JPS58511B2 - Manufacturing method of target material for sputtering - Google Patents
Manufacturing method of target material for sputteringInfo
- Publication number
- JPS58511B2 JPS58511B2 JP51145391A JP14539176A JPS58511B2 JP S58511 B2 JPS58511 B2 JP S58511B2 JP 51145391 A JP51145391 A JP 51145391A JP 14539176 A JP14539176 A JP 14539176A JP S58511 B2 JPS58511 B2 JP S58511B2
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- target
- sputtering
- container
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Powder Metallurgy (AREA)
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】
本発明は基板上に2種以上の元素特にNb、Geからな
る合金薄膜または金属間化合物薄膜を形成するに適した
スパッタリング装置用のターゲットの製法に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing a target for a sputtering apparatus suitable for forming an alloy thin film or an intermetallic compound thin film containing two or more elements, particularly Nb and Ge, on a substrate.
近年半導体材料、超電導材料、電子部品材料などとして
基板上にスパッタリング法により2種以上の成分元素か
らなる合金および金属間化合物薄膜を生成する要求が増
加している。In recent years, there has been an increasing demand for producing thin films of alloys and intermetallic compounds made of two or more constituent elements by sputtering on substrates as semiconductor materials, superconducting materials, electronic component materials, and the like.
この場合スパッタリングターゲット製造の要件は■成分
元素の組成が正確に、容易にコントロール出来ること、
■所定の形状に成形しやすいこと、■不純物の混入が少
ないことである。In this case, the requirements for sputtering target production are: ■ The composition of the component elements must be accurately and easily controllable;
■It is easy to mold into a predetermined shape, and ■It is less likely to contain impurities.
しかるに従来からとられていた製法としては、(1)得
ようとする薄膜組成にほぼ等しい組成の合金板を溶解法
で作る方法、(2)焼結による方法、(3)成分元素か
らなる個々の金属板を、同じ陰極ターゲットにセットす
るか、個々の陰極に用いて、同時にスパッタをする方法
などがあった。However, the conventional manufacturing methods include (1) a method of producing an alloy plate with a composition approximately equal to the composition of the thin film to be obtained by a melting method, (2) a method by sintering, and (3) a method of producing an alloy plate consisting of component elements. There was a method of sputtering two metal plates at the same time, either by setting them on the same cathode target or by using them for individual cathodes.
しかしく1)の方法では被スパツタ材料の二種の元素が
互いに溶解し合わない場合、特に金属間化合物を形成さ
せようとする場合には大きな偏析が生ずる。However, in method 1), when the two elements of the material to be sputtered do not dissolve into each other, large segregation occurs, especially when attempting to form an intermetallic compound.
また二種の元素の融点が大きく異なりかつ溶解温度にお
ける蒸気圧に差があるものを不純物が混入しないよう真
空溶解する場合、蒸発により成分組成が変動するため目
的組成比をもった合金を作るだめには、蒸発しやすい材
料を余分に配合し、溶解時間をコントロールしなければ
ならす材料ロスも大きく冒頭の製造要件を満足させるに
は適当な方法ではなかった。Furthermore, when two elements with greatly different melting points and vapor pressures at the melting temperature are melted in vacuum to avoid contamination by impurities, it is difficult to create an alloy with the desired composition ratio because the component composition changes due to evaporation. However, this method was not suitable for satisfying the manufacturing requirements mentioned above, as it involved adding an extra material that easily evaporates and controlling the dissolution time, which resulted in a large amount of material loss.
次に(2)の方法には、(A)構成元素の溶解温度近辺
で加圧せずに材料を焼結する方法及び(B)所定の温度
雰囲気においてカーボンのダイ中で機械的に一方向に材
料を加圧する方法があるが、下記の様な不都合な点があ
り、冒頭要件を満足するターゲット製造法として適当で
なかった。Next, method (2) includes (A) a method of sintering the material without applying pressure near the melting temperature of the constituent elements, and (B) a method of mechanically unidirectionally unidirectionally sintering the material in a carbon die in a predetermined temperature atmosphere. There is a method of pressurizing the material, but it has the following disadvantages and is not suitable as a target manufacturing method that satisfies the initial requirements.
(A)の方法では焼結時、高温のだめ、蒸発を伴い厳密
な組成のコントロールが難しい。Method (A) involves high temperature and evaporation during sintering, making it difficult to precisely control the composition.
