3) and the XY direction of the measurement optical axis of the optical measurement unit (light projection optical axis L1, light reception optical axis L2) on the XY measurement plane.

Also, for example, the change means includes an XY direction change means for changing the position of the support unit in the XY direction. The XY direction change means includes an X direction change means (for example, an X direction moving unit 240) for changing the X direction position of the holding unit on which the support unit is provided, and a Y direction change means (for example, a Y direction moving unit 230) for changing the Y direction position of the holding unit. This allows the tracking mechanism of the probe that follows the groove of the rim in the XY direction to be miniaturized and its weight to be small, so the shape of the rim can be measured with high accuracy by the probe. Also, for example, the change means includes a Z direction change means (for example, a Z direction moving unit 220) for changing the Z direction position of the holding unit on which the support unit is provided. This allows the tracking mechanism of the probe that follows the groove of the rim in the Z direction to be miniaturized and its weight to be small, so the shape of the rim can be measured with high accuracy by the probe.

For example, the eyeglass frame shape measuring device includes an interference information acquisition means (e.g., a control unit 50). The interference information acquisition means is configured to acquire interference information of at least one of the interfered objects, the rim of the eyeglass frame and the rim holding member, which are interfered with by the frame holding means and are placed in a measurement state by the eyeglass frame rim. For example, the interference information acquired by the interference information acquisition means includes position information of the rim holding member when the rim of the eyeglass frame is placed in a measurement state. For example, the interference information acquisition means acquires position information of the rim holding member in at least one of the X, Y, and Z directions.

For example, the interference information acquisition means acquires Y-direction position information of the rim holding member based on the Y-direction position to which the rim holding member has been moved by the frame holding means so as to hold the rim of the eyeglass frame. For example, the X-direction position information of the rim holding member is stored as a design value in the storage means. For example, the interference information acquisition means acquires the X-direction position information of the rim holding member by calling it from the storage means. For example, the interference information acquisition means acquires Z-direction position information of the rim holding member by obtaining the Z-direction position of the rim holding member (the rim holding member in front of the rim) when holding the rim during measurement. Note that the interference information acquisition means may store Z-direction position information of the rim holding member in the storage means as a design value. In this case, the interference information acquisition means acquires Z-direction position information of the rim holding member by calling it from the storage means.

For example, the eyeglass frame shape measuring device includes a control means (e.g., control unit 50) that controls the change means. For example, the control means controls the change means to measure the unmeasured portion of the rim based on the measurement result of the shape of the rim. During this measurement, for example, the control means controls the change means to avoid interference of the interfering object with the interfered object based on the interfered information acquired by the interfered information acquisition means. For example, the interfering object includes at least one of the measuring unit, the optical measuring unit, and the support unit. For example, the interfering object that interferes with the interfered object during measurement is typically the optical measuring unit, but depending on the shape of the measuring unit, this may also become the interfering object. Also, depending on the shape of the support unit, this may also become the interfering object. For example, when the unmeasured portion of the rim is measured, the control means controls the change means based on the arrangement information of the rim holding member so that the interfering portion (e.g., the interference area IR) of the interfering object (e.g., the optical measuring unit) moves away from the rim holding member in at least one of the X direction, Y direction, and Z direction. The interference part of the interfering object (for example, an optical measurement unit) may be specified in advance on the housing of the interfering object (for example, an optical measurement unit) and stored in a storage means. For example, the interference part can be specified in advance by simulating the positional relationship of the housing of the interfering object (for example, an optical measurement unit) during measurement with respect to the shape of the rim of various measurable eyeglass frames. For example, the interference part may be one interference point (for example, an interference point IRP) determined on the interfering object. For example, the interference point is a point determined on the interfering object (for example, an optical measurement unit), and is determined as a point that avoids the interference of the entire interference part if the interference of this interference point is avoided with respect to the interfered object. For example, the interference point can be specified in advance by simulating the positional relationship of the housing of the interfering object (for example, an optical measurement unit). In this case, the interference part has a certain area, whereas it is sufficient to calculate the arrangement position of one interference point, so that the calculation speed is increased and the measurement can be performed smoothly. For example, the control means controls the change means so that the interfering portion of the interfering object (e.g., an optical measurement unit) is moved a certain distance or more away from the tip of the rim holding member that extends toward the inside of the rim in the Y direction (e.g., avoided). For example, the control means controls the rotation means at this time. For example, when measuring an unmeasured portion of the rim, the control means positions the measuring probe so that it measures the unmeasured portion of the rim based on the measurement result, and controls the XY change means and the rotation means so that the interfering portion of the interfering object (e.g., an optical measurement unit) is moved a certain distance or more away from the tip of the rim holding member in the Y direction. This avoids interference of the interfering object (e.g., an optical measurement unit) with the rim holding member in the Y direction, and also avoids interference of the interfering object (e.g., an optical measurement unit) with the rim located near the rim holding member.

For example, the control means sets a judgment line (e.g., an interference judgment line ILCY) that is approximately parallel to the Y direction and at least a certain distance away from the tip of the rim holding member in the Y direction based on the positioning information of the rim holding member. Then, for example, the control means controls the modification means so that when the unmeasured portion of the rim is measured, the interference portion of an interfering object (e.g., an optical measurement unit) does not come closer to the side where the rim holding member is located than the judgment line. This avoids interference of an interfering object (e.g., an optical measurement unit) with the rim holding member in the Y direction, and also avoids interference of an interfering object (e.g., an optical measurement unit) with a rim located near the rim holding member.

The control means determines a first state including the XY position state of the support unit and the rotation state by the rotation means so that when the probe is positioned in the unmeasured part of the rim based on the measured result, the tip of the probe faces a predetermined angle relative to the rim (for example, in the XY direction, the unmeasured rim part is in the extension direction of the measured rim and faces normal to that extension direction), and then determines the deviation amount (for example, ΔE) in the Y direction by which the interference part of the interfering object (for example, the optical measurement unit) exceeds the judgment line in this first state, and controls the change means so that the interference part of the interfering object (for example, the optical measurement unit) is moved in the Y direction based on the determined deviation amount.

For example, the optical measurement unit is supported by the support unit in a position that does not interfere with the rim holding member in the Z direction, with the probe inserted into the groove of the rim held by the rim holding member at the start of measurement. If the interfering object is the optical measurement unit, for example, when an unmeasured portion of the rim is to be measured and, based on the position information of the rim holding member, the control means does not perform interference avoidance operation in the Y direction when the interfering portion of the optical measurement unit is located at a certain distance or more away from the rim holding member in the Z direction. This means that the position of the optical measurement unit is not changed to avoid interference in the X and Y directions, allowing the shape of the rim to be measured with greater accuracy.

For example, the interfered information acquired by the interfered information acquisition means includes measured information of the rim. In this case, for example, the control means controls the change means based on the measured information of the rim so that the distance between the interfering part of the interfering object (e.g., an optical measurement unit) and the interfered object is equal to or greater than a certain distance in at least one of the X-direction, Y-direction, and Z-direction with respect to the measured rim.

For example, the optical measuring unit is configured to be positioned offset to the left or right with respect to the probe when viewed from the tip of the probe. If the interfering object is the optical measuring unit, for example, the control means controls the probe to measure an unmeasured portion of the rim ahead of the optical measuring unit when measuring the rim, and the control means controls the change means based on the measured information of the rim so that the distance between the interfering portion of the optical measuring unit and the interfered object is equal to or greater than a certain distance in at least one of the X, Y, and Z directions with respect to the measured rim.

For example, the interfered portion of the rim in the measured information of the rim can be obtained based on the rim cross-sectional information measured by the optical measurement unit. For example, the interfered portion of the rim in the measured information of the rim can be obtained based on the rim cross-sectional information measured by the optical measurement unit and the measurement results of the three-dimensional shape of the rim by the measuring probe unit. Furthermore, even without using the rim cross-sectional information measured by the optical measurement unit, the interfered portion of the rim in the XY direction in the measured information of the rim can be obtained based on the rim information of the inside of the rim relative to the rim groove, which has been obtained in advance, and the measurement results of the rim shape by the measuring probe unit. For example, the interfered portion of the rim in the Z direction in the measured information of the rim can be obtained based on the rim thickness information relative to the rim groove, which has been obtained in advance, and the measurement results of the rim shape by the measuring probe unit.

For example, the optical measurement unit is supported by the support unit in a position that does not interfere with the rim holding member in the Z direction, with the probe inserted into the groove of the rim held by the rim holding member at the start of measurement. If the interfering object is the optical measurement unit, for example, when an unmeasured portion of the rim is to be measured, and based on the positioning information of the rim holding member, the control means does not perform interference avoidance operations in the X and Y directions when the interfering portion of the optical measurement unit is located at a certain distance or more away from the rim holding member in the Z direction.

For example, the optical measuring unit is configured to be positioned offset to one side in the left or right direction with respect to the probe when the probe is viewed from the tip direction. In this case, for example, the control means controls the modification means so that when measuring the rim, the probe precedes the optical measuring unit to measure the unmeasured portion of the rim. Then, for example, the control means controls the modification means based on the measured rim information so that the optical measuring unit avoids interference with the measured rim in at least one of the X and Y directions. This makes it possible to perform measurements while avoiding interference with the rim, even if the optical measuring unit is configured not to be able to perform interference avoidance operation in the Z direction.

For example, the eyeglass frame shape measuring device may include a selection means for selecting whether the eyeglass frame is a high-curve frame or not. In this case, for example, when a high-curve frame is selected, the control means controls the change means to avoid interference of an interfering object (for example, an optical measurement unit) with the interfered object. On the other hand, when a high-curve frame is not selected (i.e., when the eyeglass frame is not a high-curve frame), the control means does not perform an interference avoidance operation to avoid interference of the interfering object with the interfered object. For example, when the interfering object is an optical measurement unit, in a configuration in which the optical measurement unit is supported by the support unit at a position that does not interfere with the rim holding member in the Z direction with a measuring probe inserted into a groove of the rim held by the rim holding member at the start of measurement, if the eyeglass frame is not a high-curve frame, interference of the optical measurement unit with the rim holding member and the rim in the Z direction is avoided, so that the rim can be measured as usual without performing interference avoidance operations in the X and Y directions. This avoids unnecessary interference avoidance operations and allows the shape of the rim to be measured more accurately.

For example, the eyeglass frame shape measuring device is equipped with an interference occurrence detection means that detects whether or not interference occurs between an interfering object and an interfered object during measurement of the rim based on the measurement results of the rim. For example, the interference occurrence detection means detects whether or not interference occurs based on the detection results in the Z direction among the measurement results of the rim.

For example, the eyeglass frame shape measuring device includes a re-measurement execution means that executes re-measurement of the rim shape when the interference occurrence detection means detects that interference has occurred. For example, the re-measurement execution means may be configured so that the control unit automatically executes re-measurement based on the detection result of the interference occurrence detection means. Alternatively, the device may be configured so that a display means (e.g., monitor 3) displays the occurrence of interference between the interfering object and the interfered object during measurement, and a re-measurement execution signal is input when the operator operates a re-measurement execution switch.

For example, the eyeglass frame shape measuring device includes a measurement point identification means for identifying the measurement point where interference between the interfering object and the interfered object occurs based on the detection result of the interference occurrence detection means. For example, when the control means remeasures the identified measurement point, the control means controls the change means to perform an interference avoidance operation different from the interference avoidance operation before the remeasurement of the interfering object. For example, the eyeglass frame shape measuring device includes a calculation means for determining the position of the interfering part of the interfering object at the identified measurement point where interference occurs based on control information of the change means (which may further include positional relationship information of the optical measurement unit with respect to the measuring probe). In this case, for example, when the remeasurement is performed by the remeasurement execution means and the identified measurement point where interference occurs is remeasured, the control means controls the change means to perform an interference avoidance operation of the interfering object so that the interfering part is located at a certain distance or more from the position of the interfering part determined by the calculation means. This makes it possible to measure the shape of the rim more accurately and better.

For example, re-measurement by the re-measurement execution means may be performed when there is slight interference between the interfering object and the interfered object (the rim or the rim holding member) and the measuring probe has not fallen off completely from the rim groove. For example, re-measurement in this case may be performed after measurement of the entire circumference of the rim has been completed, or after the measurement has been interrupted when the occurrence of interference is detected by the interference occurrence detection means during the measurement. Also, for example, re-measurement by the re-measurement execution means may be performed if the measuring probe falls off the rim groove due to the occurrence of interference. For example, whether or not the measuring probe has fallen off the rim groove is detected based on the measurement results of the rim, since the measurement results of the rim indicate abnormal values.

