JPS5939856B2 - infrared night vision device - Google Patents
infrared night vision deviceInfo
- Publication number
- JPS5939856B2 JPS5939856B2 JP49056847A JP5684774A JPS5939856B2 JP S5939856 B2 JPS5939856 B2 JP S5939856B2 JP 49056847 A JP49056847 A JP 49056847A JP 5684774 A JP5684774 A JP 5684774A JP S5939856 B2 JPS5939856 B2 JP S5939856B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- infrared
- target object
- infrared rays
- detection surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Transforming Light Signals Into Electric Signals (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Closed-Circuit Television Systems (AREA)
Description
【発明の詳細な説明】
この発明は目標物体を走査しながらそれからの赤外線を
検出し、その検出出力を映像として表示し、例えば夜間
に目標物体を監視する赤外線暗視装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an infrared night vision device that detects infrared rays from a target object while scanning it, displays the detection output as an image, and monitors the target object at night, for example.
第1図は従来の光学走査型赤外線暗視装置を示し、これ
は1973年東京大学発行、Ka2uhikoAtsu
nll著「 MEDICALTHERMOGRAPHY
」116頁に記載されたもので、目標物体1から放射さ
れた赤外線は一次鏡2、二次鏡3で構成された集光系で
集光され、反射鏡4で反射されて赤外線検出器5の検出
面に入射される。Figure 1 shows a conventional optical scanning type infrared night vision device, published by the University of Tokyo in 1973, published by Ka2uhiko Atsu.
``MEDICAL THERMOGRAPHY'' written by nll
”, page 116, the infrared rays emitted from the target object 1 are focused by a condensing system consisting of a primary mirror 2 and a secondary mirror 3, reflected by a reflecting mirror 4, and sent to an infrared detector 5. is incident on the detection surface.
入射した赤外線は赤外線検出器5で電気信号に変換され
、映像増幅器6で増幅され、その増幅出力により表示用
ブラウン管9は輝度変調される。一方二次鏡3は走査鏡
を兼ねており、走査機構部Tにより高速度で回転され、
例えば100回転に1回程度の割合で俯仰方向に振動さ
れ、回転中の目標物体1側に向いている間に目標物体1
を水平走査し、俯仰方向の振動により垂直走査する。即
ち第2図Aに示すように絵素10が矢印方向に順次走査
されて視野11全体の面走査が完成される。そこで走査
機構部Tの回転、振動に同期した偏向信号が偏向信号発
生器8で発生され、これ等が表示ブラウン管9のXY軸
偏向コイルに加えられる。従つて表示ブラウン管9上に
は赤外線放射量に応じた物体映像12が映出される。こ
のように目標物体の赤外線放射量の差を検出し、映像と
してとらえて物体を監視することができる。物体の赤外
線放射量Wはその物体の放射率εと絶対温度Tとにより
決まり、w=εKT”(にはステファンボルツマン定数
)で表現される。The incident infrared rays are converted into electrical signals by the infrared detector 5, amplified by the video amplifier 6, and the display cathode ray tube 9 is brightly modulated by the amplified output. On the other hand, the secondary mirror 3 also serves as a scanning mirror, and is rotated at high speed by the scanning mechanism section T.
For example, the target object 1 is vibrated in the elevation direction at a rate of about once every 100 rotations, and while the target object 1 is facing the rotating target object 1 side.
horizontally scanned, and vertically scanned by vibration in the elevation direction. That is, as shown in FIG. 2A, the picture elements 10 are sequentially scanned in the direction of the arrows, and the surface scanning of the entire visual field 11 is completed. Therefore, a deflection signal synchronized with the rotation and vibration of the scanning mechanism section T is generated by a deflection signal generator 8, and these signals are applied to the XY-axis deflection coils of the display cathode ray tube 9. Therefore, an object image 12 is displayed on the display cathode ray tube 9 in accordance with the amount of infrared radiation. In this way, the difference in the amount of infrared radiation of a target object can be detected and captured as an image to monitor the object. The amount of infrared radiation W of an object is determined by the emissivity ε and absolute temperature T of the object, and is expressed as w=εKT'' (where is the Stefan Boltzmann constant).
