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JPS5932436B2 - Band-shaped silicon crystal growth device - Google Patents
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JPS5932436B2 - Band-shaped silicon crystal growth device - Google Patents

Band-shaped silicon crystal growth device

Info

Publication number
JPS5932436B2
JPS5932436B2 JP56145817A JP14581781A JPS5932436B2 JP S5932436 B2 JPS5932436 B2 JP S5932436B2 JP 56145817 A JP56145817 A JP 56145817A JP 14581781 A JP14581781 A JP 14581781A JP S5932436 B2 JPS5932436 B2 JP S5932436B2
Authority
JP
Japan
Prior art keywords
band
crystal
shaped silicon
die
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56145817A
Other languages
Japanese (ja)
Other versions
JPS5849692A (en
Inventor
直明 真木
俊幸 沢田
清 吉川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56145817A priority Critical patent/JPS5932436B2/en
Publication of JPS5849692A publication Critical patent/JPS5849692A/en
Publication of JPS5932436B2 publication Critical patent/JPS5932436B2/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/34Edge-defined film-fed crystal-growth using dies or slits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Light Receiving Elements (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 本発明は、毛細管現象を利用した帯状シリコン結晶の成
長装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for growing band-shaped silicon crystals using capillary action.

従来、帯状シリコン結晶をシリコン融液より成長させる
装置として、第1図に示すものが知られている。
2. Description of the Related Art Conventionally, an apparatus shown in FIG. 1 is known as an apparatus for growing band-shaped silicon crystals from a silicon melt.

すなわち、シリコン融液11を収容する石英ガラスで構
成されたルツボ12に、カーボンで構成されたスリット
(間隙)を有するダイ13a、13bが支持棒14a、
14bで支持される。
That is, in a crucible 12 made of quartz glass that accommodates a silicon melt 11, dies 13a and 13b having slits (gaps) made of carbon are attached to support rods 14a,
14b.

このダイ13a、13bの先端部はナイフェツジ状に鋭
く加工されている。
The tips of the dies 13a and 13b are sharply machined into a knife shape.

ルツボ12の外側には一対の板状メインヒーク15 a
y 15 bが設けられている。
A pair of plate-shaped main heaks 15a are located outside the crucible 12.
y 15 b is provided.

このような構成でルツボ12に原料の多結晶シリコンを
入れメインヒーク15 a 515 bに電力を供給す
ると、多結晶シリコンはシリコン融液11となる。
With this configuration, when polycrystalline silicon as a raw material is put into the crucible 12 and power is supplied to the main heak 15 a 515 b, the polycrystalline silicon becomes a silicon melt 11 .

そして、このシリコン融液11がダイ13a、13b間
のスリット内を毛細管現象により上昇し、先端部に達す
る。
Then, this silicon melt 11 rises in the slit between the dies 13a and 13b due to capillary action and reaches the tip.

この先端部に達したシリコン融液11に種子結晶を接触
させ、その種子結晶を徐々に引き上げることにより、帯
状シリコン結晶16が成長する。
By bringing a seed crystal into contact with the silicon melt 11 that has reached the tip and gradually pulling up the seed crystal, a band-shaped silicon crystal 16 grows.

ところで、この成長装置では、成長中の帯状シリコン結
晶16の厚さ方向の固液界面の形状は第2図に21で示
すような凸形となる。
By the way, in this growth apparatus, the shape of the solid-liquid interface in the thickness direction of the band-shaped silicon crystal 16 during growth is a convex shape as shown at 21 in FIG.

これはカーボンで構成したダイ13a、13bの先端部
23a 、23bの温度がシリコン融液11のダイ先端
部近傍部分22の温度より低温であるため、シリコン融
液11の部分22の温度分布はダイ側13a、13b近
傍で低温となり、中央部で高温となるからである。
This is because the temperature of the tips 23a and 23b of the dies 13a and 13b made of carbon is lower than the temperature of the portion 22 of the silicon melt 11 near the die tips, so the temperature distribution of the portion 22 of the silicon melt 11 is This is because the temperature is low near the sides 13a and 13b, and the temperature is high in the center.

