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JP7713893B2 - Main circuit conductors and switches - Google Patents
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JP7713893B2 - Main circuit conductors and switches - Google Patents

Main circuit conductors and switches

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Publication number
JP7713893B2
JP7713893B2 JP2022000621A JP2022000621A JP7713893B2 JP 7713893 B2 JP7713893 B2 JP 7713893B2 JP 2022000621 A JP2022000621 A JP 2022000621A JP 2022000621 A JP2022000621 A JP 2022000621A JP 7713893 B2 JP7713893 B2 JP 7713893B2
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Prior art keywords
contact
current
carrying conductor
main circuit
contacts
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JP2022000621A
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JP2023100148A (en
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淳 中川
遼 熊谷
真一 千種
吏 阿部
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Priority to JP2022000621A priority Critical patent/JP7713893B2/en
Priority to CN202211458235.6A priority patent/CN116403839A/en
Publication of JP2023100148A publication Critical patent/JP2023100148A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/58Electric connections to or between contacts; Terminals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/06Contacts characterised by the shape or structure of the contact-making surface, e.g. grooved

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Contacts (AREA)
  • Powder Metallurgy (AREA)
  • Manufacture Of Switches (AREA)
  • Breakers (AREA)

Description

本開示は、通電用導体に接点がかしめられる構造を有する主回路導体および開閉器に関する。 This disclosure relates to a main circuit conductor and a switch having a structure in which contacts are crimped to a current-carrying conductor.

電磁開閉器または回路遮断器などの開閉器の固定側接点導体または可動側接点導体を構成する主回路導体は、通電用導体と、通電用導体に固定される接点とを備える。これらの接点には、銀合金が使用されることが多い。例えば、Ag-WC-Gr系の焼結接点、Ag-In-SnO系の溶解接点などが銀合金の接点として用いられ、これらを定格電流または遮断容量によって使い分けている。また、接点と通電用導体との接合方法についても、リベット形状の接点を通電用導体にかしめ接合するもの、ロウ材により通電用導体と接点との接合を行うものなどがあるが、かしめ接合のほうが低コストであるので、コスト的に有利である。 The main circuit conductor constituting the fixed contact conductor or the movable contact conductor of a switch such as an electromagnetic switch or a circuit breaker includes a current-carrying conductor and a contact fixed to the current-carrying conductor. Silver alloys are often used for these contacts. For example, Ag-WC-Gr sintered contacts and Ag-In 2 O 3 -SnO 2 molten contacts are used as silver alloy contacts, and these are used according to the rated current or the breaking capacity. In addition, there are methods for joining the contacts and the current-carrying conductor, such as a method of crimping a rivet-shaped contact to the current-carrying conductor and a method of joining the current-carrying conductor and the contact with a brazing material, but crimping is more cost-effective and therefore more advantageous.

特許文献1には、リベット形状の台金へのかしめ固定構造が示されている。 Patent Document 1 shows a structure for fastening a rivet-shaped base metal by crimping.

特開平10-223076号公報Japanese Patent Application Publication No. 10-223076

かしめ接合は、コスト的に有利であるが、接点の種類によっては、クラックが入るか、あるいは変形が大きくなるという問題がある。例えば、リベット形状の焼結接点を通電用導体にかしめると、焼結接点にクラックが入るか、あるいは変形が大きくなる。このような接点では、無負荷耐久試験のような数千回におよぶ衝撃を加えると接点に欠けが生じる、または接点が脱落しやすくなるといった長期信頼性に欠ける問題が発生する。また、変形が大きいと、電気用品安全法で定められている銀接点の厚さ0.5mm以上の要件を守れないという問題もある。 Crimping is advantageous in terms of cost, but there are problems with the occurrence of cracks or large deformation depending on the type of contact. For example, when a rivet-shaped sintered contact is crimped to a current-carrying conductor, the sintered contact will crack or become large in deformation. With such contacts, when subjected to thousands of impacts such as in a no-load endurance test, the contacts will chip or become easily detached, resulting in a lack of long-term reliability. In addition, if deformation is large, there is also the problem that the requirement that silver contacts be 0.5 mm or more thick as stipulated by the Electrical Appliance and Material Safety Act cannot be met.

本開示は、上記に鑑みてなされたものであって、長期信頼性を確保することができる主回路導体を得ることを目的とする。 This disclosure was made in consideration of the above, and aims to obtain a main circuit conductor that can ensure long-term reliability.

