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JPS5933076B2 - Laser processing equipment - Google Patents
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JPS5933076B2 - Laser processing equipment - Google Patents

Laser processing equipment

Info

Publication number
JPS5933076B2
JPS5933076B2 JP52034574A JP3457477A JPS5933076B2 JP S5933076 B2 JPS5933076 B2 JP S5933076B2 JP 52034574 A JP52034574 A JP 52034574A JP 3457477 A JP3457477 A JP 3457477A JP S5933076 B2 JPS5933076 B2 JP S5933076B2
Authority
JP
Japan
Prior art keywords
workpiece
detector
laser
condenser lens
condensing lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52034574A
Other languages
Japanese (ja)
Other versions
JPS53121295A (en
Inventor
幹雄 本郷
建興 宮内
克郎 水越
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP52034574A priority Critical patent/JPS5933076B2/en
Publication of JPS53121295A publication Critical patent/JPS53121295A/en
Publication of JPS5933076B2 publication Critical patent/JPS5933076B2/en
Expired legal-status Critical Current

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  • Laser Beam Processing (AREA)

Description

【発明の詳細な説明】 本発明は、自動焦点合せ機構を備えたレーザ加工装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a laser processing device equipped with an automatic focusing mechanism.

第1図に従来の自動焦点合せ機構を備えたレーザ加工装
置を示す。
FIG. 1 shows a conventional laser processing device equipped with an automatic focusing mechanism.

即ち、レーザ発振器1からのレーザ光を集光レンズ2で
載物台3上の被加工物4に照射して加工する。この時、
ハーフミラー6、8を配置して光源7からの平行光線L
を被加工物4VC照射し、反射光2は検出器9VC入る
。検出器9は集光レンズ2の焦点位置に対する被加工物
4の位置によつて異なる反射光1の出力差を検出し、そ
の出力差は増幅器10を介して制御機構11に送られる
。出力差の増減に応じて駆動機構5を作動させて載物台
3を上下動させることにより、焦点位置設定を行つてい
た。しかし、この装置は光学系が複雑であり、高出力レ
ーザによる加工の場合には、プラズマ等が発生し、照射
されたレーザ光がこのプラズマによつて吸収、散乱等を
受け、検出器9に入る反射光量が変化し、焦点ずれがな
いのに焦点が外れたように検出されてしまう欠点があつ
た。また被加工物の大きさによつては載物台の移動が困
難であるなどの欠点があつた。また、空気マイクロメー
タによつて被加工物からの距離の変化を測定して、焦点
を設定する方法もあるが、真空中では使用できないとい
う欠点があつた。本発明の目的は上記した従来技術の欠
点をなくし、被加工物の表面状態に関係なく位置の検出
ができるようにしたレーザ加工装置を提供するにある。
また本発明の他の目的は、真空中に卦いても何ら不都合
なく、しかも構造の簡単な自動位置合せ機構をもつレー
ザ加工装置を提供することにある。本発明は、被加工物
表面のレーザ光軸方向への位置変化を被加工物表面に生
ずるうず電流によるインダクタンスの変化または被加工
物表面との間の容量変化によつて検出し、インダクタン
スあるいは電気容量が一定となる様に集光レンズ、また
は検出器と共に集光レンズをレーザ光軸方向へ移動させ
、被加工物表面に集光レンズの焦点を一致させるように
したレーザ加工装置である。
That is, the workpiece 4 on the stage 3 is irradiated with laser light from the laser oscillator 1 using the condenser lens 2 to process the workpiece. At this time,
By arranging the half mirrors 6 and 8, parallel light rays L from the light source 7 are generated.
The workpiece is irradiated with 4 VC, and the reflected light 2 enters the detector 9 VC. The detector 9 detects the output difference of the reflected light 1 which varies depending on the position of the workpiece 4 with respect to the focal position of the condenser lens 2, and the output difference is sent to the control mechanism 11 via the amplifier 10. The focus position was set by operating the drive mechanism 5 to move the stage 3 up and down in accordance with an increase or decrease in the output difference. However, this device has a complicated optical system, and when processing with a high-power laser, plasma etc. are generated, and the irradiated laser light is absorbed, scattered, etc. by this plasma, and reaches the detector 9. The problem was that the amount of reflected light that entered the camera changed, resulting in it being detected as being out of focus even though there was no shift in focus. Further, there were drawbacks such as difficulty in moving the stage depending on the size of the workpiece. There is also a method of measuring the change in distance from the workpiece using an air micrometer to set the focus, but this method has the disadvantage that it cannot be used in a vacuum. SUMMARY OF THE INVENTION An object of the present invention is to eliminate the drawbacks of the prior art described above and to provide a laser processing apparatus that can detect the position of a workpiece regardless of its surface condition.
Another object of the present invention is to provide a laser processing apparatus which can be operated in a vacuum without any inconvenience, and which has an automatic positioning mechanism with a simple structure. The present invention detects a change in the position of the workpiece surface in the direction of the laser optical axis by detecting a change in inductance due to an eddy current generated on the workpiece surface or a capacitance change between the workpiece surface and the inductance or electric current. This is a laser processing device in which the condenser lens or the condenser lens is moved along with the detector in the direction of the laser optical axis so that the capacitance is constant, and the focus of the condenser lens is made to coincide with the surface of the workpiece.

