JPS5829844B2 - Angle measuring device with telescope - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an angle measuring device having a microscope in which a crosshair is arranged on a scale plate for determining a target line.

The device is mounted on at least one axis for rotation, and this rotation is measured by a circular scale that cooperates with optical marks that transmit light to a photoelectric detector as it passes through the graduation lines of the circular scale. be done.

The spacing of this circular graduation is interpolated in the manner of a photoelectric micrometer, in which a raster with cooperating lines is constructed even in the case of the smallest spacing of the circular graduation.

In known angle measuring devices, the rough reading as well as the fine reading is carried out by means of a mechanical raster.

These rasters are, for example, regular, with the space between each tooth corresponding to a constant angular value.

During the rough adjustment process, the telescope is rotated and when it reaches the target line it hangs on the nearest notch.

In this position the telescope is finely adjusted using a micrometer.

This micrometer is coupled with a calculator that counts the rotations of the angular unit necessary to find the target.

Telescopes used in known optical measurement devices such as collimators and theodolites use multiple crosshairs to locate targets.

For angular reading, these are not directly connected to the circular scale of the theodolite, for example.

In collimators, such multiple crosshairs are used for precise exploration of additional line marks arranged within the collimator.

In theodolites, additional line marks are used in the field of view of the telescope for range finding operations using the Reichenbach\ method, or for multi-target detection of moving targets in the field of geodetic astronomy.

This known angle measurement method has several drawbacks.

First, the mechanical construction of these angle measuring devices is very expensive due to the use of rim gears instead of circular scales and the use of manually or motor operated micrometers.

The mutual spacing between the rask grooves of the rim gear must be of high precision and the tooth spacing must not be able to be reduced at will.

Otherwise, no reliable engagement within the groove is guaranteed.

Since the rim gear is fixed to each device, it cannot be repeated.

This means that the operator has to calculate the first angular value given by chance, which greatly complicates the measurement task.

The present invention aims to eliminate the above-mentioned drawbacks.

Furthermore, it is an object of the present invention to provide an angle measuring device that reduces the cost of mechanical parts used in the past or in mugyas by adopting the optical rask method of the present invention.

Furthermore, it is an object of the invention to provide a horizontal scale which can be repeated and thus can be oriented in any direction.

These and other purposes are such that a zone is marked symmetrically to a line or a pair of lines of crosshairs parallel to the axis of rotation, and the width of this zone is at least twice the width of the minimum spacing of the circular graduations. This is accomplished by the present invention.

According to the invention, a rask device for optical scanning is configured as an angle-measuring device, the scanning of the symmetrically located zones of the lines of each pair of crosshairs within the space determined by the graduation lines of the circular scale. It takes place outside.

When sweeping the zone through the target to the crosshair, a match is obtained between the circular graduation line and a photoelectric detector that produces an electrical signal.

This generated electrical signal triggers an electronic end chain circuit for angle measurement.

Next, the present invention will be explained according to two actual cases shown in the drawings.

1 and 2, within a housing 1 a telescope 2 is mounted on a trunnion so as to be rotatable about the axis - and about the axis H--H.

The axes are at right angles to each other.

A scale plate 3 mounted within the telescope 2 is constructed with a crosshair and a zone 5 as depicted in detail in FIG.

A circular scale 6 is arranged colinear with the axis H-H, the scale 30 being separated from a transparent line on the opaque base.

The first photoelectric detector (scanner) 7 and the second photoelectric detector (
scanner) 8, the latter preferably being a differential photoelectric detector, both mounted spaced apart above the circular scale 6, each with an electronic terminal unit 3.
Connected to 1.

There is an optical axis B-B parallel to the axis H-H, and a light source 18 and first and second optical imaging systems 9 and 10 are arranged, and the image plane of the latter optical system has light from the light source 18. A photoelectric detector 8 is installed to receive the signal.

Furthermore, a micrometer 14 is mounted in the housing 1, which includes a Rusk disk 15, two photoelectric detectors 16, 1γ (electro-optical scanning device) and a micrometer screw 21.

This Rusk disc 15 is fixed to a micrometer screw 21 so that both can rotate relative to the photodetectors 16, 17.

The housing 1 is mounted in a fixed socket 12 for rotation about an axis H-H.

A lever 13 for clamping and loosening this socket 12 is mounted on the socket for rotating axis H-H.

A base 11 supporting the circular scale 6 is rotatably mounted in a socket 12 independently of other elements, so that repeated operations can be performed.

The photoelectric detectors 16, 17 are connected to an electronic terminal unit 31.

A light source 18 is located below the circular scale on the extension of the axis B--B to illuminate the circular scale 6.

The telescope 2 has a common axis C-C, which is its target line, and includes an objective lens 19, an eyepiece 20, and a scale plate 3.
It consists of.

A micrometer screw 21 constituting a part of the micrometer 14 is attached to a screw socket 22 fixed to the housing 1.
is passing through.

