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JPS58172289A - Growth device of crystal - Google Patents
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JPS58172289A - Growth device of crystal - Google Patents

Growth device of crystal

Info

Publication number
JPS58172289A
JPS58172289A JP5349682A JP5349682A JPS58172289A JP S58172289 A JPS58172289 A JP S58172289A JP 5349682 A JP5349682 A JP 5349682A JP 5349682 A JP5349682 A JP 5349682A JP S58172289 A JPS58172289 A JP S58172289A
Authority
JP
Japan
Prior art keywords
crystal
melt
raw material
height
pulling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5349682A
Other languages
Japanese (ja)
Other versions
JPS5933553B2 (en
Inventor
Toshiro Matsui
松井 都四郎
Mitsuo Iida
飯田 光雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5349682A priority Critical patent/JPS5933553B2/en
Publication of JPS58172289A publication Critical patent/JPS58172289A/en
Publication of JPS5933553B2 publication Critical patent/JPS5933553B2/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/02Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To detect the height of a melt surface easily and exactly and to enable the replenishing of a raw material with good controllability in a growth device for a crystal by a pulling method, by detecting the change in the atmosphere resistance between a conducting terminal installed without contacting on the melt of the raw material for the crystal and the melt. CONSTITUTION:Polycrystalline Si and a dopant are put into a crucible 1, and are melted with a heater 3 so as to prepare an Si melt 2. The bottom end of the seed crystal 4 mounted to a pulling shaft 5 is immersed in the melt 2 in the crucible 1 and is pulled gradually under rotation of the shaft 5, thereby growing a crystal 7 gradually. On the other hand, granular polycrystalline Si is replenished continuously from a raw material well 13. A DC power source 11 is turned on to apply DC bias to a conducting terminal 9 at around the time when the crystal 7 grows to a specified diameter, and the conducting electric current is amplified with a logarithmic operational amplifier 12, the output signal whereof is outputted to a display 15 for the height of the melt surface. On the other hand, the output signal of the amplifier 12 is outputted to to a solenoid coil of a mechanism for adjusting the inclination of a well 13 to adjust the rate of replenishing from the well 13 so that the height of the liquid surface is kept constant.

Description

【発明の詳細な説明】 〔発−Oa*分野〕 この発明はテ、タラルス中−法による結晶成長装置に:
lIlするものである。
[Detailed description of the invention] [Oa* field] This invention relates to a crystal growth apparatus using the Tararus method:
It is something to do.

〔発明O技術的背景とそO問題点〕[Technical background and problems with the invention]

従来よ〕、シリコン等の単結晶インtットO製造にはテ
、クラルス中−法が多く用いられている。この結晶引上
は装置は>良とえばll料となる多結晶シリ;ンおよび
ドーΔント(横物)會石英ルツzfc入れてこれをヒー
タによ〕加熱して融液を形成し、とのIkmlK種結晶
を接触させ、引上げ軸t−1転させながら徐々に引上げ
、種結晶の下端に!lit晶tI[次成長させるもので
ある。
Conventionally, the Clarus medium method has been widely used to produce single-crystal materials such as silicon. For this crystal pulling, a device is used in which polycrystalline silicon and a dopant (horizontal material) containing quartz rutz (ZFC) are heated by a heater to form a melt. Contact the IkmlK seed crystal of , and gradually pull it up while rotating the pulling axis t-1, until it reaches the lower end of the seed crystal! Lit crystal tI [This is what will be grown next.

ところが従来の引上げ装置では、I11濠中のドーΔン
トが結晶引上けに従い指数関数的に減少するため、引上
軸方向に一定O抵抗値をもつ単結晶イン=1”、)管製
造で11傘い欠点があ−)良。
However, in the conventional pulling device, the dopant in the I11 moat decreases exponentially as the crystal is pulled up, so the single crystal I1 with a constant O resistance value in the direction of the pulling axis is 11 There are some flaws.) Good.

また、多結晶シリコン會引上げ工SO仕込奉段険でルツ
sWC入れるにけである丸め、IA料を一剛の引上は相
轟分のみしか溶かすむとはで111にい、これは著しく
不経済である。
In addition, it is difficult to prepare a polycrystalline silicon material for SO preparation, and it is difficult to round up the IA material when it is put into the SWC. be.

このような問題を解決する丸め、結晶引′上げ装置に原
料袖給手1il會内薦堪せ為提案は既にな噛れている。
A number of proposals have already been made to recommend a rounding and crystal pulling device for raw material handling equipment to solve these problems.