目標物体が発熱体でない場合に於てはその物体は周囲温
度に影響され、周囲の気温とほぼ同一の一定温度を保つ
ている。このような物体を赤外線暗視装置で映出する場
合は物体温度はほぼ一定であるから物体表面の放射率ε
の差による放射赤外線量の差を映出することになる。つ
fり第2図Bに示すよ・ うに視野13内に於て、各部
の放射率ε、、ε2、ε3の差が映出される。物体を囲
む周囲の温度が低くなり、物体からの赤外線放射量が低
下したとき、また物体の放射率の差が小さい時はその放
射赤外線量の差は検出装置の雑音に埋れて映出が困難と
なる。本発明の目的は従来のこのような装置の限界点を
更に低いレベルまで伸し、つまり低温で放射率差の小さ
い物体に対し、放射率差を強調し、映出を可能とした赤
外線暗視装置を提供することにある。When the target object is not a heating element, the object is influenced by the ambient temperature and maintains a constant temperature that is approximately the same as the ambient temperature. When such an object is imaged with an infrared night vision device, the temperature of the object is almost constant, so the emissivity ε of the object surface is
The difference in the amount of radiated infrared rays due to the difference in is projected. As shown in FIG. 2B, within the field of view 13, the difference in emissivity ε, ε2, ε3 of each part is displayed. When the temperature surrounding the object becomes low and the amount of infrared radiation from the object decreases, or when the difference in emissivity of the object is small, the difference in the amount of infrared radiation is buried in the noise of the detection device and difficult to image. becomes. The purpose of the present invention is to extend the limitations of such conventional devices to an even lower level. In other words, it is an infrared night vision system that emphasizes the emissivity difference and enables imaging of low-temperature objects with small emissivity differences. The goal is to provide equipment.
この発明によれば光学走査型赤外線暗視装置において、
その走査と同期し、これよりも僅か進んだ状態で、例え
ば走査方向において少なくとも1絵素分進んだ絵素位置
に対して赤外線を目標物体の検出面に投射しながらその
投射点を検出面上で二次元的に走査させる。According to this invention, in the optical scanning type infrared night vision device,
In synchronization with the scanning, in a state slightly advanced from this, for example, while projecting infrared rays onto the detection surface of the target object at a pixel position that has advanced by at least one pixel in the scanning direction, the projection point is set on the detection surface. to scan in two dimensions.
従つて物体よりの放射赤外線の受光走査は、赤外線の投
射後にその投射に続いて行われ、投射された赤外線に対
応して放射赤外線の放射量が大きくなる。例えば第3図
に示すように物体16に於て放射率の高い部分17と低
い部分18とがある場合、検出面に配列されている絵素
14が矢印方向に順次走査されて映像が作られるが、そ
の絵素14の次のステツプに相当する部分、即ち走査方
向において1絵素分進んだ部分15に、常温付近の物体
が最大放射を示す波長10μ近辺の赤外線を投射し、そ
の赤外線投射は目標物体の検出面における絵素の走査に
同期してその投射点が走査される。つまり赤外線投射が
行われたすぐ後の目標物体の検出面を受光用集光系が走
査して映出する。一般の不透明物体では放射率は吸収率
とほぼ等しく、反射率と吸収率との和が1である。そこ
で吸収率の大きい物体表面部分では投射赤外線をよく吸
収し、吸収率の小さい、従つて反射率が大きい物体表面
部分ではよく反射され、吸収は少ない。従つて吸収率の
大きい表面部分は温度上昇が大きい。この部分的な温度
上昇は物体内部の熱伝導によつて物体の低温部に伝導し
て徐々に物体温度は均一化されるが、時間的にはゆつく
りしたものである。従つて赤外線投射直後においては吸
収率が大きい部分は温度が高くしかも放射率が大きいの
で多くの赤外線を放射する。一方吸収率の小さい部分は
温度が低く、放射率も小さいので放射赤外線量は少ない
。また赤外線投射によつて全体的に表面温度は上昇して
いる。従つてこれを検出し映像化するならば、物体表面
の放射率差が強調される効果も加わり、従来不可能であ
つた低温度物体および小さな物体表面の放射率差が映出
でき、物体の詳細について監視が可能となる。第4図は
本発明赤外線暗視装置の一実施例を示し、第1図と対応
する部分には同一符号を付して重複説明は省略するも、
この発明においては赤外線投射器20が設けられ、これ
からの赤外線は走査部21内の平面走査鏡22で反射さ
れ、その反射光が目標物体1の検出面に投射され、平面
走査鏡22の移動によつて反射光は物体上を例えば第3
図に示すように順次1絵素分ずつ二次元的に走査する。Therefore, the reception scanning of the infrared rays emitted from the object is performed after the projection of the infrared rays, and the amount of the infrared rays radiated increases in accordance with the projected infrared rays. For example, as shown in FIG. 3, when the object 16 has a high emissivity part 17 and a low emissivity part 18, the picture elements 14 arranged on the detection surface are sequentially scanned in the direction of the arrow to create an image. However, an infrared ray with a wavelength of around 10μ, at which an object near room temperature emits maximum radiation, is projected onto a portion 15 corresponding to the next step of the picture element 14, that is, a portion 15 that is advanced by one pixel in the scanning direction. The projection point is scanned in synchronization with the scanning of picture