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JP7742015B2 - Optical Frequency Modulator - Google Patents
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JP7742015B2 - Optical Frequency Modulator - Google Patents

Optical Frequency Modulator

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JP7742015B2
JP7742015B2 JP2021116366A JP2021116366A JP7742015B2 JP 7742015 B2 JP7742015 B2 JP 7742015B2 JP 2021116366 A JP2021116366 A JP 2021116366A JP 2021116366 A JP2021116366 A JP 2021116366A JP 7742015 B2 JP7742015 B2 JP 7742015B2
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optical frequency
frequency modulator
diffraction grating
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JP2022117392A (en
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真人 永井
弘一 松本
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Tokyo Seimitsu Co Ltd
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Description

本発明は、光の周波数変調を行う光周波数変調器に関する。 The present invention relates to an optical frequency modulator that performs frequency modulation of light.

光ヘテロダイン干渉計測法を用いて測定対象物までの距離及び測定対象物の変位を検出する計測装置が知られている。光ヘテロダイン干渉計測法では、周波数が異なる2種類の光の一方を測定光とすると共に他方を参照光として、測定対象物にて反射された測定光と、参照面にて反射された参照光との干渉信号を検出し、この干渉信号に基づき測定対象物までの距離及び測定対象物の変位を検出する(例えば特許文献1から特許文献3参照)。 Measuring devices are known that use optical heterodyne interferometry to detect the distance to and displacement of a measurement object. Optical heterodyne interferometry uses two types of light with different frequencies, one of which is used as the measurement light and the other as the reference light. The interference signal between the measurement light reflected by the measurement object and the reference light reflected by a reference surface is detected, and the distance to and displacement of the measurement object are detected based on this interference signal (see, for example, Patent Documents 1 to 3).

光ヘテロダイン干渉計測法において、周波数が異なる測定光及び参照光を生成する方法としては、2種類の周波数の光を出射可能な光源を用いる方法と、光源から出射された光を測定光と参照光とに分割してその一方を光周波数変調器(周波数シフタともいう)により周波数変調する方法とが知られている。この際に、前者の方法では高価な光源を用いる必要があるので、コストの観点から後者の方法が採用される場合が多い。 In optical heterodyne interferometry, known methods for generating measurement and reference light of different frequencies include using a light source capable of emitting light of two different frequencies, and splitting the light emitted from the light source into measurement and reference light and frequency-modulating one of the light beams using an optical frequency modulator (also called a frequency shifter). The former method requires the use of an expensive light source, so the latter method is often adopted from a cost perspective.

光周波数変調器としては、振動子と、振動子の表面上に複数形成された回折格子と、を備えるものがよく知られている(例えば特許文献4参照)。この光周波数変調器は、振動中(往復移動中)の振動子の表面に入射した入射光を回折格子で反射して周波数変調(ドップラーシフト)し、周波数変調した回折光を測定光又は参照光として出射する。 A well-known optical frequency modulator is one that includes an oscillator and multiple diffraction gratings formed on the oscillator's surface (see, for example, Patent Document 4). In this optical frequency modulator, incident light that strikes the oscillator's surface while it is vibrating (moving back and forth) is reflected by the diffraction grating, causing frequency modulation (Doppler shift), and the frequency-modulated diffracted light is then emitted as measurement light or reference light.

特開2020-106284号公報Japanese Patent Application Laid-Open No. 2020-106284 特開2020-056658号公報Japanese Patent Application Laid-Open No. 2020-056658 特開平2-160221号公報Japanese Unexamined Patent Publication No. 2-160221 特開2020-165700号公報Japanese Patent Application Laid-Open No. 2020-165700

ところで、回折格子を用いて光の周波数変調を行う場合、回折格子を所定の一定速度で同方向に移動させる必要がある。この際に、上記特許文献4に記載の光周波数変調器では、振動子を振動させることで回折格子を移動させている。このため、振動子が振動方向の一方向に一定速度で移動している間は回折光を測定光等として利用可能であるが、振動子が振動方向の他方向(一方向とは逆方向)に移動している間は回折光の周波数が逆方向にシフトするため回折光を測定光等として利用することができない。また、特許文献4に記載の光周波数変調器は、振動子の振動方向が他方向から一方向に切り替わった場合であっても、振動子の移動速度が上述の一定速度に達するまでは回折光を測定光等として利用することができない。従って、特許文献4に記載の光周波数変調器は、所望の周波数の回折光を連続的に出射することができない。 When modulating the frequency of light using a diffraction grating, the diffraction grating must be moved in the same direction at a predetermined constant speed. In the optical frequency modulator described in Patent Document 4, the diffraction grating is moved by vibrating the oscillator. Therefore, while the oscillator is moving at a constant speed in one direction of oscillation, the diffracted light can be used as measurement light, etc.; however, while the oscillator is moving in the other direction of oscillation (the opposite direction from the one direction), the frequency of the diffracted light shifts in the opposite direction, making it impossible to use the diffracted light as measurement light, etc. Furthermore, with the optical frequency modulator described in Patent Document 4, even if the oscillator's oscillation direction switches from the other direction to the one direction, the diffracted light cannot be used as measurement light, etc., until the oscillator's moving speed reaches the above-mentioned constant speed. Therefore, the optical frequency modulator described in Patent Document 4 cannot continuously emit diffracted light of the desired frequency.

そこで、光周波数変調器として例えば音響光学素子を用いることが考えられるが、音響光学素子を用いた光周波数変調器は、回折格子を用いた光周波数変調器よりも高価であるので、コストが増加するという問題がある。 One possible solution is to use an acousto-optic element as the optical frequency modulator, but optical frequency modulators using acousto-optic elements are more expensive than optical frequency modulators using diffraction gratings, which poses the problem of increased costs.

本発明はこのような事情に鑑みてなされたものであり、低コストで連続して所望の周波数の回折光を出射可能な光周波数変調器を提供することを目的とする。 The present invention was made in consideration of these circumstances, and aims to provide an optical frequency modulator that can continuously emit diffracted light of a desired frequency at low cost.

