JPS5410415B2 - - Google Patents
Info
- Publication number
- JPS5410415B2 JPS5410415B2 JP317275A JP317275A JPS5410415B2 JP S5410415 B2 JPS5410415 B2 JP S5410415B2 JP 317275 A JP317275 A JP 317275A JP 317275 A JP317275 A JP 317275A JP S5410415 B2 JPS5410415 B2 JP S5410415B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Input From Keyboards Or The Like (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP317275A JPS5410415B2 (en) | 1974-12-26 | 1974-12-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP317275A JPS5410415B2 (en) | 1974-12-26 | 1974-12-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5176034A JPS5176034A (en) | 1976-07-01 |
| JPS5410415B2 true JPS5410415B2 (en) | 1979-05-07 |
Family
ID=11549950
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP317275A Expired JPS5410415B2 (en) | 1974-12-26 | 1974-12-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5410415B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010198693A (en) * | 2009-02-26 | 2010-09-09 | Semiconductor Energy Lab Co Ltd | Method for inspecting otp memory, method for manufacturing the otp memory, the otp memory, and method for manufacturing semiconductor device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5412331U (en) * | 1977-06-29 | 1979-01-26 | ||
| JPS6027120B2 (en) * | 1977-11-04 | 1985-06-27 | 日本電気株式会社 | programmable memory |
-
1974
- 1974-12-26 JP JP317275A patent/JPS5410415B2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010198693A (en) * | 2009-02-26 | 2010-09-09 | Semiconductor Energy Lab Co Ltd | Method for inspecting otp memory, method for manufacturing the otp memory, the otp memory, and method for manufacturing semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5176034A (en) | 1976-07-01 |