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JPS5841640B2 - X-ray device - Google Patents
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JPS5841640B2 - X-ray device - Google Patents

X-ray device

Info

Publication number
JPS5841640B2
JPS5841640B2 JP49066502A JP6650274A JPS5841640B2 JP S5841640 B2 JPS5841640 B2 JP S5841640B2 JP 49066502 A JP49066502 A JP 49066502A JP 6650274 A JP6650274 A JP 6650274A JP S5841640 B2 JPS5841640 B2 JP S5841640B2
Authority
JP
Japan
Prior art keywords
voltage
ray
tube
grid
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49066502A
Other languages
Japanese (ja)
Other versions
JPS50159691A (en
Inventor
功作 西尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP49066502A priority Critical patent/JPS5841640B2/en
Publication of JPS50159691A publication Critical patent/JPS50159691A/ja
Publication of JPS5841640B2 publication Critical patent/JPS5841640B2/en
Expired legal-status Critical Current

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  • X-Ray Techniques (AREA)

Description

【発明の詳細な説明】 本発明は四極真空管を用い゛1″X線管7Z電圧を制御
する事にj二り、高応答速度で且つ低電力で曝射X線量
の制5坪をふ・・′二々・う楽のできるXm装置放二関
−1rる。
DETAILED DESCRIPTION OF THE INVENTION The present invention uses a tetrode vacuum tube to control the 1" X-ray tube 7Z voltage, and is capable of controlling the amount of exposed X-rays with high response speed and low power.・'Xm device that can be used for two or more times.

X線装置を用い゛℃被写体のX線透視あるいはX線シネ
撮影等をあ・ζ、なう場合にあって、被写体の透視・撮
影部位を移動させ、種々の角度からのX線像を得る事が
1〜はj〜ばA−、”−、なわれ又いる。
When performing X-ray fluoroscopy or X-ray cinegraphy of a subject using an X-ray device, move the fluoroscopy/photography part of the subject to obtain X-ray images from various angles. If the thing is 1~, then j~ is A-, ``-, Nawaramata.

この場合被写体の各部位の厚みに伴゛つて曝射X線量を
制御じ、例えば透視用の表示装置で、ちるところのX線
螢1増倍管の出力輝度を一定にl−る冷が要求さ11,
7ζ)。
In this case, the amount of X-rays to be exposed is controlled according to the thickness of each part of the subject, and for example, in a fluoroscopic display device, cooling is required to keep the output brightness of the X-ray multiplier tube constant. Sa11,
7ζ).

このような制御動作は一毅にA B (: (出動輝度
調整)と称され、従来より幾つかの方法が実用化さ、t
’t ’tおり、その代表的春制御方−χ、とし′7二
下記に示す”2二2)がちる。
This kind of control operation is commonly referred to as A B (: (dispatch brightness adjustment), and several methods have been put into practical use.
The typical spring control method is χ, as shown below.

(1)高rf−発生)・ランスの1次電圧な単捲の摺動
変圧器とす・〜ボ七・−タとによって自sM御1...
X[線管々電圧ロー・制御する方法。
(1) High RF generation) The primary voltage of the lance is a single-turn sliding transformer. .. ..
How to control the voltage between X-ray tubes.

(2)X線管のフィラメント電流を自動制御し5、へ線
管々電流を制御する方式。
(2) A method of automatically controlling the filament current of the X-ray tube and controlling the current of each tube.

しかly ’rから上述し?、=2 T二)の方法は伺
2]、屯応答速度が遅いハトう欠点がある。
But ly'r mentioned above? , = 2 The method of T2) has the drawback of slow response speed.

jNfJら上記(1)・/)方法ではザ・・−・−ホモ
・−・夕の応答速度が遅り53、又(2)の方法−cは
ノイラノンI−電流を変え?[もフィラメント熱はこの
電流変化に追従せず時間遅j′!2がある1、更に上記
2つの−h法は、いずメ′)7もf−の制徊限大直力を
要−よるという欠点がある。
jNfJ et al., the above method (1)//) slows down the response speed of the...53, and method (2)-c changes the Neuranon I current? [However, the filament heat does not follow this current change and the time is delayed j′! Furthermore, the above two -h methods have the disadvantage that they also require a large direct force to limit f-.