本発明の目的を達成するための光周波数変調器は、回転軸を有し且つ回転軸に平行な方向に延びた円筒状の回転体であって、回転軸を中心として等速回転する回転体と、回転体の周面に複数形成され且つ回転軸に平行な複数の透過型回折格子であって、回転中の回転体の周面に入射した入射光を周波数変調し、周波数変調した回折光を出射する複数の透過型回折格子と、を備える。 An optical frequency modulator for achieving the object of the present invention comprises a cylindrical rotor having a rotation axis and extending in a direction parallel to the rotation axis, the rotor rotating at a uniform speed around the rotation axis, and a plurality of transmission diffraction gratings formed on the circumferential surface of the rotor and parallel to the rotation axis, the transmission diffraction gratings frequency-modulating incident light incident on the circumferential surface of the rotor during rotation and emitting frequency-modulated diffracted light.

この光周波数変調器によれば、各透過型回折格子を、回転軸を中心とする回転軌跡に沿って等速移動(等速回転)させることができるので、回転体に対する入射光の入射位置を各回折格子が等速度で且つ連続的に通過する状態が維持される。 This optical frequency modulator allows each transmission diffraction grating to move (rotate) at a uniform speed along a rotational trajectory centered on the rotation axis, thereby maintaining a state in which each diffraction grating passes the incident position of the incident light on the rotating body at a uniform speed and continuously.

本発明の他の態様に係る光周波数変調器において、透過型回折格子が、回転体の外周面から回転体の内部に入射する入射光を周波数変調する。 In an optical frequency modulator according to another aspect of the present invention, a transmission diffraction grating frequency-modulates incident light entering the interior of the rotor from the outer surface of the rotor.

本発明の他の態様に係る光周波数変調器において、回転体の内部に配置された反射体であって、且つ回転体の外部から回転軸に沿って回転体の内部に入射した入射光を回転体の内周面に向けて反射する反射体を備え、透過型回折格子が、反射体から内周面に入射して回転体の外部に出射される入射光を周波数変調する。これにより、光学的に難しい調整を行うことなく最大光量の回折光が得られる。 An optical frequency modulator according to another aspect of the present invention includes a reflector disposed inside a rotor that reflects incident light that enters the rotor from outside along the rotation axis toward the rotor's inner circumferential surface, and a transmission diffraction grating frequency-modulates the incident light that enters the inner circumferential surface from the reflector and is emitted to the outside of the rotor. This allows for the maximum amount of diffracted light to be obtained without the need for complex optical adjustments.

本発明の他の態様に係る光周波数変調器において、回転体の回転速度及び回転方向を制御する駆動部を備える。 An optical frequency modulator according to another aspect of the present invention includes a drive unit that controls the rotation speed and direction of the rotor.

本発明は、低コストで連続して所望の周波数の回折光を出射することができる。 The present invention can continuously emit diffracted light of the desired frequency at low cost.

本発明の光周波数変調器を備える計測装置の概略図である。1 is a schematic diagram of a measurement device including an optical frequency modulator according to the present invention. 第1実施形態の光周波数変調器の概略図である。FIG. 1 is a schematic diagram of an optical frequency modulator according to a first embodiment. 図2中の点線円A内の拡大図である。FIG. 3 is an enlarged view of the area within the dotted circle A in FIG. 2 . 第1実施形態の回折格子の変形例を説明するための説明図である。FIG. 10 is an explanatory diagram for explaining a modified example of the diffraction grating of the first embodiment. 第2実施形態の光周波数変調器の概略図である。FIG. 10 is a schematic diagram of an optical frequency modulator according to a second embodiment. 第3実施形態の光周波数変調器の概略図である。FIG. 10 is a schematic diagram of an optical frequency modulator according to a third embodiment. 図6中の点線円A1内の拡大図である。FIG. 7 is an enlarged view of the area within the dotted circle A1 in FIG. 6. 第4実施形態の光周波数変調器の概略図である。FIG. 10 is a schematic diagram of an optical frequency modulator according to a fourth embodiment. 第5実施形態の光周波数変調器の回転体を回転軸の軸方向側から見た正面図である。FIG. 11 is a front view of a rotating body of an optical frequency modulator according to a fifth embodiment, as viewed from the axial side of the rotating shaft. 第5実施形態の光周波数変調器の回転体の断面図である。FIG. 13 is a cross-sectional view of a rotor of an optical frequency modulator according to a fifth embodiment.

[計測装置]
図1は、本発明の光周波数変調器16を備える計測装置10の概略図である。図1に示すように、計測装置10は、光ヘテロダイン干渉計測法(光ヘテロダイン干渉計)を用いて測定対象物9までの距離及び測定対象物9の変位(微小変位を含む)を計測する。なお、測定対象物9には、計測装置10による計測のために、コーナーキューブリフレクタ或いは3面ミラー等の再帰反射部材9aが設けられている。
[Measuring equipment]
1 is a schematic diagram of a measurement device 10 equipped with an optical frequency modulator 16 of the present invention. As shown in Fig. 1, the measurement device 10 measures the distance to a measurement object 9 and the displacement (including minute displacement) of the measurement object 9 using an optical heterodyne interferometry method (optical heterodyne interferometer). Note that the measurement object 9 is provided with a retroreflective member 9a such as a corner cube reflector or a three-surface mirror for measurement by the measurement device 10.

計測装置10は、レーザ光源12と、ハーフミラー14と、光周波数変調器16と、ハーフミラー18と、受光部20と、演算装置22と、を備える。 The measurement device 10 includes a laser light source 12, a half mirror 14, an optical frequency modulator 16, a half mirror 18, a light receiving unit 20, and a calculation device 22.

レーザ光源12は、所定の周波数(波長)のレーザ光Lをハーフミラー14に向けて出射する。ハーフミラー14は、レーザ光源12から入射したレーザ光Lを同一周波数の測定光L1と参照光L2とに分割する。そして、ハーフミラー14は、測定光L1を光周波数変調器16に向けて出射すると共に参照光L2をハーフミラー18に向けて出射する。 The laser light source 12 emits laser light L of a predetermined frequency (wavelength) toward the half mirror 14. The half mirror 14 splits the laser light L incident from the laser light source 12 into measurement light L1 and reference light L2 of the same frequency. The half mirror 14 then emits the measurement light L1 toward the optical frequency modulator 16 and the reference light L2 toward the half mirror 18.

