JPS5935180B2 - IC lead joining method - Google Patents
IC lead joining methodInfo
- Publication number
- JPS5935180B2 JPS5935180B2 JP12631076A JP12631076A JPS5935180B2 JP S5935180 B2 JPS5935180 B2 JP S5935180B2 JP 12631076 A JP12631076 A JP 12631076A JP 12631076 A JP12631076 A JP 12631076A JP S5935180 B2 JPS5935180 B2 JP S5935180B2
- Authority
- JP
- Japan
- Prior art keywords
- lead
- brazing material
- lead frame
- leads
- conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title claims description 14
- 238000005304 joining Methods 0.000 title claims description 10
- 239000000463 material Substances 0.000 claims description 38
- 238000005219 brazing Methods 0.000 claims description 30
- 239000004020 conductor Substances 0.000 claims description 25
- 239000000919 ceramic Substances 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 12
- 238000007740 vapor deposition Methods 0.000 claims description 4
- 239000010409 thin film Substances 0.000 description 12
- 229910000679 solder Inorganic materials 0.000 description 6
- 238000005253 cladding Methods 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000002788 crimping Methods 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Lead Frames For Integrated Circuits (AREA)
Description
【発明の詳細な説明】
この発明はIC用セラミック基板上に蒸着形成された薄
膜導体端部にリード端子を接合する場合のICリードの
改良された接合法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improved IC lead joining method for joining a lead terminal to the end of a thin film conductor deposited on a ceramic substrate for IC.
従来よりICリードの接合法としては、帯状ロウ材をク
ラッド圧接した所謂クラッド材リードフレームを用いる
方法と通常のリードフレームをロウ材によつて直接加熱
接合する方法が知られている。Conventionally, methods for joining IC leads include a method using a so-called clad lead frame in which a band-shaped brazing material is pressure-welded to the clad, and a method of directly heating and joining an ordinary lead frame with a brazing material.
前者においては、先ずAg材(Agが71〜73%、残
りがCuの合金)等の帯状ロウ材がクラッド圧着されて
いるリードフレーム用のベース導体をICのリードフレ
ーム用に打抜いてクラッド材リードフレームを形成する
。In the former case, first, a base conductor for a lead frame to which a band-shaped brazing material such as Ag material (71 to 73% Ag, the rest is Cu alloy) is crimped to the cladding is punched out for the IC lead frame, and the cladding material is cut out. Form a lead frame.
続いて、このクラッド材リードフレームのロウ材部分を
セラミック基板上に蒸着形成された薄膜導体端部に重ね
合せて加熱接合するものである。この方法によるとベー
ス導体をリードフレーム用に打抜く場合のコストカ塙い
と共に、ベース導体に帯状にクラッド圧着されているロ
ウ材の一部分しかリードフレーム用として使用されず、
他の10部分は打抜くずとして廃棄される。Subsequently, the brazing material portion of this clad lead frame is superimposed on the end portion of the thin film conductor formed by vapor deposition on the ceramic substrate and bonded by heating. According to this method, the cost of punching out the base conductor for the lead frame is increased, and only a portion of the brazing material that is crimped to the base conductor in the form of a band is used for the lead frame.
The other 10 parts are not punched and are discarded.