以下に本発明による実施例を図に従つて説明する。Embodiments according to the present invention will be described below with reference to the drawings.

第2図は本発明のレーザ加工装置の一実施例を示すもの
で、レーザ発振器1から発振された例えば高出力のCO
2レーザ光は集光レンズ2によつて載物台3上に固定さ
れた金属製の被加工物4表面に集光照射される。
FIG. 2 shows an embodiment of the laser processing apparatus of the present invention, in which, for example, high-power CO
The two laser beams are condensed and irradiated by a condenser lens 2 onto the surface of a metal workpiece 4 fixed on a stage 3 .

この時集光レンズ2と一体 4化して設置されたインダ
クタンスまたは電気容量の変化を検出する検出器12に
よつて検出器12と被加工物4、即ち集光レンズ2と被
加工物4の距離を検出し、この距離が変化して検出器1
2VCよる出力が変化した場合には、制御装置11Vc
よつて検出器12と被加工物4の距離が設定された値と
なる様に駆動機構5を駆動して検出器12と集光レンズ
2が被加工物4表面から一定距離にある様にする。以上
の様に加工装置の対物レンズの焦点が常に被加工物4表
面上に自動的に設定できる。
At this time, the distance between the detector 12 and the workpiece 4, that is, the distance between the condenser lens 2 and the workpiece 4, is determined by the detector 12 that is installed integrally with the condenser lens 2 and detects changes in inductance or capacitance. is detected, and as this distance changes, detector 1
When the output by 2VC changes, the control device 11Vc
Therefore, the drive mechanism 5 is driven so that the distance between the detector 12 and the workpiece 4 becomes a set value, so that the detector 12 and the condenser lens 2 are at a constant distance from the surface of the workpiece 4. . As described above, the focus of the objective lens of the processing device can always be automatically set on the surface of the workpiece 4.

特に被加工物4は金属物質の平坦な面を有しているため
、インダクタンスまたは電気容量の変化を検出する検出
器によつて被加工物4の位置を精度よく測定することが
できる。次に第3図に他の実施例を示す。
In particular, since the workpiece 4 has a flat surface made of a metal material, the position of the workpiece 4 can be accurately measured by a detector that detects changes in inductance or capacitance. Next, FIG. 3 shows another embodiment.

これは低圧雰囲気中あるいは他の雰囲気中、例えばN2
,O2,Ar中でレーザ加工をする場合の実施例である
This may be done in a low pressure atmosphere or in another atmosphere, for example N2
, O2, and Ar.

