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JP7645702B2 - Connection failure detection circuit - Google Patents
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JP7645702B2 - Connection failure detection circuit - Google Patents

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JP7645702B2
JP7645702B2 JP2021076685A JP2021076685A JP7645702B2 JP 7645702 B2 JP7645702 B2 JP 7645702B2 JP 2021076685 A JP2021076685 A JP 2021076685A JP 2021076685 A JP2021076685 A JP 2021076685A JP 7645702 B2 JP7645702 B2 JP 7645702B2
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JP2022170510A (en
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智晴 鈴木
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Kawamura Electric Inc
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Description

本発明は、端子部等の電路接続部の接続不良を検出する接続不良検出回路に関する。 The present invention relates to a connection failure detection circuit that detects connection failures in electrical circuit connections such as terminals.

電源を供給する電線や導体バー等を接続する電路接続部では、ネジの緩み、プラグの緩み等により接続不良が発生することがある。配電機器や電力機器等の比較的大電流を通電する電路においてこのような接続不良が発生すると、接触抵抗の増大により発熱して接続部が劣化するし、更にはアーク放電が発生して最悪火災に至る場合がある。
そのため、これを回避するために接続不良の発生を検出する回路がある。例えば、特許文献1に開示された技術は、端子間の電位差でオン動作するようフォトカプラを配置して、このフォトカプラのオン動作により接続不良を検知させた。
In electrical circuit connections that connect electric wires and conductor bars that supply power, connection failures can occur due to loose screws, plugs, etc. If such connection failure occurs in electrical circuits that carry relatively large currents, such as in power distribution equipment and power equipment, the increased contact resistance can cause heat generation and deterioration of the connection, and even arc discharge can occur, which can lead to a fire in the worst case scenario.
Therefore, in order to avoid this, there are circuits that detect the occurrence of a connection failure. For example, the technology disclosed in Patent Document 1 arranges a photocoupler so that it turns on when there is a potential difference between terminals, and detects a connection failure by the turning on of this photocoupler.

特開2009-145083号公報JP 2009-145083 A

しかしながら、上記特許文献1の技術は、端子間に発生する電位差がフォトカプラ等のダイオード素子の順方向電圧に依存する構成であるため、この順方向電圧に達しなければ検知できなかった。 However, in the technology of Patent Document 1, the potential difference generated between the terminals depends on the forward voltage of a diode element such as a photocoupler, and therefore cannot be detected unless this forward voltage is reached.

そこで、本発明はこのような問題点に鑑み、発生する電圧がダイオード素子の順方向電圧に達しない小さな電圧であっても、電路接続部の接続不良を検知できる接続不良検出回路を提供することを目的としている。 In view of these problems, the present invention aims to provide a connection failure detection circuit that can detect connection failures in electrical circuit connections even when the generated voltage is small enough not to reach the forward voltage of the diode element.

上記課題を解決する為に、請求項1の発明は、電路に設けられた電路接続部の接続不良を検出する接続不良検出回路であって、電路接続部は、電源側電路が接続される電源側端子と、負荷側電路が接続される負荷側端子とが連結されて成り、電源側端子と負荷側端子との間に電位差が発生したら、それを検出する電位差検出回路と、電位差検出回路が電位差を検出したら、接続不良発生信号を出力する出力回路とを有し、電路に接続された電源が三相交流電源であって、電路は3本或いは4本の電線で構成され、任意の1本の電線の電路接続部の接続不良を検出する電位差検出回路及び出力回路の電源が、他の全ての電線から入手した交流電源であることを特徴とする。
この構成によれば、出力回路が接続不良発生と判断する閾値は、ダイオード等の一定の駆動電圧が必要な素子を使用して設定されないため、電路接続部に発生した電位差がダイオードの順方向電圧より小さくても、それを検出して接続不良発生信号を出力させることが可能である。よって、接続不良の検出を高感度に実施できる。
In order to solve the above problem, the invention of claim 1 is a connection failure detection circuit that detects a connection failure at an electric circuit connection portion provided in an electric circuit, the electric circuit connection portion being formed by connecting a power supply side terminal to which a power supply side electric circuit is connected and a load side terminal to which a load side electric circuit is connected, and having a potential difference detection circuit that detects a potential difference when it occurs between the power supply side terminal and the load side terminal, and an output circuit that outputs a connection failure occurrence signal when the potential difference detection circuit detects the potential difference, characterized in that the power source connected to the electric circuit is a three-phase AC power source, the electric circuit is composed of three or four electric wires, and the power source of the potential difference detection circuit and the output circuit that detects a connection failure at the electric circuit connection portion of any one electric wire is an AC power source obtained from all the other electric wires .
According to this configuration, the threshold value at which the output circuit determines that a connection failure has occurred is not set using an element such as a diode that requires a certain drive voltage, so even if the potential difference occurring at the electric path connection portion is smaller than the forward voltage of the diode, it is possible to detect it and output a connection failure occurrence signal, thereby enabling detection of connection failure with high sensitivity.

