JP7796566B2 - Test specimen gripping structure, test specimen gripping tool, and material testing method - Google Patents
Test specimen gripping structure, test specimen gripping tool, and material testing methodInfo
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- JP7796566B2 JP7796566B2 JP2022044361A JP2022044361A JP7796566B2 JP 7796566 B2 JP7796566 B2 JP 7796566B2 JP 2022044361 A JP2022044361 A JP 2022044361A JP 2022044361 A JP2022044361 A JP 2022044361A JP 7796566 B2 JP7796566 B2 JP 7796566B2
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Description
本発明は、試験片把持構造、試験片把持具および材料試験方法に関する。 The present invention relates to a test specimen gripping structure, a test specimen gripping device, and a material testing method.
試験片を用いた荷重試験を実施する際、試験精度の向上のためには、試験片に規定された荷重・モーメントを精確に負荷させることが重要である。従来、試験片に傾きや回転などの余計な力が加わることなく引張試験を行う引張試験機用治具として、試験片の一端部を固定する基体と、試験片の他端部を固定し、前記基体に対して一方向にスライドするスライド体とを備える治具が提案されている（例えば、特許文献１参照）。また、曲げモーメント無しに試験片を締め付け固定できる締め付け装置が提案されている（例えば、特許文献２参照）。 When conducting a load test using a test specimen, it is important to apply the specified load and moment accurately to the test specimen in order to improve test accuracy. A jig for a tensile testing machine that performs a tensile test without applying unnecessary forces such as tilting or rotation to the test specimen has been proposed in the past. The jig includes a base body that fixes one end of the test specimen, and a slider that fixes the other end of the test specimen and slides in one direction relative to the base (see, for example, Patent Document 1). A clamping device that can clamp and fix a test specimen without a bending moment has also been proposed (see, for example, Patent Document 2).
図４Ａ、４Ｂは、荷重試験で従来使用されている試験片把持具１００Ａであり、図４Ａは側面図、図４Ｂは正面図である。試験片把持具１００Ａは２つの試験片把持構造６０Ａからなり、試験片把持構造６０Ａは、第１把持部１０Ａと、第２把持部２０Ａと、ボルト４０とからなる。試験片把持具１００Ａでは、第２把持部２０Ａに試験片５０の形状に合わせた溝部２２を形成し、試験片５０をこの溝部２２に収容し、荷重負荷方向に対して試験片５０を拘束することで、試験片５０の滑りを防止している。しかしながら、試験片５０は、製造精度によっては把持部分の平面部が両端でねじれる場合があり、第１把持部１０Ａの平面部と試験片の平面部とを合わせた状態で、第１把持部１０Ａと第２把持部２０Ａとをボルト４０で固定した場合、試験片５０の両端から中心部に不要なねじりモーメントが発生するおそれがある。また、試験片５０の両端をそれぞれ把持する試験片把持構造６０Ａにおいて、ボルト４０を精度よく均一に締め付けることは困難であるため、図４Ａに示すように両端の試験片把持構造６０Ａで、または図４Ｂに示すように１つの試験片把持構造６０Ａ内でアンバランスな締結となり、試験片５０に曲げモーメントが発生するおそれもあった。 Figures 4A and 4B show a test specimen gripping device 100A conventionally used in load testing, with Figure 4A being a side view and Figure 4B being a front view. The test specimen gripping device 100A consists of two test specimen gripping structures 60A, each consisting of a first gripping portion 10A, a second gripping portion 20A, and a bolt 40. In the test specimen gripping device 100A, a groove portion 22 conforming to the shape of the test specimen 50 is formed in the second gripping portion 20A, and the test specimen 50 is accommodated in this groove portion 22, restraining the test specimen 50 in the load application direction and preventing the test specimen 50 from slipping. However, depending on the manufacturing precision, the flat surfaces of the gripping portions of the test specimen 50 may twist at both ends. When the first gripping portion 10A and the second gripping portion 20A are fastened with bolts 40 while the flat surfaces of the first gripping portion 10A and the test specimen are aligned, an unnecessary torsional moment may be generated from both ends of the test specimen 50 toward the center. Furthermore, since it is difficult to precisely and uniformly tighten the bolts 40 in a test specimen gripping structure 60A that grips both ends of the test specimen 50, unbalanced fastening may occur between the test specimen gripping structures 60A at both ends as shown in FIG. 4A, or within one test specimen gripping structure 60A as shown in FIG. 4B, potentially generating a bending moment in the test specimen 50.
