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JPS5841982B2 - Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou - Google Patents
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JPS5841982B2 - Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou - Google Patents

Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou

Info

Publication number
JPS5841982B2
JPS5841982B2 JP49059511A JP5951174A JPS5841982B2 JP S5841982 B2 JPS5841982 B2 JP S5841982B2 JP 49059511 A JP49059511 A JP 49059511A JP 5951174 A JP5951174 A JP 5951174A JP S5841982 B2 JPS5841982 B2 JP S5841982B2
Authority
JP
Japan
Prior art keywords
cutting
tool
light
niyor
kougumamou
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49059511A
Other languages
Japanese (ja)
Other versions
JPS50155250A (en
Inventor
和雄 山崎
信重 沢井
秀彦 竹山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP49059511A priority Critical patent/JPS5841982B2/en
Publication of JPS50155250A publication Critical patent/JPS50155250A/ja
Publication of JPS5841982B2 publication Critical patent/JPS5841982B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Description

【発明の詳細な説明】 本発明は、光反射を利用してフライス等の断続切削工具
の刃先の状態を検出、測定する方法に関するものである
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of detecting and measuring the state of a cutting edge of an interrupted cutting tool such as a milling cutter using light reflection.

断続切削を行うフライスカッタ等では、工具が少なくと
も一回転周期の半分の非切削時間を有しているので、こ
の間を利用して、刃先の状態を直接測定することができ
る。
In a milling cutter or the like that performs interrupted cutting, the tool has a non-cutting time of at least half of one rotation period, so the state of the cutting edge can be directly measured using this time.

本発明は、この非切削時間の間に、回転中の工具の刃先
に光を当て、その反射光量を検出して工具の刃先の状態
を測定する方法を提供するものである。
The present invention provides a method for measuring the condition of the cutting edge of the tool by shining light onto the cutting edge of the rotating tool during this non-cutting time and detecting the amount of reflected light.

したがって、本発明によれば簡単な装置でインプロセス
検出を行うことができ、さらに工具の刃先の状態として
工具逃げ面の摩耗ばかりでなく、チッピングの有無の検
出なども行うことができる。
Therefore, according to the present invention, in-process detection can be performed with a simple device, and it is also possible to detect not only the wear of the tool flank but also the presence or absence of chipping as the condition of the cutting edge of the tool.

図面を参照して本発明をさらに詳細に説明すると、第1
図a、bに示すように、被削材Wをフライスカッタ等の
断続切削工具Tによって切削する場合、その断続切削工
具Tの切刃2は断続的な実切削時間の間において非切削
状態に保たれる時間があり、工具摩耗等を検出するため
の検出ヘッド1は、回転する断続切削工具Tが非切削状
態にある位置においてその刃先に対向するように設置さ
れる。
To explain the present invention in more detail with reference to the drawings, the first
As shown in Figures a and b, when cutting a workpiece W with an intermittent cutting tool T such as a milling cutter, the cutting edge 2 of the intermittent cutting tool T is in a non-cutting state during the intermittent actual cutting time. A detection head 1 for detecting tool wear and the like is installed so as to face the cutting edge of the rotating intermittent cutting tool T at a position where it is in a non-cutting state.

検出ヘッド1は、光源3から出た光をレンズ4゜5によ
って平行光線にし、それをスリット6により帯状にして
工具逃げ面の摩耗部2aに当てる投光部と、その光線が
摩耗部2aで反射する方向に設置されていて、反射光を
レンズ7で集光した後フォトトランジスタ8で受光する
受光部とによって構成されている。
The detection head 1 includes a light emitting part that converts light emitted from a light source 3 into parallel light beams using a lens 4.5, transforms it into a band shape through a slit 6, and applies it to a worn part 2a of the flank of the tool, and a light emitting part that directs the light beam to a worn part 2a of the tool flank. It is installed in the direction of reflection, and consists of a light receiving section that collects the reflected light with a lens 7 and then receives the light with a phototransistor 8.

受光部のフォトトランジスタ8の出力は増幅器9を通し
てディジタル電圧計、シンクロスコープ等の表示装置1
0に表示させる。
The output of the phototransistor 8 in the light receiving section is transmitted through an amplifier 9 to a display device 1 such as a digital voltmeter or synchroscope.
Display it at 0.

第2図は、上述した光源3からの光を工具の摩耗部2a
において反射させ、フォトトランジスタ8で反射光を受
光して、その出力をディジタル電圧計で検出し、摩耗部
からの反射光の光量と摩耗幅の関係を求めた実験の結果
を示すものである。
FIG. 2 shows how the light from the light source 3 described above is applied to the worn part 2a of the tool.
This shows the results of an experiment in which the relationship between the amount of reflected light from the worn part and the width of the wear was determined by reflecting the reflected light at the phototransistor 8 and detecting its output with a digital voltmeter.

