JP7754261B2 - Analysis device, analysis method, and analysis program - Google Patents

Description

The present invention relates to the visualization of manufacturing history, and in particular to the visualization of manufacturing history of sheet products.

When processing sheet products, the sheet is pulled from a roll, subjected to surface treatment and heat treatment in each device the sheet passes through, and then stored as a roll again. This process is repeated. When sheet products are manufactured in this way through multiple manufacturing processes, if an abnormality occurs in the product, it is often difficult to determine the manufacturing conditions history for the area where the abnormality occurred. For this reason, technologies for comparing data acquired in multiple processes are being investigated. Patent Documents 1 and 2, for example, disclose such technologies for comparing data acquired in multiple processes.

The foreign matter inspection method of Patent Document 1 relates to a method for determining whether foreign matter detected in multiple inspection processes in a sheet product is the same. In the foreign matter inspection method of Patent Document 1, foreign matter detected in each inspection process is displayed on a map based on the coordinates in the long side direction of the sheet, and whether the areas where the foreign matter exists overlap is used to determine whether they are the same foreign matter. Furthermore, the sheet product quality monitoring system of Patent Document 2 manages the position of defects calculated from the unwinding length by linking it with data on the operating status of the manufacturing equipment.

Japanese Patent Application Laid-Open No. 2019-191127 JP 2010-70386 A

However, the technology in Patent Document 1 is insufficient in the following respects. While the technology in Patent Document 1 determines whether foreign objects detected in each inspection process are the same, workers must search for and compare historical data on manufacturing conditions at the location where the foreign object was detected for each process, which can require complex and extensive work. Furthermore, while the technology in Patent Document 2 also associates data on the operating status of the equipment with inspection data, it is unable to associate how the historical data on the operating status of the equipment changed at the time the foreign object was detected. Therefore, the technologies in Patent Documents 1 and 2 are insufficient as technologies for examining historical data on manufacturing conditions for each process at the location where an abnormality was detected when an abnormality occurred.

In order to solve the above problems, the present invention aims to provide an analysis device or the like that can easily reference data that associates manufacturing history data from multiple processes at each location on a sheet.

To solve the above problem, the analysis device of the present invention includes a data acquisition unit, a position identification unit, and a display unit. The data acquisition unit acquires manufacturing history data for multiple processes when manufacturing a sheet. The position identification unit associates manufacturing history data that are located at the same position in the long side direction of the sheet across multiple processes. The display unit displays the manufacturing history data that are located at the same position in the long side direction in association with each other at corresponding positions on a map showing the sheet.

The solution of the present invention acquires manufacturing history data for multiple processes when manufacturing a sheet. The solution of the present invention associates manufacturing history data that are located at the same position in the long side direction of the sheet between multiple processes. The solution of the present invention associates and displays manufacturing history data that are located at the same position in the long side direction of the sheet at corresponding positions on a map showing the sheet.

The analysis program of the present invention causes a computer to execute a process for acquiring manufacturing history data for multiple processes when manufacturing a sheet. The analysis program of the present invention causes a computer to execute a process for associating manufacturing history data that are located at the same position in the long side direction of the sheet between multiple processes. The analysis program of the present invention causes a computer to execute a process for associating and displaying manufacturing history data that are located at the same position in the long side direction of the sheet at corresponding positions on a map showing the sheet.

This invention makes it easy to access data that associates manufacturing history data from multiple processes at each location on the sheet.

1 is a diagram illustrating an outline of a configuration of a first exemplary embodiment of the present invention. 1 is a diagram illustrating a configuration of an analysis device according to a first exemplary embodiment of the present invention. FIG. 3 is a diagram illustrating an operation flow of the analysis device according to the first exemplary embodiment of the present invention. FIG. 2 is a diagram illustrating an example of data processing according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. FIG. 2 is a diagram illustrating an example of a display screen according to the first embodiment of the present invention. 2A to 2C are diagrams schematically illustrating an example of a manufacturing process according to the first embodiment of the present invention. FIG. 10 is a diagram illustrating a configuration of an analysis device according to a second exemplary embodiment of the present invention. FIG. 10 is a diagram showing an operation flow of an analysis device according to a second exemplary embodiment of the present invention. FIG. 10 is a diagram illustrating another example of the configuration of the present invention.

