JP7754271B2 - Inspection Socket - Google Patents

Description

This disclosure relates to a test socket.

Patent Document 1 describes an inspection jig used for continuity testing and characteristic measurement of electronic modules.

Japanese Patent Application Laid-Open No. 2022-135106

The inspection socket, including the inspection jig described in Patent Document 1, has multiple probe pins. The probe pins are arranged side by side at intervals and housed in a housing, electrically isolated from one another. However, if the spacing between terminals on the object the inspection socket contacts (e.g., a connector) is narrow, the spacing between the probe pins that contact each terminal must be narrow. If the spacing between the probe pins is narrow, poor contact may occur during inspection.

The purpose of this disclosure is to provide an inspection socket with high contact reliability.

The test socket of one aspect of the present disclosure includes:
Housing and
a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing;
the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction,
the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction,
the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction;
the second probe pin and the fourth probe pin are arranged side by side in the third direction;
a first contact point of each of the first probe pin, the second probe pin, the third probe pin, and the fourth probe pin has an inclined surface that can come into contact with a contact object;
the second contact point of the first probe pin is located on one side in the second direction with respect to the second contact point of the third probe pin;
The second contact point of the second probe pin is located on one side in the second direction relative to the second contact point of the fourth probe pin.

This disclosure provides an inspection socket with high contact reliability.

1 is a perspective view of a test socket according to one embodiment of the present disclosure; FIG. 2 is an exploded perspective view of the test socket of FIG. 1; FIG. FIG. FIG. 5 is a cross-sectional view taken along line AA in FIG. 4. FIG. 5 is a cross-sectional view taken along line BB in FIG. 4 . FIG. 6 is a cross-sectional view showing a first modified example of the probe pin of FIG. 5 . FIG. 7 is a cross-sectional view showing a first modified example of the probe pin of FIG. 6 . FIG. 6 is a cross-sectional view showing a second modified example of the probe pin of FIG. 5 . FIG. 7 is a cross-sectional view showing a second modified example of the probe pin of FIG. 6 .

An example of the present disclosure will now be described with reference to the accompanying drawings. The following description is merely exemplary in nature and is not intended to limit the present disclosure, its applications, or uses. The drawings are schematic, and the proportions of the dimensions do not necessarily correspond to reality. Furthermore, in the following description, terms indicating specific directions or positions (e.g., terms including "upper," "lower," "right," "left," "front," and "rear") are used as necessary. However, the use of terms indicating specific directions or positions is intended to facilitate understanding of the present disclosure with reference to the drawings, and the meanings of these terms do not limit the technical scope of the present disclosure.

As shown in Figures 1 and 2, the test socket 1 of one embodiment of the present disclosure comprises housings 2, 3, 4, 5, and 6, and a plurality of plate-shaped probe pins 7 housed inside the housings 2, 3, 4, 5, and 6.

As shown in FIG. 2, housing 2 has through-holes 2A and 2B that penetrate housing 2 in the vertical direction (e.g., the Z direction shown in each figure). The vertical direction and Z direction are examples of the first direction. In this embodiment, in the vertical direction, the side on which housing 2 is located is the upper side, and the side on which housing 6 is located is the lower side.

The housing 3 has a base 31 and a protruding portion 32 that protrudes upward from the base 31. Here, "protruding upward" means "protruding in the direction from housing 6 toward housing 2 along the first direction." The protruding portion 32 has a recess 3A that is recessed downward. Here, "recessed downward" means "recessed in the direction from housing 2 toward housing 6 along the first direction." The protruding portion 32 has a bottom surface 31B that forms the recess 31A, with multiple through holes 3B that penetrate the protruding portion 32 in the vertical direction. Each of the multiple through holes 3B corresponds to one of the multiple probe pins 7.

The housing 4 has through holes 4A and 4B that penetrate the housing 4 in the vertical direction.

The housing 5 holds multiple probe pins 7 in an array as shown in Figure 2.

The housing 6 has a pin 61 that protrudes upward and a recess 6A that is recessed downward from the top surface (in other words, the outer surface of the housing 6 that faces the housing 4). The housing 6 has multiple through holes 6B that penetrate the housing 6 in the vertical direction on the bottom surface that forms the recess 6A. Each of the multiple through holes 6B corresponds to one of the multiple probe pins 7.

The lower portion of the housing 5, which holds the probe pins 7, is housed in the recess 6A of the housing 6. The lower portion of the housing 5 is the portion of the housing 5 closest to the housing 6 in the first direction. At this time, the second contacts 121, 122, 752, 762 (see Figure 3) of each probe pin 7 are exposed to the outside of the test socket 1 through the through-hole 6B.

Housings 2, 3, and 4 are assembled above housing 6, which houses housing 5. Housings 2, 3, and 4 are assembled to housing 6 from below in the order of housings 4, 3, and 2.

Pin 61 of housing 6 passes through through-hole 4B of housing 4 and through-hole 2B of housing 2. This positions housings 2 and 4 relative to housing 6.

The protrusion 32 of the housing 3 penetrates the through-hole 2A of the housing 2 from below. This exposes the protrusion 32 to the outside of the test socket 1, and positions the housing 3 relative to the housing 2.

The first connection portion 11 (see Figures 5 and 6) of each probe pin 7 passes through the through-hole 4A of the housing 4 from below. The first contacts 111, 751, 761 (see Figure 3) of each probe pin 7 are exposed to the outside of the test socket 1 through the through-hole 3B of the housing 3.

The test socket 1 is connected to a test device (not shown), and the contact object 8 (see Figures 4, 5, and 6) is connected to the test socket 1. In this connected state, continuity between the contact object 8 and the test device is tested.

The test socket 1 is placed on a circuit board provided in the test device. As a result, the second contacts 121, 122, 752, and 762 (see Figure 3) of each probe pin 7 exposed to the outside of the test socket 1 through the through-hole 6B are electrically connected to conductive pads formed on the circuit board.

The contact object 8 shown in Figures 4, 5, and 6 is fitted into the recess 3A of the housing 3. As shown in Figures 5 and 6, the contact object 8 has a plurality of terminals 81. When the contact object 8 is fitted into the recess 3A of the housing 3, each terminal 81 is electrically connected to the first contacts 111, 751, 761 (see Figure 3) of each probe pin 7 exposed to the outside of the test socket 1 through the through hole 3B.

