JPS5829443B2 - Hizumi Soku Teiki - Google Patents
Hizumi Soku TeikiInfo
- Publication number
- JPS5829443B2 JPS5829443B2 JP49128481A JP12848174A JPS5829443B2 JP S5829443 B2 JPS5829443 B2 JP S5829443B2 JP 49128481 A JP49128481 A JP 49128481A JP 12848174 A JP12848174 A JP 12848174A JP S5829443 B2 JPS5829443 B2 JP S5829443B2
- Authority
- JP
- Japan
- Prior art keywords
- output
- switching circuit
- strain
- voltage
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Description
【発明の詳細な説明】
本発明は機械的なひずみを抵抗ひずみゲージにより測定
するひずみ測定器に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a strain measuring instrument that measures mechanical strain using a resistance strain gauge.
特に雑音が少なく、機構が簡単でかつ測定も容易なひず
み測定器に関する。In particular, the present invention relates to a strain measuring instrument that has low noise, has a simple mechanism, and is easy to measure.
従来抵抗ひずみゲージによるひずみ測定はゲージの抵抗
変化をブリッヂあるいはダブルブリッヂを用いて測定し
、ひずみ測定器はそのブリッヂの平衡電圧を拡大して測
定する方法で行われている。Conventionally, strain measurement using a resistance strain gauge is carried out by measuring the change in resistance of the gauge using a bridge or double bridge, and using a strain measuring instrument to measure the balanced voltage of the bridge by magnifying it.
この場合、一般にはブリッヂ用と増幅もしくは校正用の
2つの独立の浮動電源を使用しなければならない。In this case, typically two separate floating power supplies must be used, one for the bridge and one for the amplification or calibration.
このため浮動電源相互間に共通電位をまたがる雑音が発
生し、ひずみ測定精度を悪化させる欠点がある。Therefore, noise occurs across the common potential between the floating power supplies, which has the drawback of deteriorating strain measurement accuracy.
また、増幅器の入力に附加回路が構成され増幅器の入力
インピーダンスが低下するため、実効感度が下がること
にもなる。Further, since an additional circuit is configured at the input of the amplifier, the input impedance of the amplifier is reduced, and the effective sensitivity is also reduced.
さらに多くの測定器ではその構成が複雑であるため、操
作も複雑になり測定に要する時間が長く、多数のひずみ
ゲージを測る場合などに不都合が生じている。Furthermore, many measuring instruments have complicated configurations, making operations complicated and requiring a long time for measurement, which is inconvenient when measuring a large number of strain gauges.
本発明は、雑音が少なく精度が高く、しかも構造および
操作の簡単なひずみ測定器を提供することを目的とする
。SUMMARY OF THE INVENTION An object of the present invention is to provide a strain measuring instrument that has low noise, high accuracy, and is simple in structure and operation.
本発明は、ひずみゲージを構成アームの一辺に含む直流
平衡ブリッヂと、この平衡ブリッヂの平衡出力をそれぞ
れ正負の入力とする差動増幅器と、中点が共通電位点に
接続された直流電源と、この直流電源の出力電圧を前記
平衡ブリッヂに与える第一の開閉回路と、前記直流電源
から正または負の抵抗分圧出力を得る可変抵抗器と、こ
の可変抵抗器の出力を開閉する第二の開閉回路と、上記
直流電源の正および負の直流電圧を入力とじ一以上の抵
抗器および操作により切替えられるスイッチを含み上記
直流電圧の選択された極性が選択された抵抗器を介して
出力に導かれるように構成された較正回路と、この較正
回路の出力を開閉する第三の開閉回路と、前記差動増幅
器の出力に対して前記第二の開閉回路の出力および前記
第三の開閉回路の出力を加算もしくは減算して出力端子
に送出する増幅回路とを備え、
前記ひずみゲージに機械的ひずみが印加される前に前記
第一の開閉回路を閉じたとき前記出力端子に現われる不
平衡出力は、前記第二の開閉回路を閉じて前記可変抵抗
器を加減することにより打消され、
前記ひずみゲージに機械的ひずみが与えられ′たときに
前記第一の開閉回路および第二の開閉回路を閉じた状態
で前記出力端子に現われる測定出力は、前記第一の開閉
回路および前記第二の開閉回路を開いた状態で前記第三
の開閉回路を閉じたときに出力端子に現われる前記較正
回路の出力を基準として計測されるように構成されたこ
