JPS5916201B2 - How to measure the transferred shape - Google Patents
How to measure the transferred shapeInfo
- Publication number
- JPS5916201B2 JPS5916201B2 JP49078972A JP7897274A JPS5916201B2 JP S5916201 B2 JPS5916201 B2 JP S5916201B2 JP 49078972 A JP49078972 A JP 49078972A JP 7897274 A JP7897274 A JP 7897274A JP S5916201 B2 JPS5916201 B2 JP S5916201B2
- Authority
- JP
- Japan
- Prior art keywords
- molded product
- basic shape
- shape
- light
- contour map
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
この発明は等高線図によつて成形品の転写精度を測定す
る転写形状の測定方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a transfer shape measuring method for measuring transfer accuracy of a molded article using a contour map.
たとえば、プレス成形によつて製造された成形品が、金
型に刻設された曲面形状の基本形をどの程度精密に転写
したかを測定する場合、従来は触針式の形状測定器で測
定するのが一般に行なわれていた。For example, when measuring how accurately a molded product manufactured by press molding has transferred the basic shape of a curved surface engraved on a mold, conventionally a stylus-type shape measuring device is used to measure the shape. was commonly practiced.
この触針式の形状測定器による転写精度の測定は、成形
品の表面に針を接触させて走査し、この針の移動量から
上記成形品の形状を求め、それを上記金型に刻設された
基本形と比較することにより、上記成形品の転写精度を
測定するものである。だが、このような触針式の形状測
定器によつて転写精度を測定する場合、成形品の表面全
体に針を走査させるということは容易なことではない。To measure transfer accuracy using this stylus-type shape measuring device, a stylus is brought into contact with the surface of the molded product and scanned, the shape of the molded product is determined from the amount of movement of this stylus, and this is engraved on the mold. The transfer accuracy of the molded product is measured by comparing it with the basic shape obtained. However, when measuring transfer accuracy using such a stylus-type shape measuring device, it is not easy to scan the entire surface of the molded product with the stylus.
また、針を成形品に接触させて走査すると、上記成形品
の表面に傷が付く虞れがあるなどの不都合があつた。こ
の発明は上記事情にもとづきなされたもので、その目的
とするところは、たとえば金型などに刻設された基本形
と、この基本形から成形される成形品との等高線図を光
学的に作成し、これらの等高線図から上記成形品の基本
形に対する転写精度を測定することにより、簡単で、し
かも非接触で測定を行うことができる転写形状の測定方
法を提供することにある。Furthermore, when the needle is brought into contact with the molded article and scanned, there is a possibility that the surface of the molded article may be scratched. This invention was made based on the above circumstances, and its purpose is to optically create a contour map of a basic shape engraved on a mold or the like and a molded product molded from this basic shape, It is an object of the present invention to provide a method for measuring a transferred shape that can be easily and non-contactly measured by measuring the transfer accuracy with respect to the basic shape of the molded article from these contour maps.
以下、この発明の一実施例を図面にもとづいて説明する
。Hereinafter, one embodiment of the present invention will be described based on the drawings.
図中1は、たとえばプレス加工などに用いられる金型で
、この金型1には凹曲面からなる基本形2が刻設されて
いる。また、図中3は上記金型1から成形された凸曲面
からなる成形品で、この成形品3は載置合1上に置かれ
、その上方には、上記成形品3を覆うように微小幅で多
数の開口5a・・・が設けられた格子5が配設されてい
る。また、上記成形品3の斜上方には光源6が設けられ
、この光源6と対向して集光レンズTが配設されている
。また、成形品3の垂直上方には結像レンズ8と、この
結像レンズ8と対向して写真乾板9とが配設され、上記
成形品3の等高線図を、たとえばモアレ・トポグラフイ
ー法で作成する構成となつている。しかして、光源6か
ら光L1が発せられると、その光L1は集光レンズTで
集束され、格子5を介して成形品3を照射する。In the figure, reference numeral 1 denotes a mold used for press working, for example, and a basic shape 2 consisting of a concave curved surface is engraved on this mold 1. In addition, 3 in the figure is a molded product having a convex curved surface molded from the mold 1, and this molded product 3 is placed on the mounting plate 1, and above the molded product 3, a minute A lattice 5 is provided with a large number of openings 5a in width. Further, a light source 6 is provided diagonally above the molded product 3, and a condensing lens T is provided facing the light source 6. Further, an imaging lens 8 and a photographic plate 9 are disposed vertically above the molded product 3, and a photographic plate 9 is disposed opposite to the imaging lens 8. It is configured to be created. Thus, when the light L1 is emitted from the light source 6, the light L1 is focused by the condenser lens T and illuminates the molded product 3 through the grating 5.
