JPS5824371B2 - Method for manufacturing silicon carbide thin film - Google Patents
Method for manufacturing silicon carbide thin filmInfo
- Publication number
- JPS5824371B2 JPS5824371B2 JP50091416A JP9141675A JPS5824371B2 JP S5824371 B2 JPS5824371 B2 JP S5824371B2 JP 50091416 A JP50091416 A JP 50091416A JP 9141675 A JP9141675 A JP 9141675A JP S5824371 B2 JPS5824371 B2 JP S5824371B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon carbide
- thin film
- alkylsilane
- substrate
- glow discharge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910010271 silicon carbide Inorganic materials 0.000 title claims description 30
- 239000010409 thin film Substances 0.000 title claims description 30
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims description 29
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000000034 method Methods 0.000 title description 6
- 239000000758 substrate Substances 0.000 claims description 21
- 239000002994 raw material Substances 0.000 claims description 17
- -1 alkyl hydrocarbon Chemical class 0.000 claims description 13
- 150000001343 alkyl silanes Chemical class 0.000 claims description 13
- 239000004215 Carbon black (E152) Substances 0.000 claims description 10
- 229930195733 hydrocarbon Natural products 0.000 claims description 10
- 238000006243 chemical reaction Methods 0.000 description 12
- 239000007789 gas Substances 0.000 description 10
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 8
- 239000000463 material Substances 0.000 description 5
- 229910000077 silane Inorganic materials 0.000 description 5
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 4
- 125000000217 alkyl group Chemical group 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- 125000004432 carbon atom Chemical group C* 0.000 description 3
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical group C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000004566 IR spectroscopy Methods 0.000 description 2
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 238000001413 far-infrared spectroscopy Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 2
- VXEGSRKPIUDPQT-UHFFFAOYSA-N 4-[4-(4-methoxyphenyl)piperazin-1-yl]aniline Chemical compound C1=CC(OC)=CC=C1N1CCN(C=2C=CC(N)=CC=2)CC1 VXEGSRKPIUDPQT-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 239000003082 abrasive agent Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- FJWRGPWPIXAPBJ-UHFFFAOYSA-N diethyl(dimethyl)silane Chemical compound CC[Si](C)(C)CC FJWRGPWPIXAPBJ-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010574 gas phase reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 229920002521 macromolecule Polymers 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000005049 silicon tetrachloride Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- VCZQFJFZMMALHB-UHFFFAOYSA-N tetraethylsilane Chemical compound CC[Si](CC)(CC)CC VCZQFJFZMMALHB-UHFFFAOYSA-N 0.000 description 1
- INPZSKMAWFGEOP-UHFFFAOYSA-N tetrapropylsilane Chemical compound CCC[Si](CCC)(CCC)CCC INPZSKMAWFGEOP-UHFFFAOYSA-N 0.000 description 1
- JCSVHJQZTMYYFL-UHFFFAOYSA-N triethyl(methyl)silane Chemical compound CC[Si](C)(CC)CC JCSVHJQZTMYYFL-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/32—Carbides
- C23C16/325—Silicon carbide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Description
【発明の詳細な説明】 本発明は炭化珪素薄膜の製造法に関するものである。[Detailed description of the invention] The present invention relates to a method of manufacturing a silicon carbide thin film.
詳しくはグ冶−放電のプラズマ領域内における高エネル
ギー状態を利用した炭化珪素薄膜の製造法に関するもの
で、その目的は従来はとんど不可能とされていた炭化珪
素の数ミクロンあるいはそれ以下の薄膜を得ることにあ
り、炭化珪素のすぐれた特性を種々の材料表面に与えよ
うとするものである。The details relate to a method for manufacturing silicon carbide thin films that utilizes the high energy state within the plasma region of electrical discharge.The purpose of this is to produce silicon carbide thin films of several microns or smaller, which was previously considered impossible. The aim is to obtain thin films and to impart the excellent properties of silicon carbide to the surfaces of various materials.