As shown in Figures 3 and 4, the probe pins 7 include a first probe pin 71, a second probe pin 72, a third probe pin 73, a fourth probe pin 74, a fifth probe pin 75, and a sixth probe pin 76. At least one of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, the fourth probe pin 74, the fifth probe pin 75, and the sixth probe pin 76 is provided. In this embodiment, the probe pins 7 include 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, two fifth probe pins 75, and two sixth probe pins 76.

In this embodiment, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 are signal terminals, and the fifth probe pin 75 and the sixth probe pin 76 are power terminals or ground terminals. However, the types of each probe pin are not limited to this.

Each of the first probe pins 71, second probe pins 72, third probe pins 73, fourth probe pins 74, fifth probe pins 75, and sixth probe pins 76 are arranged at intervals. In other words, each of the first probe pins 71, second probe pins 72, third probe pins 73, fourth probe pins 74, fifth probe pins 75, and sixth probe pins 76 are electrically insulated from one another.

The first probe pin 71, third probe pin 73, and fifth probe pin 75 are arranged at intervals along the front-to-rear direction (e.g., the Y direction shown in each figure) that intersects (orthogonal in this embodiment) the up-and-down direction of the testing socket 1. The front-to-rear direction and Y direction are the thickness directions of the probe pins 7 and are examples of the third direction. The first probe pins 71 and third probe pins 73 are arranged alternately in the front-to-rear direction.

The two fifth probe pins 75 sandwich the 13 first probe pins 71 and the 13 third probe pins 73 in the front-to-rear direction. In other words, the two fifth probe pins 75 are positioned furthest forward and furthest rearward among the first probe pins 71, third probe pins 73, and fifth probe pins 75.

The second probe pin 72, fourth probe pin 74, and sixth probe pin 76 are arranged at intervals along the front-to-back direction of the test socket 1. The second probe pins 72 and fourth probe pins 74 are arranged alternately in the front-to-back direction.

The two sixth probe pins 76 sandwich the thirteen second probe pins 72 and the thirteen fourth probe pins 74 in the front-to-rear direction. In other words, the two sixth probe pins 76 are positioned furthest forward and furthest rearward among the second probe pins 72, fourth probe pins 74, and sixth probe pins 76.

As shown in FIG. 5, each first probe pin 71 and each second probe pin 72 are arranged opposite each other with a gap in the left-right direction (e.g., the X direction shown in each figure) that intersects both the up-down direction and the front-back direction (in this embodiment, perpendicular to both the up-down direction and the front-back direction). The left-right direction and the X direction are examples of the second direction.

As shown in Figure 6, each third probe pin 73 and each fourth probe pin 74 is arranged opposite each other with a gap in the left-right direction.

In this embodiment, the first probe pin 71 and the fourth probe pin 74 have the same configuration (in other words, the same size and shape). The fourth probe pin 74 is the first probe pin 71, but is positioned in the opposite direction in the left-right direction.

In this embodiment, the second probe pin 72 and the third probe pin 73 have the same configuration (in other words, the same size and shape). The third probe pin 73 is the second probe pin 72, but is positioned in the opposite direction in the left-right direction.

As a result, in this embodiment, the test socket 1 has two types of probe pins 7 instead of four types of probe pins 7 with different configurations. One of the two types of probe pins 7 is probe pins 71 and 74, and the other of the two types of probe pins 7 is probe pins 72 and 73.

As shown in Figure 3, each fifth probe pin 75 and each sixth probe pin 76 are arranged opposite each other with a gap in the left-right direction.

In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 have the same configuration (in other words, the same size and shape). In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 are arranged in opposite directions in the left-right direction. The fifth probe pin 75 and the sixth probe pin 76 are arranged symmetrically with respect to an imaginary line L1 that extends in the up-down direction between the fifth probe pin 75 and the sixth probe pin 76.

The configuration of each probe pin 7 will be described below. In this embodiment, the first probe pins 71, second probe pins 72, third probe pins 73, fourth probe pins 74, probe pins 75, and probe pins 76 have roughly the same configuration. Therefore, the configuration of the first probe pin 71 will be described below, and descriptions of the configurations of the other probe pins will generally be omitted. Note that in each figure, the same reference numerals are used for common configurations. However, configurations of the other probe pins that differ from the first probe pin 71 will be described. In the following description, "left" and "right" in the left-right direction have the following meanings. That is, for the first probe pin 71 and the third probe pin 73, the side facing the curved portion 133 in the left-right direction is the "left," and the side opposite the curved portion 133 is the "right." On the other hand, for the second probe pin 72 and the fourth probe pin 74, the side opposite the curved portion 133 in the left-right direction is the "left" side, and the side facing the curved portion 133 is the "right" side.

As shown in FIG. 5 , the first probe pin 71 includes a first connection portion 11, a second connection portion 12, and an elastic portion 13. The first connection portion 11 is connected to a first end portion 13A, which is one of the ends of the elastic portion 13 in the vertical direction (in this embodiment, the upper end portion of the elastic portion 13). In other words, the lower end portion of the first connection portion 11 (in this embodiment, the end portion closer to the elastic portion 13 in the vertical direction) is connected to the upper end portion of the elastic portion 13. The second connection portion 12 is connected to a second end portion 13B, which is the other of the ends of the elastic portion 13 in the vertical direction (in this embodiment, the lower end portion of the elastic portion 13). In other words, the upper end portion of the second connection portion 12 (in this embodiment, the end portion closer to the elastic portion 13 in the vertical direction) is connected to the lower end portion of the elastic portion 13.

The first connection portion 11 has a first contact 111 provided at the upper end of the first connection portion 11 (in this embodiment, the end farthest from the second connection portion 12 in the vertical direction). The second connection portion 12 has a second contact 121 provided at the lower end of the second connection portion 12 (in this embodiment, the end farthest from the first connection portion 11 in the vertical direction). In other words, the first probe pin 71 has a first contact 111 provided at one end in the vertical direction (in this embodiment, the upper end) and a second contact 121 provided at the other end in the vertical direction (in this embodiment, the lower end).

The elastic portion 13 has a first portion 131, a second portion 132, and a curved portion 133.

The first portion 131 extends in the left-right direction from the first end 13A. The second portion 132 extends in the left-right direction from the second end 13B. The second portion 132 extends on the same side as the first portion 131 in the left-right direction. In the example shown in Figure 5, the first portion 131 extends leftward from the first end 13A, and the second portion 132 extends leftward from the second end 13B.

The curved portion 133 has a curved shape. The curved portion 133 connects the end of the first portion 131 that is farther from the first end 13A (for example, the left end in FIG. 5 ) to the end of the second portion 132 that is farther from the second end 13B (for example, the left end in FIG. 5 ).