(First embodiment)
A first embodiment of the present invention will be described in detail with reference to the drawings. Fig. 1 is a diagram showing an outline of the configuration of a quality control system according to this embodiment. The quality control system according to this embodiment includes an analysis device 10 and a management device 20. The quality control system according to this embodiment has a function in which the management device 20 collects historical data from each step in the sheet manufacturing process, and the analysis device 10 displays the historical data from each step in the manufacturing process at each position along the long side of a map corresponding to the sheet, overlaid on the map.

The management device 20 is connected via a network to each device and inspection device in the sheet manufacturing process. Figure 1 shows an example in which the management device 20 is connected to a coating device, a drying device, and an inspection device. Figure 1 shows an example in which two coating devices, two drying devices, and two inspection devices are installed, but the types and number of devices are not limited to those shown in Figure 1. Also, Figure 1 shows an example in which processing and inspection are performed in each process while the sheet is unwound from the roll and wound onto the roll, but unwounding and winding from the roll may occur multiple times in the product manufacturing process.

The configuration of the analysis device 10 will now be described. Figure 2 is a block diagram showing the configuration of the analysis device 10. The analysis device 10 includes a data acquisition unit 11, a position identification unit 12, an input acceptance unit 13, and a map display unit 14.

The data acquisition unit 11 acquires historical data on manufacturing conditions and inspection data for each device during sheet manufacturing from the management device 20. A sheet is a product whose long side is longer than its short side and whose thickness is thin. A sheet is also called a film.

The data acquisition unit 11 acquires data related to the manufacture of seats as historical data on manufacturing conditions. Hereinafter, historical data on manufacturing conditions will also be referred to as manufacturing history data. The data acquisition unit 11 acquires data related to the manufacture of seats, including data on materials, workers, measurements and inspections, equipment, work methods, and the environment.

Material data may include, for example, the material's part number, lot number, amount used, secondary material part number, secondary material lot number, and amount used. Material data may also include information on the start and end times of supply for each lot to the manufacturing process. Material data may also include quality data for finished and intermediate products. Quality data may include, for example, length, foreign matter occurrence status, wrinkle occurrence status, scratch occurrence status, film thickness, and storage period. Occurrence status refers to, for example, shape, position, and number.

Data acquired as worker data includes the ID of the worker who performed the work, the work content, the start time of the work, and the completion time of the work. Data acquired as worker data may also include inspection records, repair content, and setup records. Setup records include, for example, records of jig replacement, equipment test runs, and cleaning work.

Measurement and inspection data includes, for example, product part numbers, lot numbers, measuring instrument identification numbers, and inspection machine identification numbers. Measurement and inspection data includes product quality data. Product quality data includes, for example, product film thickness, surface temperature, defects, MI (Melt Index) value, and EW (Equivalent Weight) value. Defects include, for example, data related to foreign matter, wrinkles, and scratches on the product.

Equipment data includes, for example, the name of the equipment used in production, the machine number, operation start time, operation stop time, equipment stop duration, and the reason for the stop. Equipment setting parameter data is also acquired. Equipment parameters include, for example, heating temperature, heating time, temperature rise rate, feed speed, winding speed, pressure, tension, coating amount, ion concentration, rotation speed, and extrusion amount.

Work method data includes, for example, basic QC (Quality Control) process chart items, process number, process name, procedure number, procedure name, processing conditions, construction method, equipment setting values, measuring instrument setting values, inspection device setting values, equipment management method, standard work method, and standard work time data.

Environmental data includes, for example, data on the temperature, humidity, air pressure, and particle amount inside the building. Furthermore, the data related to sheet manufacturing listed above is merely an example, and data on all items need not be acquired, and data on items other than those listed above may also be acquired.

The position identification unit 12 associates the manufacturing process history data with corresponding positions in the long side direction of the sheet. The position identification unit 12 also converts the time-series history data into position data corresponding to positions in the long side direction of the sheet, and associates the history data with the corresponding positions on the sheet. By associating the time-series history data with position data corresponding to positions in the long side direction on the sheet, it is possible to visualize which position on the sheet the time-series history data corresponds to in the manufacturing history. The position data is represented by the distance from the leading edge of the sheet in the long side direction. The leading edge of the sheet refers to the edge that first enters the device after being pulled from the roll. The long side direction of the sheet corresponds to the sheet transport direction. The position identification unit 12 converts the time in the time-series data into a position in the long side direction of the sheet based on the sheet transport start time and transport speed.

