JPS5520637B2 - - Google Patents
Info
- Publication number
- JPS5520637B2 JPS5520637B2 JP4978973A JP4978973A JPS5520637B2 JP S5520637 B2 JPS5520637 B2 JP S5520637B2 JP 4978973 A JP4978973 A JP 4978973A JP 4978973 A JP4978973 A JP 4978973A JP S5520637 B2 JPS5520637 B2 JP S5520637B2
- Authority
- JP
- Japan
- Prior art keywords
- ion beam
- uniform magnetic
- magnetic field
- entrance
- electrostatic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005686 electrostatic field Effects 0.000 abstract 2
- 238000010884 ion-beam technique Methods 0.000 abstract 2
- 230000004075 alteration Effects 0.000 abstract 1
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
A mass spectrometer which has a toroidal electrostatic field and a uniform magnetic field with non-zero entrance and exit angles, and which is so constructed that the incident end surface of an ion beam on the toroidal electrostatic field defines a concave surface and that the entrance angle and the exit angle of the ion beam relative to the uniform magnetic field are in the positive direction and the negative direction, respectively, thereby to make the elimination of second-order aberrations and axial focusing possible.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4978973A JPS5520637B2 (en) | 1973-05-07 | 1973-05-07 | |
| US467788A US3920988A (en) | 1973-05-07 | 1974-05-07 | Mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4978973A JPS5520637B2 (en) | 1973-05-07 | 1973-05-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS502591A JPS502591A (en) | 1975-01-11 |
| JPS5520637B2 true JPS5520637B2 (en) | 1980-06-04 |
Family
ID=12840911
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4978973A Expired JPS5520637B2 (en) | 1973-05-07 | 1973-05-07 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US3920988A (en) |
| JP (1) | JPS5520637B2 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5721832B2 (en) * | 1975-02-14 | 1982-05-10 | ||
| EP0016561A1 (en) * | 1979-03-15 | 1980-10-01 | University Of Manchester Institute Of Science And Technology | Mass spectrometers |
| JPS5829577B2 (en) * | 1980-06-13 | 1983-06-23 | 日本電子株式会社 | Double convergence mass spectrometer |
| JPS6037642A (en) * | 1983-08-10 | 1985-02-27 | Hitachi Ltd | Mass separator for ion implantation equipment |
| US5317151A (en) * | 1992-10-30 | 1994-05-31 | Sinha Mahadeva P | Miniaturized lightweight magnetic sector for a field-portable mass spectrometer |
| US8723114B2 (en) * | 2011-11-17 | 2014-05-13 | National University Of Singapore | Sequential radial mirror analyser |
| CN114709129B (en) * | 2022-03-16 | 2025-06-24 | 中国核电工程有限公司 | A mass analyzer system and mass spectrometer |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3061720A (en) * | 1960-02-29 | 1962-10-30 | Ewald Heinz | Spectrograph |
| GB1004945A (en) * | 1962-02-28 | 1965-09-22 | Heinz Ewald | Improvements in or relating to mass spectroscopes |
| US3671737A (en) * | 1969-05-07 | 1972-06-20 | Bell & Howell Co | Method for focusing a double focusing mass spectrometer |
-
1973
- 1973-05-07 JP JP4978973A patent/JPS5520637B2/ja not_active Expired
-
1974
- 1974-05-07 US US467788A patent/US3920988A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US3920988A (en) | 1975-11-18 |
| JPS502591A (en) | 1975-01-11 |
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