The first end 13A and second end 13B of the elastic portion 13 are connected to the first connection portion 11 and the second connection portion 12 from the same side in the left-right direction (the left side in this embodiment). In other words, the elastic portion 13 is located on the same side (the left side in this embodiment) of one side surface (the left side in this embodiment) of the first connection portion 11 in the left-right direction.

The length L2 in the vertical direction between the end 11A to which the first end 13A of the first connection portion 11 is connected and the end 12A to which the second end 13B of the second connection portion 12 is connected is longer than the inner radius R1 of the curve of the elastic portion 13. In this embodiment, the end 11A is the lower end of the first connection portion 11, and the end 12A is the upper end of the second connection portion 12. Also, in this embodiment, the inner radius R1 of the curve of the elastic portion 13 is the inner radius R1 of the curved portion 133.

The elastic portion 13 includes multiple long plate portions 134 (three long plate portions 134A, 134B, and 134C in this embodiment). Each long plate portion 134A, 134B, and 134C spans the first portion 131, the second portion 132, and the curved portion 133.

Each long plate portion 134A, 134B, 134C extends along the length of the elastic portion 13. The length of the elastic portion 13 is the direction in which the elastic portion 13 extends from the first portion 131, through the curved portion 133, to the second portion 132. In other words, the length of the elastic portion 13 is the left-right direction in the first portion 131 and the second portion 132, and is the direction along the curved shape in the curved portion 133.

Each long plate portion 134A, 134B, and 134C is arranged side by side at intervals along the width direction of the elastic portion 13. The width direction of the elastic portion 13 is a direction perpendicular to both the front-to-rear direction (the thickness direction of the probe pin 7 in this embodiment) and the length direction of the elastic portion 13.

The longer the long plate portions 134 are located on the outside of the curved shape of the curved portion 133, the longer they are in the width direction. In this embodiment, long plate portion 134A is longer in the width direction than long plate portion 134B, which is longer in the width direction than long plate portion 134C.

The second portion 132 extends upward toward the right on the page of FIG. 5. In other words, the second portion 132 extends so as to approach the first end 13A in the up-down direction as it approaches the second end 13B in the left-right direction. In other words, the surface that forms the radial inner edge and the surface that forms the radial outer edge of the second portion 132 are inclined surfaces that are inclined with respect to the left-right direction.

The upper edge 12B of the second connection portion 12 extends downward toward the right on the page of FIG. 5. In other words, the edge 12B of the second connection portion 12 on the first connection portion 11 side in the vertical direction (the upper side in this embodiment) extends away from the first connection portion 11 in the vertical direction as it moves away from the elastic portion 13 in the left-right direction. In other words, the edge 12B is an inclined surface that is inclined with respect to the left-right direction. The edge 12B may also extend along the left-right direction. As shown in FIG. 3, the edge 12B of the fifth probe pin 75 and the sixth probe pin 76 extends along the left-right direction.

As shown in FIG. 5, the first contact 111 has a protruding shape and protrudes upward from the upper end of the first connection portion 11 (in this embodiment, in the direction away from the second connection portion 12 in the first direction). The first contact 111 has an inclined surface 111A and a protrusion 111B.

The inclined surface 111A is located on one side of the first contact 111 in the left-right direction. The inclined surface 111A is inclined in the up-down direction so that it moves away from the center line C as it moves away from the elastic portion 13. The center line C is a line that passes through the center of the first connection portion 11 in the left-right direction and extends in the up-down direction.

Protrusion 111B protrudes upward (in the first direction, in this embodiment, in the direction away from second connection portion 12). Protrusion 111B faces in the left-right direction, with a gap between them, relative to inclined surface 111A. The protruding tip (the upper end in this embodiment) of protrusion 111B is located below the upper end of inclined surface 111A and above the lower end of inclined surface 111A. In other words, in the first direction, the protruding tip of protrusion 111B is located between the end of inclined surface 111A that is farther from elastic portion 13 and the end that is closest to it.

The terminal 81 of the contact object 8 can come into contact with the inclined surface 111A and the protrusion 111B. When the contact object 8 is fitted into the recess 3A of the housing 3, the terminal 81 has a U-shaped portion in a side view along the front-to-rear direction. In other words, the terminal 81 has a downwardly convex curved portion at its tip. The inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction.

In this embodiment, the first contact 111 has only one inclined surface that can come into contact with the contact object 8. In other words, in this embodiment, the only inclined surface of the first contact 111 that can come into contact with the contact object 8 is inclined surface 111A.

The second contact 121 has a protruding shape and protrudes downward from the lower end of the second connection portion 12 (in this embodiment, in the direction away from the first connection portion 11 in the first direction). The second contact 121 has a notch 121C. The notch 121C is cut upward from the lower surface of the second contact 121 (toward the first connection portion 11 in the first direction in this embodiment).

The second connection portion 12 has a notch 12C. The notch 12C is provided between the second contact 121 and the second portion 132 of the elastic portion 13. The notch 12C is cut out along the left-right direction from the left-right end of the second connection portion 12.

The first probe pin 71, second probe pin 72, third probe pin 73, and fourth probe pin 74 have differences in their orientation, configuration, etc., as described in detail below.

As shown in FIG. 5, the first probe pin 71 and the second probe pin 72 are arranged opposite each other in the left-right direction with their elastic portions 13 facing outward in the left-right direction. As shown in FIG. 6, the third probe pin 73 and the fourth probe pin 74 are arranged opposite each other in the left-right direction with their elastic portions 13 facing outward in the left-right direction.

As shown in Figures 5 and 6, the inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 are located on the curved portion 133 side of the elastic portion 13 at the first contact 111 in the left-right direction. The inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 face the opposite side of the curved portion 133 of the elastic portion 13 in the left-right direction. The protrusions 111B of the first probe pin 71 and the fourth probe pin 74 are located on the opposite side of the inclined surface 111A from the curved portion 133 of the elastic portion 13 in the left-right direction.

The inclined surface 111A of the first probe pin 71 is located to the left of the first contact 111 on the page of FIG. 5, extends downward toward the right, and faces upward and to the right. The protrusion 111B of the first probe pin 71 is located to the right of the inclined surface 111A of the first probe pin 71 on the page of FIG. 5. The inclined surface 111A of the fourth probe pin 74 is located to the right of the first contact 111 on the page of FIG. 6, extends downward toward the left, and faces upward and to the left. The protrusion 111B of the fourth probe pin 74 is located to the left of the inclined surface 111A of the fourth probe pin 74 on the page of FIG. 6.