−そI’l:、で本発明i′LL記L7だ事情に鑑みな
されたもので7bす、従来中4Cスイッチング累子どI
〜′−(二のみ用いられく”−いl、−四極真空管(T
ETIiou)E以下テトlコ・−トド称ノる)を用い
、このテトロ−・−ドをX線曝射用のス47チ及びX線
胃々鶏;序制御用素子としで用いる事により制御応答速
度を速めると共に、低電力制御を可能となLl、有効な
るABC動作4です・・1−なう事のできるX線装置を
提供する$を目的どする。
-I'l: The present invention i'LL was made in view of the circumstances, and it is 7b.
~'-(Only two are used)-I, -Tetrode vacuum tube (T
ETIiou) E (hereinafter referred to as tetrode) is used for control by using this tetrode as a switch for X-ray exposure and an element for controlling the sequence of X-rays. Ll, effective ABC operation 4, which speeds up the response speed and enables low power control... 1-The purpose is to provide an X-ray device that can do the following.

以下図dnjを参照し、゛℃本発明f/)一実施例を説
明する。
An embodiment of the present invention f/) will be described below with reference to Figure dnj.

第1図は本発明装短の曝fJ1打−11.制御部の概要
ζ・;jr;e +−ており、こごで1は高圧発生器で
あり1.′、の高圧発生器は図示し、ない例え(!、で
三ai交流電源か−f′−の1次捲線に与えられ、交流
電源電圧ろ−・賀斤慢する高圧発生トランス2、この1
!(圧発イ1トラン7ス2の出力を整流する高圧整流r
18.I 、I、j之)3、詳ぶIIを後述−Jるテト
ロード制御ユニツF 49 bから構成;)t1゛串1
・ろ。
FIG. 1 shows the exposure fJ1 stroke-11 of the shortened structure of the present invention. Overview of the control unit ζ・;jr;e The high voltage generator of ', is not shown in the figure, but is given to the primary winding of the three AI AC power supply or -f'-, and the AC power supply voltage is given to the primary winding of the high voltage generating transformer 2, this 1
! (High voltage rectifier r that rectifies the output of voltage generator 1 transformer 7 transformer 2)
18. I, I, j) 3. Consists of a tetrode control unit F 49 b, detailed II will be described later;) t1゛skewer 1
·reactor.

ここでテトロ・−ド制御、コ、−ツl” ’49 !1
’l”、仝〈同一・構成のものであ゛つて夫々X線管
球臨の〃・ ゲット側、カソード側に直列に挿入、きわ
7、ブトill・−ド8゜9の電気的耐圧を持たせろよ
うで、τi、°−r”い2.二)。
Here, Tetro-de control, code, -tsul'''49!1
'l', which have the same configuration and are inserted in series on the X-ray tube facing side and cathode side, respectively, and have an electrical withstand voltage of 7 and 8 and 9, respectively. Let's have it, τi, °−r"2. two).

又7はX線曝射信号をゲ:げ゛′r被写体の厚2六等に
応じて曝射時間を制御するタイ・1回路、IH′、前記
X線管球6の管電臣を制御す7り)為の前記ブト・コー
ド制御ユニツ)4,5のバイアス制御回路1.1、 、
12は前記ブト「7・〜 ド制餡I J−ニット4,5
のフィラメント電源となる例ベアθ;11文流i−00
Vi源の入力端子である。
In addition, 7 receives an X-ray exposure signal: a tie-1 circuit that controls the exposure time according to the thickness of the subject, IH', and the tube controller of the X-ray tube 6; Bias control circuits 1.1, 4 and 5 of the buttocode control unit 1.1 for
12 is the above-mentioned Buto ``7.
An example of a filament power supply is Bear θ; 11 Bunryu i-00
This is the input terminal of the Vi source.