For example, when the control means remeasures the identified measurement point where interference occurs, the control means performs an interference avoidance operation in at least one of the radial direction and the vertical directions perpendicular to the radial direction (X direction, Y direction, and Z direction) relative to the position of the interfering part determined by the calculation means.

Also, for example, when measuring the identified measurement point where interference occurs, the control means may perform an interference avoidance operation such that an interference point included in the interference portion moves away from the position of the interference point determined on the interfering object (e.g., an optical measurement unit) toward the inside of the rim in at least one of the X and Y directions. In this case, since the interference portion has a certain area, it is only necessary to calculate the position of one interference point determined on the interfering object (e.g., an optical measurement unit), which increases the calculation speed and enables smooth measurement.

For example, when re-measuring a measurement point after the identified measurement point where interference occurred, the control means controls the change means to gradually change the posture of the optical measurement unit from the posture state in which the optical measurement unit was operated to avoid interference at the measurement point where interference occurred to the posture state in which the optical measurement unit was operated to avoid interference at the measurement point where interference occurred to the posture state in which the optical measurement unit was operated to avoid interference at the measurement point where interference occurred. For example, if the posture state of the interfering object (e.g., the optical measurement unit) is suddenly returned to the posture state of the interfering object (e.g., the optical measurement unit) at the measurement point after the measurement point where interference occurred, the orientation of the probe relative to the rim (the orientation of the measurement axis L3) may suddenly change, and the measurement accuracy may deteriorate. For this reason, by gradually changing the orientation of the probe by an angle (e.g., 0.5 degrees) that reduces the effect on the measurement accuracy, the rim can be measured well without reducing the measurement accuracy.

The control for gradually changing the attitude of the optical measurement unit to that during the original measurement may be performed by setting the number of measurement points for the subsequent measurement points to a fixed value (e.g., 50 points, where one point is 0.36 degrees of radial angle), and gradually changing the angle at which the attitude of the optical measurement unit is returned to that during the original measurement by an angle divided by the number of measurement points.

The control means may also control the change means to gradually change the posture of the interfering object from the posture state at the time of the original measurement to a posture state in which the interfering object is subjected to an interference avoidance operation at the measurement point where the interference occurred, when re-measuring the previous measurement point before the identified measurement point where the interference occurred. This allows the rim to be measured satisfactorily without reducing the measurement accuracy.

Note that this disclosure is not limited to the device described in this embodiment. For example, a control program (software) that performs the functions of the above embodiment may be supplied to a system or device via a network or various storage media. Then, a control unit (e.g., a CPU) of the system or device may read and execute the program.

For example, the control program of the eyeglass frame shape measuring device includes a control step of controlling the modification means to avoid interference of interfering objects including at least one of a measuring probe unit, an optical measuring unit, and a support unit with respect to interfered objects including at least one of the rim of the eyeglass frame held by the frame holding means and the rim holding member. By having the control unit of the eyeglass frame shape measuring device execute these steps, the shape of the rim can be measured satisfactorily.

The control program may also include an interference information acquisition step for acquiring interference information of at least one of the interfered objects, the rim of the eyeglass frame held by the frame holding means and the rim holding member. In this case, the control step includes a step of controlling the change means to avoid interference of the interfering object with the interfered object, based on the interfered information acquired by the interference information acquisition step.

For example, the control program of the eyeglass frame shape measuring device includes a control step of controlling the change means to measure the unmeasured portion of the rim based on the measurement result of the shape of the rim. For example, the control program of the eyeglass frame shape measuring device includes an interference occurrence detection step of detecting whether or not interference between at least one of the interfered objects of the rim and the rim holding member and an interfering object occurs during measurement of the rim based on the measurement result of the rim. For example, the control program of the eyeglass frame shape measuring device includes a re-measurement execution step of executing re-measurement of the shape of the rim when the occurrence of interference is detected by the interference occurrence detection step. For example, the control program of the eyeglass frame shape measuring device includes a measurement point identification step of identifying the measurement point where interference with the rim occurs based on the detection result of the interference occurrence detection step. For example, the control step is a step of controlling the change means to perform an interference avoidance operation different from the interference avoidance operation before the re-measurement of the interfering object when re-measurement is performed by the re-measurement execution step and the identified measurement point is re-measured.

For example, the control program of the eyeglass frame shape measuring device may include a calculation step for determining the position of the interfering part of the interfering object at the identified measurement point where interference occurs based on control information of the modification means. In this case, the control step is a step configured to perform an interference avoidance operation of the optical measurement unit by controlling the modification means so that the interfering part moves away from the position of the interfering part determined by the calculation step. By having the control unit of the eyeglass frame shape measuring device execute these steps, the shape of the rim can be measured well when re-measuring when interference occurs.

[Example]
One exemplary embodiment of the present disclosure will now be described with reference to the drawings.

FIG. 1 is a schematic diagram showing the appearance of an eyeglass frame shape measuring device.
For example, the eyeglass frame shape measuring device 1 includes a monitor 3, a switch section 4, a frame holding unit 10, a lens shape obtaining unit 20, etc. The monitor 3 displays various information (e.g., the cross-sectional shape of the rim groove FA of the rim Ri, the shape of the rim of the eyeglass frame F, etc.). The monitor 3 is a touch panel, and may also function as the switch section 4. The switch section 4 is used to perform various settings (e.g., starting measurement, etc.). Signals corresponding to operation instructions input from the monitor 3 and the switch section 4 are output to a control section 50, which will be described later. The eyeglass frame shape measuring device 1 may be configured to be incorporated into a lens processing device, as in JP 2000-314617 A and the like. For example, the lens shape acquisition unit 20 includes an optical measurement unit that irradiates a measurement light beam toward a groove of a rim Ri (e.g., left rim RIL, right rim RIR) of the eyeglass frame F held by the frame holding unit 10 and receives the reflected light beam to acquire the cross-sectional shape of the rim groove FA of the eyeglass frame F. Also, for example, the lens shape acquisition unit 20 includes a measuring probe unit 60 that measures the shape of the rim Ri by inserting a measuring probe into a groove of a rim (e.g., left rim RIL, right rim RIR) of the eyeglass frame F held by the frame holding unit 10 and detecting the movement of the measuring probe. For example, the lens shape acquisition unit 20 is disposed below the frame holding unit 10.

<Frame holding unit>
2 is a top view of the frame holding unit 10 holding the eyeglass frame F. The frame holding unit 10 holds the eyeglass frame F in a desired state. For example, the frame holding unit 10 includes a holder base 101, a front slider 102, a rear slider 103, an opening/closing movement mechanism 110, and the like.

For example, a front slider 102 and a rear slider 103 for holding the eyeglass frame F (rim Ri) are placed on the holding unit base 101. For example, the front slider 102 and the rear slider 103 are arranged to be slidable opposite each other on two rails 111 that extend in the Y direction centered on the center line CL, and are constantly pulled in a direction toward the center line CL of both sliders by a spring 113.

For example, the front slider 102 has clamp pins 130a and 130b, which are examples of rim holding members for clamping the rim Ri of the eyeglass frame F from its thickness direction (Z direction), arranged in two locations. For example, the rear slider 103 has clamp pins 131a and 131b, which are examples of rim holding members for clamping the rim Ri of the eyeglass frame F from its thickness direction (Z direction), arranged in two locations. Also, for example, when measuring a template, the front slider 102 and rear slider 103 are opened, and a well-known template holding jig is placed at a predetermined mounting position 140 and used. The configuration of this frame holding unit 10 can be a well-known one described, for example, in JP 2000-314617 A.

For example, when the eyeglasses are worn, the lower side of the rim of the eyeglass frame F is positioned on the front slider 102 side, and the upper side of the rim Ri is positioned on the rear slider 103 side. For example, the eyeglass frame F is held in a predetermined measurement state by clamp pins located on the lower and upper sides of each of the left and right rims Ri.

The open/closed state of the front slider 102 and the rear slider 103 in the Y direction may be detected by a detector 120 (e.g., an encoder). In this case, the detection information of the detector 120 is used to obtain position information of the clamp pins (130a, 131a, etc.) in the Y direction during measurement.

Figure 3 is a diagram explaining the clamp mechanism 300 of the clamp pins 130a and 130b that hold the rim Ri. The clamp mechanism 300 is arranged on the front slider 102 and the rear slider 103 in correspondence with the clamp pins 130a, 130b, 131a, and 131b arranged at four locations. Figure 3(a) is a schematic diagram of the clamp mechanism 300 arranged on the left side of the front slider 102 to clamp the underside of the left rim RIL. Figure 3(b) is a diagram explaining the positional relationship between the clamp pins 130 and 131, the front slider 102, the rear slider 103, and the rim Ri to be measured. Figure 3(c) is a diagram of the rim Ri held by the clamp pins 130 (130a, 130b) in Figure 3(b) observed from the direction of the arrow A3.

The clamp pin 130a is attached to the tip of the first arm 301 via the support shaft 132a. The clamp pin 130b is attached to the tip of the second arm 302 via the support shaft 132b. The first arm 301 is rotatably held by the shaft 304. The second arm 302 is rotatably held by the shaft 306. A compression spring 303 is attached between the first arm 301 and the second arm 302. The compression spring 303 always biases the distance between the two clamp pins 130a and 130b in the direction of opening. In addition, a gear 309 is formed around the shaft 304 at the center of the first arm 301. Similarly, a gear 311 is formed around the shaft 306 at the center of the second arm 302, and the gear 309 is meshed with the gear 311. One end of a spring 318 is attached to the rear end of the first arm 301. A wire 315 is fixed to the other end of the spring 318. The wire 315 is wound by a motor 322 via a pulley 317. When the motor 322 is driven, the clamp pin 130a attached to the first arm 301 and the clamp pin 130b attached to the second arm 302 are opened and closed in conjunction with each other.

In addition, a U-shaped rim receiver 313 against which the rim Ri abuts is disposed between the clamp pins 130a and 130b. The rim receiver 313 is fixed to the lower support shaft 132b. A groove 314 is formed in the rim receiver 313, through which the support shaft 132a of the clamp pin 130b passes. With this configuration, the rim Ri abuts against the rim receiver 313, restricting the position of the rim Ri in the Y direction, and the two clamp pins 130a, 130b are closed, so that the rim Ri is held by the clamp pins 130a, 130b.

The length SSBL of the support shafts 132a and 132b protruding in the Y direction from the opposing surfaces 102a and 103a of the sliders 102 and 103 is set at a length such that the optical measurement unit 30, described later, does not interfere with the sliders 102 and 103 even when the optical measurement unit 30, described later, is located below the clamp pin 130b during measurement and approaches the sliders 102 and 103. In addition, the length HBL from the rim receiver 313 to the tip position 133 of the clamp pins 130a and 130b extending in the Y direction and the width HBA (XY position) of the clamp pins 130a and 130b in the X direction are stored in advance in the memory 52, described later, as interference information. In addition, the Z direction position 130min of the lowest end where the clamp pin 130b is located when the clamp pin 130b holds the measurable rim Ri is also stored in advance in the memory 52 as interference information. Regarding the rim receiver 313, if the optical measurement unit 30 interferes during measurement, the width of the rim receiver 313 in the X direction and the position of the bottom end in the Z direction may be stored in advance in the memory 52 as interference information of the interfered object.

In this embodiment, the clamp pins 130a, 130b, 131a, and 131b are used as an example of the configuration of the rim holding member that holds the rim Ri, but this is not limited to this and any well-known mechanism may be used. For example, the rim holding member may have a V-shaped groove. In this case, the rim Ri is received in the V-shaped groove, and the Z-direction position and Y-direction position of the rim Ri are regulated.

<Target shape acquisition unit>
4 to 6 are diagrams illustrating the lens shape obtaining unit 20. Fig. 4 is a top perspective view of the lens shape obtaining unit 20. Fig. 5 is a bottom perspective view of the lens shape obtaining unit 20. Fig. 6 is a top perspective view of a Z-direction moving unit 220 and a Y-direction moving unit 230 (with a base portion 211 and an X-direction moving unit 240 removed) which will be described later.

For example, the target lens shape acquisition unit 20 is disposed below the frame holding unit 10. For example, the target lens shape acquisition unit 20 includes a base unit 211, a holding unit 25, a moving unit 210, etc.

The base portion 211 is a rectangular frame extending in the X and Y directions, and is provided at the bottom of the frame holding unit 10. The holding unit 25 holds the measuring probe unit 60 and the optical measuring unit 30 described below. The holding unit 25 also includes a rotation unit 260. The rotation unit 260 rotates the rotation base 261 around the rotation axis L0 to change the XY direction in which the measuring probe 61 provided in the measuring probe unit 60 described below faces, and the XY direction in which the opening 38 provided in the optical measuring unit 30 faces. The movement unit 210 moves the holding unit 25 in the X, Y, and Z directions, thereby moving the holding unit 25 relative to the rim Ri of the eyeglass frame F.

