JPS5932167B2 - impurity gas trap - Google Patents
impurity gas trapInfo
- Publication number
- JPS5932167B2 JPS5932167B2 JP57173242A JP17324282A JPS5932167B2 JP S5932167 B2 JPS5932167 B2 JP S5932167B2 JP 57173242 A JP57173242 A JP 57173242A JP 17324282 A JP17324282 A JP 17324282A JP S5932167 B2 JPS5932167 B2 JP S5932167B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- container
- aluminum
- heater
- purified
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000012535 impurity Substances 0.000 title claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 16
- 229910052782 aluminium Inorganic materials 0.000 claims description 15
- 239000007787 solid Substances 0.000 claims description 6
- 239000007789 gas Substances 0.000 description 24
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 8
- 239000001301 oxygen Substances 0.000 description 8
- 229910052760 oxygen Inorganic materials 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000000746 purification Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- -1 AlGaAs Chemical compound 0.000 description 1
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 230000008929 regeneration Effects 0.000 description 1
- 238000011069 regeneration method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Gas Separation By Absorption (AREA)
- Drying Of Gases (AREA)
Description
【発明の詳細な説明】 本発明は半導体工業等に必要な純正ガス(酸素。[Detailed description of the invention] The present invention uses pure gas (oxygen) necessary for the semiconductor industry, etc.
水素等の不純物を含まないガス)を得ることのできるガ
ス純化装置としての不純物ガストラップに関する。The present invention relates to an impurity gas trap as a gas purification device capable of obtaining a gas containing no impurities such as hydrogen.
近年、半導体工業においてはますます高純度ガス使用の
必要性が高まりそのために様々な努力がなされている。In recent years, the need to use highly purified gases has increased in the semiconductor industry, and various efforts have been made to this end.
中でも、アルミニウムを含む半導体、AlGaAsなと
の半導体製造装置や、プロセス装置においては酸素、水
分を極度に嫌うものがある。Among these, some semiconductor manufacturing equipment and process equipment for semiconductors containing aluminum, such as AlGaAs, are extremely averse to oxygen and moisture.
この高純度ガスを得る場合に、水素ガスの場合はパラジ
ウム拡散膜を透過させることによりその純度向上が可能
である。When obtaining this high-purity gas, in the case of hydrogen gas, the purity can be improved by passing it through a palladium diffusion membrane.
しかし、窒素、アルゴンなどの不活性ガスの高純化の方
法としては、これらガスをモレキュラーシープに通して
酸素、水素等を吸着させる手段があったが、さらに高純
度化するための適当な手段がなかった。However, the method for highly purifying inert gases such as nitrogen and argon has been to pass these gases through molecular sheets to adsorb oxygen, hydrogen, etc., but there are no suitable means for further purification. There wasn't.
本発明の目的は、簡単な手段により高純度ガスを容易に
得ることができるようにした不純物ガストラップを提供
することにある。An object of the present invention is to provide an impurity gas trap that allows high purity gas to be easily obtained by simple means.
本発明の不純物ガストラップは、高真空排気手段と接続
される接続口と純化すべきガスの入口および出口とを有
しこれら出入口にバルブを設けた気密容器と、この気密
容器の内部に配設された加熱可能なヒーターと、このヒ
ーターと接して設けられた固体アルミニウムとを含み構
成される。The impurity gas trap of the present invention includes an airtight container having a connection port connected to a high vacuum evacuation means, an inlet and an outlet for the gas to be purified, and a valve provided at these inlets and outlets, and an airtight container disposed inside the airtight container. The device includes a heater capable of heating, and solid aluminum provided in contact with the heater.
以下本発明を図面により説明する。The present invention will be explained below with reference to the drawings.
第1図は本発明の実施例の構成図である。FIG. 1 is a block diagram of an embodiment of the present invention.
図において、1,2,3はバルブ、4は高融点の物質(
例えば、タングステン)からなるヒーター、5は固体ア
ルミニウム片、6は分子線、7は気密容器をそれぞれ示
す。In the figure, 1, 2, and 3 are valves, and 4 is a high melting point substance (
5 is a solid aluminum piece, 6 is a molecular beam, and 7 is an airtight container.