。一方テトロ・−ド制御j−ニット4,5は第2図放〕
示すように構成さカフ゛てふ・す、荊述!−2,た如く
、このユニット4,5は同一 K構成さメ−1、’−(
いる事から、同一部分に(4゛同一符号をf’1士でそ
の詳細を説明する。
. On the other hand, Tetro-de control j-knits 4 and 5 are shown in Figure 2.
The cafeteria is configured as shown, and it is described! -2, the units 4 and 5 have the same K configuration.
Therefore, the details will be explained using the same symbols as f'1 and 4 in the same part.

入力端子A、BEは前記タイマ回路Tの出力が導入され
て」7・す、タイマ回路4の出力が高耐lf)ランスI
IKより適宜調整される。
The output of the timer circuit T is introduced into the input terminals A and BE, and the output of the timer circuit 4 is connected to the high resistance lance I.
Adjust as appropriate from IK.

、二の高1針玉l・ランス11はX線曝射信号に対する
応答性をよくする為、フエライl−コアで構成されたト
ランスを用いるのが適当であ2)。
In order to improve the responsiveness to the X-ray exposure signal, it is appropriate to use a transformer made of a Ferrai l-core for the two-high needle lance lance 112).

而して前記トランス11の2次電圧か仝波整流回路12
で整流さj121、抵抗135.二7ンデンザ14より
成る平滑回路を介1. ’?’ニスイツチング用ト・−
〉ンジスタ15のべ・−スにべ・−スバイアス電圧とし
て与えられる。
Therefore, the secondary voltage of the transformer 11 or the high wave rectifier circuit 12
rectified by j121, resistor 135. 1. Through a smoothing circuit consisting of a 27-denser 14. '? 'Ni-switching to--
> Applied to the base of the resistor 15 as a base bias voltage.

又入力端子C、D’KIt工前述1.た虹1く常時一定
電圧、例えば交流100Vが与えられ°1−゛むりこの
電圧が高耐圧トランス16を介し、”で、低)]−・、
トランス17の一次捲線υこ供給される。
In addition, input terminal C and D'Kit are connected to the above 1. A constant voltage, for example 100V AC, is applied at all times, and this voltage is passed through a high-voltage transformer 16, ``low)]-...
The primary winding υ of the transformer 17 is supplied.

どの低圧トランスITの二次巻線は第1、グリッド・・
−1′アス供給捲線18と、フィラメント電源用捲線1
9どを有し、前記捲線18に発生1〜だ2次電j王(j
″全波整流回路20で整流ざ41′た後、抵抗41.7
フンfンサ21より成る平滑回路で直流化され、径の正
側がテトロ・−ド8のカッ・−ドに、負側かに’ip
22を介して前記テトロ・−ド8の第1グリッド針−接
続さコ1.る1、面前記平滑回路の正側(゛よ前記l・
ランジスタ15のゴ1/クタにも接続され、とのトラン
ジスタの電源電圧ともなっている。
The secondary winding of any low voltage transformer IT is the first, grid...
-1′ ground supply winding 18 and filament power supply winding 1
9 etc., and the secondary electric currents 1 to 1 generated in the winding 18 are
After rectifying the rectifier 41' with the full-wave rectifier circuit 20, the resistor 41.7
It is converted into a direct current by a smoothing circuit consisting of a funnel 21, and the positive side of the diameter is connected to the cup of Tetrode 8, and the negative side is 'ip'.
22 to the first grid needle of said tetrode 8 through thread 1. 1. The positive side of the smoothing circuit (1)
It is also connected to the gate 1/coupler of the transistor 15, and serves as the power supply voltage for the transistor.

又前記捲線19は直接前記テトロ・−・ドロ0カソード
に接続され、そのフイラ、メント加熱電源となっている
The winding 19 is directly connected to the Tetro--Dolo cathode, and serves as a power source for heating the filler and ment.