光周波数変調器16は、詳しくは後述するが、ハーフミラー14から入射した測定光L1をドップラーシフトにより周波数変調(周波数偏移)して、参照光L2とは周波数が異なる変調測定光L1Aを出射する。なお、変調測定光L1Aの周波数シフト量は、特に限定されず、光ヘテロダイン干渉計測法による計測が可能な一般的な値に設定されている。この光周波数変調器16により周波数変調された変調測定光L1Aは、再帰反射部材9aに向けて出射され、さらに再帰反射部材9aで再帰反射されることでハーフミラー18に入射する。 The optical frequency modulator 16, which will be described in more detail below, frequency-modulates (shifts the frequency of) the measurement light L1 incident from the half mirror 14 using Doppler shift, and emits modulated measurement light L1A with a different frequency from the reference light L2. The amount of frequency shift of the modulated measurement light L1A is not particularly limited and is set to a general value that allows measurement using optical heterodyne interferometry. The modulated measurement light L1A, frequency-modulated by the optical frequency modulator 16, is emitted toward the retroreflective member 9a and is retroreflected by the retroreflective member 9a before entering the half mirror 18.

ハーフミラー18は、再帰反射部材9aから入射した変調測定光L1Aと、ハーフミラー14から入射した参照光L2との干渉信号SG(ビート信号)を受光部20へ出射する。 The half mirror 18 outputs to the light receiving unit 20 an interference signal SG (beat signal) between the modulated measurement light L1A incident from the retroreflective member 9a and the reference light L2 incident from the half mirror 14.

受光部20は、公知のフォトダイオードなどが用いられ、ハーフミラー14から入射した干渉信号SGを検出(受光)して干渉信号SGの検出信号を演算装置22へ出力する。 The light receiving unit 20 uses a known photodiode or the like, detects (receives) the interference signal SG incident from the half mirror 14, and outputs a detection signal of the interference signal SG to the calculation device 22.

演算装置22は、受光部20から入力された干渉信号SGの検出信号に対して所定の演算処理を行い、計測装置10から測定対象物9(再帰反射部材9a)までの距離を演算する。これにより、測定対象物9までの距離及び測定対象物9の変位を計測可能である。なお、演算装置22が行う具体的な演算方法については公知技術であるので、ここでは具体的な説明は省略する。 The calculation device 22 performs a predetermined calculation process on the detection signal of the interference signal SG input from the light receiving unit 20, and calculates the distance from the measurement device 10 to the measurement object 9 (retroreflective member 9a). This makes it possible to measure the distance to the measurement object 9 and the displacement of the measurement object 9. Note that the specific calculation method performed by the calculation device 22 is publicly known technology, so a detailed explanation will be omitted here.

以下、光周波数変調器16の第1実施形態~第4実施形態の説明を行う。 The following describes the first to fourth embodiments of the optical frequency modulator 16.

[第1実施形態の光周波数変調器]
図2は、第1実施形態の光周波数変調器16の概略図である。図3は、図2中の点線円A内の拡大図である。図2及び図3に示すように、光周波数変調器16は、測定光L1をドップラーシフトにより周波数変調して変調測定光L1Aを出射する。この光周波数変調器16は、第1ミラー30と、第1レンズ32と、回転体34と、駆動部36と、第2レンズ38と、第2ミラー40と、を備える。なお、光周波数変調器16の中で回転体34及び駆動部36以外の構成については適宜変更可能である。
[Optical frequency modulator of the first embodiment]
FIG. 2 is a schematic diagram of the optical frequency modulator 16 of the first embodiment. FIG. 3 is an enlarged view of the area within the dotted circle A in FIG. 2. As shown in FIGS. 2 and 3, the optical frequency modulator 16 frequency-modulates the measurement light L1 by Doppler shifting to emit modulated measurement light L1A. The optical frequency modulator 16 includes a first mirror 30, a first lens 32, a rotating body 34, a driver 36, a second lens 38, and a second mirror 40. Note that the configuration of the optical frequency modulator 16, other than the rotating body 34 and the driver 36, can be modified as appropriate.

第1ミラー30は、ハーフミラー14から入射した測定光L1を、後述の回転中の回転体34に向けて反射する。これにより、回転中の回転体34の所定位置(入射位置P)に対して測定光L1(本発明の入射光に相当)が所定の入射角度で入射する。 The first mirror 30 reflects the measurement light L1 incident from the half mirror 14 toward the rotating rotor 34, which will be described later. As a result, the measurement light L1 (corresponding to the incident light in this invention) is incident at a predetermined angle of incidence on a predetermined position (incident position P) on the rotating rotor 34.

第1レンズ32は、第1ミラー30と回転体34との間の測定光L1の光路上に配置されており、ハーフミラー14から入射した測定光L1を回転中の回転体34に向けて出射する。 The first lens 32 is positioned on the optical path of the measurement light L1 between the first mirror 30 and the rotating body 34, and emits the measurement light L1 incident from the half mirror 14 toward the rotating body 34.

回転体34は、回転軸Cを有し且つこの回転軸Cに対して平行な方向に延びた円柱体である。この回転体34は、駆動部36からの駆動力を受けて、回転軸Cを中心として回転する。 The rotating body 34 is a cylindrical body having a rotation axis C and extending in a direction parallel to this rotation axis C. This rotating body 34 receives a driving force from the drive unit 36 and rotates around the rotation axis C.

駆動部36は、例えばモータ及びギヤ等で構成される公知のアクチュエータであり、回転体34の回転方向及び回転速度を制御する。この駆動部36は、回転軸Cを中心として回転体34を一方向に等速回転させる。 The drive unit 36 is a known actuator composed of, for example, a motor and gears, and controls the rotation direction and rotation speed of the rotating body 34. This drive unit 36 rotates the rotating body 34 in one direction at a uniform speed around the rotation axis C.