とを特徴とする。The present invention comprises a DC balanced bridge including a strain gauge on one side of a constituent arm, a differential amplifier having positive and negative inputs as the balanced outputs of the balanced bridge, and a DC power source whose midpoint is connected to a common potential point. A first switching circuit that applies the output voltage of the DC power supply to the balanced bridge, a variable resistor that obtains a positive or negative resistance-divided voltage output from the DC power supply, and a second switching circuit that switches the output of the variable resistor. The switching circuit includes a switch for inputting the positive and negative DC voltages of the DC power source, one or more resistors, and a switch that can be switched by operation. a third switching circuit configured to open and close the output of the calibration circuit; and a third switching circuit configured to open and close the output of the calibration circuit; an amplifier circuit that adds or subtracts the output and sends it to the output terminal, and when the first switching circuit is closed before mechanical strain is applied to the strain gauge, the unbalanced output that appears at the output terminal is , by closing the second switching circuit and adjusting the variable resistor, and closing the first switching circuit and the second switching circuit when mechanical strain is applied to the strain gauge. The measurement output that appears at the output terminal when the first switching circuit and the second switching circuit are open is the output of the calibration circuit that appears at the output terminal when the third switching circuit is closed. It is characterized in that it is configured to be measured based on .
実施例により詳しく説明する。This will be explained in detail in Examples.
第1図は本発明の実施例構成図である。FIG. 1 is a block diagram of an embodiment of the present invention.
図でA1は差動増幅器、A2は加算増幅器、EBは電池
、RBI〜RB4はブリッヂを構成する抵抗アーム、R
vは可変抵抗器、R1〜R4′は抵抗器、81〜S3は
開閉スイッチ、S4は切替スイッチを示している。In the figure, A1 is a differential amplifier, A2 is a summing amplifier, EB is a battery, RBI to RB4 are resistor arms forming the bridge, and R
v is a variable resistor, R1 to R4' are resistors, 81 to S3 are open/close switches, and S4 is a changeover switch.
第1図の構成な説明すると、ブリッヂの抵抗アームRB
I〜RB4のうち、RB+はひずみゲージである。To explain the configuration of Fig. 1, the resistance arm RB of the bridge
Among I to RB4, RB+ is a strain gauge.
これら抵抗の構成するブリッヂには、電源端子にスイッ
チS1を介して電源EBが導かれ、平衡電圧は差動増幅
器A1 に導かれている。A power supply EB is led to the power supply terminal of the bridge constituted by these resistors via a switch S1, and a balanced voltage is led to a differential amplifier A1.
差動増幅器A1 の出力は抵抗器R1を介して加算増幅
器A2の入力に導かれている。The output of differential amplifier A1 is led via resistor R1 to the input of summing amplifier A2.
加算増幅器A2にはその利得を決める帰還抵抗器R3が
あり、出力は出力端子OUT に結合されている。Summing amplifier A2 has a feedback resistor R3 that determines its gain, and its output is coupled to output terminal OUT.
また、電源EBはその中点を共通電位に接続し、可変抵
抗器Rvは固定端子をこの電源の正負端子に接続し、そ
の摺動端子は抵抗R2およびスイッチS2を介して、前
記加算増幅器A2の一つの加算点に接続する。Further, the power supply EB has its midpoint connected to a common potential, the fixed terminal of the variable resistor Rv is connected to the positive and negative terminals of this power supply, and its sliding terminal is connected to the summing amplifier A2 via a resistor R2 and a switch S2. Connect to one summing point.
スイッチS4aおよびSobは連動スイッチで、スイッ
チSobの端子1,2は上記電源の負出力に、端子4,
5は上記電源の正出力にそれぞれ接続し、端子3は開放
とする。Switches S4a and Sob are interlocking switches, terminals 1 and 2 of the switch Sob are connected to the negative output of the power supply, and terminals 4 and 2 of the switch Sob are connected to the negative output of the power supply.
5 are respectively connected to the positive outputs of the above power supply, and terminal 3 is left open.