<Mobile unit>
For example, the moving unit 210 includes a base portion 211, a Z-direction moving unit 220, a Y-direction moving unit 230, an X-direction moving unit 240, etc. For example, the base portion 211 is a rectangular frame extending in the X-direction and Y-direction, and is disposed at the lower portion of the frame holding unit 10. For example, the Z-direction moving unit 220 moves the holding unit 25 in the Z-direction. For example, the Y-direction moving unit 230 holds the holding unit 25 and the Z-direction moving unit 220, and moves them in the Y-direction. For example, the X-direction moving unit 240 holds the holding unit 25, the Z-direction moving unit 220, and the Y-direction moving unit 230, and moves them in the X-direction.

For example, the X-direction movement unit 240 is generally configured as follows. For example, the X-direction movement unit 240 has a guide rail 241 extending in the X direction below the base portion 211. For example, the Y base 230a of the Y-direction movement unit 230 is attached to the guide rail 241 so as to be movable in the X direction. For example, a motor 245 is attached to the base portion 211. For example, a feed screw 242 extending in the X direction is attached to the rotation shaft of the motor 245. For example, a nut portion 246 fixed to the Y base 230a is screwed into the feed screw 242. As a result, when the motor 245 is rotated, the Y base 230a is moved in the X direction.

For example, the Y-direction movement unit 230 is generally configured as follows. For example, a guide rail (not shown) extending in the Y direction is attached to the Y base 230a. For example, the Z base 220a is attached to the guide rail so as to be movable in the Y direction. For example, a motor 235 for movement in the Y direction and a rotatable feed screw 232 extending in the Y direction are attached to the Y base 230a. For example, the rotation of the motor 235 is transmitted to the feed screw 232 via a rotation transmission mechanism such as a gear. For example, a nut 227 attached to the Z base 220a is screwed into the feed screw 232. As a result, when the motor 235 is rotated, the Z base 220a is moved in the Y direction.

For example, the XY direction movement unit is composed of the X direction movement unit 240 and the Y direction movement unit 230. For example, the movement position of the holding unit 25 in the XY directions is detected by the control unit 50 described later detecting the number of pulses at which the motors 245 and 235 are driven. Note that, for example, the movement position of the holding unit 25 in the XY directions may be detected using a sensor such as an encoder attached to the motors 245 and 235.

For example, the Z-direction moving unit 220 is generally configured as follows. For example, a guide rail 221 extending in the Z direction is formed on the Z base 220a, and a moving base 250a to which the holding unit 25 is attached is held along the guide rail 221 so as to be movable in the Z direction. For example, a pulse motor 225 for Z-direction movement is attached to the Z base 220a, and a feed screw (not shown) extending in the Z direction is rotatably attached. For example, the feed screw is screwed into a nut attached to the base 250a of the holding unit 25. For example, the rotation of the motor 225 is transmitted to the feed screw 222 via a rotation transmission mechanism such as a gear, and the rotation of the feed screw 222 moves the holding unit 25 in the Z direction.

For example, the movement position of the holding unit 25 in the Z direction is detected by the control unit 50, which will be described later, detecting the number of pulses with which the motor 225 is driven. Note that, for example, the movement position of the holding unit 25 in the Z direction may be detected using a sensor such as an encoder attached to the motor 225.

The above-mentioned mechanisms for moving in the X, Y, and Z directions are not limited to those in this embodiment, and any known mechanism can be used. For example, instead of moving the holding unit 25 in a straight line, it may be configured to move in an arc around the center of the rotating base 261 (see, for example, JP 2006-350264 A).

<Holding unit, supporting unit>
7 to 10, the configuration of the holding unit 25 will be described. Fig. 7 is a perspective view illustrating a schematic configuration of the holding unit 25. The holding unit 25 includes a support unit 70.

The support unit 70 includes a probe unit 60 and an optical measuring unit 30. The probe unit 60 includes a probe 61 that is inserted into the groove of the rim, and a probe shaft 71 on which the probe 61 is disposed. The optical measuring unit 30 includes a cover 30c that is a housing in which the light projecting optical system and the light receiving optical system are housed. The support unit 70 is configured to integrally support the probe unit 60 and the optical measuring unit 30. In this embodiment, a part of the lower part of the probe shaft 62 also serves as the support unit 70, and the optical measuring unit 30 is attached to the probe shaft 62. Note that the support unit 70 may be configured to integrally support the probe unit 60 and the optical measuring unit 30. For example, the optical measuring unit 30 may not be attached to the probe shaft 62, but may be configured to integrally support the probe shaft 62 and the optical measuring unit 30 by a support member.

As shown in FIG. 8, the optical measurement unit 30 is supported by the support unit 70 at a position that does not interfere with the clamp pin 130 in the Z direction when the probe 61 is inserted into the groove of the rim held by the clamp pin 130 at the start of measurement. In other words, when the probe shaft 62 is positioned approximately parallel to the Z direction, the distance ZA (distance in the Z direction) of the top surface 30cA of the cover 30c relative to the tip 61a of the probe 61 is set to a distance that does not interfere with the clamp pin 130b when the probe 61 is inserted into the groove of the rim held by the clamp pin 130 at the start of measurement.

When viewed from the direction of the tip 61a of the probe 61, the optical measurement unit 30 is configured to be biased to one side in the left-right direction with respect to the probe 61 (see Figures 7 and 9). In this embodiment, the optical measurement unit 30 is biased to the left side with respect to the probe 61.

The holding unit 25 is configured to hold the support unit 70 movably in the direction in which the tip 61a of the probe 61 faces (the direction of the measurement axis L3 in Figure 9), and to hold the position of the support unit 70 in the Z direction so that it can move freely. Furthermore, the holding unit 25 is equipped with a rotation unit 260 for changing the XY directions in which the tip 61a of the probe 61 of the probe unit faces) and the measurement optical axis of the optical measurement unit 30 (the light projection optical axis in Figure 9 is L1, and the light reception optical axis is L2).

The configuration of each unit in the holding unit 25 is explained below.

<Rotation unit>
The rotating unit 260 includes a rotating base 261. As shown in FIG. 7, the support unit 70 is disposed on the rotating base 261. The rotating base 261 is held rotatably around a rotation axis LO extending in the Z direction. For example, a large diameter gear 262 is formed on the outer periphery of the lower part of the rotating base 261. For example, the rotating unit 260 includes a mounting plate 252. For example, a motor 265 is attached to the mounting plate 252. For example, a pinion gear 266 is fixed to the rotating shaft of the motor 265, and the rotation of the pinion gear 266 is transmitted to the large diameter gear 262 via a gear 263 rotatably provided on the mounting plate 252. Therefore, the rotation of the motor 265 causes the rotating base 261 to rotate around the axis of the rotation axis LO. For example, the rotation of the motor 265 is detected by an encoder 265a integrally attached to the motor 265, and the rotation angle of the rotating base 261 is detected from the output of the encoder 265a. The origin position of the rotation of the rotating base 261 is detected by an origin position sensor (not shown).

<Holding mechanism of supporting unit by holding unit>
FIG. 8 is a diagram illustrating a mechanism by which the holding unit 25 holds the support unit 70 so as to be movable in the direction in which the tip 61a of the probe 61 faces, and a mechanism by which the holding unit 70 is held so as to be movable in the Z direction.

For example, the holding unit 25 is fixed under the rotating base 261 and includes a shaft 74 extending in the Z direction. The shaft 74 includes a cylindrical member 73 that is movable in the Z direction. A Z-moving support base 72 is fixed to the cylindrical member 73. The lower part of the probe shaft 62, which also serves as the support unit 70, is held by the Z-moving support base 72 so that it can tilt around the axis S2 toward the tip 61a of the probe 61. In other words, the support unit 70 is held by the holding unit 25 so that it can move toward the tip 61a of the probe 61, and the support unit 70 is held by the holding unit 25 so that it can move in the Z direction. The movement position of the support unit 70 in the Z direction relative to the holding unit 25 (rotating unit 260) is detected by an encoder 287, which is an example of a detector.

A spring 75 is disposed between the rotating base 261 and the cylindrical member 73 to balance the load of the support unit 70. The biasing force of the spring 75 may be set to apply a slight upward measurement pressure. This ensures that an upward measurement pressure is always applied to the probe 61 when measuring the rim Ri.

In FIG. 8, a rotation angle detection plate 79 is attached via a mounting member 78 to the probe shaft 62 below the axis S2. The amount of rotation of the rotation angle detection plate 7, which rotates around the axis S2, is detected by an encoder 288, which is an example of a detector. In other words, the amount of tilt of the probe shaft 62 is detected by the encoder 288.

A spring 76, which is an example of a measuring pressure applying means for applying a measuring pressure in the direction of the tip of the probe 61, is disposed between the mounting member 78 and the cylindrical member 73. The spring 76 constantly applies a biasing force so that the probe shaft 62 is tilted in the direction of the tip of the probe 61. In the initial state during measurement of the rim Ri, the mounting member 78 abuts against the limiting member 78a, thereby restricting the inclination of the probe shaft 62 to the state shown in FIG. 8 (a state in which the inclination of the probe shaft 62 relative to the Z direction is zero). Note that in the initial state during measurement, the probe shaft 62 may be slightly tilted in the direction opposite to the tip of the probe 61 (for example, tilted 2 to 5 degrees relative to the Z direction).

<Probe unit>
Fig. 9 is a schematic diagram of the support unit 70 of Fig. 7 viewed from above. For example, the probe unit 60 is used to obtain the shape of the rim Ri of the eyeglass frame F (for example, the lens shape of the rim Ri). The probe unit 60 includes a probe 61 and a probe shaft 62. For example, the probe 61 is attached to the probe shaft 62. In this embodiment, the direction from the probe shaft 62 to the tip 61a of the probe 61 is defined as a measurement axis L3.

<Optical measurement unit>
The optical measurement unit 30 will be described with reference to Fig. 7 to Fig. 10. Fig. 10 is a schematic diagram showing the positional relationship between a light projecting optical system 30a and a light receiving optical system 30b, which are optical systems provided in the optical measurement unit 30.

For example, the optical measurement unit 30 is composed of a light projection optical system 30a, a light receiving optical system 30b, and a cover 30c. For example, the light projection optical system 30a and the light receiving optical system 30b are used to obtain the shape of the rim Ri of the eyeglass frame F and the cross-sectional shape of the rim groove FA of the eyeglass frame F. For example, an opening 38 is provided in the cover 30c. For example, the opening 38 may be provided with a transparent panel that covers the opening 38. The light projection optical system 30a irradiates a measurement light beam from a light source toward the rim groove FA of the eyeglass frame F. The measurement light beam from the light projection optical system 30a is emitted from the inside to the outside of the holding unit 25 through the opening 38 and is irradiated toward the rim groove FA. For example, the light receiving optical system 30b receives the reflected light beam of the measurement light beam reflected by the rim groove FA of the eyeglass frame F by the detector 37. The reflected light beam of the measurement light beam reflected by the rim groove FA of the eyeglass frame F enters the holding unit 25 from the outside to the inside through the opening 38 and is guided toward the light receiving optical system 30b.

<Light projection optical system>
For example, the light projection optical system 30a includes a light source 31, a lens 32, a slit plate 33, and a lens 34. For example, the light projection optical axis of the light projection optical system 30a is L1. For example, the measurement light beam emitted from the light source 31 is collected by the lens 32 and illuminates the slit plate 33. For example, the measurement light beam that illuminates the slit plate 33 is limited to a thin slit shape by the slit plate 33, and is irradiated onto the rim groove FA of the eyeglass frame F via the lens 34. That is, the slit light is irradiated onto the rim groove FA of the eyeglass frame F. As a result, the rim groove FA of the eyeglass frame F is illuminated in a form in which the slit light is cut.

<Light receiving optical system>
For example, the light receiving optical system 30b includes a lens 36 and a detector 37 (e.g., a light receiving element). For example, the light receiving optical axis of the light receiving optical system 30b is denoted by L2. For example, the lens 36 guides the reflected light beam from the rim groove FA (e.g., scattered light from the rim groove FA, regular reflected light from the rim groove FA, etc.) acquired by reflection at the rim groove FA of the eyeglass frame F to the detector 37. For example, the detector 37 has a light receiving surface disposed at a position approximately conjugate with the rim groove FA of the eyeglass frame F.

<Layout of the light projecting optical system and the light receiving optical system>
In this embodiment, the light projecting optical system 30a and the light receiving optical system 30b are arranged based on the Scheimpflug principle. For example, a cutting surface where the rim groove FA of the eyeglass frame F is cut by the slit light projected by the light projecting optical system 30a, a lens system including the rim groove FA of the eyeglass frame F (the rim groove FA of the eyeglass frame F and the lens 36), and a light receiving surface of the detector 37 are arranged in a Scheimpflug relationship.

