JP7613728B2 - Carbon compounds and their manufacturing methods - Google Patents
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- 150000001722 carbon compounds Chemical class 0.000 title claims description 33
- 238000004519 manufacturing process Methods 0.000 title description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 39
- 229910052799 carbon Inorganic materials 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 28
- 239000013078 crystal Substances 0.000 claims description 25
- 230000001133 acceleration Effects 0.000 claims description 19
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 claims description 15
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 claims description 15
- 229910021419 crystalline silicon Inorganic materials 0.000 claims description 11
- 229930195733 hydrocarbon Natural products 0.000 claims description 9
- 150000002430 hydrocarbons Chemical class 0.000 claims description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 8
- 239000010703 silicon Substances 0.000 claims description 8
- 239000004215 Carbon black (E152) Substances 0.000 claims description 7
- 229910002804 graphite Inorganic materials 0.000 claims description 6
- 239000010439 graphite Substances 0.000 claims description 6
- 239000011029 spinel Substances 0.000 claims description 6
- 229910052596 spinel Inorganic materials 0.000 claims description 6
- 239000011203 carbon fibre reinforced carbon Substances 0.000 claims description 4
- 230000007423 decrease Effects 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 claims description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 32
- 239000011787 zinc oxide Substances 0.000 description 16
- 239000007789 gas Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 5
- 239000002041 carbon nanotube Substances 0.000 description 5
- 229910021393 carbon nanotube Inorganic materials 0.000 description 5
- 238000010894 electron beam technology Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- KDKYADYSIPSCCQ-UHFFFAOYSA-N but-1-yne Chemical compound CCC#C KDKYADYSIPSCCQ-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 229910003472 fullerene Inorganic materials 0.000 description 2
- 238000002173 high-resolution transmission electron microscopy Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000002109 single walled nanotube Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- MWWATHDPGQKSAR-UHFFFAOYSA-N propyne Chemical compound CC#C MWWATHDPGQKSAR-UHFFFAOYSA-N 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000011232 storage material Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- Carbon And Carbon Compounds (AREA)
Description
本発明は、炭素化合物及びその製造方法に関する。 The present invention relates to a carbon compound and a method for producing the same.
現在、未来の炭素材料として注目されているものに、フラーレンやカーボンナノチューブ等があり、これらの材料を構成している原子は黒鉛やダイヤモンドと同じ炭素Cであるが、球状やチューブ状に原子が閉じた結合をした構造をもっている。特にナノサイズのチューブ状に結合した構造を持つカーボンナノチューブは半導体デバイス材料や電池材料を初め、導電性材料、水素貯蔵材料、キャパシター材料、超硬材料、医薬品、レジスト材料などへの応用が期待されている。 Currently, fullerenes and carbon nanotubes are attracting attention as carbon materials of the future. The atoms that make up these materials are carbon (C), the same as those in graphite and diamond, but they have a spherical or tubular structure in which the atoms are bonded in closed bonds. Carbon nanotubes, which have a nano-sized tubular bond structure, are particularly expected to be used in semiconductor device materials, battery materials, conductive materials, hydrogen storage materials, capacitor materials, superhard materials, pharmaceuticals, resist materials, and more.
また、60個の原子がサッカーボール状に結合した構造を持つものがフラーレンの中での代表的な構造のものであり、上記用途に加え、超伝導材料や超硬材料などへの応用が期待されている。 A typical fullerene structure is one in which 60 atoms are bonded together in the shape of a soccer ball, and in addition to the uses mentioned above, it is expected to be used in superconducting and ultrahard materials.
しかしながら、現状の炭素化合物の結晶構造は、上述のようなフラーレンやカーボンナノチューブ等の特殊な構造に加えて、グラファイト構造、ダイヤモンド構造のものしか知られておらず、その特性向上には自ずから限界があった。 However, the only crystal structures currently known for carbon compounds are those with graphite and diamond structures, in addition to the special structures such as fullerenes and carbon nanotubes mentioned above, and there are naturally limitations to how well their properties can be improved.
本発明は、従来の結晶構造にない新規な特性を提供し得る、新規な結晶構造の炭素化合物を提供することを目的とする。 The present invention aims to provide a carbon compound with a new crystal structure that can provide new properties not found in conventional crystal structures.