加えて、電位差検出回路及び出力回路を駆動する電源は、直流電源を必要としないため、電源回路を別途設ける必要がない。 In addition, the power supply for driving the potential difference detection circuit and the output circuit does not require a DC power supply, so there is no need to provide a separate power supply circuit.

請求項の発明は、請求項に記載の構成において、電位差検出回路は、NPNトランジスタから成る第1及び第2の2つのトランジスタを使用したカレントミラー回路で構成され、第2トランジスタのエミッタが負荷側端子に接続されると共に、第1トランジスタのエミッタが電源側端子に接続されていることを特徴とする。
この構成によれば、カレントミラー回路を構成する2つのトランジスタのエミッタ電圧差で接続不良を検出するため、簡易な回路で且つ高感度で検出できる。
The invention of claim 2 is characterized in that, in the configuration described in claim 1 , the potential difference detection circuit is composed of a current mirror circuit using two transistors, first and second NPN transistors, and the emitter of the second transistor is connected to the load side terminal and the emitter of the first transistor is connected to the power supply side terminal.
According to this configuration, since a connection failure is detected based on the emitter voltage difference between two transistors that constitute a current mirror circuit, it can be detected with high sensitivity using a simple circuit.

請求項3の発明は、請求項2に記載の構成において、カレントミラー回路は、第2トランジスタに代えてダイオードが使用され、ダイオードのカソードが前記負荷側端子に接続されていることを特徴とする。 The present invention according to claim 3 is characterized in that in the configuration according to claim 2, the current mirror circuit uses a diode instead of the second transistor, and the cathode of the diode is connected to the load side terminal.

請求項の発明は、請求項2又は3に記載の構成において、出力回路は、PNPトランジスタを有し、そのベースがカレントミラー回路の第1トランジスタのコレクタに接続され、PNPトランジスタのコレクタが接続不良発生信号の出力部であることを特徴とする。
この構成によれば、出力回路は1つのトランジスタで構成されるため、簡易な回路で構成できる。
The invention of claim 4 is characterized in that, in the configuration of claim 2 or 3 , the output circuit has a PNP transistor, the base of which is connected to the collector of the first transistor of the current mirror circuit, and the collector of the PNP transistor is an output part for the connection failure occurrence signal.
According to this configuration, the output circuit is made up of a single transistor, and therefore can be made up of a simple circuit.

本発明によれば、出力回路が接続不良発生と判断する閾値は、ダイオード等の一定の駆動電圧が必要な素子を使用して設定されないため、電路接続部に発生した電位差がダイオードの順方向電圧より小さくても、それを検出して接続不良発生信号を出力させることが可能である。よって、接続不良の検出を高感度に実施できる。 According to the present invention, the threshold value at which the output circuit determines that a connection failure has occurred is not set using an element that requires a constant drive voltage, such as a diode, so even if the potential difference occurring at the electrical path connection is smaller than the forward voltage of the diode, it is possible to detect it and output a connection failure occurrence signal. This allows for highly sensitive detection of connection failures.

本発明に係る接続不良検出回路の一例を示す回路図であり、単相電路に設けた構成を示している。1 is a circuit diagram showing an example of a connection failure detection circuit according to the present invention, illustrating a configuration in which the circuit is provided in a single-phase electric circuit. 接続不良検出回路の他の例を示す回路図である。FIG. 13 is a circuit diagram showing another example of a connection failure detection circuit. 三相電路に設けた接続不良検出回路の回路図である。FIG. 4 is a circuit diagram of a connection failure detection circuit provided in a three-phase electric circuit.

