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JPS5933849B2 - Atmosphere material testing equipment - Google Patents
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JPS5933849B2 - Atmosphere material testing equipment - Google Patents

Atmosphere material testing equipment

Info

Publication number
JPS5933849B2
JPS5933849B2 JP11420482A JP11420482A JPS5933849B2 JP S5933849 B2 JPS5933849 B2 JP S5933849B2 JP 11420482 A JP11420482 A JP 11420482A JP 11420482 A JP11420482 A JP 11420482A JP S5933849 B2 JPS5933849 B2 JP S5933849B2
Authority
JP
Japan
Prior art keywords
test piece
peripheral wall
chucking
vacuum chamber
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11420482A
Other languages
Japanese (ja)
Other versions
JPS593240A (en
Inventor
輝雄 松場
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP11420482A priority Critical patent/JPS5933849B2/en
Publication of JPS593240A publication Critical patent/JPS593240A/en
Publication of JPS5933849B2 publication Critical patent/JPS5933849B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

【発明の詳細な説明】 この発明は、各種の環境下で材料強度を評価するための
試験装置、例えば試験片を真空チャンバなどの雰囲気チ
ャンバ内に配置し、材料試験する雰囲気材料試験装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a testing device for evaluating material strength under various environments, for example, an atmospheric material testing device for placing a test piece in an atmospheric chamber such as a vacuum chamber and testing the material. It is.

試験片を真空チャンバ内に配置し、材料試験するとき、
一対のチャッキングロッドを真空チャンバ内に突出させ
た試験装置が一般に使用されている。
When placing a specimen in a vacuum chamber and testing the material,
A test device in which a pair of chucking rods protrude into a vacuum chamber is commonly used.

試験片の長さ方向両端を一対のチャッキングロッドによ
つて把持し、一対のチャッキングロッドを相対的に変位
させると、試験片に引張荷重などの試験荷重を与えるこ
とができる。しかしながら、試験片の長さ方向両端を把
持するとき、真空チャンバの外部から試験片を操作せね
ばならない。従来、外部から試験片を操作し、その長さ
方向両端をチャッキングロッドによつて把持するのは、
容易ではなかつた。試験後、試験片の長さ方向両端をチ
ャッキングロッドから取り外すのも、同様であつた。こ
の発明は、この種の雰囲気材料試験機において、試験片
の長さ方向両端をチャッキングロッドによつて容易に把
持し、チャッキングロッドから容易に取り外すことがで
きるようにすべくなされたものである。
By gripping both lengthwise ends of the test piece with a pair of chucking rods and relatively displacing the pair of chucking rods, a test load such as a tensile load can be applied to the test piece. However, when gripping both lengthwise ends of the test piece, the test piece must be manipulated from outside the vacuum chamber. Conventionally, the test specimen was manipulated from the outside and gripped at both longitudinal ends with chucking rods.
It wasn't easy. After the test, both lengthwise ends of the test piece were removed from the chucking rod in the same manner. The present invention has been made to enable an atmospheric material testing machine of this type to easily grasp both lengthwise ends of a test piece with a chucking rod and easily remove it from the chucking rod. be.

特に、この発明は、真空チャンバなどの雰囲気チャンバ
の周壁を試験片の長さ方向に少なくとも2つに分割し、
分割した周壁を少なくとも2重筒状に、かつ試験片の長
さ方向に伸縮可能に嵌合し、雰囲気チャンバの周壁を一
対のチャッキングロッド間の領域から取り除くことがで
きるよう構成したことを特徴とするものである。以下、
この発明の実施例を図面について説明する。第1図にお
いて、試験片1は真空チャンバ2内に配置されている。
In particular, this invention divides the peripheral wall of an atmosphere chamber such as a vacuum chamber into at least two parts in the length direction of a test piece,
The divided peripheral wall is fitted in at least a double cylindrical shape and expandable and contractable in the length direction of the test piece, and the peripheral wall of the atmosphere chamber is configured to be removed from the area between the pair of chucking rods. That is. below,
Embodiments of the invention will be described with reference to the drawings. In FIG. 1, a test piece 1 is placed in a vacuum chamber 2. In FIG.

