JPS5925964B2 - Temperature measurement device using resistance thermometer - Google Patents
Temperature measurement device using resistance thermometerInfo
- Publication number
- JPS5925964B2 JPS5925964B2 JP13665279A JP13665279A JPS5925964B2 JP S5925964 B2 JPS5925964 B2 JP S5925964B2 JP 13665279 A JP13665279 A JP 13665279A JP 13665279 A JP13665279 A JP 13665279A JP S5925964 B2 JPS5925964 B2 JP S5925964B2
- Authority
- JP
- Japan
- Prior art keywords
- resistance
- temperature
- output
- sensor
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Description
【発明の詳細な説明】
本発明は舶用機関等の温度を測定・監視する装置に開す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention is directed to an apparatus for measuring and monitoring the temperature of marine engines and the like.
従来、白金等の測温抵抗体センサによる温度の測定は、
測定点毎に、測温抵抗体をその一辺に配したブリッジ回
路を組みその出力を増巾し、次の(ハ式の近似式に基い
て、折線方式又はブリッジアンプ出力をゲインヘフイー
ドバツクする方式のリニアライスによつて測定温度値を
得ていた。Conventionally, temperature measurements using resistance temperature sensors such as platinum,
For each measurement point, construct a bridge circuit with a temperature sensing resistor on one side, amplify its output, and use the following (C) approximation formula to feedback the output of the bridge amplifier to the gain using the linear method or the bridge circuit. The measured temperature values were obtained by the linear rice method.
第1図はフィードバック式のブリッジリニアライス回路
の代表的な例を示す接続図である。温度Tのときの測温
抵抗体の抵抗値には第1式となる。に=に0(1+αT
+βT2) ・・・(1)但し roは測温抵抗体の初
期抵抗値、α、βは0〜600℃のときα■3.98×
10−、β=−6.13×10−7である。しかし、こ
れらの場合は次のような欠点がある。FIG. 1 is a connection diagram showing a typical example of a feedback type bridge linear rice circuit. The resistance value of the temperature measuring resistor when the temperature is T is expressed by the first equation. to=to0(1+αT
+βT2) ... (1) However, ro is the initial resistance value of the resistance temperature detector, α and β are α■3.98× at 0 to 600℃
10−, β=−6.13×10−7. However, these cases have the following drawbacks.
(1)一測定点毎に、比較的高精度高安定の要求される
ブリッジ用の抵抗素子とブリッジ出力を増巾するブリッ
ジアンプ回路及び測定点の温度と出力値の対応を線型化
するリニアライス回路とのハードウェアを必要とする。
(2)ブリッジアンプ回路及びリニアライス回路の初期
調整と経時変化の補正という作業が必要である。(1) For each measurement point, a bridge resistor element that requires relatively high precision and high stability, a bridge amplifier circuit that amplifies the bridge output, and a linear rice that linearizes the correspondence between the temperature of the measurement point and the output value. Requires circuit and hardware.
(2) Initial adjustment of the bridge amplifier circuit and linear rice circuit and correction of changes over time are required.
特に測定点数の大きな場合には・・−ドウエアコストと
調整時間とが莫大になわ、又測定の信頼性、安定性も低
下する。本発明は、これらの欠点を除去するため、一測
定点あたわに必要なハードウェアを基準抵抗素子一個に
まで単純化し、必要になる各種の補正は、線路抵抗・周
囲温度・基準電圧値等の補正用データを別途得ることに
よつて、演算処理し、所定の精度の温度測定値を求める
ものである。Particularly when the number of measurement points is large, the hardware cost and adjustment time are enormous, and the reliability and stability of the measurement are also reduced. In order to eliminate these drawbacks, the present invention simplifies the hardware required per measurement point to one reference resistance element, and makes various necessary corrections based on line resistance, ambient temperature, reference voltage value, etc. By separately obtaining correction data, arithmetic processing is performed to obtain a temperature measurement value with a predetermined accuracy.