更1.・7二前記入力端子E、FKは前記バイアス制御
回路10の出力電圧が−1えられ、この出力電圧が高耐
圧Iパニンンス23で適宜調整された後、低圧トラン、
く24で゛降圧さl′1.全波整流回路25で整流さt
′1て抵抗42、コンデンサ2Gより成る平滑回路で直
流化さ2′12、ここで得られた直流電圧の正側が11
jJ記ケ訃I]・−ド8の第2グリツドへ負側かカソー
ドに接続さ力、る。
Further 1. -72 The input terminals E and FK receive the output voltage of the bias control circuit 10 by -1, and after this output voltage is appropriately adjusted by the high voltage I panning 23, the low voltage transformer,
Step 24 lowers the pressure l'1. Rectified by the full wave rectifier circuit 25
'1 is converted to DC by a smoothing circuit consisting of a resistor 42 and a capacitor 2G, and the positive side of the DC voltage obtained here is 11.
- A force connected to the negative side or cathode of the second grid of node 8.

こ(i3J、うητ1〜で制御フー、′;−ット4によ
りX線管球Gの夕・−ゲット側に直列に挿入されている
テトロ・−ドが制御i′Sれ1、制御1ニツト5により
前記管球60カソード側に直列に挿入されているテトロ
・−ド8が制御される。
This (i3J, U ητ1~ controls the tetrode inserted in series on the evening and get sides of the X-ray tube G by ';-t4, controls i'Sre1, control 1 A tetrode 8 inserted in series on the cathode side of the tube 60 is controlled by the unit 5.

而して白前記端子A、Hにタイマ回路でユリの曝射信号
が無い場合トランジスタ15のべ・−スitτはバ・イ
アス′罵圧が−4えられ°C14・Z、い事からトラン
ジスタIFyA>:オン゛状態VXあり2、従つ′(前
記コンデンサ21の両端間ド生じ゛(、いる直流電圧が
抵抗22を介し−(テトロ・−ド8゜9のカッ・−ド、
第1グリッド間に印加され“−C”95、第1グリツド
がカソードηL苅I〜゛て負方向妃バ・イアスされる。
Therefore, if there is no lily exposure signal at the timer circuit at the terminals A and H, the base switch τ of the transistor 15 will have a bias bias of −4°C14·Z, so the transistor 15 IFyA>: ON state VX is present 2, so that (DC voltage is generated across the capacitor 21 through the resistor 22,
"-C" 95 is applied between the first grids, and the first grids are biased in the negative direction by the cathode .eta.L.

この第1グリツドW印加され2′)角、亀4圧をテ)B
・−ド8,9をノ7ツI−メフさせZ)に充分な電圧に
あらかじめ設定しでかく事により、この状態に於てはブ
トロード8.9は非導通となり、X線管球6には前記高
圧整流回路3よシの高電圧は印加され−ない。
This first grid W is applied to the 2') angle, and the 4 pressure is applied to the 4) B)
・By setting the voltages 8 and 9 in advance to a sufficient voltage for I-MEF and Z), in this state, the butrode 8.9 becomes non-conductive, and the X-ray tube 6 is No high voltage is applied to the high voltage rectifier circuit 3.

次にX線曝射信号が与えられで、前記タイマ回路Tより
所定時間だけ前記端子A、BK交流電圧が印加さ′1す
ると、との交流電圧が整流されてトランジスタ15のべ
・−スにベースバイアスが与えられ、トランジスタ15
がオン状態となる。
Next, an X-ray exposure signal is applied, and when the timer circuit T applies the AC voltage to the terminals A and BK for a predetermined time, the AC voltage is rectified and applied to the base of the transistor 15. Base bias is applied to transistor 15
turns on.

従ってブトロード8,9のカソード、第1グリッド間電
圧が略OVどなり、テトロ・−ド8,9が導通状態とな
る。
Therefore, the voltage between the cathodes of the buttrodes 8 and 9 and the first grid becomes approximately OV, and the tetrodes 8 and 9 become conductive.

ところで前記端子E、FKは前記バイアス制御回路10
よりの交流電圧が与えられており、この交流電圧の整流
された直流電圧がカソード、第2グリッド間にバイアス
電圧として与えられ′(いる。
By the way, the terminals E and FK are connected to the bias control circuit 10.
A DC voltage obtained by rectifying this AC voltage is applied as a bias voltage between the cathode and the second grid.

従ってこの第2グリツドに与えられる電圧値に応1、:
でテトロ・−ド8,9のカン・−ド、プレート間電圧が
制御さ11ろ事になる。
Therefore, depending on the voltage value applied to this second grid:
This will control the voltage between the can-dos and the plates of Tetro-dodes 8 and 9.

