JPS5920592B2 - Method for detecting defects on the surface of yarn rolls - Google Patents
Method for detecting defects on the surface of yarn rollsInfo
- Publication number
- JPS5920592B2 JPS5920592B2 JP2629076A JP2629076A JPS5920592B2 JP S5920592 B2 JPS5920592 B2 JP S5920592B2 JP 2629076 A JP2629076 A JP 2629076A JP 2629076 A JP2629076 A JP 2629076A JP S5920592 B2 JPS5920592 B2 JP S5920592B2
- Authority
- JP
- Japan
- Prior art keywords
- solid
- output
- signal
- defect
- sampling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 title claims description 34
- 238000000034 method Methods 0.000 title description 8
- 238000005070 sampling Methods 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 2
- 239000000047 product Substances 0.000 description 6
- 238000007689 inspection Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000015654 memory Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 240000008042 Zea mays Species 0.000 description 1
- 235000005824 Zea mays ssp. parviglumis Nutrition 0.000 description 1
- 235000002017 Zea mays subsp mays Nutrition 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 235000013351 cheese Nutrition 0.000 description 1
- 235000005822 corn Nutrition 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H63/00—Warning or safety devices, e.g. automatic fault detectors, stop-motions ; Quality control of the package
- B65H63/006—Warning or safety devices, e.g. automatic fault detectors, stop-motions ; Quality control of the package quality control of the package
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2701/00—Handled material; Storage means
- B65H2701/30—Handled filamentary material
- B65H2701/31—Textiles threads or artificial strands of filaments
Landscapes
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
Description
【発明の詳細な説明】
本発明は糸条巻物たとえば、パーツ、コーン、チーズ等
表面の欠点検出法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting defects on the surface of yarn rolls such as parts, corn, cheese, etc.
このような糸条巻物を製品として出荷する際には、表面
に製品として不適確な欠点が存在するものは除去する必
要があるために外観検査をおこなつているが、従来から
このような糸条巻物表面に存在する製品として不適確な
欠点を自動的かつ正確に検出および判別する最適な手段
がないために、ほとんどの場合視覚判定に頼つているの
が現状である。When such yarn rolls are shipped as products, appearance inspections are conducted to remove any defects on the surface that make them unsuitable for use as products. Currently, there is no optimal means for automatically and accurately detecting and identifying defects present on the surface of a rolled product that are unsuitable for the product, and thus visual judgment is currently relied on in most cases.
従つて検査工程には多数の熟練したオペレータを必要と
し、また人手に頼つているため作業効率も低く、オペレ
ータの個人差もあり、定量的な品質管理が困難であつた
。本発明者らはかかる現状に鑑み、このような糸条巻物
表面に存在する欠点を検出する方法について光電的に高
速で糸条巻物表面を走査可能な固体カメラに注目し、固
体カメラ出力信号の処理方法について鋭意研究の結果、
特にパーツ等のように複雑な形状の糸条巻物の表面の欠
点をも検出可能な本発明に到達したものである。Therefore, the inspection process requires a large number of skilled operators, and since it relies on manual labor, work efficiency is low, and there are individual differences among operators, making quantitative quality control difficult. In view of the current situation, the present inventors focused on a solid-state camera that can photoelectrically scan the surface of a yarn roll at high speed as a method for detecting such defects existing on the surface of a yarn roll, and developed a method for detecting such defects on the surface of a yarn roll. As a result of intensive research on processing methods,
In particular, the present invention is capable of detecting defects on the surface of yarn rolls of complicated shapes such as parts.
すなわち、本発明は糸条巻物表面の欠点を検出するに際
し、被検査糸条巻物表面に光を照射し、その反射光を固
体カメラで受光し、固体カメラを構成する固体撮像素子
の1走査毎もしくは複数回数の走査毎に各素子出力(V
01〜VOn)をサンプリングし、n回目のサンプリン
グ時の各素子出力(Vn01〜VnOn)とn+1回目
のサンプリング時の各素子出力(Vn+101〜Vn+
10n)とのサンプリング毎の各素子の出力レベル前後
差vno、−vn+1o7、vno2−vn+、02、
・・・ ・・・VnOn−Vn+、Onを求め、いずれ
かの前後差が基準値を越えたとき欠点信号として分離す
るとともに、各サンプリング毎に各素子の出力レベルの
前後差を素子配列方向の一定個数づつ加算し、これを1
素子づつ移動しながら順次求め、各値を基準値と比較し
、いずれかの加算結果が基準信号を越えたとき欠点信号
として分離し、分離された欠点信号の有無で欠点を検出
する糸条巻物表面欠点検出法である。That is, when detecting defects on the surface of a yarn roll, the present invention irradiates the surface of the yarn roll to be inspected with light, receives the reflected light with a solid-state camera, and detects the defects every scan of the solid-state image sensor constituting the solid-state camera. Or each element output (V
01 to VOn), and each element output (Vn01 to VnOn) at the nth sampling and each element output at the n+1st sampling (Vn+101 to Vn+
10n) and the output level difference before and after of each element for each sampling vno, -vn+1o7, vno2-vn+, 02,
...VnOn-Vn+, On is determined, and if any difference before and after exceeds the reference value, it is separated as a defect signal, and at each sampling, the difference between the output levels of each element before and after is calculated in the element arrangement direction. Add a certain number at a time and make this 1
A yarn scroll that sequentially calculates values while moving element by element, compares each value with a reference value, separates it as a defect signal when any addition result exceeds the reference signal, and detects a defect based on the presence or absence of the separated defect signal. This is a surface defect detection method.