As shown in Figures 5 and 6, the inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 are located on the opposite side of the first contact 111 from the elastic portion 13 in the left-right direction. The inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 face the curved portion 133 of the elastic portion 13 in the left-right direction. The protrusions 111B of the second probe pin 72 and the third probe pin 73 are located on the elastic portion 13 side of the inclined surfaces 111A in the left-right direction.

The inclined surface 111A of the second probe pin 72 is located to the left of the first contact 111 on the page of FIG. 5, extends downward toward the right, and faces upward and to the right. The protrusion 111B of the second probe pin 72 is located to the right of the inclined surface 111A of the second probe pin 72 on the page of FIG. 5. The inclined surface 111A of the third probe pin 73 is located to the right of the first contact 111 on the page of FIG. 6, extends downward toward the left, and faces upward and to the left. The protrusion 111B of the third probe pin 73 is located to the left of the inclined surface 111A of the third probe pin 73 on the page of FIG. 6.

As a result, as shown in FIG. 5, the inclined surface 111A of the first contact 111 of the first probe pin 71 and the inclined surface 111A of the first contact 111 of the second probe pin 72 face the same side in the left-right direction (to the right in this embodiment). As shown in FIG. 6, the inclined surface 111A of the first contact 111 of the third probe pin 73 and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 face the same side in the left-right direction (to the left in this embodiment).

Also, as shown in Figures 5 and 6, the inclined surface 111A of the first contact 111 of the first probe pin 71 (see Figure 5) and the inclined surface 111A of the first contact 111 of the third probe pin 73 (see Figure 6) face opposite sides in the left-right direction. The inclined surface 111A of the first contact 111 of the second probe pin 72 (see Figure 5) and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 (see Figure 6) face opposite sides in the left-right direction.

In addition, when viewed along the front-to-rear direction, the inclined surface 111A of the first contact 111 of the first probe pin 71 and the inclined surface 111A of the first contact 111 of the third probe pin 73 face each other in the left-to-right direction. When viewed along the front-to-rear direction, the inclined surface 111A of the first contact 111 of the second probe pin 72 and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 face each other in the left-to-right direction.

The first probe pin 71 and the fourth probe pin 74 have a second contact 121 and a notch 12C. The second probe pin 72 and the third probe pin 73 have a second contact 122 instead of the second contact 121. The second contact 122 does not have the notch 12C. The second contact 122 differs from the second contact 121 in that it does not have the notch 121C.

In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is positioned away from the first contact 111 when viewed in the up-down direction. In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is positioned away from the inclined surface 111A when viewed in the up-down direction. In the first probe pin 71 and the fourth probe pin 74, the portion of the second connection portion 12 that includes the second contact 121 overlaps with the elastic portion 13 when viewed in the up-down direction. In other words, in the first probe pin 71 and the fourth probe pin 74, at least a portion of the portion of the second connection portion 12 that includes the second contact 121 is in the same position as at least a portion of the elastic portion 13 in the left-right direction. Furthermore, in the first probe pin 71 and the fourth probe pin 74, the elastic portion 13 and the second contact 121 are positioned on the same side of the first connection portion 11 in the left-right direction.

In the second probe pin 72 and the third probe pin 73, the second contact 122 and the first contact 111 are positioned so that at least a portion of them overlap each other when viewed in the up-down direction. That is, in the second probe pin 72 and the third probe pin 73, at least a portion of the second contact 122 is in the same position as at least a portion of the first contact 111 in the left-right direction. Furthermore, in the second probe pin 72 and the third probe pin 73, the first contact 111 and the second contact 122 are positioned on the same side of the elastic portion 13 in the left-right direction. In the second probe pin 72 and the third probe pin 73, the second contact 122 and the inclined surface 111A are positioned so that at least a portion of them overlap each other when viewed in the up-down direction. That is, in the second probe pin 72 and the third probe pin 73, at least a portion of the second contact 122 is in the same position as at least a portion of the inclined surface 111A in the left-right direction. Furthermore, in the second probe pin 72 and the third probe pin 73, the inclined surface 111A and the second contact point 122 are located on the same side in the left-right direction with respect to the elastic portion 13.

As shown in FIG. 5, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left side of the first contact point 111. As shown in FIG. 6, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right side of the first contact point 111. The left side in FIGS. 5 and 6 (and FIGS. 7 to 10 described below) is an example of one side in the left-right direction, and the right side in FIGS. 5 and 6 (and FIGS. 7 to 10 described below) is an example of the other side in the left-right direction.

As shown in Figures 5 and 6, the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73. In other words, when viewed in the front-to-rear direction, the second contact 121 of the first probe pin 71 does not overlap with the second contact 122 of the third probe pin 73. In other words, in the left-to-right direction, the second contact 121 of the first probe pin 71 is located at a different position from the second contact 122 of the third probe pin 73. Note that, when viewed in the front-to-rear direction, the second contact 121 of the first probe pin 71 may only partially overlap with the second contact 122 of the third probe pin 73. In other words, the second contact 121 of the first probe pin 71 may be partially in the same position as the second contact 122 of the third probe pin 73 in the left-to-right direction.

The second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. In other words, when viewed in the front-to-rear direction, the second contact 122 of the second probe pin 72 does not overlap with the second contact 121 of the fourth probe pin 74. In other words, in the left-to-right direction, the second contact 122 of the second probe pin 72 is located in a different position from the second contact 121 of the fourth probe pin 74. Note that, when viewed in the front-to-rear direction, the second contact 122 of the second probe pin 72 may only partially overlap with the second contact 121 of the fourth probe pin 74. In other words, the second contact 122 of the second probe pin 72 may be partially in the same position as the second contact 121 of the fourth probe pin 74 in the left-to-right direction.

As described above, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left side of the first contact 111. Furthermore, the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. In other words, the inclined surface 111A of the first contact 111 of the first probe pin 71 is located on the left side of the first contact 111 of the first probe pin 71, which is the side where the second contact 121 of the first probe pin 71 is located relative to the second contact 122 of the third probe pin 73. Furthermore, the inclined surface 111A of the first contact 111 of the second probe pin 72 is located on the left side of the first contact 111 of the second probe pin 72, which is the side where the second contact 122 of the second probe pin 72 is located relative to the second contact 121 of the fourth probe pin 74.