純化すべきガスはバルブ1を通して気密容器7の内部に
導入される。The gas to be purified is introduced into the airtight container 7 through the valve 1.
この容器7はバルブ2を介して純化せられたガスの出口
を備えている。This vessel 7 is provided with an outlet for the purified gas via a valve 2.
これらバルブ1、バルブ2を閉じることにより、容器7
を密閉し、この容器7の内部はバルブ3を通して高真空
ポンプにより真空に排気することが可能である。By closing these valves 1 and 2, the container 7
The inside of the container 7 can be evacuated through the valve 3 by a high vacuum pump.
この容器7内を高真空に排気した後ヒーター4を加熱し
、このヒーター4に接しておかれた固体アルミニウム片
5を融解させる。After the inside of this container 7 is evacuated to a high vacuum, the heater 4 is heated, and the solid aluminum piece 5 placed in contact with this heater 4 is melted.
この真空容器γ中で融解させられたアルミニウムは分子
線6となり四散し、容器7の内部壁面に付着する。The aluminum melted in the vacuum container γ becomes molecular beams 6, scatters, and adheres to the inner wall surface of the container 7.
これら一連の操作の後、ヒーター7の温度を下げ、容器
の温度が下ったところで、バルブ1を開いて純化さるべ
きガスを導入する。After a series of these operations, the temperature of the heater 7 is lowered, and when the temperature of the container has dropped, the valve 1 is opened and the gas to be purified is introduced.
更にバルブ2を開いて純化せられたガスを所要の箇所へ
流出させる。Furthermore, the valve 2 is opened to allow the purified gas to flow out to a required location.
本装置によりバルブ1から導入されたガスが純化される
原理は次のとおりである。The principle by which the gas introduced from the valve 1 is purified by this device is as follows.
通常のアルミニウムの固体は、大気中に存在する酸素分
子、水分子等が化学吸着をおこしてアルミナとなり、ア
ルミナ膜によって覆われている。Ordinary solid aluminum becomes alumina through chemical adsorption of oxygen molecules, water molecules, etc. present in the atmosphere, and is covered with an alumina film.
しかるに、本装置の容器γ内壁に付着したアルミニウム
は高真空中にて付着させられたため、清浄な表面を保っ
ている。However, since the aluminum deposited on the inner wall of the container γ of this device was deposited in a high vacuum, the surface remained clean.
一般に、アルミニウム金属は酸素、水分等に対して極め
て大きな吸着能を有しているので、これら不純物ガスが
本装置内に流入すると、1〜数凍原子の酸化被膜が形成
されるまでは、大きな吸着能をもってこれら不純物ガス
を本装置容器内壁に固定せしめることが可能である。In general, aluminum metal has an extremely high adsorption capacity for oxygen, moisture, etc., so when these impurity gases enter the device, a large It is possible to fix these impurity gases to the inner wall of the container of the present device with the adsorption ability.
酸素又は水分とアルミニウムとの化学反応エネルギーは
極めて太きいため、吸着された酸素又は水分は、強い力
で容器内壁に固着させることができる。Since the chemical reaction energy between oxygen or moisture and aluminum is extremely large, the adsorbed oxygen or moisture can be fixed to the inner wall of the container with a strong force.
したがって、本装置によれば、酸素又は水分などの不純
物ガスを選択的に容器内壁に固着せしめ水素又は窒素又
は不活性ガスの純度を向上させることができる。Therefore, according to the present device, it is possible to selectively fix impurity gas such as oxygen or moisture to the inner wall of the container and improve the purity of hydrogen, nitrogen, or inert gas.
また、容器内壁の表面が不純物ガス吸着で覆われてトラ
ップとしての能力が低下したときには、容器入口及び出
口のバルブを閉じ、容器内を真空排気して、再びヒータ
ーによりアルミニウムを融解し、容器内壁に飛散付着さ
せて、原子的に清浄なアルミニウムの被膜を形成するこ
とによりトラップとしての機能の回復を図ることができ
る。In addition, when the surface of the inner wall of the container is covered with impurity gas adsorption and its ability as a trap is reduced, the valves at the inlet and outlet of the container are closed, the inside of the container is evacuated, the aluminum is melted again by the heater, and the inner wall of the container is The function as a trap can be restored by scattering and adhering the aluminum to form an atomically clean aluminum film.