そののち、光L1は成形品3で反射して、その反射光L
2は格子5を通り抜けて結像レンズ8を介して写真乾板
9に第4図に示すような成形品3の等高線図10を形成
する。これと同様にして金型1に刻設された基本形2の
等高線図を求めると、第3図に示すように上記成形品の
等高線図10とは対称の等高線図11が得られる。この
ようにして作成された等高線図10,11において、も
しも、上記成形品3が金型1の基本形2を正確に転写し
ていたならば、上記等高線図10と11とは鏡対称とな
つているので、これらを裏返して重合させれば、等高線
はずれることなく一致する。After that, the light L1 is reflected by the molded product 3, and the reflected light L1
2 passes through the grating 5 and forms a contour map 10 of the molded product 3 as shown in FIG. 4 on the photographic plate 9 via the imaging lens 8. If a contour map of the basic shape 2 engraved on the mold 1 is obtained in the same manner, a contour map 11 is obtained which is symmetrical to the contour map 10 of the molded product, as shown in FIG. In the contour maps 10 and 11 created in this way, if the molded product 3 had accurately transferred the basic shape 2 of the mold 1, the contour maps 10 and 11 would have mirror symmetry. Therefore, if these are turned over and polymerized, the contour lines will match without shifting.
しかし、成形品の転写精度が悪い場合は、上記等高線図
10と11との等高線はずれて、第5図に示すようにモ
アレ現像により上記ずれ量に比例した次数を有する縞模
様、すなわちモアレ縞12が現われるので、成形品3の
転写精度および上記ずれ量の次数より誤差を知ることが
できるものである。なお、上記実施例においては、等高
線図を作成するのにモアレ・トポグラフイ一法を用いた
が、他の手段としてホログラフイ一法、干渉計法、など
によつて等高線図を作成しても、上記実施例と同様に成
形品の転写精度を測定することができる。However, if the transfer accuracy of the molded product is poor, the contour lines of the contour maps 10 and 11 may deviate, and as shown in FIG. Therefore, the error can be determined from the transfer accuracy of the molded product 3 and the order of the amount of deviation. In the above embodiment, the moiré topography method was used to create the contour map, but even if the contour map was created by other means such as the holography method or the interferometer method, the above The transfer accuracy of the molded product can be measured in the same manner as in the examples.
また、転写精度を測定する対象としてプレス加工などの
ように金型に刻設された基本形から成形される成形品に
ついて述べたが、切削加工などのように基本形のない成
形品においては、理論的に基本形を求めて等高線図を作
成することにより、上記実施例と同様に転写精度を測定
することができる。さらに、上記実施例では成形品の等
高線図を作成するのに写真乾板を用いて行つたが、この
写真乾板の変わりに拡散板と、この拡散板と重合して基
本形の等高線図を配置し、上記拡散板に成形品の等高線
図を投影して、肉眼またはテレビカメラを介して上記基
本形と成形品との等高線図のずれを測定すれば、成形品
の転写精度の測定を短時間で行うことができるので、生
産ラインなどに使用することも可能である。さらに、基
本形が凸曲面からなり、成形品が凹曲面からなる場合も
上記実施例と同様転写形状を測定できることは無論であ
る。以上述べたようにこの発明においては、一方が凹曲
面からなり、他方が凸曲面からなる基本形と成形品との
等高線図を作成し、これら等高線を重ね合せることによ
つて生じるモアレ縞により上記成形品の基本形に対する
転写精度を測定することを特徴とする。In addition, we have described molded products that are molded from a basic shape engraved on a mold, such as in press processing, as targets for measuring transfer accuracy.However, for molded products that do not have a basic shape, such as in cutting processing, theoretical By finding the basic shape and creating a contour map, the transfer accuracy can be measured in the same manner as in the above embodiment. Furthermore, in the above embodiment, a photographic plate was used to create a contour map of the molded product, but instead of this photographic plate, a diffuser plate was used, and a contour map of the basic shape was arranged by superimposing the diffuser plate. By projecting the contour map of the molded product onto the diffuser plate and measuring the deviation between the contour map of the basic shape and the molded product using the naked eye or a television camera, the transfer accuracy of the molded product can be measured in a short time. It can also be used in production lines, etc. Furthermore, it goes without saying that even if the basic shape is a convex curved surface and the molded product is a concave curved surface, the transferred shape can be measured in the same manner as in the above embodiment. As described above, in this invention, a contour map is created between the basic shape and the molded product, one of which is a concave curved surface and the other is a convex curved surface, and the moiré fringes generated by overlapping these contour lines are used to form the molded product. It is characterized by measuring the transfer accuracy for the basic shape of the product.
