JPS5815041B2 - Inspection method and equipment - Google Patents
Inspection method and equipmentInfo
- Publication number
- JPS5815041B2 JPS5815041B2 JP15589277A JP15589277A JPS5815041B2 JP S5815041 B2 JPS5815041 B2 JP S5815041B2 JP 15589277 A JP15589277 A JP 15589277A JP 15589277 A JP15589277 A JP 15589277A JP S5815041 B2 JPS5815041 B2 JP S5815041B2
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- Prior art keywords
- image
- inspected
- signal
- calibration
- standard
- Prior art date
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- Expired
Links
- 238000007689 inspection Methods 0.000 title claims description 24
- 238000000034 method Methods 0.000 title claims description 13
- 238000003384 imaging method Methods 0.000 claims description 20
- 238000012937 correction Methods 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 6
- 238000000605 extraction Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 8
- 230000008859 change Effects 0.000 description 4
- 239000007787 solid Substances 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【発明の詳細な説明】
本発明は、物体の形状等の検査方法及び装置、特に、被
検査物体の周囲の条件の変動、検査装置自体の機能の変
動等に拘わらず、常に被検査物体を正確に検査し得る物
体の検査方法及び装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method and apparatus for inspecting the shape of an object, and in particular, the present invention provides a method and apparatus for inspecting the shape of an object. The present invention relates to a method and apparatus for inspecting objects that can be accurately inspected.
従来の斯種物体の検査装置に於ては、先ず、例えば第1
図に示す如く、検査台T上に標準となる物体、即ち標準
体1を置き、これに光源2より光を照射し、テレビカメ
ラ3でこの標準体1を撮像し、それよりの画像信号を、
A−D(アナログ−デジタル)変換器41及び画像信号
の特徴抽出器又は回路42等を有する画像信号処理装置
又は回路4に供給して処理し、これよりの出力情報又は
信号を、標準情報信号として、例えばコンピュータ43
に記憶せしめる。In a conventional inspection device for this type of object, first, for example, the first
As shown in the figure, a standard object, that is, a standard object 1, is placed on an inspection table T, a light source 2 irradiates it with light, a television camera 3 takes an image of this standard object 1, and the image signal from it is captured. ,
It is supplied to an image signal processing device or circuit 4 having an A-D (analog-digital) converter 41, an image signal feature extractor or circuit 42, etc. for processing, and the output information or signal therefrom is converted into a standard information signal. For example, computer 43
to be memorized.
次に、被検査物体を検査台Tの標準体1の位置に置き(
従って、この被検査物体も符号1で示す)、これをテレ
ビカメラ3で撮像し、その画像信号を、画像信号処理回
路4で同様に処理し、これよりの出力情報をコンピュー
タ43に送り、そこで以前に記憶した標準体の情報と比
較し、被検査物体が標準体と同一か否か、即ちその良否
を検査している。Next, place the object to be inspected at the position of the standard body 1 on the inspection table T (
Therefore, this object to be inspected is also indicated by reference numeral 1), is imaged by the television camera 3, the image signal is processed in the same way by the image signal processing circuit 4, and the output information from this is sent to the computer 43, where it is It is compared with previously stored information on the standard body to check whether the object to be inspected is the same as the standard body, that is, whether it is good or bad.
斯る従来の検査装置に於ては、各被検査物体の検査を通
じて、被検査物体1に照射される光源2よりの光の光量
が、標準体の撮像時に標準体に照射される光源2よりの
光の光量と異っていたり、更には、テレビカメラ等の電
気回路系のドリフト等により、被検査物体1を撮像して
得られるテレビカメラ3よりの画像信号は、仮え被検査
物体が標準体と同一であっても、標準体の画像信号と異
ったものとなるので、両者は異っていると判定される、
誤判定が生ずる恐れがある。In such a conventional inspection device, through the inspection of each object to be inspected, the amount of light from the light source 2 irradiating the object 1 to be inspected is greater than that from the light source 2 irradiating the standard object when the standard object is imaged. The image signal from the television camera 3 obtained by imaging the object to be inspected 1 may be different from the amount of light of the object to be inspected, or furthermore, due to the drift of the electric circuit system of the television camera, etc. Even if the image signal is the same as the standard object, it will be different from the image signal of the standard object, so the two will be determined to be different.
