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JPS592180B2 - hand dryer - Google Patents
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JPS592180B2 - hand dryer - Google Patents

hand dryer

Info

Publication number
JPS592180B2
JPS592180B2 JP50119749A JP11974975A JPS592180B2 JP S592180 B2 JPS592180 B2 JP S592180B2 JP 50119749 A JP50119749 A JP 50119749A JP 11974975 A JP11974975 A JP 11974975A JP S592180 B2 JPS592180 B2 JP S592180B2
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
circuit
resistor
same
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP50119749A
Other languages
Japanese (ja)
Other versions
JPS5244178A (en
Inventor
邦夫 関
良三 紺谷
良雄 坂本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50119749A priority Critical patent/JPS592180B2/en
Publication of JPS5244178A publication Critical patent/JPS5244178A/en
Publication of JPS592180B2 publication Critical patent/JPS592180B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Description

【発明の詳細な説明】 本発明は半導体集積回路装置に関する。[Detailed description of the invention] The present invention relates to a semiconductor integrated circuit device.

同一回路、同一外形で最大走路や電気的特性が多少異な
る同系列の半導体集積回路装置においては、これらの異
なる品種の半導体集積回路装置が組立封止後に混入した
場合、従来行なわれている交流、直流テストだけでは精
度の良い分類が不可能である。
For semiconductor integrated circuit devices of the same series with the same circuit and the same external shape but slightly different maximum running paths and electrical characteristics, if these different types of semiconductor integrated circuit devices are mixed after assembly and sealing, the conventional AC, Accurate classification is not possible using DC testing alone.

このことは、例えば耐圧試験で分類しようとしても、耐
圧特性が多少高めのロッドでは耐圧特性が上位ランクの
品種の規格を満足する場合があるからである。5 した
がつて、本発明の目的とすることは、同一性を有する回
路、同一形状で品種が異なる半導体集積回路装置の混入
を容易に判別することができる半導体集積回路装置を提
供することにある。
This is because, for example, even if an attempt is made to classify the rods by a pressure resistance test, a rod with somewhat higher pressure resistance characteristics may meet the standards for a product with a higher pressure resistance characteristic. 5. Therefore, an object of the present invention is to provide a semiconductor integrated circuit device that can easily distinguish between identical circuits and semiconductor integrated circuit devices of the same shape but of different types. .

上記目的を達成するための本発明の基本的構成10は、
少なくとも外部端子からみた回路構成が同一であつて、
同一外形を有し品種の異なる複数個の半導体集積回路装
置において、上記半導体集積回路装置のそれぞれに回路
動作に影響を及ぼさない素子であつて、品種毎に異なる
素子特性を有する15ものを外部端子より測定可能な位
置に内蔵してなることを特徴とするものである。以下、
実施例にそつて図面を参照し、本発明を具体的に説明す
る。
The basic structure 10 of the present invention for achieving the above object is as follows:
At least the circuit configuration as seen from the external terminal is the same,
In a plurality of semiconductor integrated circuit devices having the same external shape and different types, 15 elements that do not affect the circuit operation of each of the semiconductor integrated circuit devices and have different element characteristics depending on the type are connected to external terminals. It is characterized by being built in a position where measurements can be made more easily. below,
The present invention will be specifically described with reference to embodiments and the drawings.

第1図は本発明を音響機器の出力用半導体集積20回路
、いわゆるパワーエCに適用した場合の一例を示す回路
図である。
FIG. 1 is a circuit diagram showing an example of the case where the present invention is applied to 20 semiconductor integrated circuits for outputting audio equipment, so-called Power E-C.

トランジスタQ1、Q2およびQ3からなる差動増幅回
路により構成された初段増幅部と、その出力がトランジ
スタQ4、Q5からなるエミッタ25フォロワ出力回路
を介して印加されるトランジスタQ6、Q7により構成
された駆動回路と、この駆動回路により駆動されるトラ
ンジスタQ8〜Qllによるプッシュプル出力増回路と
により構成された半導体集積回路において、外付される
ブートス30 トラップ抵抗が接続されるべき設けられ
た外部端子G、H間に、各品種毎に例えばIKΩ、2に
Ω、4にΩ・ ・ ・ ・の値を有する抵抗R、Oを半
導体集積回路に内蔵させる。
A first-stage amplification section made up of a differential amplification circuit made up of transistors Q1, Q2, and Q3, and a drive made up of transistors Q6 and Q7 whose output is applied via an emitter 25 follower output circuit made up of transistors Q4 and Q5. In a semiconductor integrated circuit constituted by a circuit and a push-pull output multiplier circuit including transistors Q8 to Qll driven by this drive circuit, an external terminal G to which an externally attached bootstrap resistor is connected; Between H, resistors R and O having values of, for example, IKΩ, 2Ω, 4Ω, etc. for each type are built into the semiconductor integrated circuit.