スイッチS4bの可動片には2個の抵抗R4およびR4
′の各4を接続して、抵抗R4の他端はスイッチS4a
の端子1と5に、抵抗R4′の他端はスイッチS4aの
端子2と4に接続する。The movable piece of switch S4b has two resistors R4 and R4.
', and the other end of resistor R4 is connected to switch S4a.
The other end of resistor R4' is connected to terminals 1 and 5 of switch S4a.
このスイッチS4aの可動片は、開閉スイッチS3を介
して前記加算増幅器A2の一つの加算点に接続する。The movable piece of this switch S4a is connected to one summing point of the summing amplifier A2 via an on/off switch S3.
ここでスイッチS4a、S4bおよび抵抗R4,R4’
が図のように結線されて構成される回路を「較正回路」
という。Here, switches S4a, S4b and resistors R4, R4'
The circuit configured by connecting as shown in the figure is called the "calibration circuit".
That's what it means.
このように構成された装置の動作を説明する。The operation of the device configured in this way will be explained.
まづ、スイッチS1のみを閉じブリッヂに電圧を与える
。First, only switch S1 is closed to apply voltage to the bridge.
かりにブリッヂの平衡がとれていれば平衡出力はなく、
出力端子OUTに電圧はない。However, if the bridge is balanced, there will be no balanced output;
There is no voltage at the output terminal OUT.
ここでひずみゲージにひずみが加わり、平衡がくずれる
と平衡出力が出て、出力端子にはひずみに対応した電圧
が生じることになる。When strain is applied to the strain gauge and the balance is disrupted, a balanced output is produced, and a voltage corresponding to the strain is generated at the output terminal.
。一般には、素子のバラツキ等により初期不平衡電圧が
生じるので、スイッチS1を閉じて不平衡電圧が出れば
S2を閉じ、ひずみ測定前に可変抵抗Rvを調整して、
加算増幅器A2の入力に平衡電圧と逆の電圧を与え、加
算増幅器A2の出力が零になるように調整しておく。. Generally, an initial unbalanced voltage occurs due to variations in elements, etc., so if an unbalanced voltage is generated when the switch S1 is closed, switch S2 is closed, and the variable resistor Rv is adjusted before strain measurement.
A voltage opposite to the balanced voltage is applied to the input of the summing amplifier A2, and adjustment is made so that the output of the summing amplifier A2 becomes zero.
すなわち、測定ブリッヂの初期不平衡電圧は差動増幅器
A1によりそのまま増幅され、次段の加算増幅器A2に
より打ち消されることになる。That is, the initial unbalanced voltage of the measurement bridge is directly amplified by the differential amplifier A1 and canceled by the summing amplifier A2 in the next stage.
この状態でひずみを測定すると、出力端子に現われる電
圧はひずみ量に対応する電圧である。When strain is measured in this state, the voltage appearing at the output terminal is a voltage corresponding to the amount of strain.
ここでこの電圧を記録してからスイッチS3を閉じ、ひ
ずみ測定のためのスイッチS1 およびスイッチS2を
開く。This voltage is now recorded before closing switch S3 and opening switch S1 and switch S2 for strain measurement.
次にスイッチS4のいずれかを選び、較正回路の出力を
加算増幅器A2に加え、加算増幅器A2の出力で、ひず
み測定時に記録した出力電圧と等しくなるように調整す
る。Next, one of the switches S4 is selected and the output of the calibration circuit is applied to the summing amplifier A2, and the output of the summing amplifier A2 is adjusted to be equal to the output voltage recorded during the strain measurement.
この較正回路のスイッチS4の位置、すなわちその出力
の極性と使用した抵抗の値から、ひずみ電圧の大きさを
知ることができる。The magnitude of the strain voltage can be determined from the position of the switch S4 of this calibration circuit, that is, the polarity of its output and the value of the resistor used.
このように、出力端子OUTで比較される2つの電圧は
ともに同一の電源EBから供給されるものであり、電源
電圧の較正の必要がない。In this way, the two voltages compared at the output terminal OUT are both supplied from the same power supply EB, and there is no need to calibrate the power supply voltage.
操作の順序を変えて、ひずみ測定の前にあらかじめ較正
回路の出力で校正しておけばひずみを直読することがで
きる。By changing the order of operations and calibrating with the output of the calibration circuit before measuring strain, it is possible to directly read the strain.