以下、本発明を具体化した実施の形態を、図面を参照して詳細に説明する。図1は本発明に係る電路接続部の接続不良検出回路の一例を示す回路図であり、単相電路に設けた構成を示している。
検出対象の電路Lは、例えば交流100Vの単相の商用電力から成る電源10の電力を負荷11に供給する2本の電線(第1電線L1、第2電線L2)から成る単相2線式配線路であり、この電路L上に設けられた電路接続部2に接続不良が発生したらそれを検出するよう構成されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will now be described in detail with reference to the accompanying drawings, in which: FIG 1 is a circuit diagram showing an example of a circuit for detecting a connection failure in an electric circuit connection according to the present invention, and shows a configuration in which the circuit is provided in a single-phase electric circuit;
The electric circuit L to be detected is a single-phase two-wire wiring path consisting of two electric wires (a first electric wire L1 and a second electric wire L2) that supplies power from a power source 10 consisting of single-phase commercial power of, for example, 100V AC to a load 11, and is configured to detect any connection failure that occurs in an electric circuit connection part 2 provided on this electric circuit L.

電路接続部2は電源側電路接続された電源側端子2aと、負荷側電路が接続された負荷側端子2bとを有し、2線からなる電路Lのそれぞれの電線L1,L2に電源側端子2aと負荷側端子2bが設けられている。
この電源側端子2aと負荷側端子2bとは、正常な状態では接触抵抗が無いか殆ど無い状態で連結されているが、接続不良が発生すると、この端子間の接触抵抗が増大して電路電流に比例する電圧降下が発生する。図1に示すrはこの接触抵抗を示している。
尚、図1に示す複数の矢印Aは、接続不良検出回路1が動作する際の電流の流れを示し、交流である電源10の一方の極性となる半波の中で動作する。また、R1~R5は抵抗素子である。また、電路接続部2は、具体的にネジ締めの端子部、速結端子、プラグとコンセントの接続部等である。
The electrical circuit connection portion 2 has a power supply side terminal 2a connected to the power supply side electrical circuit and a load side terminal 2b connected to the load side electrical circuit, and the power supply side terminal 2a and the load side terminal 2b are provided on each of the electric wires L1, L2 of the two-wire electrical circuit L.
The power supply terminal 2a and the load terminal 2b are connected with little or no contact resistance under normal conditions, but if a connection failure occurs, the contact resistance between the terminals increases, causing a voltage drop proportional to the current in the circuit. The r in Figure 1 indicates this contact resistance.
1 indicate the flow of current when the connection failure detection circuit 1 operates, and operates during a half-wave of one polarity of the AC power source 10. R1 to R5 are resistive elements. The electrical path connection portion 2 is specifically a screw-fastened terminal portion, a quick-connect terminal, a connection portion between a plug and an outlet, or the like.

接続不良検出回路1は、電位差検出回路4と、出力回路5とで構成され、ここでは第2電線L2の電路接続部2の接続不良を検出する構成を示している。尚、第1電線L1の電路接続部2の接続不良を検出する接続不良検出回路も別途設けられているが、ここでは省略している。
電位差検出回路4は、電路接続部2の接触抵抗rに起因して発生する電位差を検出する回路であり、基準電圧として電源側端子2aの電圧が入力される第1端子部4aと、負荷側端子2bの電圧が入力される第2端子部4bと、信号(電位差検出信号)を出力する第3端子部4cと、電源10に接続される第4端子部4dとを有している。
The connection failure detection circuit 1 is composed of a potential difference detection circuit 4 and an output circuit 5, and is configured to detect a connection failure in the electric path connection portion 2 of the second electric wire L2. Note that a connection failure detection circuit for detecting a connection failure in the electric path connection portion 2 of the first electric wire L1 is also provided separately, but is omitted here.
The potential difference detection circuit 4 is a circuit that detects a potential difference generated due to the contact resistance r of the electrical path connection portion 2, and has a first terminal portion 4a to which the voltage of the power supply side terminal 2a is input as a reference voltage, a second terminal portion 4b to which the voltage of the load side terminal 2b is input, a third terminal portion 4c that outputs a signal (potential difference detection signal), and a fourth terminal portion 4d that is connected to the power supply 10.