従つて、Ag材の様な高価なロウ材が打抜くずとして廃
棄される事になり非常に不経済である。更にクラッド圧
着されているロウ材とベース導体の接合部は、クラッド
圧着独特の欠点を有している。即ち、クラツド圧着され
た帯状ロウ材の厚さ及び横巾が夫々不均一であるため、
ロウ材を節約するため帯状ロウ材の厚さ及び横巾を狭く
形成すると帯状ロウ材はベース導体に蛇行して圧着形成
される。従つてIC用のリードフレームとしてクラッド
材フレームを使用するためには巾が広く厚さの厚い帯状
ロウ材をクラッド圧着する必要があり、従つて、高価な
ロウ材が多量に必要になり非常に不経済である。更に、
帯状ロウ材とベース導体の接合部においては、ロウ材が
ベース導体に粒間浸透しており、従ってリードをセラミ
ック上の薄膜導体端部に加熱接合する際にベース導体に
この粒間浸入に伴う亀裂が生じやすい。Therefore, expensive brazing material such as Ag material is discarded without being punched, which is very uneconomical. Furthermore, the joint between the brazing material and the base conductor, which is crimped with the cladding, has drawbacks unique to cladding crimping. That is, since the thickness and width of the band-shaped brazing material that has been cradled and crimped are uneven,
If the thickness and width of the brazing material strip is made narrow in order to save the soldering material, the brazing material strip will meander and be pressure-bonded to the base conductor. Therefore, in order to use a clad material frame as a lead frame for an IC, it is necessary to crimp a wide and thick band of brazing material onto the cladding, which requires a large amount of expensive brazing material, which is very expensive. It is uneconomical. Furthermore,
At the joint between the band-shaped solder metal and the base conductor, the solder metal permeates into the base conductor between grains, and therefore, when the lead is heated and bonded to the end of the thin film conductor on the ceramic, the solder metal penetrates into the base conductor due to this intergranular penetration. Cracks are likely to occur.
従つて、]Cリードの接触不良が起き易くICの故障原
因となる。後者のリードフレームを直接セラミック基板
上の薄膜導体にロウ材によつて加熱接合する方法は次の
様なものである。Therefore, poor contact of the C lead is likely to occur, resulting in failure of the IC. The latter method of directly heat-bonding the lead frame to the thin film conductor on the ceramic substrate using a brazing material is as follows.
即ち、リードフレームのリード群端部上に帯状ロウ材を
重ね両端をスポット固定する。That is, a band-shaped brazing material is stacked on the ends of the lead group of the lead frame, and both ends are spot-fixed.
次にセラミツク基板上に蒸着形成された一連の薄膜導体
端部をこの帯状ロウ材に接触させ、この状態で各リード
端部を各薄膜導体端部を夫々加熱接合する。この加熱接
合の際に、各リード間に配置されたロウ材は加熱される
事によつて溶融し、表面張力の作用によつて夫々隣接す
る各リード端部に移動する。従つて、各リード間が遮断
された状態で、各薄膜導体端部と各リード端部が接合さ
れるのである。しかし、この方法によるリードの接合で
は各リード間に配置されたロン材が充分に溶融せず、各
リード間が互いにロウ材によつて接続されている不良品
が製造される事がある。Next, the end portions of a series of thin film conductors deposited on the ceramic substrate are brought into contact with this band-shaped brazing material, and in this state, the end portions of each lead and the end portions of the thin film conductors are respectively heated and bonded. During this heating bonding, the brazing material disposed between the leads is heated and melted, and moved to the respective adjacent lead ends by the action of surface tension. Therefore, each thin film conductor end and each lead end are joined with each lead being disconnected from each other. However, when the leads are joined by this method, the solder material placed between the leads is not sufficiently melted, and a defective product may be manufactured in which the leads are connected to each other by the solder material.
これは、電気的シヨートを引き起こし、Cチツプに致命
傷を与えるという最も基本的な欠点である。又、各リー
ド間に本来必要でないロウ材が余分に配置されるため大
変不経済であり、更に各リードに付着するロウ材の量が
不揃いになるという欠点を有している。更に、作業工程
が複雑であるため機械化して自動的にリードの取付を行
う事が困難である。この発明の目的は上述の様な欠点を
有する従来の方式のICリードの接合法に鑑み、次の様
な利点を有するICリードの接合法を提供する事にある
。This is the most fundamental drawback, causing electrical shot and fatal damage to the C-chip. Furthermore, since an unnecessary amount of brazing material is disposed between the leads, it is very uneconomical, and the amount of brazing material attached to each lead is uneven. Furthermore, since the work process is complicated, it is difficult to mechanize and automatically attach the leads. SUMMARY OF THE INVENTION An object of the present invention is to provide an IC lead bonding method having the following advantages in view of the conventional IC lead bonding method having the above-mentioned drawbacks.
(イ)高価なロウ材の無駄な消費をなくし、必要最小限
のロウ材で各1Cリードを接合し、各りードに付着する
ロウ材の量を均一にする。(a) Eliminate wasteful consumption of expensive brazing material, join each 1C lead with the minimum necessary brazing material, and make the amount of brazing material attached to each lead uniform.