以下本発明の実施例についてそのハードウェア構成、白
金測温抵抗体の温度抵抗関係式の導入、各誤差項の分析
、補正演算処理と精度について詳細に説明する。Hereinafter, the hardware configuration of the embodiment of the present invention, the introduction of the temperature resistance relational expression of the platinum resistance temperature sensor, the analysis of each error term, the correction calculation process, and the accuracy will be described in detail.
第2図は本発明の一実施に係る温度測定監視装置全体の
概略系統図を示す。FIG. 2 shows a schematic system diagram of the entire temperature measurement and monitoring device according to one embodiment of the present invention.
複数の測温抵抗体にからの信号(dフロントエンド部2
を介して、周囲温度測定用のtセンサ3・基準電圧測定
用のVセンサ4からの信号とともにマルチプレクサ(M
PX)5で選択され、ADコンバータ6によつてデジタ
ル値に変換される。演算処理回路7でぱリニアライスと
各種補正処理により測定温度値を演算し、プリンタ8に
その結果を出力する。第3図に一測定点あたDのフロン
トエンド部を示す。Signals from multiple resistance temperature detectors (d front end section 2
A multiplexer (M
PX) 5 and converted into a digital value by the AD converter 6. The arithmetic processing circuit 7 calculates the measured temperature value by linear rice processing and various correction processes, and outputs the result to the printer 8. FIG. 3 shows the front end section of D per measurement point.
基準電源Vから基準抵抗Rを介して測温抵抗体rに電流
を流し、線路抵抗a−a″,cmc″を含む、全電圧降
下分Vrと線路抵抗cmc′のみによる電圧降下分vδ
の二信号を一測定点毎に計測する。第4図は、基準電源
電圧Vの変動△Vを検出するための、温度特性のマツチ
した抵抗素子Rl,R2による単純な抵抗分割回路図で
ある。When a current is passed from the reference power supply V to the temperature sensing resistor r via the reference resistor R, the total voltage drop Vr including the line resistance a-a'', cmc'' and the voltage drop due only to the line resistance cmc' vδ
Two signals are measured at each measurement point. FIG. 4 is a simple resistance division circuit diagram using resistance elements Rl and R2 with matched temperature characteristics for detecting a variation ΔV in the reference power supply voltage V.
基準抵抗の温度係数に起因する測定値誤差を補正するた
めの周囲温度値tは、常温域でのみ、要求される分解能
とリニアリテイを有する電流出力型の詰度センサC等を
利用して得る。The ambient temperature value t for correcting the measurement value error caused by the temperature coefficient of the reference resistance is obtained using a current output type clogging sensor C or the like having the required resolution and linearity only in the room temperature range.
第5図はその一例を示す回路図である。抵抗値から温度
を導くにあたつて、(1)式では実特性に対してまだ誤
差が大きく、特に高温側で0.5℃以上の近似誤差を有
するので補正しようとする値と同程度となり各誤差要因
をこまかく補正していくためのベースとなる温度一抵抗
関係式としては精度が不充分である。FIG. 5 is a circuit diagram showing an example thereof. When deriving the temperature from the resistance value, equation (1) still has a large error in relation to the actual characteristics, especially on the high temperature side, which has an approximation error of 0.5°C or more, so the value to be corrected is about the same. The accuracy is insufficient as a temperature-resistance relational expression that serves as the basis for finely correcting each error factor.
従つて、この高温領域での近似精度を改善するため、三
角関係を含む双曲線によつて近似をおこなう次の関係式
を導入する。TllO
〜600℃の場合 A=2444.060ΩB−137
63660Ω・℃C=5871.705℃
Z=0.26rc
この結果、実特性との差はO〜400℃で0.05℃以
下400〜600℃で0.08゜C以下となる。Therefore, in order to improve the approximation accuracy in this high temperature region, we introduce the following relational expression that performs approximation using a hyperbola including trigonometric relationships. TllO ~ 600℃ A=2444.060ΩB-137
63660Ω·°C C=5871.705°C Z=0.26rc As a result, the difference from the actual characteristics is 0.05°C or less at 0 to 400°C and 0.08°C or less at 400 to 600°C.