上記目的を達成すべく、本発明は、以下に示す通りである。
(1)結晶性のシリコン基質と炭素の多層膜を備え、当該結晶性のシリコン基質を構成するシリコンのC軸方向と当該炭素の多層膜が平行に配列し、当該炭素の多層膜は、当該結晶性の基質上に形成され、スピネル型の結晶構造の相を含み、当該結晶性のシリコン基質と当該炭素の多層膜は架橋されていることを特徴とする、積層体。
(2)前記シリコンのC軸方向と前記炭素の多層膜の積層方向が平行に配列されている、(1)に記載の積層体。
(3)前記スピネル型の結晶構造の相と連続して、前記基質と反対側にグラファイトが多段に積層されてなる構造の相を含むことを特徴とする、(1)又は(2)に記載の積層体。
(4)厚さ100nm以下における抵抗率が10-5~10-10Ω・mであることを特徴とする、(1)~(3)のいずれか1項に記載の積層体。
(5)前記抵抗率が前記炭素化合物の厚さの増大とともに減少することを特徴とする、(1)~(4)のいずれか1項に記載の積層体。
(6)電子源が配設されたカソードと、当該カソードと対向して結晶性のシリコン基質が配設されたアノードとを配設する工程と、前記カソード及び前記アノード間において、前記カソード側にゲート電極を配設し、前記アノード側に加速度電極を配設する工程と、前記ゲート電極及び前記加速度電極間にアセチレン系炭化水素を流し、前記電子源から放出された電子と、前記ゲート電極に印加された電圧とで前記アセチレン系ガスを分解して、イオン化した炭素及びハイドロカーボンの少なくとも一方を得る工程と、前記炭素及びハイドロカーボンの少なくとも一方を前記加速度電極に印加された電圧で加速して、前記アノードの前記結晶性のシリコン基質に照射する工程と、を含むことを特徴とする、積層体の製造方法。
In order to achieve the above object, the present invention is as follows.
(1) A laminate comprising a crystalline silicon substrate and a carbon multilayer film, the C-axis direction of silicon constituting the crystalline silicon substrate and the carbon multilayer film are aligned parallel to each other, the carbon multilayer film is formed on the crystalline substrate and contains a phase of a spinel type crystal structure , and the crystalline silicon substrate and the carbon multilayer film are crosslinked .
(2) The stack according to (1), in which a C-axis direction of the silicon and a stacking direction of the carbon multilayer film are arranged parallel to each other.
( 3 ) The laminate according to (1) or (2) , characterized in that it contains, continuous to the phase of the spinel type crystal structure, a phase having a structure in which graphite is laminated in multiple stages on the side opposite to the substrate.
( 4 ) The laminate according to any one of (1) to (3) , characterized in that the resistivity at a thickness of 100 nm or less is 10 −5 to 10 −10 Ω·m.
( 5 ) The laminate according to any one of (1) to ( 4 ), wherein the resistivity decreases with increasing thickness of the carbon compound.
( 6 ) A method for manufacturing a laminate, comprising the steps of: disposing a cathode having an electron source disposed thereon and an anode having a crystalline silicon substrate disposed opposite the cathode; disposing a gate electrode on the cathode side and an acceleration electrode on the anode side between the cathode and the anode; flowing an acetylene-based hydrocarbon between the gate electrode and the acceleration electrode, decomposing the acetylene-based gas with electrons emitted from the electron source and a voltage applied to the gate electrode, thereby obtaining at least one of ionized carbon and hydrocarbon; and accelerating the at least one of the carbon and hydrocarbon by the voltage applied to the acceleration electrode, and irradiating the crystalline silicon substrate of the anode with the carbon and hydrocarbon .
以上、本発明によれば、従来の結晶構造にない新規な特性を提供し得る、新規な結晶構造の炭素化合物を提供することができる。 As described above, the present invention can provide a carbon compound with a new crystal structure that can provide new properties not found in conventional crystal structures.
以下、本発明の詳細及びその他の特徴について、実施の形態に基づいて説明する。
(炭素化合物)
本発明の炭素化合物は、結晶性の基質上に形成され、当該基質を架橋しているスピネル型の結晶構造の相を含む。このような構造の炭素化合物は従来に存在しなかったため、種々の特性を示すことが期待される。
Hereinafter, details and other features of the present invention will be described based on embodiments.