The spring 23 is in contact with the housing 1 by means of a micrometer screw 21 in order to provide the elastic action of the displacement lever 13.

The light cable 24 transmits the light from the light source 18 to the raster 15.
and illuminate the dividing line there.

When the target (not shown) is observed roughly, the telescope is rotated about axis H--H and subsequent fine adjustments are made with the micrometer 14.

When the micrometer screw 21 is operated, the housing 1 is rotated and the telescope 2 is connected thereto, and the optical imaging system 9,
A photoelectric detector γ, 8 with 10 rotates about a fixed circular scale 6.

Graduation line 30 on which photoelectric detector 8 is illuminated by light source 18
Sweeping the electron terminal unit 3 as detailed below
An electrical signal is generated which triggers 1.

At the same time, a rough reading is taken by the photoelectric detector 7 at the position of the circular scale 6.

When illuminated by the light source 18 via the light cable 24, the photoelectric detector 16 is guided from the dividing line of the raster disk 15 and by operation of the micrometer screw 21.
, 1γ enable a fine reading of the angle in the child rectification unit 31.

The design of the angle measuring device is not limited to the practical case outlined here.

Alternatively, it is also possible to employ only one photoelectric scanner 7 and a photodetector 16 for each angular value reading on a micrometer.

Furthermore, the telescope may be mounted for rotation about only one axis relative to its base, and there may be a number of circular scales, each of which may have more than one line segment per circular scale.

In FIG. 3, a graduated plate 3 is placed in the telescope 2 in front of the eyepiece 20 (FIG. 2), forming a crosshair 4.

The border line 25 of zone 5 is positioned symmetrically with respect to the lines 26, 27 and the paired lines 28, 29.

The width of zone 5 is at least twice the minimum circular graduation spacing.

This zone 5 performs interpolation for both horizontal and vertical angle measurements.

FIG. 4 shows a block diagram of an electronic tree circuit.

is guided from the photoelectric detector 7 and the housing 1 is aligned with the axis H-
The signal produced when rotated through H (FIG. 1) is fed to a counter 34 via a trigger and pulse waveform stage 32 and a sampling gate 33.

The electrical signal generated when the housing 1 is rotated from the photoelectric detector 8 is transmitted to the second trigger and pulse waveform stage 3.
5, and this output signal is simultaneously sent to the counter 34 via the sampling gate 33, memory 36 and gate 37.
and the O-input of bidirectional counter 38.

Bidirectional sampling stage 39 includes photoelectric detector 16
, 17 and which are generated when the raster disk 15 is rotated.

Outputs 40, 41 of this stage 39 are connected to a bidirectional counter 38, of which output 40 is also connected to a gate 37.

Pulse counter output 42 of stage 39 is connected to bidirectional counter 38 via memory 36 and down-down circuit 43.

When the illuminated graticule line is scanned, an electrical signal is generated on the photoelectric detector 8, which is sent to the trigger and pulse waveform stage 35 to generate a clock pulse, which opens the sampling gate 33 and at the same time Restore counter 38 and start fine reading.

The electrical signal from the photoelectric detector γ and the display of coarse divisions on the circular scale 6 (FIG. 2) are converted into a pulse waveform in the trigger and pulse waveform stage 32 and fed to the open sampling gate 33, from which the preset of the counter 34 is sent. Sent to input to display rough angle value.

When the micrometer 14 of FIG. 1 is rotated in the opposite direction, the counter 34 is used for backward calculations since the angular value of the rough reading must be subtracted in units.

The decision as to whether forward or reverse calculations are involved is made by the signals derived from the photoelectric detectors 16, 17, and the corresponding signals are processed in the bidirectional sampling stage 39.
Its output signal 40 is supplied with a backward calculation control signal, and its output 41 is supplied with a forward calculation control signal.

Both signals are fed to a bidirectional counter 38 which displays the angle value set by the micrometer 14.

The final clock pulse is stored in memory 36.

The count pulses further generated by the cooperation of the Rusk disk 15 and the photoelectric detectors 16 and 17 are counted by the bidirectional counter 3.
It is not fed after 8 has finished its calculation.

The first (subsequent) count pulse from the output 42 of the bidirectional sampling stage 39 causes the clock pulses stored in the memory 36 to be pre-opened by the signal from the output 40 of the bidirectional sampling stage 39 during the backward computation. It is fed to gate 37.

As described above, the clock pulse for terminating the calculation is sent to the reverse counter 34 as a return pulse.

In order to minimize alignment errors resulting from discrepancies in the divisions of the rusk disc 15 and the circular scale 6, the divisions of the rusk disc 15 are subdivided very precisely.

For example, when the number of rask lines is increased by a factor of 10,
The output 42 of the bidirectional sampling stage 39 sends ten times the number of counter pulses to the bidirectional counter 38.

However, when the original resolution of the interpolation system must be maintained, the final position of the displayed angle value is not read, which corresponds to a step-down ratio of 10:1.