しかしζOI[料補艙0vLirは、ルツI中0IIi
t液量の過少に対する対策およびルツlから液が流出す
る事故に対する対策が未解決の九め゛、未だ実用に供畜
せる段階に至っていまい。
However, ζOI [fare supplement 0vLir is 0IIi in Ruth I
Countermeasures against insufficient amount of liquid and measures against accidents where liquid leaks from the root l are still unresolved, and we have not yet reached the stage where animals can be put to practical use.

〔晃−01的〕 本発明は、*a*ii*高1を簡便かつ正確に検出する
手at備えて制御性のよいj料補給を可能にし九結晶成
長amを提供することを1的とするもc+′eある。
[Ko-01] The present invention aims to provide a method for easily and accurately detecting *a*ii* high 1, making it possible to replenish J material with good controllability, and providing nine crystal growth am. There is also c+'e.

C%@t)1!i費〕 本発明は結晶原料elks上に非接触状部で通電端子を
設置し、ζO通電端子と一諌聞の雰囲気抵抗O羨化を検
出すhことによ〉融液面高さを検出する手段を備える。
C%@t)1! The present invention detects the height of the melt surface by installing a current-carrying terminal on the crystal raw material in a non-contact manner and detecting the change in atmospheric resistance between the current-carrying terminal and the ζO current-carrying terminal. Provide means to do so.

ルッzml@o雰囲気は通常ムrガスであるが、本発明
者らの実験によゐと、融液上に非接触で通電端子を設け
、ルツーを対向電極としてこの間に電圧を印加すると1
118気中に電流が流れること、この雰囲気抵抗は融液
面高さが減少するに従うて指数−数的に増大すること、
が明らかになり九、そOI!由は、高1*txoイオン
伝導性によるものか、他のメカ二ズ五によるものか未だ
不明であるが、本発明はヒ0実験による知見を積極的に
利用するものである。
The atmosphere is usually a mixed gas, but according to experiments conducted by the present inventors, if a current-carrying terminal is provided on the melt without contact, and a voltage is applied between them with the Luzml as a counter electrode, 1
118 Current flows in the atmosphere, and this atmospheric resistance increases exponentially as the melt surface height decreases;
It became clear that 9, so OI! Although it is still unclear whether the reason for this is due to the high 1*txo ion conductivity or other mechanical factors, the present invention actively utilizes the findings from the H0 experiment.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、結晶jI料融液面の高さ【簡便かつ正
確に検出することができ、従うてそO検出結果音用いて
JIc料補給を結晶成長中に連続的に行うことがで會る
。壜たl[刹補給が過鯛O楊合、これ【融液面の嵩畜O
情報として検出し、原料補給を中断ずゐといった制御も
容品である。
According to the present invention, the height of the crystal jI material melt surface can be easily and accurately detected, and the JIc material replenishment can be performed continuously during crystal growth using the sound of the detection result. meet The bottle is [the supply is too much sea bream O Yang, this is [the bulk of the melt surface O]
Detection as information and control such as not interrupting raw material replenishment are also included in the package.

この揚重、結晶側lνは中断する必要がなく、ルツ、r
EIllO1llltFi漸次減少することによシ所定
otmaiさまで戻ることになる。また本発明によれば
、通電端子は融液とは非接触で設置されるので、耐久性
に優れ友構造の簡単な液面検出手段が得られる。通電端
子中そOリード線tルツIやヒータrC接触させないよ
うに絶縁する必要はあるが、これは電気絶縁管を用いる
ことで容易に実現できる。
This lifting, the crystal side lν does not need to be interrupted, Ruth, r
By gradually decreasing EIllO1lltFi, it returns to the predetermined otmai. Further, according to the present invention, since the current-carrying terminal is installed without contacting the melt, it is possible to obtain a liquid level detection means that is excellent in durability and has a simple structure. Although it is necessary to insulate the current-carrying terminal so that it does not come in contact with the center O lead wire tRut I or the heater RC, this can be easily achieved by using an electrically insulating tube.

〔発明の集施例〕[Collection of invention examples]

率晃明〇−実施例管図面を参照して説明する。 This will be explained with reference to the drawings of example tubes.

崗は装置の概略構成を示す、1は石英製ルツが、2はシ
リコン融液、3はヒータ、4は種結晶、Iは引上げ軸、
6はルツが軸、1は引上けられ九シリコン結晶である。
1 shows the schematic configuration of the device, 1 is a quartz crystal, 2 is a silicon melt, 3 is a heater, 4 is a seed crystal, I is a pulling shaft,
6 is a root axis, and 1 is a nine-silicon crystal that has been pulled up.

この基本構成は従来と変らない。ルツMlO融液2上に
、石英管8によ〉保賎された通電端子tが設置られてい
る。
This basic configuration remains the same as before. A current-carrying terminal t protected by a quartz tube 8 is placed on the Ruth MlO melt 2 .