レーザ発振器1より発振されたレーザ光は集光レンズ2
により集光され、加工雰囲気を保つためのケーシング1
4に取りつけられたレーザ光の波長に対して透明な窓1
3を透過して、載物台3上に設置された被加工物4表面
に照射し加工を行う。この時ケーシング14VC固定さ
れたインダクタンスまたは電気容量の変化を検出する検
出器12によつて検出器12と被加工物4表面の距離を
検出し、また検知器12′によつて集光レンズ2の位置
を検知する。ところでインダクタンスまたは電気容量の
変化する検出器12でケーシング14内に配置された被
加工物の表面を検出すれば、加工雰囲気に影響されるこ
となく被加工物の表面位置を精度良く検出することがで
きる。被加工物4の表面がレーザ光軸方向に変化した場
合、検出器12によつて変化量を検出し、集光レンズ2
の位置を検知する検知器12/による出力が、上記変化
量と同じ変化量を示すまで、制御機構11によつて駆動
機構5を駆動させてレンズ位置を移動させる。検出器1
2と検知器12′に同じ物を使用するか、あるいは変化
量に対する出力が同じになる様、較正して卦くことによ
り、検出器12と検知器121の出力を直接比較するこ
とができ、双方の出力が常に等しくなる様、集光レンズ
2の位置を制御するだけで、自動的に被加工物4表面に
焦点を合せることができる。(最初の設定は必要である
が)次に他の実施例を第4図に従つて説明する。
The laser beam oscillated by the laser oscillator 1 passes through the condensing lens 2
Casing 1 for concentrating the light and maintaining the processing atmosphere
Window 1 transparent to the wavelength of the laser light attached to 4
3 and irradiates the surface of the workpiece 4 placed on the stage 3 for processing. At this time, the distance between the detector 12 and the surface of the workpiece 4 is detected by the detector 12 that detects changes in the inductance or capacitance fixed to the casing 14VC, and the detector 12' detects the distance between the detector 12 and the surface of the workpiece 4. Detect location. By the way, if the surface of the workpiece placed in the casing 14 is detected by the detector 12 whose inductance or capacitance changes, it is possible to accurately detect the surface position of the workpiece without being affected by the processing atmosphere. can. When the surface of the workpiece 4 changes in the laser optical axis direction, the amount of change is detected by the detector 12, and the condenser lens 2
The drive mechanism 5 is driven by the control mechanism 11 to move the lens position until the output from the detector 12/ detecting the position shows the same amount of change as the above amount of change. Detector 1
The outputs of the detector 12 and the detector 121 can be directly compared by using the same thing as the detector 2 and the detector 12', or by calibrating them so that the outputs for the amount of change are the same. By simply controlling the position of the condensing lens 2 so that both outputs are always equal, it is possible to automatically focus on the surface of the workpiece 4. Next, another embodiment will be described with reference to FIG. 4 (although initial settings are necessary).

これはレーザによる動バランス取りを行うための加工装
置である。レーザ発振器1から発振されたレーザ光は集
光レンズ2により被加工物である回転体15に集光照射
される。回転体15は加工雰囲気を保つ、あるいは安全
のためのケーシング16に納められ、レーザ光はレーザ
光の波長を透過する窓を通して照射されを。また回転体
15VC.は回転体15の位相を検出するための位相検
出機構17が設置されていて、レーザ制御装置18によ
り、回転体15が高速回転中であつても=定の個所を照
射できる。ケーシング16に固定された検出器12によ
つて回転体15の加工部の位置変動を検出する。加工し
ようとする部分の位置出力と、集光レンズ2の位置を検
知する検知器12′の出力が等しくなる様、制御機構1
1VCよつて駆動機構5を駆動し、レンズ位置を移動さ
せる。第4図に示した様に、加工部と検出部が180動
ずれている場合を考える。
This is a processing device for performing dynamic balancing using a laser. Laser light emitted from a laser oscillator 1 is focused and irradiated onto a rotating body 15, which is a workpiece, by a condensing lens 2. The rotating body 15 is housed in a casing 16 for maintaining a processing atmosphere or for safety, and the laser beam is irradiated through a window that transmits the wavelength of the laser beam. Also, the rotating body 15VC. A phase detection mechanism 17 for detecting the phase of the rotating body 15 is installed, and a laser control device 18 allows irradiation to a fixed location even when the rotating body 15 is rotating at high speed. A detector 12 fixed to the casing 16 detects changes in the position of the processing portion of the rotating body 15. The control mechanism 1 is operated so that the position output of the part to be processed is equal to the output of the detector 12' that detects the position of the condensing lens 2.
1VC drives the drive mechanism 5 to move the lens position. As shown in FIG. 4, consider the case where the processing section and the detection section are shifted by 180 degrees.

細い軸に円板が取り付けられた様な回転体15を回転さ
せると、危険速度付近に卦いては偏心量によつては数M
mの振巾で振動する。その場合の検出器12の出力を変
位に変換した例を第5図に示す。しかし、加工部に卦い
ては第6図に示す様に位相が180加ずれているはずで
あるから、制御機構11で検出器12の出力の位相を1
800ずらす必要がある。ここで、第5図、第6図中の
変位X。
When rotating the rotating body 15, which has a disc attached to a thin shaft, the speed near the critical speed is several M depending on the amount of eccentricity.
It vibrates with an amplitude of m. FIG. 5 shows an example in which the output of the detector 12 in that case is converted into displacement. However, in the machining section, the phase should be shifted by 180 as shown in FIG.
It is necessary to shift it by 800. Here, the displacement X in FIGS. 5 and 6.