As mentioned above, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right side of the first contact 111. Furthermore, the second contact 122 of the third probe pin 73 is located to the right of the second contact 121 of the first probe pin 71, and the second contact 121 of the fourth probe pin 74 is located to the right of the second contact 122 of the second probe pin 72. In other words, the inclined surface 111A of the first contact 111 of the third probe pin 73 is located to the right of the second contact 122 of the second probe pin 72 in the left-right direction. Of the first contacts 111 of the third probe pin 73, the second contact 122 of the third probe pin 73 is located on the right side relative to the second contact 121 of the first probe pin 71. Furthermore, the inclined surface 111A of the first contact 111 of the fourth probe pin 74 is located on the right side in the left-right direction, relative to the side where the second contact 121 of the fourth probe pin 74 is located relative to the second contact 122 of the second probe pin 72.

The first probe pin 71, second probe pin 72, third probe pin 73, and fourth probe pin 74 can achieve the following effects.

In the first probe pin 71, second probe pin 72, third probe pin 73, and fourth probe pin 74, the length L2 in the vertical direction between end 11A and end 12A is longer than the inner radius R1 of the curve of the elastic portion 13. The edge 12B of the second connection portion 12 on the first connection portion 11 side in the vertical direction extends away from the first connection portion 11 in the vertical direction as it moves away from the elastic portion 13 in the left-right direction. Therefore, in the first probe pin 71, second probe pin 72, third probe pin 73, and fourth probe pin 74, the vertical stroke of the elastic portion 13 can be increased. As a result, the contact reliability of the probe pins 7 can be improved.

The second portion 132 extends in the left-right direction toward the second end 13B and in the up-down direction toward the first end 13A. This allows the area of each probe pin 7 occupied by the elastic portion 13 to be reduced.

The elastic portion 13 includes multiple long plate portions 134. The longer the long plate portions 134 are located on the outside of the curved shape of the curved portion 133, the longer they are in the width direction. This makes the elastic portion 13 more flexible.

The first contact 111 has an inclined surface 111A that can come into contact with the contact object 8. For example, if the terminal 81 of the contact object 8 has a curved portion at its tip, the inclined surface 111A will come into contact with the curved portion of the terminal 81 from one side in the left-right direction. If only one side of the curved portion of the terminal 81 is gold-plated and the other side is tin-plated, the inclined surface 111A can come into contact with the gold-plated portion.

The first contact point 111 has a protrusion 111B in addition to an inclined surface 111A. This allows the first contact point 111 to come into contact with the contact object 8 at multiple points.

The first probe pin 71 and the fourth probe pin 74 can achieve the following effects:

When viewed in the vertical direction, the second contacts 121 of the first probe pin 71 and the fourth probe pin 74 are positioned away from the inclined surface 111A. Therefore, in a configuration in which the first probe pin 71 and the third probe pin 73 are arranged side by side in the front-to-back direction, the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 can be positioned at different left-to-right positions. Similarly, in a configuration in which the fourth probe pin 74 and the second probe pin 72 are arranged side by side in the front-to-back direction, the second contact 121 of the fourth probe pin 74 and the second contact 122 of the second probe pin 72 can be positioned at different left-to-right positions.

The second connection portions 12 of the first probe pin 71 and the fourth probe pin 74 have notches 12C, which allow the second contacts 121 to bend in the vertical direction.

The second probe pin 72 and the third probe pin 73 can achieve the following effects:

When viewed in the up-down direction, at least a portion of the second contacts 122 of the second probe pin 72 and the third probe pin 73 overlaps at least a portion of the inclined surface 111A. Therefore, in a configuration in which the second probe pin 72 and the fourth probe pin 74 are arranged side by side in the front-to-rear direction, the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be positioned at different left-to-right positions. Similarly, in a configuration in which the third probe pin 73 and the first probe pin 71 are arranged side by side in the front-to-rear direction, the second contact 122 of the third probe pin 73 and the second contact 121 of the first probe pin 71 can be positioned at different left-to-right positions.

Test socket 1 can provide the following benefits:

The second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. This configuration allows the pitch between two adjacent second contacts in the front-to-rear direction to be increased when the first probe pins 71 and the third probe pins 73 are arranged alternately in the front-to-rear direction. This is described in detail below. If the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 are located at the same left-to-right position, the second contacts 121, 122 of the first probe pins 71 and the third probe pins 73 arranged alternately in the front-to-rear direction will be adjacent in the front-to-rear direction. On the other hand, if the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, the second contacts 121, 122 of the first probe pins 71 and the third probe pins 73, which are arranged alternately in the front-to-back direction, are not adjacent to each other in the front-to-back direction. In this case, the second contacts 121, 121 of the two first probe pins 71 are adjacent to each other in the front-to-back direction. In other words, because the third probe pin 73 is not located between the two first probe pins 71, the pitch between two adjacent second contacts is increased. Similarly, if the second probe pins 72 and the fourth probe pins 74 are arranged alternately in the front-to-back direction, the pitch between two adjacent second contacts in the front-to-back direction can also be increased. As a result, the contact reliability of the test socket 1 can be improved.

If the spacing between each probe pin is narrow, the spacing between the pads on the board on which the test socket is mounted will also be narrow, which can make it difficult to form each pad. As mentioned above, the test socket 1 of this embodiment allows for a larger pitch between two adjacent second contacts in the front-to-rear direction. This allows for a larger pad spacing on the board, making it easier to form each pad.

When viewed in the vertical direction, the first contact 111 of the first probe pin 71 and the fourth probe pin 74 is positioned away from the second contact 121. When viewed in the vertical direction, the first contact 111 of the second probe pin 72 and the third probe pin 73 is positioned so that they overlap. As a result, when the first probe pins 71 and the third probe pins 73 are alternately arranged in the front-to-back direction, the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 can be positioned at different positions in the left-to-right direction. Furthermore, when the second probe pins 72 and the fourth probe pins 74 are alternately arranged in the front-to-back direction, the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be positioned at different positions in the left-to-right direction.

The third probe pin 73 has the same configuration as the second probe pin 72, but is arranged in the opposite direction to the second probe pin 72 in the left-right direction. The fourth probe pin 74 has the same configuration as the first probe pin 71, but is arranged in the opposite direction to the first probe pin 71 in the left-right direction. This allows the number of types of probe pins provided in the testing socket 1 to be reduced.

The inclined surfaces 111A of the first probe pin 71 and the second probe pin 72, which are arranged opposite each other in the left-right direction, face the same side in the left-right direction. The inclined surfaces 111A of the third probe pin 73 and the fourth probe pin 74, which are arranged opposite each other in the left-right direction, face the same side in the left-right direction. This allows the inclined surfaces 111A of the two probe pins arranged opposite each other in the left-right direction to come into contact with the contact object 8 from the same side in the left-right direction.

The inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-to-rear direction, face opposite sides in the left-to-right direction. The inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-to-rear direction, face opposite sides in the left-to-right direction. This allows the inclined surfaces 111A of the two probe pins arranged side by side in the front-to-rear direction to come into contact with the contact object 8 from opposite sides in the left-to-right direction.

When viewed along the front-to-rear direction, the inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-to-rear direction, face each other in the left-to-right direction. When viewed along the front-to-rear direction, the inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-to-rear direction, face each other in the left-to-right direction. This allows the inclined surfaces 111A of each probe pin to come into contact with the contact object 8 from the outside in the left-to-right direction.

The first contact 111 of each of the first probe pin 71, second probe pin 72, third probe pin 73, and fourth probe pin 74 has only one inclined surface 111A that can come into contact with the contact object 8. If the first contact 111 had two inclined surfaces that can come into contact with the contact object 8, the contact object 8 would be pressed against one inclined surface, increasing the likelihood that the contact object 8 would separate from the other inclined surface. However, this configuration reduces the likelihood that the inclined surface 111A will not come into contact with the desired position on the contact object 8.

Test socket 1 can also be configured as follows:

In the above-described embodiment, a configuration has been described in which the testing socket 1 is equipped with two types of probe pins 7. One of the two types of probe pins 7 is the first probe pin 71 and the fourth probe pin 74, which have the same configuration. The other of the two types of probe pins 7 is the second probe pin 72 and the third probe pin 73, which have the same configuration. However, the types of probe pins 7 equipped in the testing socket 1 are not limited to two.

A configuration in which the inspection socket 1 is equipped with four types of probe pins 7 is shown in Figures 7 and 8. In Figures 7 and 8, parts with the same configuration as the probe pins shown in Figures 5 and 6 are assigned the same reference numerals and their description will be omitted. In the configuration shown in Figures 7 and 8, the first probe pin 71, second probe pin 72, third probe pin 73, and fourth probe pin 74 each have second contacts with different configurations. That is, the first probe pin 71 has second contact 123, the second probe pin 72 has second contact 124, the third probe pin 73 has second contact 125, and the fourth probe pin 74 has second contact 126. The second contacts 123, 124, 125, and 126 differ in the number of notches they have. Second contact 123 has three notches, second contact 124 has two notches, second contact 125 has no notches, and second contact 126 has one notch.

In the above-described embodiment, a configuration was described in which the first contact 111 has only one inclined surface 111A that can come into contact with the contact object 8. However, the first contact 111 may have multiple inclined surfaces.

Figures 9 and 10 show a configuration in which the first contact 111 has two inclined surfaces (inclined surface 111A and second inclined surface 111C). In Figures 9 and 10, parts that have the same configuration as the probe pins shown in Figures 5 and 6 are given the same reference numerals and their description is omitted. In the configuration shown in Figures 9 and 10, the first contact 111 of each probe pin 7 has a second inclined surface 111C in addition to the inclined surface 111A. The second inclined surface 111C faces the inclined surface 111A in the left-right direction. Sloped surface 111C is inclined in the opposite direction to the opposing sloped surface 111A in the left-right direction. For example, if sloped surface 111A is inclined to face up and to the right, second sloped surface 111C is inclined to face up and to the left. Like sloped surface 111A, terminal 81 of contact object 8 can come into contact with second sloped surface 111C. Sloped surface 111A comes into contact with the curved portion of terminal 81 from one side in the left-right direction. Meanwhile, second sloped surface 111C comes into contact with the curved portion of terminal 81 from the other side in the left-right direction.

The shape and configuration of the housings 2, 3, 4, 5, and 6 can be changed as desired depending on the design of the inspection socket 1. For example, the shape of the housings 2, 3, 4, 5, and 6 is not limited to being a substantially rectangular prism, but may also be a substantially cylindrical shape, or a substantially polygonal shape other than a substantially rectangular prism. The housing 10 is not limited to being composed of five members, but may also be composed of one member, or may be composed of multiple members other than five.

The number of probe pins 7 that the test socket 1 has can be changed as desired depending on the design of the test socket 1, etc.

For example, in the configuration shown in Figures 3 and 4, the probe pins 7 include 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, two fifth probe pins 75, and two sixth probe pins 76. Here, a pair of probe pins 71, 72 facing each other in the left-right direction and a pair of probe pins 73, 74 facing each other in the left-right direction are arranged side by side in the front-to-back direction to form a single probe tweezers set. In this case, in the configuration shown in Figures 3 and 4, 13 probe tweezers are arranged side by side in the front-to-back direction. By arranging them in this manner, the left-to-right positions of adjacent second contacts 121, 122 are different when viewed in the up-down direction. The number of probe tweezers arranged side by side in the front-to-back direction may be any number other than 13.

Various embodiments of the present disclosure have been described in detail above with reference to the drawings. Finally, various aspects of the present disclosure will be described. In the following description, reference numerals will also be used as examples.

(1) The test socket 1 of the present disclosure is
a housing 5;
a first probe pin (71), a second probe pin (72), a third probe pin (73), and a fourth probe pin (74), each having a first contact (111) provided at one end in a first direction and second contacts (121, 122) provided at the other end in the first direction, and each supported by the housing (5);
The first probe pin 71 and the second probe pin 72 are arranged opposite to each other at an interval in a second direction intersecting the first direction,
The third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other with a gap in the second direction,
In a third direction intersecting the first direction and the second direction, the first probe pin 71 and the third probe pin 73 are arranged side by side,
In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side,
the second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction;
the second contact 122 of the second probe pin 72 is located between the second contact 122 of the third probe pin 73 and the second contact 121 of the fourth probe pin 74 in the second direction;
When the contact object 8 is brought into contact with the first contact 111 of the first probe pin 71 and the first contact 111 of the third probe pin 73 from the first direction, the first contact 111 of the first probe pin 71 comes into contact with the contact object 8 at a first position, and the first contact 111 of the third probe pin 73 comes into contact with the contact object 8 at a second position that is different from the first position in the second direction.

(2) In the test socket 1 of (1),
When the contact object 8 is brought into contact with the first contact point 111 of the second probe pin 72 and the first contact point 111 of the fourth probe pin 74 from the first direction, the first contact point 111 of the second probe pin 72 may contact the contact object 8 at a third position, and the first contact point 111 of the fourth probe pin 74 may contact the contact object 8 at a fourth position different from the third position in the second direction.