上記端子G、H間には、通常100Ω程度のブートスト
ラップ抵抗が接続され35るものであるため、これと並
列に接続される上記各品種を示す抵抗R1oの値をIK
Ω以上にしておけば、上記抵抗R1oを設けても回路動
作には何ら影響を及ぼす心配はない。各品種を分類する
にあたり、上記抵抗R,lを測定することにより、容易
にかつ精度よく行なうことができる。したがつて、品種
を表示せしめるための素子、例えば拡散抵抗を用いると
きは、その抵抗値のバラツキを考慮して設定する必要が
ある。そして、この素子は外部端子より容易に測定でき
る位置に内蔵する必要がある。各品種を表示するための
素子は何んであつてもよいが、上記実施例に示すように
抵抗を用いることが、半導体集積回路に内蔵でき、しか
も測定しやすい点ですぐれている。
Since a bootstrap resistor of about 100Ω is usually connected between the terminals G and H above, the value of the resistor R1o that is connected in parallel with this and indicates each of the above types is IK.
If it is set to Ω or more, there is no fear that the provision of the resistor R1o will have any effect on the circuit operation. Classification of each product type can be easily and accurately performed by measuring the resistances R and l. Therefore, when using an element for displaying the product type, such as a diffused resistor, it is necessary to take into account the variation in the resistance value when setting the element. This element needs to be built in at a location where it can be easily measured from the external terminal. Although any element may be used to indicate each product type, using a resistor as shown in the above embodiment is advantageous in that it can be built into a semiconductor integrated circuit and is easy to measure.

このように抵抗を用いるときは、外部抵抗を接続するた
めに設けられた外部端子が、上記品種を表示する抵抗を
内蔵する目安となる。パワーさしであれば、前記説明し
たようなブートストラツプ抵抗がそれであり、デイジタ
ル回路、例えばECL回路においては、第2図に示すよ
うなNOR回路においては、外部端子7,6間には外部
にエミツタフオロワ出力回路用のエミツタ、抵抗が通常
接続され、その値は50Ω程度である。したがつて、各
品種毎に1KΩ,2KΩ・・ 程度の抵抗Rl7を半導
体集積回路に内蔵すればよい。本発明は、外部端子から
みた回路構成が同一、外形が同一で品種の異なる半導体
集積回路に広く適用できる。
When using a resistor in this way, the external terminal provided for connecting the external resistor serves as a guide for incorporating the resistor that indicates the type. If it is a power source, it is the bootstrap resistor as explained above.In a digital circuit, for example, an ECL circuit, in a NOR circuit as shown in FIG. An emitter for the emitter follower output circuit and a resistor are usually connected, and the value thereof is about 50Ω. Therefore, it is sufficient to incorporate a resistor Rl7 of about 1KΩ, 2KΩ, etc. into the semiconductor integrated circuit for each type. The present invention can be widely applied to semiconductor integrated circuits of different types with the same circuit configuration and the same external shape as seen from external terminals.

【図面の簡単な説明】[Brief explanation of drawings]

第1図、第2図はそれぞれ本発明の一実施例を示す回路
図である。 Q,〜Q,7・・・トランジスタ、R1〜Rl7・・・
抵抗、A1〜A6・・・ダイオード、A−H,I−B・
・・外部端子。
FIG. 1 and FIG. 2 are circuit diagrams each showing an embodiment of the present invention. Q, ~Q,7...Transistor, R1~Rl7...
Resistance, A1-A6...Diode, A-H, I-B.
...External terminal.

Claims (1)

【特許請求の範囲】[Claims] 1 回路構成が同一又は類似であつて、同一又は類似の
外形を有した品種の異なる複数個の半導体集積回路装置
において、品種毎に相違する素子特性を有するとともに
その素子特性の相違が上記半導体集積回路装置のそれぞ
れの回路動作に本質的に悪影響を及ぼさない素子をその
外部端子より測定可能な位置でその半導体集積回路装置
内部に内蔵してなることを特徴とする品種の異なる複数
個の半導体集積回路装置。
1. In a plurality of semiconductor integrated circuit devices of different types with the same or similar circuit configuration and the same or similar external shape, each type has different element characteristics, and the difference in element characteristics is different from the above semiconductor integrated circuit device. A plurality of semiconductor integrated circuit devices of different types, characterized in that elements that do not essentially adversely affect the operation of each circuit of the circuit device are built into the semiconductor integrated circuit device at a position that can be measured from its external terminal. circuit device.
JP50119749A 1975-10-06 1975-10-06 hand dryer Expired JPS592180B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50119749A JPS592180B2 (en) 1975-10-06 1975-10-06 hand dryer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50119749A JPS592180B2 (en) 1975-10-06 1975-10-06 hand dryer

Publications (2)

Publication Number Publication Date
JPS5244178A JPS5244178A (en) 1977-04-06
JPS592180B2 true JPS592180B2 (en) 1984-01-17

Family

ID=14769185

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50119749A Expired JPS592180B2 (en) 1975-10-06 1975-10-06 hand dryer

Country Status (1)

Country Link
JP (1) JPS592180B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5622973A (en) * 1979-08-01 1981-03-04 Hitachi Ltd Discriminating device
JPS56157874A (en) * 1980-05-09 1981-12-05 Toshiba Corp Measuring method of characteristics of semiconductor device
JPS63122242A (en) * 1986-11-12 1988-05-26 Nec Corp How to configure a master-slice integrated circuit
JPH08274176A (en) * 1995-03-30 1996-10-18 Nec Corp Semiconductor device

Also Published As

Publication number Publication date
JPS5244178A (en) 1977-04-06

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