は、例えば静止時に卦ける集光レンズの焦点位置である
。ここで、第6図に卦けるT,vcレーザを発振してア
ンバランスを除去する場合、位相検出器17のフ出力を
参照してレーザ加工する位相に卦ける検出器12の出力
の位相を180るずらした時の出力に見合う量だけ検知
器12′によつてレンズ位置を検出しながら移動させる
is, for example, the focal position of the condenser lens when the object is at rest. Here, when removing the unbalance by oscillating the T, VC laser shown in Figure 6, the phase of the output of the detector 12 is determined by referring to the output of the phase detector 17 and the phase of the output of the detector 12 is calculated by referring to the output of the phase detector 17. The lens position is detected by the detector 12' and moved by an amount corresponding to the output when shifted by 180 degrees.

そして、レーザ加工する位相に同期をとつてレーザ照射
すれば良い。以上の様に回転体の動バランス取りに卦い
ては、レーザ照射する位相を設定するだけで自動的に焦
点を加工部表面に合すことができる。以上説明したよう
に本発明によれば、次の効果がある。
Then, laser irradiation may be performed in synchronization with the phase of laser processing. As described above, when it comes to dynamically balancing the rotating body, simply by setting the phase of laser irradiation, the focus can be automatically adjusted to the surface of the processed part. As explained above, the present invention has the following effects.

(1)焦点合せのための光学系を必要とせず、装置が簡
略化され安価にできる。
(1) There is no need for an optical system for focusing, making the device simple and inexpensive.

(2)高出力レーザの加工によつて生じるプラズマ等の
影響をなくして焦点合せを行うことができる。
(2) Focusing can be performed while eliminating the effects of plasma and the like caused by high-power laser processing.

(3)加工雰囲気に関係なく使用できる。(3) Can be used regardless of the processing atmosphere.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来技術によるレーザ加工装置の概略図、第2
図〜第4図は本発明によるレーザ加工装置の各々実施例
を示す概略図、第5図は第4図に示した実施例Vc卦け
る検出器による出力波形変位に変換した波形を示す図、
第6図は加工部VC卦ける変位波形を示す図である。 符号の説明、1・・・・・・レーザ発振器、2・・・・
・・集光レンズ、3・・・・・・載物台、4・・・・・
・被加工物、5・・・・・・駆動機構、11・・・・・
・制御機構、12・・・・・・検出器。
Figure 1 is a schematic diagram of a laser processing device according to the prior art;
4 are schematic diagrams showing respective embodiments of the laser processing apparatus according to the present invention, and FIG. 5 is a diagram showing a waveform converted into an output waveform displacement by the detector of the embodiment Vc shown in FIG. 4,
FIG. 6 is a diagram showing a displacement waveform of the processing section VC. Explanation of symbols, 1... Laser oscillator, 2...
・・Condensing lens, 3・・・・Product table, 4・・・・・
・Workpiece, 5... Drive mechanism, 11...
- Control mechanism, 12...detector.

Claims (1)