Misjudgment may occur.
所で、光源2の経時変化や、被検査物体1の周囲光の変
動が生じ、被検査物体1に当る光の量が、無視し得ない
程度に変化するのが、通常である。However, as the light source 2 changes over time and the ambient light around the object to be inspected 1 changes, the amount of light hitting the object to be inspected 1 usually changes to an extent that cannot be ignored.
更に、カメラ等の電気回路系にも、屡々ドリフトが生ず
る。Furthermore, drift often occurs in electrical circuit systems such as cameras.
従って、従来の装置によっては、上述の誤判定が、屡々
生ずると云う、斯の種の装置にとっては、重大な欠点を
回避し得ない。Therefore, depending on the conventional device, the above-mentioned erroneous judgment often occurs, and this type of device cannot avoid a serious drawback.
従って、本発明の主目的は、上述した従来の欠点を一掃
した、物体の検査方法及び装置を提供せんとするにある
。SUMMARY OF THE INVENTION Accordingly, the main object of the present invention is to provide a method and apparatus for inspecting objects, which eliminates the above-mentioned conventional drawbacks.
本本明の他の目的は、仮え各被検査物体の検査毎に、光
源の光量ば標準体の撮像時の光量に対して変化して、又
、同様に標準体の撮像時に対し、被検査物の周囲光が変
化しても、更にはカメラ、や関連する増巾器等の電気回
路系等に温変変化、その他の原因によるドリフト等が生
じたとしても、これ等を全て自動的且つ正確に補正し、
精密な検査を行い得る物体の検査方法及び装置を、安価
に提供せんとするものである。Another object of the present invention is to change the amount of light from the light source for each inspection of each object to be inspected relative to the amount of light when imaging the standard object; Even if the ambient light of the object changes, or even if there is temperature change or drift due to other causes in the electrical circuit system of the camera or related amplifier, all of these can be automatically and easily corrected. Correctly correct
It is an object of the present invention to provide an inexpensive method and apparatus for inspecting objects that enable precise inspection.
本発明による検査方法の特徴とするところは、撮像体及
びそれよりの画像信号を処理して物体の検査をする方法
に於て、上記撮像体の標準体及び被検査物体に対する視
野内に検査の条件の基準となる較正体を配置して、該較
正体及び上記標準体又は被検査物体を同時に上記撮像体
により撮像し、該撮像体よりの撮像信号のうち上記較正
体に対応する信号を検出し、該検出信号により上記撮像
体よりの画像信号を補正するようになしたことに存する
。The inspection method according to the present invention is characterized in that, in the method of inspecting an object by processing an image pickup body and image signals from the image pickup body, an inspection method is provided within the field of view of the standard body and the object to be inspected of the image pickup body. A calibration body that serves as a reference for the conditions is arranged, the calibration body and the standard body or the object to be inspected are simultaneously imaged by the imaging body, and a signal corresponding to the calibration body is detected from among the imaging signals from the imaging body. However, the present invention resides in that the image signal from the imaging body is corrected using the detection signal.
又、本発明による検査装置の特徴とするところは、撮像
体と、それよりの画像信号を処理するA−り変換器、特
徴抽出回路及びコンピュータ等を。Further, the inspection apparatus according to the present invention is characterized by an image pickup object, an A-reverse converter for processing image signals from the image pickup object, a feature extraction circuit, a computer, etc.
有する画像信号処理装置とを有し、物体の検査を行う検
査装置に於て、上記撮像体の標準体及び被検査物体に対
する視野内に検査の条件の基準となる較正体を配置して
、該較正体及び上記標準体又は被検査物体を同時に上記
撮像体により撮像し、。In an inspection apparatus that inspects an object, a calibration body serving as a reference for inspection conditions is placed within the field of view of the standard body of the imaging body and the object to be inspected, and Imaging the calibration body and the standard body or the object to be inspected by the imaging body at the same time;
該撮像体よりの画像信号を較正信号形成回路に供給し、
これにより上記画像信号のうち上記較正体に対応する信
号を検出し、該検出信号及び上記画像信号を補正回路に
供給し、ここで上記撮像体よりの画像信号を上記検出信
号で補正するようにな。supplying an image signal from the image pickup body to a calibration signal forming circuit;
As a result, a signal corresponding to the calibration object among the image signals is detected, and the detection signal and the image signal are supplied to a correction circuit, where the image signal from the image pickup object is corrected using the detection signal. Na.