通電端子9はリード線10によpr外に會で導かれ直流
電源11に接続されている。を良ルツI軸6は電気ブラ
シ勢によル接地されておシ、直流電fill 10一端
を対数演算項@tarsに接続して、通電端子9と融液
1間O響閥気を流れゐ電流を検出するようになうている
。にツ11上には、原料wIJとその原料をルツー・1
に補給するための漏斗14が設けられている。原料1i
J jtcは例えdンレノイドコイルを利用し九傾き調
整機構(図示せず)が設けられ、演算増幅器110出力
でこのJ[刹榴sho@f/kt制御して原料補給を行
うようになっている・演算増幅@110出力は液面高さ
表示器IIにも接続されている。
The current-carrying terminal 9 is led outside the pr by a lead wire 10 and connected to a DC power source 11. The I-shaft 6 is grounded by an electric brush, and one end of the DC current fill 10 is connected to the logarithmic term @tars, so that current flows through the air between the current-carrying terminal 9 and the melt 1. It is now possible to detect. On Nitsu 11, raw materials wIJ and its raw materials are listed on Nitsu 1.
A funnel 14 is provided for replenishing. Raw material 1i
The J jtc is equipped with a nine-tilt adjustment mechanism (not shown) using a d-lenoid coil, and the raw material is supplied by controlling this J [sho@f/kt] with the output of the operational amplifier 110. The operational amplifier@110 output is also connected to the liquid level indicator II.

この装置による結晶成長と原料補給O動作を次にa@す
る。まず多結晶シリコン!00gとド一)9ントのホウ
素tルッdllへ入れた後、ヒータ3によシ溶かしシリ
コン融液、tlつくる。ルツ11の上方に設けた引上軸
5の種結晶チャ。
The crystal growth and raw material replenishment operations using this apparatus will be described next. First, polycrystalline silicon! After putting 00g and 900g of boron into tludll, melt it in the heater 3 to create a silicon melt. Seed crystal cha of the pulling shaft 5 provided above the nut 11.

り部に種結晶4を取シ付は友後、引上げ軸5を降下させ
て種結晶4の下端をルツが1内のシリコン融液2に浸し
、続いて引上軸5會回転させながら、徐々に引上げ、種
結晶4の下端に!i!i晶yt*次成長させる。(ロ)
転速度は毎分6〜10回転が最適で、引上げ速度は毎分
2ミリメートルが好しい・このときルッが軸6も同時に
回転させるが、ルツl軸6は電気ブラシで接地させる。
After attaching the seed crystal 4 to the recess, the pulling shaft 5 is lowered to immerse the lower end of the seed crystal 4 in the silicon melt 2 in the melt 1, and then, while rotating the pulling shaft 5, Gradually pull up to the bottom of seed crystal 4! i! i crystal yt * next growth. (B)
The optimum rotation speed is 6 to 10 revolutions per minute, and the preferable pulling speed is 2 mm per minute.At this time, the rudder shaft 6 is also rotated at the same time, but the rudder shaft 6 is grounded with an electric brush.

引上は結晶1の直径が一定になる以前よp、原料溜13
よ多連続的に粒状の多結晶シリコンtルツ11内へ投入
するように原料溜13の傾き一11機構を働かせる。そ
して引上は結晶7の直径が一定になると前後して、直流
電@11のスイッチをオンして通電端子9に直流ノ童イ
アス會印加し、通電電St対数演算増幅器12で増幅し
、その出力信号を液面高さを表示する表示器15へ出力
すると同時VC!jA料榴め13の傾き調整機構のソレ
ノイドコイルへ出力させる。華− 実験によれば、融液2の面と通電端子9間の距離をx3
とし九とき、その間の抵抗R(Q/am”)祉次式で表
現される。
The pulling begins before the diameter of crystal 1 becomes constant, and the raw material reservoir 13
The tilting mechanism 11 of the raw material reservoir 13 is operated so that the raw material is continuously fed into the granular polycrystalline silicon melt 11. Then, around the time when the diameter of the crystal 7 becomes constant, the pulling is performed by turning on the switch of the DC current @ 11 and applying a DC current to the energizing terminal 9, which is amplified by the energizing current St logarithmic operational amplifier 12, and its output When a signal is output to the display 15 that displays the liquid level height, VC! j Output to the solenoid coil of the inclination adjustment mechanism of the A-feed latch 13. According to experiments, the distance between the surface of the melt 2 and the current-carrying terminal 9 is x3.
9, the resistance R (Q/am'') between them is expressed by the following equation.