<Measurement positional relationship between optical measurement unit and probe unit>
Next, the relationship between the measurement position by the optical measurement unit 30 and the measurement position by the probe unit 60 will be described with reference to FIG.

For example, as shown in FIG. 9, in this embodiment, the optical measurement unit 30 and the probe unit 60 are arranged so that the first measurement position T measured by the optical measurement unit 30 and the second measurement position S measured by the probe unit 60 are different measurement positions. Also, in this embodiment, the probe unit 60 and the optical measurement unit 30 are arranged so that the first measurement position T and the second measurement position S are adjacent measurement positions. In this embodiment, the first measurement position T and the second measurement position S are shifted in measurement position by a shift amount ΔD.

For example, in this embodiment, the light projection optical axis L1 of the light projection optical system 30a and the imaging optical axis L2 of the light receiving optical system 30b are inclined in the Z direction by an inclination angle α with respect to the measurement axis L3 of the probe 61.

In addition, for example, in this embodiment, in order to enable measurement of positions where the first measurement position T and the second measurement position S are closer, the optical axis L1 of the projection optical system 30a in the optical measurement unit 30 is inclined by an inclination angle β on the radial plane (XY plane) with respect to the measurement axis L3 extending from the measuring element 61 toward the measurement position of the rim groove FA of the eyeglass frame F.

Furthermore, for example, in this embodiment, the imaging optical axis L2 of the light receiving optical system 30b in the optical measurement unit 30 is inclined by an inclination angle γ on the radial plane (XY plane) with respect to the optical axis L1 of the light projecting optical system 30a so that the cut surface cut by the slit light of the light projecting optical system 30a can be detected. That is, in this embodiment, the imaging optical axis L2 of the light receiving optical system 30b is inclined downward in the Z direction by an inclination angle α with respect to the XY plane, and is inclined by an inclination angle γ on the XY plane with respect to the optical axis L1 of the light projecting optical system 30a.

For example, the probe unit 60 and the optical measurement unit 30 are supported integrally by the support unit 70, so when the probe unit 60 is moved, the optical measurement unit 30 is moved in accordance with the movement of the probe unit 60.

<Control Unit>
11 is a diagram showing a control system of the eyeglass frame shape measuring device 1. For example, the control unit 50 is electrically connected to the monitor 3, the switch unit 4, the light source 31, the detector 37, the encoder 265a, each motor, a non-volatile memory 52 (hereinafter, memory 52), and the like.

For example, the control unit 50 includes a CPU (processor), RAM, ROM, etc. For example, the control unit 50 controls each component in the eyeglass frame shape measuring device 1. Also, for example, the control unit 50 functions as a calculation unit that performs various calculation processes, such as calculating the cross-sectional shape of the rim groove FA based on the output signals from each sensor. Also, the control unit 50 has the function of an interference information acquisition means. For example, the RAM temporarily stores various information. For example, the ROM stores various programs, initial values, etc. for controlling the operation of the eyeglass frame shape measuring device 1. Note that the control unit 50 may be configured with multiple control units (i.e., multiple processors).

For example, memory 52 is a non-transient storage medium that can retain its contents even if the power supply is cut off. For example, memory 52 can be a hard disk drive, a flash ROM, a USB memory, etc.

<Device Operation>
Next, an example of the operation of the device in the present disclosure will be described with reference to the flowchart in Fig. 12. The flowchart in Fig. 12 is an example of a program executed by the control unit 50 in the eyeglass frame shape measuring device 1. In this embodiment, the measurement of the rim Ri is performed starting from the right rim RIR, and then the left rim RIL, but it is of course also possible to measure the left rim RIL first, and then the right rim RIR.

First, the operator holds the eyeglass frame F in the frame holding unit 10. For example, the operator holds the eyeglass frame F in the frame holding unit 10 so that the left and right rims RIR, RIL of the eyeglass frame F face downward and the left and right temples FTL, FTR of the eyeglass frame F face upward. After that, the operator operates the switch unit 4 to input a trigger signal to start measurement to the control unit 50.

For example, a sensor (not shown) may detect that the eyeglass frame F is held by the frame holding unit 10, and measurement may begin.

Figure 13 (a) shows the state in which the tip 61a of the probe 61 provided on the holding unit 25 is located at the initial position SR1.

The initial position SR1 is a predetermined position where the holding unit 25 is placed before the start of measurement. For example, the X-direction position of the initial position SR1 is the center position of the clamp pins 130a and 130b in the X-direction. For example, the Y-direction position of the initial position SR1 is the same as the Y-direction position of the center line CL relative to the front slider 102 and the rear slider 103. For example, the Z-direction position of the initial position SR1 is a position where the probe 61 is lower than the lowest end 130min of the Z-direction movable range of the clamp pin 130b, for example, the lower end of the movable range of the Z-direction moving unit 220. In this embodiment, the X-direction positions of the clamp pins 130a and 130b and the Y-direction position of the center line CL are preset positions and may be stored in the memory 52. For example, in the initial position SR1, the tip 61a of the stylus 61 faces the measurement start point FS, and the stylus shaft 62 is positioned perpendicular to the Z direction relative to the rotation base 261. The initial position SR1 is set as the reference position OR for obtaining radial information in the X and Y directions of the right rim RIR. The reference position in the Z direction is set to the midpoint between the clamp pins 130a and 130b (clamp pins 131a and 131b). The initial position SR1 may be a position different from the above, depending on the positional relationship between the stylus 61 and the optical unit 30.

For example, when a trigger signal to start measurement is output, the control unit 50 controls the driving of the moving unit 210 and the rotating unit 260, and moves the holding unit 25 in the Y direction from the initial position SR1 so that the tip 61a of the probe 61 is inserted into the groove portion of the rim Ri clamped by the clamp pins 130a, 130b. Note that by moving the holding unit 25 from the initial position SR1, the portion of the rim groove FA into which the tip 61a of the probe 61 is inserted (and the position of the tip 61a of the probe 61) becomes the measurement start point FS.

Figure 13 (b) shows the state in which the holding unit 25 has been moved so that the tip 61a of the probe 61 is positioned at the measurement start point FS. For example, the position of the measurement start point FS is a point included in the portion clamped by the clamp pins 130a and 130b.

An example of a method for moving the holding unit 25 from the initial position SR so that the tip 61a of the probe 61 is positioned at the measurement start point FS is described below.

The control unit 50 rotates the rotation base 261 of the rotation unit 260 so that the measurement axis L3 of the probe 61 is at a predetermined angle δ with respect to the X direction at the measurement start point FS. The predetermined angle δ is, for example, an appropriate angle for at least one of the probe unit 60 and the optical measurement unit 30 to accurately measure the shape of the rim Ri, and is, for example, a normal direction to the X direction in the XY direction. The control unit 50 also moves the Z direction moving unit 220 so that the tip 61a of the probe 61 is at a predetermined height of the measurement start point FS (the position of the midpoint in the Z direction of the clamp pin 130a and the clamp pin 130b). Next, the control unit 50 drives the X direction moving unit 240 and the Y direction moving unit 230 to insert the tip 61a of the probe 61 into the rim groove FA. The tip 61a of the probe 61 comes into contact with the rim groove FA, and from that state the holding unit 25 is moved further towards the rim Ri, causing the probe shaft 62, which was in a vertical position, to tilt around the axis S2. The tilt of the probe shaft 62 is detected from a change in the output of the encoder 288, so the control unit 50 detects that the tip 61a of the probe 61 has come into contact with the rim groove FA. At the measurement start point FS, the holding unit 25 is moved towards the rim groove FA until the probe shaft 82 is tilted by a predetermined angle (for example, 5 degrees).

The position of the tip 61a of the probe 61 at this time is determined based on the XYZ position information of the holding unit 25 moved by the moving unit 210, the detection information of the encoder 287 that detects the amount of movement of the probe shaft 62 in the Z direction, the detection information of the encoder 288 that detects the inclination angle of the probe shaft 62, and the detection information of the encoder 265a that detects the rotation angle of the rotation unit 260, and is stored in the memory 52.

The reason why the holding unit 25 is moved until the probe shaft 62 is tilted is to enable measurements in the direction away from the rim groove FA when measuring subsequent measurement points. In this embodiment, after the probe 61 is inserted into the rim groove FA, it is tilted toward the rim groove FA around the axis S2, and a measuring pressure is applied by the springs 75 and 76. This generation of measuring pressure allows the tip 61a of the probe 61 to follow the change in the position of the rim groove FA until the probe shaft 62 becomes vertical.

When starting measurement of the rim Ri, it is advisable to make it possible to select in advance whether the eyeglass frame F to be measured is a high curve frame or not. For example, on the screen of the monitor 3 shown in FIG. 1, a selection switch 3a is displayed, which is an example of a selection means for selecting whether the eyeglass frame F to be measured is a high curve frame or not. When a high curve frame is selected by the selection switch 3a, an interference avoidance measurement mode is applied to avoid interference of the optical measurement unit 30 with the object to be interfered with. When a frame other than a high curve frame (i.e., a low curve frame) is selected by the selection switch 3a, the normal measurement mode is applied. Below, the measurement operation in the normal measurement mode and the operation in the interference avoidance measurement mode will be described in order.

<Normal measurement mode>
Fig. 14 is a schematic diagram showing the positional relationship between the clamp pins 130, 131, the rim Ri, the stylus 61, and the optical measurement unit 30 when measuring the shape of a low-curve frame. Fig. 14(a) is a diagram showing the state in which the rim Ri of the eyeglass frame F in Fig. 2 is held by the clamp pins (130, 131), as observed from above on the paper, and Fig. 14(b) is a diagram showing the rim Ri as observed from the direction of the arrow A2 in Fig. 2 (towards the viewer).

As shown in FIG. 14(a), when the tip 61a of the probe 61 is measuring a measurement point Fn slightly below the right side of the rim Ri, if the XY plane is observed from above, the optical measurement unit 30 appears to be interfering with the clamp pin 130 and the rim Ri. However, as shown in FIG. 14(b), the upper surface 30cA of the optical measurement unit 30 is located lower than the lower end of the clamp pin 130b in the Z direction, so there is usually no interference between the optical measurement unit 30 and the rim Ri or clamp pin 130b. For this reason, in normal measurement mode, no special control is performed to avoid interference with the clamp pin 130b, etc.

An example of a method for acquiring rim shape data in normal measurement mode is described below. In normal measurement mode, the control unit 50 acquires the cross-sectional shape of the rim groove FA using the optical measurement unit 30. The control unit 50 also acquires three-dimensional position information for the entire circumference of the rim groove FA using the probe unit 60.

When the normal measurement mode is started, the control unit 50 turns on the light source 31 of the optical measurement unit 30. When the light source 31 is turned on, the rim groove FA of the eyeglass frame F is optically cut by the slit light. The reflected light beam from the rim groove FA of the eyeglass frame F, optically cut by the slit light, travels toward the light receiving optical system 30b and is received by the detector 37. The control unit 50 obtains the cross-sectional shape of the rim groove FA of the eyeglass frame F based on the reflected light beam received by the detector 37. Note that in this embodiment, a cross-sectional image is obtained as the cross-sectional shape.

For example, in the case of measurement by the probe unit 60, the control unit 50 drives the rotation unit 260 to rotate the probe shaft 62 and the probe 61 around the axis of the rotation axis LO. The control unit 50 also drives the moving unit 210 to adjust the position of the holding unit 25 in the XY direction. The probe 61 moves in the X, Y, and Z directions following the change in the rim Ri (rim groove FA). In this embodiment, the control unit 50 moves the tip 61a of the probe 61 along the rim Ri. At this time, the control unit 50 controls the operation of the moving unit 210 and the rotation unit 260 to move the probe 61 so that the measurement axis L3 is at a predetermined angle δ in the XY direction with respect to the direction in which the rim Ri extends. The predetermined angle δ is, for example, a predetermined angle. The specified angle δ is, for example, an appropriate angle for at least one of the probe unit 60 and the optical measurement unit 30 to accurately measure the shape of the eyeglass frame F, and is, for example, a normal direction in the XY direction to the direction in which the rim Ri extends.

The position of the tip 61a of the probe 61 during tracing (i.e., the position information of the rim groove FA) is found based on the detection information of the XYZ direction position of the holding unit 25 (detected by the control unit 50 from the drive amount of each motor), the detection information of the encoder 265a which detects the rotation angle of the rotation unit 260, the detection information of the encoder 287 which detects the movement amount of the support unit 70 in the Z direction, and the detection information of the encoder 288 which detects the inclination angle of the probe shaft 62.