When a section other than the rask section is used, the down-down circuit 43 is connected in series with the bidirectional counter 38.

Said circuit reduces the number of counting pulses to the original number, in other words to the unsubdivided Rusk disk 15, which corresponds to any solution HaIt of the interpolation system.

The first measuring principle will be explained in more detail in connection with the schematic diagram of FIG.

A scale plate 3 is mounted on the telescope 2 (FIG. 1), showing a zone 5 and a crosshair 4.

The image of the target point 44 is located outside the zone 5 within the field of view of the telescope, and observation is performed with rough adjustment.

In this position, the housing 1 is indirectly clamped against the socket 12 by the lever 13, and the photoelectric detector 8, which activates the electronic terminal unit 31, assumes a position 45 between the two graduation lines. .

The target point 44 is, as described in connection with FIG.
It is captured by the crosshair 4 during the fine adjustment process by the micrometer 14.

The electronic terminal unit 31 is activated at a position 46 corresponding between the illuminated graduation line 30 and the extent of the photoelectric detector 8 .

When the target point 44 is captured by the crosshair 4 (position 4
γ), the measurement operation ends.

Since the width of the zone 5 is at least twice the width of the minimum circular graduation spacing, there will always be coincident positions 45 which are scanned during the fine adjustment process.

This is useful for locating target points from both sides as well as for measuring vertical angles.

The second angle measurement principle will now be explained with reference to FIG.

Once again, the scale librate 3 is installed in the telescope 2 (FIG. 1) with the zone 5 and the crosshair 4.

The scale lines 49 and 50 face each other in the orthogonal direction, and the circular scale 48
placed above.

The scale lines 49, 50 are made transparent on an opaque base.

Target point 51 is observed in such a way that its image lies outside zone 5 of graduation plate 3.

(The starting position is 52.

) Fine adjustment of the line of sight C--C is made with a micrometer as shown in FIGS. 1 and 2 when the circular embossing 48 is clamped.

When the illuminated graduation line (position 53) of section 49 is scanned with a small imaging system, the optical signal preferably impinges on the first photosensitive area of the differential photoelectric detector and the resulting electrical signal starts the electronic terminal unit as already described in connection with FIG.

In the course of successive fine adjustments, the illuminated graduation line of section 50 is scanned by an optical imaging system (not shown) and by a second light-sensitive region of a photoelectric detector (also not shown).

The induced electrical signals control the electronic terminal unit to form an average value of the angular deviations scanned from positions 53,54.

At the same time, electronic calculation units similar to counters 34, 38 of FIG. 4 are triggered to calculate the remaining distance between average positions 53, 54 and end positions 55.

The fact that the zone 5 is at least twice the width of the smallest circular graduation spacing and the arrangement of the line segments 49, 50 of the circular graduation 48 ensure two coincident positions 53, 54 in any case.

Averaging performed in this way has the advantage of a higher reading accuracy since segmentation and eccentricity errors are eliminated.

[Brief explanation of the drawing]

Fig. 1 is a schematic front view of the angle measuring device, Fig. 2 is a sectional plan view of Fig. 1, Fig. 3 is a view showing a telescopic field of view, and Fig. 4 is a block diagram of the electronic terminal system. , FIG. 5 is a schematic representation of the measuring principle in one reading position, and FIG. 6 is a schematic representation of another measuring principle with two reading positions. 1...Housing, 2...Telescope, 3
...Scale plate, 4...Crosshair, 5...
...Zone, 6...Circle scale, I, 8...
...Photoelectric detector, 9,10...Optical system, 1
1...Base, 12...Socket, 1
3... Lever, 14... Micrometer, 15... Raster, 16, 17...
Photoelectric detector, 18...Light source, 19...
Objective lens, 20...Eyepiece lens, 21...
...Screw, 23...Spring, 24...
... Light cable, 30 ... Separation line, 31
...Electronic terminal system, 32, 35...
・Triforce/pulse waveform stage, 33...Sampling gate, 34...Counter, 36...
...Memory, 3γ...Gate, 38...
...Bidirectional counter, 39...Sampling stage, 43...Down-down circuit, 44...
・Target point.

Claims (1)

[Claims] 1 Base 11, at least one axis H-H with respect to this base
a telescope 2 mounted on this base for rotation, at least - a circular scale 6 having equally spaced line segments 30 and connected to the base, a scanner γ, 8 connected to the telescope; A circular scale and a scanner are for starting rough and fine measurements of the rotation of the telescope, and a micrometer 14 for subdividing the division intervals of the scale and making fine readings of the rotation of the telescope; a photoelectric scanning device 16 for reading;
17, an electronic device 31 connected to a scanner and a scanning device for detecting signals therefrom and for forming an angle measurement result, and arranged with a crosshair 4 in the field of view of the telescope, furthermore one line of the crosshair; An angle measuring device consisting of a scale plate having two parallel and symmetrical lines in each case, the lines being separated by at least one scale division width.