試験片1の長さ方向両端は、上下一対のチャッキングロ
ッド3H、3Lによつて把持されている、上側のチャッ
キングロッド3Hは上方から真空チャンバ2内に突出し
、下側のチャッキングロッド3Lは下方から真空チャン
バ2内に突出している。チャッキングロッド3Hの突出
量は小さく、チャッキングロッド3Lの突出量は大きい
。真空チャンバ2は、上下一対の端壁4H、4Lと、上
下方向、すなわち試験片1の長さ方向に2つに分割され
た周壁5H、5Lを有する。
Both longitudinal ends of the test piece 1 are held by a pair of upper and lower chucking rods 3H and 3L. The upper chucking rod 3H protrudes from above into the vacuum chamber 2, and the lower chucking rod 3L protrudes into the vacuum chamber 2 from below. The amount of protrusion of the chucking rod 3H is small, and the amount of protrusion of the chucking rod 3L is large. The vacuum chamber 2 has a pair of upper and lower end walls 4H and 4L, and peripheral walls 5H and 5L that are divided into two in the vertical direction, that is, in the length direction of the test piece 1.

上下一対の端壁4H、4Lは、チャッキングロッド3H
、3Lと一体に形成されている。分割された周壁5H、
5Lは、2重筒状に、かつ上下方向、すなわち試験片1
の長さ方向に伸縮可能に嵌合されている。上側の周壁5
Hは、上側の端壁4Hに上下方向に相対的に変位可能に
、かつ分離可能に嵌合され、スライダ6に連結されてい
る。下側の周壁5Lは、下側の端壁4Lに固定されてい
る。端壁4Hと周壁5H間、周壁5H,5L間および周
壁5Lと端壁4L間はそれぞれシールリング7によつて
密封されている。真空チヤンバ2内は、真空ポンプPに
よつて真空排気される。
The pair of upper and lower end walls 4H and 4L are the chucking rods 3H.
, 3L. Divided peripheral wall 5H,
5L is double cylindrical and in the vertical direction, that is, test piece 1
are fitted so that they can expand and contract in the length direction. Upper peripheral wall 5
H is fitted into the upper end wall 4H so as to be relatively displaceable in the vertical direction and separable, and connected to the slider 6. The lower peripheral wall 5L is fixed to the lower end wall 4L. Seal rings 7 are used to seal between the end wall 4H and the peripheral wall 5H, between the peripheral walls 5H and 5L, and between the peripheral wall 5L and the end wall 4L. The inside of the vacuum chamber 2 is evacuated by a vacuum pump P.