The control unit 50 moves the holding unit 25 to move the optical measurement unit 30 (light projecting optical system 30a and light receiving optical system 30b) and the probe unit 60, and measures the contour of the rim Ri of the eyeglass frame F. This obtains the cross-sectional shape of the rim groove FA of the eyeglass frame F and the position information of the rim Ri (in this embodiment, the lens shape and circumference of the rim Ri). In this embodiment, the light projecting optical system 30a and the light receiving optical system 30b are moved relative to the rim Ri while maintaining the Scheimpflug relationship. In other words, the cross-sectional shape of the rim groove FA of the eyeglass frame F can be obtained by moving the optical measurement unit 30 so that it is in a constant positional relationship with respect to the rim groove FA of the eyeglass frame F.

For example, the control unit 50 determines the radial angle (θn) from the reference position OR (initial position SR1) to the rim groove FA that is in contact with the tip 61a of the probe 61 in the XY direction, and the radial length (rn), which is the distance from the reference position OR to the rim groove FA, based on the position information of the tip 61a of the probe 61.

The control unit 50 moves the holding unit 25 from the measurement start point FS so that the radius vector angle (θn) centered on the reference position OR is from 0 degrees to 360 degrees, and measures the shape of the entire circumference of the rim Ri. Note that the point on the rim Ri where the tip 61a of the probe 61 touches at the radius vector angle (θn) is defined as the measurement point Fn.

When measuring the shape of the rim Ri, the control unit 50 may predict the position of the unmeasured portion of the rim Ri based on information about the portion of the rim Ri that has already been measured, and control the movement of the holding unit 25 and the rotation of the rotation unit 260. An example of a method for predicting the position of the unmeasured portion of the rim Ri based on position information about the rim Ri that has already been measured will be described below.

For example, when the tip 61a of the probe 61 is located at the measurement point Fn at the radial angle (θn), the position of the next measurement point Fn+1 is predicted to be on a straight line passing through the measurement point Fn and the measurement point Fn-1 where a measurement has already been performed. Note that multiple measurement points where measurements have already been performed may be used to predict the position of the measurement point Fn+1.

The method for predicting the position of the rim Ri in the unmeasured portion based on the position information of the rim Ri that has already been measured can be a known method described in JP 2011-122899 A, etc. This allows the shape of the rim Ri to be measured with high accuracy.

Because the optical measurement unit 30 and the probe unit 60 are supported integrally by the support unit 70, the position of the measurement light beam irradiated by the optical measurement unit 30 on the rim groove is changed as the probe unit 60 moves. In this embodiment, the measurement of the rim groove FA by the probe 61 and the measurement of the cross-sectional shape of the rim groove by the optical measurement unit 30 are performed in parallel. For example, the cross-sectional image (cross-sectional shape) of the rim groove FA is acquired in sequence by the movement of the probe 61 along the rim groove FA. That is, the position where the cross-sectional image of the rim Ri is acquired is moved in the circumferential direction of the rim Ri. The position where the cross-sectional image of the rim Ri is acquired is a value shifted by ΔD from the tip of the probe 61 (see FIG. 9) and is determined based on the position of the tip 61a of the probe 61. For example, the acquisition position of the acquired groove cross-sectional shape information is stored in the memory 52.

The method for acquiring a cross-sectional image of the rim Ri using the optical measurement unit 30 can be, for example, the method described in International Publication WO 2019/026416.

For example, in this embodiment, for each radial angle (θn) centered on the reference position OR, the radial length (rn) at the radial angle (θn), the position information (xn, yn, zn) (n = 1, 2, 3, ..., N) of the measurement point Fn at the radial angle (θn), and the cross-sectional shape of the rim groove FA at the radial angle (θn) are obtained over the entire circumference of the rim Ri. For example, in this embodiment, there are 1,000 measurement points around the entire circumference of the rim Ri, and the radial angle is changed every 0.36 degrees. In this embodiment, the position information of the measurement point Fn is expressed in three-dimensional orthogonal coordinates. The position information of the measurement point Fn may be appropriately converted to (rn, zn, θn) (n = 1, 2, 3, ..., N) in which the position in the X direction and Y direction is expressed in two-dimensional polar coordinates by the radial angle θn and the radial length rn, and the position in the Z direction is expressed in the Z coordinate.

For example, for each radial angle (θn) obtained around the entire circumference of the rim Ri, the control unit 50 stores in the memory 52 the radial length (rn) at the radial angle (θn), the three-dimensional outline shape data (xn, yn, zn) (n = 1, 2, 3, ..., N) of the rim groove FA at the radial angle (θn), and the cross-sectional shape of the rim groove FA at the radial angle (θn).

For example, when acquisition of cross-sectional images of the rim groove FA over the entire circumference of the rim Ri is completed, the control unit 50 calls up the cross-sectional images of the entire circumference of the rim Ri stored in the memory 52 and the positional information of the rim groove FA over the entire circumference of the rim Ri, and performs calculation processing to acquire the three-dimensional shape of the rim Ri over the entire circumference of the rim Ri. For example, the control unit 50 stores the acquired three-dimensional shape of the entire circumference of the rim Ri in the memory 52. Note that in this embodiment, an example has been described in which a three-dimensional cross-sectional image is acquired after acquisition of the cross-sectional shape over the entire circumference of the rim Ri is completed, but this is not limited to this. A configuration in which calculation processing is performed each time a cross-sectional image is acquired at each acquisition position of the cross-sectional image of the rim groove FA may also be used.

In this embodiment, the optical axis L1 of the light projecting optical system 30a and the imaging optical axis L2 of the light receiving optical system 30b are inclined downward by an inclination angle α in the Z direction with respect to the XY plane. Also, for example, the optical axis L1 of the light projecting optical system 30a in the optical measurement unit 30 is inclined by an inclination angle β on the radial plane (XY plane) with respect to the measurement axis L3 from the probe 61 toward the measurement position of the rim groove FA of the eyeglass frame F. Furthermore, for example, the light projecting optical axis L1 of the light projecting optical system 30a and the imaging optical axis L2 of the light receiving optical system 30b are inclined downward by an inclination angle γ in the Z direction with respect to the measurement axis L3 from the probe 61 toward the measurement position of the rim groove FA of the eyeglass frame F. In the case of the above configuration, for example, the control unit 50 may correct the cross-sectional shape of the rim groove FA based on at least one of the inclination angles α, β, and γ. As an example, the control unit 50 may correct the cross-sectional shape of the rim groove FA of the acquired eyeglass frame F by a trigonometric function using at least one of the inclination angles α, β, and γ. Furthermore, for example, since the optical measurement unit 30 is held integrally with the probe shaft 62, the control unit 50 may correct the cross-sectional shape of the rim groove FA of the acquired eyeglass frame F based on the inclination angle of the probe shaft 62 acquired by the encoder 288.

In this way, by correcting the cross-sectional shape of the rim groove FA based on the inclination angle, it is possible to obtain a cross-sectional shape in which the distortion of the cross-sectional shape caused by the influence of the inclination angle has been corrected, and the cross-sectional shape of the rim groove FA can be obtained with high accuracy.

For example, when moving the tip 61a of the probe 61 along the rim groove FA, the position of the probe 61 may be adjusted while moving based on the measurement results (e.g., cross-sectional image) acquired by the optical measurement unit 30. That is, since the measurement of the cross-sectional shape of the rim groove FA by the optical measurement unit 30 is performed prior to the measurement of the position n of the rim groove FA by the probe unit 60, the control unit 50 can control the movement of the holding unit 25 so that the probe 61 does not fall out of the rim groove FA based on the cross-sectional shape of the rim groove FA acquired by the optical measurement unit 30. In this case, for example, the control unit 50 may process the cross-sectional image acquired by the optical measurement unit 30, detect the bottom of the rim groove FA, and control the movement of the holding unit 25 so that the tip 61a of the probe 61 is inserted into the position of the bottom of the rim groove FA based on the detected position of the bottom of the rim groove FA.

For example, when the control unit 50 finishes measuring one rim Ri (the right rim RIR), it controls the driving of the X-direction moving unit 240 to move the holding unit 25 to the initial position for measuring the other rim. The other rim is measured in the same manner as the above measurement control. The measurement results of the right rim RIR and the left rim RIL are stored in the memory 52.
By performing the normal measurement mode as described above, the control unit 50 acquires the three-dimensional shape of the rim Ri.

<Interference avoidance measurement mode>
A case will be described where the eyeglass frame F to be measured is selected as a high curve frame and the interference avoidance measurement mode is applied. Note that the operation of measuring the shape of the rim Ri by the probe unit 60 and measuring the cross-sectional shape by the optical measurement unit 30 is basically the same as in the normal measurement mode described above, so here, the interference avoidance operation of the optical measurement unit 30 with respect to the object to be interfered with will be mainly described.

When a high curve frame is selected, the control unit 50 takes into consideration the possibility of interference between the optical measurement unit 30 and the object to be interfered with (clamp pin 130b, rim Ri, etc.) occurring during the measurement operation, and acquires the three-dimensional shape of the rim Ri in an interference avoidance measurement mode that causes the target shape acquisition unit 20 to perform an interference avoidance operation.

For example, in the interference avoidance measurement mode, similar to the normal measurement mode, when measuring the shape of the rim Ri, the control unit 50 predicts the position of the unmeasured portion of the rim Ri based on information on the portion of the rim Ri that has already been measured. For example, for each radial angle (θn) centered on the reference position, the control unit 50 predicts the position of the measurement point Fn+1 on the rim Ri that the tip 61a of the probe 61 comes into contact with at the radial angle (θn+1) where measurement is performed next to the radial angle (θn) based on information on the portion of the rim Ri that has already been measured. Note that, similar to the normal measurement mode, the method for predicting the position of the unmeasured portion of the rim Ri based on position information of the rim Ri that has already been measured can be a well-known method described in JP 2011-122899 A, etc.

Figure 15 is a diagram illustrating a typical example of interference between the optical measurement unit 30 and the clamp pin 130b, and is a schematic diagram showing the positional relationship between the rim Ri, the clamp pins 130 and 131, and the optical measurement unit 30. Figure 15(a) is a diagram of the measurement plane observed from above the paper, and Figure 15(b) is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis.

Arrow C1 indicates the measurement progress direction (clockwise in FIG. 15), that is, the movement direction of the probe 61 when measuring the shape of the rim Ri. In this embodiment, the optical measurement unit 30 is installed integrally with the probe shaft 62 at the bottom of the probe 61, and the optical measurement unit 30 is moved integrally with the probe unit 60. The optical measurement unit 30 is larger in the XY directions than the probe unit 60. For this reason, when performing shape measurement on a highly curved frame, when the probe unit 60 and the optical measurement unit 30 are measuring a certain measurement point Fn on the rim Ri, there is a possibility that the optical measurement unit 30 will interfere with a part of the rim Ri, clamp pin 130b, etc., different from the measurement point Fn.

In the interference avoidance measurement mode, shape data of the rim Ri is obtained while avoiding interference between the optical measurement unit 30 and the objects to be interfered with, such as the rim Ri and the clamp pin 130b.

An example of an interference avoidance control program executed by the control unit 50 in the interference avoidance measurement mode will be described. In this disclosure, the following cases will be described separately: when the optical measurement unit 30 interferes with the clamp pins 130b and 131b; when it interferes with an unmeasured portion of the rim Ri; and when it interferes with a measured portion of the rim Ri.

For example, at measurement point Fn, measurement axis L3 extending from probe 61 toward measurement point Fn+1 on the rim groove FA is inserted into the rim groove FA at a predetermined angle δ (the same as in normal measurement mode), and the control unit 50 determines the position of an interference region IR (see FIG. 16), which is an example of an interference site.

In the interference avoidance measurement mode, when the position of the measurement point Fn+1 at the radial angle (θn+1) is predicted, the position of the holding unit 25 at the measurement point Fn+1 is obtained based on a predetermined angle δ. The optical measurement unit 30 and the probe unit 60 are integrally held in the holding unit 25, and the position of the optical measurement unit 30 in the holding unit 25 is obtained by various detectors (encoders 265a, 287, 288, etc.). The XY position of the holding unit 25 at the measurement point Fn+1 is detected by the control information of the moving unit 210, and the XYZ direction position of the optical measurement unit 30 at the measurement point Fn+1 is obtained.