上述した課題を解決し、目的を達成するために、本開示の主回路導体は、孔が設けられた通電用導体と、通電用導体の孔に挿入されてかしめられるリベット形状の接点と、を備える。通電用導体の厚さをtとし、接点がかしめられた後のかしめ代をdとしたとき、t×(d1.4)>2.3で、かつd+t<4.7mmを満足し、通電用導体の厚さtが薄くなると、かしめ代dが大きくなるようかしめ代dを決定することを特徴とする。 In order to solve the above problems and achieve the object, the main circuit conductor of the present disclosure includes a current-carrying conductor having a hole formed therein, and a rivet-shaped contact that is inserted into the hole of the current-carrying conductor and crimped. The main circuit conductor of the present disclosure is characterized in that, when the thickness of the current-carrying conductor is t and the crimping allowance after the contact is crimped is d, the crimping allowance d is determined so that t×( d1.4 )>2.3 and d+t<4.7 mm are satisfied, and the crimping allowance d increases as the thickness t of the current-carrying conductor becomes thinner .

本開示の主回路導体によれば、長期信頼性を確保することができるという効果を奏する。 The main circuit conductor disclosed herein has the effect of ensuring long-term reliability.

実施の形態1に係る回路遮断器のトリップ状態を示す断面図FIG. 1 is a cross-sectional view showing a tripped state of a circuit breaker according to a first embodiment; 実施の形態1に係る回路遮断器のオン状態を示す断面図FIG. 1 is a cross-sectional view showing an on-state of a circuit breaker according to a first embodiment; 実施の形態1に係るリベット形状の接点の構成を示す断面図FIG. 1 is a cross-sectional view showing a configuration of a rivet-shaped contact according to a first embodiment; 実施の形態1に係る通電用導体にリベット接点をかしめる前の状態を示す正面図FIG. 1 is a front view showing a state before a rivet contact is crimped to a current-carrying conductor according to the first embodiment; 実施の形態1に係る通電用導体にリベット接点をかしめた後の状態を示す正面図FIG. 1 is a front view showing a state after a rivet contact is crimped to a current-carrying conductor according to the first embodiment; 実施の形態1に係る通電用導体にリベット接点を適切にかしめることができなかった状態を示す正面図FIG. 1 is a front view showing a state in which the rivet contacts cannot be properly crimped to the current-carrying conductor according to the first embodiment; 実施の形態1において、通電用導体にリベット接点をかしめる試験の結果を示すグラフであり、通電用導体の厚さを横軸に、かしめ代を縦軸として、接点に発生するクラックの有無を示すグラフ1 is a graph showing the results of a test in which a rivet contact is crimped to a current-carrying conductor in the first embodiment, the graph showing the presence or absence of cracks occurring at the contact, with the thickness of the current-carrying conductor on the horizontal axis and the crimping allowance on the vertical axis. 実施の形態2に係る2点切りの回路遮断器のトリップ状態を示す断面図FIG. 11 is a cross-sectional view showing a tripped state of a double-break circuit breaker according to a second embodiment. 実施の形態3に係る電磁開閉器の構成を示す断面図FIG. 11 is a cross-sectional view showing a configuration of an electromagnetic switch according to a third embodiment.

以下に、実施の形態にかかる主回路導体および開閉器を図面に基づいて詳細に説明する。 The main circuit conductor and switch according to the embodiment are described in detail below with reference to the drawings.

実施の形態1.
図1は、実施の形態1に係る回路遮断器のトリップ状態を示す断面図である。図2は、実施の形態1に係る回路遮断器のオン状態を示す断面図である。
Embodiment 1.
Fig. 1 is a cross-sectional view showing a tripped state of the circuit breaker according to the first embodiment. Fig. 2 is a cross-sectional view showing an on-state of the circuit breaker according to the first embodiment.

図1および図2において、開閉器としての回路遮断器は、ハンドル10と、開閉機構部30と、固定側の通電用導体6と、固定側の通電用導体6に設けられた固定側接点7と、可動側の通電用導体8と、可動側の通電用導体8に設けられた可動側接点9と、を備える。開閉機構部30の構成の詳細については、本開示の要部ではないので、説明を省略する。 1 and 2, the circuit breaker as a switch includes a handle 10, a switching mechanism 30, a fixed-side current-carrying conductor 6, a fixed-side contact 7 provided on the fixed-side current-carrying conductor 6, a movable-side current-carrying conductor 8, and a movable-side contact 9 provided on the movable-side current-carrying conductor 8. Details of the configuration of the switching mechanism 30 are not essential to this disclosure, so a description thereof will be omitted.

