JPS5932430B2 - Manufacturing equipment for band-shaped silicon crystals - Google Patents
Manufacturing equipment for band-shaped silicon crystalsInfo
- Publication number
- JPS5932430B2 JPS5932430B2 JP17481A JP17481A JPS5932430B2 JP S5932430 B2 JPS5932430 B2 JP S5932430B2 JP 17481 A JP17481 A JP 17481A JP 17481 A JP17481 A JP 17481A JP S5932430 B2 JPS5932430 B2 JP S5932430B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- band
- pulling
- shaped silicon
- seed crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 title claims description 65
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims description 20
- 229910052710 silicon Inorganic materials 0.000 title claims description 20
- 239000010703 silicon Substances 0.000 title claims description 20
- 238000004519 manufacturing process Methods 0.000 title claims description 3
- 239000000155 melt Substances 0.000 claims description 5
- 230000000630 rising effect Effects 0.000 claims description 2
- 230000005499 meniscus Effects 0.000 description 9
- 239000007788 liquid Substances 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】 本発明は帯状シリコン結晶の製造方法に関する。[Detailed description of the invention] The present invention relates to a method for producing band-shaped silicon crystals.
結晶引上げを行うに際しまず第一に考慮すべき点は、結
晶引上げ速度と、加熱ヒータパワーとのバランスである
。The first thing to consider when performing crystal pulling is the balance between crystal pulling speed and heater power.
一般に結晶引上げを行なう際には、結晶引上げ速度を上
昇させるに従い加熱ヒータパワーを減少させて行く必要
がある。Generally, when pulling a crystal, it is necessary to reduce the heater power as the crystal pulling speed increases.
これは、シリコン融液が結晶化するに際して発生する潜
熱の分だけヒータから固液界面に供給される熱を減少さ
せ、固液界面の位置変動を少すくシようという目的(こ
よる。The purpose of this is to reduce the heat supplied from the heater to the solid-liquid interface by the latent heat generated when the silicon melt crystallizes, and to reduce the positional fluctuation of the solid-liquid interface.
帯状シリコン結晶引上げに際しても同様な操作が必要で
ある。A similar operation is required when pulling a band-shaped silicon crystal.
帯状シリコン結晶引上げに適した固液界面形状は、帯状
シリコン結晶幅方向端部のメニスカス高さが低く、中央
部では高いという形状である。A solid-liquid interface shape suitable for pulling a band-shaped silicon crystal is such that the meniscus height is low at the ends in the width direction of the band-shaped silicon crystal and high at the center.
これが逆転している場合には結晶引上げは困難である。If this is reversed, crystal pulling will be difficult.
結晶幅方向端部でのメニスカス高さが高いと結晶幅の拡
大及び一定幅の維持は困難であり、幅方向端部でメニス
カス高さを低下させた場合幅方向中央部でのメニスカス
高さも低下し、成長中の帯状結晶はキャピラリ・ダイと
固着するからである。If the meniscus height at the ends in the crystal width direction is high, it is difficult to expand the crystal width and maintain a constant width, and if the meniscus height is reduced at the ends in the width direction, the meniscus height at the center part in the width direction also decreases. However, the growing band-shaped crystal is stuck to the capillary die.
しかし帯状結晶引上げの際、幅方向中央部でのメニスカ
ス高さは高い方が良いとはいえ、これが極端になりすぎ
た場合にはキャピラリ・ダイ中央部で結晶成長が起らな
いか、ないしは中央部で結晶厚みが薄い結晶が得られる
という不都合を生ずる。However, when pulling a band-shaped crystal, although it is better to have a high meniscus height at the center in the width direction, if this becomes too extreme, crystal growth may not occur at the center of the capillary die, or This results in the inconvenience that a crystal having a thin crystal thickness can be obtained in some regions.
さて、帯状シリコン結晶の成長に当り、結晶引上げ速度
を増大させ、ヒータパワーを減少させた場合には、一般
的にはメニスカス形状は変化する。Now, when growing a band-shaped silicon crystal, when the crystal pulling speed is increased and the heater power is decreased, the meniscus shape generally changes.
その方向は、結晶幅方向端部のメニスカス高さを一定に
しよう吉して操作した場合、幅方向中央部メニスカス高
さが増大するというものである。The direction is such that when the meniscus height at the end portions in the crystal width direction is operated to be constant, the meniscus height at the center portion in the width direction increases.
