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JP7644129B2 - Manufacturing method for double-sided cooled power module - Google Patents
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JP7644129B2 - Manufacturing method for double-sided cooled power module - Google Patents

Manufacturing method for double-sided cooled power module Download PDF

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JP7644129B2
JP7644129B2 JP2022546754A JP2022546754A JP7644129B2 JP 7644129 B2 JP7644129 B2 JP 7644129B2 JP 2022546754 A JP2022546754 A JP 2022546754A JP 2022546754 A JP2022546754 A JP 2022546754A JP 7644129 B2 JP7644129 B2 JP 7644129B2
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substrate
double
bonding material
power module
bonding
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JPWO2022049641A1 (en
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キム・ウジン
パク・チャンヨン
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Sanken Electric Co Ltd
Sanken Electric Korea Co Ltd
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Sanken Electric Korea Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/10Arrangements for heating
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • H10W72/07351Connecting or disconnecting of die-attach connectors characterised by changes in properties of the die-attach connectors during connecting
    • H10W72/07354Connecting or disconnecting of die-attach connectors characterised by changes in properties of the die-attach connectors during connecting changes in dispositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • H10W72/341Dispositions of die-attach connectors, e.g. layouts
    • H10W72/347Dispositions of multiple die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Description

本発明は、パワー半導体パッケージの両面冷却(デュアルサイドクーリング:DUAL SIDE COOLING:DSC)パワーモジュールに関する。特に、内部に部材が積層されたパッケージの厚さを制御する製造方法とそのモジュールに関する。
The present invention relates to a dual side cooling (DSC) power module for a power semiconductor package, and more particularly to a manufacturing method for controlling the thickness of a package having members stacked therein and the module.

現在のパワー半導体市場において、高電圧および高電流を使用するハイエンドパワーモジュールは、より効率的な放熱を必要とされている。特に、パワー半導体パッケージの両面冷却パワーモジュールは、高い電力密度と高速による半導体チップの高い動作温度に応じて、より高い熱性能を必要とされる。
In the current power semiconductor market, high-end power modules that use high voltage and high current require more efficient heat dissipation. In particular, double-sided cooling power modules for power semiconductor packages require higher thermal performance in response to the high operating temperatures of semiconductor chips due to high power density and high speed.

例えば、特許文献1には、下端ターミナル、パワー半導体チップ、水平スペーサ、上端ターミナル、垂直スペーサで構成され、内部にこれら部材が積層された両面冷却パワーモジュールが開示されている。
For example, Patent Document 1 discloses a double-sided cooled power module that is composed of a lower end terminal, a power semiconductor chip, a horizontal spacer, an upper end terminal, and a vertical spacer, and in which these components are stacked inside.

米国特許第9390996B2号U.S. Patent No. 9,390,996B2

従来方法で部材を積層する場合は、ダイマウント工程の前に印刷された接合材(接着剤)を使用して乾式処理(ドライプロセス)を実行するが、印刷された接合材の表面の平坦性が不均一であるため、次工程でチップクラックや絶縁基板にクラックが発生する懸念がある。
When stacking components using conventional methods, a dry process is carried out using a printed bonding material (adhesive) before the die mounting process. However, because the surface of the printed bonding material is not uniform in flatness, there is a concern that chip cracks or cracks may occur in the insulating substrate in the next process.

また、積み重ねられた材料の厚さのばらつきがあるため、1つずつ積み重ねることは、接合材乾燥工程なしの従来方法では、全体の積層厚さを一定に抑えることは困難である。 In addition, because there is variation in the thickness of the stacked materials, it is difficult to keep the overall layer thickness constant when stacking them one by one using the conventional method that does not involve a bonding material drying process.

材料厚さ公差がモジュール全体の厚さ公差に直接影響する場合、両面冷却モジュールの積層高さを制御するために、向かいあう絶縁基板にダイなどを積層して取り付けた後、基板に最後に取り付ける接合材(接着剤)を、特殊金属治具を使用し、予備乾燥をしないリフロープロセスで、緩衝接合層(バッファー接着層)とすることである。
When the material thickness tolerance directly affects the thickness tolerance of the entire module, in order to control the stacking height of the double-sided cooling module, after the dies and other parts are stacked and attached to the opposing insulating substrates, the bonding material (adhesive) that is finally attached to the substrate is used as a buffer bonding layer (buffer adhesive layer) using a special metal jig and a reflow process without pre-drying.


