JPS5934680B2 - Single crystal manufacturing method - Google Patents
Single crystal manufacturing methodInfo
- Publication number
- JPS5934680B2 JPS5934680B2 JP459381A JP459381A JPS5934680B2 JP S5934680 B2 JPS5934680 B2 JP S5934680B2 JP 459381 A JP459381 A JP 459381A JP 459381 A JP459381 A JP 459381A JP S5934680 B2 JPS5934680 B2 JP S5934680B2
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- crystal
- single crystal
- gap
- rpm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
本発明は例えばGaP、GaAs* IaP などの
高い分解圧を有する化合物半導体結晶を液体カプセル引
上げ法により製造する方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing a compound semiconductor crystal having a high decomposition pressure, such as GaP or GaAs*IaP, by a liquid capsule pulling method.
図面は液体カプセル法によるGaP単結晶成長装置の説
明図で、圧力容器1内部の石英るつぼ2内に収容したG
aP融液3および液体カプセル材であるB2O34はカ
ーボンヒーター5により刀l熱溶解され、GaP 3の
液面はB2034で覆われる。The drawing is an explanatory diagram of a GaP single crystal growth apparatus using the liquid capsule method.
The aP melt 3 and the liquid encapsulant B2O34 are thermally melted by the carbon heater 5, and the liquid surface of the GaP 3 is covered with B2034.
圧力容器1内部はあらかじめ真空置換によりN2ガスで
満たされ、温度上昇と共に加圧して溶融時には70気圧
程度に保ってGaPの分解、蒸発を防ぐ。The inside of the pressure vessel 1 is filled in advance with N2 gas by vacuum displacement, and as the temperature rises, the pressure is increased and maintained at about 70 atmospheres during melting to prevent decomposition and evaporation of GaP.
その状態で種結晶6をB2034層を通してGaP溶融
液に浸漬して回転(矢印)させながら徐々に引上げ、G
aP単結晶7を作成する。In this state, the seed crystal 6 is immersed in the GaP melt through the B2034 layer and gradually pulled up while rotating (arrow).
An aP single crystal 7 is created.
GaPは融点(1470℃)で、32気圧の解離圧をも
ち、分解、蒸発を防ぐためGaP融液をB2O3融液で
覆う。GaP has a melting point (1470°C) and a dissociation pressure of 32 atmospheres, and the GaP melt is covered with a B2O3 melt to prevent decomposition and evaporation.
B2O3は溶融状態でも粘性が高く、熱伝導度は低いた
めB2O3で覆われたGaP溶液は液面下の温度勾配が
小さくなり、過冷却し易(、しばしば成長中に多結晶を
発生してしまう。B2O3 has high viscosity even in its molten state and low thermal conductivity, so a GaP solution covered with B2O3 has a small temperature gradient below the liquid surface and is easily supercooled (and often forms polycrystals during growth). .
特に種結晶付けから成長結晶が所定の大きさになる迄の
いわゆるヘッド部の成長はB2O3中で進行するため熱
放散が不十分で溶液を徐々に冷却しなげればならないの
で一層過冷却し易い。In particular, the growth of the so-called head portion, from seed crystal attachment until the grown crystal reaches a predetermined size, progresses in B2O3, so heat dissipation is insufficient and the solution must be gradually cooled, making it more likely to be supercooled. .
ヘッド部の成長が終ると成長結晶がB2O3上に露出し
てくるため今度は急激に熱放散が良くなって急成長が起
る。When the growth of the head portion is completed, the growing crystal is exposed on B2O3, so that heat dissipation improves rapidly and rapid growth occurs.
ヘッド部の成長でGaP溶液が過冷却しているのでこの
急成長は一層加速され直径制御は非常に困難となり、多
結晶化の原因にもなる。Since the GaP solution is supercooled due to the growth of the head portion, this rapid growth is further accelerated, making diameter control extremely difficult and also causing polycrystalization.
一度大きく変動した直径を一定に戻すことは非常に難し
い。It is extremely difficult to return to a constant diameter once it has fluctuated greatly.
従来法では種結晶およびるつぼの回転数は固定され、例
えば種結晶10 r−p−m−るつぼ20r。In the conventional method, the rotational speeds of the seed crystal and crucible are fixed, for example, seed crystal 10 rpm crucible 20 r.
p−m−で一定のまま温度を徐冷しながら結晶成長を行
なう。Crystal growth is performed while slowly cooling the temperature while keeping it constant at pm-.
種結晶付けから引上げ終了迄に徐冷する降温量はるつぼ
底部で約50℃になる。The amount of gradual cooling from seed crystal formation to completion of pulling is approximately 50° C. at the bottom of the crucible.
溶液全体の過冷却をより小さくして直径の変動や多結晶
化による歩留り低下を防ぐためにはこの降温量を小さく
することが効果的である。It is effective to reduce the amount of temperature drop in order to reduce the supercooling of the entire solution and prevent a decrease in yield due to diameter fluctuations and polycrystalization.
本発明は直径の変動や多結晶化を少なくし、高品質、高
歩留りで化合物半導体単結晶を製造する方法を提供する
ものである。The present invention provides a method for manufacturing compound semiconductor single crystals with high quality and high yield while reducing diameter fluctuations and polycrystallization.