これは潜熱発生とは無関係の固液界面以外の部分はヒー
タパワーの減少に伴い確実に温度低下を起し、結晶幅方
向端部は中央部に比べ熱放散が良いために起る現象であ
る。This is a phenomenon that occurs because the temperature of parts other than the solid-liquid interface, which is unrelated to latent heat generation, steadily decreases as the heater power decreases, and the edges in the crystal width direction have better heat dissipation than the central part. .
このため結晶が低速で引上げられる結晶成長初期のメニ
スカス形状を定めている条件は、引上げ速度の大きいそ
の後の状態下では好ましいものではなく、またその逆も
いえる。Therefore, the conditions that determine the meniscus shape at the initial stage of crystal growth, where the crystal is pulled at a low speed, are not favorable under subsequent conditions where the pulling speed is high, and vice versa.
従来このような不都合を避けるためには、帯状シリコン
結晶の幅方向の温度分布を結晶引上げ中に変更できるよ
うな電気的あるいは機械的手段を設けるという方法によ
り解決していたが、これは非常に繁雑であった。Conventionally, the solution to avoid such inconveniences was to provide electrical or mechanical means that could change the temperature distribution in the width direction of the band-shaped silicon crystal during crystal pulling, but this was extremely difficult. It was complicated.
本発明は、このような繁雑な方法を取らずに結晶成長時
の初期から引上げ速度増大に至るまでの間の温度分布の
変化を解消して所望の形状の帯状シリコン結晶を引上げ
る方法を提供するものである。The present invention provides a method for pulling a band-shaped silicon crystal in a desired shape by eliminating changes in temperature distribution from the initial stage of crystal growth to increasing the pulling speed without using such complicated methods. It is something to do.
このような目的を達成するためには、リボン結晶幅方向
端部が結晶引上げ初期には熱放散が大きくその後熱放散
が低下すればよい。In order to achieve this purpose, it is sufficient that the ends of the ribbon crystal in the width direction have large heat dissipation in the initial stage of crystal pulling, and then the heat dissipation decreases.
そこで本発明では、種子結晶として、結晶引上げ方向に
頂点をもつ頂角が鈍角である二等辺三角形板体部と、そ
の頂点部と種子結晶支持体との間を連結する、前記二等
辺三角形板体部の底辺1/10以下の幅をもつ平行板体
部とからなる板状結晶を用いることにより、上記目的を
達成する。Therefore, in the present invention, as a seed crystal, an isosceles triangular plate part having an apex in the crystal pulling direction and having an obtuse apex angle, and the isosceles triangular plate part connecting the apex part and the seed crystal support body. The above object is achieved by using a plate-shaped crystal consisting of a parallel plate body having a width of 1/10 or less of the base of the body.
第1図aは一実施例での結晶引上げの要部状態を示し、
同図すはその種子結晶の平面形状を示している。Figure 1a shows the main part of crystal pulling in one embodiment,
The figure shows the planar shape of the seed crystal.
図中、1はシリコン融液2が収容された石英製ルツボで
あり、その中にスリットを有するキャピラリ・ダイ3(
3□、3゜)が配置され、スリットを介して上昇した融
液2に種子結晶4を接触させ、これを引上げることによ
り帯状シリコン結晶5を得るものである。In the figure, 1 is a quartz crucible containing a silicon melt 2, and a capillary die 3 (
3□, 3°) are arranged, and the seed crystal 4 is brought into contact with the melt 2 rising through the slit, and by pulling it up, a band-shaped silicon crystal 5 is obtained.
6は種子結晶支持体である。6 is a seed crystal support.
種子結晶4は、第1図すに示すように、結晶引上げ方向
に頂点をもち、頂点θが鈍角である二等辺三角形板体部
4aと、その頂点部と種子結晶支持体6との間を連結す
る、二等辺三角形板体部4aの底辺d1の1/10以下
の幅d2をもつ平行平板部4bとからなる。As shown in FIG. 1, the seed crystal 4 has an isosceles triangular plate portion 4a having an apex in the crystal pulling direction and an obtuse angle at the apex θ, and a portion between the apex portion and the seed crystal support 6. It consists of a parallel flat plate part 4b having a width d2 less than 1/10 of the base d1 of the isosceles triangular plate part 4a to be connected.
以下に具体的な実験データを挙げてこの発明の効果を明
らかにする。Specific experimental data will be listed below to clarify the effects of this invention.