The input acceptance unit 13 accepts input of the selection results of data items by the worker. The input acceptance unit 13 acquires the selection results from the input device when the worker selects a data item to display. The selection results are input, for example, by clicking with a mouse on a data item displayed on the screen to select it. The selection results may also be input by the worker touching a data item displayed on a display device equipped with a touch panel. The input acceptance unit 13 may also accept input of the selection results of data items by recognizing the worker's voice. When accepting input through voice recognition, the input acceptance unit 13 is connected to a microphone that acquires the worker's voice.

The map display unit 14 generates data that overlays each historical data of the manufacturing process during sheet manufacturing with the inspection data. The map display unit 14 generates data that associates each piece of data with its position along the long side of the sheet, generating map data. The map display unit 14 also outputs a map based on the generated map data to the display device. The map display unit 14 outputs display data used when selecting data items to display, along with the map, to the display device.

Management device 20 acquires data from each device and inspection device in the sheet manufacturing process and stores the acquired data. Management device 20 sends data used by analysis device 10 for analysis to analysis device 10. Management device 20 may acquire inspection data from multiple inspection devices in intermediate and final processes when manufacturing sheets. Management device 20 may also acquire inspection data from inspection devices in multiple inspection processes in intermediate processes. Management device 20 may also acquire inspection data from inspection devices that perform inspections only in either intermediate or final processes. Management device 20 may also be provided as part of a production management system that instructs each device to start processing and set manufacturing conditions.

The operation of the quality control system of this embodiment will be described. Figure 3 is a diagram showing the operational flow of the analysis device 10. During sheet manufacturing, each device and inspection device in the manufacturing process stores history data and inspection data. The management device 20 acquires history data from each device and inspection device at predetermined intervals. The predetermined intervals are set in hours or days. The management device 20 may also acquire history data from each device and inspection device at predetermined lot intervals or when the type of product being manufactured is changed. The management device 20 stores the history data acquired from each device and inspection device in a storage device either inside the device or connected to the management device 20.

In FIG. 3, the data acquisition unit 11 of the analysis device 10 acquires historical data for the lot to be analyzed from the management device 20 (step S11). The items of historical data to be acquired are set in advance for each type of sheet, for example. The lot to be analyzed and the items of historical data to be acquired may be selected by the operator.

When the data acquisition unit 11 acquires the history data, the position identification unit 12 associates the history data with a position on the long side of the sheet (step S12). For example, if the history data is data recording temperature data within the device at each time, i.e., a time-series temperature data, the position identification unit 12 converts the time into a corresponding position on the long side of the sheet. The position identification unit 12 converts the time data into position data on the sheet based on the time when the leading edge of the sheet entered the area where temperature data is being acquired and the sheet transport speed.

For example, when the sheet conveying speed is A (m/sec) and the time when the leading edge of the sheet enters the area where temperature data is acquired is _t0 , the position specifying unit 12 calculates the position of the sheet in the long side direction at time t using the distance D (m) from the leading edge of the sheet as D = (t - _t0 ) x A. When the conveying speed is measured in seconds, the position specifying unit 12 calculates (t - _t0 ) as the time difference measured in seconds.

If the acquired data is the length from a midpoint along the long side of the sheet, the position identification unit 12 converts the acquired data into data on the distance from the edge of the long side of the sheet. If the acquired data is data on the distance from the edge of the sheet, the acquired data is used as is.

Once the position identification unit 12 converts each piece of data into data associated with a position in the long side direction of the sheet, the map display unit 14 generates map data that displays each piece of data associated with a position in the long side direction of the sheet on a map (step S13). Once the map data is generated, the map display unit 14 displays the generated map data on the display device (step S14).

Figure 4 shows examples of history data and map data. The upper left section of Figure 4 shows an example of history data for temperatures in a manufacturing device. The history data in the upper left section of Figure 4 is time and temperature data, so the position identification unit 12 converts the time and temperature data into position and temperature data. The data in the lower left section of Figure 4 shows an example of inspection data, showing an example of wrinkles occurring in part of the sheet. The numbers below the sheet in the lower left section of Figure 4 indicate the distance from the edge of the sheet. The lower left section of Figure 4 is an enlarged view of the range from 300 mm to 500 mm from the leading edge of the sheet.