第2図は本発明の第2の実施例の構成図である。FIG. 2 is a block diagram of a second embodiment of the present invention.
第2図における第1図と同一番号のものは第1図の構成
要素と同一のものを示し、ダッシュのついた数字のもの
はダッシュのつかない数字のものと同種の構成要素を示
す。In FIG. 2, the same numbers as in FIG. 1 indicate the same components as in FIG. 1, and the numbers with a dash indicate the same types of components as the numbers without a dash.
第1図においては、純化されるべきガスは、容器内壁の
再生時、すなわちアルミニウムの原子的清浄表面形成時
に、一時通過を中断させなげればならないが、実際のガ
ス使用にあたっては、中断なしに、連続的に使用するこ
とが望ましい場合が多い。In Figure 1, the passage of the gas to be purified must be temporarily interrupted when the inner wall of the container is regenerated, that is, when the atomically clean surface of the aluminum is formed. , it is often desirable to use it continuously.
そのため第2図においては、純化ガスの連続使用ができ
るようにしたものであり、機能上、上下対称な構造にな
っており、−ト半分使用時には下半分は再生のためのプ
ロセスを進行させ、下半分使用時には上半分を再生させ
るようにして、入口8から入ったガスを出口9かも連続
的に純化したガスを得ることが可能である。Therefore, in Fig. 2, the purified gas can be used continuously, and functionally it has a symmetrical structure, so that when the upper half is used, the lower half advances the regeneration process. By regenerating the upper half when the lower half is used, it is possible to continuously obtain purified gas from the gas entering from the inlet 8 at the outlet 9.
第1図は本発明の第1の実施例の構成図、第2図は本発
明の第2の実施例の構成図である。
図において、1,1′・・・・・・入口バルブ、2,2
′・・・・・・出口バルブ、3,3′・・・・・・真空
排気排気装置用バルブ、4 、4’・・・・・・ヒータ
ー、5,5′・・・・・・固体アルミニウム片、6,6
′・・・・・・アルミニウム分子線、7.γ′・・・・
・・真空容器、8・・・・・・入口、9・・・・・・出
口である。FIG. 1 is a block diagram of a first embodiment of the present invention, and FIG. 2 is a block diagram of a second embodiment of the present invention. In the figure, 1, 1'... Inlet valve, 2, 2
'...Outlet valve, 3,3'...Valve for vacuum exhaust system, 4,4'...Heater, 5,5'...Solid Aluminum piece, 6,6
'...Aluminum molecular beam, 7. γ'...
...Vacuum container, 8...Inlet, 9...Outlet.
Claims (1)
スの入口および出口とを有しこれら出入口にバルブを設
けた気密容器と、この気密容器内部に配設された加熱可
能なヒーターと、このヒーターと接して設けられた固体
アルミニウム片とを含む不純物ガストラップ。1. An airtight container having a connection port connected to a high vacuum evacuation means, an inlet and an outlet for the gas to be purified, and valves provided at these inlets and outlets, and a heater that can be heated inside the airtight container; an impurity gas trap comprising a solid aluminum piece in contact with the heater;
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57173242A JPS5932167B2 (en) | 1982-10-04 | 1982-10-04 | impurity gas trap |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57173242A JPS5932167B2 (en) | 1982-10-04 | 1982-10-04 | impurity gas trap |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5966325A JPS5966325A (en) | 1984-04-14 |
| JPS5932167B2 true JPS5932167B2 (en) | 1984-08-07 |
Family
ID=15956788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57173242A Expired JPS5932167B2 (en) | 1982-10-04 | 1982-10-04 | impurity gas trap |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5932167B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100321634B1 (en) * | 1999-10-08 | 2002-03-18 | 송창빈 | Ultra high degree of purity gas refine device |
-
1982
- 1982-10-04 JP JP57173242A patent/JPS5932167B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5966325A (en) | 1984-04-14 |
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