乾式工程を含まない最後の接合材層は、特殊金属治具を使用して、原材料と積層材料の厚さのばらつきをすべて緩衝接合層として補正することができる。これにより、パワー半導体の両面冷却(デュアルサイドクーリングモジュール)のスタック高さ(H)のばらつきを従来よりも小さくすることがでる。

The final bonding layer, which does not involve a dry process, can use a special metal jig to compensate for all thickness variations in the raw materials and laminated materials as a buffer bonding layer, which allows the stack height (H) variation of the power semiconductor double-sided cooling (dual-sided cooling module) to be smaller than before.

さらに、パワー半導体は、ウォータージャケット冷却システムに適合する熱性能を最適化できる。すなわち、安い部材(寸法公差を緩和部材)が使用でき、パワー半導体のパッケージ厚さを均一にできる。
Furthermore, power semiconductors can be optimized for thermal performance to suit water jacket cooling systems, which means cheaper materials (materials with relaxed dimensional tolerances) can be used and the package thickness of the power semiconductors can be made uniform.

本発明の実施例1に係る両面冷却パワーモジュールの製造方法を説明する(1)(2)図である。1A and 1B are diagrams illustrating a method for manufacturing a double-sided cooled power module according to a first embodiment of the present invention; 本発明の実施例1に係る両面冷却パワーモジュールの製造方法を説明する(3)(4)図である。3A and 3B are diagrams illustrating a method for manufacturing a double-sided cooled power module according to the first embodiment of the present invention. 本発明の実施例1に係る両面冷却パワーモジュールの概略断面である。1 is a schematic cross-sectional view of a double-sided cooled power module according to a first embodiment of the present invention.

以下、本発明を実施するための形態について、図を参照して詳細に説明する。ただし、本発明は以下の記載に何ら限定されるものではない。
Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings. However, the present invention is not limited to the following description in any way.

本発明の実施例1に係る両面冷却パワーモジュールの製造方法を図1で説明する。図1(1)~(2)、図2(3)~(4)は、製造の状態を示した断面略図である。すなわち緩衝接着剤層を構築する組み立てプロセスフローを示している。
The manufacturing method of the double-sided cooling power module according to the first embodiment of the present invention is explained with reference to Fig. 1. Fig. 1 (1)-(2) and Fig. 2 (3)-(4) are schematic cross-sectional views showing the manufacturing process, i.e., the assembly process flow for constructing the buffer adhesive layer.

図1(1)は、第一の基板1上に第一の接合材5を接合し予備乾燥させた後、電子部品を搭載し接合する第一の接合工程である。ここで電子部品は、スペーサ3上に、ダイ4を第三の接合材6を用いて接合したのである。
1(1) shows a first bonding process in which a first bonding material 5 is bonded onto a first substrate 1 and pre-dried, and then an electronic component is mounted and bonded. Here, the electronic component is a die 4 bonded onto a spacer 3 using a third bonding material 6.

第一の基板1は、絶縁基板が使用でき、例えば、一方に回路パターンが配置されたDBC基板やTPC基板とすることができる。スペーサ3は、導電性金属板であり、Cuとすることができる。ダイ4は、半導体チップであり、Siの他、SiC、GaNのとすることができる。
The first substrate 1 can be an insulating substrate, for example, a DBC substrate or a TPC substrate with a circuit pattern arranged on one side. The spacer 3 is a conductive metal plate and can be Cu. The die 4 is a semiconductor chip and can be Si, SiC, or GaN.

第一の接合材5と第三の接合材6とは同様な焼結材である。焼結材を用いた接合は、通常焼結材を塗布し、予備乾燥後に接合対象物を加圧加熱し接合するものである。また、予備乾燥することによって、接合材の形状が平坦に保てる。
The first bonding material 5 and the third bonding material 6 are similar sintered materials. In bonding using a sintered material, the sintered material is usually applied, pre-dried, and then pressurized and heated to bond the objects to be bonded. Pre-drying also keeps the shape of the bonding material flat.

図1(2)は、第二の基板2上に第二の接合材7を接合する第二の接合工程である。ここでは、第二の基板2は、第一の基板1と同様な絶縁基板が使用できる。第二の接合材7は、第一の接合材5、第三の接合材6とは同様な焼結材であり、ペースト状材料を印刷して基板に塗布する方法で製造することができ、予備乾燥プロセスを用いない状態を保つ。
1 (2) shows a second bonding process in which a second bonding material 7 is bonded onto a second substrate 2. Here, the second substrate 2 can be an insulating substrate similar to the first substrate 1. The second bonding material 7 is a sintered material similar to the first bonding material 5 and the third bonding material 6, and can be manufactured by printing a paste-like material and applying it to the substrate, without using a pre-drying process.