従来より炭化珪素はいわゆるカーボランダムとして知ら
れその硬度はダイヤモンドに近く熱電材料や研磨材とし
て広く利用されて来ている。Silicon carbide has been known as so-called carborundum, and its hardness is close to that of diamond, and it has been widely used as a thermoelectric material and an abrasive material.
また近年半導体材料として発光ダイオードその他の応用
が検討され注目されている。In addition, in recent years, its applications as a semiconductor material in light emitting diodes and other applications have been studied and attracting attention.
しかしこの炭化珪素を薄膜化する試みはほとんどないの
が現状である。However, at present, there are almost no attempts to reduce the thickness of silicon carbide.
炭化珪素の合成には2000℃に及ぶ高温で気相反応で
行われるがこの反応をそのまま薄膜化の手段とすること
は高温のため不可能である。Silicon carbide is synthesized by a gas phase reaction at a high temperature of up to 2000° C., but it is impossible to directly use this reaction as a means of forming a thin film due to the high temperature.
この反応の温度を下げる試みとしてグ爾−放電によって
四塩化珪素とメタンを反応させた例が報告されているが
実用化に至っていない。In an attempt to lower the temperature of this reaction, an example has been reported in which silicon tetrachloride and methane were reacted by a gas discharge, but this has not been put to practical use.
本発明者はこのきわめて秀れた物性を有する炭化珪素を
薄膜状に基板の上に生成させることを種々検討した結果
、グロー放電を利用した方法で比較的低温において炭化
珪素の数ミクロンあるいはそれ以下の薄膜を得る方法を
発明したのである。As a result of various studies on the production of silicon carbide, which has extremely excellent physical properties, on a substrate in the form of a thin film, the inventors of the present invention discovered that silicon carbide with a thickness of several microns or less can be produced at a relatively low temperature using a method using glow discharge. He invented a method for obtaining thin films.
すなわち、グロー放電により、アルキルシラン、または
シランもしくはアルキルシランとアルキル炭化水素、を
原料とし、該グロー放電のプラズマ領域内に電気的に浮
遊した状態で配設された基板上に、該原料を直接的に反
応生長させることを特lする炭化珪素薄膜の製造方法を
発明するに至った。That is, by glow discharge, alkylsilane or silane or alkylsilane and alkyl hydrocarbon are used as raw materials, and the raw materials are directly placed on a substrate that is electrically suspended in the plasma region of the glow discharge. A method for manufacturing a silicon carbide thin film, which is characterized by organically reactive growth, has been invented.
本発明におけるグロー放電について簡単に説明すると、
いわゆる有極放電によるグロー放電であって、図に示さ
れた様な装置を利用して容器1内を約1O−5Torr
の真空状態にした後、原料気体を原料吸入口4より吸入
し約0.1〜3Torrの圧力に調節しつつ両電極2に
数百ポルトル千数百ボルトの電圧で高周波電流を印加す
ると電気放電が両電極2間に発生する。To briefly explain the glow discharge in the present invention,
This is a so-called glow discharge by polar discharge, and the inside of the container 1 is heated to about 1O-5 Torr using a device like the one shown in the figure.
After creating a vacuum state, the raw material gas is sucked in through the raw material suction port 4, and while adjusting the pressure to about 0.1 to 3 Torr, a high frequency current is applied to both electrodes 2 at a voltage of several hundred volts, and an electric discharge occurs. occurs between both electrodes 2.
この放電が定常持続状態に達した状態をグロー放電とい
うのである。The state in which this discharge reaches a steady state of continuation is called glow discharge.
このグロー放電において図の8の部分は通称陽光柱と呼
ばれる発光領域でここはプラズマ状態になっている。In this glow discharge, the part 8 in the figure is a light emitting region commonly called a positive column, which is in a plasma state.
本発明はこのプラズマ状態が巨視的には低エネルギーで
あるが微視的には非常に高いエネルギー状態であること
を利用して、導入された原料に充分な活性化エネルギー
を与えて炭化珪素を反応生成せんとするものである。The present invention takes advantage of the fact that this plasma state has low energy macroscopically but very high energy microscopically, and gives sufficient activation energy to the introduced raw material to convert silicon carbide. It is intended to produce a reaction.