16 is a diagram showing an interference area IR, which is an example of an interference portion of the optical measurement unit 30 in this embodiment. In this embodiment, it is assumed that the interference area IR of the optical measurement unit 30 interferes with the clamp pins (130, 131) and the rim Ri, and an interference avoidance operation is performed. The interference area IR is a predetermined area on the cover 30c of the optical measurement unit 30 that may interfere with the rim Ri. For example, in the example of FIG. 16, the interference area IR is an area of the left half corner of the circular upper surface 30cA on the cover 30c. The coordinate position of the area where the interference area IR is located on the optical measurement unit 30 changes depending on the shape of the optical measurement unit 30. Since the interference area IR is a predetermined area on the optical measurement unit 30, the position of the interference area IR at the measurement point Fn (XYZ position based on the reference position OR) is obtained based on the position of the optical measurement unit 30.

In this embodiment, an interference region IR is provided to determine the interference avoidance operation, but the interference region IR may be an interference point IRP on the optical measurement unit 30 .
For example, the interference point IRP is a point on the optical measurement unit 30 that is set based on the interference state obtained by measuring multiple frames.
For example, the interference point IRP is determined as a point for the clamp pins 130b, 131b and the rim Ri such that, if interference at one interference point IRP is avoided, interference in the entire interference region IR is avoided.
In the interference avoidance measurement mode, the control unit 50 determines whether to perform interference avoidance control based on the arrangement of the interference region IR at the measurement point Fn+1.

<To avoid interference with the clamp pin>
First, a case where the control unit 50 performs interference avoidance for the clamp pin 130b will be described.

When the optical measurement unit 30 and the clamp pin 130b interfere with each other, the positions of the optical measurement unit 30 and the clamp pin 130b overlap in the X, Y, and Z directions. On the other hand, if the positions of the optical measurement unit 30 and the clamp pin 130b differ in at least one of the X, Y, and Z directions, the optical measurement unit 30 and the clamp pin 130b do not interfere with each other.

For example, first, interference information of the interfered object (such as the clamp pins 130b, 131b and the measured shape information of the rim Ri) is acquired by the interfered information acquisition means (control unit 50) (step S101). The control unit 50 sets an interference judgment line ILC (ILCY, ILCZ) for avoiding interference with the clamp pin 130b in order to determine whether to perform interference avoidance control (see FIG. 15) (step S102). In a typical example, the interference judgment line ILC is a reference line that is set at a predetermined judgment distance m in a direction away from the clamp pin 130b based on the XYZ arrangement position of the clamp pin 130b acquired by the interfered information acquisition means (control unit 50).
In this embodiment, the interference detection line ILC is set in the Y and Z directions.

For example, the first interference determination line ILCY in the Y direction is set at a position away from the tip position 133 of the clamp pin 130b by the determination distance m in the Y direction toward the center line CL. The tip position 133 of the clamp pin 130b in the Y direction is obtained based on the detection information of the detector 120 that detects the open/closed state of the sliders 102, 103 in the Y direction, the length HBL of the clamp pin 130b, and the length SSBL of the support shaft 132b. If the detector 120 is not used, the tip position 133 of the clamp pin 130b in the Y direction is approximately obtained based on the Y direction position of the tip 61a of the probe 61 at the measurement start point FS, the length HBL of the clamp pin 130b, and the thinnest distance of the rim Ri when the measurable rim Ri is held by the clamp pin 130. Similarly, the second interference determination line ILCY in the Y direction is also set on the clamp pin 131 side. The Y-direction interference determination line ILCY may be set based on a part other than the tip position 133 of the clamp pin 130b, such as the base of the clamp pin 130b or the rim receiver 132b.

The position of the clamp pin 130b in the Y direction may be obtained by controlling the moving unit 210 and the rotating unit 260 while the rim Ri is held by the frame holding unit 10, and bringing the tip 61a of the probe 61 into contact with the tip position 133 of the clamp pin 130b. That is, the control unit 50 can obtain the Y-direction coordinate position of the tip 61a when the tip 61a of the probe 61 is brought into contact with the tip position 133 based on the control data of the moving unit 210, the control data of the rotating unit 260, the tilt data of the probe shaft 62, and the Z-direction movement data of the probe shaft 62 relative to the rotating unit 260, thereby obtaining the tip position 133 of the clamp pin 130b. The tip position 133 of the clamp pin, which is an example of a rim holding member, may be on the clamp pin 131b side. This is because the clamp pin 130b and the clamp pin 131b are positioned symmetrically about the center line CL in the Y direction. Furthermore, to obtain the tip position 133 of the clamp pin 130b in the Y direction, the tip 61a of the probe 61 may be abutted against a member having a known positional relationship with the clamp pin 130b or 131b (e.g., the rim receiver 313, the Y-direction surface of the slider 102 or 103, etc.) rather than abutting the tip 61a of the probe 61 against the clamp pin 130b or 131b.

For example, the Z-direction interference determination line ILCZ is set at a position that is a determination distance m downward along the Z axis from the lowest end 130min of the movable range of the clamp pin 130b in the Z direction. The lowest end 130min is retrieved from the memory 52 by the control unit 50 and obtained. The determination distance m is a distance that is set in advance to avoid interference between the interference region IR and the clamp pin 130b, and is, for example, 6 mm. The Z-direction interference determination line ILCZ may also be set based on the movable center of the clamp pin 130. Of course, the determination distance m may be different values in the Y direction and the Z direction.

For example, the control unit 50 predicts the position of the next measurement point Fn+1 for each measurement point Fn, and determines the position of the interference area IR at the measurement point Fn+1 based on the predicted position information of the measurement point Fn+1 (step S103). If the position of the interference area IR at the measurement point Fn+1 is determined to be on the clamp pin (130b, 131b) side of the interference judgment line ILCY in the Y direction and is determined to be on the clamp pin (130b, 131b) side of the interference judgment line ILCZ in the Z direction (step S104), the control unit 50 determines to perform interference avoidance control. The control unit 50 moves the tip 61a of the probe 61 from the measurement point Fn to the measurement point Fn+1, and at the same time controls the operation of the moving unit 210 and the rotating unit 260 to perform the avoidance operation.

On the other hand, when the interference region IR is located farther from the clamp pins (130b, 131b) than at least one of the interference line ILCY in the Y direction and the interference determination line ILCZ in the Z direction (step S107), the control unit 50 determines not to perform interference avoidance control.
Although the above example shows the case where the interference judgment lines are provided in the Y and Z directions, the control unit 50 may provide an interference judgment line ILCX in the X direction. For example, the position of the interference judgment line ILCX in the X direction is set in a direction away from the clamp pin by a judgment distance m from both end positions of the clamp pin 130b in the X direction. The both end positions of the clamp pin 130b in the X direction are acquired from the arrangement information of the clamp pin 130b stored in the memory 52. When the interference judgment line in the X direction is provided, for example, the control unit 50 determines to perform interference avoidance control when it is predicted that the position of the optical measurement unit 30 is located on the rim Ri side of the interference judgment line ILC in any of the X direction, Y direction, and Z direction.

In this way, by using multiple interference detection lines, the frequency with which unnecessary interference avoidance operations are performed can be reduced, and the three-dimensional shape of the rim Ri can be obtained with high accuracy.

In the example of Figure 15, the probe 61 measures the position of the measurement point Fn+1. In Figure 15, the interference region IR exists on the rim Ri side of the Y-direction interference determination line ILCY in the Y direction, and also exists on the rim side of the Z-direction interference determination line ILCZ in the Z direction, so the control unit 50 determines that interference avoidance control should be performed.

Note that the configuration may be such that it is determined whether to perform interference avoidance operation by using one or more of the interference detection lines ILC in the X, Y, and Z directions. For example, the configuration may be such that only the interference detection line ILCY in the Y direction is used as the interference detection line ILC.

When the control unit 50 determines that interference avoidance control should be performed on the clamp pin 130b, it controls the driving of the moving unit 210 and the rotating unit 260 to avoid interference between the holding unit 25 and the rim Ri. The operation of avoiding interference will be explained using FIG. 17. FIG. 17 is a diagram showing a case where interference is avoided by moving the optical measurement unit 30 in the Y direction. FIG. 17(a) is a diagram of the measurement plane observed from above the paper, and FIG. 17(b) is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis.

If the position of the optical measurement unit 30 and the positions of the clamp pin 130b and rim Ri differ in at least one of the X, Y, and Z directions, interference will not occur, so interference can be avoided by moving the position of the interference region IR in at least one of the X, Y, and Z directions.

For example, the control unit 50 moves the interference area IR in the Y direction to avoid interference between the interference area IR and the clamp pin 130b. First, when the control unit 50 moves the tip 61a of the probe 61 from the measurement point Fn to the measurement point Fn+1 of the unmeasured part, the control unit 50 obtains the Y position (coordinate position) of the interference area IR at the measurement point Fn+1. Next, the control unit 50 obtains the interference amount ΔE, which is the distance by which the obtained Y position of the interference area IR exceeds the interference judgment line ILCY in the Y direction (step S105). Then, the control unit 50 moves the tip 61a of the probe 61 from the measurement point Fn to the measurement point Fn+1, and at the same time controls the operation of the moving unit 210 and the rotating unit 260 so that the interference area IR is at a position moved by the interference amount ΔE in the Y direction (step S106). This makes it possible to avoid interference between the interference area IR and the clamp pin 130b. This type of interference avoidance control is performed in the same way at measurement points after measurement point Fn+1 until the interference amount ΔE is eliminated.

In addition, since the probe unit 60 is held integrally with the optical measurement unit 30, when the avoidance operation is performed, the angle of the measurement axis L3 in the XY direction at the measurement point Fn+1 with respect to the rim Ri will be tilted by a change angle Δe from the original angle δ. If the interference amount ΔE is eliminated at the measurement point of the transition to the measurement point Fn+1, the probe unit 60 and the optical measurement unit 30 will be moved integrally to the original angle δ, but if the change angle Δe to return to the original angle δ is large, it may affect the measurement accuracy. In that case, it may be controlled so that the angle is gradually returned to the original angle δ for each measurement point. For example, it may be gradually changed in increments of 0.5 degrees.

Also, for example, the control unit 50 may be configured to avoid interference by moving the interference region IR in the Z direction as interference avoidance control. FIG. 18 is a diagram showing a case where interference is avoided by moving the optical measurement unit 30 in the Z direction. FIG. 18(a) is a diagram of the measurement plane observed from above the paper, and FIG. 18(b) is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis.

For example, as in the previous example, the control unit 70 obtains the Z position of the interference area IR at the measurement point Fn+1, and then obtains the amount of interference ΔG, which is the distance by which the obtained Z position of the interference area IR exceeds the interference judgment line ILCZ in the Z direction. The control unit 70 also sets the interference judgment line ILCX in the X direction for the right end of the clamp pin 130b, as shown in FIG. 18, using the same concept as the interference judgment line ILCZ in the Z direction. Then, the control unit 70 obtains the inclination angle XA of the probe axis 62 with respect to the Z direction so that the interference area IR located on the clamp pin 130b side from the interference judgment line ILCX is moved in the Z direction by the interference amount ΔG. Then, the control unit 70 moves the holding unit 25 in the XY direction so that the inclination of the probe axis 62 with respect to the Z direction is the inclination angle XA. This makes it possible to avoid interference of the optical measurement unit 30 with the clamp pin 130b.

Note that, although it is somewhat disadvantageous to set an interference determination line ILCX in the X direction, it is also possible to use only the interference determination line ILCX. That is, in FIG. 18, the control unit 70 determines the inclination angle XA of the probe shaft 62 so that the interference region IR does not get closer to the clamp pin 130b than the interference determination line ILCX, and moves the holding unit 25 in the XY direction so that the probe shaft 62 is at the inclination angle XA. This makes it possible to avoid interference of the optical measurement unit 30 with the clamp pin 130b.

The above describes how to avoid interference with clamp pin 130b, but the same can be done for clamp pin 131b.

<To avoid interference with unmeasured parts of the rim>
19 is a diagram for explaining a case where the optical measurement unit 30 avoids interference with the unmeasured portion of the rim Ri. In Fig. 19(a) and Fig. 19(d), the upper half is a diagram of the measurement plane observed from the top of the paper, and the lower half is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis. In Fig. 19(b) and Fig. 19(c), the upper half is a diagram of the measurement plane observed from the top of the paper, and the lower half is a diagram of the measurement plane observed from the clamp pin 131 side in a direction parallel to the Y axis.

When avoiding interference with unmeasured parts of the rim, the first and second interference determination lines ILCY in the Y direction and the interference determination line ILCZ in the Z direction shown in FIG. 17 are used to determine whether to perform interference avoidance control. Note that the measurement direction in which the probe 61 advances is clockwise, and this is an example in which the optical measurement unit 30 measures ahead of the probe 61.

