JPS5841351B2 - Katsuseikahannoujiyouchiyakuuchi - Google Patents
KatsuseikahannoujiyouchiyakuuchiInfo
- Publication number
- JPS5841351B2 JPS5841351B2 JP50099793A JP9979375A JPS5841351B2 JP S5841351 B2 JPS5841351 B2 JP S5841351B2 JP 50099793 A JP50099793 A JP 50099793A JP 9979375 A JP9979375 A JP 9979375A JP S5841351 B2 JPS5841351 B2 JP S5841351B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- gas
- metal
- electron gun
- torr
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/32—Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】
本発明は主としてサブストレート上に金属炭化物或は窒
化物、特にCr、AI、Si、Ti、■、Fe。DETAILED DESCRIPTION OF THE INVENTION The present invention mainly uses metal carbides or nitrides on a substrate, especially Cr, AI, Si, Ti, ■, and Fe.
Co、Ni炭化物或はCr窒化物の被膜を形成させるに
適合する活性化反応蒸着方法に関する。The present invention relates to an activated reactive vapor deposition method suitable for forming coatings of Co, Ni carbide, or Cr nitride.
従来この種方法としては例えばパンシャ(Bun−sh
ah )法によるものが知られるが、この場合電子銃は
高電圧少電流で作動する高圧式電子銃から成るもので、
電子ビーム電流が比較的少量であるため、サブストレー
ト上に所定膜厚例えば1μ屏の被膜を得るためには、電
子ビーム電流に対応するように金属の蒸発量を遅くし、
かつサブストレートの表面の分子を活性化するようにそ
の温度を高くするか或はサブストレートと蒸発源との中
間の空間内に別個に補助電極たるプローブを設置して金
属蒸気粒子のイオン化及び炭化水素ガスその他の反応ガ
スの電離を有効に行なわせるかしなければならず、両者
の場合ともサブストレート上に形成される被膜は700
kg/m”以下の比較的低硬度のものであり、耐摩耗性
、耐食性に劣るという大きな欠点を有し、さらに前者の
場合は所定膜厚の被膜を得るに60分の長時間を要し、
作業能率が悪いという欠点もあり、また後者の場合は構
成が複雑となると共に作動が比較的非能率であるという
欠点も有する。As a conventional method of this kind, for example, Bun-sh
ah) method is known, but in this case the electron gun consists of a high-voltage electron gun that operates with high voltage and low current.
Since the electron beam current is relatively small, in order to obtain a film with a predetermined thickness, for example, 1 μm, on the substrate, the amount of metal evaporation is slowed down to correspond to the electron beam current.
In addition, the temperature of the substrate is increased to activate molecules on the surface of the substrate, or a probe serving as an auxiliary electrode is installed separately in the space between the substrate and the evaporation source to ionize and carbonize the metal vapor particles. It is necessary to effectively ionize hydrogen gas and other reactive gases, and in both cases, the film formed on the substrate is 700%
It has a relatively low hardness of less than 100 kg/m", and has the major drawback of poor wear resistance and corrosion resistance. Furthermore, in the case of the former, it takes a long time of 60 minutes to obtain a film of a specified thickness. ,
It also has the disadvantage of poor working efficiency, and in the latter case, the structure is complicated and the operation is relatively inefficient.
本発明はかかる不都合を無くした方法を得ることをその
目的としたもので、内部を炭化水素ガス或は窒素ガスそ
の他の反応ガスの比較的高真空の雰囲気に保有される処
理室内にるつぼ内の金属から成る蒸発源と、これに対応
するサブストレートとを作動電源の正側と負側とに接続
させて設け、該蒸発源を電子銃の電子ビームで照射させ
ることにより該金属の蒸発と、該蒸発により生ずる金属
蒸気粒子のイオン化とを行なわせると共に前記した反応
ガスの電離を行なわせて該蒸気粒子を該電離される反応
ガスの炭素成分或は窒素成分と化学反応させつつサブス
トレート上に吸引被着させるようにした式のものにおい
て、前記電子銃として中空熱陰極型の電子銃を使用し、
更に該サブストレートの温度を20℃〜315°Cとす
ると共に、前記反応ガスの圧力を3 X 10= To
rr〜5X10−5Torrとしたことを特徴とする。The object of the present invention is to obtain a method that eliminates such inconveniences, and the purpose of the present invention is to provide a method in which a crucible is placed in a processing chamber whose interior is kept in a relatively high vacuum atmosphere of hydrocarbon gas, nitrogen gas, or other reactive gas. An evaporation source made of a metal and a corresponding substrate are connected to the positive and negative sides of an operating power source, and the evaporation source is irradiated with an electron beam from an electron gun to evaporate the metal; The metal vapor particles generated by the evaporation are ionized, and the reaction gas is ionized, and the vapor particles are chemically reacted with the carbon component or nitrogen component of the ionized reaction gas while being deposited on the substrate. In the vacuum deposition type, a hollow hot cathode type electron gun is used as the electron gun,
Further, the temperature of the substrate is set to 20°C to 315°C, and the pressure of the reaction gas is set to 3×10=To
It is characterized by being set at rr to 5×10 −5 Torr.
