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JPS5937586B2 - Souhogatadenkaikoukasoshiyuusekikairosouchi - Google Patents
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JPS5937586B2 - Souhogatadenkaikoukasoshiyuusekikairosouchi - Google Patents

Souhogatadenkaikoukasoshiyuusekikairosouchi

Info

Publication number
JPS5937586B2
JPS5937586B2 JP50134372A JP13437275A JPS5937586B2 JP S5937586 B2 JPS5937586 B2 JP S5937586B2 JP 50134372 A JP50134372 A JP 50134372A JP 13437275 A JP13437275 A JP 13437275A JP S5937586 B2 JPS5937586 B2 JP S5937586B2
Authority
JP
Japan
Prior art keywords
ram
cmos
power
field effect
effect element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP50134372A
Other languages
Japanese (ja)
Other versions
JPS5258385A (en
Inventor
正明 上野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP50134372A priority Critical patent/JPS5937586B2/en
Publication of JPS5258385A publication Critical patent/JPS5258385A/en
Publication of JPS5937586B2 publication Critical patent/JPS5937586B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/85Complementary IGFETs, e.g. CMOS

Landscapes

  • Static Random-Access Memory (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Description

【発明の詳細な説明】 この発明は相補形電界効果素子集積回路装置に関するも
ので、特に電子式卓上計算機(以下「電卓」)等に用い
得るように改良されたランダムアクセスメモリ(以下「
RAM」)を有する相補形電界効果素子集積回路装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a complementary field-effect element integrated circuit device, and in particular to a random access memory (hereinafter referred to as ``calculator'') that is improved so that it can be used in electronic desktop calculators (hereinafter referred to as ``calculators'').
The present invention relates to a complementary field effect element integrated circuit device having a "RAM").

相補形MOS電界効果トランジスタ(以下CMOSと称
す)を用いたRAMが実用に供されているが、よく知ら
れているように、CMOS−RAMはローパワーゆえに
、システムの電源がオフになつた後も、バッテリバック
アップで用いることにより不揮発性のRAMとして使用
される。
RAMs using complementary MOS field effect transistors (hereinafter referred to as CMOS) are in practical use, but as is well known, CMOS-RAMs are low-power and cannot be used after the system power is turned off. It is also used as a non-volatile RAM by using it for battery backup.

しかしながら、この様なRAMは大形コンピュータ等に
用いられるように、高スピードに設計されているので非
常に高価であり、また、電源系等も個別にする必要があ
るため、電卓用等として不適である。ハンディタイプの
プログラム式の電卓等のシステムにおいては、システム
の電源を切つた後も、そのプログラムが消失することな
く、あるいは書き込んでおいたデータが消失することの
ないようにできれば非常にメリットがあり、かつ付加価
値も上るが、これを実現するには不揮発性のRAMが必
要とされる。この場合紫外線によつて書き込んだデータ
を消失させる様なFAMOS等は不適合であり、システ
ムの電源が切れた後もバッテリでバックアップするCM
OS−RAMが適合している。しかしながら、汎用性の
あるCMOS一RAMの電源は、消費電力を減らすため
の目的で1〜2ボルト前後のできるだけ低い電圧で設計
されているが、TTLコンパテイブルな様に5ボルトに
設定しスピードアップを図るためできるだけ低いしきい
値電圧が採用されかつまた、できるだけ多くのシステム
に適合できるように書込および読出のスピードを上げる
べき最大限の努力が払われているのが常である。このた
め、製造歩留りも悪くなりコスト高となる。いうまでも
なく、電卓等のシステムにおいてこのような高価なRA
Mは不必要であり、またシステム自体も最も安価に製造
できるようにするため最も自然にコントロールできるし
きい値電圧(2.5ボルト程度)を選択するのが一般的
であり、従つて電源電圧も5〜6ボルトに選択されるの
が一般的である。このようなシステムと前記のRAMと
を適合させるのは非常に難かしい。しかしながら、この
適合困難なシステムとRAMとをうまく適合させれば、
安価な電卓等に有効に用いられよう。それゆえにこの発
明の主たる目的は上述の困難を解決した、改良されたR
AMを有する相補形電界効果素子集積回路装置を提供す
ることである。
However, this kind of RAM is designed for high speed and is used in large computers, etc., so it is very expensive, and also requires a separate power supply system, making it unsuitable for use in calculators, etc. It is. In systems such as hand-held programmable calculators, it would be extremely advantageous if the program or written data could be prevented from being lost even after the power to the system is turned off. , and the added value increases, but non-volatile RAM is required to realize this. In this case, FAMOS, etc., which erase written data due to ultraviolet rays, are incompatible, and CM, which is backed up by a battery even after the system power is turned off, is incompatible.
OS-RAM is compatible. However, the power supply for general-purpose CMOS-RAM is designed with the lowest voltage possible, around 1 to 2 volts, in order to reduce power consumption, but it is set to 5 volts to make it TTL compatible to speed it up. Usually, the lowest possible threshold voltage is adopted to achieve this, and maximum effort is also made to increase the writing and reading speeds so as to be compatible with as many systems as possible. For this reason, manufacturing yield is also poor and costs are high. Needless to say, such an expensive RA is required in systems such as calculators.
M is unnecessary, and in order to manufacture the system itself at the lowest cost, it is common to select a threshold voltage that can be controlled most naturally (approximately 2.5 volts), so the power supply voltage It is also common to select 5 to 6 volts. It is very difficult to adapt such a system to the above-mentioned RAM. However, if we successfully match this difficult-to-match system with RAM,
It could be effectively used in inexpensive calculators, etc. Therefore, the main object of this invention is to provide an improved R
An object of the present invention is to provide a complementary field effect element integrated circuit device having AM.