For example, as shown in Figures 19(a) and 19(b), when the probe 61 is measuring measurement points FP1 and FP2 to the left (nose side) of the clamp pin 130b, the optical measurement unit 30 interferes with the rim Ri in the XY direction, but in the Z direction, the optical measurement unit 30 (interference area IR) is located below the interference determination line ILCZ, so no interference occurs and interference avoidance control is not performed.

Also, as shown in FIG. 19(c), when the stylus 61 is measuring the measurement point FP3 to the right (ear side) of the clamp pin 131b, the optical measurement unit 30 (interference region IR) is located above the interference determination line ILCZ in the Z direction. For this reason, an avoidance control operation is performed so as not to approach the clamp pin 131b side from the second interference determination line ILCY in the Y direction. However, since the position of the rim Ri in the Z direction increases toward the ear side (the ear side of the wearer when worn), the optical measurement unit 30 will not normally interfere with the rim Ri even without interference avoidance control.

On the other hand, as shown in FIG. 19(d), when the probe 61 is on the right side (ear side) of the clamp pins 130b, 131b and is measuring the measurement point FP4 of the rim Ri extending approximately parallel to the Y direction, the optical measurement unit 30 (interference area IR) is located above the interference judgment line ILCZ in the Z direction. Therefore, as in FIG. 17 of the previous example, an avoidance control operation is performed so that the optical measurement unit 30 does not approach the clamp pin 130b side from the first interference judgment line ILCY in the Y direction. In this case, as in FIG. 18, the control unit 70 may move the holding unit 25 in the XY direction so as to tilt the probe shaft 62 to an inclination angle XA, thereby avoiding interference in at least one of the Z direction and the X direction. This avoids interference with the unmeasured part of the rim.

In the above explanation, the Y-direction interference judgment line ILCY and the Z-direction interference judgment line ILCZ are used to avoid interference with the clamp pins (130b, 131b), but interference judgment lines may be set separately to avoid interference with unmeasured parts of the rim. For example, the position information of the end face of the rim Ri in the Y direction is known based on the measurement results of the cross-sectional shape of the rim groove at a certain measurement point from the measurement start point FS, so the Y-direction interference judgment line is set based on this. Also, the position information of the lower end face of the rim Ri in the Z direction is known based on the measurement results of the cross-sectional shape of the rim groove, so the Y-direction interference judgment line is set based on this. In this case, the interference judgment line can be set closer to the rim Ri side than the interference judgment line for avoiding interference with the clamp pins (130b, 131b), so the amount of interference avoidance can be reduced and measurements can be made more accurately.

The above describes an example in which the control unit 50 sets the first interference determination line ILCY in the Y direction and the interference determination line ILCZ in the Z direction based on the position of the clamp pin 130b, and moves the interfering object (interfering part) so that the interfering object (e.g., the optical measurement unit 30) is at a certain distance or more from these lines, but the interference avoidance operation is not limited to this. For example, it is also possible to set an avoidance area for avoiding interference with the interfering object based on the position information of the interfering object (rim holding member, measured results of the rim) acquired by the interference information acquisition means (control unit 50), and control the change means (moving unit 210, rotating unit 260) so that the interfering object (interfering part) moves into the avoidance area.

<To avoid interference with the measured part of the rim>
Next, an example of avoiding interference with the rim Ri by using the measurement result of the rim Ri will be described with reference to Fig. 20. When using the measurement result of the rim Ri to avoid interference, the stylus 61 precedes the optical measurement unit 30. In the example of Fig. 20, the measurement proceeding direction C2 is counterclockwise.

For example, when moving the tip 61a of the probe 61 from the measurement point Fn to the measurement point Fn+1, the control unit 50 performs interference avoidance control based on the position information of the measured part of the rim Ri, and controls the XY movement of the holding unit 25 and the rotational movement of the rotation unit 260 to avoid interference. For example, when the control unit 50 moves the probe 61 so as to measure the next unmeasured measurement point Fn+1 from the measurement point Fn based on the measurement result, the control unit 50 obtains the XYZ position (coordinate position) of the interference area IR (which may be the cover 30c of the optical measurement unit 30) at the measurement point Fn+1. Next, the control unit 50 compares the obtained XYZ position of the interference area IR with the XYZ position (coordinate position) of the measured area MA of the rim Ri to determine whether interference has occurred. If the control unit 50 determines that interference has occurred, it performs interference avoidance control. For example, when avoiding in the Y direction, the control unit 50 obtains the interference amount ΔI in the Y direction of the interference area IR. Then, the operation of the moving unit 210 and the rotating unit 260 is controlled so that the interference area IR is moved in the Y direction to a position inside the rim Ri by an amount equal to the interference amount ΔI plus the margin amount ΔIA.

The XYZ positions of the measured area MA of the rim Ri can be calculated as the inner XY positions of the rim Ri and the lower Z position in the Z direction of the rim Ri based on the measurement results by the probe 61 and the cross-sectional shape of the rim groove measured by the optical measurement unit 30. This makes it possible to avoid interference with the measured area MA. This type of interference avoidance control is similarly performed at measurement points Fn+1 and onwards until the amount of interference ΔI is eliminated.

The above describes an example of avoiding interference in the Y direction, but with a similar concept, it is also possible to control avoidance in the X or Z direction. When avoiding interference in the Z direction, it can be avoided by tilting the probe axis 62, as shown in Figure 18.

The above-mentioned avoidance control using the already measured measurement results of rim Ri is conveniently applied when the height distance ZA between the probe 61 and the optical measurement unit 30 in the Z direction is not large. For example, if the heights of the probe 61 and the optical measurement unit 30 in the Z direction are approximately the same, interference cannot be avoided in the Z direction. Therefore, interference can be avoided by using the already measured measurement results of rim Ri and moving the optical measurement unit 30 in the Y direction.

<Detection of interference occurrence>
By the above control, measurement is performed while avoiding interference between the interfered object and the optical measurement unit 30, but interference may not always be avoided depending on the shape of the rim Ri. Below, an example will be described in which the measurement is completed with the stylus 61 not falling off the rim groove FA and slight interference between the interfered object and the optical measurement unit 30 remaining.

For example, when the measurement of the three-dimensional shape data for the entire circumference of the rim Ri is completed, the control unit 50 then determines (detects) whether or not the optical measurement unit 30 (interference region IR) interfered with the interfered object (clamp pins 130b, 131b and the rim Ri, etc.) during the measurement operation based on the measurement results of the rim Ri.

A method for detecting whether the optical measuring unit 30 and the object being interfered with during the measurement operation will be described. Figure 21 is a graph showing the results of differentiating the Z-direction measurement results of the rim Ri measured by the probe 61. When the measurement is completed without interference, the differential value of the Z-direction measurement result of the rim usually changes slowly. However, when interference occurs during the measurement, the differential value of the Z-direction measurement result changes suddenly. Figure 21 shows an example where interference occurs at the measurement point Fn, and then the interference disappears, a normal measurement result is obtained, and the measurement is continued. Note that if the probe 61 falls off the rim groove, the measurement value of the radius length, including the measurement value in the Z direction, also changes suddenly and becomes an abnormal value. Therefore, it is easy to detect whether the probe 61 has fallen off the rim groove. In this case, the measurement is stopped.

In addition, to detect whether interference has occurred between the optical measurement unit and the object being interfered with during rim measurement, the output signal of the encoder 287, which detects the amount of movement of the probe shaft 62 in the Z direction, may be used.

In FIG. 21, for example, when the differential value of the measurement result in the Z direction exceeds a predetermined threshold Lim, the control unit 50 identifies the measurement point Fn at that time as the measurement point where interference with the interfered object occurred. Note that in FIG. 21, the differential value exceeding the positive threshold Lim after the measurement point Fn indicates a measurement point where interference has disappeared and the probe 61 has returned to normal measurement by following the center of the rim groove.

Note that the interference determination method using the Z-direction measurement results or the detection information of the encoder 287 is one example of a determination means, and is not limited to this method. For example, position information of the rim groove FA is obtained by analyzing the cross-sectional image acquired by the optical measurement unit 30. Interference determination may be performed based on the transition of the position of this rim groove FA.

<Re-measurement due to detection of interference occurrence>
When the control unit 50 determines that the optical measurement unit 30 and the interfered object interfere with each other, the control unit 50 performs a re-measurement while performing interference avoidance control. The re-measurement operation will be described below. During the re-measurement, the control unit 50 performs interference avoidance control at the measurement point Fn where interference was detected during the previous measurement and was identified, thereby avoiding interference between the optical measurement unit 30 and the interfered object.

An example of interference avoidance control during remeasurement is described below. FIG. 22 is a diagram illustrating the avoidance operation at the measurement point where interference has occurred. FIG. 22(a) is a schematic diagram showing the positional relationship between the rim Ri and the optical measurement unit 30 when interference has occurred. In FIG. 22(a), the measurement point Fn is the measurement point where interference has occurred. The upper half of FIG. 22(a) is a diagram of the measurement plane observed from above the paper, and the lower half of FIG. 22(a) is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis.

For example, the control unit 50 determines (calculates) the position (XYZ coordinate position) of the interference area IR (interference site) on the optical measurement unit 30 at the time of measuring the occurrence of interference for the measurement point Fn where the occurrence of interference is identified, based on the control data at the time of measuring the occurrence of interference and the position data of the optical measurement unit 30 relative to the support unit 70. For example, the control data at the time of measuring the occurrence of interference is the XYZ position data of the holding unit 25, the rotation control data of the rotation unit 260, the tilt data of the probe shaft 62, and the Z-direction movement data of the probe shaft 62 relative to the rotation unit 260. In addition, the position data of the interference area IR on the optical measurement unit 30 relative to the support unit 70 is design value data and is stored in the memory 52. The position of the interference area IR at the measurement point Fn is stored in the memory 52. Note that the position data of the interference area IR stored in the memory 52 at this time may be only the Y coordinate data, for example, when interference is avoided in the Y direction. Additionally, the memory 52 may store control data at the time of measuring the occurrence of interference, and when re-measuring, the placement position data of the interference region IR may be obtained from the stored control data.

Then, when the control unit 50 measures the measurement point Fn during remeasurement, it controls the rotation of the moving unit 210 and the rotating unit 260 so that the interference region IR moves away from the determined position of the interference region IR.

Since calculating the overall position of the interference region IR requires a large amount of calculation, it is possible to simply set one point included in the interference region IR as the interference point IRa and calculate the position of the interference point IRa. This is because in remeasurement, it is sufficient to move the slightly interfering part away from the rim Ri, and it is not necessary to specify the overall position of the interference region IR. For example, the interference point IRa is determined as the point where the interference region IR is closest to the rim shape of the measurement result of the rim Ri when interference occurs. Alternatively, the interference point IRa may be a predetermined part (for example, the interference point IRa is determined as a point where interference occurs according to the shape of the cover 30c of the optical measurement unit 30). An example of controlling one interference point IRa to move away from the rim Ri is described below.

Even in the remeasurement, it is sufficient to avoid interference between the rim Ri, which is the object to be interfered with, and the optical measurement unit 30 in at least one of the X, Y, and Z directions. FIG. 22(b) is a diagram explaining an example of avoiding interference in the Y direction. The upper half of FIG. 22(b) is a diagram of the measurement plane observed from above the paper, and the lower half of FIG. 22(b) is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis.

For example, the control unit 50 sets an interference avoidance line IELY that is approximately parallel to the X direction at a position away from the rim Ri in the Y direction (toward the center line CL) from the calculated Y position of the interference point IRa at the measurement point Fn where the occurrence of interference is identified, by an avoidance distance ΔJ (for example, 1 mm). Then, when the control unit 50 measures the measurement point Fn in a remeasurement, the control unit 50 controls the rotation of the moving unit 210 and the rotating unit 260 so that the Y position of the interference point IRa is located on the interference avoidance line IELY (it may be moved away from the interference avoidance line IELY toward the inside of the rim). This avoids interference between the rim Ri and the optical measurement unit 30 at the measurement point Fn. Note that if there are multiple identified measurement points Fn where interference occurs (including cases where the measurement points Fn where interference occurs exist consecutively and at separate positions), the control unit 50 performs similar interference avoidance operations at the multiple measurement points Fn.

In addition, the measurement point where interference occurs may shift slightly when re-measuring compared to the measurement point Fn identified when interference occurred. Therefore, for example, the avoidance operation at the measurement point Fn may be performed including the measurement points before and after, taking into account the shift in the occurrence of interference.