図1,2に示すように、ハンドル10をオン操作すると、開閉機構部30が動作し、可動側の通電用導体8が回転駆動され、可動側接点9が固定側接点7に当接し、可動側の通電用導体8と固定側の通電用導体6とが導通状態となる。可動側接点9が固定側接点7に接触した瞬間に、可動側接点9と固定側接点7との投入による衝撃が可動側接点9と固定側接点7に加わる。この衝撃により、可動側接点9または固定側接点7にクラックが入っている場合、無負荷耐久試験のような数千回の衝撃によりクラックが進行し、可動側接点9または固定側接点7に欠損が発生する、または可動側接点9または固定側接点7が脱落するなどの可能性がある。 As shown in Figures 1 and 2, when the handle 10 is turned on, the opening and closing mechanism 30 operates, the movable side current conductor 8 is rotated, the movable side contact 9 abuts the fixed side contact 7, and the movable side current conductor 8 and the fixed side current conductor 6 are in a conductive state. At the moment the movable side contact 9 touches the fixed side contact 7, the movable side contact 9 and the fixed side contact 7 are subjected to an impact caused by the closing of the movable side contact 9 and the fixed side contact 7. If a crack has occurred in the movable side contact 9 or the fixed side contact 7 due to this impact, the crack may progress due to several thousand impacts such as in a no-load endurance test, causing a defect in the movable side contact 9 or the fixed side contact 7, or the movable side contact 9 or the fixed side contact 7 may fall off.

図3は、実施の形態1に係るリベット形状の接点20の構成を示す断面図である。リベット形状の接点20は、可動側接点9または固定側接点7の総称である。以下、リベット形状の接点20をリベット接点20と呼称する。図3に示すように、リベット接点20は、リベットの形状を有する台金部1と、台金部1に接合された接点2とを有する。台金部1は、ネジのない胴部1aと、胴部1aより径が大きな頭部1bとを有する。台金部1と接点2との間の境界面は、ろう付け、冷間圧接、熱間圧接などによって台金部1と接点2とが接合される接合面3を示している。 Figure 3 is a cross-sectional view showing the configuration of a rivet-shaped contact 20 according to embodiment 1. The rivet-shaped contact 20 is a general term for the movable contact 9 or the fixed contact 7. Hereinafter, the rivet-shaped contact 20 will be referred to as a rivet contact 20. As shown in Figure 3, the rivet contact 20 has a base metal part 1 having a rivet shape and a contact 2 joined to the base metal part 1. The base metal part 1 has a body part 1a without a thread and a head part 1b having a larger diameter than the body part 1a. The boundary surface between the base metal part 1 and the contact 2 shows a joint surface 3 where the base metal part 1 and the contact 2 are joined by brazing, cold pressure welding, hot pressure welding, or the like.

台金部1の材料は、例えば、銅であり、無酸素銅、タフピッチ銅などの純銅が望ましい。接点2の材料は、銀系の合金であり、例えば、Ag-WC-Gr、Ag-WC、Ag-In-SnO、Ag-SnO系である。このように、台金部1と接点2の材質には様々な種類があり、また、台金部1と接点2との接合の仕方にも様々な種類がある。 The material of the base metal part 1 is, for example, copper, and preferably pure copper such as oxygen-free copper or tough pitch copper. The material of the contact 2 is a silver-based alloy, for example, Ag-WC-Gr, Ag-WC, Ag-In 2 O 3 -SnO 2 , Ag-SnO 2 system. As described above, there are various types of materials for the base metal part 1 and the contact 2, and there are also various types of methods for joining the base metal part 1 and the contact 2.

図4は、実施の形態1に係る通電用導体5にリベット接点20をかしめる前の状態を示す正面図である。図5は、実施の形態1に係る通電用導体5にリベット接点20をかしめた後の状態を示す正面図である。通電用導体5は、固定側の通電用導体6および可動側の通電用導体8の総称である。通電用導体5とリベット接点20によって主回路導体が構成される。通電用導体5の材料は、例えば、銅、アルミニウム、鉄などである。 Figure 4 is a front view showing the state before the rivet contact 20 is crimped to the current-carrying conductor 5 according to embodiment 1. Figure 5 is a front view showing the state after the rivet contact 20 is crimped to the current-carrying conductor 5 according to embodiment 1. The current-carrying conductor 5 is a collective term for the fixed current-carrying conductor 6 and the movable current-carrying conductor 8. The current-carrying conductor 5 and the rivet contact 20 form the main circuit conductor. The material of the current-carrying conductor 5 is, for example, copper, aluminum, iron, etc.