(B)の方法では(a)カーボンのダイの表面から焼結
体中にダイの構成元素が多量に侵入する。In method (B), (a) a large amount of constituent elements of the carbon die enter the sintered body from the surface of the die.
従って高純度超電導材料の製作用ターゲット材料製造に
は具合が悪い。Therefore, it is not suitable for producing target materials for producing high-purity superconducting materials.
(b)圧力が一方向にのみ加えられるため、圧力分布が
均等でなく、低融点金属粒子が圧力の小さな方向に押し
込まれ、偏析の原因となり均一組成の焼結体が得られな
い。(b) Since pressure is applied only in one direction, the pressure distribution is not uniform, and the low melting point metal particles are pushed in the direction of lower pressure, causing segregation and making it impossible to obtain a sintered body with a uniform composition.
従って均一な組成比の要求される超電導材料の製作用タ
ーゲット材料としては不適当である。Therefore, it is unsuitable as a target material for producing superconducting materials that require a uniform composition ratio.
(c)焼結中に焼結体の構成元素がダイの内部に侵入し
、ダイを一回の焼結ごとに新しいものと交換する必要が
あり、焼結コストが高くつく。(c) Constituent elements of the sintered body enter the inside of the die during sintering, and it is necessary to replace the die with a new one every time sintering is performed, increasing sintering costs.
従って多量にターゲットを製造する場合には適当な方法
ではない。Therefore, this method is not suitable for manufacturing targets in large quantities.
(3)の方法で目的とする組成比をもった合金薄膜を形
成しようとする場合、ターゲットの表面上で成分元素金
属の表面積の比がスパッタリングレートを考慮した上で
薄膜の組成を形成する様に成分元素金属を配置するわけ
であるが、この場合は基板に形成される薄膜が場所によ
り組成不均一にならない様に、ターゲットの表面上で成
分元素金属を分散させる必要があるが、分散に限度があ
り、うまく行なわないと組成均一な薄膜が得られないな
ど不都合が生じた。When attempting to form an alloy thin film with a desired composition ratio using method (3), the composition of the thin film is determined by considering the sputtering rate so that the surface area ratio of the component element metals on the target surface is In this case, it is necessary to disperse the component metals on the surface of the target so that the thin film formed on the substrate does not have a non-uniform composition depending on the location. There were limitations, and unless done well, a thin film with a uniform composition could not be obtained, resulting in inconveniences.
本発明においては、従来のかかる不具合点を解消し冒頭
で述べた3つの要件を満足するターゲットを提供するた
めの製造方法を提供するものである。The present invention provides a manufacturing method for eliminating such conventional drawbacks and providing a target that satisfies the three requirements mentioned at the beginning.
薄膜にしたい合金又は化合物を構成する元素の純度管理
された金属粉末を準備し、従来良く知られている粉末冶
金的手法で均一に混合する。Metal powders with controlled purity of the elements constituting the alloy or compound desired to be made into a thin film are prepared and mixed uniformly by a conventionally well-known powder metallurgy method.
しかる後に所望のターゲット形状を得るに適した構造を
有したガラス容器内に挿入し、真空封じを行なう。Thereafter, it is inserted into a glass container having a structure suitable for obtaining the desired target shape, and vacuum sealed.
粉末表面に吸着した水分ならびにガスを取り除いてから
真空封じをする必要があるので70℃〜500℃の適当
な温度で加熱しながら真空排気を行なうなどの配慮が必
要である。Since it is necessary to vacuum-seal the powder after removing moisture and gas adsorbed on the surface of the powder, consideration must be given to evacuation while heating at an appropriate temperature of 70°C to 500°C.
引き続き、このガラス容器ごと加熱しながら加圧するこ
とにより、ガラス容器内の金属粉末は圧縮一体化しター
ゲットとしての十分なる強度を有したターゲットが準備
出来る。Subsequently, by applying pressure while heating the entire glass container, the metal powder in the glass container is compressed and integrated, and a target having sufficient strength as a target can be prepared.
かかる方法によれば成分粉末を所定量混合するため成分
割りあいを正確にコントロール出来る上、ガラス容器内
に封入して作業を進めるため、加熱加圧時の蒸発損を心
配する必要がない。According to this method, since the component powders are mixed in a predetermined amount, the ratio of the components can be accurately controlled, and since the work is carried out by sealing the powder in a glass container, there is no need to worry about evaporation loss during heating and pressurization.