本発明は、上記に鑑みてなされたものであって、試験片に不要な荷重・モーメントをかけることなく試験片を把持可能な試験片把持構造、試験片把持具および材料試験方法を提供することを目的とする。 The present invention was made in consideration of the above, and aims to provide a test specimen gripping structure, test specimen gripping device, and material testing method that can grip a test specimen without applying unnecessary loads or moments to the test specimen.
上述した課題を解決し、目的を達成するために、本発明に係る試験片把持構造は、試験片を把持する試験片把持構造であって、試験片を収容する凹部を有する第１把持部と、前記第１把持部と固定されて前記試験片を固定する第２把持部と、前記第１把持部の凹部と前記第２把持部とで構成される試験片収容部内に配置され、前記試験片を付勢するばね部材と、を有することを特徴とする。 In order to solve the above-mentioned problems and achieve the objectives, the test strip gripping structure of the present invention is a test strip gripping structure for gripping a test strip, characterized by having a first gripping portion having a recess for accommodating the test strip, a second gripping portion fixed to the first gripping portion to fix the test strip, and a spring member disposed within a test strip accommodating portion formed by the recess of the first gripping portion and the second gripping portion and biasing the test strip.
また、本発明に係る試験片把持構造は、上記発明において、前記試験片収容部の高さは、前記試験片の厚さより大きいことを特徴とする。 Furthermore, the test strip gripping structure according to the present invention is characterized in that, in the above invention, the height of the test strip storage section is greater than the thickness of the test strip.
また、本発明に係る試験片把持構造は、上記発明において、前記第２把持部には、試験片を収容する弧状の溝部が設けられ、前記第１把持部の凹部と前記第２把持部の溝部とで試験片収容部を構成することを特徴とする。 The test strip gripping structure according to the present invention is also characterized in that, in the above invention, the second gripping portion is provided with an arc-shaped groove for accommodating the test strip, and the recess in the first gripping portion and the groove in the second gripping portion form a test strip accommodating portion.
また、本発明に係る試験片把持構造は、上記発明において、前記ばね部材は、板ばねまたは皿ばねであることを特徴とする。 Furthermore, the test piece gripping structure according to the present invention is characterized in that, in the above invention, the spring member is a leaf spring or a disc spring.
また、本発明に係る試験片把持構造は、上記発明において、前記ばね部材は、前記第１把持部の凹部内に固定されていることを特徴とする。 Furthermore, the test piece gripping structure according to the present invention is characterized in that, in the above invention, the spring member is fixed within a recess in the first gripping portion.
また、本発明に係る試験片把持具は、上記のいずれか一つに記載の２つの試験片把持構造からなることを特徴とする。 The test piece gripping device according to the present invention is characterized by comprising two test piece gripping structures described above.
また、本発明に係る材料試験方法は、上記のいずれか一つに記載の試験片把持構造で試験片の両端部をそれぞれ固定して行うことを特徴とする。 The material testing method according to the present invention is characterized in that both ends of the test piece are fixed using any one of the test piece gripping structures described above.
本発明によれば、試験片に不要な荷重・モーメントをかけることなく試験片を把持することができるという効果を奏する。 The present invention has the advantage of being able to grip a test specimen without applying unnecessary loads or moments to the test specimen.