図4に示すように、通電用導体5に設けられた貫通孔5aに、リベット接点20の台金部1の胴部1aを挿入後、通電用導体5から突出されたリベット接点20の台金部1の胴部1aの先端面1cに、ポンチ11などの工具により力を加えて、かしめを行う。 As shown in FIG. 4, after inserting the body 1a of the base metal part 1 of the rivet contact 20 into the through hole 5a provided in the current-carrying conductor 5, a force is applied to the tip surface 1c of the body 1a of the base metal part 1 of the rivet contact 20 protruding from the current-carrying conductor 5 using a tool such as a punch 11 to perform crimping.

これにより、図5に示すように、通電用導体5から突出された台金部1の胴部1aの先端部1dが変形し、かしめ接合が行われる。通電用導体5の厚さをtとし、かしめ後のリベット接点20の先端面1eから通電用導体5までの距離をdとする。以下、dをかしめ代と称す。かしめ代dは、かしめ後のリベット接点20の先端面1eが平面でない場合、先端面1eを構成する各先端点の平均位置に基づいて決定される。 As a result, as shown in FIG. 5, the tip 1d of the body 1a of the base metal part 1 protruding from the current-carrying conductor 5 is deformed, and a crimped joint is performed. The thickness of the current-carrying conductor 5 is t, and the distance from the tip surface 1e of the rivet contact 20 after crimping to the current-carrying conductor 5 is d. Hereinafter, d is referred to as the crimping allowance. If the tip surface 1e of the rivet contact 20 after crimping is not flat, the crimping allowance d is determined based on the average position of each tip point that constitutes the tip surface 1e.

図6は、実施の形態1に係る通電用導体5にリベット接点20を適切にかしめることができなかった状態を示す正面図である。図6のように、かしめ代dが長すぎると、台金部1の胴部1aの先端面1cの近傍だけが膨らむため、通電用導体5の貫通孔5aの部分が膨らまず、台金部1が通電用導体5に対し動く状態となり、適切なかしめ強度をもってリベット接点20をかしめることができない。 Figure 6 is a front view showing a state in which the rivet contact 20 cannot be properly crimped to the current-carrying conductor 5 according to embodiment 1. As shown in Figure 6, if the crimping allowance d is too long, only the vicinity of the tip surface 1c of the body 1a of the base metal portion 1 expands, so the through hole 5a of the current-carrying conductor 5 does not expand, and the base metal portion 1 moves relative to the current-carrying conductor 5, making it impossible to crimp the rivet contact 20 with the appropriate crimping strength.

図7は、実施の形態1において、通電用導体5にリベット接点20をかしめる試験の結果を示すグラフであり、通電用導体5の厚さtを横軸に、かしめ代dを縦軸として、接点2に発生するクラックの有無を示すグラフである。かしめ代dの単位はmmであり、通電用導体5の厚さtの単位はmmである。通電用導体5を銅とし、接点2をAg(85wt%)-WC(12wt%)-Gr(3wt%)とした。wt%は重量パーセントである。かしめ時は、接点2が若干膨張し、接点2の径が大きくなるが、この試験では接点2の外周を拘束せずにかしめを行った。〇印は目視で確認できる接点クラックがなしの状態を示し、×印は目視で確認できる接点クラックがあることを示している。また、白塗りの三角で示される閾値a1は、接点クラックが有りか無しかを識別するための閾値である。かしめ代dが閾値a1より小さくなると、接点クラックの発生の可能性があり、かしめ代dが閾値a1より大きくなると、接点クラックの発生の可能性がない。黒塗りの三角で示される閾値a2は、かしめ力が緩くなるか否かを判定するための閾値であり、かしめ代dが閾値a2より大きくなると、かしめ力が緩くなって適切なかしめ力を得られず、かしめ代dが閾値a2より小さな場合は、所要のかしめ力が得られる。 FIG. 7 is a graph showing the results of a test in which the rivet contact 20 is crimped to the current-carrying conductor 5 in the first embodiment. The graph shows the presence or absence of cracks occurring in the contact 2, with the thickness t of the current-carrying conductor 5 on the horizontal axis and the crimping allowance d on the vertical axis. The crimping allowance d is in mm, and the thickness t of the current-carrying conductor 5 is in mm. The current-carrying conductor 5 is copper, and the contact 2 is Ag (85 wt%)-WC (12 wt%)-Gr (3 wt%). wt% is weight percent. When crimping, the contact 2 expands slightly and the diameter of the contact 2 increases, but in this test, the crimping was performed without restraining the outer periphery of the contact 2. A circle indicates a state in which there is no contact crack that can be visually confirmed, and a cross indicates the presence of a contact crack that can be visually confirmed. The threshold value a1 indicated by a white triangle is a threshold value for identifying whether or not there is a contact crack. When the crimping allowance d is smaller than the threshold value a1, there is a possibility of contact cracks occurring, and when the crimping allowance d is larger than the threshold value a1, there is no possibility of contact cracks occurring. The threshold value a2 indicated by a black triangle is a threshold value for determining whether the crimping force will become weak or not. When the crimping allowance d is larger than the threshold value a2, the crimping force becomes weak and an appropriate crimping force cannot be obtained, and when the crimping allowance d is smaller than the threshold value a2, the required crimping force can be obtained.