したことに存する。It depends on what you did.
以下、本発明の−f11を第2乃至第5図を参照して説
明する。-f11 of the present invention will be explained below with reference to FIGS. 2 to 5.
尚、第2乃至第5図に於て、第1図と同一符号は、互に
同一要素を示すものとする。In addition, in FIGS. 2 to 5, the same reference numerals as in FIG. 1 indicate the same elements.
籾で、本発明に於ては、例えばテレビカメラ3の如き撮
像体により、標準体1を撮像する際に、テレビカメラ3
の視野内に、第2図の例に於ては、台T上の標準体1の
近傍に、例えば白い紙の如き較正体5を配置し、この較
正体5を後の検査に於けるテレビカメラ3の視野の明る
さの基準とする。In the present invention, when the standard body 1 is imaged by an imaging body such as the television camera 3, the television camera 3
In the example shown in FIG. 2, a calibration body 5 such as a white paper is placed near the standard body 1 on the stand T, and this calibration body 5 is used as a television screen in later inspections. This is used as a reference for the brightness of the field of view of camera 3.
この較正体5及び標準体1を、テレビカメラ3で撮像ス
ると、テレビカメラ3のスクリーンS上の撮像パターン
は、例えば第3図に示す如くなる。When the calibration body 5 and the standard body 1 are imaged by the television camera 3, the imaged pattern on the screen S of the television camera 3 becomes as shown in FIG. 3, for example.
・こ5で1′は標準体1の像であり、5′は較正体5の
像である。・In 5, 1' is an image of the standard body 1, and 5' is an image of the calibration body 5.
又、この時のテレビカメラ3よりの画像信号は、例えば
第4図の実線カーブAの如き波形となる。Further, the image signal from the television camera 3 at this time has a waveform such as the solid curve A in FIG. 4, for example.
この第4図の波形図に於て、横軸の1“及び5“は、夫
々標準体1の画像1′及び較正体5の画像5′の略々中
心位置に対応し、A1及びB1は、夫々画像1′及び5
′のレベルを夫々示す。In the waveform diagram of FIG. 4, 1" and 5" on the horizontal axis correspond to approximately the center positions of the image 1' of the standard body 1 and the image 5' of the calibration body 5, respectively, and A1 and B1 are , images 1' and 5 respectively
′ levels are shown respectively.
テレビカメラ3よりの第4図の実線カーブAの如き画像
信号が、従来と同様に、画像信号処理装置4により処理
され、コンピュータ43に、続く検査に於ける基準又は
標準情報信号として記憶される。An image signal such as the solid line curve A in FIG. 4 from the television camera 3 is processed by the image signal processing device 4 in the same manner as before, and stored in the computer 43 as a reference or standard information signal for subsequent examinations. .
本発明による被検査物体の検査に於ては、較正体5を、
標準体1を撮像した時と同一条件に置き、標準体1の代
りに、それと同一位置に被検査物体を置き(従って、被
検査物体も、図に於ては符号1で示す)、テレビカメラ
3で、較正体5及び被検査物体1を同時に撮(像)映す
る。In the inspection of the object to be inspected according to the present invention, the calibration body 5 is
Place the standard body 1 under the same conditions as when the image was taken, place the object to be inspected in the same position as the standard body 1 (therefore, the object to be inspected is also indicated by reference numeral 1 in the figure), and place the object to be inspected in place of the standard body 1. 3, the calibration body 5 and the object to be inspected 1 are simultaneously photographed (imaged).
従って、テレビカメラ3のスクリーンS上の画像は、第
3図に示すと全く同様となる。Therefore, the image on the screen S of the television camera 3 is exactly the same as shown in FIG.