※※ さらに出力電圧の関係を式を用いて詳しく説明する。 ※※ Furthermore, the relationship between the output voltages will be explained in detail using equations.
抵抗ひずみゲージのゲージ率をkとすると、ゲージRB
tにひずみが加わった場合ゲージRBtの抵抗値は(1
+にε)倍に増加する。If the gauge factor of the resistance strain gauge is k, then the gauge RB
When strain is applied to t, the resistance value of gauge RBt is (1
+ to ε) times.
いま、ひずみを加える前に測定ブリッヂの初期平衡がと
れていたと仮定すれば、測定ブリッヂの出力e1 は次
の式で表わされる。Now, assuming that the measuring bridge is initially balanced before applying strain, the output e1 of the measuring bridge is expressed by the following equation.
′となる。'.
従って、可変抵抗器Rvの摺動子E点の電位e8= O
のとき、すなわちちょうど中点にあるとき、出力ec
は加算増幅器A2の利得はとなる。Therefore, the potential e8 of the slider point E of the variable resistor Rv = O
, that is, exactly at the midpoint, the output ec
The gain of the summing amplifier A2 is as follows.
ここに、Gは差動増幅器A1 の利得である。Here, G is the gain of the differential amplifier A1.
ブリッヂに初期不平衡電圧Je、が存在する場合は、ひ
ずみ測定前に出力e。If there is an initial unbalanced voltage Je, on the bridge, the output e before the strain measurement.
が零になるようにRvを調整する。Adjust Rv so that it becomes zero.
このときE点の電位e。は、となる。At this time, the potential e at point E. becomes.
ここで初期不平衡電圧は打ち消されるので、新しい測定
を行なうことができ、測定の結果は(3)式の出力が得
られる。Since the initial unbalanced voltage is canceled here, a new measurement can be performed, and the measurement result is the output of equation (3).
次にこの得られた結果を校正するときは、スイッチS1
およびスイッチS2が開となるため、測定ブリッヂの出
力は零となり、かつ平衡回路が切り離される。Next, when calibrating this obtained result, switch S1
Since the switch S2 is then opened, the output of the measuring bridge becomes zero and the balance circuit is disconnected.
抵抗分割回路からの電圧を受けて、出力e。In response to the voltage from the resistive divider circuit, output e.
はスイッチS4が切り替えスイッチ1の位置にあるとき
、ちょうど前に測定した値に一致したものとすると、
となる。If it is assumed that when the switch S4 is in the changeover switch 1 position, the value coincides with the value measured just before.
この値を差動増幅器A1換算すると、 の入力値e。When this value is converted into differential amplifier A1, Input value e.
に となる。to becomes.
この値は、
(2)式から明らかなように、
なるひずみがひずみゲージに加わったときのブリッヂの
出力電圧と等しい。As is clear from equation (2), this value is equal to the output voltage of the bridge when a strain of is applied to the strain gauge.
(5)式にはブリッヂ電圧EBの項が含まれず、かつR
1,に、G、R4は全て安定なる定数とみなすことがで
きる。Equation (5) does not include the term of bridge voltage EB, and R
1, G, and R4 can all be regarded as stable constants.
すなわち、スイッチS1およびスイッチS2が開、スイ
ッチS3が閉で、かつスイッチS4が切り換えスイッチ
1の位置にあるとき加算増幅器A2の出力には、ブリッ
ヂ電圧EBの値にかかわらず、(5)式で表されるひず
みに相当した校正電圧が発生する。That is, when the switches S1 and S2 are open, the switch S3 is closed, and the switch S4 is in the changeover switch 1 position, the output of the summing amplifier A2 is expressed by equation (5), regardless of the value of the bridge voltage EB. A calibration voltage corresponding to the strain represented is generated.
次に数字を用いて更に具体的に説明する。Next, a more specific explanation will be given using numbers.
例えばゲージ率が2のとき、差動増幅器A1 の利得を
100、抵抗器R1、較正回路における抵抗器R4゜R
4′の値をそれぞれ10にΩ、1.00 kΩ、500
にΩとする。For example, when the gauge factor is 2, the gain of the differential amplifier A1 is 100, the resistor R1, and the resistor R4°R in the calibration circuit.