以下、添付図面を参照して本発明を実施するための形態（以下、「実施の形態」という）を説明する。なお、図面は模式的なものであって、各部分の厚みと幅との関係、それぞれの部分の厚みの比率などは現実のものとは異なる場合があり、図面の相互間においても互いの寸法の関係や比率が異なる部分が含まれる場合がある。 The following describes modes for carrying out the present invention (hereinafter referred to as "embodiments") with reference to the accompanying drawings. Please note that the drawings are schematic, and the relationship between the thickness and width of each part, the thickness ratio of each part, etc. may differ from the actual ones, and the drawings may also include parts with different dimensional relationships and ratios.
（実施の形態）
図１は、本発明の実施の形態に係る試験片把持具１００の斜視図であり、図２は、試験片把持具１００の一部拡大図である。また、図３Ａ～図３Ｃは、試験片把持具１００の側面図、上面図、正面図である。
(Embodiment)
Fig. 1 is a perspective view of a test strip gripper 100 according to an embodiment of the present invention, and Fig. 2 is a partially enlarged view of the test strip gripper 100. Also, Figs. 3A to 3C are a side view, a top view, and a front view of the test strip gripper 100.
試験片把持具１００は、２つの試験片把持構造６０からなる。試験片把持構造６０は、第１把持部１０と、第１把持部１０と固定されて試験片５０の端部を固定する第２把持部２０と、試験片５０を付勢するばね部材３０と、を有する。 The test strip gripping device 100 consists of two test strip gripping structures 60. The test strip gripping structure 60 has a first gripping portion 10, a second gripping portion 20 that is fixed to the first gripping portion 10 and secures the end of the test strip 50, and a spring member 30 that biases the test strip 50.
第１把持部１０は、本体部１１と、本体部１１の第２把持部２０と対向する面に形成され、試験片収容部７０を構成する凹部１２と、を有する。本体部１１を構成する材料は、適切な剛性を有する材料から適宜選択されるが、ＳＵＳ３０４が好ましい。 The first gripping portion 10 has a main body 11 and a recess 12 formed on the surface of the main body 11 facing the second gripping portion 20, which constitutes the test piece storage portion 70. The material constituting the main body 11 is selected from materials with appropriate rigidity, but SUS304 is preferred.
第２把持部２０は、本体部２１と、本体部２１の第１把持部１０と対向する面に形成され、試験片５０を収容する弧状の溝部２２と、を有する。本体部２１を構成する材料は、本体部１１と同様に適切な剛性を有する材料から適宜選択されるが、ＳＵＳ３０４が好ましい。本実施の形態では、第１把持部１０の凹部１２と、第２把持部２０の溝部２２とにより試験片収容部７０（図３Ｃ参照）が構成される。試験片収容部７０の高さＬ１、すなわち、凹部１２の深さと溝部２２の深さの和は、試験片５０の厚さＬ２より大きく、試験片５０の厚さＬ２と荷重が負荷されていない状態のバネ部材３０の付勢方向の長さとの和より小さい。これにより、ばね部材３０の付勢力により試験片５０を固定することが可能となる。なお、図３Ｃはボルト４０で固定後の試験片把持構造６０を示しているため、ばね部材３０が収縮し、試験片収容部７０の高さＬ１は、試験片５０の厚さＬ２とバネ部材３０の付勢方向の長さとの和に等しくなっている。 The second gripping portion 20 has a main body 21 and an arc-shaped groove 22 formed on the surface of the main body 21 facing the first gripping portion 10, which accommodates the test specimen 50. The material constituting the main body 21 is selected from materials with appropriate rigidity, similar to that of the main body 11, but SUS304 is preferred. In this embodiment, the recess 12 of the first gripping portion 10 and the groove 22 of the second gripping portion 20 form the test specimen accommodation portion 70 (see Figure 3C). The height L1 of the test specimen accommodation portion 70, i.e., the sum of the depth of the recess 12 and the depth of the groove 22, is greater than the thickness L2 of the test specimen 50 and less than the sum of the thickness L2 of the test specimen 50 and the length of the spring member 30 in the biasing direction when no load is applied. This allows the test specimen 50 to be fixed in place by the biasing force of the spring member 30. Note that Figure 3C shows the test specimen gripping structure 60 after it has been fixed with the bolts 40, so the spring member 30 has contracted and the height L1 of the test specimen storage section 70 is equal to the sum of the thickness L2 of the test specimen 50 and the length of the spring member 30 in the biasing direction.