図7の試験結果によれば、t×(d1.4)の値が2.3より大きい場合、すなわち下式(1)が成立する場合、接点2にクラックが発生しないことを目視で確認した。
t×(d1.4)>2.3 ・・・・・(1)
According to the test results in FIG. 7, when the value of t×(d 1.4 ) is greater than 2.3, that is, when the following formula (1) is established, it was visually confirmed that no cracks occurred in the contact 2 .
t×(d 1.4 )>2.3 (1)

この結果は、通電用導体5の厚さtが薄い場合、かしめ時の力が接点2に伝わりやすくなるため、浅く(すなわち、かしめ代dを大きく)かしめる必要があるが、通電用導体5の厚さtが厚い場合は、かしめの力が接点2に伝わりにくくなるため、深く(すなわち、かしめ代dを小さく)かしめることができることを示している。 This result shows that when the thickness t of the current-carrying conductor 5 is thin, the force during crimping is easily transmitted to the contact 2, so it is necessary to crimp it shallowly (i.e., the crimping allowance d is large); however, when the thickness t of the current-carrying conductor 5 is thick, the force is not easily transmitted to the contact 2, so it can be crimped deeply (i.e., the crimping allowance d is small).

また、閾値a2で示されるように、d+t≧4.7となると、図6に示したように、かしめの力が緩くなり、接触安定性が損なわれるため、主回路導体として使用できなくなることを示している。したがって、適切なかしめ強度を得るためには、下式(2)に示されるように、通電用導体5の厚さtとかしめ代dとの合計を4.7mmより小さくする必要がある。
d+t<4.7 ・・・・・(2)
Moreover, as shown by the threshold value a2, when d+t≧4.7, the crimping force becomes weak and the contact stability is impaired, as shown in Fig. 6, and the conductor cannot be used as a main circuit conductor. Therefore, in order to obtain an appropriate crimping strength, the sum of the thickness t of the current-carrying conductor 5 and the crimping allowance d must be less than 4.7 mm, as shown in the following formula (2).
d+t<4.7 (2)

式(1)を満足する主回路導体を回路遮断器、または電磁開閉器などの開閉器に搭載した場合、無負荷耐久試験のような数千回の衝撃にも耐えることができ、長期信頼性を確保することができる。 When a main circuit conductor that satisfies formula (1) is installed in a switch such as a circuit breaker or an electromagnetic switch, it can withstand thousands of shocks such as those in a no-load durability test, ensuring long-term reliability.

また、ビッカース硬さが160HV以下である接点の場合は、式(1)を満足しないと、リベット接点20をかしめたときに接点2が変形しやすくなり、接点2の形状によっては例えば電気用品安全法で定められている銀合金接点の場合の0.5mm以上の接点要件を満足しなくなる。 In addition, in the case of contacts with a Vickers hardness of 160 HV or less, if formula (1) is not satisfied, the contact 2 will be easily deformed when the rivet contact 20 is crimped, and depending on the shape of the contact 2, it will not satisfy the contact requirement of 0.5 mm or more for silver alloy contacts as stipulated in the Electrical Appliance and Material Safety Law.

また、焼結接点でタングステンカーバイドを含有すると、前述の銀系の合金接点と比較して、かしめの衝撃の力に対して弱く、よりクラックが入りやすくなり、式(1)の効果がより顕著に現れる。特に、タングステンカーバイドの含有量が40wt%以下である場合、式(1)を満足しないと、リベット接点20をかしめたときに接点2が変形しやすくなり、接点2の形状によっては例えば電気用品安全法で定められている銀合金接点の場合の0.5mm以上の接点要件を満足しなくなる。また、通常、焼結接点はろう付けで通電用導体に接点が接合されるが、実施の形態1では、ろう付けよりも安価なリベット形状で、通電時の温度上昇を抑制し、かつ接点の溶着性能が優れている焼結接点の特性を生かすことができる。 In addition, when sintered contacts contain tungsten carbide, they are weaker against the impact force of crimping than the above-mentioned silver-based alloy contacts, and cracks are more likely to occur, and the effect of formula (1) is more pronounced. In particular, when the tungsten carbide content is 40 wt% or less, if formula (1) is not satisfied, the contact 2 is more likely to deform when the rivet contact 20 is crimped, and depending on the shape of the contact 2, the contact requirement of 0.5 mm or more for silver alloy contacts specified in the Electrical Appliance and Material Safety Law will not be satisfied. In addition, although sintered contacts are usually joined to the current-carrying conductor by brazing, in the first embodiment, the rivet shape is less expensive than brazing, and the characteristics of sintered contacts, which suppress temperature rise during current flow and have excellent welding performance, can be utilized.

