JPS581505B2 - Denkai Housiya Denshijiyuu - Google Patents
Denkai Housiya DenshijiyuuInfo
- Publication number
- JPS581505B2 JPS581505B2 JP49005882A JP588274A JPS581505B2 JP S581505 B2 JPS581505 B2 JP S581505B2 JP 49005882 A JP49005882 A JP 49005882A JP 588274 A JP588274 A JP 588274A JP S581505 B2 JPS581505 B2 JP S581505B2
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- field emission
- electric field
- electron gun
- electron flow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Electron Sources, Ion Sources (AREA)
Description
【発明の詳細な説明】
本発明は電界放射電子銃の構成に関するもので特に陰極
の保護装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to the structure of a field emission electron gun, and particularly to a cathode protection device.
電界放射電子は尖端の曲率半径の小さいタングステンの
針に107〔v/CrrL〕程度の強電界を与えること
により得られる。Field emission electrons are obtained by applying a strong electric field of about 107 [v/CrrL] to a tungsten needle whose tip has a small radius of curvature.
陰極の脱ガスを行った清浄な陰極からの放射電子流は第
1図に示すよう外経一変化を示す。The emitted electron flow from a clean cathode after degassing the cathode exhibits a change in external diameter as shown in FIG.
この放射電子流の変化は陰極表面へのガス吸着によるも
ので、清浄であった陰極へガス吸着することにより陰極
表面の仕事関数が増加し放射電子流が減少する。This change in the radiated electron flow is due to gas adsorption on the cathode surface. By gas adsorption to the clean cathode, the work function of the cathode surface increases and the radiated electron flow decreases.
初期では放射電子流の減少は早く(この領域は初期減少
領域といわれる)ほぼ単原子−のガス吸着が終ると電子
流の減少はとまり、ほぼ一定の放射電子流が得られる(
この領域は安定領域といわれ1 0”−10Torrオ
ーダーの真空度では8時間にもなる)。At the beginning, the radiation electron flow decreases quickly (this region is called the initial reduction region). When the gas adsorption of almost monoatomic atoms ends, the decrease in the electron flow stops, and a nearly constant radiation electron flow is obtained (
This region is called a stable region and can last up to 8 hours at a vacuum degree of 10"-10 Torr).
その後は徐徐に放射電子流の増加がみられ、パルス状の
電流変化がしだいに多くなりついには陰極で真空内放電
をおこし陰極を破損し、再び電界放射電子が得られなく
なる。After that, the emitted electron flow gradually increases, and the pulse-like current changes gradually increase, eventually causing a discharge in vacuum at the cathode, damaging the cathode, and making it impossible to obtain field emitted electrons again.
(この領域は不定領域といわれ札真空内放電が生じる前
に陰極へ与える強電界を遮断し陰極の脱ガスを行えば第
1図の経過を再びたどることができる。(This region is called an indeterminate region, and if the strong electric field applied to the cathode is cut off and the cathode is degassed before the vacuum discharge occurs, the process shown in FIG. 1 can be traced again.
本発明はこの陰極の脱ガスを行うべき時期を簡単左方法
で検知し、陰極の破損を防ぐようにした電界放射電子銃
を提供するものである。The present invention provides a field emission electron gun that detects the time when the cathode should be degassed using a simple method and prevents damage to the cathode.
不安定領域では放射電子流の増加があることから安定領
域の値の150%に達したときに陰極に与える強電界を
遮断する等の方法も考えられているが放射電子流の変化
が非常にゆっくりしたものであるため記憶装置を必要と
するため大がかりなものどなる。Since the radiation electron flow increases in the unstable region, methods such as cutting off the strong electric field applied to the cathode when it reaches 150% of the value in the stable region have been considered, but the change in the radiation electron flow is very large. Since it is slow and requires a storage device, it is a large-scale process.
本発明は不安定領域においてパルス状の電流変化がしだ
いに増加していることから、パルス状の電流変化のみを
検出し、この検出量により陰極の脱ガス時期を検知する
方法である。Since pulse-like current changes gradually increase in an unstable region, the present invention is a method of detecting only pulse-like current changes and detecting the time of cathode degassing from this detected amount.
第2図は本発明の実施例を示すものである。FIG. 2 shows an embodiment of the invention.
陰極1、第1陽極2は高真空容器3に内蔵されている。The cathode 1 and the first anode 2 are housed in a high vacuum container 3.
スイッチ6をオンすることにより第1陽極電圧5が印加
され陰極1の先端から電子が放出される。By turning on the switch 6, the first anode voltage 5 is applied and electrons are emitted from the tip of the cathode 1.