この場合、被検査物体1と標準体1とが同一であり、更
にテレビカメラ3の視野内の明るさが、標準体の撮映時
と同一で、更にカメラ3等の電気回路系等の機能も同一
ならば、カメラ3よりの画像信号は、第4図の実線カー
ブAの波形となるので、コンピュータ43による検査に
於ける誤判定の問題は全く生じない。In this case, the object to be inspected 1 and the standard body 1 are the same, the brightness within the field of view of the television camera 3 is the same as when the standard body was imaged, and the functions of the electric circuit system of the camera 3 etc. If both are the same, the image signal from the camera 3 will have the waveform of the solid curve A in FIG. 4, so there will be no problem of misjudgment during inspection by the computer 43.
然し乍ら、実際問題としては、前述した如く、光源2よ
りの光量の変化、カメラ3等の電気回路系の機能の変化
(ドリフトの増大)等により、仮え被検査物体が標準体
と同一で、同一個所に置かれて撮映されたとしても、カ
メラ3よりの画像信号は、例えば第4図の点線カーブB
で示す如く、標準体を撮映した場合の画像信号Aと異っ
たものとなる。However, as a practical matter, as mentioned above, due to changes in the amount of light from the light source 2, changes in the function of the electric circuit system such as the camera 3 (increased drift), etc., even if the object to be inspected is the same as the standard object, Even if the images are taken at the same location, the image signal from the camera 3 will, for example, follow the dotted line curve B in Figure 4.
As shown, the image signal A is different from the image signal A obtained when the standard body is photographed.
従って、この画像信号Bを、そのま5画像信号処理装置
4を介してコンピュータ43で検査すると、この被検査
物体は、不良品と判定されてしまう。Therefore, if this image signal B is directly inspected by the computer 43 via the 5-image signal processing device 4, the object to be inspected will be determined to be defective.
斯る場合に、誤判定を回避し得る本発明の画像信号処理
装置4の一例を、第5図を参照して詳紐に説明する。An example of the image signal processing device 4 of the present invention that can avoid erroneous determination in such a case will be explained in detail with reference to FIG. 5.
この第5図に示す本発明の例に於ては、カメラ3の出力
画像信号を、従来と同様に、A−D変換器41に供給す
ると共に、較正体5に対応する信号より較正信号を検出
形成する較正信号形成回路44にも供給する。In the example of the present invention shown in FIG. 5, the output image signal of the camera 3 is supplied to the A-D converter 41 as in the conventional case, and a calibration signal is obtained from the signal corresponding to the calibration body 5. It is also supplied to a calibration signal forming circuit 44 for detecting and forming.
A−D変換器41よりのデジタル画像信号と、較正信号
形成回路44よりの較正体5の画像5′の、例えばレベ
ルに対応する較正信号とを、補正回路45へ供給する。A digital image signal from the A-D converter 41 and a calibration signal corresponding to, for example, the level of the image 5' of the calibration body 5 from the calibration signal forming circuit 44 are supplied to the correction circuit 45.
この補正回路45は、A−D変換器41よりのデジタル
画像信号を、較正信号形成回路44より較正信号で、次
の如く補正する。This correction circuit 45 corrects the digital image signal from the A-D converter 41 using a calibration signal from the calibration signal forming circuit 44 as follows.
即ち、標準体を撮映した時の画像信号は、第4図の実線
カーブAの如くであり、標準体1及び較正体5に対応す
る画像信号のレベルは、夫々A1及びB1であったもの
が、標準体と同一の被検査物体1を撮映した時の画像信
号は、上述の原因により、第4図の点線カーブBの如く
なり、被検査物体1及び較正体5に対応する画像信号の
レベルは、夫々A2及びB2に変化しているので、この
レベル変化を実線カーブAのレベル、即ちレベルB2を
レベルB1に戻し、画像信号B全体を画像信号Aに戻す
(この場合、レベルA2はレベルA1に戻される:補正
を、この補正回路45は行う。That is, the image signal when the standard body was photographed was as shown by the solid line curve A in FIG. 4, and the levels of the image signals corresponding to the standard body 1 and the calibration body 5 were A1 and B1, respectively. However, due to the above-mentioned reasons, the image signal when the inspected object 1, which is the same as the standard object, is photographed becomes like the dotted line curve B in FIG. 4, and the image signal corresponding to the inspected object 1 and the calibration object 5. have changed to A2 and B2, respectively, so this level change is returned to the level of solid curve A, that is, level B2, to level B1, and the entire image signal B is returned to image signal A (in this case, level A2 is returned to level A1: the correction circuit 45 performs the correction.