4' value to 10Ω, 1.00 kΩ, 500 respectively
Let it be Ω.
このとき、スイッチS1 およびスイッチS2を開、ス
イッチS3を閉とし、スイッチS4を切り換えスイッチ
1の位置から5の位置まで順次切り換えれば、それぞれ
1000xlO’ひずみ、200xlO’ひずみ、Oひ
すみ、200xlO’ひずみ、−1000xlO’ひず
みに相当する校正電圧e。At this time, if switches S1 and S2 are opened, switch S3 is closed, and switch S4 is sequentially switched from switch 1 position to switch 5 position, 1000xlO' strain, 200xlO' strain, O strain, 200xlO' strain, the calibration voltage e corresponding to -1000xlO' strain.
が出力端子OUTより得られる。is obtained from the output terminal OUT.
以上述べたように、本発明の特長をまとめると次のよう
になる。As described above, the features of the present invention can be summarized as follows.
(1)電源が1系統であるので、測定時と校正時に電圧
校正を行なう必要がなく、操作が簡単で測定に要する時
間が短縮される。(1) Since there is only one power supply system, there is no need to perform voltage calibration during measurement and calibration, and the operation is simple and the time required for measurement is shortened.
(2)電源が1系統でこの間に浮動電位がないので、共
通電位間に生じる雑音の影響がない。(2) Since there is only one power supply system and there is no floating potential between them, there is no influence of noise generated between common potentials.
従って精度が高くなる。Therefore, accuracy is increased.
(3)増幅器の入力回路に附加回路を必要としないので
、増幅器人力インピーダンスの低下を防ぐことができ、
感度誤差がなくなる。(3) Since no additional circuit is required for the input circuit of the amplifier, it is possible to prevent the amplifier's manual impedance from decreasing;
Sensitivity error is eliminated.
(4)回路が簡単で部品が少なく、信頼性および経済性
が良い。(4) The circuit is simple, has few parts, and is reliable and economical.
(5)較正回路により随時装置の較正を行うことができ
るので、電源電圧の変動その他による装置の経時的な変
動が測定値に影響を与えることがなくなり、精度の高い
測定を行うことができる。(5) Since the calibration circuit can calibrate the device at any time, fluctuations in the device over time due to fluctuations in power supply voltage and other factors do not affect the measured values, and highly accurate measurements can be performed.
なお、上記説明で述べた較正回路は、本発明の範囲を限
定するものでなく、他の回路を用いても適当な校正電圧
を発生して本発明を実施することができる。Note that the calibration circuit described in the above description does not limit the scope of the present invention, and the present invention can be practiced by generating an appropriate calibration voltage using other circuits.
また、ひずみ量の表示についても、較正回路に直読目盛
を付すほか、出力端子の電圧指示計に補間目盛を付し、
さらにひずみの読みとりを容易とする等の応用も考えら
れる。In addition, for displaying the amount of strain, in addition to a direct reading scale on the calibration circuit, an interpolation scale is attached to the voltage indicator at the output terminal.
Furthermore, other applications such as making it easier to read strain may also be considered.
第1図は本発明の実施例装置構成図。
B・・・・・・測定ブリッヂ、RB1〜RB4・・・・
・・測定ブリッヂのアームを構成する抵抗器(RBtは
抵抗ゲージ)、A1 ・・・・・・差動増幅器、A2・
・・・・・加算増幅器、R1−R4・・・・・・抵抗器
、RV・・・・・・可変抵抗、EB・・・・・・電源、
S1〜S4・・・・・・スイッチ。FIG. 1 is a configuration diagram of an apparatus according to an embodiment of the present invention. B...Measurement bridge, RB1 to RB4...
...Resistor (RBt is resistance gauge) that constitutes the arm of the measurement bridge, A1 ...Differential amplifier, A2...
...Summing amplifier, R1-R4...Resistor, RV...Variable resistor, EB...Power supply,
S1~S4...Switch.