放射電子流のパルス状の電流変化はパルス電流検出器4
で検出され、増幅器7で増幅され所定の値に達したとき
に警報器8をオンする。Pulse current changes in the emitted electron flow are detected by a pulse current detector 4.
is detected, amplified by an amplifier 7, and when a predetermined value is reached, an alarm 8 is turned on.
この警報により操作者はスイッチ6をオフすることがで
き陰極1の破損を防ぐことができる。This alarm allows the operator to turn off the switch 6, thereby preventing damage to the cathode 1.
第3図は前記実施例の警報器8をオンするかわりにリレ
ーコイル9をオンとし、これに連動してスイッチ6をオ
フするようにした本発明の他の実施例である。FIG. 3 shows another embodiment of the present invention in which instead of turning on the alarm 8 of the previous embodiment, a relay coil 9 is turned on and the switch 6 is turned off in conjunction with this.
第4図は他の実施例を示すものでパルス電流検出器4の
出力を増幅器7で増幅し、交直変換器10で直流とし積
分器11で積分し積分器11の出力が所定の値に達した
ときにリレーコイル9をオンとしスイッチ6をオフにす
る。FIG. 4 shows another embodiment in which the output of the pulse current detector 4 is amplified by the amplifier 7, converted to DC by the AC/DC converter 10, and integrated by the integrator 11 until the output of the integrator 11 reaches a predetermined value. When this occurs, the relay coil 9 is turned on and the switch 6 is turned off.
積分器110時定数を変えることにより検知時期の調整
を行うこともできる。The detection timing can also be adjusted by changing the time constant of the integrator 110.
このように積分値で制御すると外部からの雑音等により
誤動作を少くすることができる。By controlling using the integral value in this manner, malfunctions caused by external noise etc. can be reduced.
同様にパルス電流検出器4の出力を計数しその計数値に
より制御することも可能である。Similarly, it is also possible to count the output of the pulse current detector 4 and control based on the counted value.
第5図は他の実施例を示すものである。FIG. 5 shows another embodiment.
上記の説明においては簡単のため第2陽極のない構造を
説明したが本実施例においては第2陽極14を備えてい
る。In the above description, a structure without the second anode was described for the sake of simplicity, but in this embodiment, the second anode 14 is provided.
本実施例は電界放射電子銃を走査形電子顕微鈍の電子銃
として用いた装置に実施した例を示すものである。This example shows an example in which a field emission electron gun is used as an electron gun for a scanning electron microscope.
電界放射電子流に含まれる交流成分(雑音)は安定領域
においても4〜5%あり、走査形電子顕微鏡においては
走査像に雑音があらわれ、像を悪くしてしまう。The alternating current component (noise) contained in the field emission electron flow is 4 to 5% even in the stable region, and in a scanning electron microscope, noise appears in the scanned image and deteriorates the image.
このため走査形電顕に使用した場合には補正回路を用い
て走査像が消去する方法をとっている。For this reason, when used in a scanning electron microscope, a correction circuit is used to erase the scanned image.
陰極と陽極2の間に数KVの引出電圧を印加すると陰極
1から電子放射がなされる。When an extraction voltage of several kilovolts is applied between the cathode and anode 2, electrons are emitted from the cathode 1.
この電子はさらに第2陽極14に加速電圧12を印加し
任意の電圧に加速される。These electrons are further accelerated to an arbitrary voltage by applying an accelerating voltage 12 to the second anode 14.
第1陽極2と第2陽極14は一組の静電レンズを形成し
、電子ビームはこの静電レンズにより集束作用をうける
。The first anode 2 and the second anode 14 form a pair of electrostatic lenses, and the electron beam is focused by this electrostatic lens.
一般に用いる電圧配分では静電レンズを通過したビーム
はほとんど平行となる。With commonly used voltage distribution, the beams passing through the electrostatic lens are almost parallel.
補正信号検出器は第1絞り15、第2絞り16と2次電
子検出器17によって形成されている。The correction signal detector is formed by a first aperture 15, a second aperture 16, and a secondary electron detector 17.
第1絞り15の孔により陰極からの放射角を約10mr
に制限し、さらに第2絞り16で約6mrに制限する。The radiation angle from the cathode is approximately 10 mr due to the hole of the first diaphragm 15.
and is further limited to approximately 6 mr by the second aperture 16.
第2絞り16を通過した電子は電磁レンズ20により点
集束され走査電子として偏向コイル19で試料21上を
走査される。The electrons that have passed through the second aperture 16 are focused by an electromagnetic lens 20 and scanned over a sample 21 by a deflection coil 19 as scanning electrons.
第1絞り15を通過して第2絞り16に衝突する電子に
よって発生した2次電子は検出器17で検出され補正信
号となる。Secondary electrons generated by electrons passing through the first aperture 15 and colliding with the second aperture 16 are detected by the detector 17 and become a correction signal.