本発明方法の実施例を別紙図面に付説明する。Examples of the method of the present invention will be explained with reference to the attached drawings.
図面で1は処理室を示し、該処理室1内を排気口2を介
して外部の真空ポンプ3に連通ずると共に給気口4を介
して外部のアセチレンガス(C2H2)その他の炭化水
素ガスのボンベから成るガス源5に連通して該室1内を
該ガスの比較的高真空、例えばI X 10−3Tor
r 〜5 X 10−5Torr程度の高真空の雰囲気
に保有させるようにした。In the drawing, 1 indicates a processing chamber, and the inside of the processing chamber 1 is communicated with an external vacuum pump 3 through an exhaust port 2, and acetylene gas (C2H2) and other hydrocarbon gases from the outside are communicated through an air supply port 4. A relatively high vacuum of the gas, e.g.
It was kept in a high vacuum atmosphere of about r ~ 5 x 10-5 Torr.
図面で6は該室1内の下側に配置された蒸発源、7は該
室1内の上側のサブストレート、8は該サブストレート
7に所定の負電圧例えば−50Vを印加すべき外部の直
流電源を示し、該蒸発源6はるつぼ6a内の金属6b例
えば金属Crをこれに対向する電子銃6cの電子ビーム
で照射すべく構成する。In the drawing, 6 is an evaporation source placed on the lower side of the chamber 1, 7 is a substrate on the upper side of the chamber 1, and 8 is an external source to which a predetermined negative voltage, e.g., -50V, is to be applied to the substrate 7. A DC power source is shown, and the evaporation source 6 is configured to irradiate a metal 6b, such as metal Cr, in a crucible 6a with an electron beam from an electron gun 6c facing it.
図面で6dは該電子銃6cの作動電源を示す。In the drawing, 6d indicates an operating power source for the electron gun 6c.
以上は従来提案されたパンシャ法の場合における前記し
たプローブを省略したものに略相当するが、本発明によ
れば該電子銃6cを低電圧大電流で作動すべき中空熱陰
極型に構成させ、かくて従来の高電圧型のものに比し著
しく多量の電子ビームがその前面に得られるようにした
。The above is approximately equivalent to the conventionally proposed Pansha method in which the above-mentioned probe is omitted, but according to the present invention, the electron gun 6c is configured as a hollow hot cathode type that operates at low voltage and large current, In this way, a significantly larger amount of electron beam can be obtained at the front surface than in the conventional high-voltage type.
更に図面はサブストレート7の温度を特に20°C〜3
15℃に調節可能にするため、該サブストレート7の裏
面のホルダ7aの一端に電熱型のヒータ10と他端に冷
媒型のクーラ11とを配置した。Furthermore, the drawing specifically shows the temperature of the substrate 7 between 20°C and 3°C.
In order to be able to adjust the temperature to 15° C., an electric heater 10 was placed at one end of the holder 7a on the back side of the substrate 7, and a refrigerant cooler 11 was placed at the other end.
その作動を説明するに、処理室1内を真空ポンプ3によ
る排気と、ガス源5からの給気とで、炭化水素ガスたる
例えばアセチレンガス02H2の比較的高真空、例えば
1×1O−3Torr〜5×1O−5Torrの雰囲気
に保有させると共に、サブストレート7に所定の電位例
えばOV、−50Vを与え更に電子銃6cを作動させる
もので、かくするときは該電子銃6cは中空熱陰極型を
なすのでその前面に著しく多量の出力電子ビームを生じ
、該ビームは金属6b即ち金属Crを照射してこれを加
熱蒸発させるばかりでなく、生ずる該金属の蒸気粒子を
衝突してこれをイオン化し、更にその外周空間のアセチ
レンガスに衝突してこれを電離し、かくてイオン化され
たCr金属の蒸気粒子は電離した該ガスの炭素成分と化
学反応してCryCx となって電界作用によりサブス
トレート7上に吸引されそれに該金属炭化物節ちCr3
C2の化学量論的に安定した被膜を作る。To explain its operation, the inside of the processing chamber 1 is evacuated by the vacuum pump 3 and air is supplied from the gas source 5 to create a relatively high vacuum of hydrocarbon gas such as acetylene gas 02H2, such as 1 x 1 O-3 Torr~. The substrate 7 is held in an atmosphere of 5 x 1 O-5 Torr, and a predetermined potential, for example OV, -50V is applied to the substrate 7 to operate the electron gun 6c. As a result, a significantly large amount of output electron beam is generated in front of the metal 6b, and the beam not only irradiates the metal 6b, that is, the metal Cr, and heats and evaporates it, but also collides with the vapor particles of the metal to ionize them. Furthermore, it collides with the acetylene gas in the outer space to ionize it, and the thus ionized Cr metal vapor particles chemically react with the ionized carbon component of the gas to become CryCx, which is deposited on the substrate 7 by the action of an electric field. is attracted to the metal carbide joint Cr3
Create a stoichiometrically stable coating of C2.