The map display unit 14 generates data correlating temperature and wrinkles by position in the long side direction, generating map data such as that shown on the right side of Figure 4. The map data on the right side of Figure 4 is generated as a map in which temperature changes and wrinkles in the long side direction of the sheet are superimposed. The numbers below the sheet on the right side of Figure 4 indicate the distance from the leading edge of the sheet. The right side of Figure 4 shows the area from the leading edge of the sheet to approximately 600 mm. In addition, the diagram on the right side of Figure 4 indicates the temperature fluctuations when processed using the heater shown in the upper right part of Figure 4 using point density. For example, the high point density around 400 mm indicates that the temperature is higher than other areas when processed using the heater. By referring to a map such as the one on the right side of Figure 4, the worker can recognize that wrinkles have occurred approximately 400 mm from the leading edge of the sheet, where the temperature is higher than in other areas. By referring to a map showing high temperatures near the location of wrinkles on the sheet, the worker can infer that temperature changes are the cause of the wrinkles.

Figure 5 shows an example of a display screen in which the inspection results, displayed as a map, are associated with the temperature data's position along the long side, and displayed as a graph. The numbers at the bottom of the map in Figure 5 indicate the distance from the leading edge of the sheet. The graph at the bottom of Figure 5 also associates the temperature data for process A with each position on the map, with the vertical axis indicating high and low temperatures. In the example of Figure 5, by displaying the temperature data in association with the inspection results and the position along the long side, based on the same data as in Figure 4, workers can more easily recognize temperature changes at the location where wrinkles have occurred by looking at the changes in the graph.

Next, we will explain how to change the displayed history data items. Figure 6 is a schematic diagram of an example display screen in which the operator selects the data items to be displayed. In the example display screen in Figure 6, buttons for inspection and history data items, such as "Inspection," "Process A Temperature," "Process B Pressure," and "Process B Discharge Volume," are displayed on the left side. When the operator clicks on an item to be displayed using the mouse, the selection results for the items to be displayed on the map display unit 14 are sent via the input reception unit 13. In the example in Figure 6, "Inspection," "Process A Temperature," and "Process B Discharge Volume" are selected, and the map display unit 14 generates data that combines the inspection results displayed on the map with graphical data for the temperature in process A and the discharge volume in process B corresponding to the position along the long side of the map. Data selection may be performed by the operator touching a button on a touch-panel display device. Alternatively, a selection may be canceled by clicking or touching the selected area again with the mouse.

Next, we will explain the case where display data candidates are displayed by clicking on the map or touching the screen. Figure 7 shows an example where only the sheet inspection results are displayed. In Figure 7, when the worker clicks on the wrinkled area with the mouse or touches the screen, the map display unit 14 displays candidate items of history data for the related process, as shown in Figure 8. When the worker selects an item to display from the candidate history data, the map display unit 14 displays the data for the selected item on a map and graph, as shown in Figure 9. The example in Figure 9 shows the case where "Process A Temperature," "Process B Pressure," and "Process B Discharge Volume" have been selected. Based on the display screen like that in Figure 9, the worker can infer that the temperature in Process A has changed while the other items have not changed, and therefore that the wrinkles are caused by the temperature in Process A.

Next, we will explain an example of displaying information about lots related to a lot whose inspection results are displayed. Figure 10 shows an example in which related lot numbers are displayed when a wrinkled area or map is clicked on a screen like that of Figure 5. Related lots are pre-set, such as several lots before or after the displayed lot. Also, lots that were processed under the same conditions or using the same material rod as the displayed lot may be set as related lots. Also, lots that were processed between pre-processing maintenance and post-processing maintenance of the equipment that processed the displayed lot may be set as related lots. Clicking on the number of a related lot may also display the inspection results and history data for the clicked lot. In this way, by displaying information about related lots, when an abnormality occurs, it is easy to check whether or not there are any abnormalities in other lots.

Next, an example of displaying data from multiple sheets will be described. Figure 11 shows an example of displaying two sheets of maps. By displaying multiple sheets in this way, it is possible to determine whether the change occurred only in the lot in which the abnormality occurred, or whether the abnormality is common to multiple lots, making it easier to deduce the cause of the abnormality. Displaying multiple sheets also makes it possible to determine whether the abnormality occurred over a period longer than the production time of one sheet. Also, while Figure 11 shows an example of two sheets, three or more sheets may be displayed. When displaying three or more sheets, for example, by displaying sheets for lots before and after the lot in which the abnormality occurred, it is easier to determine whether the abnormality occurred in other lots.

The above explanation shows an example of displaying one or more sheets, but it is also possible to enlarge and display only a portion of a sheet. It is also possible to display the entire sheet and an enlarged portion at the same time. By being able to change the display range in response to operator operation, it becomes easier to analyze the cause of an abnormality.