同図かられかるように、上述した摩耗部からの反射光量
の検出によって精度のよい逃げ面摩耗幅の測定を行うこ
とができる。
As can be seen from the figure, the flank wear width can be measured with high precision by detecting the amount of reflected light from the wear portion described above.

また、受光部の出力を表示する表示装置10としてシン
クロスコープを用いた場合、上述の逃げ面摩耗が生じた
ときには第3図aに示すような波形が得られるが、工具
がチッピングしたときには、同図すに示すように、その
チッピングの程度に応じて幅が増加すると共にレベルが
低くなって2つのピークを有する波形が得られることに
なる。
Furthermore, when a synchroscope is used as the display device 10 to display the output of the light receiving section, when the above-mentioned flank wear occurs, a waveform as shown in FIG. 3a is obtained, but when the tool chips, the same waveform is obtained. As shown in the figure, the width increases and the level decreases depending on the degree of chipping, resulting in a waveform having two peaks.

したがって、これにより工具がチッピングしたか否かを
検出することもできる。
Therefore, it is also possible to detect whether the tool has chipped or not.

以上に詳述したところから明らかなように、本発明の方
法によれば工具の一回転周期の非切削時間を利用して工
具摩耗やチッピングの検出、測定をインプロセスで行う
ことができ、特に、チッピングが生じた場合にはそれを
直ちに検出することができるため、切削面への悪影響を
極力抑えることができ、その測定のための装置も極めて
簡単でモデルが不要であるなどの特長がある。
As is clear from the detailed description above, according to the method of the present invention, tool wear and chipping can be detected and measured in-process using the non-cutting time of one tool rotation period, and in particular, If chipping occurs, it can be detected immediately, so the negative effect on the cutting surface can be minimized, and the equipment for measuring it is extremely simple and does not require a model. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図a、bは本発明の方法を実施する装置についての
構成図、第2図は本発明に関する実験の結果を示す線図
、第3図a、bは本発明の方法によって得られる出力波
形についての説明図である。 T・・・・・・断続切削工具、2・・・・・・切刃、2
a・・・・・・摩耗部、3・・・・・・光源、8・・・
・・・フォトトランジスタ、10・・・・・・表示装置
Figures 1a and b are block diagrams of an apparatus for implementing the method of the present invention, Figure 2 is a diagram showing the results of experiments related to the present invention, and Figures 3a and b are outputs obtained by the method of the present invention. It is an explanatory diagram about a waveform. T... Intermittent cutting tool, 2... Cutting blade, 2
a... Worn part, 3... Light source, 8...
. . . Phototransistor, 10 . . . Display device.

Claims (1)

【特許請求の範囲】[Claims] 1 断続切削工具による切削加工中に、断続的な実切削
時間の間において非切削状態にある切刃の逃げ面の摩耗
部に平行光線を当て、その摩耗部からの反射光量及びそ
の変化を検出して、上記光量により摩耗幅を検出すると
共に、出力波形の幅の増加とレベルの低下によってチッ
ピングの検出を行うことを特徴とする光反射による工具
摩耗・チッピングのインプロセス検出方法。
1. During cutting using an intermittent cutting tool, a parallel light beam is applied to the worn part of the flank of the cutting edge that is not cutting during the intermittent actual cutting time, and the amount of light reflected from the worn part and its change are detected. An in-process method for detecting tool wear and chipping by light reflection, characterized in that the wear width is detected by the amount of light, and chipping is detected by an increase in the width and a decrease in the level of the output waveform.
JP49059511A 1974-05-27 1974-05-27 Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou Expired JPS5841982B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49059511A JPS5841982B2 (en) 1974-05-27 1974-05-27 Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49059511A JPS5841982B2 (en) 1974-05-27 1974-05-27 Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou

Publications (2)

Publication Number Publication Date
JPS50155250A JPS50155250A (en) 1975-12-15
JPS5841982B2 true JPS5841982B2 (en) 1983-09-16

Family

ID=13115345

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49059511A Expired JPS5841982B2 (en) 1974-05-27 1974-05-27 Hikari Hanshiya Niyor Kougumamou Chitsupinno In-process Kenshiyutsuhouhou

Country Status (1)

Country Link
JP (1) JPS5841982B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020153730A (en) * 2019-03-19 2020-09-24 株式会社豊田中央研究所 Wear measurement device and wear measurement method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3137756A (en) * 1957-10-31 1964-06-16 Zeiss Carl Device for determining the dimensions of an object
JPS511005Y2 (en) * 1971-05-24 1976-01-13
JPS4855766A (en) * 1971-11-10 1973-08-04

Also Published As

Publication number Publication date
JPS50155250A (en) 1975-12-15

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