ばね部材３０は、試験片収容部７０内に配置され、試験片５０を付勢する。ばね部材３０は、試験片５０を固定するために荷重が負荷されると試験片５０の形状に沿って柔軟に変形するため、試験片５０の形状を過度に矯正することなく、試験片５０への不要な荷重・モーメントの負荷を防止することができる。また、試験片５０の両端の形状が、製造精度の低下により平面部にねじりが生じた場合であっても、ばね部材３０が試験片５０の形状に沿って変形可能であるため、試験片５０への不要な荷重・モーメントの負荷を防止することができる。ばね部材３０は、第１把持部１０の凹部１２内に溶接等により接合されていることが好ましい。また、ばね部材３０は、適度な付勢力を得られる観念から、板バネ、皿ばねを好ましく使用することができる。 The spring member 30 is placed within the test specimen storage section 70 and biases the test specimen 50. When a load is applied to secure the test specimen 50, the spring member 30 flexibly deforms to conform to the shape of the test specimen 50, preventing unnecessary loads and moments from being applied to the test specimen 50 without excessively correcting the shape of the test specimen 50. Even if the flat portions of both ends of the test specimen 50 are twisted due to a decrease in manufacturing precision, the spring member 30 can deform to conform to the shape of the test specimen 50, preventing unnecessary loads and moments from being applied to the test specimen 50. The spring member 30 is preferably joined by welding or other means to the recess 12 of the first gripping section 10. A leaf spring or disc spring is preferably used as the spring member 30, as this provides an appropriate biasing force.
第１把持部１０と第２把持部２０は、試験片収容部７０に試験片５０を収容した状態で、ボルト４０で固定される。固定方法はボルト４０に限定されるものではない。本実施の形態では、試験片把持構造６０内でボルト３０の締結力に差異が生じた場合であっても、ばね部材３０が変形することにより、試験片５０への不要な荷重・モーメントの負荷を防止することができる。また、第１把持部１０の凹部１２に試験片５０を収容するため、凹部１２がストッパーとなり、ボルト４０の過度な締め付けを防止することもできる。 The first gripping portion 10 and the second gripping portion 20 are fixed with the bolt 40 while the test specimen 50 is housed in the test specimen housing portion 70. The fixing method is not limited to the bolt 40. In this embodiment, even if a difference occurs in the fastening force of the bolt 30 within the test specimen holding structure 60, the spring member 30 deforms, preventing unnecessary loads and moments from being applied to the test specimen 50. Furthermore, because the test specimen 50 is housed in the recess 12 of the first gripping portion 10, the recess 12 acts as a stopper, preventing excessive tightening of the bolt 40.
本実施の形態の試験片把持具１００によって、試験片６０の両端部を固定した後、材料試験を行うことができる。材料試験としては、例えば、引張試験、ねじり試験、曲げ試験、圧縮試験、疲労試験等が挙げられる。本実施の形態の試験片把持具１００を使用することにより、試験片５０に不要な荷重・モーメントの負荷を防止しながら、材料試験を行うことができるので、精度高く材料試験を行うことが可能となる。 The test piece gripping device 100 of this embodiment can be used to secure both ends of the test piece 60 and then perform a material test. Examples of material tests include tensile tests, torsion tests, bending tests, compression tests, and fatigue tests. By using the test piece gripping device 100 of this embodiment, material tests can be performed while preventing unnecessary loads and moments from being applied to the test piece 50, enabling highly accurate material tests.