図1(3)は、第一の基板1に接合された電子部品(スペーサ3とダイ4)と第二の基板2に接合された第二の接合材7を向かい合わせて接合する第三の接合工程である。
FIG. 1(3) shows a third bonding process in which the electronic components (spacer 3 and die 4) bonded to the first substrate 1 and the second bonding material 7 bonded to the second substrate 2 are bonded face to face.

各接合材は焼結結合層となるが、第一の接合材5、第三の接合材6は、予備乾燥するので、硬化し平坦な形状を保つことができる。また。第二の接合材7は、予備乾燥しないので、軟化した状態を保っている。
Each bonding material becomes a sintered bond layer, but the first bonding material 5 and the third bonding material 6 are pre-dried, so they harden and can maintain a flat shape. The second bonding material 7 is not pre-dried, so it maintains a softened state.

図1(4)は、前述の第三の接合工程で形成された基板をリフロー下治具8に入れ、リフロー上治具9を覆いかぶせる。第一の基板1と第二の基板2との間に内側から特殊金属治具10を用いて、テンションを加える。そして、加熱し接合する第四の接合工程である。
1(4), the substrates formed in the third bonding process are placed in a lower reflow jig 8, and then covered with an upper reflow jig 9. A special metal jig 10 is used to apply tension from the inside between the first substrate 1 and the second substrate 2. Then, in the fourth bonding process, the substrates are heated and bonded.

図3は、前述の第四の接合工程後にリフロー治具から取り出した状態である。通常、基板間をモールド樹脂により樹脂成形をして両面冷却パワーモジュールが完成する。ここでは、モールド樹脂、外部導出端子は先行技術に見られるようなものであり、図示を省略している。
Fig. 3 shows the state after removal from the reflow jig after the fourth bonding step described above. Usually, the double-sided cooling power module is completed by molding the space between the boards with a molded resin. Here, the molded resin and the external lead-out terminals are the same as those seen in the prior art, and are therefore not shown.

ここで、第二の接合材7は、軟化した状態で接合されると、押しつぶされフィレット形状となり、緩衝接合層(バッファー接着層)となる。
Here, when the second bonding material 7 is bonded in a softened state, it is crushed into a fillet shape and becomes a buffer bonding layer (buffer adhesive layer).

すなわち、第二の接合材7は、バッファーとしての予備乾燥されていない軟化状態の接着層を使用することにより、スペーサ3やダイ4の厚さばらつきが大きい場合でも、その寸法をバッファーとして吸収し、目標モジュールの厚さH(図3)を維持することが可能である。
In other words, by using a softened adhesive layer that has not been pre-dried as a buffer, the second bonding material 7 can absorb the dimensions as a buffer and maintain the target module thickness H (Figure 3) even if there is a large variation in the thickness of the spacer 3 or die 4.

スペーサやダイが複数の場合であっても、積み重ねた高さを補正することができる。また、スペーサやダイの積層順番が任意の場合であっても同様である。
Even when there are a plurality of spacers or dies, the stacking height can be corrected. This also applies when the stacking order of the spacers or dies is arbitrary.

完成した両面冷却パワーモジュールの樹脂分解と断面分析により、他のパワー半導体モジュールの積層構造とは、フィレット形状が異なることが確認できる。
Resin decomposition and cross-sectional analysis of the completed double-sided cooled power module confirmed that the fillet shape was different from the laminated structure of other power semiconductor modules.

従来のリフロー治具の場合、ロケーションガイドブロックと言われ、上下治具で挟み込む構造である。そのため、パワーモジュールの最大高さは制御できるが、最小高さを制御するのは困難である。
Conventional reflow jigs are called location guide blocks and have a structure in which the power module is sandwiched between upper and lower jigs. Therefore, although the maximum height of the power module can be controlled, it is difficult to control the minimum height.

そのため、本発明は、特殊金属治具10は、リフロー下治具8とリフロー上治具9を組み合わせ、基板内側から基板をリフロー下治具8、リフロー上治具9の内壁に押し付けるように、特殊金属治具10をそれぞれの基板内側に挿入し、テンションをかけて使用し、ダイ4の下の流動可能な最後の接着層である第二の接合材7を使用して、緩衝接合層(バッファー接着層)とすることにより、積層厚さHを補正することにより、一定の高さに制御できる。
Therefore, in the present invention, the special metal jig 10 is used by combining the lower reflow jig 8 and the upper reflow jig 9, inserting the special metal jig 10 into the inside of each board so as to press the board against the inner walls of the lower reflow jig 8 and the upper reflow jig 9 from the inside of the board, and applying tension, and by using the second bonding material 7, which is the last flowable adhesive layer under the die 4, as a buffer bonding layer (buffer adhesive layer), the stack thickness H can be corrected to control it to a constant height.