まず、キャピラリ・ダイ3として、比重1.8の高純度
グラファイトを幅100 mm、高さ40m11L1厚
み3rranに切り出し、先端を30度の角度に斜め研
削し、同質のグラファイト製ネジでスペーサを介して間
隔0.3 rnmのスリットをもつように構成した。First, as a capillary die 3, high-purity graphite with a specific gravity of 1.8 was cut into a piece with a width of 100 mm, a height of 40 m, 1 L, and a thickness of 3 rran.The tip was ground diagonally at a 30 degree angle, and a screw made of the same quality graphite was used to cut it through a spacer. It was configured to have slits with an interval of 0.3 nm.
この2枚のキャピラリ・ダイ3を内径150mmφの石
英ガラス製ルツボ1に配置した。These two capillary dies 3 were placed in a quartz glass crucible 1 with an inner diameter of 150 mmφ.
そしてキャピラリ・ダイ3以外の石英ガラスルツボ1中
には比抵抗50Ω儒の高純度原料シリコン粒を1001
r充填し、ドーピング用ホウ素を10μgr混入した。In the quartz glass crucible 1 other than the capillary die 3, 1001 high-purity raw material silicon grains with a resistivity of 50Ω are placed.
10 μgr of boron for doping was added.
次に引上炉中にルツボをセットし、炉内を昇温した。Next, the crucible was set in a pulling furnace, and the temperature inside the furnace was raised.
約1時間後に炉内温度は1450°C迄上がり、高純度
シリコンとドーピング用ホウ素は融解し、融液2となっ
た。After about 1 hour, the temperature inside the furnace rose to 1450°C, and the high purity silicon and doping boron were melted to form a melt 2.
炉内温度を更に上げて1500°Cにすると、融液2は
キャピラリ・ダイ3のスリットの間を上昇し始め、10
分後にスリット開口部を埋めた。When the temperature inside the furnace is further increased to 1500°C, the melt 2 begins to rise between the slits of the capillary die 3, and
After minutes the slit opening was filled.
加熱をやや抑えて成長に必要な温度条件を作り出すと、
あらかじめ中心軸に近い端の温度が高くなっていた。When heating is slightly suppressed to create the temperature conditions necessary for growth,
The temperature at the end near the central axis was already high.
この状態で頂角θが120度である二等辺三角形板体部
4aをもつ種子結晶4をキャピラリ・ダイ3の開口部の
融液2に命中させた。In this state, a seed crystal 4 having an isosceles triangular plate portion 4a with an apex angle θ of 120 degrees was struck into the melt 2 at the opening of the capillary die 3.
一定時間そのまま保持し、その後毎分1. mmの引上
げ速度で引上げを開始し、炉の加熱条件を入力パワーを
下げる方向で変えた。Hold it for a certain period of time, then 1 minute every minute. Pulling was started at a pulling speed of mm, and the heating conditions of the furnace were changed to lower the input power.
成長した帯状結晶5は幅が二等辺三角形板体部4aの底
辺の幅d1と同等で中心部の厚みは薄くなかった。The width of the grown band-shaped crystal 5 was equal to the width d1 of the base of the isosceles triangular plate portion 4a, and the thickness at the center was not thin.
次に種子結晶4の形状、特に頂角が帯状結晶の良否を決
める決定的な要因になることを明らかにするデータを示
す。Next, we will show data that makes it clear that the shape of the seed crystal 4, especially the apex angle, is a decisive factor in determining the quality of the band-shaped crystal.
具体的には、頂角θをパラメータとして、1メートルの
帯状結晶を引上げたあと、目的の結晶幅がどの位できた
かを一つの目安にし、また厚みが中心部で薄いことを目
的の厚みと比較して不良率を求めた。Specifically, after pulling a 1-meter belt-shaped crystal using the apex angle θ as a parameter, use the desired width of the crystal as a guideline, and determine that the thickness is thinner in the center as the desired thickness. A comparison was made to determine the defective rate.
第2図、第3図は種子結晶4の頂角θを20.40,5
0,80゜ioo 、120度と選んで上記不良率を求
めたものである。In Figures 2 and 3, the apex angle θ of the seed crystal 4 is 20.40,5.
The defect rate was determined by selecting 0.80° ioo and 120°.
なお、幅d2は実施例と同様幅d1の1/10以下に設
定した。Note that the width d2 was set to 1/10 or less of the width d1 as in the example.
幅、厚みともに頂角θが120度と大きいときに不良率
が激減する。When the apex angle θ is as large as 120 degrees for both width and thickness, the defective rate is drastically reduced.
頂角θが90度より大きい範囲では、実用土十分小さい
不良率となることがわかる。It can be seen that in a range where the apex angle θ is greater than 90 degrees, the defective rate is sufficiently small for practical use.