(Carbon compounds)
The carbon compound of the present invention is formed on a crystalline substrate and contains a phase of a spinel-type crystal structure bridging the substrate. Since no carbon compound with such a structure has existed in the past, it is expected to exhibit various properties.
例えば、スピネル型の結晶構造に由来して、従来のカーボンには存在しなかった磁性を呈することが期待される。 For example, due to its spinel crystal structure, it is expected to exhibit magnetism that has not existed in conventional carbon.
また、電気特性においても変化を見ることができ、例えば、厚さ100nm以下における抵抗率が10-5~10-10Ω・m程度と金属アルミニウム等と同程度の抵抗率を示し、金属的な特性を有することが分かる。なお、当該抵抗率を示す最低の厚さは、例えば20nmである。 Also, changes can be seen in the electrical properties, for example, the resistivity at a thickness of 100 nm or less is about 10 -5 to 10 -10 Ω·m, which is similar to that of metallic aluminum, and it is found to have metallic properties. The minimum thickness at which this resistivity is exhibited is, for example, 20 nm.
さらに、本発明の炭素化合物は厚さの増大とともにその抵抗率が減少し、やはり金属薄膜と類似の特性を示し、金属的な特性を有することが分かる。例えば、厚さが0.02μm~1.2μmに増大する間に、抵抗率は10-5~10-10Ω・mにまで減少する。 Furthermore, the carbon compound of the present invention exhibits a decrease in resistivity with increasing thickness, and thus exhibits properties similar to those of a thin metal film, and thus has metallic properties. For example, the resistivity decreases from 10 -5 to 10 -10 Ω·m as the thickness increases from 0.02 μm to 1.2 μm.
現在、上記のような特性は、特に金属的な特性に関しては、炭素化合物中のスピネル型の結晶構造のみではなく、スピネル型の結晶構造の相と連続して、基質と反対側にグラファイトが多段に積層されてなる構造のポリカーボン相を含むという当該炭素化合物の特性に依存していると考えられる。 Currently, it is believed that the above-mentioned properties, especially the metallic properties, depend not only on the spinel-type crystal structure in the carbon compound, but also on the property of the carbon compound that it contains a polycarbon phase in which graphite is laminated in multiple layers on the side opposite the substrate, continuous with the spinel-type crystal structure phase.
なお、本発明でいうところの「架橋」とは、主に高分子化学においてポリマー同士を連結し、物理的、化学的性質を変化させる反応を意味するものではなく、以下の実施例の結果からも明らかように、互いの結晶構造が橋を架けたように結合しているような広義の結合状態を意味するものである。 In this invention, "crosslinking" does not mean a reaction that mainly occurs in polymer chemistry, in which polymers are linked together and their physical and chemical properties are changed, but rather means a bonding state in a broad sense in which the crystal structures of the polymers are bonded together as if they were bridged, as is clear from the results of the following examples.
(炭素化合物の製造方法)
次に、上記炭素化合物の製造方法の一例について説明する。図1は、炭素化合物の製造装置10の一例を示す概略構成図である。
(Method for producing carbon compounds)
Next, an example of the method for producing the carbon compound will be described. Fig. 1 is a schematic diagram showing an example of an apparatus 10 for producing a carbon compound.
図1に示すように、本実施形態の炭素化合物の製造装置10は、カソード11と、当該カソード11と対向するようにして配設されたアノード12とを有している。カソード11上には、ITO透明導電膜13を電極として電子源14が配設されている。また、アノード12上には目的とする炭素化合物を形成するための結晶性の基質15が配設されている。 As shown in FIG. 1, the carbon compound manufacturing apparatus 10 of this embodiment has a cathode 11 and an anode 12 arranged to face the cathode 11. An electron source 14 is arranged on the cathode 11, with an ITO transparent conductive film 13 as an electrode. In addition, a crystalline substrate 15 for forming the desired carbon compound is arranged on the anode 12.
さらに、カソード11とアノード12との間には、カソード11側にゲート電極16が配設され、アノード12側に加速度電極17が配設されている。 Furthermore, between the cathode 11 and the anode 12, a gate electrode 16 is disposed on the cathode 11 side, and an acceleration electrode 17 is disposed on the anode 12 side.