Claims (1)
リッヂと、 この平衡ブリッヂの平衡出力をそれぞれ正負の入力とす
る差動増幅器A1と、 中点が共通電位点に接続された直流電源と、この直流電
源の出力電圧を前記平衡ブリッヂに与える第一の開閉回
路S1と、 前記直流電源から正または負の抵抗分圧出力を得る可変
抵抗器Rvと、 この可変抵抗器の出力を開閉する第二の開閉回路S2と
、 上記直流電源の正および負の直流電圧を入力とし 一以上の抵抗器R4,R4′および操作により切替られ
るスイッチS4a、S4bを含み 上記直流電圧の選択された極性が選択された抵抗器を介
して出力に導かれるように構成された較正回路と、 この較正回路の出力を開閉する第三の開閉回路S3と、 前記差動増幅器A1の出力に対して前記第二の開閉回路
S2の出力および前記第三の開閉回路S3の出力を加算
もしくは減算して出力端子OUTに送出する増幅器A2
と を備え、 前記ひずみゲージに機械的ひずみが印加される前に前記
第一の開閉回路S1を閉じたとき前記出力端子OUTに
現われる不平衡出力は、前記第二の開閉回路S2を閉じ
て前記可変抵抗器RVを加減することにより打消され、 前記ひずみゲージに機械的ひずみが与えられたときに前
記第一の開閉回路S1および第二の開閉回路s2を閉じ
た状態で前記出力端子OUTに現われる測定出力は、前
記第一の開閉回路s1および前記第二の開閉回路S2を
開いた状態で前記第三の開閉回路S3を閉じたときに出
力端子OUTに現われる前記較正回路の出力を基準とし
て計測されるように構成されたことを特徴とする ひずみ測定器。[Claims] 1. A DC balanced bridge including a strain gauge on one side of the component arm, a differential amplifier A1 having the balanced outputs of this balanced bridge as positive and negative inputs, respectively, and the midpoint of which is connected to a common potential point. a first switching circuit S1 that supplies the output voltage of the DC power supply to the balanced bridge; a variable resistor Rv that obtains a positive or negative resistance-divided voltage output from the DC power supply; A second switching circuit S2 that opens and closes the output; and one or more resistors R4 and R4' that receive positive and negative DC voltages from the DC power source and switches S4a and S4b that are switched by operation, and select the DC voltage. a calibration circuit configured such that the selected polarity is guided to the output via a selected resistor; a third switching circuit S3 that opens and closes the output of this calibration circuit; an amplifier A2 that adds or subtracts the output of the second switching circuit S2 and the output of the third switching circuit S3, and sends the result to the output terminal OUT;
The unbalanced output that appears at the output terminal OUT when the first switching circuit S1 is closed before mechanical strain is applied to the strain gauge is the same as the unbalanced output that appears at the output terminal OUT when the second switching circuit S2 is closed. is canceled by adjusting the variable resistor RV, and appears at the output terminal OUT with the first switching circuit S1 and the second switching circuit s2 closed when mechanical strain is applied to the strain gauge. The measurement output is measured based on the output of the calibration circuit that appears at the output terminal OUT when the third switching circuit S3 is closed with the first switching circuit s1 and the second switching circuit S2 open. A strain measuring instrument characterized in that it is configured to
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49128481A JPS5829443B2 (en) | 1974-11-07 | 1974-11-07 | Hizumi Soku Teiki |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49128481A JPS5829443B2 (en) | 1974-11-07 | 1974-11-07 | Hizumi Soku Teiki |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5154453A JPS5154453A (en) | 1976-05-13 |
| JPS5829443B2 true JPS5829443B2 (en) | 1983-06-22 |
Family
ID=14985794
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49128481A Expired JPS5829443B2 (en) | 1974-11-07 | 1974-11-07 | Hizumi Soku Teiki |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5829443B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS629984A (en) * | 1985-07-08 | 1987-01-17 | Ookura Eng Kk | Automatic selection device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52145246A (en) * | 1976-05-28 | 1977-12-03 | Hitachi Ltd | Slide resistance-electric signal converter |
| JPS54167652U (en) * | 1978-05-15 | 1979-11-26 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53703B2 (en) * | 1972-05-01 | 1978-01-11 |
-
1974
- 1974-11-07 JP JP49128481A patent/JPS5829443B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS629984A (en) * | 1985-07-08 | 1987-01-17 | Ookura Eng Kk | Automatic selection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5154453A (en) | 1976-05-13 |
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