出力回路5は、電位差検出回路4が出力する電位差検出信号が入力される(第3端子部4cと接続される)第5端子部5aと、基準電圧を入力する第6端子部5bと、信号(接続不良発生信号)を出力する第7端子部5cと、電源10に接続される第8端子部5dとを有している。 The output circuit 5 has a fifth terminal 5a (connected to the third terminal 4c) to which the potential difference detection signal output by the potential difference detection circuit 4 is input, a sixth terminal 5b to which a reference voltage is input, a seventh terminal 5c to which a signal (a connection failure occurrence signal) is output, and an eighth terminal 5d to which a power source 10 is connected.

そして、この接続不良検出回路1を駆動するための電源は、電源線L4が接続不良を検出する第2電線L2とは対を成す反対側の第1電線L1に接続されて、反対側から供給される。電源線L4に設けられたダイオードD1は逆流防止のためのものである。 The power supply for driving this connection failure detection circuit 1 is supplied from the opposite side, with the power supply line L4 connected to the first wire L1, which is the opposite side of the second wire L2 that detects connection failures. The diode D1 provided on the power supply line L4 is for preventing backflow.

電位差検出回路4は、具体的に第1トランジスタT1と第2トランジスタT2とで構成されたカレントミラー回路を備えている。両トランジスタT1,T2ともNPNトランジスタであり、例えばモノリシック・デュアルタイプのものが使用され、同一特性になるよう構成されている。そして、第1トランジスタT1のエミッタが第1端子部4aに接続され、コレクタが第3端子部4cに接続されている。また、第2トランジスタT2のエミッタが第2端子部4bに接続されている。両トランジスタT1,T2のコレクタは、それぞれ抵抗素子R1,R2を介して第4端子部4dに接続されている。
尚、第2トランジスタT2のコレクタは共通するベースに接続されている。
Specifically, the potential difference detection circuit 4 includes a current mirror circuit composed of a first transistor T1 and a second transistor T2. Both transistors T1 and T2 are NPN transistors, and are, for example, monolithic dual type transistors, and are configured to have the same characteristics. The emitter of the first transistor T1 is connected to the first terminal 4a, and the collector is connected to the third terminal 4c. The emitter of the second transistor T2 is connected to the second terminal 4b. The collectors of both transistors T1 and T2 are connected to the fourth terminal 4d via resistor elements R1 and R2, respectively.
The collector of the second transistor T2 is connected to the common base.

出力回路5は、PNPトランジスタからなる第3トランジスタT3を備えて構成され、そのベースが第5端子部5aに接続され、コレクタが第6端子部5bに接続され、エミッタが第8端子部5dに接続されている。そして、コレクタに第7端子部5cが設けられている。尚、第6端子部5bと第7端子部5cとの間に配置された抵抗素子R5は負荷抵抗として作用する。 The output circuit 5 is configured with a third transistor T3 made of a PNP transistor, the base of which is connected to the fifth terminal 5a, the collector of which is connected to the sixth terminal 5b, and the emitter of which is connected to the eighth terminal 5d. The seventh terminal 5c is provided at the collector. The resistive element R5 disposed between the sixth terminal 5b and the seventh terminal 5c acts as a load resistor.

このように構成された接続不良検出回路1の動作は以下のようである。電路接続部2に接触抵抗rが無いか非常に小さい正常な接続状態では、第1トランジスタT1及び第2トランジスタT2のエミッタ電位はほぼ同一であるため、オン状態の両トランジスタT1,T2にはほぼ同一の電流が流れる。この状態では、第3トランジスタT3はオンしないよう抵抗素子R1,R2は設定されている。この結果、第3トランジスタT3はオンせず、異常発生信号は出力されない。 The operation of the connection failure detection circuit 1 configured in this manner is as follows. In a normal connection state where the electrical path connection portion 2 has no or very small contact resistance r, the emitter potentials of the first transistor T1 and the second transistor T2 are approximately the same, so approximately the same current flows through both transistors T1 and T2 in the on state. In this state, the resistance elements R1 and R2 are set so that the third transistor T3 does not turn on. As a result, the third transistor T3 does not turn on, and no abnormality occurrence signal is output.