式(2−1),(2−2)に基づいて測定温度Tを求め
るとき、実際の変数rは基準電圧V,基準抵抗R,取得
データVr,vδによつて定まる。When determining the measured temperature T based on equations (2-1) and (2-2), the actual variable r is determined by the reference voltage V, reference resistance R, and acquired data Vr and vδ.
従つて式(2−2)は変数変換されて第3式となる。T
A=f(r)=G(V,R,vδ,Vr) ・・−・
・・(3)ここで誤差要因として、基準電源変動DV,
基準抵抗の初期偏差DRi,基準抵抗の周囲温度による
変動DRt,線路抵抗による電位Dvδを考慮するとと
なる。Therefore, equation (2-2) is converted into variables and becomes the third equation. T
A=f(r)=G(V,R,vδ,Vr)...
...(3) Here, as error factors, reference power supply fluctuation DV,
Considering the initial deviation DRi of the reference resistance, the variation DRt of the reference resistance due to the ambient temperature, and the potential Dvδ due to the line resistance.
実際の補正演算は次の手順で実行される。The actual correction calculation is performed in the following steps.
まづDvδ,dにAD変換のフアクタを乗じたものとし
て?=2000>(DvδμV二2000×DVを各々
定義する。First, as Dvδ,d multiplied by the AD conversion factor? =2000>(DvδμV22000×DV are defined respectively.
次にDRtを定める周囲温度については、tセンサデー
タの25℃からの偏差、抵抗の温度係数、その初期偏差
を分解能均一化のため、各々32X△T,lO′5×β
,101×△Rという値に置きかえる。この結果補正式
(4−2)は実際のデジタル演算上有利な各項の寄与の
バランスがとれた次の形となる。DT−kδ・?+Kv
−ベ什KRi・球+KRt・β・Δt・・・各係数は
(5−1)但し 引R′
A=2.3041475×104N−(A+RO)/A
=1.40915526x=2000Xv前述の諸式に
基づいて測定慌度Tを定める処理はマイクロコン程度の
演算処理装置によシ以下の手順で行う。Next, regarding the ambient temperature that determines DRt, the deviation of the t sensor data from 25°C, the temperature coefficient of resistance, and its initial deviation are determined to be 32X△T, lO'5×β, respectively, in order to equalize the resolution.
, 101×ΔR. As a result, the correction formula (4-2) has the following form in which the contribution of each term, which is advantageous in actual digital calculations, is balanced. DT-kδ・? +Kv
- Base KRi・Sphere+KRt・β・Δt...Each coefficient is
(5-1) However, pull R'
A=2.3041475×104N-(A+RO)/A
= 1.40915526 x = 2000
(1)係数kδ,Kv,kRi,kRtについては、そ
の都度演算するのではなく、0〜600℃の範囲で0.
3℃程度の精度を得るためXに関して128ステツプ毎
に係数表をメモリ上に設定する。(1) The coefficients kδ, Kv, kRi, kRt are not calculated each time, but are 0.
In order to obtain an accuracy of about 3°C, a coefficient table is set in memory for every 128 steps regarding X.
(2)使用する抵抗素子からβ,△Rの表をメモリード
に設定する。(3)上記の数値表から16BITの乗算
及び和算によりDTを定める。(2) Set the table of β and ΔR from the resistance element to be used in the memory. (3) Determine DT from the above numerical table by multiplication and summation of 16 BIT.
(4) TOについてはXに関して1ステツプ毎の表を
メモリ上に設定する。(4) For TO, set a table for each step regarding X in memory.
(5) TO.l!:DTとの和により最終的な測定婦
度値Tを定める。(5) T.O. l! : Determine the final measured feminine power value T by the sum with DT.