従って、この補正回路45の出力は、被検査物体1の撮
映時の条件を、標準体1の撮映時の条件と同一となす働
きをなす。Therefore, the output of the correction circuit 45 serves to make the conditions when photographing the object to be inspected 1 the same as the conditions when photographing the standard body 1.
本発明の第5図の例では、この補正回路45の出力を特
徴抽出回路42に供給し、その出力情報信号をコンピュ
ータ43で標準体の情報信号と比較検査しているので、
標準体と同一の被検査物体を撮映した場合、その画像信
号が上述の如き原因により、第4図のカーブBで示す如
く、標準体の画像信号Aと異っていても、前者は較正信
号形成回路44及び補正回路45の作用により後者と同
一となされるので、両者は同一である、と判定され得る
ものである。In the example of FIG. 5 of the present invention, the output of the correction circuit 45 is supplied to the feature extraction circuit 42, and the output information signal is compared and inspected by the computer 43 with the information signal of the standard body.
When the same object to be inspected as the standard body is photographed, even if the image signal differs from the image signal A of the standard body as shown by curve B in Figure 4 due to the reasons mentioned above, the former is not calibrated. Since it is made to be the same as the latter by the action of the signal forming circuit 44 and the correction circuit 45, it can be determined that the two are the same.
本発明による検査方法及び装置は、被検査物体が標準体
と真に相違している時のみ(この場合、当然のこと乍ら
、被検査物体に対応する画像信号そのものが標準体のそ
れと相違する)、被検査物体を否と判定し、上述の如き
従来の装置の如く、被検査物体以外に起因する誤判定を
することはない0
尚、第5図に示す本発明の例は、補正回路45をA−D
変換器41の後段に設けた場合であるが、補正回路45
の接続位置は、A−D変換器の後段に限定する必要はな
く、その他の位置でもよい。The inspection method and apparatus according to the present invention are applicable only when the object to be inspected is truly different from the standard object (in this case, of course, the image signal itself corresponding to the object to be inspected is different from that of the standard object). ), the object to be inspected is determined to be rejected, and unlike the conventional apparatus described above, there is no erroneous determination caused by something other than the object to be inspected.In addition, the example of the present invention shown in FIG. 45 A-D
This is a case where the correction circuit 45 is provided after the converter 41.
The connection position does not need to be limited to the downstream stage of the A-D converter, and may be at any other position.
第6図は本発明の他の例の主要部、即ち画像信号処理装
置4の他の例を示すブロック線図で、同図に於て、第5
図と同一符号は互に同一素子を示すものである。FIG. 6 is a block diagram showing the main part of another example of the present invention, that is, another example of the image signal processing device 4.
The same reference numerals as in the figures indicate the same elements.
初で、この第6図に示す本発明の例に於ては、カメラ3
よりの出力信号を、先ず較正信号形成回路44及び補正
回路45に供給し、更に較正信号形成回路44の出力信
号を補正回路45に供給し、前例と同様に、補正回路4
5に於て、カメラ3よりの画像信号を正規化する。For the first time, in the example of the present invention shown in FIG.
The output signal of
In step 5, the image signal from the camera 3 is normalized.
即ち、較正体5へ照射される光量の変化や、カメラ3等
の電気回路系のドリフト等の影響を除いた画像信号を作
り、これを、従来と同様に、’A−D変換器41、特徴
抽出回路42及びコンピュータ43で処理し、検査を行
う。That is, an image signal is created from which influences such as changes in the amount of light irradiated to the calibration body 5 and drifts of the electric circuit system of the camera 3, etc. are removed, and this signal is sent to the 'A-D converter 41, The feature extraction circuit 42 and computer 43 process and test the data.
従って、本発明のこの例によっても、従来の欠点は回避
され得るものである。Therefore, with this example of the invention, the conventional drawbacks can also be avoided.