elements on the detection surface of the target object. In other words, the light receiving condensing system scans and images the detection surface of the target object immediately after the infrared projection is performed. In a general opaque object, the emissivity is almost equal to the absorption rate, and the sum of the reflectance and absorption rate is 1. Therefore, the projected infrared rays are well absorbed in the object's surface portion where the absorption rate is high, and the projected infrared rays are well reflected and absorbed in the object surface portion where the absorption rate is low and therefore the reflectance is high. Therefore, the temperature rise is large in the surface area where the absorption rate is high. This local temperature increase is transferred to the low temperature part of the object by heat conduction inside the object, and the temperature of the object is gradually equalized, but only slowly over time. Therefore, immediately after infrared radiation is emitted, a portion with a high absorption rate has a high temperature and a high emissivity, so it emits a large amount of infrared rays. On the other hand, the portion with low absorption rate has a low temperature and low emissivity, so the amount of infrared rays radiated is small. Additionally, the overall surface temperature is rising due to infrared radiation. Therefore, if this is detected and visualized, the effect of emphasizing the emissivity difference on the object's surface will be added, and the emissivity difference on the surface of low-temperature objects and small objects, which was previously impossible, can be visualized, and the object's emissivity difference will be enhanced. It becomes possible to monitor details. FIG. 4 shows an embodiment of the infrared night vision device of the present invention, and parts corresponding to those in FIG.
In this invention, an infrared projector 20 is provided, and the infrared rays from this are reflected by a plane scanning mirror 22 in a scanning section 21, and the reflected light is projected onto the detection surface of the target object 1, and the movement of the plane scanning mirror 22 causes the reflected light to be projected onto the detection surface of the target object 1. Therefore, the reflected light travels on the object, for example, in the third direction.
As shown in the figure, one picture element is sequentially scanned two-dimensionally.
その使用赤外線としては大気中の透過率のよい波長10
μ近辺のものがよく、CO2レーザ装置等の使用が有効
である。一方目標物体1から放射された赤外線を受光す
る二次鏡3が設けられ、二次鏡3は走査機構部7により
高速度で回転され、例えは100回転に1回程度の割合
で俯仰方向に振動されるような構成となつている。従つ
て二次鏡3はその回転中において目標物体1側を向いて
いる時間で目標物体1の赤外線の照射面を水平走査し、
俯仰方向の振動によつて垂直走査を行う。この平面走査
鏡22の走査は二次鏡3の走査と同期されるが、第3図
に示したように、二次鏡3による受光点の走査よりも1
絵素分だけ、平面走査鏡22による目標吻体の検出面に
対する赤外線投射器20の投射点の走査は進んだ状態に
選定される。従つて走査形表示器例えば表示ブラウン管
9上には赤外線投射直後における目標物体の検出面の絵
素部分からの赤外線放射量に応じた映像が映出される。
このように本発明装置によれば赤外線を投射した直後の
物体表面からの赤外線放射を利用するので、物体表面の
放射赤外線量が増すとともに放射率差が強調され、従来
不可能であつた低温物体および小さな放射率差が映出で
きるので夜間において物体の詳細にして充分な監視がで
き、その効果は実用上頗る大である。The infrared light to be used is wavelength 10, which has good transmittance in the atmosphere.
A value in the vicinity of μ is preferable, and the use of a CO2 laser device or the like is effective. On the other hand, a secondary mirror 3 that receives infrared rays emitted from the target object 1 is provided, and the secondary mirror 3 is rotated at high speed by the scanning mechanism 7, and is rotated in the elevation direction at a rate of about once every 100 rotations. It is structured so that it vibrates. Therefore, during the rotation, the secondary mirror 3 horizontally scans the infrared irradiation surface of the target object 1 while facing the target object 1,
Vertical scanning is performed by vibration in the vertical direction. The scanning of this plane scanning mirror 22 is synchronized with the scanning of the secondary mirror 3, but as shown in FIG.