回転体34は、回転軸Cの軸周り方向(以下、単に軸周り方向と略す)に沿って形成された外周面35(本発明の曲面に相当)を有する。この外周面35には、回転軸Cに対して平行な回折格子42が軸周り方向に沿って複数(等間隔)に形成されている。これにより、回転体34の等速回転が継続している間、回転体34に所定の入射角で入射する測定光L1の入射位置Pを、各回折格子42が連続的に等速度で通過する。 The rotating body 34 has an outer peripheral surface 35 (corresponding to the curved surface of the present invention) formed along the axial direction of the rotation axis C (hereinafter simply referred to as the axial direction). This outer peripheral surface 35 has multiple diffraction gratings 42 formed (equally spaced) along the axial direction parallel to the rotation axis C. As a result, while the rotating body 34 continues to rotate at a uniform speed, each diffraction grating 42 passes continuously at a uniform speed through the incident position P of the measurement light L1, which is incident on the rotating body 34 at a predetermined angle of incidence.

各回折格子42は、公知の反射型回折格子であるブレーズド回折格子である。入射位置Pを等速度で通過する回折格子42に所定の入射角度で測定光L1が入射すると、この回折格子42において鏡面反射された反射光LRと、回折格子42により反射されてドップラーシフト(周波数変調)された回折光(少なくとも1次回折光)と、が発生する。そして本実施形態では、1次回折光(図示しない2次回折光以降でも可)を変調測定光L1Aとして用いる。なお、変調測定光L1Aの出射角度、すなわち変調測定光L1Aの周波数シフト量は任意であるので、所望の周波数シフト量に応じて、回転体34の回転速度、回転体34の回転方向、測定光L1の入射角度、回折格子42のブレーズド角、及び回折格子42のピッチなどが定められる。 Each diffraction grating 42 is a blazed diffraction grating, a well-known reflection-type diffraction grating. When measurement light L1 is incident on the diffraction grating 42 at a predetermined angle of incidence while passing through the incident position P at a constant speed, the diffraction grating 42 generates specularly reflected light LR and diffracted light (at least first-order diffracted light) that is reflected by the diffraction grating 42 and Doppler-shifted (frequency-modulated). In this embodiment, the first-order diffracted light (or second-order or later diffracted light, not shown) is used as modulated measurement light L1A. Note that the emission angle of modulated measurement light L1A, i.e., the amount of frequency shift of modulated measurement light L1A, is arbitrary. Therefore, the rotational speed of the rotor 34, the rotational direction of the rotor 34, the angle of incidence of measurement light L1, the blazed angle of the diffraction grating 42, and the pitch of the diffraction grating 42 are determined according to the desired frequency shift amount.

第2レンズ38は、回転体34から出射された変調測定光L1Aの光路上に配置され、この変調測定光L1Aを第2ミラー40に向けて出射する。第2ミラー40は、第2レンズ38から入射した変調測定光L1Aを再帰反射部材9aに向けて反射する。これにより、既述の図1に示したように、再帰反射部材9aにて再帰反射された変調測定光L1Aがハーフミラー18に入射する。 The second lens 38 is positioned on the optical path of the modulated measurement light L1A emitted from the rotating body 34, and emits this modulated measurement light L1A toward the second mirror 40. The second mirror 40 reflects the modulated measurement light L1A incident from the second lens 38 toward the retroreflective member 9a. As a result, as shown in Figure 1 above, the modulated measurement light L1A retroreflectively reflected by the retroreflective member 9a enters the half mirror 18.

以上のように本実施形態の光周波数変調器16では、円柱状の回転体34の外周面35に軸周り方向に沿って複数の回折格子42を形成することによって、この回転体34を等速回転させるだけで、各回折格子42を、回転軸Cを中心とする回転軌跡に沿って等速移動(等速回転)させることができる。このため、回転体34の回転開始時及び回転停止時を除いた等速回転中は、入射位置Pを各回折格子42が等速度で且つ連続的に通過する状態が維持される。これにより、高価な音響光学素子を用いることなく、回転体34からの所望の周波数の変調測定光L1Aの出射を途切れることなく連続的に行うことができる。その結果、低コストで所望の周波数の変調測定光L1A(回折光)の出射を連続して行うことができる。 As described above, in the optical frequency modulator 16 of this embodiment, by forming multiple diffraction gratings 42 around the axis on the outer circumferential surface 35 of the cylindrical rotor 34, each diffraction grating 42 can be moved at a uniform speed (rotated at a uniform speed) along a rotational trajectory centered on the rotation axis C simply by rotating the rotor 34 at a uniform speed. Therefore, during the uniform rotation except when the rotor 34 starts and stops rotating, each diffraction grating 42 continues to pass the incident position P at a uniform speed. This allows the rotor 34 to continuously emit modulated measurement light L1A of the desired frequency without interruption, without using an expensive acousto-optic element. As a result, modulated measurement light L1A (diffracted light) of the desired frequency can be continuously emitted at low cost.

(回折格子の変形例)
図4は、第1実施形態の回折格子42の変形例を説明するための説明図である。上記第1実施形態では、反射型の回折格子42としてブレーズド回折格子を例に挙げて説明したが、例えば図4に示すように、回転体34の外周面35をガラス等で形成すると共に、この外周面35に回転軸Cに平行な溝35aを軸周り方向に沿って複数形成することで、反射型の回折格子42Aを形成してもよい。すなわち外周面35に形成する反射型回折格子の種類は特に限定されるものではない。
(Modification of Diffraction Grating)
Fig. 4 is an explanatory diagram illustrating a modified example of the diffraction grating 42 of the first embodiment. In the above-described first embodiment, a blazed diffraction grating has been described as an example of the reflective diffraction grating 42, but as shown in Fig. 4, for example, a reflective diffraction grating 42A may be formed by forming the outer peripheral surface 35 of the rotor 34 from glass or the like and forming a plurality of grooves 35a parallel to the rotation axis C in the direction around the axis on this outer peripheral surface 35. In other words, the type of reflective diffraction grating formed on the outer peripheral surface 35 is not particularly limited.