(ロ)電気的シヨートを引き起す各リード端子間の接合
を起こす事なく、確実に各1Cリードを接合する。(b) To reliably join each 1C lead without causing any joining between the lead terminals that would cause electrical shorts.
(ハ)ICリードの接合工程を機械化が容易になる様に
簡単化する。(c) Simplify the IC lead bonding process so that it can be easily mechanized.
即ち、この発明によればIC用リードフレームの各リー
ド端部表面に凸部又は凹部が形成されており、この凸部
又は凹部上にリードの接合に必要な最小限度量のロウ材
が圧着される。That is, according to the present invention, a convex portion or a concave portion is formed on the surface of each lead end of an IC lead frame, and a minimum amount of brazing material necessary for joining the leads is crimped onto the convex portion or concave portion. Ru.
次に、このロウ材が圧着されたリードフレームにICセ
ラミツク基板を接触させ、各リード端部とセラミツク基
板土に蒸着形成された導体端部が直接加熱・接合される
。以下添附の図面に示す実施態様によつて、更に詳細に
この発明について説明する。Next, the IC ceramic substrate is brought into contact with the lead frame to which the brazing material is crimped, and the ends of each lead and the ends of the conductor formed by vapor deposition on the ceramic substrate are directly heated and bonded. The present invention will be described in more detail below with reference to embodiments shown in the accompanying drawings.
第1図に示すのはこの発明に用いるIC用りードフレー
ム1の平面図であり、第2図に示すのは第1図に示した
IC用リードフレーム1のリード3の端部を矢印Aの方
向から見たときの拡大図である。1 is a plan view of an IC lead frame 1 used in the present invention, and FIG. 2 shows an end of the lead 3 of the IC lead frame 1 shown in FIG. It is an enlarged view when seen from the direction.
即ち、リード3の端部には第2図から明らかな様に比較
的厚さの薄い凹状の溝4が形成されており、この溝4を
囲繞する様な配置でロウ材5が圧着されている。That is, as is clear from FIG. 2, a relatively thin concave groove 4 is formed at the end of the lead 3, and a brazing material 5 is crimped so as to surround this groove 4. There is.
ロウ材5は図示した様にリード3端部に形成された溝5
内にしつかりと食込み確実に固定される。続いて、ロウ
材5が圧着されているIC用りードフレーム1を、第3
図に示す様に図中にその一部を示す多数の薄膜導体11
が蒸着形成されているIC用セラツク基板7に、各リー
ド端部と各薄膜導体11の端部が夫々一致する様な配置
で重ね合せる。The brazing material 5 is inserted into the groove 5 formed at the end of the lead 3 as shown in the figure.
It firmly bites into the inside and is securely fixed. Next, the IC lead frame 1 to which the brazing material 5 is crimped is placed in a third
As shown in the figure, a large number of thin film conductors 11, some of which are shown in the figure.
The thin film conductors 11 are superimposed on the IC ceramic substrate 7 on which the conductors are deposited by vapor deposition, so that the ends of each lead and the ends of each thin film conductor 11 are aligned with each other.
ここで各薄膜導体11の他端は夫々ICチツプ9に接続
されている。次に、この状態で各リード端部を加熱して
圧着されているロウ材5を溶融させ冷却し接合を行う。Here, the other end of each thin film conductor 11 is connected to an IC chip 9, respectively. Next, in this state, each lead end is heated to melt the solder material 5 that has been crimped and cooled to perform joining.
更に、第1図の点線Bに示す位置で夫々のリード3を切
断して第4図に示す様な配置のIC用りード3を形成す
る。以上の説明においては凹状の溝4を有する形成のI
C用リードフレームについて説明したが本発明はこれに
限定されるものではなく任意の形状の溝や突起で良い。Furthermore, each lead 3 is cut at the position shown by dotted line B in FIG. 1 to form IC leads 3 arranged as shown in FIG. 4. In the above description, the formation I having the concave groove 4 is
Although the C lead frame has been described, the present invention is not limited to this, and grooves or protrusions of any shape may be used.