ここで第24ic示す回路を等簡約7711書替えろと
第3図に示すようVXなる。
Now, if the circuit shown in No. 24ic is rewritten as equal reduction 7711, it becomes VX as shown in FIG.

即ち第2図に示す高耐圧トランス119、整流回路12
、抵抗13、コンデンサ14、トランジスタ15よりな
るスイッチング回路がスイッチS1V:、、高耐圧トラ
ンス16、低圧トランス17及びその2次捲線18,1
9、整流回路20、抵抗41、コンデンサ21より成る
第1グリッドバイアス回路がEgIK、更に高耐圧トラ
ンス23、低圧トランス24、整流回路25、抵抗42
、コンデンサ26より成る第2グリッドバイアス回路が
Eg:i[夫々相当する事になり、タイマ回路7よりの
X線曝射信号が与えられると前記スイッチS1が閉成さ
れテト)コ・=−ド8゜9が導通してその内部電圧降下
EPが前記電源Eg2の電圧値により決定される事にな
る。
That is, the high voltage transformer 119 and rectifier circuit 12 shown in FIG.
, a switching circuit consisting of a resistor 13, a capacitor 14, and a transistor 15 is a switch S1V: , a high voltage transformer 16, a low voltage transformer 17, and their secondary windings 18, 1
9. The first grid bias circuit consisting of a rectifier circuit 20, a resistor 41, and a capacitor 21 is EgIK, and further includes a high voltage transformer 23, a low voltage transformer 24, a rectifier circuit 25, and a resistor 42.
, the second grid bias circuit consisting of the capacitor 26 corresponds to Eg:i[, respectively, and when the X-ray exposure signal from the timer circuit 7 is given, the switch S1 is closed and the switch S1 is closed. 8.9 becomes conductive, and its internal voltage drop EP is determined by the voltage value of the power source Eg2.

従ってX線管球6の管電圧な■工とすれば、高圧整流回
路3の整流出力電圧をEHTとして下式でJj、えられ
る。
Therefore, if the tube voltage of the X-ray tube 6 is represented by {circumflex over (2)}, the rectified output voltage of the high-voltage rectifier circuit 3 is set as EHT, and Jj can be obtained by the following formula.

一方前記テトロード8,9のプレ・−ト電流Ipがその
ttX線管球6の管電流になる。
On the other hand, the pre-t current Ip of the tetrodes 8 and 9 becomes the tube current of the tt X-ray tube 6.

ところで1、X線WK於いて、その管電流Ipとフィラ
メント電流Ifとの関係は一般に第4図に示すようにな
っている。
By the way, 1. In the X-ray WK, the relationship between the tube current Ip and the filament current If is generally as shown in FIG.

即ちこの第4図に示すX線管のIpIf特性から明らか
なように管電流Hpはフィラメント電流IfK大きく依
存しているものであり1、特に本発明装置が対象とj〜
ている透視撮影に於ては通常管電流の範囲は1.00m
A以下がほとんどである事から、この範囲に於ては管電
流I l−)は管電圧VXに依存せず、フィラメント電
流Ifを一定としておけばX線管球6はテトロード8,
9に対して定電流負荷とみなせる事になる。
That is, as is clear from the IpIf characteristics of the X-ray tube shown in FIG. 4, the tube current Hp is largely dependent on the filament current IfK1.
In fluoroscopy, the range of tube current is usually 1.00 m.
Since it is mostly below A, in this range the tube current I l-) does not depend on the tube voltage VX, and if the filament current If is kept constant, the X-ray tube 6 will have a tetrode 8,
9 can be regarded as a constant current load.