カソード11、アノード12、ゲート電極16及び加速度電極17は電気伝導性に優れた金属、例えばアルミニウム、金、銀、銅や、耐熱性に優れた鉄、コバルト、ニッケル、タングステン、モリブデン及びこれらの合金等を用いることができる。 The cathode 11, anode 12, gate electrode 16, and acceleration electrode 17 can be made of metals with excellent electrical conductivity, such as aluminum, gold, silver, and copper, or iron, cobalt, nickel, tungsten, molybdenum, and alloys of these metals with excellent heat resistance.
また、電子源14も特に限定されるものではないが、安定した電子放出を行うという観点からカーボンナノチューブから構成することが好ましく、特には高結晶性単層カーボンナノチューブから構成することが好ましい。 The electron source 14 is also not particularly limited, but is preferably made of carbon nanotubes from the viewpoint of stable electron emission, and is particularly preferably made of highly crystalline single-walled carbon nanotubes.
基質15も結晶性を有していれば特に限定されるものではなく、シリコン等の半導体や酸化亜鉛等のセラミックを用いることができる。 The substrate 15 is not particularly limited as long as it has crystallinity, and semiconductors such as silicon and ceramics such as zinc oxide can be used.
なお、以下に説明するように、炭素化合物の製造にはアセチレン系ガスを使用するので、製造装置10の全体は必要に応じて真空チャンバ等の容器内に配設することが好ましい。 As described below, since acetylene-based gas is used to produce carbon compounds, it is preferable to place the entire production apparatus 10 in a container such as a vacuum chamber as necessary.
また、製造装置10の大きさは適宜に設定することができるが、例えばカソード11及びアノード12間は0.1~1.0cm、カソード11及びゲート電極14間は0.005~0.02cm、アノード12及び加速度電極17間は0.1~0.5cmとすることができる。 The size of the manufacturing device 10 can be set appropriately, for example, the distance between the cathode 11 and the anode 12 can be 0.1 to 1.0 cm, the distance between the cathode 11 and the gate electrode 14 can be 0.005 to 0.02 cm, and the distance between the anode 12 and the acceleration electrode 17 can be 0.1 to 0.5 cm.
以上のような製造装置10を準備した後、カソード11及びアノード12間、より具体的にはゲート電極14及び加速度電極17間にアセチレン系ガス18を流す。アセチレン系ガス18とは、いわゆるアセチレン系炭化水素を意味するものであり、炭素間に三重結合を有する物質を意味するものである。具体的には、アセチレン、プロピン、1-ブチン等を挙げることができるが、最も反応性に富み、安価で入手が容易であることから、一般にはアセチレンを用いる。 After preparing the manufacturing apparatus 10 as described above, acetylene-based gas 18 is flowed between the cathode 11 and the anode 12, more specifically between the gate electrode 14 and the acceleration electrode 17. Acetylene-based gas 18 refers to so-called acetylene-based hydrocarbons, meaning substances that have triple bonds between carbon atoms. Specific examples include acetylene, propyne, and 1-butyne, but acetylene is generally used because it is the most reactive, inexpensive, and easily available.
アセチレン系ガス18を所定の流量で流すと同時に、カーボンナノチューブ14から例えば70nA/cm2以上の電流密度(ドーズ量)で電子を放出し、ゲート電極16に例えば18~40Vの電圧を印加すると、アセチレン系ガス18は分解され、イオン化した炭素あるいはハイドロカーボンとなる。 When an acetylene-based gas 18 is flowed at a predetermined flow rate, electrons are emitted from the carbon nanotubes 14 at a current density (dose) of, for example, 70 nA/ cm2 or more, and a voltage of, for example, 18 to 40 V is applied to the gate electrode 16, the acetylene-based gas 18 is decomposed and becomes ionized carbon or hydrocarbons.
次いで、このイオンを加速度電極17に例えば200~600Vの電圧を印加して当該イオンを加速し、基質15に照射する。すると、基質15上に上述した少なくともスピネル型の結晶構造からなる相を含む炭素化合物が形成される。 Next, the ions are accelerated by applying a voltage of, for example, 200 to 600 V to the acceleration electrode 17, and are then irradiated onto the substrate 15. This causes the formation of a carbon compound on the substrate 15 that includes at least the phase having the spinel-type crystal structure described above.