本発明を図に従って詳細に説明すると、気密容器1内で
あってプラズマ状態となり得る部分8に炭化珪素の薄膜
を付着させるべき基板7を図の様に電気的に浮遊した状
態で並べておき、ついで真空ポンプ6にて容器1内の空
気を抜き約1O−5Torrの真空度とする。The present invention will be explained in detail with reference to the drawings. Substrates 7 to which a thin film of silicon carbide is to be attached are arranged in an electrically floating state as shown in the drawings in a portion 8 in an airtight container 1 that can be in a plasma state. The air inside the container 1 is removed using a vacuum pump 6 to create a vacuum of about 1 O-5 Torr.
そして原料人口4よりアルキルシラン、シランとアルキ
ル炭化水素、または、アルキルシランとアルキル炭化水
素、を容器。Then, from raw material number 4, alkylsilane, silane and alkyl hydrocarbon, or alkylsilane and alkyl hydrocarbon are placed in a container.
1内に吸入し圧力を0.1〜3Torrに調節する。1 and adjust the pressure to 0.1-3 Torr.
ついで容器内の両端にある電極2間に数百ポルトル千数
百ボルトの高周波電流を印加するとやがてグロー放電状
態となる。Then, when a high frequency current of several hundred volts is applied between the electrodes 2 at both ends of the container, a glow discharge state is created.
容器1内を200〜400℃の一定の温度に調節してプ
ラズマ内の電子エネ1ルギーを1〜10 eVにする。The temperature inside the container 1 is adjusted to a constant temperature of 200 to 400°C, and the electron energy in the plasma is set to 1 to 10 eV.
原料ガスは活性化して浮遊基板に沈着しそこで炭素と珪
素は立体格子状に結合して炭化珪素の結晶格子状巨大分
子として基板表面に生成し薄膜として付着する。The source gas is activated and deposited on the floating substrate, where carbon and silicon are combined in a three-dimensional lattice to form silicon carbide crystal lattice macromolecules on the substrate surface and adhere as a thin film.
一方水素原子は水素ガスとなって排気用出口5より排l
出される。On the other hand, the hydrogen atoms become hydrogen gas and are exhausted from the exhaust outlet 5.
Served.
反応生原料は一定の圧力を保ちながら容器1内に原料吸
入口4より供給される。The reaction raw materials are supplied into the container 1 from the raw material inlet 4 while maintaining a constant pressure.
この様にして炭化珪素薄膜は反応と共に生長して適当な
厚さの薄膜が得られたとき電源3を切り反応を停止し炭
化珪素薄膜加工された基板を取り出すので二ある。In this way, the silicon carbide thin film grows with the reaction, and when a thin film of an appropriate thickness is obtained, the power supply 3 is turned off, the reaction is stopped, and the substrate processed with the silicon carbide thin film is taken out.
なお本発明における高周波電流とはIK〜100にサイ
クル7秒の周波数を有する交流である。Note that the high-frequency current in the present invention is an alternating current having a frequency of IK to 100 and a cycle of 7 seconds.
本発明において使用する原料はアルキルシラン単独か、
シランもしくはアルキルシランとアルキ2ル炭化水素の
混合物であり、ここにアルキルシランとはテトラメチル
シラン、テトラエチルシラン、テトラプロピルシラン、
ジメチルジエチルシラン、モノメチルトリエチルシラン
など同一または異なったアルキル基が珪素原子に合計4
個結合したも3のをいう。The raw material used in the present invention is alkylsilane alone,
It is a mixture of silane or alkylsilane and alkyl hydrocarbon, where alkylsilane is tetramethylsilane, tetraethylsilane, tetrapropylsilane,
Dimethyldiethylsilane, monomethyltriethylsilane, etc. have a total of 4 same or different alkyl groups on the silicon atom.
It refers to 3 pieces combined together.
なおこのアルキル基の炭素数については限定する必要は
ないが少くとも該アルキルシランが0.1〜3Torr
の圧力下で400℃以下でガス化する必要があり該アル
キル基の炭素数は自づと限定されるものである。There is no need to limit the number of carbon atoms in this alkyl group, but at least the alkylsilane is 0.1 to 3 Torr.