(6)最終的な精度としては(2−1),(2−2)式
の孟度一抵抗関係式の近似精度と補正演算精度の和とし
て約0.4℃の精度が得られる。(6) As for the final accuracy, an accuracy of about 0.4° C. is obtained as the sum of the approximation accuracy of the degree-resistance relational expression of equations (2-1) and (2-2) and the correction calculation accuracy.
以上説明したように測.扁抵抗体による温度測定が複雑
なブリツジ回路・リニアライス回路等を用いることなく
、一測定点当りきわめて簡単な・・−トウエアと、一括
補正処理用には低価格マイクロコンピユータと小容量の
メモリ程度によつて、十分実用的なサンプリング速度で
、正確に実現できるから、臂度計測装置を単純.小型化
でき、特に多点計測の揚合効果が著しい。さらに無調整
であるから製作工程の簡単化と長期にわたる測定の信頼
性が得られる。Measure as explained above. Temperature measurement using a flat resistor is extremely simple per measurement point without using complicated bridge circuits, linear rice circuits, etc. - All it takes is a low-cost microcomputer and a small amount of memory for batch correction processing. This makes it possible to achieve accurate measurement at a sufficiently practical sampling rate, which simplifies the arm measurement device. It can be made smaller and has a particularly significant effect on multi-point measurement. Furthermore, since no adjustment is required, the manufacturing process is simplified and long-term measurement reliability is achieved.
【図面の簡単な説明】
第1図は従来の温度測定装置のフロントエンド部の接続
図。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a connection diagram of the front end of a conventional temperature measuring device.
Claims (1)
列接続される基準抵抗と、該基準抵抗と前記測温抵抗体
に電圧を印加する基準電圧源及びケーブルと、該基準電
圧源の電圧変動を検出するVセンサと、周囲温度を測定
するtセンサと、前記複数の測温抵抗体の電圧降下(v
r)及び前記ケーブルの電圧降下(vδ)を順次切換え
て検出し、前記tセンサ出力及びVセンサ出力と共に出
力するマルチプレクサと、該マルチプレクサの各出力を
AD変換するADコンバータと、該ADコンバータ出力
を補正係数を記憶したメモリを用いて三角関数を含む双
曲線近似演算する演算装置とを有することを特徴とする
温度測定装置。1. A plurality of resistance temperature detectors, a reference resistor connected in series to each of the resistance temperature detectors, a reference voltage source and cable that apply a voltage to the reference resistance and the resistance temperature detector, and the reference voltage source. a V sensor that detects voltage fluctuations, a t sensor that measures ambient temperature, and a voltage drop (v
r) and the voltage drop (vδ) of the cable by sequentially switching and detecting the voltage drop (vδ) and outputting it together with the t sensor output and the V sensor output, an AD converter that AD converts each output of the multiplexer, and an AD converter that converts each output of the multiplexer into an AD converter; A temperature measuring device comprising: an arithmetic device that performs hyperbolic approximation calculations including trigonometric functions using a memory that stores correction coefficients.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13665279A JPS5925964B2 (en) | 1979-10-23 | 1979-10-23 | Temperature measurement device using resistance thermometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13665279A JPS5925964B2 (en) | 1979-10-23 | 1979-10-23 | Temperature measurement device using resistance thermometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5660327A JPS5660327A (en) | 1981-05-25 |
| JPS5925964B2 true JPS5925964B2 (en) | 1984-06-22 |
Family
ID=15180329
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13665279A Expired JPS5925964B2 (en) | 1979-10-23 | 1979-10-23 | Temperature measurement device using resistance thermometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5925964B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0664678B2 (en) * | 1985-03-01 | 1994-08-22 | 三菱電機株式会社 | Analog input device |
-
1979
- 1979-10-23 JP JP13665279A patent/JPS5925964B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5660327A (en) | 1981-05-25 |
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