For example, in the execution of remeasurement, at the subsequent measurement point after the avoidance operation at the measurement point Fn is completed, the posture of the optical measurement unit 30 at the time of the original measurement (the posture at the time of measurement when the occurrence of interference is detected, or the state in which the measurement axis L3 of the probe 61 is at an angle δ in the normal direction with respect to the rim Ri) is returned to. However, if the posture of the optical measurement unit is suddenly returned to the state at the time of the original measurement, the orientation of the probe 61 (the orientation of the measurement axis L3) with respect to the rim Ri may suddenly change, and the measurement accuracy may deteriorate. To avoid this, for example, when remeasurement of the subsequent measurement point after the measurement point Fn where interference occurs, the control unit 50 may control the rotation of the moving unit 210 and the rotating unit 260 so as to gradually change the posture of the optical measurement unit 30 from the posture in which the optical measurement unit 30 was subjected to the interference avoidance operation at the measurement point Fn where interference occurred to the posture of the optical measurement unit 30 at the time of the original measurement. The correction angle of the probe 61 that is gradually changed for each measurement point is 0.5 degrees. For example, if there are 1,000 measurement points around the circumference, the radial angle of one measurement point is 0.36 degrees.

The control for gradually changing the posture of the optical measurement unit 30 during the original measurement may be performed by setting the number of measurement points for the subsequent measurement points to a fixed value (e.g., 50 points) and gradually changing the angle at which the posture of the optical measurement unit 30 is returned to the posture of the original measurement by an angle divided by the number of measurement points.

Furthermore, at the front measurement point before the identified measurement point Fn where interference occurs, as in the case of the rear measurement point, if the posture of the optical measurement unit is suddenly changed from the posture state during the original measurement to the posture state of the avoidance operation, the orientation of the probe 61 relative to the rim Ri will suddenly change, and the measurement accuracy may deteriorate. Therefore, even at the front measurement point, the control unit 50 may control the driving of the moving unit 210 and the rotating unit 260 so as to gradually change the posture of the optical measurement unit 30 from the posture state during the original measurement to the posture state in which the optical measurement unit 30 is subjected to the interference avoidance operation at the measurement point Fn where interference occurs.

In addition, in order to simplify the control program during remeasurement, the measurement at the previous measurement point may be controlled as follows. For example, the control unit 50 rotates the rotation unit 260 to change the angle of the measurement axis L3 relative to the rim Ri. At this time, the control unit 50 controls the operation of the moving unit 210 and the rotation unit 260 so that the position of the tip 61a of the probe 61 does not change from the measurement point. At this time, due to the relationship between the rotation speed of the rotation unit 260 and the movement speed of the moving unit 210, the change in the angle of the measurement axis L3 relative to the rim Ri for each measurement point is limited to a limit angle ΔBA (for example, 10 degrees). That is, the control unit 50 starts controlling the rotation unit 260 and the moving unit 210 from the previous measurement point (for example, the measurement point 50 points before the measurement point Fn) with a margin of measurement points so that the Y position of the interference point IRa moves toward the interference avoidance line IELY. At this time, the control unit 50 controls the change in the angle of the measurement axis L3 relative to the rim Ri with the limit angle ΔBA at one measurement point as the upper limit. For example, if the Y position of the interference point IRa reaches the interference avoidance line IELY at the third measurement point after starting to change the angle of the tip 61a of the probe 61, then at the next measurement point, the control unit 50 controls the drive of the moving unit 210 and the rotating unit 260 so that the Y position of the interference point IRa reaches the interference avoidance line IELY. This allows for smooth measurement.

Although an example of avoiding interference in the Y direction has been described above, it is also possible to avoid interference in the X direction. Figure 23 is a diagram illustrating an example of avoiding interference in the X direction. The upper half of Figure 23 is a diagram of the measurement plane observed from above the paper, and the lower half of Figure 23 is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis.

For example, at the measurement point Fn where the occurrence of interference has been identified, the control unit 50 sets an interference avoidance line IELX that is approximately parallel to the Y direction at a position that is an avoidance distance ΔK (e.g., 1 mm) away from the X position of the calculated interference point IRa in the X direction away from the rim Ri. Then, when the control unit 50 measures the measurement point Fn again, it controls the rotation of the moving unit 210 and the rotating unit 260 so that the X position of the interference point IRa is located on the interference avoidance line IELX (or may be moved away from the interference avoidance line IELX toward the inside of the rim). This avoids interference between the rim Ri and the optical measurement unit 30 at the measurement point Fn.

In addition, at the subsequent measurement point after the measurement point Fn, control may be performed to gradually return the posture of the optical measurement unit 30 to the posture state during the original measurement, similar to the avoidance control in the Y direction. Also, at the previous measurement point before the measurement point Fn, control may be performed to gradually change the posture of the optical measurement unit 30 from the posture state 30 during the original measurement to the posture state in which the optical measurement unit 30 is subjected to interference avoidance operation at the measurement point Fn where interference occurs, similar to the avoidance control in the Y direction.

The above-mentioned avoidance control in the Y direction and avoidance control in the X direction may be used in combination. In this case, the decrease in measurement accuracy can be reduced by controlling the direction that involves less avoidance movement of the optical measurement unit 30.

In addition, interference may be avoided in the Z direction depending on the position of the identified measurement point Fn where interference occurs. For example, as shown in FIG. 18, the control unit 50 controls the moving unit 210 to tilt the probe shaft 62, so that the Z position of the interference point IRa is positioned lower than the Z position when interference occurs. This allows measurements to be performed while avoiding interference.

In addition, the above describes an example in which remeasurement is performed after measurement of rim Ri is completed, but it is also possible to stop the measurement and perform remeasurement when interference is detected during measurement of rim Ri.

<Example of transformation of optical measurement unit>
In the above, the optical measurement unit 30 has been described as being arranged offset to one side in the left-right direction with respect to the probe 61 when the probe 61 is viewed from the tip direction of the probe 61, but this is not limited thereto. For example, as shown in Fig. 24, the optical measurement unit 30 may be arranged on both the left and right sides of the probe 61 when the probe 61 is viewed from the tip direction of the probe 61.

Figure 24 is a diagram showing a part of the optical measurement unit 30 and the probe unit 60 supported by the support unit 70 in this modified example. When viewed from the tip direction of the probe 61, the cover 30Dc of the optical measurement unit 30 is arranged almost evenly on both the left and right sides of the probe shaft 62. The appearance of the optical measurement unit 30 in this modified example is basically the same as the optical measurement unit 30 in the previous example shown in Figures 7 and 8, except for the left-right arrangement of the cover 30Dc. In this optical measurement unit 30, the interference area with the interfered object exists in the semicircular area IR1 on the left side and the semicircular area IR2 on the right side on the top surface of the cover 30Dc in Figure 24 (a).

Figure 25 is a diagram explaining the operation of avoiding an object to be interfered with in the eyeglass frame shape measuring device 1 having the optical measuring unit 30 shown in Figure 24. In Figure 25, the measurement direction in which the measuring probe 61 advances is the direction of the arrow C1 (clockwise). The upper half of Figures 25(a) and (b) is a diagram of the measurement plane observed from the top of the paper, and the lower half of Figures 25(a) and (b) is a diagram of the measurement plane observed from the clamp pin 130 side in a direction parallel to the Y axis. The upper half of Figures 25(c) and (d) is a diagram of the measurement plane observed from the top of the paper, and the lower half of Figures 25(c) and (d) is a diagram of the measurement plane observed from the clamp pin 131 side in a direction parallel to the Y axis. In this example, the interference determination line ILCZ in the Z direction and the interference determination line ILCY in the Y direction are also set. When the optical measurement unit 30 is located below the interference determination line ILCZ in the Z direction, the control unit 50 performs normal measurement operation without performing interference avoidance operation since no interference occurs between the interfered object and the optical measurement unit 30. When the optical measurement unit 30 is located below the interference determination line ILCZ in the Z direction, the control unit 50 performs interference avoidance operation as follows.

For example, the control unit 50 performs the interference avoidance operation for the area IR1 of the optical measurement unit 30 located ahead of the probe 61 based on the interference determination line ILCY in the Y direction. The control unit 50 performs the interference avoidance operation for the area IR2 of the optical measurement unit 30 located behind the probe 61 based on the positioning information of the rim holding member and the measured results of the rim Ri.

Figure 25 (a) shows an example of a case where the area IR1 ahead of the probe 61 is closer to the clamp pin 130b side than the interference determination line ILCY in the Y direction. In this case, the control unit 50 controls the operation of the moving unit 210 and the rotating unit 260 so that the area IR1 is not positioned closer to the clamp pin 130b side than the interference determination line ILCY in the Y direction, as shown in Figure 25 (b).

Figure 25(c) shows an example of a case where the area IR2 located behind the probe 61 approaches the clamp pin 131 and the measured rim Ri. In this case, the control unit 50 controls the operation of the moving unit 210 and the rotating unit 260 so that the area IR2 moves away from the clamp pin 131 and the rim Ri based on the position information of the clamp pin 131 and the measured result of the rim Ri, as shown in Figure 25(d).

This type of interference avoidance control allows for good measurement while avoiding interference, even when the optical measurement unit 30 is positioned on both the left and right sides of the probe 61 (left and right when viewed from the tip of the probe 6).

The above describes typical examples of the present disclosure, but the present disclosure is not limited to the examples shown here, and various modifications are possible within the scope of the same technical concept of the present disclosure.

Reference Signs List 1: eyeglass frame shape measuring device 25: holding unit 30: optical measuring unit 50: control unit 60: measuring probe unit 61: measuring probe 70: supporting unit 130: clamp pin 210: moving unit 260: rotating unit 300: clamp mechanism

Claims (6)

An eyeglass frame shape measuring device for measuring the shape of an eyeglass frame rim, comprising:
a frame holding means having a rim holding member for holding a rim of an eyeglass frame;
a probe unit having a probe to be inserted into a groove of the rim;
an optical measurement unit for optically measuring the shape of the groove of the rim, the optical measurement unit comprising: a light projecting optical system that irradiates a measurement light beam from a light source toward the groove of the rim; a light receiving optical system that receives a reflected light beam of the measurement light beam reflected by the groove of the rim with a detector; and a housing that contains the light projecting optical system and the light receiving optical system ;
a support unit that integrally supports the probe unit and the optical measurement unit;
A change means for changing a relative positional relationship between the rim and the support unit;
a control means for controlling the change means based on position information of an interference portion previously specified in the housing of the optical measurement unit so as to avoid interference with an interfering object including at least the optical measurement unit among the measurement element unit, the optical measurement unit, and the support unit, when measuring the rim, the interfering object including at least one of the rim and the rim holding member of the eyeglass frame held by the frame holding means;
An eyeglass frame shape measuring device comprising: 2. The eyeglass frame shape measuring device according to claim 1,
an interference information acquisition means for acquiring interference information including position information of the interfered object,
The eyeglass frame shape measuring device is characterized in that the control means controls the change means so as to avoid interference of the interfering object with the interfered object based on the interference information acquired by the interference information acquisition means. 3. The eyeglass frame shape measuring device according to claim 2,
The rim holding member is configured to extend toward the inside of the rim in a radial plane at the time of measurement,
The interference information includes position information of the rim holding member when the rim of the eyeglass frame is held,
The control means controls the change means based on the positioning information of the rim holding member so that the distance of the interfering object is equal to or greater than a certain distance in at least one of a radial direction and a vertical direction perpendicular to the radial direction relative to the rim holding member. 4. The eyeglass frame shape measuring device according to claim 3,
The eyeglass frame shape measuring device is characterized in that the control means controls the change means so that the interfering object is at a certain distance or more in the radial direction relative to the rim holding member extending toward the inside of the rim. 5. The eyeglass frame shape measuring device according to claim 3,
The change means includes a rotation means for rotating the support unit about an axis extending in a vertical direction perpendicular to a radial direction,
The control means controls the rotation means so that the distance between the rim holding member and the interfering object is greater than or equal to a certain distance in the radial direction when measuring the unmeasured portion of the rim. a frame holding means having a rim holding member for holding a rim of an eyeglass frame in a measurement state; a probe unit having a probe to be inserted into a groove of the rim; an optical measurement unit for optically measuring the shape of the groove of the rim, the optical measurement unit comprising a light projecting optical system which irradiates a measurement light beam from a light source towards the groove of the rim; a light receiving optical system which receives a reflected light beam of the measurement light beam reflected by the groove of the rim with a detector ; and a housing which contains the light projecting optical system and the light receiving optical system ; a support unit which integrally supports the probe unit and the optical measurement unit; and a change means which changes the relative positional relationship between the rim and the support unit,
A control program for an eyeglass frame shape measuring device, characterized in that a control unit of the eyeglass frame shape measuring device is caused to execute a control step of controlling the change means based on position information of an interference site previously specified in the housing provided with the optical measurement unit, so as to avoid interference with an interfering object including at least the optical measurement unit among the measurement element unit, the optical measurement unit, and the support unit, with respect to an interfered object including at least one of the rim of the eyeglass frame held by the frame holding means and the rim holding member.