It is necessary to gasify the alkyl group at a pressure of 400° C. or lower, and the number of carbon atoms in the alkyl group is naturally limited.
3また本発明においてはその原
料としてアルキルシラン単独でもよいが前述の如く、シ
ランとアルキル炭化水素またはアルキルシランとアルキ
ル炭化水素を原料として用いても全く同一の目的を達成
するものであり、このアルキル炭化水素として4はメタ
ン、エタン、フロパン、メタン、ペンタン、・・・など
があげられこの炭素数も特に限定する必要はないが反応
条件でガス化し得るものでなければならない。3 In the present invention, alkylsilane alone may be used as the raw material, but as mentioned above, the same purpose can be achieved even if silane and alkyl hydrocarbon or alkylsilane and alkyl hydrocarbon are used as raw materials. Examples of the hydrocarbon 4 include methane, ethane, furopane, methane, pentane, etc., and the number of carbon atoms does not need to be particularly limited, but it must be able to be gasified under the reaction conditions.
本発明においてプラズマを構成しているアルキルシラン
イオン、シランイオンとアルキル炭化水素イオンまたは
アルキルシランイオンとアルキル炭化水素イオン、ある
いはそれらの中性ガスがいかなる機構で化学反応し炭化
珪素の薄膜が生成するかについては明確ではないが、プ
ラズマ内に浸された浮遊基板面はプラズマから発する数
eV〜10数eVのエネルギーをもった紫外線もしくは
軟X線の定常的な照射を受けているので基板上の原料ガ
ス分子は容易に活性化エネルギーまで励起され得るもの
と考えられ反応の進行に充分寄与し得るものと想定され
る。In the present invention, the alkylsilane ions, silane ions and alkyl hydrocarbon ions, or alkylsilane ions and alkyl hydrocarbon ions, or their neutral gases that constitute the plasma chemically react by any mechanism to produce a thin film of silicon carbide. Although it is not clear whether the surface of the floating substrate immersed in the plasma is constantly irradiated with ultraviolet rays or soft X-rays with an energy of several eV to several tens of eV emitted from the plasma, It is assumed that the source gas molecules can be easily excited to activation energy and can sufficiently contribute to the progress of the reaction.
なお浮遊基板7に原料ガス分子が沈着する機構について
はいわゆるプラズマのイオンシース現象に起因するもの
であることはよく知られている。It is well known that the mechanism by which source gas molecules are deposited on the floating substrate 7 is due to the so-called plasma ion sheath phenomenon.
すなわちプラズマ内では電子の温度がイオンの温度より
2〜3桁高いため電子の飛ぶ速度は速くしたがって浮遊
基板はその衝突で負に帯電しプラズマより負電位になる
。That is, in the plasma, the temperature of the electrons is two to three orders of magnitude higher than the temperature of the ions, so the electrons fly at a high speed, so the floating substrate is negatively charged by the collision and has a more negative potential than the plasma.
すると基板の近傍はイオンで包囲されることになる。The vicinity of the substrate will then be surrounded by ions.
これらのイオンが基板表面に達し電子と結合して沈着す
るのである。These ions reach the substrate surface, combine with electrons, and deposit.
以上の如く本発明の方法は300℃前後の比較的低温で
炭化珪素の数ミクロンあるいはそれ以下の薄膜を基板上
にきわめて均一に製造することができ従来不可能とされ
ていた炭化珪素の薄膜化を可能にしたものである。As described above, the method of the present invention enables extremely uniform production of a thin film of several microns or less of silicon carbide on a substrate at a relatively low temperature of around 300 degrees Celsius, making it possible to produce a thin film of silicon carbide that was previously considered impossible. This is what made it possible.
これは使用される基板の耐熱性に制約を受けることが少
ない点で特に秀れたものといえる。This can be said to be particularly excellent in that there are few restrictions on the heat resistance of the substrate used.