試験片1は、加熱炉8によつて加熱され、高温に保持さ
れる。加熱炉8は、第2回に示されているように真空チ
ヤンバ2の上側の周壁5Hを包囲する楕円反射鏡9と、
その集点に配置された一対の赤外ランプ10とからなる
。反射鏡9は、径方向に2つに分割されている。真空チ
ヤンバ2の上側の周壁5Hは耐熱透明材料によつて成型
され、赤外ランプ10の赤外線は反射鏡9によつて反射
された後、周壁5Hを通過する。試験片1は、幅射熱に
よ?て加熱される。したがつて、試験片1の昇温および
降温に要する時間は短かい。チヤツキングロツド3H,
3Lは、その内部流路11を循環する冷却水によつて冷
却される。この実施例では、試験片1の伸びなどの変形
を検出する差動トランスなどの検出器12が下側のチヤ
ツキングロツド3Lと下側の周壁5L間に配置されてい
る。検出器12は、アーム13によつて試験片1の一対
の標点から垂下されている。前述したように、真空チヤ
ンバ2内への下側のチヤツキングロツド3Lの突出量は
大きい。したがつて、検出器12を試験片1から離して
真空チヤンバ2内に配置することができ、熱から保護す
ることができ、その損傷を防止することができる。前記
のように構成された雰囲気材料試験装置において、真空
チヤンバ2内を真空排気し、試験片1を加熱した後、一
対のチヤツキングロツド3H,3Lを上下方向に相対的
に変位させると、試験片1に引張荷重などの試験荷重を
与えることができる。したがつて、試験片1を真空高温
材料試験することができる。真空チヤンバ2の上側の周
壁5Hは、上側の端壁4Hまたは下側の周壁5Lに対し
土下方向に相対的に変位し、チヤツキングロツド3H,
3Lの変位を吸収する。試験片1の長さ方向両端をチヤ
ツキングロツド3H,3Lによつて把持するとき、加熱
炉8の反射鏡9は径方向に2つに分割されているため、
径方向に変位させ、分離させること楽できる。
The test piece 1 is heated by a heating furnace 8 and kept at a high temperature. The heating furnace 8 includes an elliptical reflecting mirror 9 surrounding the upper peripheral wall 5H of the vacuum chamber 2 as shown in the second part,
It consists of a pair of infrared lamps 10 arranged at the focal point. The reflecting mirror 9 is divided into two parts in the radial direction. The upper peripheral wall 5H of the vacuum chamber 2 is made of a heat-resistant transparent material, and the infrared rays of the infrared lamp 10 are reflected by the reflecting mirror 9 and then pass through the peripheral wall 5H. Is test piece 1 affected by radiant heat? and heated. Therefore, the time required to raise and lower the temperature of the test piece 1 is short. Chucking rod 3H,
3L is cooled by cooling water circulating through its internal flow path 11. In this embodiment, a detector 12 such as a differential transformer for detecting deformation such as elongation of the test piece 1 is arranged between the lower chucking rod 3L and the lower peripheral wall 5L. The detector 12 is suspended from a pair of gauge points on the test piece 1 by an arm 13 . As mentioned above, the amount of protrusion of the lower chucking rod 3L into the vacuum chamber 2 is large. Therefore, the detector 12 can be placed in the vacuum chamber 2 away from the test piece 1 and can be protected from heat and prevented from being damaged. In the atmospheric material testing apparatus configured as described above, after evacuating the vacuum chamber 2 and heating the test piece 1, the pair of chucking rods 3H and 3L are relatively displaced in the vertical direction. , a test load such as a tensile load can be applied to the test piece 1. Therefore, the test piece 1 can be subjected to a vacuum high temperature material test. The upper peripheral wall 5H of the vacuum chamber 2 is relatively displaced in the direction of the soil with respect to the upper end wall 4H or the lower peripheral wall 5L, and the chucking rod 3H,
Absorbs 3L displacement. When holding both lengthwise ends of the test piece 1 with the chucking rods 3H and 3L, since the reflector 9 of the heating furnace 8 is divided into two in the radial direction,
It can be easily displaced and separated in the radial direction.

したがつて、加熱炉8を真空チヤンバ2のまわりから取
り除き、真空チヤンバ2を露出させることができる。そ
の後、スライダ6を下方にスライドさせると、真空チヤ
ンバ2の上側の周壁5Hがスライダ6と一体的に下方に
変位する。上側の周壁5Hは、上側の端壁4Hから分離
され、下側の周壁5Lの外周に重ね合わされる。したが
つて、周壁5H,5L全体が試験片1の長さ方向に縮少
されるものである。これによつて、上側の周壁5Hが一
対のチヤツキングロツド3H,3L間の領域から取り除
かれ、チヤツキングロツド3H,3L間の領域は外部に
開放される。真空チヤンバ2内への上側のチヤツキング
ロツド3Hの突出量は小さく、下側のチヤツキングロツ
ド3Lの突出量は大きいため、上側の周壁5Hを下方に
変位させるとチヤツキング田ンド3H,3L間の領域は
完全に開放される。したがつて、試験片1をチヤツキン
グロツド3H,3L間に容易に挿入することができ、長
さ方向両端をチヤツキングロツド3H,3Lによつて容
易に把持することができる。検出器12も、アーム13
によつて試験片1の標点から容易に垂下させることがで
き、下側のチヤツキングロツド3Lと下側の周壁5L間
に容易に配置することができる。その後、スライダ6を
上方に変位させると、上側の周壁5Hが上方に変位し、
周壁5H,5L全体は試験片1の長さ方向に伸長する。
Therefore, the heating furnace 8 can be removed from around the vacuum chamber 2 to expose the vacuum chamber 2. Thereafter, when the slider 6 is slid downward, the upper peripheral wall 5H of the vacuum chamber 2 is displaced downward together with the slider 6. The upper peripheral wall 5H is separated from the upper end wall 4H and overlapped with the outer periphery of the lower peripheral wall 5L. Therefore, the entire peripheral walls 5H and 5L are reduced in the length direction of the test piece 1. As a result, the upper peripheral wall 5H is removed from the region between the pair of chucking rods 3H and 3L, and the region between the chucking rods 3H and 3L is opened to the outside. The amount of protrusion of the upper chucking rod 3H into the vacuum chamber 2 is small, and the amount of protrusion of the lower chucking rod 3L is large, so when the upper peripheral wall 5H is displaced downward, the chucking rod 3H , 3L is completely opened. Therefore, the test piece 1 can be easily inserted between the chucking rods 3H and 3L, and both lengthwise ends can be easily gripped by the chucking rods 3H and 3L. The detector 12 and the arm 13
Therefore, it can be easily suspended from the gage of the test piece 1, and can be easily placed between the lower chucking rod 3L and the lower peripheral wall 5L. Thereafter, when the slider 6 is displaced upward, the upper peripheral wall 5H is displaced upward,
The entire peripheral walls 5H and 5L extend in the length direction of the test piece 1.