(3) The inspection socket 1 of the present disclosure is
a housing 5;
a first probe pin (71), a second probe pin (72), a third probe pin (73), and a fourth probe pin (74), each having a first contact (111) provided at one end in a first direction and second contacts (121, 122) provided at the other end in the first direction, and each supported by the housing (5);
The first probe pin 71 and the second probe pin 72 are arranged opposite to each other at an interval in a second direction intersecting the first direction,
The third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other with a gap in the second direction,
In a third direction intersecting the first direction and the second direction, the first probe pin 71 and the third probe pin 73 are arranged side by side,
In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side,
the second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction;
the second contact 122 of the second probe pin 72 is located between the second contact 122 of the third probe pin 73 and the second contact 121 of the fourth probe pin 74 in the second direction;
When viewed in the third direction, the shape of the first contact 111 of the first probe pin 71 is different from the shape of the first contact 111 of the third probe pin 73 .

(4) In the test socket 1 of (3),
When viewed along the third direction, the shape of the first contact 111 of the second probe pin 72 may be different from the shape of the first contact 111 of the fourth probe pin 74 .

(5) In any one of the test sockets (1) to (4),
The first contact point 111 of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may have an inclined surface 111A.

(6) In the test socket 1 of (5),
The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the second probe pin 72 may face the same side in the second direction,
The inclined surface 111A of the third probe pin 73 and the inclined surface 111A of the fourth probe pin 74 may face the same side in the second direction.

(7) In the test socket 1 of (5) or (6),
The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the third probe pin 73 may face opposite sides in the second direction,
The inclined surface 111A of the second probe pin 72 and the inclined surface 111A of the fourth probe pin 74 may face opposite sides in the second direction.

(8) In the test socket 1 according to any one of (5) to (7),
The inclined surface 111A of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may be capable of coming into contact with the contact object 8.

(9) In any one of the test sockets 1 of (5) to (8),
In the second direction, the position of the inclined surface 111A of the first probe pin 71 may be different from the position of the inclined surface 111A of the third probe pin 73 .

(10) In the test socket 1 according to any one of (5) to (9),
In the second direction, the position of the inclined surface 111A of the second probe pin 72 may be different from the position of the inclined surface 111A of the fourth probe pin 74 .

(11) In the test socket 1 according to any one of (1) to (10),
When viewed along the first direction, the first contact point 111 of the first probe pin 71 may be located at a position offset from the second contact point 121 of the first probe pin 71,
When viewed along the first direction, the first contact point 111 of the fourth probe pin 74 may be located at a position offset from the second contact point 121 of the fourth probe pin 74 .

(12) In the test socket 1 according to any one of (1) to (11),
When viewed along the first direction, the first contact 111 of the second probe pin 72 and the second contact 122 of the second probe pin 72 may be positioned to partially overlap each other,
When viewed along the first direction, the first contact 111 of the third probe pin 73 and the second contact 122 of the third probe pin 73 may be positioned to partially overlap each other.

(13) In the test socket 1 according to any one of (1) to (12),
The third probe pin 73 may have the same configuration as the second probe pin 72 and may be arranged in the opposite direction to the second probe pin 72 in the second direction.

(14) In the test socket 1 according to any one of (1) to (13),
The fourth probe pin 74 may have the same configuration as the first probe pin 71 and may be arranged in the opposite direction to the first probe pin 71 in the second direction.

(15) In the test socket 1 according to any one of (1) to (14),
The first probe pin 71 may include an identification portion 121C that allows identification from the second probe pin 72.

(16) The test socket 1 according to any one of (1) to (15)
A fifth probe pin 75 may be a power terminal or a ground terminal and is supported by the housing 5 .

(17) The inspection socket 1 of (16) is
Two of the fifth probe pins 75 may be provided,
The two fifth probe pins 75 may sandwich the first probe pin 71 and the third probe pin 73 in the third direction.

(18) In the test socket 1 of (16) or (17),
The thickness of the fifth probe pin 75 may be greater than the thickness of the first probe pin 71 .

(19) In the test socket 1 according to any one of (16) to (18),
In the third direction, a gap between the fifth probe pin 75 and the first probe pin 71 may be larger than a gap between the first probe pin 71 and the third probe pin 73 .

(20) In the test socket 1 according to any one of (16) to (19),
Each of the first probe pin 71 and the fifth probe pin 75 may include an elastic portion 13 having a curved portion,
When viewed along the third direction, the shape of the elastic portion 13 of the fifth probe pin 75 may be different from the shape of the elastic portion 13 of the first probe pin 71 .

(21) The test socket 1 according to any one of (16) to (20) is
a sixth probe pin (76) supported by the housing (5), the sixth probe pin being a power terminal or a ground terminal;
The fifth probe pin 75 and the sixth probe pin 76 may be arranged opposite to each other with a gap in between in the second direction.

(22) The test socket 1 of (21) is
Two sixth probe pins 76 may be provided;
The two sixth probe pins 76 may sandwich the second probe pin 72 and the fourth probe pin 74 in the third direction.

(23) In the test socket 1 of (21) or (22),
The sixth probe pin 76 may have the same configuration as the fifth probe pin 75 and may be arranged in the opposite direction to the fifth probe pin 75 in the second direction.

While the present disclosure has been fully described in connection with preferred embodiments with reference to the accompanying drawings, various variations and modifications will be apparent to those skilled in the art. Such variations and modifications are to be understood as included within the scope of the present disclosure as defined by the appended claims, unless they depart therefrom.

The inspection socket disclosed herein can be applied to inspection equipment used to inspect electronic modules such as optical modules, for example.