炭化珪素は衆知の如くその硬度はきかめて高く、耐摩耗
性は抜群であるため、これを種々な基板の表面に薄膜化
してやることにより耐摩耗性の保護膜としてあらゆる分
野に応用できるものでありその効果は非常に甚大である
。As is well known, silicon carbide has extremely high hardness and excellent wear resistance, so by forming a thin film on the surface of various substrates, it can be applied in all fields as a wear-resistant protective film. Yes, the effect is enormous.
また本発明はその原料中に塩素等の有害な物質を含まな
いため電子装置に用いてもきわめて好適な炭化珪素薄膜
を製造できるので、その半導体性を利用して薄膜発熱体
として利用することも可能であり、その他の半導体電子
装置としても特に好ましい材料として応用できるのであ
る。Furthermore, since the present invention does not contain harmful substances such as chlorine in its raw materials, it is possible to produce a silicon carbide thin film that is extremely suitable for use in electronic devices, so it can also be used as a thin film heating element by taking advantage of its semiconducting properties. Therefore, it can be applied as a particularly preferable material for other semiconductor electronic devices.
実施例 1
4EMの容量を有する図の様なグロー放電装置内に炭化
珪素の薄膜を形成させるための基板を電気的に浮遊せし
め、真空ポンプにて該容器1内を10−’ Torr
の真空にした。Example 1 A substrate for forming a silicon carbide thin film is electrically suspended in a glow discharge device as shown in the figure having a capacity of 4EM, and the inside of the container 1 is heated to 10-' Torr using a vacuum pump.
It was made into a vacuum.
ついでテトラメチルシラン0.4Torr及びメタン0
.2Torrの分圧を有する混合ガスを該容器内に吸入
し全圧0.6Torrの圧力に調節した。Then 0.4 Torr of tetramethylsilane and 0.0 Torr of methane
.. A mixed gas having a partial pressure of 2 Torr was drawn into the vessel and the total pressure was adjusted to 0.6 Torr.
この原料ガス吸入後ただちにグロー放電を発生させた。Immediately after inhaling this raw material gas, glow discharge was generated.
その条件は周波数5にサイクル7秒の高周波電流で放電
電圧はIKVであり、プラズマ領域内の断面における電
流密度は0.5mAAとした。The conditions were a high frequency current with a frequency of 5 and a cycle of 7 seconds, a discharge voltage of IKV, and a current density in the cross section within the plasma region of 0.5 mAA.
また反応温度は300°Cに調節した。。この様にして
30分間反応させた結果、基板上に約300OAの厚さ
を有する炭化珪素の薄膜が形成されていた。Further, the reaction temperature was adjusted to 300°C. . As a result of reacting in this manner for 30 minutes, a thin film of silicon carbide having a thickness of about 300 OA was formed on the substrate.
なおこの薄膜が炭化珪素であることの同定は赤外及び遠
赤外分光によって行なった。The thin film was identified as silicon carbide by infrared and far-infrared spectroscopy.
実施例 2
実施例1と同様の装置内に、炭化珪素の薄膜を形成させ
るための基板を電気的に浮遊せしめ、真空ポンプにて反
応容器内を10 ”−3Torrの真空にした。Example 2 A substrate for forming a silicon carbide thin film was electrically suspended in the same apparatus as in Example 1, and the inside of the reaction vessel was evacuated to 10''-3 Torr using a vacuum pump.
ついでテトラメチルシラン0.4Torr及び不活性キ
ャリヤーガスとしてアルゴン0.2Torrの分圧を有
する混合ガスを該容器内に吸入し全圧0.6Torrの
圧力に調節した。Then, a mixed gas having a partial pressure of 0.4 Torr of tetramethylsilane and argon as an inert carrier gas was drawn into the vessel and the total pressure was adjusted to 0.6 Torr.
この原料ガス吸入後ただちにグロー放電を発生させた。Immediately after inhaling this raw material gas, glow discharge was generated.
その条件は周波数5にサイクル7秒の高周波電流で、放
電電圧は1000Vであり、プラズマ領域の断面におけ
る電流密度は0.5mA/iとした。The conditions were a high frequency current with a frequency of 5 and a cycle of 7 seconds, a discharge voltage of 1000 V, and a current density in the cross section of the plasma region of 0.5 mA/i.