一方テトロードにあっては周知の如くその特性上プレー
ト電流■p1第1グリッド電圧Eglを一定とすればプ
レート電圧、即ち内部降下電圧Epは第2グリツド電圧
Eg2に依存する事とh:す、従って、前記第2グリツ
ド電圧Eg2を変化させる事によりテトロ・−ドの内部
降下電圧Epを制御でき、それによって上記(1)式よ
り明らかな如く一定管電流Ipのもどに線管々電圧Vx
を制御してX線管球6よりの曝射X線量を制御できる事
になる。
On the other hand, as is well known, due to the characteristics of a tetrode, if the plate current (p1) and the first grid voltage (Egl) are constant, the plate voltage, that is, the internal voltage drop Ep, depends on the second grid voltage (Eg2). By changing the second grid voltage Eg2, it is possible to control the internal voltage drop Ep of the tetrode, and as a result, as is clear from equation (1) above, the tube-to-line voltage Vx remains constant at a constant tube current Ip.
By controlling this, the amount of X-rays emitted from the X-ray tube 6 can be controlled.

即ちテトロード8,9の第1グリツドの作用に、j:す
X線曝馴の、ン、・イッデ”ソゲ動作を鮫こなわせるど
共V(ミ、ぞ”の第2のグリッドの作用によりX線管管
電、+EE’y Xを制御t、”−を−被写体の撮影部
位に対する必誠ニア’(iX線遺る−<$f、lφ11
できる事η7二なる。
That is, due to the action of the first grid of tetrodes 8 and 9, the action of the second grid of V (mi, zo) makes it possible to perform the "shark motion" of X-ray exposure. X-ray tube, +EE'y Controls the
What you can do is η72.

尚前記タイマ゛回路71t3第3図に示すように構成さ
れマ二いる。
The timer circuit 71t3 is constructed as shown in FIG. 3.

即ち入力端−了(÷に1曝躬信月が−h、えられると、
ごの曝射信号をトリガ信号と1〜て単安定マルチバイフ
レ・−タ27が1駆動され2)1、ところでこの単安定
マノトチバイノi/−□−夕27は今苅象とし7ている
被写体の診断部位′に応した曝射時間が設定さ′Jする
曝射時1恨設定器28により出力パルス巾が制御された
パルス信号が発生し1.−1のバダ・ス信号がゲート回
路2藁に一す、えらオ′1°こ、前記パルス信号が存在
する間が、[・回路29が5FI X (、−・方前記
ゲ・−・ト回路29には1F弦波発振jEjl ’y、
f53崗、1、りの出力が与えられT−おわ、ゲートが
開い゛(、いる間前記発振回路30の出力正弦波f己号
が噌巾L’# 31 K 、、%−えらI″L1適宜増
1″IJさね゛て出]J )ランス32を分j〜て前記
制御61ニツt−4、5の入力端子A、BE−ちえられ
る。
In other words, if the input terminal - 了 (÷ 1 exposure to Shingetsu - h, is obtained,
The monostable multi-vibrator 27 is driven by using the exposure signal of each as a trigger signal. At the time of exposure, the exposure time corresponding to the diagnostic area is set.1.The pulse setting device 28 generates a pulse signal with a controlled output pulse width.1. -1 badass signal is applied to the gate circuit 2, and while the pulse signal is present, the [・circuit 29 is 5FI The circuit 29 has a 1F string wave oscillation jEjl 'y,
An output of f53 is given, and the gate is open. L1 is increased by 1" as appropriate; IJ is turned out; J) The input terminals A and BE of the control 61 t-4 and t-5 are set by dividing the lance 32.

次に1:述1−2J:二曝射制御部を用い−こ構成j〜
たABC方式乙・でよるX線装欝の全体構成の−例を第
G図りτ示す、3り・fマ回路7’ K[lJ射倍信号
与えられ°(上述j〜だよう(t71高圧発生器1が作
動しX線管球6よりX線が曝射さ]9.′て、このX線
が被写体33を透過1−7てそ”の透過X線がX線螢光
増倍管34に与え;)・れる13 而しノーCiX線螢9″f、増倍賀34の出)1面に前
記透過X線の一1iJ’祝ソ己1象が生し、1゛この町
視界:像が光学分配藤35η5(’、 j−、リチア、
・ビーiJ%う36及びシネカメラ31に映像分配され
1.夫々透視8撮影がおこなわズ7.2)。
Next, 1: Description 1-2J: Using the two-irradiation control unit, this configuration j ~
An example of the overall configuration of an X-ray equipment based on the ABC method B is shown in Figure G. The generator 1 operates and X-rays are emitted from the X-ray tube 6 ] 9.' Then, these X-rays pass through the subject 33 1-7 and the transmitted X-rays pass through the X-ray fluorescence multiplier tube. 34; :The image is optically distributed Fuji 35η5(', j-, Lithia,
・Image is distributed to B iJ% U 36 and cine camera 31.1. 8 fluoroscopic images were performed respectively (7.2).