[第2実施形態]
図5は、第2実施形態の光周波数変調器16の概略図である。図5に示すように、第2実施形態の光周波数変調器16は、回転体34の代わりに回転体34Aを備える点を除けば上記第1実施形態の光周波数変調器16と基本的に同じ構成であるので、上記第1実施形態と機能又は構成上同一のものについては同一符号を付してその説明は省略する。
[Second embodiment]
Fig. 5 is a schematic diagram of an optical frequency modulator 16 of the second embodiment. As shown in Fig. 5, the optical frequency modulator 16 of the second embodiment has basically the same configuration as the optical frequency modulator 16 of the first embodiment, except that it includes a rotor 34A instead of the rotor 34. Therefore, components that are the same in function or configuration as those of the first embodiment are designated by the same reference numerals, and descriptions thereof will be omitted.

第2実施形態の回転体34Aは、回転軸Cに対して平行な方向に延びた円筒体であり、駆動部36からの駆動力を受けて回転軸Cを中心として等速回転する。この回転体34Aは、第1実施形態と同様の外周面35及び複数の回折格子42(回折格子42Aでも可)を有している。このため、第1実施形態と同様に各回折格子42を、回転軸Cを中心とする回転軌跡に沿って等速移動(等速回転)させられる。その結果、第2実施形態の光周波数変調器16についても第1実施形態と同様の効果が得られる。 The rotating body 34A of the second embodiment is a cylindrical body extending in a direction parallel to the rotation axis C, and rotates at a uniform speed around the rotation axis C upon receiving a driving force from the drive unit 36. This rotating body 34A has the same outer peripheral surface 35 and multiple diffraction gratings 42 (or diffraction gratings 42A) as in the first embodiment. Therefore, as in the first embodiment, each diffraction grating 42 can be moved (rotated) at a uniform speed along a rotational trajectory around the rotation axis C. As a result, the optical frequency modulator 16 of the second embodiment achieves the same effects as the first embodiment.

[第3実施形態]
図6は、第3実施形態の光周波数変調器16の概略図である。図7は、図6中の点線円A1内の拡大図である。上記各実施形態では回転体34,34Aの外周面35に反射型の回折格子42,42Aを形成しているが、図6及び図7に示すように第3実施形態では、回転体34Bの外周面35又は内周面37(或いは双方)に透過型の回折格子42Bを複数形成している。なお、第3実施形態の光周波数変調器16は、回転体34B及び回折格子42Bを備える点を除けば上記各実施形態の光周波数変調器16と基本的に同じ構成であるので、上記各実施形態と機能又は構成上同一のものについては同一符号を付してその説明は省略する。
[Third embodiment]
FIG. 6 is a schematic diagram of an optical frequency modulator 16 according to a third embodiment. FIG. 7 is an enlarged view of the dotted circle A1 in FIG. 6 . In the above-described embodiments, reflective diffraction gratings 42, 42A are formed on the outer peripheral surface 35 of the rotor 34, 34A. However, in the third embodiment, as shown in FIGS. 6 and 7 , a plurality of transmissive diffraction gratings 42B are formed on the outer peripheral surface 35 or the inner peripheral surface 37 (or both) of the rotor 34B. The optical frequency modulator 16 according to the third embodiment has basically the same configuration as the optical frequency modulator 16 according to the above-described embodiments, except for the rotor 34B and the diffraction grating 42B. Therefore, components identical in function or configuration to those according to the above-described embodiments are designated by the same reference numerals, and their description will be omitted.

第3実施形態の回転体34Bは、第2実施形態の回転体34Aと同様の円筒体であり、駆動部36からの駆動力を受けて回転軸Cを中心として等速回転する。この回転体34Bの外周面35には、軸周り方向に沿って透過型の回折格子42Bが複数形成されている。 The rotating body 34B of the third embodiment is a cylindrical body similar to the rotating body 34A of the second embodiment, and receives a driving force from the drive unit 36 to rotate at a constant speed around the rotation axis C. A plurality of transmission-type diffraction gratings 42B are formed on the outer peripheral surface 35 of this rotating body 34B along the direction around the axis.

各回折格子42Bは、回転軸Cに平行な複数のスリット35b(ガラス等の光透過部でも可)により構成されており、外周面35(内周面37)に軸周り方向に沿って所定ピッチで複数形成されている。なお、透過型の回折格子42Bは、図6及び図7に示したものに限定されず、公知の各種形状のもの(例えば透過型ブレーズド回折格子、刻線など)を代わりに用いてもよい。上記各実施形態と同様に、入射位置Pを等速度で通過する回折格子42Bに所定の入射角度で測定光L1が入射すると、この回折格子42Bを透過してドップラーシフトされた回折光(少なくとも1次回折光)である変調測定光L1Aが回転体34Bの内部に出射される。そして、この変調測定光L1Aを、不図示の複数のミラー、プリズム、レンズ等の光学部材を介して、回転体34Bの内部から再帰反射部材9aまで導く。 Each diffraction grating 42B is composed of multiple slits 35b (which may be light-transmitting portions such as glass) parallel to the rotation axis C, and multiple slits are formed at a predetermined pitch around the axis on the outer peripheral surface 35 (inner peripheral surface 37). Note that the transmission diffraction grating 42B is not limited to the one shown in FIGS. 6 and 7; various known shapes (e.g., transmission blazed diffraction gratings, ruled lines, etc.) may be used instead. As in the above embodiments, when measurement light L1 is incident at a predetermined angle on the diffraction grating 42B passing through the incident position P at a uniform velocity, modulated measurement light L1A, which is Doppler-shifted diffracted light (at least first-order diffracted light) that passes through the diffraction grating 42B, is emitted into the interior of the rotor 34B. This modulated measurement light L1A is then guided from the interior of the rotor 34B to the retroreflective member 9a via multiple optical components such as mirrors, prisms, and lenses (not shown).