The scan of the projection point of the infrared projector 20 on the detection surface of the target proboscis by the plane scanning mirror 22 is selected to be advanced by the number of picture elements. Therefore, an image corresponding to the amount of infrared radiation from the pixel portion of the detection surface of the target object immediately after the infrared radiation is projected is displayed on the scanning type display, for example, the display cathode ray tube 9.
In this way, the device of the present invention utilizes the infrared radiation from the object surface immediately after the infrared rays are projected, so the amount of infrared rays radiated from the object surface increases and the emissivity difference is emphasized. Since small emissivity differences can be imaged, objects can be monitored in detail and sufficiently at night, and the effect is extremely large in practical terms.
第1図は従来の光学走査型赤外線暗視装置を示すプロツ
ク図、第2図はその動作の説明図、第3図は本発明赤外
線暗視装置の動作説明図、第4図は本発明赤外線暗視装
置の一実施例を示すプロツク図である。
1.目標物体、2,3:集光系、5:光検出器、7:走
査機構部、8:偏向信号発生器、9:表示用ブラウン管
、20:赤外線投射器、22:走査機構部。Fig. 1 is a block diagram showing a conventional optical scanning type infrared night vision device, Fig. 2 is an explanatory diagram of its operation, Fig. 3 is an explanatory diagram of the operation of the infrared night vision device of the present invention, and Fig. 4 is an infrared ray of the present invention. FIG. 2 is a block diagram showing an embodiment of a night vision device. 1. Target object, 2, 3: condensing system, 5: photodetector, 7: scanning mechanism section, 8: deflection signal generator, 9: display cathode ray tube, 20: infrared projector, 22: scanning mechanism section.
Claims (1)
目標物体の検出面に対して二次元的に走査しながら前記
検出面の各絵素部分からの放射赤外線を表示信号として
逐次検出走査し、得られた表示信号に基づいて上記目標
物体を映像として表示する赤外線暗視装置において、上
記物体の検出面に対して赤外線を投射する投射器と、こ
の投射器による投射と同期し、この投射後、前記目標物
体の検出面の反射率、吸収率等の性質により定まる前記
赤外線投射による前記検出面からの赤外線の放射効果が
持続している時間内の予め定めた時間だけ遅れて、前記
検出走査を行なう走査手段と、表示面を上記放射赤外線
の検出走査と同期して走査し、各走査点を上記表示信号
に応じて光学的に表示させ、上記目標物件の映像を上記
表示面に表示させる走査形表示器とを有する赤外線暗視
装置。1. While two-dimensionally scanning a radiation point of radiated infrared rays emitted from a target object with respect to a detection surface of the target object, sequentially detecting and scanning radiated infrared rays from each pixel portion of the detection surface as a display signal, An infrared night vision device that displays the target object as an image based on the obtained display signal includes a projector that projects infrared rays onto the detection surface of the object, and a projector that is synchronized with the projection by the projector and that , the detection scanning is performed with a delay of a predetermined time within the duration of the infrared radiation effect from the detection surface due to the infrared projection, which is determined by the properties of the detection surface of the target object, such as reflectance, absorption rate, etc. a scanning means for scanning a display surface in synchronization with the detection scan of the radiation infrared rays, optically displaying each scanning point in accordance with the display signal, and displaying an image of the target object on the display surface; An infrared night vision device having a scanning display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49056847A JPS5939856B2 (en) | 1974-05-20 | 1974-05-20 | infrared night vision device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49056847A JPS5939856B2 (en) | 1974-05-20 | 1974-05-20 | infrared night vision device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50148063A JPS50148063A (en) | 1975-11-27 |
| JPS5939856B2 true JPS5939856B2 (en) | 1984-09-26 |
Family
ID=13038794
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49056847A Expired JPS5939856B2 (en) | 1974-05-20 | 1974-05-20 | infrared night vision device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5939856B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60243949A (en) * | 1984-05-18 | 1985-12-03 | Hitachi Ltd | Electron gun electrode and its manufacturing method |
| JPH06162957A (en) * | 1992-11-20 | 1994-06-10 | Mitsubishi Electric Corp | Electron gun |
-
1974
- 1974-05-20 JP JP49056847A patent/JPS5939856B2/en not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60243949A (en) * | 1984-05-18 | 1985-12-03 | Hitachi Ltd | Electron gun electrode and its manufacturing method |
| JPH06162957A (en) * | 1992-11-20 | 1994-06-10 | Mitsubishi Electric Corp | Electron gun |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50148063A (en) | 1975-11-27 |
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