品質に関しても頂角θが大きい方が帯状結晶の破損事故
が少ないことが確認された。In terms of quality, it was confirmed that the larger the apex angle θ, the fewer accidents caused by band crystal breakage.
また種子結晶4の平行平板部4bの幅d2が二等辺三角
形板体部゛4a゛の底辺の幅d1の1/10以下でない
と、種子結晶側への熱伝達が大きすぎて固液界面の熱バ
ランスが悪くなり、良質の帯状シリコン結晶が引上げら
れないことも確認された。Furthermore, if the width d2 of the parallel plate portion 4b of the seed crystal 4 is not 1/10 or less of the width d1 of the base of the isosceles triangular plate portion 4a, the heat transfer to the seed crystal side will be too large and the solid-liquid interface will It was also confirmed that good quality band-shaped silicon crystals could not be pulled up due to poor thermal balance.
以上のように本発明によれば、種子結晶の形状を選ぶこ
とにより、複雑な外部的温度制御を要せず、所望の形状
の帯状シリコン結晶を安定に引上げることかできる。As described above, according to the present invention, by selecting the shape of the seed crystal, it is possible to stably pull a band-shaped silicon crystal in a desired shape without requiring complicated external temperature control.
【図面の簡単な説明】
第1図a、bは本発明の一実施例の成長方法の説明図、
第2図及び第3図は本発明の効果を示す図である。
1・・・・・・石英ガラス製ルツボ、2・・・・・・シ
リコン融液、3□、32・・・・・・キャピラリ・ダイ
、4・・・・・・種子結晶、4a・・・・・・二等辺三
角形板体部、4b・・・・・・平行板体部、5・・・・
・・帯状シリコン結晶、6・・・・・・種子結晶支持体
。[Brief Description of the Drawings] Figures 1a and 1b are explanatory diagrams of a growth method according to an embodiment of the present invention;
FIGS. 2 and 3 are diagrams showing the effects of the present invention. 1...Quartz glass crucible, 2...Silicon melt, 3□, 32...Capillary die, 4...Seed crystal, 4a... ...Isosceles triangular plate body part, 4b...Parallel plate body part, 5...
... Band-shaped silicon crystal, 6... Seed crystal support.
Claims (1)
キャピラリ・ダイを配し、前記スリットを介して上昇し
た融液に種子結晶を接触させ、この種子結晶を引上げる
ことにより帯状シリコン結晶を引上げるに際し、前記種
子結晶として、結晶引上げ方向に頂点をもつ頂角が鈍角
である二等辺三角形板体部と、その頂点部と種子結晶支
持体との間を連結する、前記二等辺三角形板体部の底辺
の1/10以下の幅をもつ平行板体部とからなる板状結
晶を用いることを特徴とする帯状シリコン結晶の製造方
法。1. A capillary die having a slit is arranged in a crucible containing silicon melt, a seed crystal is brought into contact with the melt rising through the slit, and the band-shaped silicon crystal is pulled up by pulling up the seed crystal. , as the seed crystal, an isosceles triangular plate part having an apex in the crystal pulling direction and having an obtuse apex angle, and an isosceles triangular plate part connecting the apex part and the seed crystal support. 1. A method for producing a band-shaped silicon crystal, characterized in that a plate-shaped crystal consisting of parallel plate portions having a width of 1/10 or less of the base is used.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17481A JPS5932430B2 (en) | 1981-01-06 | 1981-01-06 | Manufacturing equipment for band-shaped silicon crystals |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17481A JPS5932430B2 (en) | 1981-01-06 | 1981-01-06 | Manufacturing equipment for band-shaped silicon crystals |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57118092A JPS57118092A (en) | 1982-07-22 |
| JPS5932430B2 true JPS5932430B2 (en) | 1984-08-08 |
Family
ID=11466638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17481A Expired JPS5932430B2 (en) | 1981-01-06 | 1981-01-06 | Manufacturing equipment for band-shaped silicon crystals |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5932430B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6064844U (en) * | 1983-10-08 | 1985-05-08 | 株式会社ローラ製作所 | Cleaning device for water rod rollers in offset printing machines |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017077986A (en) * | 2015-10-20 | 2017-04-27 | 並木精密宝石株式会社 | Sapphire single crystal and manufacturing method thereof |
-
1981
- 1981-01-06 JP JP17481A patent/JPS5932430B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6064844U (en) * | 1983-10-08 | 1985-05-08 | 株式会社ローラ製作所 | Cleaning device for water rod rollers in offset printing machines |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57118092A (en) | 1982-07-22 |
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