このように第3実施形態においても、回転体34Bからの所望の周波数の変調測定光L1Aの出射を途切れることなく連続的に行うことができるので、上記各実施形態と同様の効果が得られる。 In this way, in the third embodiment, the modulated measurement light L1A of the desired frequency can be emitted continuously and without interruption from the rotating body 34B, thereby achieving the same effects as the above embodiments.

[第4実施形態]
図8は、第4実施形態の光周波数変調器16の概略図である。上記各実施形態では、光周波数変調器16が円柱状又は円筒状の回転体34,34A,34Bを備えているが、図8に示すように第4実施形態の光周波数変調器16は、非円柱状・非円筒状の回転体34Cを備える。なお、第4実施形態の光周波数変調器16は、回転体34Cを備える点を除けば上記各実施形態の光周波数変調器16と基本的に同じ構成であるので、上記各実施形態と機能又は構成上同一のものについては同一符号を付してその説明は省略する。
[Fourth embodiment]
Figure 8 is a schematic diagram of an optical frequency modulator 16 of a fourth embodiment. In the above-described embodiments, the optical frequency modulator 16 includes a cylindrical or columnar rotor 34, 34A, 34B, but as shown in Figure 8, the optical frequency modulator 16 of the fourth embodiment includes a non-cylindrical rotor 34C. Note that the optical frequency modulator 16 of the fourth embodiment has basically the same configuration as the optical frequency modulator 16 of the above-described embodiments except for the rotor 34C. Therefore, components that are identical in function or configuration to those of the above-described embodiments are designated by the same reference numerals, and their description will be omitted.

回転体34Cは、回転軸Cに対して平行な方向に延びた半円柱体(半円筒体でも可)であり、回転軸Cの軸方向側(図8の紙面垂直方向側)から見て、回転軸Cを中心とする円周の一部を構成する曲面50(外周面)を有する。そして、この回転体34Cは、駆動部36からの駆動力を受けて回転軸Cを中心として等速回転する。 The rotating body 34C is a semi-cylindrical body (or semi-cylinder) extending in a direction parallel to the rotation axis C, and has a curved surface 50 (outer peripheral surface) that forms part of a circumference centered on the rotation axis C when viewed from the axial side of the rotation axis C (the side perpendicular to the plane of the paper in Figure 8). The rotating body 34C receives a driving force from the drive unit 36 and rotates at a uniform speed around the rotation axis C.

曲面50には、軸周り方向に沿って複数の回折格子42(回折格子42Aでも可)が形成されている。なお、回転体34Cが半円筒形状に形成されている場合には、反射型の回折格子42,42Aの代わりに第3実施形態と同様の透過型の回折格子42Bを形成してもよい。これにより、回転体34Cの回転に応じて、入射位置Pを回折格子42が等速度で且つ連続的に通過する間、回転体34Cからの所望の周波数の変調測定光L1Aの出射を途切れることなく連続的に行うことができる。その結果、第4実施形態では、光周波数変調器16から所望の周波数の変調測定光L1A(パルス光)を出射することができる。 Multiple diffraction gratings 42 (or diffraction gratings 42A) are formed on the curved surface 50 along the axial direction. If the rotor 34C is formed in a semi-cylindrical shape, a transmission-type diffraction grating 42B similar to that of the third embodiment may be formed instead of the reflection-type diffraction gratings 42, 42A. This allows the rotor 34C to continuously emit modulated measurement light L1A of the desired frequency without interruption while the diffraction grating 42 passes through the incident position P at a constant speed in accordance with the rotation of the rotor 34C. As a result, in the fourth embodiment, modulated measurement light L1A (pulsed light) of the desired frequency can be emitted from the optical frequency modulator 16.

なお、上記第4実施形態では、回転体34Cが半円柱体(半円筒体)に形成されているが、四半円柱体(四半円筒体)等の回転軸Cを中心とする円周の一部を構成する曲面(外周面)を有する形状であれば特に限定はされない。 In the fourth embodiment, the rotor 34C is formed as a semi-cylindrical body (semi-cylinder), but there is no particular limitation to this shape as long as it has a curved surface (outer peripheral surface) that forms part of a circumference centered on the rotation axis C, such as a quarter-cylindrical body (quarter-cylinder).

[第5実施形態]
図9は、第5実施形態の光周波数変調器16の回転体34Bを回転軸Cの軸方向側から見た正面図(上面図、側面図)である。図10は、第5実施形態の光周波数変調器16の回転体34Bの断面図である。
Fifth Embodiment
Fig. 9 is a front view (top view, side view) of the rotor 34B of the optical frequency modulator 16 according to the fifth embodiment, as viewed from the axial direction of the rotation axis C. Fig. 10 is a cross-sectional view of the rotor 34B of the optical frequency modulator 16 according to the fifth embodiment.

上記第3実施形態では、回転体34Bに透過型の回折格子42Bを複数形成し、回転体34Bの外周面35側から回転体34の内部に入射する測定光L1を各回折格子42Bによって周波数変調している。これに対して第5実施形態では、回転体34Bの内周面37側から回転体34の外部に出射される測定光L1を各回折格子42Bによって周波数変調する。 In the third embodiment, multiple transmission diffraction gratings 42B are formed on the rotor 34B, and the measurement light L1 entering the interior of the rotor 34 from the outer peripheral surface 35 side of the rotor 34B is frequency-modulated by each diffraction grating 42B. In contrast, in the fifth embodiment, the measurement light L1 emitted to the exterior of the rotor 34 from the inner peripheral surface 37 side of the rotor 34B is frequency-modulated by each diffraction grating 42B.

図9及び図10に示すように、第5実施形態の光周波数変調器16は、回転体34Bの外部から回転軸Cに沿って回転体34Bの内部に測定光L1が入射し、且つ回転体34Bの内部に反射体54が固定配置されている点を除けば、上記第3実施形態の光周波数変調器16と基本的に同じ構成である。このため、上記第3実施形態と機能又は構成上同一のものについては同一符号を付してその説明は省略する。 As shown in Figures 9 and 10, the optical frequency modulator 16 of the fifth embodiment has basically the same configuration as the optical frequency modulator 16 of the third embodiment, except that measurement light L1 enters the interior of the rotor 34B from outside the rotor 34B along the rotation axis C, and a reflector 54 is fixedly disposed inside the rotor 34B. Therefore, components that are functionally or structurally identical to those of the third embodiment are designated by the same reference numerals, and their description will be omitted.