また、焼結接点でグラファイトを含有すると、前述の銀系の合金接点と比較してかしめの衝撃の力に対して弱く、よりクラックが入りやすくなり、式(1)の効果がより顕著に現れる。特に、グラファイトの含有量が2%以上の場合、より式(1)の効果が顕著に表れ、無負荷耐久試験のような数千回の衝撃にも耐えることができ、長期信頼性を確保することができる。さらに、安価なリベット形状で、通電時の温度上昇を抑制し、かつ接点の溶着性能が優れている焼結接点の特性を生かすことができる。 Furthermore, when sintered contacts contain graphite, they are weaker against the impact force of crimping than the silver-based alloy contacts described above, and are more susceptible to cracking, making the effect of formula (1) more pronounced. In particular, when the graphite content is 2% or more, the effect of formula (1) is more pronounced, and they can withstand thousands of impacts such as those in no-load durability tests, ensuring long-term reliability. Furthermore, it is possible to take advantage of the characteristics of sintered contacts, which have an inexpensive rivet shape, suppress temperature rise when current is applied, and have excellent contact welding performance.

また、タングステンカーバイドおよびグラファイトを接点2に含有してもよく、この場合でも、安価なリベット形状で通電時の温度上昇を抑制し、かつ接点の溶着性能が優れている焼結接点の特性を生かすことができる。 Tungsten carbide and graphite may also be included in the contact 2. In this case, the rivet shape is inexpensive, the temperature rise during current flow is suppressed, and the characteristics of the sintered contact, which has excellent welding performance, can be utilized.

このように実施の形態1によれば、通電用導体5の厚さをtとし、リベット接点20がかしめられた後のかしめ代をdとしたとき、t×(d1.4)>2.3で、かつd+t<4.7mmを満足するようにしたので、接点にクラックが生じることがなくなり、また接点が脱落しやすくなることがなくなり、主回路導体の長期信頼性を確保することができる。 Thus, according to the first embodiment, when the thickness of the current-carrying conductor 5 is t and the crimping allowance after the rivet contact 20 is crimped is d, the relationships t × ( d1.4 ) > 2.3 and d + t < 4.7 mm are satisfied. This prevents cracks from occurring in the contacts and prevents the contacts from becoming easily detached, ensuring the long-term reliability of the main circuit conductor.

実施の形態2.
実施の形態1は1点切りの回路遮断器の実施例について説明したが、実施の形態2は、実施の形態1で説明したリベット接点20および通電用導体5を有する主回路導体を2点切りの回路遮断器に適用したものである。図8は、実施の形態2に係る2点切りの回路遮断器のトリップ状態を示す断面図である。
Embodiment 2.
In the first embodiment, an example of a single-break circuit breaker has been described, but in the second embodiment, the main circuit conductor having the rivet contact 20 and the current-carrying conductor 5 described in the first embodiment is applied to a double-break circuit breaker. Fig. 8 is a cross-sectional view showing the tripped state of the double-break circuit breaker according to the second embodiment.

図8に示すように、回路遮断器は、固定接点として、通電用導体としての第1固定接触子40と、第1固定接触子40に設けられた第1固定接点41と、通電用導体としての第2固定接触子42と、第2固定接触子42に設けられた第2固定接点43とを備える。また、図8に示す回路遮断器は、可動接点として、通電用導体としての第1可動接触子50と、第1可動接触子50に設けられた第1可動接点51と、通電用導体としての第2可動接触子52と、第2可動接触子52に設けられた第2可動接点53とを備える。第1可動接触子50および第2可動接触子52は、ロータ55の回転軸54に支持される一体構造物であり、互いに反対方向に延びている。図8に示される状態から、ロータ55が時計方向に回転すると、第1可動接触子50および第2可動接触子52が時計方向に回転し、第1可動接点51が第1固定接点41に当接し、第2可動接点53が第2固定接点43に当接し、回路遮断器が導通状態となる。 As shown in Fig. 8, the circuit breaker includes, as fixed contacts, a first fixed contact 40 as a current-carrying conductor, a first fixed contact 41 provided on the first fixed contact 40, a second fixed contact 42 as a current-carrying conductor, and a second fixed contact 43 provided on the second fixed contact 42. The circuit breaker shown in Fig. 8 also includes, as movable contacts, a first movable contact 50 as a current-carrying conductor, a first movable contact 51 provided on the first movable contact 50, a second movable contact 52 as a current-carrying conductor, and a second movable contact 53 provided on the second movable contact 52. The first movable contact 50 and the second movable contact 52 are integral structures supported by the rotating shaft 54 of the rotor 55, and extend in opposite directions to each other. When the rotor 55 rotates clockwise from the state shown in FIG. 8, the first movable contact 50 and the second movable contact 52 rotate clockwise, the first movable contact 51 abuts against the first fixed contact 41, the second movable contact 53 abuts against the second fixed contact 43, and the circuit breaker enters a conductive state.