このように、本実施形態によれば、電子源を配設したカソードと、基質を配設したアノードとを対向させ、その間にゲート電極及び加速度電極を配設し、ゲート電極でアセチレン系ガスを分解し、加速度電極で分解して得たイオンを基質へ向けて加速して照射するという、電界電子放出の原理を用いた簡易な操作を行うのみで、目的とするスピネル型の結晶構造の相を有する炭素化合物を得ることができる。 In this way, according to this embodiment, a cathode with an electron source and an anode with a substrate are opposed to each other, a gate electrode and an acceleration electrode are disposed between them, an acetylene-based gas is decomposed by the gate electrode, and the ions obtained by the decomposition by the acceleration electrode are accelerated and irradiated toward the substrate. This is a simple operation that uses the principle of field electron emission, and it is possible to obtain a carbon compound having the desired phase of a spinel-type crystal structure.
(実施例1)
図1に示すような製造装置10を用いてスピネル型の結晶構造の相を有する炭素化合物を製造した。
Example 1
A carbon compound having a spinel-type crystal structure phase was produced using a production apparatus 10 as shown in FIG.
カソード11及びアノード12を金属もしくは半導体基板から構成し、ゲート電極16及び加速度電極17をステンレス加工板から構成した。次いで、カソード11及びアノード12間距離を0.35cmとし、カソード11及びゲート電極16間距離を0.01cmとし、アノード12及び加速度電極17間距離を0.17cmとした。 The cathode 11 and anode 12 were made of a metal or semiconductor substrate, and the gate electrode 16 and acceleration electrode 17 were made of a stainless steel processed plate. Next, the distance between the cathode 11 and the anode 12 was set to 0.35 cm, the distance between the cathode 11 and the gate electrode 16 was set to 0.01 cm, and the distance between the anode 12 and the acceleration electrode 17 was set to 0.17 cm.
また、電子源14として電子放出サイズ15×15mm2の高結晶性単層カーボンナノチューブを用い、ゲート電極16の印加電圧を22Vとした。さらに、加速度電極17への印加電圧を500Vとした。 Further, a highly crystalline single-walled carbon nanotube having an electron emission size of 15×15 mm 2 was used as the electron source 14, and the voltage applied to the gate electrode 16 was set to 22 V. Furthermore, the voltage applied to the acceleration electrode 17 was set to 500 V.
なお、本実施例では、製造装置10の全体を真空チャンバ内に収容し、その内部の圧力が1.6Paとなるように、アセチレンガスを導入した。また、基質15として、湿式合成により形成された酸化亜鉛を用いた。 In this embodiment, the entire manufacturing apparatus 10 was housed in a vacuum chamber, and acetylene gas was introduced so that the internal pressure was 1.6 Pa. Zinc oxide formed by wet synthesis was used as the substrate 15.
図2は得られた炭素化合物のSEM写真である。なお、図2に示すSEM写真は、得られた炭素化合物を樹脂包埋した試験片を集束イオンビーム加工で剥片加工したものを写したものである。 Figure 2 is an SEM photograph of the obtained carbon compound. The SEM photograph shown in Figure 2 was taken of a test piece in which the obtained carbon compound was embedded in resin and then processed by focused ion beam processing to produce a flake.
図2(a)から明らかなように、炭素化合物の内部には細かな空隙が見られるものの、マクロ的には楕円状であることが分かる。また、図2(b)は、図2(a)の白丸部分を拡大したものであるが、もともと粒状であった酸化亜鉛粒子が非平衡励起反応場により結晶C軸方向で選択的に架橋し、その結果楕円状粒子となっていることが分かる。そして、これら楕円状酸化亜鉛の粒子間に炭素膜が被覆されていることが分かる。 As is clear from Figure 2(a), although fine gaps can be seen inside the carbon compound, it is understood that it has an elliptical shape on a macroscopic level. Also, Figure 2(b) is an enlarged view of the white circle part in Figure 2(a), and it can be seen that the zinc oxide particles, which were originally granular, are selectively cross-linked in the crystal C-axis direction by the non-equilibrium excitation reaction field, resulting in elliptical particles. It can also be seen that a carbon film is coated between these elliptical zinc oxide particles.