即ち種結晶とるつぼを同一方向に回転し、かつ両者の回
転速度に差をつげておき、遅い方の回転数を結晶が成長
するにつれて徐々に増加させてゆ(ことにより、るつぼ
内の温度分布が直径変動や多結晶の発生し易い方向へ変
化してゆくのを修正することができる。That is, the seed crystal and the crucible are rotated in the same direction, the rotational speeds of the two are kept different, and the slower rotational speed is gradually increased as the crystal grows (thereby, the temperature distribution inside the crucible is It is possible to correct changes in the direction in which diameter fluctuations and polycrystals are likely to occur.
このような回転変化により結晶成長過程の降温量はるつ
ぼ底部で20係程度少なくなり、溶液の過冷却を減少さ
せる効果があると考えられる。Due to such rotational changes, the amount of temperature drop during the crystal growth process is reduced by about 20 factors at the bottom of the crucible, which is thought to have the effect of reducing supercooling of the solution.
1 以下に本発明をGaP単結晶の作成に適用した実施
例により説明する。1 The present invention will be explained below using an example in which the present invention is applied to the production of a GaP single crystal.
第1表に実施例の1〜3と従来法との回転数条件と結晶
成長の結果を並記して示した。Table 1 shows the rotational speed conditions and crystal growth results for Examples 1 to 3 and the conventional method.
尚引上げ装置は従来例(図面)に示したものを用いた。The lifting device shown in the conventional example (drawing) was used.
この表から明らかのように、種結晶回転5rpm。As is clear from this table, the seed crystal rotation is 5 rpm.
るつぼ回転30 で一定のまま引上げた従来pm
法では、径変動が大きく、20回の引上実験で平均50
φ±12叫であるのに対し、実施例1ではるつぼを20
rpmでニ定とし、種結晶を5rpmから始めて0.0
5 rpm /分で漸増して引上げることにより5回の
平均で50φ±5mに向上した。In the conventional pm method, in which the crucible is pulled at a constant rotation of 30°, the diameter fluctuates greatly, and the average diameter was 50° in 20 pulling experiments.
The diameter of the crucible in Example 1 was φ±12, whereas in Example 1 the crucible was
The rpm is constant, and the seed crystal is set at 0.0 rpm starting from 5 rpm.
By gradually increasing the pulling rate at 5 rpm/min, the diameter increased to 50φ±5m on average over 5 times.
実施例2では従来例と同じ回転数から始めて種結晶を0
.2rpm/分で増加してゆくことにより5回の平均で
50φ±4門になった。In Example 2, starting from the same rotation speed as the conventional example, the seed crystal was set to 0.
.. By increasing the speed at 2 rpm/min, the average of 5 times was 50φ±4.
実施例3では逆に種結晶30 rpm、るつぼ5rpm
から始めてるつぼを0.1 rpm /分で増加してゆ
(ことにより同じ(5回平均で50φ±4mmになった
。In Example 3, the seed crystal speed was 30 rpm and the crucible speed was 5 rpm.
Starting from , the pressure point was increased at 0.1 rpm/min.
しかも従来法で多結晶発生率が20係程度あったものが
実施例の15回で全く発生しな(なった。In addition, although the polycrystal generation rate was about 20 times in the conventional method, it did not occur at all in 15 times in the example.
図面は液体カプセル法に用いられるGaP単結晶成長装
置の断面図である。
1・・・圧力容器、2・・・石英るつぼ、3・・・Ga
P融液、4・・・R2O3,5・・・カーボンヒーター
、6・・・種結晶、7・・・GaP単結晶。The figure is a cross-sectional view of a GaP single crystal growth apparatus used in the liquid capsule method. 1... Pressure vessel, 2... Quartz crucible, 3... Ga
P melt, 4... R2O3, 5... Carbon heater, 6... Seed crystal, 7... GaP single crystal.
Claims (1)
成するにあたり、種結晶とるつぼを同一方向に回転させ
、かつ相対的に差のある回転速度から始めて相対回転速
度がOになる方向に回転速度を制御することを特徴とす
る単結晶の製造方法。1. When creating a compound semiconductor crystal by the liquid capsule pulling method, the seed crystal and the crucible are rotated in the same direction, and the rotational speed is controlled in the direction where the relative rotational speed becomes O, starting from a rotational speed with a relative difference. A method for producing a single crystal characterized by the following.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP459381A JPS5934680B2 (en) | 1981-01-17 | 1981-01-17 | Single crystal manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP459381A JPS5934680B2 (en) | 1981-01-17 | 1981-01-17 | Single crystal manufacturing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57123887A JPS57123887A (en) | 1982-08-02 |
| JPS5934680B2 true JPS5934680B2 (en) | 1984-08-23 |
Family
ID=11588335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP459381A Expired JPS5934680B2 (en) | 1981-01-17 | 1981-01-17 | Single crystal manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5934680B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02293394A (en) * | 1989-04-18 | 1990-12-04 | Ind Technol Res Inst | Production of single-crystalline compound semiconductor |
-
1981
- 1981-01-17 JP JP459381A patent/JPS5934680B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57123887A (en) | 1982-08-02 |
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