固液界面21かこのような形状の状態で成長を行うと、
帯状シリコン結晶16の表面から結晶核が発生するため
、帯状シリコン結晶16の厚さ方向中央部に第3図に示
す如く結晶不整31が生ずる。
When growth is performed with the solid-liquid interface 21 in this shape,
Since crystal nuclei are generated from the surface of the band-shaped silicon crystal 16, a crystal irregularity 31 occurs at the center of the band-shaped silicon crystal 16 in the thickness direction as shown in FIG.

なお、32は双晶粒界である。Note that 32 is a twin grain boundary.

このような結晶不整31が結晶中に存在すると、バルク
結晶中の比抵抗の分布が不均一となる。
If such crystal irregularity 31 exists in the crystal, the distribution of resistivity in the bulk crystal becomes non-uniform.

また結晶中の少数キャリアライフタイムが極端に短くな
り、太陽電池として素子化した場合、電気変換効率が著
しく低いものとなってしまう。
Moreover, the minority carrier lifetime in the crystal becomes extremely short, and when it is made into a solar cell, the electrical conversion efficiency becomes extremely low.

本発明はこのような点に鑑みなされたもので、その目的
は厚さ方向中央部の結晶不整を生ずることのない帯状シ
リコン結晶の成長装置を提供することにある。
The present invention has been made in view of these points, and its object is to provide an apparatus for growing band-shaped silicon crystals that does not cause crystal irregularity in the central portion in the thickness direction.

本発明は、ダイ先端部の温度をダイのスリット内を上昇
するシリコン融液のダイ先端部近傍部分の温度より高温
の状態に制御する温度制御装置を備えることによって、
シリコン融液のダイ先端部近傍部分の温度分布を従来と
は逆にダイ側で高温、スリット内中央部で低温となるよ
うにしたものである。
The present invention includes a temperature control device that controls the temperature of the die tip to a state higher than the temperature of the silicon melt rising in the slit of the die near the die tip.
The temperature distribution of the silicon melt in the vicinity of the die tip is reversed from the conventional technique, with a high temperature on the die side and a low temperature at the center of the slit.

このようにすると、帯状シリコン結晶厚さ方向における
固液界面の形状は凹形となるため、従来問題となってい
た厚さ方向中央部の結晶不整を除去することができる。
In this way, the shape of the solid-liquid interface in the thickness direction of the band-shaped silicon crystal becomes concave, so that it is possible to eliminate the crystal irregularity in the central part in the thickness direction, which has been a problem in the past.

なお、上記の温度制御は具体的には、スリット内を上昇
するシリコン融液の中央部を冷却することによって達成
することが可能である。
Note that the above temperature control can be specifically achieved by cooling the central portion of the silicon melt rising inside the slit.

以下、本発明の実施例を図面を用いて説明する。Embodiments of the present invention will be described below with reference to the drawings.

第4図は本発明の一実施例の要部を示す図であり、aは
斜視図、bは断面図である。
FIG. 4 is a diagram showing a main part of an embodiment of the present invention, in which a is a perspective view and b is a sectional view.

ダイ13a。13bの間のスリット内中央部に薄い冷却
板41か設置されている。
Die 13a. A thin cooling plate 41 is installed in the center of the slit between the holes 13b.

この冷却板41は例えばカーボン板からなり、ダイ13
a、13bと平行に設けられ、またその先端位置はダイ
13a、13bの先端エツジより低く設定される。
This cooling plate 41 is made of, for example, a carbon plate, and the die 13
It is provided parallel to the dies 13a and 13b, and its tip position is set lower than the tip edge of the dies 13a and 13b.