While the above explanation shows an example of displaying temperature changes in the long axis direction, temperature changes in the short axis direction can also be displayed. In Figure 12, film thickness data in the short axis direction is displayed around 200 mm, where the defect, indicated by a square on the map, occurred. Temperature data is also displayed around 600 mm. In a case like Figure 12, temperature and film thickness data are measured by sensors located at several points along the rotation direction and recorded as two-dimensional data. If the film thickness and temperature values are higher on the right side of the figure, it can be seen that the defects in the section 200 to 400 mm from the leading edge of the sheet are caused by thin film thickness. It can also be seen that the defects in the section 600 to 800 mm from the leading edge of the sheet are caused by high temperature. By displaying the temperature distribution and film thickness distribution in the short axis direction in relation to the position in the long axis direction in this way, the causes of abnormalities can be analyzed in more detail.

While the above explanation focuses on an example of a sheet drawn from a single roll, the above example may also apply to a sheet formed by laminating sheets drawn from multiple rolls. The lamination of multiple sheets is also called laminating. Figure 13 is a schematic diagram showing sheets drawn from three rolls laminated together, processed and inspected in each device, and then wound into a single roll. In the system shown in Figure 13, the historical data and inspection data from the manufacturing of each roll are displayed as a map by correlating the historical data and inspection data from each process after the sheets are laminated with the position along the long side. This configuration makes it easy to identify whether an abnormality occurred in a process before or after lamination, even for sheets manufactured by laminating multiple sheets. When laminating multiple sheets, the data is associated based on the position along the long side of each sheet from its leading edge when laminating.

In the quality control system of this embodiment, the management device 20 collects device history data and inspection data, and the analysis device 10 associates data that are located at the same position on the sheet. The analysis device 10 also associates and displays data that are located at the same position on the sheet. Therefore, by using the quality control system of this embodiment, it is possible to easily refer to data that associates history data from multiple processes at each location on the sheet. As a result, the quality control system of this embodiment associates and displays history data and inspection data that are located at the same position, making it easy to identify the cause when an abnormality occurs in a manufactured sheet.

Second Embodiment
A second embodiment of the present invention will be described in detail with reference to the drawings. FIG. 14 is a diagram showing an outline of the configuration of an analysis device of this embodiment. The analysis device of this embodiment includes a data acquisition unit 101, a position identification unit 102, and a map display unit 103. The data acquisition unit 101 acquires manufacturing history data for multiple processes in manufacturing a sheet. Specifically, the data acquisition unit 101 acquires, for example, manufacturing history data and inspection data for each device in manufacturing the sheet. The position identification unit 102 associates history data that are located at the same position in the long-side direction of the sheet across multiple processes. The map display unit 103 associates and displays manufacturing history data that are located at the same position in the long-side direction of the sheet at corresponding positions on a map showing the sheet. Specifically, the position identification unit 102 associates manufacturing history data and inspection data that are located at the same position in the long-side direction of the sheet, and the map display unit 103 displays the associated data on a map.

Here, the data acquisition unit 11 of the first embodiment is an example of the data acquisition unit 101. The data acquisition unit 101 is also one aspect of data acquisition means. The position identification unit 12 of the first embodiment is an example of the position identification unit 102. The position identification unit 102 is also one aspect of position identification means. The map display unit 103 is an example of the map display unit 14 of the first embodiment. The map display unit 14 is also one aspect of map display means.

The operation of the analysis device of this embodiment will now be described. Figure 15 is a diagram showing the operation flow of the analysis device of this embodiment. The data acquisition unit 101 of the analysis device acquires manufacturing history data for multiple processes when manufacturing a sheet (step S21). Once the manufacturing history data has been acquired, the position identification unit 102 associates manufacturing history data that are located at the same position in the long side direction of the sheet across multiple processes (step S22). Once the manufacturing history data that are located at the same position have been associated, the map display unit 103 displays the manufacturing history data that are located at the same position in the long side direction in association with each other at corresponding positions on the map showing the sheet (step S23).

The analysis device of this embodiment associates manufacturing history data for multiple processes that are located at the same position along the long side of the sheet, and displays the data in association with each other at corresponding positions on a map representing the sheet. Therefore, by using the analysis device of this embodiment, it is possible to refer to data on a map that associates manufacturing history data for multiple processes at each location on the sheet, making it possible to visualize and compare the manufacturing history between multiple processes in the sheet's manufacturing process.