このような本発明は糸条巻物の表面に存在する各種欠点
を自動的かつ正確に検出することを可能とするものであ
る。一般に固体カメラとは、フオトセンサをリニア方向
に一列もしくはエリア状に多数配夕!ルてなるイメージ
センサと呼ばれる固体撮像素子を内蔵したTVカメラを
云う。The present invention as described above makes it possible to automatically and accurately detect various defects present on the surface of a yarn roll. In general, a solid-state camera consists of multiple photo sensors arranged in a linear row or in an area. A TV camera with a built-in solid-state image sensor called a solid-state image sensor.
各フオトセンサ、すなわち光電変換部はそれぞれ独立し
ていて、各光電変換部(以下素子と云う)の入射光量に
対応する電気信号出力は、固体撮像素子独特の自已走査
機能により各素子出力が一定の順序で外部へ出力される
。このように外部へ出力されたn個の素子で構成される
固体撮像素子、すなわち固体カメラの各素子の入射光量
に対応する電気信号出力(電圧出力)のうち1番目に続
出される素子出力をVOl,n番目に続出される素子出
力を0nと定義する。以下本発明を添付図面に従つて詳
細に説明する。第1図は本発明の配置例を説明するため
の図であり、被検査糸条巻物1に対向する位置には固体
カメラ3が素子配列方向が該糸条巻物1の糸巻方向とほ
ぼ直角にかつ該糸条巻物の要検査巾全域、たとえばS部
を走査可能なように光学系を調整して配置する。また固
体カメラ3の近傍にはパーツを照明するための光源2,
2′を配置する。光源の光量は固体カメラの光電変換部
出力が飽和しない範囲内で十分に大きくする。このよう
に配置することによつて固体カメラ3の各素子には被検
査糸条巻物1の表面状態に対応する光情報が入力し、電
気信号出力として順次得られる。また被検査糸条巻物1
を矢印で示すように回転させれば固体カメラ3の出力と
して、全表面の状態に対応する電気信号に変換された情
報として得ることができる。ここで用いる固体カメラ3
としては、エリアタイプの固体撮像素子でもよいが、リ
ニアタイプのものが望ましく、また素子数は多い方が望
ましいが、少なくとも糸径よりやや細い分解能があれば
よい。このように固体カメラを用いれば、信号処理の速
度に合わせて走査を制御でき、また素子が独立している
ので読出される情報のアドレスが明確であり、信号処理
回路等の設計の点から好都合である。尚複数回数の走査
毎に各素子出力をサンプリングする具体的方法は次の通
りである。すなわち一般に固体撮像素子を駆動させる為
の基本信号として、スタートパルス信号とクロツクパル
ス信号を入力する。ここでスタートパルス信号は走査の
開始を指示する信号であり、又クロツクパルス信号は走
査信号で、素子数に対応するパルス数の信号を供給する
。スタートパルスは各走査のスタート毎に1つのパルス
を供給する。従つてこのスタートパルスをカウントし、
一定のカウント数毎に各素子出力をA/Dコンバータに
て2値化(デジタル化)した信号からスタートパルス信
号を基準信号としてクロツクパルス信号により、1走査
分の情報をサンプリングするのである。次に第2図は、
固体カメラから取り出される糸条巻物の表面状態に対応
する電気信号情報を処理する処理回路および結果の出力
をおこなう回路の一例を示すプロツクダイヤグラムであ
りカメラコントロールユニツト4によつて制御される固
体カメラ3のアナログ信号出力はバツフア用のアンプ5
を介してA/Dコンバータに供給され、デイジタル信号
に変換される。Each photo sensor, that is, a photoelectric conversion unit, is independent, and the electric signal output corresponding to the amount of incident light of each photoelectric conversion unit (hereinafter referred to as an element) is maintained at a constant level due to the self-scanning function unique to solid-state image sensors. Output to the outside in order. Out of the electric signal outputs (voltage outputs) corresponding to the amount of incident light of each element of the solid-state image sensor, that is, the solid-state camera, which is composed of n elements outputted to the outside in this way, the output of the first successive element is VOl, the nth element output successively output is defined as On. The present invention will be described in detail below with reference to the accompanying drawings. FIG. 1 is a diagram for explaining an example of the arrangement of the present invention, in which a solid-state camera 3 is installed at a position facing the thread roll 1 to be inspected, with the element arrangement direction being approximately perpendicular to the winding direction of the thread roll 1. The optical system is adjusted and arranged so as to be able to scan the entire width of the thread roll to be inspected, for example, the S section. Also, near the solid-state camera 3, a light source 2 for illuminating the parts,
Place 2'. The light intensity of the light source is set to be sufficiently large within a range that does not saturate the output of the photoelectric conversion section of the solid-state camera. With this arrangement, optical information corresponding to the surface condition of the yarn roll 1 to be inspected is input to each element of the solid-state camera 3, and is sequentially obtained as an electrical signal output. In addition, the yarn roll to be inspected 1