図3は、酸化亜鉛と炭素膜との界面付近における結晶構造について、加速電圧300kVの高分解能電子線等価顕微鏡(HRTEM:日本電子株式会社製)を用いて観察した透過像である。 Figure 3 shows a transmission image of the crystal structure near the interface between zinc oxide and the carbon film, observed using a high-resolution electron beam equivalent microscope (HRTEM: manufactured by JEOL Ltd.) with an acceleration voltage of 300 kV.
図3(a)は、酸化亜鉛と炭素膜界面の高解像電子透過像を表し、酸化亜鉛表面に20nm程度の炭素膜が形成されており、酸化亜鉛と炭素膜との明瞭な界面が確認できることが分かる。 Figure 3 (a) shows a high-resolution electron transmission image of the interface between zinc oxide and a carbon film, which shows that a carbon film of about 20 nm is formed on the zinc oxide surface, and that a clear interface between the zinc oxide and the carbon film can be confirmed.
図3(b)及び図3(c)は、酸化亜鉛側の回折パターン及びフーリエ変換像を表す。図3(a)~(c)の画像より、酸化亜鉛のC軸方向と炭素の多層膜が平行に配列していることが判明した。 Figures 3(b) and 3(c) show the diffraction pattern and Fourier transform image of the zinc oxide side. From the images in Figures 3(a) to (c), it is clear that the C-axis direction of the zinc oxide and the carbon multilayer film are aligned parallel to each other.
さらに、上記多層膜の回折パターンを撮像し、そのフーリエ変換像を得た(図4(d)参照)。この結果、この多層膜はスピネル型の結晶構造を有することが判明した。 Furthermore, the diffraction pattern of the multilayer film was imaged and its Fourier transform image was obtained (see Figure 4(d)). As a result, it was found that the multilayer film has a spinel-type crystal structure.
このとき、上述のように、スピネル型の結晶構造を有する相と酸化亜鉛のC軸とは、互いに平行に結合していることから、上記相と酸化亜鉛とは架橋していることが分かる。 At this time, as described above, the phase having a spinel-type crystal structure and the C-axis of zinc oxide are bonded parallel to each other, and therefore it can be seen that the phase and zinc oxide are cross-linked.
また、図3(e)から明らかなように、酸化亜鉛表面から離れた箇所の炭素膜はグラファイト層が多段に積み重なったポリカーボン相となっていることが判明した。 As is clear from Figure 3(e), the carbon film away from the zinc oxide surface was found to be a polycarbon phase in which graphite layers were stacked in multiple stages.
(実施例2)
実施例1において、基質を酸化亜鉛から厚さ0.625mmのシリコン基板に変更した以外は、同様の製造装置10を用い、同様の条件で炭素化合物の形成を行った。
Example 2
A carbon compound was formed under the same conditions using the same manufacturing apparatus 10 as in Example 1, except that the substrate was changed from zinc oxide to a silicon substrate having a thickness of 0.625 mm.
図4は、酸化亜鉛と炭素膜との界面付近における結晶構造について、加速電圧300kVの高分解能電子線等価顕微鏡(HRTEM:日本電子株式会社製)を用いて観察した透過像である。 Figure 4 shows a transmission image of the crystal structure near the interface between zinc oxide and the carbon film, observed using a high-resolution electron beam equivalent microscope (HRTEM: manufactured by JEOL Ltd.) with an acceleration voltage of 300 kV.
図4から明らかなように、本実施例においても、実施例1と同様に、シリコンのC軸方向と炭素の多層膜が平行に配列していることが判明し、上記多層膜の回折パターンを撮像し、そのフーリエ変換像を得た。この結果、この多層膜はスピネル型の結晶構造を有することが判明した。 As is clear from Figure 4, in this embodiment, as in Example 1, it was found that the C-axis direction of silicon and the carbon multilayer film were aligned parallel to each other, and the diffraction pattern of the multilayer film was imaged and its Fourier transform image was obtained. As a result, it was found that this multilayer film has a spinel-type crystal structure.
また、スピネル型の結晶構造を有する相と酸化亜鉛のC軸とは、互いに平行に結合していることから、上記相とシリコンとは架橋していることが分かる。 In addition, the phase having a spinel crystal structure and the C-axis of zinc oxide are bonded parallel to each other, which indicates that the phase is cross-linked with silicon.