実施の形態1で詳述したリベット接点20および通電用導体5を有する主回路導体は、図8に示される2点切りの回路遮断器の固定接点および可動接点として使用することができる。 The main circuit conductor having the rivet contact 20 and the current-carrying conductor 5 described in detail in the first embodiment can be used as the fixed contact and the movable contact of the double-break circuit breaker shown in FIG. 8.

実施の形態3.
実施の形態3は、実施の形態1で説明したリベット接点20および通電用導体5を有する主回路導体を電磁開閉器に適用したものである。図9は、実施の形態3に係る電磁開閉器の構成を示す断面図である。
Embodiment 3.
In the third embodiment, the main circuit conductor having the rivet contact 20 and the current-carrying conductor 5 described in the first embodiment is applied to an electromagnetic switch. Fig. 9 is a cross-sectional view showing the configuration of the electromagnetic switch according to the third embodiment.

開閉器としての電磁開閉器は、固定接点として、通電用導体としての第1固定接触子60と、第1固定接触子60に設けられた第1固定接点61と、通電用導体としての第2固定接触子62と、第2固定接触子62に設けられた第2固定接点63とを備える。電磁開閉器は、可動接点として、通電用導体としての第1可動接触子70と、第1可動接触子70に設けられた第1可動接点71と、通電用導体としての第2可動接触子72と、第2可動接触子72に設けられた第2可動接点73とを備える。第1可動接触子70および第2可動接触子72は、電磁アクチュエータ75のプランジャ74に支持される一体構造物であり、互いに反対方向に延びている。図9に示される状態から、電磁アクチュエータ75は、固定鉄心76と可動鉄心77を有し、コイル78に電流を流すと固定鉄心76が可動鉄心77を吸引する。可動鉄心77には、プランジャ74が取り付けられている。電磁アクチュエータ75が動作すると、固定鉄心76が可動鉄心77を吸引し、これにより、第1可動接点71が第1固定接点61に当接し、第2可動接点73が第2固定接点63に当接し、電磁開閉器が導通状態となる。 The electromagnetic switch as a switch includes, as fixed contacts, a first fixed contact 60 as a current-carrying conductor, a first fixed contact 61 provided on the first fixed contact 60, a second fixed contact 62 as a current-carrying conductor, and a second fixed contact 63 provided on the second fixed contact 62. The electromagnetic switch includes, as movable contacts, a first movable contact 70 as a current-carrying conductor, a first movable contact 71 provided on the first movable contact 70, a second movable contact 72 as a current-carrying conductor, and a second movable contact 73 provided on the second movable contact 72. The first movable contact 70 and the second movable contact 72 are integral structures supported by the plunger 74 of the electromagnetic actuator 75 and extend in opposite directions to each other. From the state shown in FIG. 9, the electromagnetic actuator 75 has a fixed core 76 and a movable core 77, and when a current flows through the coil 78, the fixed core 76 attracts the movable core 77. A plunger 74 is attached to the movable core 77. When the electromagnetic actuator 75 operates, the fixed core 76 attracts the movable core 77, causing the first movable contact 71 to abut against the first fixed contact 61 and the second movable contact 73 to abut against the second fixed contact 63, and the electromagnetic switch becomes conductive.

実施の形態1で詳述したリベット接点20および通電用導体5を有する主回路導体は、図9に示される電磁開閉器の固定接点および可動接点として使用することができる。 The main circuit conductor having the rivet contact 20 and the current-carrying conductor 5 described in detail in embodiment 1 can be used as the fixed contact and the movable contact of the electromagnetic switch shown in FIG. 9.