−・力前記光コ゛)!“分配鼎35シアー、は例えは光
電子増倍管等21、り成る輝度検出a38が設けられて
むり、冒の輝度検出器38 K 、) リX線螢光増倍
管34の出力輝馬′ンうく検出;シq1..る・・而「
て7−の輝度検出2;÷38の検出信号が前記バイアス
制御回路10に4’ff1aさ力〜る。
-・Power before light)! ``In the distribution mode 35, for example, a photomultiplier tube 21, etc., is provided with a brightness detection a38, and the output brightness of the X-ray fluorescence multiplier tube 34 is Detection;
A detection signal of 7-brightness detection 2;÷38 is applied to the bias control circuit 10 by 4'ff1a.

3とごろで前記バイアス制御回路’10?、τ(5、あ
らか1−め設定さ1また適正輝′f5.l?二相当−す
る基準電FEErが与えられ7でおり8.6(−の基準
電pf、民rに郊する前記輝度検出信号qvaを補+E
tへく、前記バイアス制御回路10よりの出力信号が制
御ユ・−ツl−4、5の入力端子E。
3 and the bias control circuit '10? , τ(5, approximately 1-1 is set 1, and the appropriate brightness 'f5.l?2-corresponding reference voltage FEEr is given as 7, and the reference voltage pf of 8.6(-) is set to Supplement the brightness detection signal qva +E
Next, the output signal from the bias control circuit 10 is input to the input terminal E of the control units 1-4 and 5.

Fに−tjえられて、ブートロ・−ド8,9の第2グリ
ッド電圧が制御され′マ入イ[巾、)i ff 1.、
・、X線管球Gび〕管電圧が可変されて曝射X線量力噛
I]御されT二剤ni[輝度検出信号が基準電圧E r
III追従する。
-tj is applied to control the second grid voltage of bootloads 8, 9. ,
・The X-ray tube G and the tube voltage are varied to control the irradiated X-ray dose and the luminance detection signal is set to the reference voltage E r
III Follow.

、1.6W泪動制御系が構成される事になる。, a 1.6W vibration control system will be constructed.

従って被写体33申診断部(srの厚みが変化L・、i
−楊合五二あ”−二)“てもX線螢弄増[音管34の出
力輝度は常に適止値に保)、これる。
Therefore, the thickness of 33 subjects (sr changes L・, i
-2) Even if the X-ray intensity increases (the output brightness of the sound tube 34 is always kept at an appropriate value), this will occur.

以上述べたように本発明1LよれLJX線管と直列に接
続されたテ”トロ・−・ドの第1グリツドを制御する事
陀よって、X線管の曝射制御を才、・こ、なうと共に、
4橢「4テトロ・−ドの第2グリツドに与えるべ・イア
スミ圧を制御し5てX線青々電圧を制御し5、その曝射
X線量を制御するようにし、ているので、応名速庶が格
段に改着き、1l−1J’ip低電力でX線量の制御を
おこなう事が一’r”き、X線透視、撮影に於l、パ了
]有効なるA B C’、動作をよ・・ξなわぜる事の
できるX線装置が提供′7″きる。
As described above, the present invention 1L controls the first grid of the tetrode connected in series with the LJ X-ray tube, thereby making it possible to control the exposure of the X-ray tube. Along with
4) The beam pressure applied to the second grid of the tetrode is controlled, the X-ray voltage is controlled, and the exposed X-ray dose is controlled. The general world has changed dramatically, and it has become possible to control the X-ray dose with low power. An X-ray device that can do...ξ is now available.