If it is rotated as shown by the arrow, it is possible to obtain the output of the solid-state camera 3 as information converted into an electrical signal corresponding to the state of the entire surface. Solid-state camera 3 used here
Although an area type solid-state image sensor may be used, a linear type is preferable, and a large number of elements is preferable, but it is sufficient if the resolution is at least slightly smaller than the thread diameter. Using a solid-state camera in this way allows scanning to be controlled according to the signal processing speed, and since the elements are independent, the address of the information to be read out is clear, which is advantageous from the standpoint of designing signal processing circuits, etc. It is. A specific method for sampling the output of each element every multiple times of scanning is as follows. That is, generally, a start pulse signal and a clock pulse signal are input as basic signals for driving the solid-state image sensor. Here, the start pulse signal is a signal instructing the start of scanning, and the clock pulse signal is a scanning signal, which supplies a signal with a number of pulses corresponding to the number of elements. The start pulse provides one pulse at the start of each scan. Therefore, count this start pulse,
Information for one scan is sampled by a clock pulse signal using a start pulse signal as a reference signal from a signal obtained by binarizing (digitizing) each element output by an A/D converter every fixed count. Next, Figure 2 shows
This is a block diagram showing an example of a processing circuit that processes electrical signal information corresponding to the surface condition of a yarn roll taken out from a solid-state camera, and a circuit that outputs the results, and the solid-state camera is controlled by a camera control unit 4. 3 analog signal output is buffer amplifier 5
The signal is supplied to the A/D converter via the A/D converter and converted into a digital signal.
ここで用いるA/Dコンバータ6は6〜8ビツトのもの
でよい。次いで該回路出力は素子数に対応する個数のメ
モリーをシリアルに配列してなるシフトレジスタ8に送
られ、1番目の1走査ライン分(固体カメラによつて走
査される1ラインを云い、第1図の1点鎖線部分がその
一例である)の情報V,Ol〜,0nを一旦蓄積する。
次に糸条巻物1を回転させることによつて、各素子の糸
条巻物表面の走査位置は2番目の走査位置に移りこのと
きの1番目の素子出力V2O,がレジスタ8に送られる
ことによつてレジスタ8からは1番目の素子情報V,O
,がオーバフロして取り出され減算回路10へ供給され
る。このとき1番目の素子出力V2O,はゲ゛一ト9を
開くことによつて減算回路10へ供給される。減算回路
10ではこの2つの情報の差,01−V2Ol,,O2
−V2O2,・・・・・・・・・。−10n−VnOO
を算出するものである。すなわちこのようにして全素子
の時間軸方向の出力の前後差を順次算出し、その結果は
判別回路11へ順次供給される。該判別回路11は予め
欠点の許容限界に設定した基準値と個々の情報とを比較
し、許容限界を越えた場合のみ欠点信号を出力する。こ
のように各素子について時間軸方向の前後差処理は点型
の欠点あるいは素子配列方向に長い線型の欠点がシヤー
プに分離できる。一方減算回路10の時間軸方向の各素
子の前後差は順次パラレルに配置された4個のエリアを
持つシフトレジスタ12に供給され、まず該レジスタ1
2では最初1〜4番目の情報が全エリアに入力されると
、個々の情報は加算回路13に送られ、全情報の和が算
出されその結果は判別回路14に送られる。The A/D converter 6 used here may be of 6 to 8 bits. Next, the circuit output is sent to a shift register 8 which is formed by serially arranging a number of memories corresponding to the number of elements, and is sent to a shift register 8 which is formed by serially arranging memories corresponding to the number of elements. The information V, Ol~, On (of which the one-dot chain line in the figure is an example) is temporarily stored.