上側の周壁5Hは、上側の端壁4Hに嵌合され、シール
リング7によつて密封される。その後、真空チヤンバ2
を加熱炉8の反射鏡9によつて包囲し、真空チヤンバ2
を真空排気するとともに、試験片1を加熱すると、試験
片1を真空高温材料試験することができるのは、前述し
たとおりである。試験後、試験片1の長さ方向両端をチ
ヤツキングロツド3H,3Lから取り外すのも、同様で
あり、容易に取り外すことができる。
The upper peripheral wall 5H is fitted into the upper end wall 4H and sealed by the seal ring 7. After that, vacuum chamber 2
is surrounded by the reflecting mirror 9 of the heating furnace 8, and the vacuum chamber 2
As described above, if the test piece 1 is evacuated and the test piece 1 is heated, the test piece 1 can be subjected to a vacuum high-temperature material test. After the test, both lengthwise ends of the test piece 1 can be removed from the chucking rods 3H and 3L in the same manner and can be easily removed.

なお、この発明には、前記実施例の他に種々の変形例が
考えられる。
It should be noted that various modifications of the present invention are possible in addition to the above-mentioned embodiments.

前記実施例では真空チヤンバ2の周壁を試験片1の長さ
方向に2つに分割した場合について説明したが、場合に
よつては3つ以上に分割してもよい。分割した周壁を3
重筒以一上に嵌合することも可能である。第3図は周壁
を4つに分割し、3重筒状に嵌合したものを示す。すな
わち、上側の周壁5H1中間周壁5Mおよび下側の周壁
5Lを3重筒状に嵌合し、上側の周壁5Hをさらに上側
の周壁5H′に嵌合した構成を示すものである。周壁5
H′は所定位置に固定され、ベローズ14によつて端壁
4Hに連結されている。ベローズ14は、周壁5H′と
端壁4H間を密封するとともに、上下方向に伸縮し、端
壁4Hの変位を吸収する。チヤツキングロツド3H,3
L間を外部に開放するとき、周壁5Hを下方に変位させ
るとそのストツパ一15が周壁5Mに接触し、周壁5M
をスプリング16の弾性に抗して下方に変位させること
ができる。したがつて、周壁5H,5M,5L全体を効
果的に伸縮させることができる。この発明は、試験片を
真空チヤンバではなく、高圧チヤンバなどの他の雰囲気
チヤンバに配置する試験装置に適用することもできる。
In the above embodiment, a case has been described in which the peripheral wall of the vacuum chamber 2 is divided into two in the length direction of the test piece 1, but it may be divided into three or more parts depending on the case. Divided surrounding wall into 3
It is also possible to fit more than one cylinder. FIG. 3 shows a structure in which the peripheral wall is divided into four parts and fitted together in a triple cylinder shape. That is, the upper peripheral wall 5H1, the intermediate peripheral wall 5M, and the lower peripheral wall 5L are fitted into a triple cylinder shape, and the upper peripheral wall 5H is further fitted into the upper peripheral wall 5H'. Peripheral wall 5
H' is fixed in place and connected to end wall 4H by bellows 14. The bellows 14 seals between the peripheral wall 5H' and the end wall 4H, expands and contracts in the vertical direction, and absorbs displacement of the end wall 4H. Chucking rod 3H, 3
When opening the space between L to the outside, when the peripheral wall 5H is displaced downward, the stopper 15 contacts the peripheral wall 5M, and the peripheral wall 5M
can be displaced downward against the elasticity of the spring 16. Therefore, the entire peripheral walls 5H, 5M, and 5L can be effectively expanded and contracted. The present invention can also be applied to test equipment in which the test piece is placed in another atmospheric chamber, such as a high-pressure chamber, rather than a vacuum chamber.