ところが、電路接続部2に接続不良が発生して接触抵抗rが大きくなると、電源側端子2aと負荷側端子2bの間に電圧降下が生ずる。この結果、電源側端子2aを基準にすると、第1トランジスタT1のエミッタ電位に対して、第2トランジスタT2のエミッタ電位が上昇する。すると、第2トランジスタT2のベース電位が上昇するため、連結されている第1トランジスタT1のベース電位が上昇し、第1トランジスタT1のコレクタ電流が増加する。
この電流増加の結果、抵抗素子R1の電圧降下が大きくなり、第3トランジスタT3のベース電位が低下し、第3トランジスタT3がオンする。
こうして、第7端子部5cの電位が上昇して、接続不良発生信号が出力される。
However, if a connection failure occurs in the electric path connection portion 2 and the contact resistance r increases, a voltage drop occurs between the power supply terminal 2a and the load terminal 2b. As a result, the emitter potential of the second transistor T2 rises relative to the emitter potential of the first transistor T1, taking the power supply terminal 2a as the reference. Then, the base potential of the second transistor T2 rises, so the base potential of the connected first transistor T1 rises, and the collector current of the first transistor T1 increases.
As a result of this increase in current, the voltage drop across the resistor R1 increases, the base potential of the third transistor T3 decreases, and the third transistor T3 turns on.
Thus, the potential of the seventh terminal 5c rises, and a connection failure occurrence signal is output.

このように、出力回路5が接続不良発生と判断する閾値はダイオード等の一定の駆動電圧が必要な素子を使用して設定されないため、電路接続部2に発生した電位差がダイオードの順方向電圧より小さくてもそれを検出して接続不良発生信号を出力させることが可能である。よって、接続不良の検出を高感度に実施できる。
また、電位差検出回路4及び出力回路5を駆動する電源は、反対極の電線から入手した交流電源であるため、直流電源を必要とせず電源回路を別途設ける必要がない。
更に、カレントミラー回路を構成する2つのトランジスタT1,T2のエミッタ電圧差で接続不良を検出するため、簡易な回路で且つ高感度で検出できる。
加えて、出力回路5は1つのトランジスタT3で構成されるため、簡易な回路で構成できる。
In this way, the threshold value at which the output circuit 5 determines that a connection failure has occurred is not set using an element such as a diode that requires a constant drive voltage, so even if the potential difference occurring in the electric path connection part 2 is smaller than the forward voltage of the diode, it is possible to detect it and output a connection failure occurrence signal. Therefore, connection failure detection can be performed with high sensitivity.
Furthermore, the power source driving the potential difference detection circuit 4 and the output circuit 5 is an AC power source obtained from electric wires of opposite polarity, so that a DC power source is not required and there is no need to provide a separate power supply circuit.
Furthermore, since a connection failure is detected based on the emitter voltage difference between the two transistors T1 and T2 that form a current mirror circuit, it can be detected with high sensitivity using a simple circuit.
In addition, since the output circuit 5 is composed of one transistor T3, it can be composed of a simple circuit.

尚、接続不良検出回路1を駆動するための電源は、単相2線式の場合は、上述したように接続不良を検出する電線と反対側の電線から供されるが、単相3線式の場合は3本の電線を有する為、接続不良検出回路1の電源は、接続不良を検出する電線以外の他の2線の双方からダイオードを介して供給される。 In the case of a single-phase two-wire system, the power supply for driving the connection failure detection circuit 1 is supplied from the wire opposite the wire that detects the connection failure as described above. However, in the case of a single-phase three-wire system, since there are three wires, the power supply for the connection failure detection circuit 1 is supplied via diodes from both of the other two wires other than the wire that detects the connection failure.