Next, by rotating the thread roll 1, the scanning position of the thread roll surface of each element moves to the second scanning position, and the first element output V2O at this time is sent to the register 8. Therefore, from register 8, the first element information V, O
, is taken out after overflowing and is supplied to the subtraction circuit 10. At this time, the first element output V2O is supplied to the subtraction circuit 10 by opening the gate 9. The subtraction circuit 10 calculates the difference between these two pieces of information, 01−V2Ol,,O2
-V2O2,... -10n-VnOO
is calculated. That is, in this way, the differences between the outputs of all the elements in the time axis direction are sequentially calculated, and the results are sequentially supplied to the discrimination circuit 11. The discrimination circuit 11 compares each piece of information with a reference value set in advance as an allowable limit for defects, and outputs a defect signal only when the allowable limit is exceeded. In this manner, point-type defects or long-line defects in the element arrangement direction can be sharply separated by the front-back difference processing in the time axis direction for each element. On the other hand, the difference between each element in the time axis direction of the subtraction circuit 10 is sequentially supplied to a shift register 12 having four areas arranged in parallel.
2, when the first to fourth pieces of information are first input to all areas, the individual pieces of information are sent to the adder circuit 13, the sum of all the pieces of information is calculated, and the result is sent to the discrimination circuit 14.
また5番目の情報により1番目の情報のみがクリアーさ
れ、2〜5番目の情報を加算回路13で加算する。この
ようにして順次取り込むと同時に古い情報を順次クリア
ーしながらそのつど4個の情報の和(以下移動和と称す
)を算出する。次に判別回路14に送られてくる個々の
移動和はあらかじめ欠点の許容限界に設定した基準移動
和と順次比較し許容限界を越えた場合のみ欠点として信
号出力する。このような前後差の素子配列方向について
の移動差処理によりたとえば汚れが検査巾方向に徐々に
濃くなつているような面積型の欠点がシヤープに分離で
きる。このように2種類の信号処理により糸条巻物表面
の濃度変化で表われる欠点のすべてを分離することが可
能となる。Further, only the first information is cleared by the fifth information, and the second to fifth information are added by the addition circuit 13. In this way, the sum of the four pieces of information (hereinafter referred to as moving sum) is calculated each time while sequentially fetching and clearing old information. Next, each moving sum sent to the discrimination circuit 14 is sequentially compared with a reference moving sum set in advance as an allowable limit for defects, and only when the allowable limit is exceeded, a signal is output as a defect. By performing such differential movement processing in the element arrangement direction of the front and back differences, it is possible to sharply separate area-type defects, such as dirt that gradually becomes darker in the inspection width direction, for example. In this way, by using two types of signal processing, it is possible to separate all the defects that appear in the density changes on the surface of the yarn roll.
なおコントローラ7はカメラコントローラ4からの走査
パルス、およびスタートパルスおよびエンドパルスに基
ずきレジスタ8および12へのデータの繰込みならびに
ゲート9の制御を行なうためのロジツク回路である。次
に判別回路11の前後差計算による欠点信号と前後差の
移動和計算による欠点信号は、たとえばアラーム機構1
5に送られいずれかの処理回路で製品としての許容限界
を越えた欠点が検出されれば不良品として表示をおこな
う。尚このようにして欠点信号が分離できれば、アラー
ムのみならず欠点糸条巻物へのマーキング、あるいは欠
点糸条巻物のラインからの除去などの制御信号として用
いることも可能であり、また、欠点信号をコンピユータ
等へ入力することによつて品種別の欠点の信号の集計あ
るいは解析などをも実施することも可能となる。以上の
ように本発明は糸条巻物の検査工程の自動化及び品質管
理の定量化に寄与するものであり、その効果は極めて多
大である。The controller 7 is a logic circuit for loading data into the registers 8 and 12 and controlling the gate 9 based on the scanning pulse, start pulse, and end pulse from the camera controller 4. Next, the defect signal obtained by calculating the front and rear difference in the discrimination circuit 11 and the defect signal obtained by calculating the moving sum of the front and rear difference are, for example, generated by the alarm mechanism 1
5, and if any processing circuit detects a defect exceeding the allowable limit for the product, it is displayed as a defective product. If the defect signal can be separated in this way, it can be used not only as an alarm but also as a control signal for marking defective yarn rolls or removing defective yarn rolls from the line. By inputting the signals to a computer or the like, it is also possible to aggregate or analyze signals of defects by product type. As described above, the present invention contributes to the automation of the inspection process of yarn rolls and the quantification of quality control, and its effects are extremely large.