この発明のその他の目的および特徴は図面を参照して行
なう以下の詳細な説明から一層明らかとなろう。概説す
れば、Pチヤンネル電界効果素子およびNチヤンネル電
界効果素子から成るランダムアクセスメモリと、システ
ムとを1チツプ上に形成し、かつ、前記システムの電源
と、前記ランダムアクセスメモリの電源とを切り離して
構成したことを特徴とする。
Other objects and features of the present invention will become more apparent from the following detailed description with reference to the drawings. Briefly, a random access memory consisting of a P-channel field effect element and an N-channel field effect element and a system are formed on one chip, and the power supply for the system is separated from the power supply for the random access memory. It is characterized by having been configured.

第1図はこの発明の一実施例のシステムのブロツク図で
ある。
FIG. 1 is a block diagram of a system according to an embodiment of the present invention.

この発明の注目すべき特徴は、CMOS−RAMとCM
OS−RAM以外のシステムSとを1個のチツプCH内
に構成したことである。加えて、CMOS−RAMの不
揮発化を図るために前記システムSとCMOS−RAM
との電源を個別にしたことである。すなわち、外部から
の電源Pは直接CMOS−RAMへ与えられる一方、シ
ステムSへはスイツチSWを介して与えている。もちろ
ん、このスイツチSWは使用時には閉成される。それに
対して、CMOS−RAMへは常時電源が供給されてメ
モリ内容の揮発防止を図つている。このように、1チツ
プ内にRAMをつくりこみ、しかもその電源系を別にす
れば、システムSとRAMのしきい値電圧は1チツプ化
の性質上殆んど同じとなり、前述した入出力の適合は何
ら問題がなく、しかもシステムに適合したスピードのR
AMを設計することができる(周波数マージンに余裕を
とり過ぎているとか、余裕がないとかということがない
。)第2図は第1図のCMOS−RAMの一例のセルフ
リフレツシユのCMOS−RAMである。
The notable features of this invention are CMOS-RAM and CM
The system S other than the OS-RAM is configured in one chip CH. In addition, in order to make the CMOS-RAM non-volatile, the system S and the CMOS-RAM
The main reason for this is that the power supply was made separate. That is, the external power P is directly applied to the CMOS-RAM, while it is applied to the system S via the switch SW. Of course, this switch SW is closed when in use. On the other hand, power is constantly supplied to the CMOS-RAM to prevent the memory contents from volatilizing. In this way, if RAM is built into one chip and its power supply system is separated, the threshold voltages of system S and RAM will be almost the same due to the nature of being integrated into one chip, and the above-mentioned input/output compatibility will be achieved. There are no problems with R, and the speed is compatible with the system.
(There is no need to leave too much or too little margin in the frequency margin.) Figure 2 shows a self-refresh CMOS-RAM, which is an example of the CMOS-RAM in Figure 1. It is.

この例において留意すべき点は、次のとおりである。す
なわち、RAM以外のシステムSの電源が完全にオフに
なつている状態では、読出し書込み線(データ線)lの
レベルがオープン状態でも外部から電流でフォーシンク
されることはなくかつ従つて予期しない状態が書き込ま
れることはない。しかし、RAM以外のシステムSの電
源がオン時およびオフ時のそれぞれ瞬時において(ある
いは過渡期において)は予期しない状態が書き込まれる
恐れが多分にある。第3図はこのような点を解決するた
めの一例である。すなわち、第3図は、第2図のRAM
の桁選択信号Diを形成するためのデコーダ(図示せず
Points to note in this example are as follows. In other words, when the power of the system S other than the RAM is completely off, even if the level of the read/write line (data line) l is open, there will be no current for sinking from the outside, and therefore unexpected No state is written. However, there is a high possibility that an unexpected state will be written at each instant (or during a transition period) when the power of the system S other than the RAM is turned on and off. FIG. 3 is an example for solving this problem. That is, FIG. 3 shows the RAM of FIG.
A decoder (not shown) for forming the digit selection signal Di.