また反応温度は300°Cに調節した。この様にして3
0分間反応させた結果、基板上に約300 OAの厚さ
を有する炭化珪素の薄膜が形成されていた。Further, the reaction temperature was adjusted to 300°C. In this way 3
As a result of the reaction for 0 minutes, a thin film of silicon carbide having a thickness of about 300 OA was formed on the substrate.
この薄膜が炭化珪素であることの同定は赤外及び遠赤外
分光によって行なった。This thin film was identified as silicon carbide by infrared and far-infrared spectroscopy.
応用例
実施例と同一条件で反応時間だけを60分間にしたもの
はその基板上に約500 OAの厚さを有する炭化珪素
の薄膜を形成していた。Application Example A thin film of silicon carbide having a thickness of about 500 OA was formed on the substrate under the same conditions as in the example, except that the reaction time was 60 minutes.
このものを薄膜サーマルプリントヘッドの耐摩耗性膜と
して利用したところ、二酸化珪素、一酸化珪素などの薄
膜に比して少くとも5倍の耐摩耗性を示した。When this material was used as an abrasion-resistant film for a thin-film thermal printhead, it showed at least five times the abrasion resistance compared to thin films made of silicon dioxide, silicon monoxide, or the like.
図は本発明を実施するための装置の一例である。
1は気密容器、2は電極、3は高周波電源、4は原料吸
入口、5は排気用出口、6は真空ポンプ、7は電気的浮
遊基板、8はプラズマ領域、を表わしている。The figure is an example of an apparatus for carrying out the present invention. 1 is an airtight container, 2 is an electrode, 3 is a high frequency power source, 4 is a raw material inlet, 5 is an exhaust outlet, 6 is a vacuum pump, 7 is an electrically floating substrate, and 8 is a plasma region.
Claims (1)
ランもしくはアルキルシランとアルキル炭化水素、を原
料とし、該グ爾−放電のプラズマ領域内に電気的に浮遊
した状態で配設された基板上に、該原料を直接的に反応
生長させることを特徴とする炭化珪素薄膜の製造方法。1. By glow discharge, an alkylsilane, or an alkylsilane, or an alkylsilane and an alkyl hydrocarbon are used as raw materials, and on a substrate disposed in an electrically floating state within the plasma region of the glow discharge, A method for producing a silicon carbide thin film, which comprises directly reacting and growing the raw material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50091416A JPS5824371B2 (en) | 1975-07-25 | 1975-07-25 | Method for manufacturing silicon carbide thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50091416A JPS5824371B2 (en) | 1975-07-25 | 1975-07-25 | Method for manufacturing silicon carbide thin film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5214600A JPS5214600A (en) | 1977-02-03 |
| JPS5824371B2 true JPS5824371B2 (en) | 1983-05-20 |
Family
ID=14025758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50091416A Expired JPS5824371B2 (en) | 1975-07-25 | 1975-07-25 | Method for manufacturing silicon carbide thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5824371B2 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5671399A (en) * | 1979-11-14 | 1981-06-13 | Mitsubishi Metal Corp | Composite layer diaphragm plate for sound converter and its manufacture |
| JPS56115573A (en) * | 1980-02-15 | 1981-09-10 | Matsushita Electric Ind Co Ltd | Photoconductive element |
| JPS57200215A (en) * | 1981-06-04 | 1982-12-08 | Kanegafuchi Chem Ind Co Ltd | Chemical-resistant protective film having excellent surface hardness |
| US4423701A (en) * | 1982-03-29 | 1984-01-03 | Energy Conversion Devices, Inc. | Glow discharge deposition apparatus including a non-horizontally disposed cathode |
| JPH03255459A (en) * | 1990-11-16 | 1991-11-14 | Matsushita Electric Ind Co Ltd | Production of electrophotographic sensitive body |
| US5465680A (en) * | 1993-07-01 | 1995-11-14 | Dow Corning Corporation | Method of forming crystalline silicon carbide coatings |
-
1975
- 1975-07-25 JP JP50091416A patent/JPS5824371B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5214600A (en) | 1977-02-03 |
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