図2は、接続不良検出回路1の変形例を示している。上記図1では、電位差検出回路4を2つのトランジスタT1,T2を使用したカレントミラー回路で構成しているが、図2では第2トランジスタT2に代えてダイオードD2を使用した回路を示している。ダイオードD2のカソードが負荷側端子2bに接続されている。
このように第2トランジスタT2はダイオードD2に変更しても良く、電位差検出回路4を簡易な回路にできる。尚、抵抗素子R6は、抵抗素子R2に代わる素子である。
Fig. 2 shows a modified example of the connection failure detection circuit 1. In Fig. 1, the potential difference detection circuit 4 is configured as a current mirror circuit using two transistors T1 and T2, but Fig. 2 shows a circuit using a diode D2 instead of the second transistor T2. The cathode of the diode D2 is connected to the load side terminal 2b.
In this way, the second transistor T2 may be replaced with the diode D2, which simplifies the circuitry of the potential difference detection circuit 4. The resistor element R6 is an element that replaces the resistor element R2.

尚、上記実施形態は、第1電線L1が正極の場合を説明しているが、電源10は交流であるため、正極と負極が交互に発生する。よって、第1電線L1が負極の場合は、図示しない第1電線L1側に設けた接続不良検出回路が起動することになる。
また、上記接続不良検出回路1は、圧設した端子、半田等による溶接した電路接続部に対しても接続不良検出に適用できるものである。
In the above embodiment, the first electric wire L1 is positive, but since the power source 10 is an AC power source, positive and negative poles are generated alternately. Therefore, when the first electric wire L1 is negative, a connection failure detection circuit (not shown) provided on the first electric wire L1 side is activated.
The connection failure detection circuit 1 can also be applied to detect connection failures in crimped terminals and electrical circuit connections welded with solder or the like.

また上記実施形態は、検出対象の電路が、単相2線から成る電路Lの場合を説明したが、多相の電路に対しても上記接続不良検出回路1は良子に適用でき、例えば三相電路の場合を図3に示している。
図3は三相3電源20を備えた3線式電路に設けた接続不良検出回路1の回路図を示している。この場合、電路Lが3本の電線L1~L3で構成されているため、接続不良検出回路1の駆動電源を、接続不良を検出する電線(ここでは、第2電線L2)以外の2本の電線(ここでは、第1電線L1及び第3電線L3)からダイオードD1,D3を介して入手する。このように構成することで、接続不良検出回路1を良好に動作させることができる。更に、三相4線式電路の場合は、接続不良を検出する電線以外の3本の電線からダイオードを介して接続不良検出回路1に対して交流電源が供給される。
In the above embodiment, the case where the electric circuit to be detected is an electric circuit L consisting of a single-phase two-wire has been described. However, the connection failure detection circuit 1 can also be applied to a multi-phase electric circuit. For example, the case of a three-phase electric circuit is shown in FIG. 3.
3 shows a circuit diagram of the connection failure detection circuit 1 provided in a three-wire circuit equipped with a three-phase three-wire power source 20. In this case, since the circuit L is composed of three electric wires L1 to L3, the drive power of the connection failure detection circuit 1 is obtained through diodes D1 and D3 from two electric wires (here, the first electric wire L1 and the third electric wire L3) other than the electric wire for detecting the connection failure (here, the second electric wire L2). By configuring in this way, the connection failure detection circuit 1 can be operated satisfactorily. Furthermore, in the case of a three-phase four-wire circuit, AC power is supplied to the connection failure detection circuit 1 through diodes from the three electric wires other than the electric wire for detecting the connection failure.

1・・接続不良検出回路、2・・電路接続部、2a・・電源側端子、2b・・負荷側端子、4・・電位差検出回路、5・・出力回路、10・・電源(単相交流電源)、11・・負荷、20・・三相電源(三相交流電源)、T1・・第1トランジスタ、T2・・第2トランジスタ、T3・・第3トランジスタ(PNPトランジスタ)、r・・接触抵抗、L・・電路、L1・・第1電線(電線)、L2・・第2電線(電線)、L3・・第3電線(電線)。 1: poor connection detection circuit, 2: electrical circuit connection part, 2a: power supply side terminal, 2b: load side terminal, 4: potential difference detection circuit, 5: output circuit, 10: power supply (single-phase AC power supply), 11: load, 20: three-phase power supply (three-phase AC power supply), T1: first transistor, T2: second transistor, T3: third transistor (PNP transistor), r: contact resistance, L: electrical circuit, L1: first wire (electric wire), L2: second wire (electric wire), L3: third wire (electric wire).