第1図は本発明の装置配置例を示す説明図であり、1は
被検査糸条巻物、2,2′は光源、3は固体カメラ、S
は検査巾をそれぞれ示し、第2図は本発明の構成例を示
すプロツクダイヤグラムで・あり、3′は固体カメラの
光電変換部、4はカメラコントローラ、5はバツフア、
6はA/Dコンバータ、7はコントローラ、8はシフト
レジスタ、9はゲート、10は減算回路、11は判別回
路、12はシフトレジスタ、13は加算回路、14は判
別回路、15は表示回路をそれぞれ示す。FIG. 1 is an explanatory diagram showing an example of the arrangement of the apparatus of the present invention, in which 1 is a yarn roll to be inspected, 2 and 2' are light sources, 3 is a solid-state camera, and S
2 shows an inspection width, and FIG. 2 is a program diagram showing an example of the configuration of the present invention, where 3' is a photoelectric conversion section of a solid-state camera, 4 is a camera controller, 5 is a buffer,
6 is an A/D converter, 7 is a controller, 8 is a shift register, 9 is a gate, 10 is a subtraction circuit, 11 is a discrimination circuit, 12 is a shift register, 13 is an addition circuit, 14 is a discrimination circuit, and 15 is a display circuit. Each is shown below.
Claims (1)
巻物表面に光を照射し、その反射光を固体カメラで受光
し、固体カメラを構成する固体撮像素子の1走査毎もし
くは複数回数の走査毎に各素子出力(VO_1〜VOn
)をサンプリングし、n回目のサンプリング時の各素子
出力(VnO_1〜VnOn)とn+1回目のサンプリ
ング時の各素子出力(V_n_+_1O_1〜V_n_
+_1O_n)とのサンプリング毎の各素子の出力レベ
ル前後差V_nO_1−V_n_+_1O_1,V_n
O_2−V_n_+_1O_2,……V_nO_n−V
_n_+_1O_nを求め、いずれかの前後差が基準値
を越えたとき欠点信号として分離するとともに、各サン
プリング毎に各素子の出力レベルの前後差を素子配列方
向の一定個数づつ加算し、これを1素子づつ移動しなが
ら順次求め、各値を基準値と比較し、いずれかの加算結
果が基準信号を越えたとき欠点信号として分離し、分離
された欠点信号の有無で欠点を検出する糸条巻物表面欠
点検出法。1. When detecting defects on the surface of a yarn roll, the surface of the yarn roll to be inspected is irradiated with light, the reflected light is received by a solid-state camera, and the solid-state image sensor constituting the solid-state camera is scanned every scan or multiple times. Each element output (VO_1 to VOn
), and each element output (VnO_1 to VnOn) at the nth sampling and each element output at the n+1st sampling (V_n_+_1O_1 to V_n_
+_1O_n) and the difference in output level of each element for each sampling V_nO_1-V_n_+_1O_1,V_n
O_2-V_n_+_1O_2,...V_nO_n-V
_n_+_1O_n is determined, and when any difference before and after exceeds the reference value, it is separated as a defect signal, and at each sampling, the difference between the output levels of each element before and after is added by a fixed number in the element arrangement direction, and this is added to one element. The surface of the yarn roll is sequentially obtained while moving one by one, and each value is compared with a reference value. When any of the addition results exceeds the reference signal, it is separated as a defect signal, and a defect is detected by the presence or absence of the separated defect signal. Defect detection method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2629076A JPS5920592B2 (en) | 1976-03-11 | 1976-03-11 | Method for detecting defects on the surface of yarn rolls |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2629076A JPS5920592B2 (en) | 1976-03-11 | 1976-03-11 | Method for detecting defects on the surface of yarn rolls |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52110951A JPS52110951A (en) | 1977-09-17 |
| JPS5920592B2 true JPS5920592B2 (en) | 1984-05-14 |
Family
ID=12189159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2629076A Expired JPS5920592B2 (en) | 1976-03-11 | 1976-03-11 | Method for detecting defects on the surface of yarn rolls |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5920592B2 (en) |
-
1976
- 1976-03-11 JP JP2629076A patent/JPS5920592B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52110951A (en) | 1977-09-17 |
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