かくして得られる該被膜は表面硬度が著しく高く、しか
も被膜形成速度が早く、耐食性に富むもので、その硬度
は処理室1内のC2H2の圧力、即ち真空度とサブスト
レート7の温度とで多少とも変化する。The film obtained in this way has extremely high surface hardness, has a fast film formation rate, and is highly corrosion resistant. Change.
第2図はその測定結果を示すもので、図中A、B、Cは
サブストレート7の温度が20°G、160’C,31
5°Cの場合であり、これらの場合にはサブストレート
7の電位は直流電源8の両端子がスイッチ12により短
絡状態とされてOvに保たれる。Figure 2 shows the measurement results. In the figure, A, B, and C indicate temperatures of the substrate 7 of 20°G, 160'C, and 31°C.
5° C. In these cases, the potential of the substrate 7 is maintained at Ov by short-circuiting both terminals of the DC power supply 8 by the switch 12.
この結果から1300kg/7以上の高硬度の被膜をサ
ブストレート7の温度の広範囲に亘って得るためには、
処理宿1内の真空度を3 X 10 ’Torr〜5×
10”−’ Torr程度にすることが好ましいものと
判断される。From this result, in order to obtain a coating with a high hardness of 1300 kg/7 or more over a wide range of temperatures of the substrate 7,
The degree of vacuum in the processing facility 1 is 3 x 10' Torr ~ 5 x
It is judged that it is preferable to set it to about 10''-' Torr.
尚、上記場合電子銃6Cは45■。70Aで作動するも
のとし、その中空熱陰極内のキャリアガスたるアルゴン
ガスの圧力は7.5×10−’)−ルとし、硬度は50
gr負負荷ビッカース硬度で示すものとする。In the above case, the electron gun 6C is 45cm. It is assumed that it operates at 70A, the pressure of argon gas as a carrier gas in the hollow hot cathode is 7.5 × 10-')-L, and the hardness is 50
gr is expressed as negative load Vickers hardness.
更にサブストレート7の表面にCrN或はCr2Nの被
膜を作るには反応ガスとして前記実施例におけるアセチ
レンガスに代え窒素ガスを使用すればよい。Furthermore, in order to form a CrN or Cr2N film on the surface of the substrate 7, nitrogen gas may be used as the reaction gas instead of the acetylene gas in the above embodiment.
即ちガス源5を例えば窒素ガスのボンベで構成するもの
で、かくて室1内で該ガスは電子ビームにより衝撃され
て電離し、Cr蒸気と反応する。That is, the gas source 5 comprises, for example, a cylinder of nitrogen gas, so that in the chamber 1 this gas is bombarded by the electron beam, ionizes, and reacts with the Cr vapor.
上記説明はサブストレート7の電位をOVに設定した場
合であり、−50Vに設定すれば更にサブストレート7
上の被膜の硬度を1300kg/cIIL以上にするサ
ブストレート7の温度範囲が広くなることを発明者等は
実験により確認している。The above explanation is for the case where the potential of the substrate 7 is set to OV, and if it is set to -50V, the potential of the substrate 7 is set to OV.
The inventors have confirmed through experiments that the temperature range of the substrate 7 in which the hardness of the upper coating is 1300 kg/cIIL or more is widened.
尚、これらの測定結果及びその他被膜の緒特性を考慮し
て、被膜形成の際のサブストレート7の温度及び処理室
1内の真空度を一義的に決定することができる。Note that the temperature of the substrate 7 and the degree of vacuum in the processing chamber 1 during film formation can be uniquely determined by taking these measurement results and other characteristics of the film into consideration.