R=7.5xlO’ @!P (1,6X )λも 従って実麺例によれば、結晶成長に従う融#[□2の減
少量を検出して自動的に原料補給量を制御することで、
安定して長時間結晶を引上げることが可能である。しか
も連続的成長によ如インプットの長さが極めて大きくな
るため作業能率は大幅に向上する。不純物等の添加物も
あらかじめ原料溜め13に調合し入れておくことができ
る九め、従来技術で困難であった指数関数不純物一度変
化を任意に修正して、均質の結晶を連続的に製造するこ
とができる。
R=7.5xlO' @! Therefore, according to the actual noodles example, P (1,6
It is possible to pull crystals stably for a long time. Furthermore, continuous growth greatly increases the length of the input, greatly improving work efficiency. Additives such as impurities can also be prepared and placed in the raw material reservoir 13 in advance.Ninth, homogeneous crystals can be produced continuously by arbitrarily correcting once changes in exponential function impurities, which was difficult with conventional technology. be able to.

なお本発明の変形として、結晶引上げ装置だけにはとど
まらず半導体の鋳造法(中ヤスティンダ法)Kも適用す
ることができる。
As a modification of the present invention, not only the crystal pulling apparatus but also the semiconductor casting method (Nakajastinda method) K can be applied.

を良、本発明の通電端子による融液面高さ検州は原料補
給の制御にとどまらず、通常のチ。
The current-carrying terminal of the present invention can be used not only to control the supply of raw materials, but also to check the height of the melt surface using the current-carrying terminal.

クラルスキー法での直径制御にも利用できる。It can also be used for diameter control using the Kralski method.

この場合、棒状インゴットがSt液と接触する固。In this case, the rod-shaped ingot is in contact with the St liquid.

液界面の近くに通電端子を非接触状態で設置する必要が
ある。これによシ直径の変化分に比例して融液の盛り土
がシの1度が変るため、これt検出することが可能であ
る。
It is necessary to install the current-carrying terminal near the liquid surface in a non-contact manner. As a result, the mound of melt changes by 1 degree in proportion to the change in diameter, and this can be detected.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明の一実施例による結晶引上装置の概略構成図
である。 1・・・ルツ〆、2シリコy融液、s・・・ヒータ、4
・・・種結晶、5・・・引上げ軸、C・・・ルツが軸、
1・・・引上は結晶1.8・・・石英管、9・・・通電
端子、1ノ・・・直流電源、12・・・対数 演算増幅
器、I3・・・原料溜、14・・・漏斗、1j・・・液
面高さ表示器。
The figure is a schematic diagram of a crystal pulling apparatus according to an embodiment of the present invention. 1...Rutsu〆, 2 silicoy melt, s...heater, 4
... Seed crystal, 5... Pulling axis, C... Ruth is the axis,
1... Pulling crystal 1.8... Quartz tube, 9... Current-carrying terminal, 1 No... DC power supply, 12... Logarithmic operational amplifier, I3... Raw material reservoir, 14...・Funnel, 1j...Liquid level height indicator.

Claims (1)

【特許請求の範囲】 ルツかに結晶原料、融液を影威し、この融1[に種結晶
を接触させて引上げることによシ結晶成長を行う装置に
おいて、前記結晶l[胴llk箪上に非接触状部で通電
端子を設置し、ζO過電・端子と結晶J[刹融液関ou
rs気抵抗の変化、【検出するととによjmAjlif
ll−液画高1を検出する手Rt備えたことt−特徴と
する結晶成長装置。
[Scope of Claims] An apparatus for growing a crystal by directly influencing a crystal raw material, a melt, and bringing a seed crystal into contact with the melt and pulling it up. A current-carrying terminal is installed on top of the non-contact part, and the ζO overcurrent terminal and crystal J
Change in resistance, [when detected]
ll- A crystal growth apparatus characterized in that it is equipped with a hand Rt for detecting a liquid image height of 1.
JP5349682A 1982-03-31 1982-03-31 crystal growth equipment Expired JPS5933553B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5349682A JPS5933553B2 (en) 1982-03-31 1982-03-31 crystal growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5349682A JPS5933553B2 (en) 1982-03-31 1982-03-31 crystal growth equipment

Publications (2)

Publication Number Publication Date
JPS58172289A true JPS58172289A (en) 1983-10-11
JPS5933553B2 JPS5933553B2 (en) 1984-08-16

Family

ID=12944436

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5349682A Expired JPS5933553B2 (en) 1982-03-31 1982-03-31 crystal growth equipment

Country Status (1)

Country Link
JP (1) JPS5933553B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5087429A (en) * 1988-04-28 1992-02-11 Nkk Corporation Method and apparatus for manufacturing silicon single crystals

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5087429A (en) * 1988-04-28 1992-02-11 Nkk Corporation Method and apparatus for manufacturing silicon single crystals

Also Published As

Publication number Publication date
JPS5933553B2 (en) 1984-08-16

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