上述した如く、本発明によれば、被検査物体への光量の
変化や、カメラ等の電気回路系等に起因して、カメラよ
りの被検査物体に対応する画像信号が、標準体を撮映し
た時の条件と異る如く変化したとしても、単に較正体を
カメラの標準体又は被検査物体に対する視野内に配し、
この較正体に対応するカメラよりの撮像信号に基づき、
較正信号形成回路により較正信号を作り、これを用いて
、カメラよりの撮像信号をコンピュータ等で比較処理す
る前に、補正回路で補正することにより、上述の画像信
号の変化を自動的に補正し、上述の如き原因による誤判
定を回避し得る。As described above, according to the present invention, the image signal corresponding to the object to be inspected from the camera may be caused by changes in the amount of light to the object to be inspected or the electric circuit system of the camera, etc. Simply place the calibration object within the camera's field of view for the standard object or object to be inspected, even if the conditions have changed from those at the time of the test.
Based on the imaging signal from the camera corresponding to this calibration body,
A calibration signal is generated by a calibration signal forming circuit, and using this signal, the above-mentioned change in the image signal is automatically corrected by correcting it by a correction circuit before comparing and processing the imaging signal from the camera with a computer, etc. , it is possible to avoid misjudgment due to the causes mentioned above.
従って、本発明に於ては、光量変動の少ない高価な光源
を使用する必要もなく、光源より被検査物体への光量の
変化を防ぐ厳重な防光設備を設ける必要もなく、更に自
身に変動の少ない高価なカメラを必要としないので、こ
の種装置の価格を大巾に減少し得ると共に、精度を改善
すると云う、犬なる効果がある。Therefore, in the present invention, there is no need to use an expensive light source with little variation in light intensity, and there is no need to provide strict light protection equipment to prevent changes in the light intensity from the light source to the object to be inspected. This has the advantage of significantly reducing the cost of this type of device and improving accuracy, since fewer and more expensive cameras are not required.
尚、図示の例では、較正体5を台T上の一部に置いたが
、較正体5の位置は、カメラ3の視野内に於て、標準体
又は被検査物体の撮映を妨害しない位置で、しかも、標
準体及び被検査物体の撮映中、それらに対して不変に保
持するならば、どこでもよい。In the illustrated example, the calibration body 5 is placed on a part of the table T, but the position of the calibration body 5 is such that it does not interfere with the imaging of the standard body or the object to be inspected within the field of view of the camera 3. Any position is acceptable as long as it remains unchanged relative to the standard object and the object to be inspected during imaging.
更に、較正体5は白い紙に限定する必要はなく、上述の
目的を達成し得る範囲内で、例えば灰色、黄色等でもよ
く、更にその材質に関しても、特別の制限は不要で、そ
の色を不変に保ち得るものならば、なんでもよいし、そ
の形状に就いても、特別の限定のないことも、明らかで
あろう。Furthermore, the calibrator 5 does not have to be limited to white paper; it may be gray, yellow, etc., as long as the above-mentioned purpose can be achieved, and there is no need for any special restrictions on the material; It is clear that anything can be used as long as it can be kept unchanged, and there are no particular limitations on its shape.
更に、図示の例では補正を装置のハードウェアで行って
いるが、同様の補正をコンピュータのソフトウェアで行
うこともできる。Furthermore, although in the illustrated example the correction is performed by the hardware of the apparatus, similar corrections can also be performed by computer software.
第1図は従来の検査装置の一例の路線的ブロック線図、
第2図は本発明の検査装置の一例の系統的ブロック線図
、第3図は本発明のテレビカメラのスクリーンの正面図
、第4図は本発明のテレビカメラの画像信号を示す波形
図、第5図は第2図に示す本発明の系統図の要部のブロ
ック線図、第6図は本発明の他の例の要部のブロック線
図である。
図に於て、1は標準体又は被検査物体、2は光源、3は
テレビカメラ、4は画像信号処理装置、5は較正体、4
1はA−D変換器、42は特徴抽・出回路、43はコン
ピュータ、44は較正信号形成回路、45は補正回路、
Sはカメラのスクリーン、1′は被検査物体の画像、5
′は較正体の画像を夫々示す。Figure 1 is a schematic block diagram of an example of a conventional inspection device.