両面冷却パワーモジュールを一定の高さに制御できれば、の積層する部材の厚さのばらつきに左右されず、ユニットや機器に組み込む場合、ヒートシンク(ウォータージャケット)との間に隙間ができず、十分に接触できるため高い熱性能を維持できる。
If the double-sided cooled power module can be controlled to a constant height, it will not be affected by variations in the thickness of the laminated components, and when it is incorporated into a unit or device, there will be no gaps between it and the heat sink (water jacket), and sufficient contact will be achieved, allowing high thermal performance to be maintained.

電子部品は、ひとつでも複数でもよく、スペーサ3とダイ4の組み合わせや積層順番は自由に変えてもよい。
The number of electronic components may be one or more, and the combination of the spacers 3 and the dies 4 and the order of stacking may be freely changed.

また、第二の接合材は、「基板とダイ」の他、「ダイとスペーサ」、または「スペーサと基板」の間に配置してもよい。その効果は同じである。
The second bonding material may be disposed between the "substrate and die", the "die and spacer", or the "spacer and substrate", with the same effect.

また、スペーサは、Cuの他、Cu / Moなどが適用することができる。
Moreover, the spacer may be made of Cu, Cu/Mo, or the like.

また、厚さのばらつきが補正されていれば、予備乾燥前の接合材はテープやペーストタイプを使用することができる。
Furthermore, if the thickness variation is corrected, the bonding material before pre-drying can be of tape or paste type.

1、第一の基板
2、第二の基板
3、スペーサ
4、ダイ(チップ)
5、第一の接合材
6、第三の接合材
7、第二の接合材(緩衝接合層)
8、リフロー下治具
9、リフロー上治具
10、特殊金属治具
11、パワーモジュール
1, first substrate 2, second substrate 3, spacer 4, die (chip)
5: First bonding material 6: Third bonding material 7: Second bonding material (buffer bonding layer)
8, lower reflow jig 9, upper reflow jig 10, special metal jig 11, power module

Claims (4)

第一の基板上に第一の接合材を接合し予備乾燥させた後、電子部品を搭載し接合する第一の接合工程と、第二の基板上に第二の接合材を接合する第二の接合工程と、前記第一の基板に接合された前記電子部品と前記第二の基板に接合された前記第二の接合材を向かい合わせて接合する第三の接合工程と、前記第一の基板と前記第二の基板との間にテンションを加え、加熱し接合する第四の接合工程とからなる両面冷却パワーモジュールの製造方法。 A method for manufacturing a double-sided cooled power module, comprising a first bonding process in which a first bonding material is bonded onto a first substrate and pre-dried, followed by mounting and bonding of electronic components; a second bonding process in which a second bonding material is bonded onto a second substrate; a third bonding process in which the electronic components bonded to the first substrate and the second bonding material bonded to the second substrate are bonded face-to-face; and a fourth bonding process in which tension is applied between the first substrate and the second substrate, and the substrates are heated and bonded. 前記第一の接合材ないし前記第二の接合材は、焼結材料であり、銀、銅、酸化銀、および酸化銅からなり少なくとも一種を含み、ペースト状態、または、テープ状態からなることを特徴とする請求項1に記載の両面冷却パワーモジュールの製造方法。 The method for manufacturing a double-sided cooled power module according to claim 1, characterized in that the first bonding material or the second bonding material is a sintered material, contains at least one of silver, copper, silver oxide, and copper oxide, and is in a paste or tape state. 前記電子部品は、半導体チップ、スペーサまたは、それらの組み合わせSiの他、SiC、GaNからなることを特徴とする請求項1ないし請求項2に記載の両面冷却パワーモジュールの製造方法。 The method for manufacturing a double-sided cooled power module according to claims 1 and 2, characterized in that the electronic components are made of semiconductor chips, spacers, or a combination thereof, Si, SiC, or GaN. 前記第一の基板と前記第二の基板は、DBC(Direct Bonded Copper)基板からなることを特徴とする請求項1ないし請求項3に記載の両面冷却パワーモジュールの製造方法。 The method for manufacturing a double-sided cooled power module according to any one of claims 1 to 3, characterized in that the first substrate and the second substrate are made of DBC (Direct Bonded Copper) substrates.
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