なお、上記の実施の形態では、Ｄカット形状の試験片を使用する試験把持具について説明したが、試験片はＤカットに限定されるものではなく、平板状の試験片についても試験片への不要な荷重・モーメントの負荷を防止することができる。平板状の試験片を使用する場合は、第２把持部に溝部を設ける必要はない。また、第２把持部２０に溝部を設けない場合、凹部を第２把持部に設けてもよく、ばね部材を第２把持部に固定してもよい。さらに、上記の実施形態では、同じ構成を有する２つの試験片把持構造により試験片把持具を構成したが、少なくとも１つの本実施の形態の試験片把持構造を使用することにより、試験片への不要な荷重・モーメントの負荷を防止することができる。 In the above embodiment, the test gripping device was described as being used with D-cut test specimens. However, the test specimens are not limited to D-cuts, and the application of unnecessary loads and moments to flat test specimens can also be prevented. When using flat test specimens, there is no need to provide a groove in the second gripping portion. Furthermore, if no groove is provided in the second gripping portion 20, a recess may be provided in the second gripping portion, or a spring member may be fixed to the second gripping portion. Furthermore, in the above embodiment, the test specimen gripping device was constructed using two test specimen gripping structures with the same configuration, but by using at least one test specimen gripping structure of the present embodiment, the application of unnecessary loads and moments to the test specimen can be prevented.
本発明はここでは記載していない様々な実施の形態等を含みうるものであり、特許請求の範囲により特定される技術的思想を逸脱しない範囲内において種々の設計変更等を施すことが可能である。 The present invention may include various embodiments not described herein, and various design modifications may be made without departing from the technical concept defined by the claims.
以上説明したように、本発明に係る試験片把持具は、試験片に不要な荷重・モーメントをかけることなく試験片を把持可能であって、これにより材料試験を精度よく行うことができる。 As explained above, the test piece gripping device of the present invention is capable of gripping a test piece without applying unnecessary loads or moments to the test piece, thereby enabling material testing to be performed with high accuracy.
１０、１０Ａ 第１把持部
１１、２１ 本体部
１２ 凹部
２０、２０Ａ 第２把持部
２２ 溝部
３０ ばね部材
４０ ボルト
５０ 試験片
６０ 試験片把持構造
７０ 試験片収容部
１００、１００Ａ 試験片把持具
10, 10A First gripping portion 11, 21 Main body portion 12 Recessed portion 20, 20A Second gripping portion 22 Groove portion 30 Spring member 40 Bolt 50 Test piece 60 Test piece gripping structure 70 Test piece storage portion 100, 100A Test piece gripping tool
Claims (7)
試験片を収容する凹部を有する第１把持部と、
前記第１把持部と固定されて前記試験片を固定する第２把持部と、
前記第１把持部の凹部と前記第２把持部とで構成される試験片収容部内に配置され、前記試験片を付勢するばね部材と、
を有することを特徴とする試験片把持構造。 A test piece holding structure for holding one end of a test piece for material testing with both ends fixed ,
a first gripping portion having a recess for accommodating a test strip;
a second gripping portion fixed to the first gripping portion to fix the test piece;
a spring member disposed in a test strip accommodating section formed by the recess of the first gripping section and the second gripping section, and biasing the test strip;
A test piece gripping structure comprising:
前記第１把持部の凹部と前記第２把持部の溝部とで試験片収容部を構成することを特徴とする請求項１に記載の試験片把持構造。 The second gripping portion is provided with an arc-shaped groove portion for accommodating a test piece,
2. The test strip gripping structure according to claim 1, wherein the recess of the first gripping portion and the groove of the second gripping portion form a test strip accommodating portion.
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| JP2023137920A JP2023137920A (en) | 2023-09-29 |
| JP7796566B2 true JP7796566B2 (en) | 2026-01-09 |
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Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6263424A (en) * | 1985-09-13 | 1987-03-20 | Toshiba Mach Co Ltd | Sample holding device |
| JPS63152121U (en) * | 1987-03-25 | 1988-10-06 | ||
| JPH02260647A (en) * | 1989-03-31 | 1990-10-23 | Omron Tateisi Electron Co | Sample fixing device |
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