Claims (4)

電路に設けられた電路接続部の接続不良を検出する接続不良検出回路であって、
前記電路接続部は、電源側電路が接続される電源側端子と、負荷側電路が接続される負荷側端子とが連結されて成り、
前記電源側端子と前記負荷側端子との間に電位差が発生したら、それを検出する電位差検出回路と、
前記電位差検出回路が電位差を検出したら、接続不良発生信号を出力する出力回路とを有し、
前記電路に接続された電源が三相交流電源であって、前記電路は3本或いは4本の電線で構成され、
任意の1本の前記電線の前記電路接続部の接続不良を検出する前記電位差検出回路及び前記出力回路の電源が、他の全ての前記電線から入手した交流電源であることを特徴とする接続不良検出回路。
A connection failure detection circuit for detecting a connection failure of an electric path connection portion provided in an electric path,
The electric circuit connection portion is configured by connecting a power supply side terminal to which a power supply side electric circuit is connected and a load side terminal to which a load side electric circuit is connected,
a potential difference detection circuit that detects a potential difference between the power supply terminal and the load terminal when the potential difference occurs;
an output circuit that outputs a connection failure occurrence signal when the potential difference detection circuit detects a potential difference ;
The power source connected to the electric circuit is a three-phase AC power source, and the electric circuit is composed of three or four electric wires;
A connection failure detection circuit, characterized in that the power source of the potential difference detection circuit and the output circuit, which detect a connection failure of the electrical path connection portion of any one of the electric wires, is an AC power source obtained from all other electric wires .
前記電位差検出回路は、NPNトランジスタから成る第1及び第2の2つのトランジスタを使用したカレントミラー回路で構成され、前記第2トランジスタのエミッタが前記負荷側端子に接続されると共に、前記第1トランジスタのエミッタが前記電源側端子に接続されていることを特徴とする請求項記載の接続不良検出回路。 2. The connection failure detection circuit according to claim 1, wherein the potential difference detection circuit is configured as a current mirror circuit using two transistors, first and second NPN transistors, the emitter of the second transistor being connected to the load side terminal and the emitter of the first transistor being connected to the power supply side terminal. 前記カレントミラー回路は、第2トランジスタに代えてダイオードが使用され、前記ダイオードのカソードが前記負荷側端子に接続されていることを特徴とする請求項2記載の接続不良検出回路。 3. The connection failure detection circuit according to claim 2, wherein the current mirror circuit uses a diode instead of the second transistor, and the cathode of the diode is connected to the load side terminal. 前記出力回路は、PNPトランジスタを有し、そのベースが前記カレントミラー回路の前記第1トランジスタのコレクタに接続され、前記PNPトランジスタのコレクタが接続不良発生信号の出力部であることを特徴とする請求項2又は3記載の接続不良検出回路。 4. The connection failure detection circuit according to claim 2, wherein the output circuit has a PNP transistor, the base of which is connected to the collector of the first transistor of the current mirror circuit, and the collector of the PNP transistor is an output section for a connection failure occurrence signal.
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Citations (4)

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Publication number Priority date Publication date Assignee Title
JP2003315378A (en) 2002-04-23 2003-11-06 Matsushita Electric Works Ltd Current detector
JP2009145083A (en) 2007-12-11 2009-07-02 Kawamura Electric Inc Connection failure detection circuit at the circuit connection
JP2010176988A (en) 2009-01-28 2010-08-12 Kawamura Electric Inc Circuit breaker
JP2010256102A (en) 2009-04-23 2010-11-11 Kawaden Corp Wiring connection inspection method and inspection device for integrated watt-hour meter

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003315378A (en) 2002-04-23 2003-11-06 Matsushita Electric Works Ltd Current detector
JP2009145083A (en) 2007-12-11 2009-07-02 Kawamura Electric Inc Connection failure detection circuit at the circuit connection
JP2010176988A (en) 2009-01-28 2010-08-12 Kawamura Electric Inc Circuit breaker
JP2010256102A (en) 2009-04-23 2010-11-11 Kawaden Corp Wiring connection inspection method and inspection device for integrated watt-hour meter

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