反射体54は、例えばミラー(反射鏡)或いはペンタプリズムなどが用いられ、回転体34Bの内部の回転軸C上において軸周り方向に回転不能に配置(固定配置)されている。反射体54は、回転体34Bの外部から回転軸Cに沿って回転体34Bの内部に入射した測定光L1を直角に反射して、この測定光L1を回転体34Bの内周面37に入射させる。なお、反射体54による測定光L1の反射方向は、この測定光L1を内周面37に入射可能であれば適宜変更してもよい。 The reflector 54 is, for example, a mirror or a pentaprism, and is arranged (fixed) on the rotation axis C inside the rotor 34B so that it cannot rotate around the axis. The reflector 54 reflects at a right angle the measurement light L1 that enters the rotor 34B from outside along the rotation axis C, causing this measurement light L1 to be incident on the inner circumferential surface 37 of the rotor 34B. Note that the reflection direction of the measurement light L1 by the reflector 54 may be changed as appropriate, as long as this measurement light L1 can be incident on the inner circumferential surface 37.

第5実施形態の各回折格子42Bは、上記第3実施形態の各回折格子42Bと同様に、回転体34Bの外周面35又は内周面37(或いは双方)に形成された透過型回折格子であり、スリット35b(図7参照)、透過型ブレーズド回折格子、刻線などが用いられる。各回折格子42Bは、回転体34Bの回転中に反射体54から内周面37に入射した測定光L1を周波数変調する。これにより、周波数変調された変調測定光L1Aが回転体34Bの外部に出射される。 Each diffraction grating 42B of the fifth embodiment, like each diffraction grating 42B of the third embodiment, is a transmission diffraction grating formed on the outer peripheral surface 35 or inner peripheral surface 37 (or both) of the rotor 34B, and uses slits 35b (see Figure 7), a transmission blazed diffraction grating, rulings, etc. Each diffraction grating 42B frequency-modulates the measurement light L1 incident on the inner peripheral surface 37 from the reflector 54 while the rotor 34B is rotating. As a result, the frequency-modulated modulated measurement light L1A is emitted to the outside of the rotor 34B.

このように第5実施形態の光周波数変調器16では、回転体34Bの内部に反射体54を配置して回転体34Bの内部から外部に向けて測定光L1を透過させながら、この測定光L1を各回折格子42Bにより周波数変調することで、光学的に難しい調整を行うことなく最大光量の変調測定光L1Aが得られる。 In this way, in the optical frequency modulator 16 of the fifth embodiment, a reflector 54 is placed inside the rotor 34B, and the measurement light L1 is transmitted from the inside to the outside of the rotor 34B. This measurement light L1 is then frequency-modulated by each diffraction grating 42B, thereby obtaining the maximum amount of modulated measurement light L1A without the need for complex optical adjustments.

例えば円柱状又は円筒状の回転体34の外周面35に反射型の回折格子42が形成されている上記第1実施形態及び第2実施形態の光周波数変調器16で最大光量の変調測定光L1Aを出力するためには、回折格子42に入射する測定光L1の入射角度の角度調整と、回折格子42のブレーズド角の角度調整と、の2種類の角度調整が必要となる。また、回折格子42がブレーズド回折格子である場合には、回折格子42に対して測定光L1が斜めに入射することで変調測定光L1A(回折光)が拡散し易くなるため、既述の図1に示したように測定光L1の光路上に第1レンズ32を配置し且つ変調測定光L1Aの光路上に第2レンズ38を配置する必要がある。さらにこの場合には、第1レンズ32の光軸を測定光L1の光路に平行に調整し且つ第2レンズ38の光軸を変調測定光L1Aの光路に平行に調整する必要がある。 For example, in the optical frequency modulator 16 of the first and second embodiments described above, in which a reflective diffraction grating 42 is formed on the outer surface 35 of a cylindrical or cylindrical rotor 34, two types of angle adjustment are required to output the maximum amount of modulated measurement light L1A: adjusting the angle of incidence of the measurement light L1 onto the diffraction grating 42 and adjusting the blazed angle of the diffraction grating 42. Furthermore, if the diffraction grating 42 is a blazed diffraction grating, the measurement light L1 is likely to be diffused when the measurement light L1 is incident obliquely onto the diffraction grating 42. Therefore, as shown in FIG. 1, it is necessary to position a first lens 32 in the optical path of the measurement light L1 and a second lens 38 in the optical path of the modulated measurement light L1A. Furthermore, in this case, it is necessary to adjust the optical axis of the first lens 32 parallel to the optical path of the measurement light L1 and the optical axis of the second lens 38 parallel to the optical path of the modulated measurement light L1A.

また例えば、円板と、この円板の中心軸を中心とする同一円周上に沿って複数形成された透過型回折格子と、を有する単純な透過型の光周波数変調器(特開2004-287029号公報の図2参照)では、円板(透過型回折格子)に対して垂直に測定光L1を入射させた場合に最大光量の変調測定光L1A(0次回折光)が同方向に得られる。しかしながら、この場合においても円板に対する測定光L1の入射角度の調整と、円板の角度調整とを含む2種類の角度調整が必要になる。 For example, in a simple transmission-type optical frequency modulator (see Figure 2 of JP 2004-287029 A) that has a disk and multiple transmission-type diffraction gratings formed along the same circumference centered on the central axis of the disk, when measurement light L1 is incident perpendicularly on the disk (transmission-type diffraction grating), modulated measurement light L1A (zeroth-order diffracted light) with the maximum light intensity is obtained in the same direction. However, even in this case, two types of angle adjustment are required: adjusting the angle of incidence of measurement light L1 with respect to the disk, and adjusting the angle of the disk itself.