したがつて、成形品の転写精度の測定を簡単に、かつ非
接触で行うことができるようになつたので、能率の向上
が計れるばかりが、成形品の表面に傷を付けることなく
測定できるという実用上の利用価値は大きい。Therefore, it has become possible to easily and non-contactly measure the transfer accuracy of molded products, which not only improves efficiency, but also allows measurement without damaging the surface of the molded product. It has great practical value.
図面は、この発明の一実施例を示すもので、第1図は基
本形が刻設された金型を示す縦断面図、第2図は等高線
図を作成する手段を示す概略的構成図、第3図は基本形
の等高線図、第4図は成形品の等高線図、第5図は重ね
合された等高線図によつて生じるモアレ縞を示す平面図
である。
2・・・・・・基本形、3・・・・・・成形品、10,
11・・・・・・等高線図、12・・・・・・モアレ縞
。The drawings show one embodiment of the present invention, and FIG. 1 is a longitudinal sectional view showing a mold in which a basic shape is engraved, FIG. 2 is a schematic configuration diagram showing a means for creating a contour map, and FIG. 3 is a contour map of the basic shape, FIG. 4 is a contour map of the molded product, and FIG. 5 is a plan view showing moiré fringes caused by the superimposed contour maps. 2...basic shape, 3...molded product, 10,
11...Contour map, 12...Moire fringes.
Claims (1)
行光を格子を介して対応関係になる基本形およびこの基
本形より得られる成形品の凹凸二つの物体に別々に照射
し、各照射された物体のそれぞれの反射光によつて鏡対
称になる等高線図を作成し、上記二つの高等線図の一方
を裏返して両者を重ね合わせモアレ現像によるモアレ縞
を得このモアレ縞より上記二つの物体のずれ量を測定す
ることを特徴とする転写形状の測定方法。1 The light emitted from the light source is made into parallel light by an optical system, and this parallel light is separately irradiated through a grating to the basic shape that corresponds to the two objects with the irregularities of the molded product obtained from this basic shape, and each irradiated light is A mirror-symmetric contour map is created using the reflected light of each object, and one of the above two high-level contour maps is turned over and the two are superimposed to obtain moire fringes due to moire development. A method for measuring a transferred shape, characterized by measuring the amount of deviation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49078972A JPS5916201B2 (en) | 1974-07-10 | 1974-07-10 | How to measure the transferred shape |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49078972A JPS5916201B2 (en) | 1974-07-10 | 1974-07-10 | How to measure the transferred shape |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS517960A JPS517960A (en) | 1976-01-22 |
| JPS5916201B2 true JPS5916201B2 (en) | 1984-04-13 |
Family
ID=13676802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49078972A Expired JPS5916201B2 (en) | 1974-07-10 | 1974-07-10 | How to measure the transferred shape |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5916201B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004133324A (en) * | 2002-10-11 | 2004-04-30 | Fuji Photo Film Co Ltd | Electronic image forming method |
| JP2016070918A (en) * | 2014-10-01 | 2016-05-09 | 本田技研工業株式会社 | Molded product manufacturing method, shape measuring method and shape measuring apparatus |
-
1974
- 1974-07-10 JP JP49078972A patent/JPS5916201B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS517960A (en) | 1976-01-22 |
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