かわりに第3図においてデコーダ出力を示す)の出力を
さらに論理処理する回路を示し、全体としては桁選択信
号Di発生回路を示す。第3図において、RAM以外の
システムの電源。、8が用いられていることにまず注目
されたい。まず、電源オンの瞬時(スイツチSW閉成瞬
時)には、キヤパシタC1の作用により、点N1のレベ
ルは電源電圧8のレベルとなる。この8レベルがNAN
DゲートGの一方入カへ与えられる。NANDゲートG
の他方入カへはデコーダ出力が与えられる。このように
することにより、一義的にDiおよびDiのレベルを決
定することができ、読出しおよび書込みを禁止すること
ができる。時間が経過して、正常な動作を始めれば、点
N1はVOレベルとなり、NANDゲートは能動化され
他のデコーダ出力のレベルによつてのみ桁選択信号Di
,Diを決定することができる。同様に、電源オフ瞬時
には点N1はVsレベルに放電するのでやはり読出しお
よび書込みを禁止することができる。以上説明したよう
にこの発明によれば、CMOS−RAMとそれ以外のシ
ステムとを1チツプ化することにより、安価な、不揮発
性のRAMを有するシステムが得られ、ハンデイタイプ
の電卓等にも用いられる等の効果が得られる。
Instead, it shows a circuit that further logically processes the output of the decoder (decoder output shown in FIG. 3), and shows the digit selection signal Di generation circuit as a whole. In FIG. 3, power supplies for systems other than RAM. , 8 are used. First, at the moment the power is turned on (the moment the switch SW is closed), the level of the point N1 becomes the level of the power supply voltage 8 due to the action of the capacitor C1. These 8 levels are NAN
D is given to one input of gate G. NAND gate G
The decoder output is given to the other input. By doing so, the levels of Di and Di can be uniquely determined, and reading and writing can be prohibited. After time has passed and normal operation starts, point N1 becomes VO level, the NAND gate is activated, and the digit selection signal Di is activated only by the level of other decoder outputs.
, Di can be determined. Similarly, since point N1 is discharged to the Vs level at the instant the power is turned off, reading and writing can also be prohibited. As explained above, according to the present invention, by integrating CMOS-RAM and other systems into one chip, an inexpensive system with non-volatile RAM can be obtained, which can also be used in hand-held calculators, etc. Effects such as:

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例のシステムの概略図を示す
。 第2図は第1図のCMOS−RAMの一例の回路図であ
る。第3図は第2図の桁選択信号Di,Di発生回路を
示す。図において、SはCMOS−RAM以外のシステ
ム、Pは電源、SWはスイツチを示す。
FIG. 1 shows a schematic diagram of a system according to an embodiment of the present invention. FIG. 2 is a circuit diagram of an example of the CMOS-RAM shown in FIG. 1. FIG. 3 shows the digit selection signal Di, Di generation circuit of FIG. In the figure, S indicates a system other than CMOS-RAM, P indicates a power supply, and SW indicates a switch.

Claims (1)

【特許請求の範囲】[Claims] 1 Pチャンネル電界効果素子およびNチャンネル電界
効果素子から成るランダムアクセスメモリと、演算処理
等の電子的論理処理を行なうためのシステムとを1個の
集積回路として形成し、かつ前記ランダムアクセスメモ
リと前記システムとの付勢電源を分離した相補形電界効
果素子集積回路装置。
1 A random access memory consisting of a P-channel field effect element and an N-channel field effect element and a system for performing electronic logic processing such as arithmetic processing are formed as one integrated circuit, and the random access memory and the Complementary field effect element integrated circuit device with separate energizing power supply from the system.
JP50134372A 1975-11-07 1975-11-07 Souhogatadenkaikoukasoshiyuusekikairosouchi Expired JPS5937586B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50134372A JPS5937586B2 (en) 1975-11-07 1975-11-07 Souhogatadenkaikoukasoshiyuusekikairosouchi

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50134372A JPS5937586B2 (en) 1975-11-07 1975-11-07 Souhogatadenkaikoukasoshiyuusekikairosouchi

Publications (2)

Publication Number Publication Date
JPS5258385A JPS5258385A (en) 1977-05-13
JPS5937586B2 true JPS5937586B2 (en) 1984-09-11

Family

ID=15126835

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50134372A Expired JPS5937586B2 (en) 1975-11-07 1975-11-07 Souhogatadenkaikoukasoshiyuusekikairosouchi

Country Status (1)

Country Link
JP (1) JPS5937586B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937656B2 (en) * 1977-11-05 1984-09-11 松下電器産業株式会社 equipment gearing
JPS5769588A (en) * 1980-10-16 1982-04-28 Nec Corp Memort circuit

Also Published As

Publication number Publication date
JPS5258385A (en) 1977-05-13

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