これに対して第5実施形態の光周波数変調器16では、反射体54の角度調整のみで測定光L1を内周面37(回折格子42B)に垂直入射させて最大光量の変調測定光L1Aを出力可能である。また、測定光L1が正確に回転軸Cに沿って回転体34Bの内部に入射する場合には、反射体54の反射面の角度も回転軸Cに対して45度に定まる。その結果、光学的に難しい調整を行うことなく最大光量の変調測定光L1Aが得られる。さらに、反射体54としてペンタプリズムのような光を90度屈折可能な光学素子を用いた場合には、反射体54の角度調整はより容易になる。さらにまた、第1レンズ32及び第2レンズ38の配置に関しても、ブレーズド回折格子を用いた場合に比べて変調測定光L1A(回折光)の出射方向が計算し易いので、配置(位置)調整が容易になる。 In contrast, the optical frequency modulator 16 of the fifth embodiment can output the maximum intensity of modulated measurement light L1A by simply adjusting the angle of the reflector 54, allowing the measurement light L1 to be perpendicularly incident on the inner surface 37 (diffraction grating 42B). Furthermore, when the measurement light L1 is incident precisely along the rotation axis C into the interior of the rotor 34B, the angle of the reflecting surface of the reflector 54 is also set to 45 degrees with respect to the rotation axis C. As a result, the maximum intensity of modulated measurement light L1A can be obtained without complex optical adjustments. Furthermore, when an optical element capable of refracting light 90 degrees, such as a pentaprism, is used as the reflector 54, adjusting the angle of the reflector 54 becomes easier. Furthermore, the position of the first lens 32 and the second lens 38 is also easier to calculate the emission direction of the modulated measurement light L1A (diffracted light) than when a blazed diffraction grating is used, facilitating adjustment of their placement (position).

[その他]
上記各実施形態では、光周波数変調器16により測定光L1を周波数変調しているが、参照光L2を周波数変調してもよい。
[others]
In each of the above embodiments, the measurement light L1 is frequency-modulated by the optical frequency modulator 16, but the reference light L2 may also be frequency-modulated.

上記各実施形態では、光ヘテロダイン干渉計測法を用いて測定対象物9までの距離及び測定対象物9の変位を計測する計測装置10に用いられる光周波数変調器16を例に挙げて説明したが、各種用途で用いられる光周波数変調器に本発明を適用可能である。 In the above embodiments, an optical frequency modulator 16 used in a measurement device 10 that measures the distance to and displacement of a measurement object 9 using optical heterodyne interferometry has been described as an example, but the present invention can be applied to optical frequency modulators used for a variety of purposes.

9 測定対象物
9a 再帰反射部材
10 計測装置
12 レーザ光源
14 ハーフミラー
16 光周波数変調器
18 ハーフミラー
20 受光部
22 演算装置
30 第1ミラー
32 第1レンズ
34,34A~34C 回転体
35 外周面
35a 溝
35b スリット
36 駆動部
37 内周面
38 第2レンズ
40 第2ミラー
42,42A,42B 回折格子
50 曲面
54 反射体
C 回転軸
L レーザ光
L1 測定光
L1A 変調測定光
L2 参照光
LR 反射光
P 入射位置
SG 干渉信号
9 Measurement object 9a Retroreflective member 10 Measuring device 12 Laser light source 14 Half mirror 16 Optical frequency modulator 18 Half mirror 20 Light receiving unit 22 Calculating device 30 First mirror 32 First lens 34, 34A to 34C Rotating body 35 Outer surface 35a Groove 35b Slit 36 Driving unit 37 Inner surface 38 Second lens 40 Second mirror 42, 42A, 42B Diffraction grating 50 Curved surface 54 Reflector C Rotation axis L Laser light L1 Measurement light L1A Modulated measurement light L2 Reference light LR Reflected light P Incident position SG Interference signal

Claims (2)

回転軸を有し且つ前記回転軸に平行な方向に延びた円筒状の回転体であって、前記回転軸を中心として等速回転する回転体と、
前記回転体の周面に複数形成され且つ前記回転軸に平行な複数の透過型回折格子であって、回転中の前記回転体の前記周面に入射した入射光を周波数変調し、周波数変調した回折光を出射する複数の透過型回折格子と、
を備え
前記透過型回折格子が、前記回転体の外周面から前記回転体の内部に入射する前記入射光を周波数変調する光周波数変調器。
a cylindrical rotor having a rotation axis and extending in a direction parallel to the rotation axis, the rotor rotating at a constant speed around the rotation axis;
a plurality of transmission type diffraction gratings formed on the circumferential surface of the rotating body and parallel to the rotation axis, the transmission type diffraction gratings frequency-modulating incident light that is incident on the circumferential surface of the rotating body during rotation and emitting frequency-modulated diffracted light;
Equipped with
The optical frequency modulator includes a transmission type diffraction grating that modulates the frequency of the incident light that enters the interior of the rotating body from the outer peripheral surface of the rotating body .
前記回転体の回転速度及び回転方向を制御する駆動部を備える請求項に記載の光周波数変調器。 2. The optical frequency modulator according to claim 1 , further comprising a drive unit for controlling the rotation speed and direction of the rotor.
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Publication number Priority date Publication date Assignee Title
JP2002514301A (en) 1996-12-04 2002-05-14 ザ・リサーチ・ファンデーション・オブ・シティ・ユニバーシティ・オブ・ニューヨーク Apparatus and method for selectively performing optical measurement
JP2020056658A (en) 2018-10-01 2020-04-09 株式会社豊田中央研究所 An optical heterodyne detector and a laser radar device using the optical heterodyne detector.
JP2020106284A (en) 2018-12-26 2020-07-09 沖電気工業株式会社 Doppler vibrometer, doppler vibrometer measurement method, and measurement program
JP2020165700A (en) 2019-03-28 2020-10-08 セイコーエプソン株式会社 Frequency shifter type optical modulator and laser Doppler measuring device

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JP2020056658A (en) 2018-10-01 2020-04-09 株式会社豊田中央研究所 An optical heterodyne detector and a laser radar device using the optical heterodyne detector.
JP2020106284A (en) 2018-12-26 2020-07-09 沖電気工業株式会社 Doppler vibrometer, doppler vibrometer measurement method, and measurement program
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