また純度管理についても最初の粉末を準備する段階で十
分管理をしておけば、あとはガラス容器内に収納されて
いるため、不純物混入の恐れはない。In addition, as long as the purity is properly controlled at the stage of preparing the initial powder, there is no risk of contamination with impurities since the powder is stored in a glass container.
加熱加圧された材料の表面はガラス材でおおわれている
ために一体化が終了したのちガラス材を除去し、ターゲ
ット形状の寸法精度をだすだめ、従来より知られている
適当な方法で切削、研磨を行ないターゲツト材とするこ
とが出来る。The surface of the heated and pressurized material is covered with a glass material, so after the integration is completed, the glass material is removed, and in order to achieve the dimensional accuracy of the target shape, it is cut using an appropriate method known in the past. It can be polished and used as a target material.
ガラス容器に封じ込むだめの真空度は酸化防止のだめ1
O−3Torr以上の高真空が望捷しい。The vacuum level of the container sealed in the glass container is 1 to prevent oxidation.
A high vacuum of O-3 Torr or higher is desirable.
加熱温度Tと加圧条件Pとは相互に関係があるが、実験
の結果、温度は構成成分元素のうち最も低い融点を有す
る材料の融点をTm、p、l、高い融点を有する材料の
融点をTm、p、hとすると00−5T、p、l≦T≦
Tm、p、hの範囲が良い。The heating temperature T and the pressurizing condition P are related to each other, but as a result of experiments, the temperature is Tm, p, l, the melting point of the material with the lowest melting point among the constituent elements, and the melting point of the material with the higher melting point. Let Tm, p, h be 00-5T, p, l≦T≦
The range of Tm, p, and h is good.
0.5Tm、p、l以下では十分な強度を有した一体化
したターゲットが得られず、あとの切削・研磨時に破壊
してしまう不都合が起る。If it is less than 0.5 Tm, p, l, an integrated target with sufficient strength cannot be obtained, and there is a problem that it will be destroyed during subsequent cutting and polishing.
圧力Pは次式で決められる範囲が好ましい。The pressure P is preferably within a range determined by the following equation.
本発明のNb、Geからなる場合ばC1=3.31゜C
2=2.30であり、この範囲以下では十分な強度を持
ったターゲットが得られない。In the case of Nb and Ge of the present invention, C1=3.31°C
2=2.30, and below this range a target with sufficient strength cannot be obtained.
また圧力Pの上限は、使用する加圧装置の上限で自ら限
定されることになる。Further, the upper limit of the pressure P is self-limited by the upper limit of the pressurizing device used.
以下、本発明の詳細な説明する。The present invention will be explained in detail below.
ターゲット材料として、Nb粉末(純度99.9溶融点
2468℃)Ge粉末(純度99.999%融点936
℃)で粒度140μのものを準備し、次に得ようとする
スパッタ薄膜のNb/Ge組成比が3/1になる様粉末
の均一混合を行なう。As target materials, Nb powder (purity 99.9, melting point 2468°C) and Ge powder (purity 99.999%, melting point 936°C) were used.
.degree. C.) with a particle size of 140 microns, and the powders are uniformly mixed so that the Nb/Ge composition ratio of the sputtered thin film to be obtained is 3/1.
この混合粉末を第1図に示す様な目的とするターゲット
の形状をそなえたパイレックスガラス(軟化温度750
℃)容器中に入れ真空度1O−5Torr(温度400
℃)にて20分間、粉末に耐着する水分、不純物除去の
だめのガス出し加熱を行なった後、真空封じを行う。This mixed powder was prepared using Pyrex glass (softening temperature: 750
degree of vacuum 10-5 Torr (temperature 400
℃) for 20 minutes to remove moisture and impurities that are resistant to adhesion to the powder, and then heat to remove gas, and then vacuum sealing is performed.
この容器を850℃で3時間の熱処理をし、ガラスを軟
化させその状態でアルゴンガスにより200kg/cm
2にて1時間圧縮焼結を行なう。This container was heat-treated at 850℃ for 3 hours to soften the glass, and in that state, it was heated to 200kg/cm using argon gas.
Compression sintering is performed for 1 hour at step 2.
この条件設定のために実施したNb−Ge系におけるP
とTの関係は第3図に示す通りである。P in the Nb-Ge system conducted to set this condition
The relationship between T and T is as shown in FIG.