【図面の簡単な説明】[Brief explanation of the drawing]

第11ffl&’文本発明の一実施飼を示す構成図J第
2図、第5図は同実施例の要部詳細構成図、第3図は第
2図の等価回路図、第4図はX線管のIp1f特1土全
1土図、第6図は同実施例の適用例を示す全体FIJM
、図〒9ちる。 4.5・・・・・・高に′y″トロ・−ド制何]ユニッ
ト、8゜;〕 ・・・・・・“ラ−i c:+ −
ド。
11ffl&' text A block diagram showing one implementation of the present invention J Figures 2 and 5 are detailed configuration diagrams of the main parts of the same embodiment, Figure 3 is an equivalent circuit diagram of Figure 2, and Figure 4 is an X-ray diagram. Ip1f special 1st land 1st land map of the pipe, Figure 6 is the entire FIJM showing an example of application of the same example.
, Figure 9. 4.5...high ``y'' toro-do system unit, 8゜;] ......"ra-i c: + -
Do.

Claims (1)

【特許請求の範囲】[Claims] 1 X線装置IL於’−rl、被検体の透過xaf象を
可況光像に変換するX線螢光増倍管と、このX線螢光増
倍管の出力輝度を検出j−る輝1f検出器ど、、X線管
に印加すべき高′鍼0を発生ずる高)千発生器の出力端
とX線管との間に直列jc接続さ、、1−1−.7.τ
四極真空管と、X線曝射信号が与えられる2−前記四極
真空管を導通させるべくその第1グリツドのバイアス電
圧を制御する第1グリツドバ・イブス回路と、前記X線
螢光増倍管の適圧輝度1置対応さ((゛て−f・め基準
電圧か設定さカー、′二の基準電圧と前記輝度検出乙に
よる検出信−じとを比較1−7これらの差が減小すく)
方向に前記四極貞、空簀の内部電圧降Fを制御j−べく
その第2グリツドのバイアス電圧を制御する第2グリツ
ドバイ°アス回路とを具備(〜たC1とを特徴とするX
線装置。
1 In the X-ray device IL'-rl, there is an X-ray fluorescence multiplier tube that converts the transmitted XAF image of the subject into a visible light image, and a luminance detector that detects the output brightness of this X-ray fluorescence multiplier tube. The 1f detector is connected in series between the output end of the generator and the X-ray tube, which generates the high voltage to be applied to the X-ray tube, 1-1-. 7. τ
a tetrode vacuum tube, to which an X-ray exposure signal is applied; 2-a first grid bus circuit for controlling the bias voltage of its first grid to render the tetrode vacuum tube conductive; and an appropriate voltage for the X-ray fluorescence multiplier tube; Compatible with the brightness 1 position ((1-7) Compare the two reference voltages and the detection signal from the brightness detection B, and the difference between them will be reduced.
and a second grid bias circuit for controlling the bias voltage of the second grid in order to control the internal voltage drop F of the quadrupole cell and the air tank in the direction.
line equipment.
JP49066502A 1974-06-13 1974-06-13 X-ray device Expired JPS5841640B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49066502A JPS5841640B2 (en) 1974-06-13 1974-06-13 X-ray device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49066502A JPS5841640B2 (en) 1974-06-13 1974-06-13 X-ray device

Publications (2)

Publication Number Publication Date
JPS50159691A JPS50159691A (en) 1975-12-24
JPS5841640B2 true JPS5841640B2 (en) 1983-09-13

Family

ID=13317654

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49066502A Expired JPS5841640B2 (en) 1974-06-13 1974-06-13 X-ray device

Country Status (1)

Country Link
JP (1) JPS5841640B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56162499A (en) * 1980-05-20 1981-12-14 Hitachi Medical Corp Tetrode control type x-ray generator
JPS56162500A (en) * 1980-05-20 1981-12-14 Hitachi Medical Corp Tetrode control type x-ray generator
JPS57141900A (en) * 1981-02-27 1982-09-02 Hitachi Medical Corp X-ray apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1395015A (en) * 1964-02-28 1965-04-09 Radiologie Cie Gle Improvements to high voltage generators for x-ray equipment

Also Published As

Publication number Publication date
JPS50159691A (en) 1975-12-24

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