また、冷却板41の先端は42 a 、42 bの如く
両側に突出する形でダイ13a 、’13bの幅より広
く形成され、これらの突出部42a、42bがアルゴン
ガスのような冷却ガス43 a 、43 bが噴き付け
られることにより冷却される。
Further, the tips of the cooling plate 41 are formed to be wider than the widths of the dies 13a and 13b in the form of protruding from both sides as 42a and 42b, and these protrusions 42a and 42b are connected to a cooling gas 43a such as argon gas. , 43b are sprayed onto the surface of the substrate.

そして、・ガス43a。43bの流量を制御して、冷却
板41の少なくとも先端部の温度をダイ13a、13b
先端部の温度より低温に設定する。
And, gas 43a. The temperature of at least the tip of the cooling plate 41 is controlled by controlling the flow rate of the die 13a, 13b.
Set it to a temperature lower than that of the tip.

このような温度条件下では、シリコン融液11のダイ1
3 a 、13 b先端部近傍部分の温度分布はスリッ
ト内中央部、つまり冷却板41近傍で低温さなり、ダイ
13a、13b側で高温となる。
Under such temperature conditions, the die 1 of the silicon melt 11
The temperature distribution in the vicinity of the tips of 3a and 13b is low at the center of the slit, that is, near the cooling plate 41, and high at the dies 13a and 13b.

従って、この温度条件下で帯状シリコン結晶の引上げを
行うと結晶の厚さ方向における固液界面の形状“は、第
5図に51で示す如く凹形となる。
Therefore, when a band-shaped silicon crystal is pulled under these temperature conditions, the shape of the solid-liquid interface in the thickness direction of the crystal becomes concave as shown at 51 in FIG.

そして固液界面51がこのような形状の状態で成長した
帯状シリコン結晶16の厚さ方向の断面は第6図の如く
なる。
The cross section in the thickness direction of the band-shaped silicon crystal 16 grown with the solid-liquid interface 51 having such a shape is shown in FIG.

すなわち、厚さ方向において中央部より結晶核が発生し
、リボン表面に進行する結果、中央部の結晶不整は除去
され、双晶粒界61のみで構成される。
That is, crystal nuclei are generated from the center in the thickness direction and proceed to the ribbon surface, so that the crystal irregularity in the center is removed and the ribbon is composed only of twin grain boundaries 61.

このようにして得られた帯状シリコン結晶は、比抵抗の
分布が均一となるばかりでなく、少数キャリアライフタ
イムも格段に長くなり、太陽電池として素子化した場合
、その電気変換効率は平均10%にも達し大幅な向上が
見られた。
The band-shaped silicon crystal obtained in this way not only has a uniform distribution of resistivity, but also has a significantly longer minority carrier lifetime, and when made into a solar cell, its electrical conversion efficiency is 10% on average. A significant improvement was seen.