その後、圧力を除去した状態で3時間850℃の熱処理
を行なう。Thereafter, heat treatment is performed at 850° C. for 3 hours with the pressure removed.
斯くして得た焼結体は、第2図に示す様な形状、寸法を
有し収縮し一体化されていることが認められた。The sintered body thus obtained had the shape and dimensions shown in FIG. 2, and was found to be shrunk and integrated.
この焼結体の表面を平面研削盤により研削することによ
り表面層のガラスの耐着は容易に取除くことが出来た。By grinding the surface of this sintered body with a surface grinder, the glass adhesion on the surface layer could be easily removed.
マイクロアナライザにより不純物を分析したところSi
、Al、B等のガラス成分は数PPMのオーダーにおさ
えられていた。When impurities were analyzed using a microanalyzer, Si
, Al, B, and other glass components were kept on the order of several ppm.
この研削した焼結体をターゲツト材として使用しスパッ
タリングを行なったところ、得られたスパッタ薄膜の組
成比率は少なくとも直径50mm以内で±2係以内のバ
ラツキであることがマイクロアナライザの測定結果から
確認出来だ。When sputtering was performed using this ground sintered body as a target material, it was confirmed from the microanalyzer measurement results that the composition ratio of the sputtered thin film obtained varied within ±2 coefficient within a diameter of at least 50 mm. is.
さらに得られた薄膜の臨界温度を測定すると20.5に
という値が観測され、所定のNb/Geの組成比が3/
1となっていることが判定される。Furthermore, when the critical temperature of the obtained thin film was measured, a value of 20.5 was observed, indicating that the predetermined Nb/Ge composition ratio was 3/3.
It is determined that the value is 1.
尚、第1図においてaは2mm、bは8mm、eは10
0mmφ、dは10m、第2図においてeは6mm、f
は80mmφである。In addition, in Fig. 1, a is 2 mm, b is 8 mm, and e is 10
0mmφ, d is 10m, e is 6mm, f in Figure 2
is 80mmφ.
第3図においてで実験により斜線部で示される領域で焼
結が可能と判断し、■の点で実施例のサンプルを作製し
た。In FIG. 3, it was determined by experiment that sintering was possible in the shaded area, and a sample of the example was prepared at point (■).
図中○印は焼結可能、X印は焼結不可能を示す。In the figure, ○ marks indicate that sintering is possible, and X marks indicate that sintering is not possible.
第1図及び第2図は本発明の実施例におけるガラス容器
の形状及び焼結体の形状を示す説明図、第3図は本発明
における圧力と温度の関係を説明する図表である。1 and 2 are explanatory diagrams showing the shape of a glass container and the shape of a sintered body in an example of the present invention, and FIG. 3 is a chart explaining the relationship between pressure and temperature in the present invention.
Claims (1)
基板上に形成するだめのスパッタ一方法に用いるターゲ
ット材料の製造法において、粒度1叫以下の粒状あるい
は粉末状構成元素を均一に所定の組成比に混合する工程
と、加熱温度で圧力が加わった時に十分に変形しうる程
度に軟化するが容器内の該構成元素を外界と接触しない
よう保護する程度には強度を保つようなガラス材質より
なる容器中に真空封入する工程と、それを加熱しながら
不活性気体中で等方的に圧力Pをかけ圧縮成形する工程
とよりなり、上記加熱する温度は構成元素のうち最も低
い融点を有する元素の融点をTm、P−7とすると加熱
温度Tは≧0.5Tm、P・1の範囲に設定したことを
特徴としたものであり、圧力PはC1,C2を材料によ
り決定される定数とし、定数C1=3.31.C2=2
.30であり、の式で示される範囲に設定したことを特
徴とする高純度で所定の組成比と形状を持ったスパッタ
ーリング用ターゲツト材の製造法。In a method for manufacturing a target material used in sputtering to form a thin film of an alloy or an intermetallic compound consisting of 1Nb and Ge on a substrate, granular or powdered constituent elements with a grain size of 100 nm or less are uniformly distributed in a predetermined manner. A glass material that softens enough to be deformed when pressure is applied at heating temperature, but maintains strength enough to protect the constituent elements in the container from contact with the outside world. The process consists of a step of vacuum sealing the container in a container made of the same material, and a step of compression molding it by isotropically applying a pressure P in an inert gas while heating it. The heating temperature T is set in the range of ≧0.5Tm, P-1, and the pressure P is determined by C1 and C2 depending on the material. As a constant, constant C1=3.31. C2=2
.. 30, and is set within the range shown by the formula:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51145391A JPS58511B2 (en) | 1976-12-02 | 1976-12-02 | Manufacturing method of target material for sputtering |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51145391A JPS58511B2 (en) | 1976-12-02 | 1976-12-02 | Manufacturing method of target material for sputtering |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5370047A JPS5370047A (en) | 1978-06-22 |