一方試料21から発生した2次電子等は検出器18によ
り検出され情報信号となる。On the other hand, secondary electrons and the like generated from the sample 21 are detected by the detector 18 and become information signals.
情報信号と補正信号とは補正装置22により割算され、
その出力は偏向コイル19と同期した偏向コイル23を
もったブラウン管24の輝度変調信号となり走査像を形
成する。The information signal and the correction signal are divided by the correction device 22,
The output becomes a brightness modulation signal of a cathode ray tube 24 having a deflection coil 23 synchronized with the deflection coil 19 to form a scanning image.
このような構成とすることにより交流成分の含有率は1
/3−1/5に減衰される。With this configuration, the content of AC components is reduced to 1
/3-1/5.
この補正信号検出器17に含まれるパルス状の電流変化
を増幅器7で増幅し、所定の値に達したときにリレーコ
イル9をオンにし、リレー13を切り換えて引出電圧5
を第1陽極2から切り離すようにする。The pulse-like current change included in this correction signal detector 17 is amplified by the amplifier 7, and when it reaches a predetermined value, the relay coil 9 is turned on, and the relay 13 is switched to increase the output voltage 5.
is separated from the first anode 2.
以上説明したようなパルス電流検出器を設けることによ
り電界放射電子流の不安定領域を簡単でしかも正確に検
知することができ、工業的寄与は甚大である。By providing a pulse current detector as described above, unstable regions of field emission electron flow can be detected easily and accurately, and the industrial contribution is enormous.
第1図は電界放射電子流の経時変化、第2図、第3図、
第4図、第5図は本発明の実施例を示したものである。
1は陰極、2は第1陽極、3は高真空容器、4はパルス
電流検出器、5は第1陽極用電源、6はスイッチ、7は
増幅器、8は警報器である。Figure 1 shows the change in field emission electron flow over time, Figures 2 and 3,
FIGS. 4 and 5 show an embodiment of the present invention. 1 is a cathode, 2 is a first anode, 3 is a high vacuum container, 4 is a pulse current detector, 5 is a power source for the first anode, 6 is a switch, 7 is an amplifier, and 8 is an alarm.
Claims (1)
を少くとも有する電界放射電子銃において、陪陰極に与
える強電界を制御する情報として該陰極から放射される
全電子流またはその1部に含まれる電子流が減少した後
における電子流のパルス状変動成分を検出する検出手段
を具備し、該検出手段の出力により前記陰極に与える強
電界を遮断もしくは低下するごとく構成したことを特徴
とする電界放射電子銃。 2 上記検出器の出力を積分して、その積分値が所定の
値に達したときに上記陰極に与える強電界を遮断もしく
は低下する手段を設けたことを特徴とする特許請求の範
囲第1項記載の電界放射電子銃。 3 上記検出手段の出力を計数して、この全計数値又は
時間当りの計数値が所定の値に達したときに陰極に与え
る強電界を遮断もしくは低下する手段を設けたことを特
徴とする特許請求の範囲第1項記載の電界放射電子銃。[Scope of Claims] 1. In a field emission electron gun having at least a field emission cathode and an anode that applies a strong positive electric field to the cathode, the total amount emitted from the cathode is used as information for controlling the strong electric field applied to the cathode. A detection means is provided for detecting a pulse-like fluctuation component of the electron flow after the electron flow or a part of the electron flow has decreased, and the strong electric field applied to the cathode is blocked or reduced by the output of the detection means. A field emission electron gun characterized by comprising: 2. Claim 1, characterized in that the device is provided with means for integrating the output of the detector and interrupting or reducing the strong electric field applied to the cathode when the integrated value reaches a predetermined value. Field emission electron gun described. 3. A patent characterized in that a means is provided for counting the output of the detection means and for blocking or reducing the strong electric field applied to the cathode when the total counted value or the counted value per time reaches a predetermined value. A field emission electron gun according to claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49005882A JPS581505B2 (en) | 1974-01-11 | 1974-01-11 | Denkai Housiya Denshijiyuu |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49005882A JPS581505B2 (en) | 1974-01-11 | 1974-01-11 | Denkai Housiya Denshijiyuu |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50103251A JPS50103251A (en) | 1975-08-15 |
| JPS581505B2 true JPS581505B2 (en) | 1983-01-11 |
Family
ID=11623258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49005882A Expired JPS581505B2 (en) | 1974-01-11 | 1974-01-11 | Denkai Housiya Denshijiyuu |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS581505B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55155454A (en) * | 1979-05-22 | 1980-12-03 | Jeol Ltd | Scanning electron microscope equipped with electromagnetic radiation type electron gun |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5548427B2 (en) * | 1971-09-23 | 1980-12-05 |
-
1974
- 1974-01-11 JP JP49005882A patent/JPS581505B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50103251A (en) | 1975-08-15 |
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