以上の実施の形態に示した構成は、本開示の内容の一例を示すものであり、別の公知の技術と組み合わせることも可能であるし、本開示の要旨を逸脱しない範囲で、構成の一部を省略、変更することも可能である。 The configurations shown in the above embodiments are merely examples of the contents of this disclosure, and may be combined with other known technologies. Parts of the configurations may be omitted or modified without departing from the spirit of this disclosure.

1 台金部、1a 胴部、1b 頭部、1c,1e 先端面、1d 先端部、2 接点、3 接合面、5,6,8 通電用導体、5a 貫通孔、7 固定側接点、9 可動側接点、10 ハンドル、11 ポンチ、20 リベット形状の接点(リベット接点)、30 開閉機構部、40,60 第1固定接触子、41,61 第1固定接点、42,62 第2固定接触子、43,63 第2固定接点、50,70 第1可動接触子、51,71 第1可動接点、52,72 第2可動接触子、53,73 第2可動接点、54 回転軸、55 ロータ、74 プランジャ、75 電磁アクチュエータ、76 固定鉄心、77 可動鉄心、78 コイル、d かしめ代、t 通電用導体の厚さ。 1 base metal portion, 1a body portion, 1b head portion, 1c, 1e tip surface, 1d tip portion, 2 contact, 3 joint surface, 5, 6, 8 current-carrying conductor, 5a through hole, 7 fixed side contact, 9 movable side contact, 10 handle, 11 punch, 20 rivet-shaped contact (rivet contact), 30 opening/closing mechanism portion, 40, 60 first fixed contact, 41, 61 first fixed contact, 42, 62 second fixed contact, 43, 63 second fixed contact, 50, 70 first movable contact, 51, 71 first movable contact, 52, 72 second movable contact, 53, 73 second movable contact, 54 rotating shaft, 55 rotor, 74 plunger, 75 electromagnetic actuator, 76 fixed core, 77 movable core, 78 coil, d crimping allowance, t thickness of current-carrying conductor.

Claims (7)

孔が設けられた通電用導体と、
前記通電用導体の前記孔に挿入されてかしめられるリベット形状の接点と、
を備え、
前記通電用導体の厚さをtとし、前記接点がかしめられた後のかしめ代をdとしたとき、
t×(d1.4)>2.3で、かつ
d+t<4.7mm
を満足し、
前記通電用導体の厚さtが薄くなると、かしめ代dが大きくなるようかしめ代dを決定することを特徴とする主回路導体。
a current-carrying conductor having a hole;
a rivet-shaped contact that is inserted into the hole of the current-carrying conductor and crimped;
Equipped with
When the thickness of the current-carrying conductor is t and the crimping margin after the contact is crimped is d,
t × (d 1.4 ) > 2.3, and d + t < 4.7 mm
Satisfied ,
A main circuit conductor characterized in that the crimping allowance d is determined so that the crimping allowance d increases as the thickness t of the current-carrying conductor becomes thinner .
前記接点は、ビッカース硬さが160HV以下であることを特徴とする請求項1に記載の主回路導体。 The main circuit conductor according to claim 1, characterized in that the contacts have a Vickers hardness of 160 HV or less. 前記接点は、焼結接点であり、タングステンカーバイドを含有することを特徴とする請求項1または2に記載の主回路導体。 The main circuit conductor according to claim 1 or 2, characterized in that the contacts are sintered contacts and contain tungsten carbide. 前記接点は、前記タングステンカーバイドの含有率が40重量%以下であることを特徴とする請求項3に記載の主回路導体。 The main circuit conductor according to claim 3, characterized in that the contacts have a tungsten carbide content of 40% by weight or less. 前記接点は、焼結接点であり、グラファイトを含有することを特徴とする請求項1から4のいずれか1項に記載の主回路導体。 The main circuit conductor according to any one of claims 1 to 4, characterized in that the contacts are sintered contacts and contain graphite. 前記接点は、前記グラファイトを2重量%以上含有することを特徴とする請求項5に記載の主回路導体。 The main circuit conductor according to claim 5, characterized in that the contact contains 2% or more by weight of the graphite. 請求項1から6のいずれか1項に記載の主回路導体を用いたことを特徴とする開閉器。 A switch characterized by using a main circuit conductor according to any one of claims 1 to 6.
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010109777A1 (en) 2009-03-24 2010-09-30 株式会社アライドマテリアル Electrical contact material
JP2016207380A (en) 2015-04-20 2016-12-08 三菱電機株式会社 Electrical contact and method for manufacturing the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010109777A1 (en) 2009-03-24 2010-09-30 株式会社アライドマテリアル Electrical contact material
JP2016207380A (en) 2015-04-20 2016-12-08 三菱電機株式会社 Electrical contact and method for manufacturing the same

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