The processes in the analysis device 10 of the first embodiment and the analysis device of the second embodiment can be performed by executing a computer program on a computer. Figure 16 shows an example of the configuration of a computer 200 that executes a computer program that performs the processes in the analysis device 10 of the first embodiment and the analysis device of the second embodiment. The computer 200 includes a CPU (Central Processing Unit) 201, memory 202, a storage device 203, an input/output I/F (Interface) 204, and a communication I/F 205. The management device 20 of the first embodiment can also have a similar configuration.

The CPU 201 reads and executes computer programs that perform each process from the storage device 203. The memory 202 is composed of a DRAM (Dynamic Random Access Memory) or the like, and temporarily stores the computer programs executed by the CPU 201 and data being processed. The storage device 203 stores the computer programs executed by the CPU 201. The storage device 203 is composed of, for example, a non-volatile semiconductor storage device. Other storage devices such as a hard disk drive may also be used for the storage device 203. The input/output I/F 204 is an interface that accepts input from workers and outputs display data, etc. The communication I/F 205 is an interface that sends and receives data between each device and the worker's terminal, etc.

The computer programs used to execute each process can also be stored on a recording medium and distributed. Examples of recording media that can be used include magnetic tape for recording data and magnetic disks such as hard disks. Optical disks such as CD-ROMs (Compact Disc Read Only Memory) can also be used as recording media. Non-volatile semiconductor storage devices can also be used as recording media.

REFERENCE SIGNS LIST 10 Analysis device 11 Data acquisition unit 12 Position identification unit 13 Input reception unit 14 Map display unit 20 Management device 101 Data acquisition unit 102 Position identification unit 103 Map display unit 200 Computer 201 CPU
202 Memory 203 Storage device 204 Input/output I/F
205 Communication I/F

Claims (10)

a data acquisition means for acquiring manufacturing history data of a plurality of processes in manufacturing a sheet and inspection results of the sheet ;
a position specifying means for associating the manufacturing history data and the inspection results with positions on the sheet in the long side direction;
an input receiving means for acquiring a process and a data item selected on a selection screen for selecting a process and a data item for displaying a manufacturing history;
and a map display means for displaying the manufacturing history data of a selected process and data item from the manufacturing history data of the plurality of processes and the inspection results in association with corresponding positions in a long side direction of a map showing the sheet. 2. The analysis device according to claim 1, wherein the map display means displays buttons on the selection screen for selecting processes and data items for displaying the manufacturing history, and displays the manufacturing history data for the process and data item corresponding to the selected button in association with a corresponding position in the long side direction of the map showing the sheet . 3. The analysis device according to claim 1 , wherein the map display means displays the distribution of the selected data item in the short side direction of the sheet by superimposing it on the map showing the sheet at a position corresponding to the long side direction of the map . 4. The analysis device according to claim 1 , wherein the map display means displays at least one of historical data relating to equipment and historical data relating to work performed by workers in association with positions in the long side direction of the sheet . 5. The analysis device according to claim 1 , wherein the data acquisition means acquires manufacturing history data and inspection results of a plurality of processes after laminating the sheets together when manufacturing a sheet made by laminating the sheets together . the data acquisition means further acquires manufacturing history data and inspection results of a plurality of processes in manufacturing each of the sheets before lamination;
The analysis device according to claim 5, wherein the map display means displays at least one of the manufacturing history data and the inspection results selected for the sheets before bonding, in association with a corresponding position in the long side direction of the map showing the inspection results for the sheets after bonding. The analysis device according to claim 4 , wherein the historical data relating to the facility includes at least one of an operating state of the facility and a facility parameter. 8. The analysis apparatus according to claim 1, wherein the map display means displays information about a lot related to a defect when the defect is selected on the map. Acquire manufacturing history data of a plurality of processes in manufacturing the sheet and inspection results of the sheet ;
The manufacturing history data and the inspection results are associated with positions on the sheet in a long side direction;
Acquire the process and data item selected on a selection screen for selecting the process and data item for which the manufacturing history is to be displayed;
An analysis method for displaying the manufacturing history data of a selected process and data item from the manufacturing history data of the plurality of processes and the inspection results in association with corresponding positions in the long side direction of a map showing the sheet. A process of acquiring manufacturing history data of a plurality of processes in manufacturing a sheet and inspection results of the sheet ;
a process of associating the manufacturing history data and the inspection results with positions on the sheet in the long side direction;
A process of acquiring the process and data item selected on a selection screen for selecting the process and data item for displaying the manufacturing history;
and displaying the manufacturing history data of a selected process and data item from the manufacturing history data of the plurality of processes and the inspection results in association with the corresponding positions in the long side direction of a map showing the sheet.