以上説明したように、この発明は、雰囲気チヤンバの周
壁を試験片の長さ方向に少なくとも2つに分割し、分割
した周壁を少なくとも2重筒状に、かつ試験片の長さ方
向に伸縮可能に嵌合したから、雰囲気チヤンバの周壁を
一対のチヤツキングロツド間の領域から簡単に取り除く
ことができる。
As explained above, the present invention divides the peripheral wall of the atmosphere chamber into at least two parts in the length direction of the test piece, and the divided peripheral wall has at least a double cylindrical shape and can be expanded and contracted in the length direction of the test piece. 2, the peripheral wall of the atmosphere chamber can be easily removed from the area between the pair of chucking rods.

したがつて、試験片の長さ方向両端を一対のチヤツキン
グロツドによつて容易に把持することができ、チヤツキ
ングロツドから容易に取り外すことができるとともに、
伸び計の操作も容易にできるものである。
Therefore, both lengthwise ends of the test piece can be easily gripped by a pair of chucking rods, and can be easily removed from the chucking rods.
The extensometer can also be easily operated.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示す縦断面図、第2図は
第1図の横断面図、第3図は第1図の変形例を示す縦断
面図である。 1・・・・・・試験片、2・・・・・・真空チヤンバ(
雰囲気チヤンバ)、3H,3L・・・・・・チヤツキン
グロツド、5H,5H′,5M,5L・・・・・・周壁
FIG. 1 is a longitudinal cross-sectional view showing an embodiment of the invention, FIG. 2 is a cross-sectional view of FIG. 1, and FIG. 3 is a longitudinal cross-sectional view showing a modification of FIG. 1. 1... Test piece, 2... Vacuum chamber (
atmosphere chamber), 3H, 3L...chucking rod, 5H, 5H', 5M, 5L...peripheral wall.

Claims (1)

【特許請求の範囲】[Claims] 1 雰囲気チャンバ内に配置した試験片の長さ方向両端
を一対のチャッキングロッドによつて把持し、前記一対
のチャッキングロッドを相対的に変位させ、これによつ
て試験片に試験荷重を与えるようにした装置において、
前記雰囲気チャンバの周壁を試験片の長さ方向に少なく
とも2つに分割し、分割した周壁を少なくとも2重筒状
に、かつ試験片の長さ方向に伸縮可能に嵌合し、前記周
壁を前記一対のチャッキングロッド間の領域から取り除
くことができるよう構成したことを特徴とする雰囲気材
料試験装置。
1. Grip both lengthwise ends of a test piece placed in an atmosphere chamber with a pair of chucking rods, and relatively displace the pair of chucking rods, thereby applying a test load to the test piece. In a device made like this,
The peripheral wall of the atmosphere chamber is divided into at least two parts in the length direction of the test piece, and the divided peripheral wall is fitted in at least a double cylinder shape so as to be expandable and contractible in the length direction of the test piece. An atmospheric material testing device characterized by being configured such that it can be removed from an area between a pair of chucking rods.
JP11420482A 1982-06-29 1982-06-29 Atmosphere material testing equipment Expired JPS5933849B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11420482A JPS5933849B2 (en) 1982-06-29 1982-06-29 Atmosphere material testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11420482A JPS5933849B2 (en) 1982-06-29 1982-06-29 Atmosphere material testing equipment

Publications (2)

Publication Number Publication Date
JPS593240A JPS593240A (en) 1984-01-09
JPS5933849B2 true JPS5933849B2 (en) 1984-08-18

Family

ID=14631809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11420482A Expired JPS5933849B2 (en) 1982-06-29 1982-06-29 Atmosphere material testing equipment

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JP (1) JPS5933849B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61232999A (en) * 1985-04-08 1986-10-17 工業技術院長 Composite environmental test apparatus
JPH0627698B2 (en) * 1985-04-08 1994-04-13 工業技術院長 Specimen mounting device for compound environment test equipment
JP2015014596A (en) * 2013-06-08 2015-01-22 株式会社山本金属製作所 Cantilever type rotary-bending fatigue testing apparatus under high temperature environment

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Publication number Publication date
JPS593240A (en) 1984-01-09

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