FIG. 2 is a systematic block diagram of an example of the inspection device of the present invention, FIG. 3 is a front view of the screen of the television camera of the present invention, and FIG. 4 is a waveform diagram showing image signals of the television camera of the present invention. FIG. 5 is a block diagram of the main parts of the system diagram of the present invention shown in FIG. 2, and FIG. 6 is a block diagram of the main parts of another example of the invention. In the figure, 1 is a standard body or an object to be inspected, 2 is a light source, 3 is a television camera, 4 is an image signal processing device, 5 is a calibration body, 4
1 is an A-D converter, 42 is a feature extraction circuit, 43 is a computer, 44 is a calibration signal forming circuit, 45 is a correction circuit,
S is the camera screen, 1' is the image of the object to be inspected, and 5
′ indicates the image of the calibration body, respectively.
Claims (1)
査をする方法に於て、上記撮像体の標準体及び被検査物
体に対する視野内に検査の条件の基準となる較正体を配
置して、該較正体及び上記標準体又は被検査物体を同時
に上記撮像体により撮像し、該撮像体よりの撮像信号の
うち上記較正体に対応する信号を検出し、該検出信号に
より上記撮像体よりの画像信号を補正するようになした
ことを特徴とする検査方法。 2 撮像体と、それよりの画像信号を処理するA−り変
換器、特徴抽出回路及びコンピュータ等を有する画像信
号処理装置とを有し、物体の検査を行う検査装置に於て
、上記撮像体の標準体及び被検査物体に対する視野内に
検査の条件の基準となる較正体を配置して、該較正体及
び上記標準体又は被検査物体を同時に上記撮像体により
撮像し、該撮像体よりの画像信号を較正信号形成回路に
供給し、これにより上記画像信号のうち上記較正体に対
応する信号を検出し、該検出信号及び上記画像信号を補
正回路に供給し、ここで上記撮像体よりの画像信号を上
記検出信号で補正するようになしたことを特徴とする検
査装置。[Claims] 1. In a method of inspecting an object by processing an imaging body and image signals from it, a reference object for the inspection conditions is provided within the field of view of the standard body and the object to be inspected of the imaging body. A calibration body is arranged, the calibration body and the standard body or the object to be inspected are simultaneously imaged by the imaging body, a signal corresponding to the calibration body is detected from among the imaging signals from the imaging body, and the detection signal is detected. An inspection method characterized in that the image signal from the imaging body is corrected by. 2. In an inspection apparatus for inspecting an object, which includes an image pickup body and an image signal processing device having an A-ray converter, a feature extraction circuit, a computer, etc. for processing image signals from the image pickup body, the image pickup body A calibration body, which serves as a reference for the inspection conditions, is placed within the field of view for the standard body and the object to be inspected, and the calibration body and the standard body or the object to be inspected are simultaneously imaged by the image pickup body, and the image from the image pickup body is An image signal is supplied to a calibration signal forming circuit, which detects a signal corresponding to the calibration object among the image signals, and the detection signal and the image signal are supplied to a correction circuit, where the signal from the image pickup object is detected. An inspection device characterized in that an image signal is corrected using the detection signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15589277A JPS5815041B2 (en) | 1977-12-24 | 1977-12-24 | Inspection method and equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15589277A JPS5815041B2 (en) | 1977-12-24 | 1977-12-24 | Inspection method and equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5487555A JPS5487555A (en) | 1979-07-12 |
| JPS5815041B2 true JPS5815041B2 (en) | 1983-03-23 |
Family
ID=15615774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15589277A Expired JPS5815041B2 (en) | 1977-12-24 | 1977-12-24 | Inspection method and equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5815041B2 (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0619335B2 (en) * | 1985-01-25 | 1994-03-16 | シグマツクス株式会社 | Object recognition device |
| JPH038751U (en) * | 1989-06-15 | 1991-01-28 | ||
| ATE472090T1 (en) * | 2006-12-15 | 2010-07-15 | Fraunhofer Ges Forschung | METHOD AND DEVICE FOR THICKNESS MEASURING |
| JP4981185B2 (en) * | 2011-08-30 | 2012-07-18 | シグマツクス株式会社 | Injection molding machine monitoring device |
| JP5037733B2 (en) * | 2012-01-11 | 2012-10-03 | シグマツクス株式会社 | Injection molding machine monitoring device |
-
1977
- 1977-12-24 JP JP15589277A patent/JPS5815041B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5487555A (en) | 1979-07-12 |
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