【特許請求の範囲】 1 照射されたレーザ光を集光する集光レンズを設け、
該集光レンズによつて集光されたレーザ光によつて、被
加工物をレーザ加工するレーザ加工装置において、被加
工物表面のレーザ光軸方向の位置を検出するように被加
工物表面に生ずるうず電流によるインダクタンスの変化
を検出する検出器または被加工物表面との間の電気容量
の変化を検出する検出器を設け、上記集光レンズをレー
ザ光軸方向に移動させるための駆動機構を設け、上記検
出器の出力によつて駆動機構を駆動して集光レンズの焦
点位置が常に被加工物表面に一致するようにしたことを
特徴とするレーザ加工装置。 2 集光レンズと検出器を一体化したことを特徴とする
特許請求の範囲第1項記載のレーザ加工装置。 3 照射されたレーザ光を集光する集光レンズを設け、
該集光レンズによつて集光されたレーザ光によつて被加
工物をレーザ加工するレーザ加工装置において、上記被
加工物を所定の雰囲気に設置するためのケーシングを設
け、該ケーシングにうず電流によるインダクタンスの変
化あるいは電気容量の変化により被加工物との間隔を検
出する検出器を設け、上記集光レンズの位置を検出する
検出器の出力に応じて集光レンズをレーザ光軸方向に移
動させる駆動機構を設け、検出器によつて検出された被
加工物の位置の変化に応じて集光レンズの位置を移動さ
せて、常に集光レンズの焦点が被加工物表面に一致する
ようにしたことを特徴とするレーザ加工装置。 4 照射されたレーザ光を集光する集光レンズを設け、
該集光レンズによつて集光されたレーザ光によつて被加
工物をレーザ加工するレーザ加工装置において、該被加
工物を回転体で形成し、被加工物表面の変動を検出する
検出器と、上記被加工物の回転位相を検出する位相検出
器とを設け、集光レンズの位置を検知する検知器の出力
に応じて集光レンズの位置をレーザ光軸方向に移動させ
る駆動機構を設け、上記検出器からの出力に応じて駆動
機構を制御してレーザ照射部の表面に集光レンズの焦点
を合せ、位相検出器からの信号にもとづいて被加工物の
回転位相に同期をとりながらレーザ光を照射するように
したことを特徴とするレーザ加工装置。
[Claims] 1. A condensing lens that condenses the irradiated laser beam is provided,
In a laser processing device that laser-processes a workpiece using a laser beam focused by the condenser lens, a laser beam is attached to the workpiece surface so as to detect the position of the workpiece surface in the laser optical axis direction. A detector for detecting a change in inductance due to the generated eddy current or a detector for detecting a change in capacitance with the surface of the workpiece is provided, and a drive mechanism for moving the condensing lens in the direction of the laser optical axis is provided. A laser processing apparatus characterized in that the drive mechanism is driven by the output of the detector so that the focal position of the condensing lens always coincides with the surface of the workpiece. 2. The laser processing device according to claim 1, characterized in that the condenser lens and the detector are integrated. 3 Provide a condensing lens that condenses the irradiated laser beam,
In a laser processing device that laser-processes a workpiece using a laser beam focused by the condenser lens, a casing for placing the workpiece in a predetermined atmosphere is provided, and an eddy current is applied to the casing. A detector is installed to detect the distance between the workpiece and the workpiece by changes in inductance or capacitance caused by the change in inductance, and the condenser lens is moved in the direction of the laser optical axis according to the output of the detector that detects the position of the condenser lens. A driving mechanism is provided to move the condenser lens according to changes in the position of the workpiece detected by the detector, so that the focus of the condenser lens always matches the surface of the workpiece. Laser processing equipment that is characterized by: 4 Provide a condensing lens that condenses the irradiated laser beam,
In a laser processing device that laser-processes a workpiece using a laser beam focused by the condenser lens, the workpiece is formed of a rotating body, and a detector detects fluctuations on the surface of the workpiece. and a phase detector for detecting the rotational phase of the workpiece, and a drive mechanism for moving the position of the condensing lens in the laser optical axis direction in accordance with the output of the detector for detecting the position of the condensing lens. The drive mechanism is controlled according to the output from the detector to focus the condensing lens on the surface of the laser irradiation part, and the rotational phase of the workpiece is synchronized based on the signal from the phase detector. A laser processing device characterized in that it irradiates laser light while
JP52034574A 1977-03-30 1977-03-30 Laser processing equipment Expired JPS5933076B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52034574A JPS5933076B2 (en) 1977-03-30 1977-03-30 Laser processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52034574A JPS5933076B2 (en) 1977-03-30 1977-03-30 Laser processing equipment

Publications (2)

Publication Number Publication Date
JPS53121295A JPS53121295A (en) 1978-10-23
JPS5933076B2 true JPS5933076B2 (en) 1984-08-13

Family

ID=12418086

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52034574A Expired JPS5933076B2 (en) 1977-03-30 1977-03-30 Laser processing equipment

Country Status (1)

Country Link
JP (1) JPS5933076B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59105223A (en) * 1982-12-07 1984-06-18 キヤノン株式会社 Input/output device
JPH0325816A (en) * 1989-06-23 1991-02-04 Sony Corp Lighting system for switch operating button
JPH0366127U (en) * 1989-10-31 1991-06-27

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57159286A (en) * 1981-03-27 1982-10-01 Mitsubishi Electric Corp Laser working device
JPS57159285A (en) * 1981-03-27 1982-10-01 Mitsubishi Electric Corp Laser working device
JPS59193783A (en) * 1983-04-18 1984-11-02 Mitsubishi Electric Corp Pipe cutter
JPS59223189A (en) * 1983-06-03 1984-12-14 Mitsubishi Heavy Ind Ltd Laser working device
JPS6011185U (en) * 1983-06-28 1985-01-25 株式会社 アマダ Processing head nozzle lifting device
JPS60171684U (en) * 1984-04-20 1985-11-14 三洋電機株式会社 Laser processing equipment
JPS6267690U (en) * 1985-10-18 1987-04-27
KR101046953B1 (en) * 2011-01-20 2011-07-06 주식회사 엘티에스 Selective emitter manufacturing device for solar cell using laser

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59105223A (en) * 1982-12-07 1984-06-18 キヤノン株式会社 Input/output device
JPH0325816A (en) * 1989-06-23 1991-02-04 Sony Corp Lighting system for switch operating button
JPH0366127U (en) * 1989-10-31 1991-06-27

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