例えば第5図に示す様に各りード端部に三角形状の断面
を有する溝13を形成しても良いし、第6図に示す様に
三角形状の突起15を形成しても良い。この発明によれ
ば必要最小限度量のロウ材を各リードの端部に設けられ
た溝や突起を介して圧着するため、ロウ材をいたずらに
浪費する事がなく確実にロウ材を固着できる。For example, as shown in FIG. 5, a groove 13 having a triangular cross section may be formed at the end of each lead, or a triangular protrusion 15 may be formed as shown in FIG. According to this invention, since the minimum necessary amount of brazing material is crimped through the grooves and protrusions provided at the ends of each lead, the brazing material can be securely fixed without being wasted unnecessarily.
又、圧着に際しても各リード端部に加える圧力を一定に
保持する事が機械的に容易に行えるため、各リード3の
端部が上下方向に不揃になる事もない。更に各リード端
部間が互いに接合される危険がなく、確実にIC用セラ
ミツク基板の蒸着導体端部に接合する事ができる。又、
この発明は作業工程が単純であるため、簡単な設備で自
動化が容易に行え加工費が非常に安価であるという利点
を有している。Furthermore, since it is mechanically easy to maintain a constant pressure applied to each lead end during crimping, the ends of each lead 3 will not become uneven in the vertical direction. Furthermore, there is no risk that the ends of the leads will be joined to each other, and the leads can be reliably joined to the ends of the vapor-deposited conductor of the ceramic substrate for IC. or,
This invention has the advantage that since the working process is simple, it can be easily automated with simple equipment and the processing cost is very low.
第1図はこの発明に用いるIC用リードフレームの例を
示す平面図であり、第2図は第1図の要都拡大図であり
、第3図はIC用セラミツク基板の一例を示す平面図で
あり、第4図はセラミツク基板にリードを取付けた状態
を示す平面図であり、第5図、第6図はIC用リードフ
レームの要部拡大図である。
1・・・・・・IC用リードフレーム、3・・・・・・
リード、4,13・・・・・・溝、15・・・・・・突
起、5・・・・・・ロウ材、7・・・・・・セラミツク
基板、9・・・・・・ICチツプ、・・・・・・蒸着薄
膜導体。FIG. 1 is a plan view showing an example of a lead frame for IC used in the present invention, FIG. 2 is an enlarged view of the essential parts of FIG. 1, and FIG. 3 is a plan view showing an example of a ceramic substrate for IC. FIG. 4 is a plan view showing a state in which leads are attached to a ceramic substrate, and FIGS. 5 and 6 are enlarged views of essential parts of the IC lead frame. 1...Lead frame for IC, 3...
Lead, 4, 13...groove, 15...protrusion, 5...brazing material, 7...ceramic substrate, 9...IC Chip... Vapor deposited thin film conductor.
Claims (1)
成された導体11端部にリード3を接合するにあたり、
ロウ材5をリードフレーム1のリード3端部に設けられ
た溝や突起4、13、15上に圧着し、続いてリード端
部と導体11端部を互いに重ね合わせ加熱・接合するI
Cリードの接合法。1. When joining the lead 3 to the end of the conductor 11 formed by vapor deposition to form a wiring on the ceramic substrate 7,
The brazing material 5 is crimped onto the grooves and protrusions 4, 13, and 15 provided at the ends of the leads 3 of the lead frame 1, and then the ends of the leads and the ends of the conductor 11 are overlapped and heated and bonded.
C lead joining method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12631076A JPS5935180B2 (en) | 1976-10-22 | 1976-10-22 | IC lead joining method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12631076A JPS5935180B2 (en) | 1976-10-22 | 1976-10-22 | IC lead joining method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5352069A JPS5352069A (en) | 1978-05-12 |
| JPS5935180B2 true JPS5935180B2 (en) | 1984-08-27 |
Family
ID=14932009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12631076A Expired JPS5935180B2 (en) | 1976-10-22 | 1976-10-22 | IC lead joining method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5935180B2 (en) |
-
1976
- 1976-10-22 JP JP12631076A patent/JPS5935180B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5352069A (en) | 1978-05-12 |
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