| JPS58511B2 true JPS58511B2 (en) | 1983-01-06 |
Family
ID=15384160
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51145391A Expired JPS58511B2 (en) | 1976-12-02 | 1976-12-02 | Manufacturing method of target material for sputtering |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58511B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1996036746A1 (en) * | 1995-05-18 | 1996-11-21 | Asahi Glass Company Ltd. | Process for producing sputtering target |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6058289B2 (en) * | 1979-05-18 | 1985-12-19 | 三菱マテリアル株式会社 | Manufacturing method of high chromium alloy material |
| JP3486640B2 (en) * | 1993-03-26 | 2004-01-13 | 独立行政法人産業技術総合研究所 | Target for manufacturing superconducting thin film, method for manufacturing the same, and method for manufacturing superconductor using the same |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4844611A (en) * | 1971-10-06 | 1973-06-27 | ||
| SE387876B (en) * | 1972-11-16 | 1976-09-20 | Asea Ab | PROCEDURE FOR HOT PRESSING OF POWDER BODIES |
| JPS49129606A (en) * | 1973-04-17 | 1974-12-12 | ||
| JPS5110677A (en) * | 1974-07-17 | 1976-01-28 | Nippon Steel Corp | Haikibutsushoriro |
| SE394178B (en) * | 1975-02-03 | 1977-06-13 | Asea Ab | PROCEDURE FOR HOT PRESSING OF POWDER BODIES |
-
1976
- 1976-12-02 JP JP51145391A patent/JPS58511B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1996036746A1 (en) * | 1995-05-18 | 1996-11-21 | Asahi Glass Company Ltd. | Process for producing sputtering target |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5370047A (en) | 1978-06-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6010583A (en) | Method of making unreacted metal/aluminum sputter target | |
| US6042777A (en) | Manufacturing of high density intermetallic sputter targets | |
| EP0004177B2 (en) | A method of metal coating of diamond or cubic boron nitride particles and an abrasive tool containing the particles thus coated | |
| US10023953B2 (en) | High purity refractory metal powders and their use in sputtering targets which may have random texture | |
| WO2004024977A1 (en) | Iron silicide sputtering target and method for production thereof | |
| WO2000038861A1 (en) | Method of making high-density, high-purity tungsten sputter targets | |
| JP3342898B2 (en) | Silicon sintered body and wafer holding board, sputtering target and silicon wafer formed using the same | |
| JP5684821B2 (en) | Method for manufacturing tungsten target | |
| WO1995004167A1 (en) | High melting point metallic silicide target and method for producing the same, high melting point metallic silicide film and semiconductor device | |
| JP2757287B2 (en) | Manufacturing method of tungsten target | |
| EP1069204A1 (en) | Cu/Cr sputter targets | |
| JPH10183341A (en) | Tungsten or molybdenum target | |
| US3809553A (en) | Metal foil-making process | |
| JPS58511B2 (en) | Manufacturing method of target material for sputtering | |
| JP3280054B2 (en) | Method for manufacturing tungsten target for semiconductor | |
| JPH03173704A (en) | Production of target for sputtering | |
| JP3086447B1 (en) | Tungsten target for sputtering and method for producing the same | |
| JP2896233B2 (en) | Refractory metal silicide target, manufacturing method thereof, refractory metal silicide thin film, and semiconductor device | |
| JP3551355B2 (en) | Ru target and method of manufacturing the same | |
| JP2894695B2 (en) | Rare earth metal-iron group metal target and method for producing the same | |
| JPH02166276A (en) | Target made of refractory metal silicide and its production | |
| KR102486945B1 (en) | Manufacturing method of high-purity silver sputtering target and silver sputtering target manufactured thereby | |
| JPS6328987B2 (en) | ||
| JP3472993B2 (en) | Sputtering target for forming indium tin oxide film and method for producing the same | |
| JPH0726369A (en) | Target for forming permalloy film and its production |