さらに、上述のようにして得たスピネル型の結晶構造の相を有する炭素化合物の抵抗率を図5に示す装置を用いて測定したところ、厚さ0.03μmにおいて約10-3~10-5Ω・cmの抵抗率を示し、アルミニウムと同程度の低い抵抗率、すなわち高伝導性が得られることが判明した。 Furthermore, when the resistivity of the carbon compound having a spinel-type crystal structure phase obtained as described above was measured using the apparatus shown in FIG. 5, it was found to have a resistivity of about 10-3 to 10-5 Ω·cm at a thickness of 0.03 μm, which is as low as that of aluminum, that is, high conductivity.
また、厚さが0.03μmから1.2μmに増大するに際して、抵抗率が10-5Ω・cmから10-8Ω・cmにまで減少することが確認された。 It was also confirmed that the resistivity decreased from 10 -5 Ω·cm to 10 -8 Ω·cm when the thickness increased from 0.03 μm to 1.2 μm.
以上、本発明のいくつかの実施形態を説明したが、これらの実施形態は例として掲示したものであり、発明の範囲を限定することは意図していない。これら新規な実施形態は、その他の様々な形態で実施されることが可能であり、発明の要旨を逸脱しない範囲で、種々の省略、置き換え、変更を行うことができる。これら実施形態やその変形は、発明の範囲や要旨に含まれるとともに、特許請求の範囲に記載された発明とその均等の範囲に含まれる。 Although several embodiments of the present invention have been described above, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, substitutions, and modifications can be made without departing from the gist of the invention. These embodiments and their modifications are included within the scope and gist of the invention, and are included in the scope of the invention and its equivalents as set forth in the claims.
10 炭素化合物の製造装置
11 カソード
12 アノード
13 ITO透明導電膜
14 電子源
15 基質
16 ゲート電極
17 加速度電極
18 アセチレン系ガス
REFERENCE SIGNS LIST 10 Carbon compound manufacturing apparatus 11 Cathode 12 Anode 13 ITO transparent conductive film 14 Electron source 15 Substrate 16 Gate electrode 17 Acceleration electrode 18 Acetylene-based gas
Claims (6)
当該結晶性のシリコン基質を構成するシリコンのC軸方向と当該炭素の多層膜が平行に配列し、
当該炭素の多層膜は、当該結晶性のシリコン基質上に形成され、スピネル型の結晶構造の相を含み、
当該結晶性のシリコン基質と当該炭素の多層膜は架橋されていることを特徴とする、積層体。 It has a crystalline silicon substrate and a multilayer of carbon.
the C-axis direction of silicon constituting the crystalline silicon substrate and the multilayer film of carbon are aligned parallel to each other;
the carbon multilayer film is formed on the crystalline silicon substrate and includes a phase having a spinel type crystal structure;
The crystalline silicon substrate and the carbon multilayer are crosslinked .
1~4のいずれか1項に記載の積層体。 5. A laminate according to claim 1, wherein the resistivity decreases with increasing thickness of the carbon compound.
前記カソード及び前記アノード間において、前記カソード側にゲート電極を配設し、前記アノード側に加速度電極を配設する工程と、
前記ゲート電極及び前記加速度電極間にアセチレン系炭化水素を流し、前記電子源から放出された電子と、前記ゲート電極に印加された電圧とで前記アセチレン系ガスを分解して、イオン化した炭素及びハイドロカーボンの少なくとも一方を得る工程と、
前記炭素及びハイドロカーボンの少なくとも一方を前記加速度電極に印加された電圧で加速して、前記アノードの前記結晶性のシリコン基質に照射する工程と、を含むことを特徴とする、積層体の製造方法。 providing a cathode having an electron source disposed thereon and an anode having a crystalline silicon substrate disposed opposite the cathode;
a step of disposing a gate electrode on the cathode side and an acceleration electrode on the anode side between the cathode and the anode;
a step of flowing an acetylene-based hydrocarbon between the gate electrode and the acceleration electrode, and decomposing the acetylene-based gas by electrons emitted from the electron source and a voltage applied to the gate electrode to obtain at least one of ionized carbon and hydrocarbon;
and accelerating at least one of the carbon and the hydrocarbon by a voltage applied to the acceleration electrode and irradiating the crystalline silicon substrate of the anode.
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