このように本発明によるときは、サブストレートの最適
な温度下で、しかも処理室内の最適な真空圧下で、電子
銃として低電圧大電流作動の中空熱陰極型を使用したの
で、該電子銃の電子ビームが多量に得られ、そのままで
金属蒸気の発生と共に該蒸気性に炭化水素ガスの活性化
が有効に、かつ迅速に行なわれ、前記した従来例におけ
る被膜の形成速度の遅れを無くし、さらにプローブの設
置を必須とするものにおける不都合をも無くすことがで
き、サブストレートの広範囲の温度下において、130
0kg/−以上の高硬度の化学量論的に安定した被膜が
高能率で得られる効果を有する。In this way, according to the present invention, a hollow hot cathode type electron gun that operates at low voltage and high current is used as the electron gun under the optimum temperature of the substrate and under the optimum vacuum pressure in the processing chamber. A large amount of electron beam can be obtained, and as it is, metal vapor is generated and the vaporized hydrocarbon gas is activated effectively and quickly, eliminating the delay in film formation rate in the conventional example, and further It also eliminates the inconvenience caused by the installation of probes, and it can be
It has the effect that a stoichiometrically stable coating with high hardness of 0 kg/- or more can be obtained with high efficiency.
【図面の簡単な説明】
第1図は本発明方法の一例の載断面図、第2図は測定結
果の一例の線図である。
1・・・・・・処理室、3・・・・・・真空ポンプ、5
・・・・・・反応ガス源、6・・・・・・蒸発源、7・
・・・・・サブストレート、8・・・・・・直流電源、
6b・・・・・・金属、6c・・・・・・中空熱陰極型
電子銃。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a cross-sectional view of an example of the method of the present invention, and FIG. 2 is a line diagram of an example of measurement results. 1...Processing chamber, 3...Vacuum pump, 5
...Reactant gas source, 6... Evaporation source, 7.
...Substrate, 8...DC power supply,
6b...metal, 6c...hollow hot cathode type electron gun.
Claims (1)
真空の雰囲気に保有される処理室内に、るつぼ内の金属
から成る蒸発源と、これに対向するサブストレートとを
作動電源の正側と負側とに接続させて設け、該蒸発源を
電子銃の電子ビームで照射させることにより該金属の蒸
発と該蒸発により生ずる金属蒸気粒子のイオン化とを行
なわせると共に前記した反応ガスの電離を行なわせて該
蒸気粒子を該電離される反応ガスの炭素成分或は窒素成
分と化学反応させつつサブストレート上に吸引被着させ
るようにした式のものにおいて、前記電子銃として中空
熱陰極型の電子銃を使用し、更に該サブストレートの温
度を20°C〜315℃とすると共に、前記反応ガスの
圧力を3 X 10=Torr 〜5 X 10 ’
Torrとしたことを特徴とする活性化反応蒸着方法。1 In a processing chamber whose interior is kept in a relatively high vacuum atmosphere of hydrocarbon gas, nitrogen gas, or other gas, an evaporation source made of metal in a crucible and a substrate facing it are connected to the positive side of the operating power source. The evaporation source is connected to the negative side and irradiated with an electron beam from an electron gun to evaporate the metal and ionize the metal vapor particles generated by the evaporation, as well as ionize the reaction gas described above. The electron gun is a hollow hot cathode type electron gun, in which the vapor particles are chemically reacted with the carbon component or nitrogen component of the reaction gas to be ionized and are attracted and deposited on the substrate. Using a gun, the temperature of the substrate is between 20° C. and 315° C., and the pressure of the reaction gas is between 3×10=Torr and 5×10′.
An activation reaction deposition method characterized by using Torr.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50099793A JPS5841351B2 (en) | 1975-08-19 | 1975-08-19 | Katsuseikahannoujiyouchiyakuuchi |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50099793A JPS5841351B2 (en) | 1975-08-19 | 1975-08-19 | Katsuseikahannoujiyouchiyakuuchi |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5223579A JPS5223579A (en) | 1977-02-22 |
| JPS5841351B2 true JPS5841351B2 (en) | 1983-09-12 |
Family
ID=14256787
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50099793A Expired JPS5841351B2 (en) | 1975-08-19 | 1975-08-19 | Katsuseikahannoujiyouchiyakuuchi |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5841351B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6044391B2 (en) * | 1977-03-29 | 1985-10-03 | 日本真空技術株式会社 | Activated reaction deposition method |
| JPS56100669A (en) * | 1980-01-14 | 1981-08-12 | Koyo Jidoki | Adhesive supplying device |
| JPS5842771A (en) * | 1981-09-07 | 1983-03-12 | Sumitomo Electric Ind Ltd | Ion plating device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5113471B2 (en) * | 1971-11-30 | 1976-04-28 | ||
| US3791852A (en) * | 1972-06-16 | 1974-02-12 | Univ California | High rate deposition of carbides by activated reactive evaporation |
-
1975
- 1975-08-19 JP JP50099793A patent/JPS5841351B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5223579A (en) | 1977-02-22 |
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