以上説明したように、本発明によればダイ先端部の温度
がダイ先端部近傍部分のシリコン融液より高温の状態の
温度条件を形成して厚さ方向の固液界面の形状を凹形に
することにより、帯状シリコン結晶の厚さ方向中央部で
の結晶不整の発生を防止して結晶の品質を向上させるこ
とができ、太陽電池として用いた場合電気変換効率を大
幅に向上させることが可能となる。
As explained above, according to the present invention, the temperature condition is such that the temperature at the die tip is higher than the silicon melt near the die tip, and the shape of the solid-liquid interface in the thickness direction is made concave. By doing so, it is possible to prevent the occurrence of crystal irregularities in the central part of the band-shaped silicon crystal in the thickness direction and improve the quality of the crystal, and it is possible to significantly improve the electrical conversion efficiency when used as a solar cell. becomes.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は帯状シリコン結晶成長装置の基本構成を示す断
面図、第2図は従来装置における固液界面の形状を説明
するための断面図、第3図は従来装置において得られる
帯状シリコン結晶の厚み方向の断面図、第4図a、bは
本発明の一実施例の要部の構成を示す1斜視図および断
面図、第5図は同実施例装置における固液界面の形状を
説明するための断面図、第6図は同実施例装置によって
得られた帯状シリコン結晶の厚さ方向の断面図、である
。 11・・・・・・シリコン融液、12・・・・・・ルツ
ボ、1’z a t i 3b・・・・・・ダイ、14
a、14b・・・・・・支持棒、15 a 、15 b
””メインヒータ、16・・・・・・帯状シリコン結
晶、21・・・・・・固液界面、31・・・・・・結晶
不整、32・・・・・・双晶粒界、41・・・・・・冷
却板、43a、43b・・・・・・冷却ガス、51・・
・・・・固液界面、61・・・・・・双晶粒界。
Fig. 1 is a sectional view showing the basic configuration of a band-shaped silicon crystal growth apparatus, Fig. 2 is a sectional view illustrating the shape of the solid-liquid interface in the conventional apparatus, and Fig. 3 is a sectional view of the band-shaped silicon crystal grown in the conventional apparatus. A sectional view in the thickness direction, FIGS. 4a and 4b are a perspective view and a sectional view showing the configuration of essential parts of an embodiment of the present invention, and FIG. 5 illustrates the shape of the solid-liquid interface in the device of the embodiment. FIG. 6 is a cross-sectional view in the thickness direction of a band-shaped silicon crystal obtained by the apparatus of the same example. 11... Silicon melt, 12... Crucible, 1'z a t i 3b... Die, 14
a, 14b... Support rod, 15 a, 15 b
"" Main heater, 16... Band-shaped silicon crystal, 21... Solid-liquid interface, 31... Crystal irregularity, 32... Twin grain boundary, 41 ......Cooling plate, 43a, 43b...Cooling gas, 51...
...Solid-liquid interface, 61...Twin grain boundary.

Claims (1)

【特許請求の範囲】 1 シリコン融液を収容したルツボ内に、スリットを有
するダイを立設し、このスリット内を上昇したシリコン
融液に種子結晶を接触させ、この種子結晶を引上げて帯
状シリコン結晶を成長させる装置において、前記ダイの
スリット内中央部に冷却板を備え、ダイ先端部のシリコ
ン融液の温度を、スリット内中央部でダイ側よりも低温
の状態に制御することを特徴とする帯状シリコン結晶の
成長装置。 2 冷却板をガスにより冷却するようにしたことを特徴
とする特許請求の範囲第1項記載の帯状シリコン結晶の
成長装置。
[Claims] 1. A die having a slit is set up in a crucible containing a silicon melt, a seed crystal is brought into contact with the silicon melt rising inside the slit, and the seed crystal is pulled up to form a silicon band. The apparatus for growing a crystal is characterized in that a cooling plate is provided at the center of the slit of the die, and the temperature of the silicon melt at the tip of the die is controlled to be lower at the center of the slit than at the die side. A device for growing band-shaped silicon crystals. 2. The apparatus for growing a band-shaped silicon crystal according to claim 1, wherein the cooling plate is cooled by gas.
JP56145817A 1981-09-16 1981-09-16 Band-shaped silicon crystal growth device Expired JPS5932436B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56145817A JPS5932436B2 (en) 1981-09-16 1981-09-16 Band-shaped silicon crystal growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56145817A JPS5932436B2 (en) 1981-09-16 1981-09-16 Band-shaped silicon crystal growth device

Publications (2)

Publication Number Publication Date
JPS5849692A JPS5849692A (en) 1983-03-23
JPS5932436B2 true JPS5932436B2 (en) 1984-08-08

Family

ID=15393817

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56145817A Expired JPS5932436B2 (en) 1981-09-16 1981-09-16 Band-shaped silicon crystal growth device

Country Status (1)

Country Link
JP (1) JPS5932436B2 (en)

Also Published As

Publication number Publication date
JPS5849692A (en) 1983-03-23

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