1 Inspection socket 2, 3, 4, 5, 6 Housing 11 First connection portion 11A End 12 Second connection portion 12A End 12C Notch 13 Elastic portion 131 First portion 132 Second portion 133 Curved portion 134 Long plate portion 13A First end 13B Second end 71 First probe pin 72 Second probe pin 73 Third probe pin 74 Fourth probe pin 111 First contact 111A Inclined surface 111B Protrusions 121, 122 Second contact

Claims (27)

Housing and
a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing;
the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction,
the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction,
the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction;
the second probe pin and the fourth probe pin are arranged side by side in the third direction;
the second contact point of the third probe pin is located between the second contact point of the first probe pin and the second contact point of the second probe pin in the second direction;
the second contact point of the second probe pin is located between the second contact point of the third probe pin and the second contact point of the fourth probe pin in the second direction;
the first contact point of each of the first probe pin and the third probe pin has a protrusion that protrudes in the first direction and that comes into contact with a contact object in the first direction;
The position of the protrusion of the first probe pin and the position of the protrusion of the third probe pin are different in the second direction. the first contact point of each of the second probe pin and the fourth probe pin has a protrusion that protrudes in the first direction and that comes into contact with a contact object in the first direction;
The test socket according to claim 1 , wherein the position of the protrusion of the second probe pin and the position of the protrusion of the fourth probe pin are different in the second direction. the first contact point of each of the first probe pin and the third probe pin has at least one inclined surface positioned with a gap from the protrusion in the second direction;
The contact object is
a first terminal having at least one curved surface and capable of contacting the inclined surface of the first probe pin from the first direction;
2. The test socket according to claim 1, further comprising a third terminal having at least one curved surface and capable of contacting the inclined surface of the third probe pin from the first direction. the first terminal has a linear portion extending from one end of the at least one curved surface along the second direction and capable of contacting the protrusion of the first probe pin from the first direction;
4. The test socket according to claim 3 , wherein the third terminal has a straight portion that extends from one end of the at least one curved surface along the second direction and is capable of contacting the protrusion of the third probe pin from the first direction. the first contact point of each of the second probe pin and the fourth probe pin has at least one inclined surface positioned with a gap from the protrusion in the second direction;
The contact object is
a second terminal having at least one curved surface and capable of contacting the inclined surface of the second probe pin from the first direction;
3. The test socket according to claim 2, further comprising a fourth terminal having at least one curved surface and capable of contacting the inclined surface of the fourth probe pin from the first direction. the second terminal has a linear portion extending from one end of the at least one curved surface along the second direction and capable of contacting the protrusion of the second probe pin from the first direction;
6. The test socket according to claim 5 , wherein the fourth terminal has a straight portion that extends from one end of the at least one curved surface along the second direction and is capable of contacting the protrusion of the fourth probe pin from the first direction. The at least one curved surface is
a first curved surface;
a second curved surface that is located at a different position from the first curved surface in the second direction,
4. The test socket according to claim 3, wherein when the contact object comes into contact with the first probe pin and the third probe pin, the inclined surface of the first probe pin comes into contact with the first curved surface of the first terminal, and the inclined surface of the third probe pin comes into contact with the second curved surface of the third terminal. The at least one curved surface is
a first curved surface;
a second curved surface that is located at a different position from the first curved surface in the second direction,
6. The test socket according to claim 5, wherein when the contact object comes into contact with the second probe pin and the fourth probe pin, the inclined surface of the second probe pin comes into contact with the first curved surface of the second terminal, and the inclined surface of the fourth probe pin comes into contact with the second curved surface of the fourth terminal. Housing and
a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing;
the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction,
the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction,
the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction;
the second probe pin and the fourth probe pin are arranged side by side in the third direction;
the second contact point of the third probe pin is located between the second contact point of the first probe pin and the second contact point of the second probe pin in the second direction;
the second contact point of the second probe pin is located between the second contact point of the third probe pin and the second contact point of the fourth probe pin in the second direction;
the first contact point of each of the first probe pin and the third probe pin has an inclined surface;
When viewed along the third direction, the inclined surface of the first probe pin is at a different position in the second direction from the inclined surface of the third probe pin. the first contact point of each of the second probe pin and the fourth probe pin has an inclined surface;
10. The test socket according to claim 9 , wherein, when viewed along the third direction, the inclined surface of the second probe pin is at a different position in the second direction from the inclined surface of the fourth probe pin. the inclined surface of the first probe pin and the inclined surface of the second probe pin face the same side in the second direction;
The test socket according to claim 3 , wherein the inclined surface of the third probe pin and the inclined surface of the fourth probe pin face the same side in the second direction. the inclined surface of the first probe pin and the inclined surface of the third probe pin face opposite sides in the second direction;
The test socket according to claim 3 , wherein the inclined surface of the second probe pin and the inclined surface of the fourth probe pin face opposite sides in the second direction. 11. The test socket according to claim 9 , wherein the inclined surface of each of the first probe pin, the second probe pin, the third probe pin, and the fourth probe pin is capable of coming into contact with a contact object. The test socket according to claim 3 , wherein a position of the inclined surface of the first probe pin is different from a position of the inclined surface of the third probe pin in the second direction. The test socket according to claim 3 , wherein a position of the inclined surface of the second probe pin is different from a position of the inclined surface of the fourth probe pin in the second direction. When viewed along the first direction, the first contact point of the first probe pin is located at a position offset from the second contact point of the first probe pin;
11. The test socket according to claim 1, wherein, when viewed along the first direction, the first contact point of the fourth probe pin is positioned away from the second contact point of the fourth probe pin. When viewed along the first direction, the first contact point of the second probe pin and the second contact point of the second probe pin are positioned so as to partially overlap each other,
11. The test socket according to claim 1, wherein the first contact point of the third probe pin and the second contact point of the third probe pin are positioned so as to partially overlap each other when viewed along the first direction. 11. The test socket according to claim 1, wherein the third probe pins have the same configuration as the second probe pins and are arranged in an opposite direction to the second probe pins in the second direction. 11. The test socket according to claim 1, wherein the fourth probe pin has the same configuration as the first probe pin and is arranged in an opposite direction to the first probe pin in the second direction. The test socket according to claim 1 , wherein the first probe pin has an identification portion that enables the first probe pin to be identified from the second probe pin. 11. The test socket of claim 1, further comprising a fifth probe pin, the fifth probe pin being a power terminal or a ground terminal, supported by the housing. two of the fifth probe pins;
22. The test socket of claim 21 , wherein the two fifth probe pins sandwich the first probe pin and the third probe pin in the third direction. 22. The test socket of claim 21 , wherein the thickness of the fifth probe pin is greater than the thickness of the first probe pin. 22. The test socket of claim 21 , wherein a gap between the fifth probe pin and the first probe pin in the third direction is larger than a gap between the first probe pin and the third probe pin. a sixth probe pin, which is a power terminal or a ground terminal, supported by the housing;
22. The test socket according to claim 21 , wherein the fifth probe pin and the sixth probe pin are arranged opposite to each other with a gap in the second direction. two sixth probe pins;
26. The test socket of claim 25 , wherein the two sixth probe pins sandwich the second probe pin and the fourth probe pin in the third direction. 26. The test socket according to claim 25 , wherein the sixth probe pin has the same configuration as the fifth probe pin and is arranged in an opposite direction to the fifth probe pin in the second direction.